December 1997 3
Philips Semiconductors Product specification
MOSFET N-channel depletion switching transistor BSD22
RATINGS
Limiting values in accordance with the Absolute Maximum System (IEC 134)
THERMAL RESISTANCE
Note
1. Device mounted on a ceramic subtrate of 8 mm × 10 mm × 0.7 mm.
CHARACTERISTICS
T
amb
=25°C unless otherwise specified
Drain-source voltage V
DS
max. 20 V
Source-drain voltage V
SD
max. 20 V
Drain-substrate voltage V
DB
max. 25 V
Source-substrate voltage V
SB
max. 25 V
Gate-substrate voltage V
GB
max. ± 15 V
Gate-source voltage V
GS
max.
+ 15 V
− 40 V
Drain current (DC) I
D
max. 50 mA
Total power dissipation up to T
amb
=25°C
(1)
P
tot
max. 230 mW
Storage temperature range T
stg
−65 to + 150 °C
Junction temperature T
j
max. 125 °C
From junction to ambient in free air
(1)
R
th j-a
= 430 K/W
Drain-source breakdown voltage
V
GS=VBS
= −5 V; IS= 10 nA V
(BR)DSX
min. 20 V
Source-drain breakdown voltage
V
GD=VBD
= −5 V; ID= 10 nA V
(BR)SDX
min. 20 V
Drain-substrate breakdown voltage
VGB= 0; ID= 10 nA; open source V
(BR)DBO
min. 25 V
Source-substrate breakdown voltage
V
GB
= 0; IS= 10 nA; open drain V
(BR)SBO
min. 25 V
Drain-source leakage current
VGS=VBS= −5 V; VDS= 10 V I
DSoff
typ. 1.0 nA
Source-drain leakage current
V
GD=VBD
= 5 V; VSD= 10 V I
SDoff
typ. 1.0 nA
Gate-substrate leakage current
V
DB=VSB
= 0; VGB= ± 15 V I
GBS
max. 10 nA
Forward transconductance at f = 1 kHz
V
DS
= 10 V; VSB= 0; ID= 20 mA
g
fs
min. 10 mS
typ. 15 mS
Gate-source cut-off voltage
V
DS
= 10 V; VSB=0;
ID=10µA −V
(P)GS
max. 2.0 V