• Very low power consumption :
Vcc = 5.0VC-grade: 40mA (Max.) operating current
I -grade: 45mA (Max.) operating current
0.6uA (Typ.) CMOS standby current
• High speed access time :
-70 70ns (Max.) at Vcc = 5.0V
-55 55ns (Max.) at Vcc = 5.0V
• Automatic power down when chip is deselected
• Three state outputs and TTL compatible
• Fully static operation
• Data retention supply voltage as low as 1.5V
• Easy expansion with CE and OE options
• I/O Configuration x8/x16 selectable by LB and UB pin
DESCRIPTION
The BS616LV2015 is a
Random Acce
operates from a
Advanced CM
speed and low
of 0.6uA and m
Easy memory
enable(CE), act
drivers.
The BS616LV2015 ha
power consum
The BS616LV2015 is
TSOP Type II
and 48-pin BG
ss Memory organized as 131,072 words by 16 bits and
wide range of 4.5V to 5.5V supply voltage.
OS technology and circuit techniques provide both high
power features with a typical CMOS standby current
aximum access time of 70/55ns in 5V operation.
expansion is provided by an active LOW chip
ive LOW output enable(OE) and three-state output
s an automatic power down feature, reducing the
ption significantly when chip is deselected.
package, JEDEC standard 44-pin TSOP Type II package
Brilrves the right to modify document contents without notice.liance Semiconductor Inc. rese
PKG TYPE
TSOP2-44
TSOP1-48
BGA-48-0608
TSOP2-44
TSOP1-48
BGA-48-0608
2048
128
14
A10
A0
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BSI
PIN DESCRIPTIONS
NameFunction
BS616LV2015
A0-A16 Address Input
CE Chip Enable Input
WE Write Enable Input
OE Output Enable Input
LB and UB Data Byte Control Input
DQ0 - DQ15 Data Input/Output
Ports
Vcc
Gnd
TRUTH TABLE
These 17 address inputs select one of the 131,072 x 16-bit words in the RAM.
CE is active LOW. Chip enables must be active when data read from or write to the
device. if chip enable is not active, the device is deselected and is in a standby power
mode. The DQ pins will be in the high impedance state when the device is deselected.
The write enable input is active LOW and controls read and write operations. With the
chip selected, when WE is HIGH and OE is LOW, output data will be present on the
DQ pins; when WE is LOW, the data present on the DQ pins will be written into the
selected memory location.
The output enable input is active LOW. If the output enable is active while the chip is
selected and the write enable is inactive, data will be present on the DQ pins and they
will be enabled. The DQ pins will be in the high impedance state when OE is inactive.
Lower byte and upper byte data input/output control pins.
These 16 bi-directional ports are used to read data from or write data into the RAM.
Power Supply
Ground
MODECEWEOELBUBDQ0~DQ7DQ8~DQ15Vcc CURRENT
Not selected
(Power Down)
HXXXXHigh ZHigh ZI
Output DisabledLHHXXHigh ZHigh ZI
LLDoutDoutI
ReadLHL
HLHigh ZDoutI
LHDoutHigh ZI
LLDinDinI
WriteLLX
HLXDinI
LHDinXI
R0201-BS616LV2015
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CCSB
, I
CCSB1
CC
CC
CC
CC
CC
CC
CC
Revision 2.5
April 2002
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BSI
BS616LV2015
ABSOLUTE MAXIMUM RATINGS
(1)
SYMBOLPARAMETERRATINGUNITS
V
T
T
P
I
TERM
BIAS
STG
T
OUT
Terminal Voltage with
Respect to GND
Temperature Under BiasC-40 to +125
Storage TemperatureC-60 to +150
Power Dissipation1.0W
DC Output CurrentmA20
1. Stresses greater than those listed under ABSOLUTE MAXIMUM
RATINGS may cause permanent damage to the device. This is a
stress rating only and functional operation of the device at these
or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
reliability.
-0.5 to
Vcc+0.5
V
O
O
DC ELECTRICAL CHARACTERISTICS ( TA = 0 to + 70
PARAMETER
NAME
IL
V
IH
V
IL
I
IOL Output Leakage Current
VOL Output Low Voltage Vcc = Max, IOL = 2mA
VOH Output High Voltage Vcc = Min, IOH = -1mA
CC
I
PARAMETER TEST CONDITIONS MIN. TYP.
Guaranteed Input Low
(2)
Voltage
Guaranteed Input High
(2)
Voltage
Input Leakage CurrentVcc = Max, V
Vcc = Max, CE = V
I/O
= 0V to Vcc
V
Operating Power Supply
Current
CE = V
IN
= 0V to Vcc-- -- 1 uA
IH
, or OE = VIH,
IL
, IDQ = 0mA, F = Fmax
OPERATING RANGE
RANGE
Commercial0
Industrial-40
CAPACITANCE
SYMBOLPARAMETERCONDITIONSMAX. UNIT
C
C
1. This parameter is guar
o
C )
(3)
IN
DQ
Input
Capacitance
Input/Output
Capacitance
Vcc=5.0V
Vcc=5.0V
Vcc=5.0V
Vcc=5.0V
Vcc=5.0V
AMBIENT
TEMPERATURE
O
C to +70
O
(1)
-0.5 -- 0.8 V
2.2 -- Vcc+0.2V
-- -- 1 uA
-- -- 0.4 V
2.4 -- -- V
-- -- 40 mA
O
C4.5V ~ 5.5V
O
C to +85
C4.5V ~ 5.5V
(TA = 25oC, f = 1.0 MHz)
VIN=0V6pF
I/O
V
=0V8pF
anteed and not tested.
(1)
MAX.
Vcc
UNITS
CCSB
I
Standby Current-TTL CE = VIH, IDQ = 0mA
CCSB1
I
Standby Current-CMOS
CE Њ Vcc-0.2V,
IN
Њ
V
Vcc - 0.2V or V
IN
Љ
0.2V
Vcc=5.0V
Vcc=5.0V
-- -- 1 mA
-- 0.6 6 uA
1. Typical characteristics are at TA = 25oC.
2. These are absolute values with respect to device ground and all overshoots due to system or tester notice are included.
V
I
CCDR
t
CDR
.
RC
o
C )
(1)
MAX.UNITS
DR
Vcc for Data Retention
Data Retention Current
CEЊVcc - 0.2V
IN
Vcc - 0.2V or V
V
Њ
CEЊVcc - 0.2V
IN
V
Vcc - 0.2V or V
Њ
IN
0.2V
Љ
IN
0.2V
Љ
Chip Deselect to Data
Retention Time
t
R
Operation Recovery Time
See Retention Waveform
1.5----V
--0.051.5uA
0---n-s
(2)
T
RC
----ns
3. Fmax = 1/t
DATA RETENTION CHARACTERISTICS ( TA = 0 to + 70
SYMBOLPARAMETERTEST CONDITIONSMIN. TYP.
1. Vcc = 1.5V, TA= + 25OC
2. t
= Read Cycle Time
RC
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BSI
LOW VCCDATA RETENTION WAVEFORM ( CE Controlled )
Data Retention Mode
≥
Vcc
CE
Vcc
t CDR
VDR 1.5V
≥
CE Vcc - 0.2V
BS616LV2015
Vcc
t R
VIHVIH
AC TEST CONDITIONS
Input Pulse Levels
Input Rise and Fall Times
Input and Output
Timing Reference Level
Vcc/0V
5ns
0.5Vcc
AC TEST LOADS AND WAVEFORMS
5.0V
OUTPUT
INCLUDING
JIG AND
SCOPE
OUTPUT
Vcc
GND
Ω
1928
100PF
1020
FIGURE 1A
THEVENIN EQUIVALENT
10%
→
5.0V
OUTPUT
Ω667
90%
INCLUDING
JIG AND
SCOPE
→
Ω
ALL INPUT PULSES
90%
←
FIGURE 2
←
1.73V
10%
5ns
Ω
1928
5PF
1020
FIGURE 1B
Ω
AC ELECTRICAL CHARACTERISTICS ( TA = 0 to + 70
READ CYCLE
JEDEC
PARAMETER
NAME
t
AVAX
t
AVQV
t
ELQV
t
BA
t
GLQV
t
ELQX
t
BE
t
GLQX
t
EHQZ
t
BDO
t
GHQZ
t
AXOX
PARAMETER
NAME
t
RC
t
AA
t
ACS
(1)
t
BA
t
OE
t
CLZ
t
BE
t
OLZ
t
CHZ
t
BDO
t
OHZ
t
OH
DESCRIPTION
Read Cycle Time
Address Access Time
Chip Select Access Time
Data Byte Control Access Time
Output Enable to Output Valid
Chip Select to Output Low Z
Data Byte Control to Output Low Z
Output Enable to Output in Low Z
Chip Deselect to Output in High Z
Data Byte Control to Output High Z
Output Disable to Output in High Z
Output Disable to Address Change
KEY TO SWITCHING WAVEFORMS
WAVEFORMINPUTSOUTPUTS
MUST BE
STEADY
MAY CHANGE
FROM H TO L
MAY CHANGE
FROM L TO H
,
o
C , Vcc = 5.0V )
BS616LV2015-70
MIN. TYP. MAX.
DON T CAR
ANY CHANG
PERMITTED
DOES NOT
APPLY
E:CHANGE :
ESTATE
70----55----ns
----70----55ns
(CE)----70----55ns
(LB,UB)----35----30ns
----35----30ns
(CE)10----10----ns
(LB,UB)10----10---- ns
10----10----ns
(CE)0--350--30ns
(LB,UB)0--350--30ns
0--300--25 ns
10----10----ns
MUST BE
STEADY
WILL BE
CHANGE
FROM H TO L
WILL BE
CHANGE
FROM L TO H
UNKNOWN
CENTER
LINE IS HIGH
IMPEDANCE
”OFF ”STATE
BS616LV2015-55
MIN. TYP. MAX.
UNIT
NOTE :
1. tBA is 35ns/30ns (@speed=70ns/55ns) with address toggle. ; tBA is 70ns/55ns (@speed=70ns/55ns) without address toggle.
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BSI
SWITCHING WAVEFORMS (READ CYCLE)
READ CYCLE1
ADDRESS
D
(1,2,4)
t AA
t OH
OUT
BS616LV2015
t RC
t OH
READ CYCLE2
CE
LB,UB
D
OUT
READ CYCLE3
ADDRESS
OE
(1,3,4)
(1,4)
t CLZ
t ACS
t BA
(5)
(5)
t BE
t BDO
t CHZ
t RC
t AA
t OE
t OH
CE
LB,UB
D
OUT
NOTES:
1. WE is high for read Cycle.
2. Device is continuously selected when CE = V
3. Address valid prior to or coincident with CE transition low.
4. OE = V
5. Transition is easured 500mV from steady state with CL = 5pF as shown in Figure 1B.
R0201-BS616LV2015
IL .
The parameter is guaranteed but not 100% tested.
t OLZ
(5)
t CLZ
(5)
t ACS
t OHZ
t CHZ
(1,5)
t BA
t BE
IL.
t BDO
±
5
Revision 2.5
April 2002
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BSI
BS616LV2015
AC ELECTRICAL CHARACTERISTICS ( TA = 0 to + 70
o
C , Vcc = 5.0V )
WRITE CYCLE
JEDEC
PARAMETER
NAME
t
AVAX
t
E1LWH
t
AVWL
t
AVWH
t
WLWH
t
WHAX
t
BW
t
WLQZ
t
DVWH
t
WHDX
t
GHQZ
t
WHOX
NOTE :
1. tBW is 30ns/25ns (@speed=70ns/55ns) with address toggle. ; tBW is 70ns/55ns (@speed=70ns/55ns) without address toggle.
SWITCHING WAVEFORMS (WRITE CYCLE)
WRITE CYCLE1
PARAMETER
NAME
WC
t
CW
t
AS
t
AW
t
WP
t
WR1
(1)
t
BW
t
WHZ
t
DW
t
DH
t
OHZ
t
OW
(1)
DESCRIPTION
Write Cycle Timet
Chip Select to End of Write
Address Setup Time
Address Valid to End of Write
Write Pulse Width
Write recovery Time
Date Byte Control to End of Write
Write to Output in High Z
Data to Write Time Overlap
Data Hold from Write Time
Output Disable to Output in High Z
End of Write to Output Active
BS616LV2015-70
MIN. TYP. MAX.
70----55----ns
70----55----ns
0----0----ns
70----55----ns
35----30----ns
(CE,WE)0----0----ns
(LB,U )3B0----25----ns
0--300--25 ns
30----25----ns
0----0----ns
0--300--25 ns
5----5----ns
BS616LV2015-55
MIN. TYP. MAX.
t WC
UNIT
ADDRESS
OE
CE
LB,UB
WE
D
OUT
D
IN
t AS
(4,10)
t OHZ
(3)
t WR
(11)
(5)
t CW
t BW
t AW
t WP
(2)
(3)
t DH
t DW
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BS616LV2015
WRITE CYCLE2
ADDRESS
CE
LB,UB
WE
D
OUT
D
IN
(1,6)
t AS
(5)
t AW
(4,10)
t WHZ
t WC
t CW
t WP
t BW
(11)
t WR
(3)
(2)
t DH
(7)(8)
t DW
t DH
(8,9)
NOTES:
1. WE must be high during address transitions.
2. The internal write time of the memory is defined by the overlap of CE and WE low. All signals
must be active to initiate a write and any one signal can terminate a write by going inactive.
The data input setup and hold timing should be referenced to the second transition edge of
the signal that terminates the write.
3. T
WR is measured from the earlier of CE or WE going high at the end of write cycle.
4. During this period, DQ pins are in the output state so that the input signals of opposite phase
to the outputs must not be applied.
5. If the CE low transition occurs simultaneously with the WE low transitions or after the WE
transition, output remain in a high impedance state.
6. OE is continuously low (OE = V
7. D
OUT is the same phase of write data of this write cycle.
8. D
OUT is the read data of next address.
9. If CE is low during this period, DQ pins are in the output state. Then the data input signals of
opposite phase to the outputs must not be applied to them.
10. Transition is measured 500mV from steady state with C
The parameter is guaranteed but not 100% tested.
CW is measured from the later of CE going low to the end of write.