Datasheet BSC130P03LS G Datasheet (Infineon) [ru]

Page 1
BSC130P03LS G
OptiMOSTM-P Power-Transistor
Product Summary
Features
• P-Channel
• Enhancement mode
• Logic level
• 150°C operating temperature
• Vgs=25V, specially suited for notebook applications
Type Package Marking Lead free Packing
BSC130P03LS G PG-TDSON-8 130P03LS Yes Dry
Maximum ratings, at T
=25 °C, unless otherwise specified
j
V
DS
R
DS(on),max
I
D
-30 V
13
-22.5 A
PG-TDSON-8
m
Parameter Symbol Conditions Unit
Continuous drain current
Pulsed drain current
Avalanche energy, single pulse
Gate source voltage
Power dissipation
Operating and storage temperature
I
D
I
D,pulse
E
AS
V
GS
P
tot
T
j
, T
TC=25 °C
T
=70 °C
C
1)
=25 °C
T
A
TC=25 °C
2)
ID=-22.5 A, RGS=25
TC=25 °C
=25 °C
1)
stg
T
A
ESD class JESD22-C101-HBM
Soldering temperature
IEC climatic category; DIN IEC 68-1
Value
-22.5
-22.5
-12
-90
148
±25
69
2.8
-55 ... 150
1C (1kV-2kV)
260 °C
55/150/56
A
mJ
V
W
°C
Rev. 1.3 page 1 2008-07-10
Page 2
BSC130P03LS G
Parameter Symbol Conditions Unit
Values
min. typ. max.
Thermal characteristics
Thermal resistance, junction - case
Thermal resistance, junction - ambient
Electrical characteristics, at T
R
thJC
R
thJA
=25 °C, unless otherwise specified
j
6 cm2 cooling area
- - 1.8 K/W
1)
--50
Static characteristics
Drain-source breakdown voltage
Gate threshold voltage
Zero gate voltage drain current
V
(BR)DSS
V
GS(th)
I
DSS
VGS=0 V, ID=-250µA
VDS=VGS, ID=-150 µA
VDS=-30 V, VGS=0 V, T
=25 °C
j
-30 - - V
-2.2 -1.5 -1
- -0.1 -1 µA
V
=-30 V, VGS=0 V,
DS
T
=125 °C
j
Gate-source leakage current
Drain-source on-state resistance
Gate resistance
Transconductance
1)
Device on 40 mm x 40 mm x 1.5 mm epoxy PCB FR4 with 6 cm2 (one layer, 70 µm thick) copper area for drain
connection. PCB is vertical in still air.
I
R
R
g
GSS
DS(on)
G
fs
VGS=-25 V, VDS=0 V
VGS=-10 V, I
=-22.5 A
D
|VDS|>2|ID|R
I
=-22.5 A
D
DS(on)max
- -10 -100
- -10 -100 nA
- 9.4 13.0
- 3.8 -
,
20 39 - S
m
Rev. 1.3 page 2 2008-07-10
Page 3
BSC130P03LS G
g
Parameter Symbol Conditions Unit
Values
min. typ. max.
Dynamic characteristics
Input capacitance
Output capacitance
Reverse transfer capacitance
Turn-on delay time
Rise time
Turn-off delay time
Fall time
Gate Char
e Characteristics
Gate to source charge
Gate charge at threshold
Gate to drain charge
Switching charge
3)
C
C
C
t
t
t
t
Q
Q
Q
Q
iss
oss
rss
d(on)
r
d(off)
f
gs
g(th)
gd
sw
=0 V, VDS=-15 V,
V
GS
f =1 MHz
VDD=-15 V, VGS=­10 V, I R
V V
=22.5 A,
D
=6
G
=-24 V, ID=22.5 A,
DD
=0 to -10 V
GS
- 2760 3670 pF
- 857 1140
- 690 1000
- 11.4 17.1 ns
- 65.6 98.4
- 43.5 65.3
- 35.1 52.7
- -7.7 -10.3 nC
- -4.3 -5.7
- -20.5 -30.8
- -24.0 -35.4
Gate charge total
Gate plateau voltage
Output charge
Reverse Diode
Diode continous forward current
Diode pulse current
Diode forward voltage
Reverse recovery time
Reverse recovery charge
Q
V
plateau
Q
I
S
I
S,pulse
V
SD
t
rr
Q
g
oss
rr
VDD=-15 V, VGS=0 V
=25 °C
T
C
VGS=0 V, IF=-22.5 A, T
=25 °C
j
VR=15 V, IF=|IS|,
di
/dt =100 A/µs
F
- -54.9 -73.1
- -2.9 - V
- -14.8 -
- - 22.5 A
- - -90
- -0.9 -1.2 V
-33-ns
-24-nC
Rev. 1.3 page 3 2008-07-10
Page 4
1 Power dissipation 2 Drain current
P
=f(TC); tp≤10 s ID=f(TC); |VGS|10 V; tp≤10 s
tot
BSC130P03LS G
80
24
70
20
60
[W]
tot
P
50
40
[A]
D
-I
16
12
30
8
20
10
0
0 40 80 120 160
TC [°C]
4
0
0 40 80 120 160
TC[°C]
3 Safe operating area 4 Max. transient thermal impedance
Z
I
=f(VDS); TC=25 °C1); D =0
D
parameter: t
10
p
2
100
10 µs
=f(tp)
thJS
parameter: D =tp/T
1
10
10
100 µs
0.01
0
1
10
1
10
[A]
10
D
-I
0
1
0.1 1 10 100
10
limited by on-state resistance
1 ms
10 ms
DC
-VDS [V]
0.2
[K/W]
0.1
thJS
Z
0.05
-1
0.1
10
0.02
single pulse
-2
0.01
0.00001 0.0001 0.001 0.01 0.1 1 10
10
10
10
-4
-5
10
-3
-2
10
tp [s]
10
-1
10
1
0
10
Rev. 1.3 page 4 2008-07-10
Page 5
5 Typ. output characteristics 6 Typ. drain-source on resistance
I
=f(VDS); Tj=25 °C R
D
parameter: V
GS
=f(ID); Tj=25 °C
DS(on)
parameter: V
GS
BSC130P03LS G
60
50
-10 V
-4.5 V
-3.5 V
50
40
-2.5 V
-2.7 V
-3 V
40
]
30
[A]
D
-I
30
-3.2 V
-3 V
[m
DS(on)
R
20
20
-2.7 V
10
-2.5 V
-2.3 V
0
0123
-VDS [V]
10
0
0 10203040
-ID [A]
7 Typ. transfer characteristics 8 Typ. forward transconductance
I
=f(VGS); |VDS|>2|ID|R
D
parameter: T
j
DS(on)max
gfs=f(ID); Tj=25 °C
-3.2 V
-3.5 V
-4.5 V
-10 V
60
25 °C
50
50
40
40
150 °C
30
[A]
D
-I
30
[S]
fs
g
20
20
10
0
01234
-VGS [V]
10
0
0102030
-ID [A]
Rev. 1.3 page 5 2008-07-10
Page 6
9 Drain-source on-state resistance 10 Typ. gate threshold voltage
R
=f(Tj); ID=-22.5 A; VGS=-10 V
DS(on)
=f(Tj); VGS=VDS; ID=-150 µA
V
GS(th)
BSC130P03LS G
16
14
98 %
12
]
[m
R
10
DS(on)
typ.
8
6
4
-60 -20 20 60 100 140 180
Tj [°C]
3
2.5
max.
2
[V]
GS(th)
1.5
typ.
-V
1
0.5
0
-60 -20 20 60 100 140 180
min.
Tj [°C]
11 Typ. capacitances 12 Forward characteristics of reverse diode
C =f(V
); VGS=0 V; f =1 MHz IF=f(VSD)
DS
4
10000
10
parameter: T
100
j
25 °C, typ
150 °C, 98%
10
C [pF]
150 °C, typ
Ciss
3
1000
Coss
Crss
[A]
F
I
10
1
25 °C, 98%
2
100
10
0 8 16 24
-VDS [V]
0.1
0 0.5 1 1.5
-VSD [V]
Rev. 1.3 page 6 2008-07-10
Page 7
13 Avalanche characteristics 14 Typ. gate charge
V
IAS=f(tAV); RGS=25
parameter: T
j(start)
=f(Q
GS
parameter: V
); ID=-22.5 A pulsed
gate
DD
BSC130P03LS G
100
[A]
10
AV
-I
1
1 10 100 1000
100 °C
125 °C
tAV [µs]
25 °C
10
9
8
7
6
[V]
5
GS
-V
4
3
2
1
0
0204060
-Q
15 Drain-source breakdown voltage 16 Gate charge waveforms
V
=f(Tj); ID=-250 µA
BR(DSS)
-6 V
gate
[nC]
-15 V
-24 V
35
V
GS
34
33
32
31
[V]
BR(DSS)
30
-V
29
28
27
26
-60 -20 20 60 100 140 180
V
gs(th)
Q
g(th)
Q
gs
Q
g
Q
sw
Q
gd
Q
gate
Tj [°C]
Rev. 1.3 page 7 2008-07-10
Page 8
Package Outline
PG-TDSON-8: Outline
BSC130P03LS G
Dimensions in mm
Rev. 1.3 page 8 2008-07-10
Page 9
BSC130P03LS G
Published by Infineon Technologies AG 81726 Munich, Germany © 2008 Infineon Technologies AG All Rights Reserved.
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Information
For further information on technology, delivery terms and conditions and prices, please contact the nearest Infineon Technologies Office (www.infineon.com
Warnings
Due to technical requirements, components may contain dangerous substances. For information on the types in question, please contact the nearest Infineon Technologies Office. Infineon Technologies components may be used in life-support devices or systems only with the express written approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure of that life-support device or system or to affect the safety or effectiveness of that device or system. Life support devices or systems are intended to be implanted in the human body or to support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may be endangered.
).
Rev. 1.3 page 9 2008-07-10
Page 10
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