Stresses exceeding Maximum Ratings may damage the device. Maximum
Ratings are stress ratings only. Functional operation above the Recommended
Operating Conditions is not implied. Extended exposure to stresses above the
Recommended Operating Conditions may affect device reliability.
1. V
voltages shall not be tested with a constant current source such that the
voltage ratings of the devices are exceeded.
= 25°C, t = 10ms)
J
and V
DRM
for all types can be applied on a continuous basis. Blocking
RRM
= 25°C unless otherwise noted)
J
SymbolValueUnit
V
DRM,
V
RRM
BTA12−600BW3G
BTA12−800BW3G
I
T(RMS)
I
TSM
V
DSM/
V
RSM
GM
P
GM
G(AV)
J
stg
V
iso
= 80°C)
C
= 25°C)
A
= 80°C)
C
600
800
12A
105A
V
DSM/VRSM
+100
4.0A
20W
1.0W
−40 to +125°C
−40 to +150°C
2500V
V
V
TO−220AB
1
2
3
x= 6 or 8
A= Assembly Location
Y= Year
WW= Work Week
G= Pb−Free Package
All polarities are referenced to MT1.
With in−phase signals (using standard AC lines) quadrants I and III are used.
GT
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3
Page 4
BTA12−600BW3G, BTA12−800BW3G
125
110
, CASE TEMPERATURE (°C)
C
T
1000
95
80
65
120°, 90°, 60°, 30°
I
, RMS ON-STATE CURRENT (A)
T(RMS)
Figure 1. RMS Current Derating
180°
DC
20
18
16
14
12
10
8
6
, AVERAGE POWER (W)
AV
4
P
2
121086420
0
1
DC
180°
120°
60°
30°
I
, ON-STATE CURRENT (A)
T(RMS)
Figure 2. On−State Power Dissipation
90°
121086420
100
T
10
, INSTANTANEOUS ON−STATE CURRENT (A)
T
I
1
Typical @
= −40°C
J
Typical @ TJ = 25°C
Typical @ TJ = 125°C
Typical @ TJ = 25°C
Typical @ TJ = −40°C
Typical @ TJ = 125°C
0.1
0.01
r(t), TRANSIENT THERMAL RESISTANCE (NORMALIZED)
55
45
35
25
t, TIME (ms)
Figure 4. Thermal Response
MT2 Positive
4
10001001010.1
1·10
0.1
0.511.522.533.544.55
VT, INSTANTANEOUS ON-STATE VOLTAGE (V)
Figure 3. On-State Characteristics
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, HOLD CURRENT (mA)
15
H
I
5
−40 −25 −105 203550658095110125
MT2 Negative
TJ, JUNCTION TEMPERATURE (°C)
Figure 5. Hold Current Variation
4
Page 5
BTA12−600BW3G, BTA12−800BW3G
d
/d
CRITICAL
RATE
OF
RISE
OF
OFF
STATE
VOLTAGE (V/
)
5
5
100
VD = 12 V
R
= 30 W
L
10
Q3
Q1
Q2
, GATE TRIGGER CURRENT (mA)
GT
I
1
−40 −25 −10 52035 50 6580 95 110 125
TJ, JUNCTION TEMPERATURE (°C)
Figure 6. Gate Trigger Current Variation
s
μ
5k
VD = 800 Vpk
T
= 125°C
4k
J
‐
3k
2k
1k
0
t,
RG, GATE TO MAIN TERMINAL 1 RESISTANCE (W)
v
Figure 8. Critical Rate of Rise of Off-State Voltage
(Exponential Waveform)
2.0
1.8
1.6
Q1
VD = 12 V
R
= 30 W
L
1.4
1.2
1.0
0.8
GATE TRIGGER VOLTAGE (V)LATCHING CURRENT (mA)
0.6
0.4
−40 −25 −105 20355065809511012
, JUNCTION TEMPERATURE (°C)
T
J
Q3
Q2
Figure 7. Gate Trigger Voltage Variation
120
100
Q2
80
60
Q1
40
20
10000100010010
0
−40 −25 −10 520 3550 6580 95 110 12
Q3
TJ, JUNCTION TEMPERATURE (°C)
VD = 12 V
R
= 30 W
L
Figure 10. Latching Current Variation
200 V
ADJUST FOR
, 60 Hz V
I
TM
CHARGE
RMS
L
L
MEASURE
AC
TRIGGER
CHARGE
CONTROL
I
1N4007
200 V
+
MT2
1N914
NON‐POLAR
C
51 W
L
TRIGGER CONTROL
MT1
G
Note: Component values are for verification of rated (di/dt)c. See AN1048 for additional information.
Figure 9. Simplified Test Circuit to Measure the Critical Rate of Rise of Commutating Current (di/dt)
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5
c
Page 6
BTA12−600BW3G, BTA12−800BW3G
PACKAGE DIMENSIONS
TO−220
CASE 221A−07
ISSUE O
SEATING
−T−
PLANE
FB
Q
4
A
123
T
U
C
S
H
K
Z
L
V
R
J
G
D
N
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
3. DIMENSION Z DEFINES A ZONE WHERE ALL
BODY AND LEAD IRREGULARITIES ARE
ALLOWED.
DIM MINMAXMINMAX
A 0.570 0.620 14.48 15.75
B 0.380 0.4059.66 10.28
C 0.160 0.1904.074.82
D 0.025 0.0350.640.88
F0.142 0.1473.613.73
G 0.095 0.1052.422.66
H0.110 0.1552.803.93
J0.014 0.0220.360.55
K 0.500 0.562 12.70 14.27
L0.045 0.0601.151.52
N 0.190 0.2104.835.33
Q 0.100 0.1202.543.04
R 0.0800.1102.042.79
S0.045 0.0551.151.39
T0.235 0.2555.976.47
U 0.000 0.0500.001.27
V0.045---1.15---
Z--- 0.080---2.04
STYLE 12:
PIN 1. MAIN TERMINAL 1
2. MAIN TERMINAL 2
3. GATE
4. NOT CONNECTED
MILLIMETERSINCHES
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BTA12−600BW3/D
6
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