Datasheet BS616LV2015TI, BS616LV2015TC, BS616LV2015EI, BS616LV2015EC, BS616LV2015DI Datasheet (BSI)

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BSI
Very Low Power/Voltage CMOS SRAM 128K X 16 bit
BS616LV2015
FEATURES
• Very low operation voltage : 4.5 ~ 5.5V
• Very low power consumption : Vcc = 5.0V C-grade: 40mA (Max.) operating current
I -grade: 45mA (Max.) operating current
0.6uA (Typ.) CMOS standby current
• High speed access time :
-70 70ns (Max.) at Vcc = 5.0V
-55 55ns (Max.) at Vcc = 5.0V
• Automatic power down when chip is deselected
• Three state outputs and TTL compatible
• Fully static operation
• Data retention supply voltage as low as 1.5V
• Easy expansion with CE and OE options
• I/O Configuration x8/x16 selectable by LB and UB pin
DESCRIPTION
The BS616LV2015 is a Random Acce operates from a Advanced CM speed and low of 0.6uA and m Easy memory enable(CE), act drivers. The BS616LV2015 ha power consum The BS616LV2015 is TSOP Type II and 48-pin BG
ss Memory organized as 131,072 words by 16 bits and
wide range of 4.5V to 5.5V supply voltage.
OS technology and circuit techniques provide both high
power features with a typical CMOS standby current
aximum access time of 70/55ns in 5V operation. expansion is provided by an active LOW chip ive LOW output enable(OE) and three-state output
s an automatic power down feature, reducing the
ption significantly when chip is deselected.
package, JEDEC standard 44-pin TSOP Type II package
A package.
high performance, very low power CMOS Static
available in DICE form, JEDEC standard 44-pin
PRODUCT FAMILY
PRODUCT
FAMILY
OPERATING
TEMPERATURE
Vcc
RANGE
(ns)
Vcc=5.0V Vcc=5.0V Vcc=5.0V
BS616LV2015DC DICE
SPEED
BS616LV2015EC BS616LV2015TC
O
C to +70OC 4.5V ~ 40mA
+0
5.5V 70 / 55 6uA
BS616LV2015AC BS616LV2015DI DICE BS616LV2015EI BS616LV2015TI
O
C to +85OC 4.5V ~ 45mA
-40
5.5V 70 / 55 10uA
BS616LV2015AI
PIN CONFIGURATIONS
1
A4
2
A3
3
A2
4
A1
5
A0
6
CE
7
DQ0
8
DQ1
9
DQ2 DQ3 VCC GND DQ4 DQ5 DQ6 DQ7
WE A16 A15 A14 A13 A12
A
B
C
D
VCC
E
F
G
H
48-ball BGA top view
BS616LV2015EC
10 11
BS616LV2015EI
12 13 14 15 16 17 18 19 20 21 22
23
LB1OE A0
D8 UB
D9
D10 A5
VSS
D11
D12
D13
D14
D15
N.C.
N.C.
A3
N.C.
N.C.
A14
A12
A9A8
44
A5
43
A6
42
A7
41
OE
40
UB
39
LB
38
DQ15
37
DQ14
36
DQ13
35
DQ12
34
GND
33
VCC
32
DQ11
31
DQ10
30
DQ9
29
DQ8
28
NC
27
A8
26
A9
25
A10
24
A11
23
456
A1 A2
A4
A6
A7
A16 D4
A15 D5
A13 WE
NC
N.C.
D0
CE
D1
D2
VCC
D3
VSS
D6
D7
N.C.
A11A10
BLOCK DIAGRAM
A8 A13
A15
A16 A14
A12
A7
A6 A5 A4
DQ0
. . . .
DQ15
CE
WE
OE
UB
LB
Vcc Gnd
POWER DISSIPATION
STANDBY
CCSB1
(I
, Max)
Address
20
Input
Buffer
16
. . .
16
.
Control
Data Input Buffer
Data
Output
Buffer
Row
Decoder
Operating
(ICC, Max)
1024
16
16
A11
Memory Array
1024 x 2048
Column I/O
Write Driver
Sense Amp
Column Decoder
Address Input Buffer
A9
A3 A2 A1
Bril rves the right to modify document contents without notice.liance Semiconductor Inc. rese
PKG TYPE
TSOP2-44 TSOP1-48 BGA-48-0608
TSOP2-44 TSOP1-48 BGA-48-0608
2048
128
14
A10
A0
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PIN DESCRIPTIONS
Name Function
BS616LV2015
A0-A16 Address Input
CE Chip Enable Input
WE Write Enable Input
OE Output Enable Input
LB and UB Data Byte Control Input
DQ0 - DQ15 Data Input/Output Ports
Vcc
Gnd
TRUTH TABLE
These 17 address inputs select one of the 131,072 x 16-bit words in the RAM.
CE is active LOW. Chip enables must be active when data read from or write to the
device. if chip enable is not active, the device is deselected and is in a standby power
mode. The DQ pins will be in the high impedance state when the device is deselected.
The write enable input is active LOW and controls read and write operations. With the
chip selected, when WE is HIGH and OE is LOW, output data will be present on the
DQ pins; when WE is LOW, the data present on the DQ pins will be written into the
selected memory location.
The output enable input is active LOW. If the output enable is active while the chip is
selected and the write enable is inactive, data will be present on the DQ pins and they
will be enabled. The DQ pins will be in the high impedance state when OE is inactive.
Lower byte and upper byte data input/output control pins.
These 16 bi-directional ports are used to read data from or write data into the RAM.
Power Supply
Ground
MODE CE WE OE LB UB DQ0~DQ7 DQ8~DQ15 Vcc CURRENT
Not selected
(Power Down)
H X X X X High Z High Z I
Output Disabled L H H X X High Z High Z I
L L Dout Dout I
Read L H L
H L High Z Dout I
L H Dout High Z I
L L Din Din I
Write L L X
H L X Din I
L H Din X I
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CCSB
, I
CCSB1
CC
CC
CC
CC
CC
CC
CC
Revision 2.5 April 2002
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BSI
BS616LV2015
ABSOLUTE MAXIMUM RATINGS
(1)
SYMBOL PARAMETER RATING UNITS
V
T
T
P
I
TERM
BIAS
STG
T
OUT
Terminal Voltage with Respect to GND
Temperature Under Bias C-40 to +125
Storage Temperature C-60 to +150
Power Dissipation 1.0 W
DC Output Current mA20
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
-0.5 to
Vcc+0.5
V
O
O
DC ELECTRICAL CHARACTERISTICS ( TA = 0 to + 70
PARAMETER
NAME
IL
V
IH
V
IL
I
IOL Output Leakage Current
VOL Output Low Voltage Vcc = Max, IOL = 2mA
VOH Output High Voltage Vcc = Min, IOH = -1mA
CC
I
PARAMETER TEST CONDITIONS MIN. TYP.
Guaranteed Input Low
(2)
Voltage Guaranteed Input High
(2)
Voltage
Input Leakage Current Vcc = Max, V
Vcc = Max, CE = V
I/O
= 0V to Vcc
V
Operating Power Supply Current
CE = V
IN
= 0V to Vcc -- -- 1 uA
IH
, or OE = VIH,
IL
, IDQ = 0mA, F = Fmax
OPERATING RANGE
RANGE
Commercial 0
Industrial -40
CAPACITANCE
SYMBOL PARAMETER CONDITIONS MAX. UNIT
C
C
1. This parameter is guar
o
C )
(3)
IN
DQ
Input Capacitance Input/Output Capacitance
Vcc=5.0V
Vcc=5.0V
Vcc=5.0V
Vcc=5.0V
Vcc=5.0V
AMBIENT
TEMPERATURE
O
C to +70
O
(1)
-0.5 -- 0.8 V
2.2 -- Vcc+0.2 V
-- -- 1 uA
-- -- 0.4 V
2.4 -- -- V
-- -- 40 mA
O
C4.5V ~ 5.5V
O
C to +85
C4.5V ~ 5.5V
(TA = 25oC, f = 1.0 MHz)
VIN=0V 6 pF
I/O
V
=0V 8 pF
anteed and not tested.
(1)
MAX.
Vcc
UNITS
CCSB
I
Standby Current-TTL CE = VIH, IDQ = 0mA
CCSB1
I
Standby Current-CMOS
CE Њ Vcc-0.2V,
IN
Њ
V
Vcc - 0.2V or V
IN
Љ
0.2V
Vcc=5.0V
Vcc=5.0V
-- -- 1 mA
-- 0.6 6 uA
1. Typical characteristics are at TA = 25oC.
2. These are absolute values with respect to device ground and all overshoots due to system or tester notice are included.
V
I
CCDR
t
CDR
.
RC
o
C )
(1)
MAX. UNITS
DR
Vcc for Data Retention
Data Retention Current
CEЊVcc - 0.2V
IN
Vcc - 0.2V or V
V
Њ
CEЊVcc - 0.2V
IN
V
Vcc - 0.2V or V
Њ
IN
0.2V
Љ
IN
0.2V
Љ
Chip Deselect to Data Retention Time
t
R
Operation Recovery Time
See Retention Waveform
1.5 -- -- V
-- 0.05 1.5 uA
0--- n-s
(2)
T
RC
-- -- ns
3. Fmax = 1/t
DATA RETENTION CHARACTERISTICS ( TA = 0 to + 70
SYMBOL PARAMETER TEST CONDITIONS MIN. TYP.
1. Vcc = 1.5V, TA= + 25OC
2. t
= Read Cycle Time
RC
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LOW VCCDATA RETENTION WAVEFORM ( CE Controlled )
Data Retention Mode
Vcc
CE
Vcc
t CDR
VDR 1.5V
CE Vcc - 0.2V
BS616LV2015
Vcc
t R
VIHVIH
AC TEST CONDITIONS
Input Pulse Levels Input Rise and Fall Times Input and Output Timing Reference Level
Vcc/0V 5ns
0.5Vcc
AC TEST LOADS AND WAVEFORMS
5.0V
OUTPUT
INCLUDING JIG AND SCOPE
OUTPUT
Vcc
GND
1928
100PF
1020
FIGURE 1A
THEVENIN EQUIVALENT
10%
5.0V
OUTPUT
667
90%
INCLUDING JIG AND SCOPE
ALL INPUT PULSES
90%
FIGURE 2
1.73V
10%
5ns
1928
5PF
1020
FIGURE 1B
AC ELECTRICAL CHARACTERISTICS ( TA = 0 to + 70
READ CYCLE
JEDEC
PARAMETER
NAME
t
AVAX
t
AVQV
t
ELQV
t
BA
t
GLQV
t
ELQX
t
BE
t
GLQX
t
EHQZ
t
BDO
t
GHQZ
t
AXOX
PARAMETER
NAME
t
RC
t
AA
t
ACS
(1)
t
BA
t
OE
t
CLZ
t
BE
t
OLZ
t
CHZ
t
BDO
t
OHZ
t
OH
DESCRIPTION
Read Cycle Time
Address Access Time
Chip Select Access Time
Data Byte Control Access Time
Output Enable to Output Valid
Chip Select to Output Low Z
Data Byte Control to Output Low Z
Output Enable to Output in Low Z
Chip Deselect to Output in High Z
Data Byte Control to Output High Z
Output Disable to Output in High Z
Output Disable to Address Change
KEY TO SWITCHING WAVEFORMS
WAVEFORM INPUTS OUTPUTS
MUST BE STEADY
MAY CHANGE FROM H TO L
MAY CHANGE FROM L TO H
,
o
C , Vcc = 5.0V )
BS616LV2015-70
MIN. TYP. MAX.
DON T CAR ANY CHANG PERMITTED
DOES NOT APPLY
E: CHANGE :
E STATE
70 -- -- 55 -- -- ns
-- -- 70 -- -- 55 ns
(CE) -- -- 70 -- -- 55 ns
(LB,UB) -- -- 35 -- -- 30 ns
-- -- 35 -- -- 30 ns
(CE) 10 -- -- 10 -- -- ns
(LB,UB)10----10---- ns
10 -- -- 10 -- -- ns
(CE) 0 -- 35 0 -- 30 ns
(LB,UB) 0 -- 35 0 -- 30 ns
0--300--25 ns
10 -- -- 10 -- -- ns
MUST BE STEADY
WILL BE CHANGE FROM H TO L
WILL BE CHANGE FROM L TO H
UNKNOWN
CENTER LINE IS HIGH IMPEDANCE ”OFF ”STATE
BS616LV2015-55
MIN. TYP. MAX.
UNIT
NOTE :
1. tBA is 35ns/30ns (@speed=70ns/55ns) with address toggle. ; tBA is 70ns/55ns (@speed=70ns/55ns) without address toggle.
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SWITCHING WAVEFORMS (READ CYCLE)
READ CYCLE1
ADDRESS
D
(1,2,4)
t AA
t OH
OUT
BS616LV2015
t RC
t OH
READ CYCLE2
CE
LB,UB
D
OUT
READ CYCLE3
ADDRESS
OE
(1,3,4)
(1,4)
t CLZ
t ACS
t BA
(5)
(5)
t BE
t BDO
t CHZ
t RC
t AA
t OE
t OH
CE
LB,UB
D
OUT
NOTES:
1. WE is high for read Cycle.
2. Device is continuously selected when CE = V
3. Address valid prior to or coincident with CE transition low.
4. OE = V
5. Transition is easured 500mV from steady state with CL = 5pF as shown in Figure 1B.
R0201-BS616LV2015
IL .
The parameter is guaranteed but not 100% tested.
t OLZ
(5)
t CLZ
(5)
t ACS
t OHZ
t CHZ
(1,5)
t BA
t BE
IL.
t BDO
±
5
Revision 2.5 April 2002
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BS616LV2015
AC ELECTRICAL CHARACTERISTICS ( TA = 0 to + 70
o
C , Vcc = 5.0V )
WRITE CYCLE
JEDEC
PARAMETER
NAME
t
AVAX
t
E1LWH
t
AVWL
t
AVWH
t
WLWH
t
WHAX
t
BW
t
WLQZ
t
DVWH
t
WHDX
t
GHQZ
t
WHOX
NOTE :
1. tBW is 30ns/25ns (@speed=70ns/55ns) with address toggle. ; tBW is 70ns/55ns (@speed=70ns/55ns) without address toggle.
SWITCHING WAVEFORMS (WRITE CYCLE)
WRITE CYCLE1
PARAMETER
NAME
WC
t
CW
t
AS
t
AW
t
WP
t
WR1
(1)
t
BW
t
WHZ
t
DW
t
DH
t
OHZ
t
OW
(1)
DESCRIPTION
Write Cycle Timet
Chip Select to End of Write
Address Setup Time
Address Valid to End of Write
Write Pulse Width
Write recovery Time
Date Byte Control to End of Write
Write to Output in High Z
Data to Write Time Overlap
Data Hold from Write Time
Output Disable to Output in High Z
End of Write to Output Active
BS616LV2015-70
MIN. TYP. MAX.
70 -- -- 55 -- -- ns
70 -- -- 55 -- -- ns
0 -- -- 0 -- -- ns
70 -- -- 55 -- -- ns
35 -- -- 30 -- -- ns
(CE,WE) 0 -- -- 0 -- -- ns
(LB,U ) 3B 0 -- -- 25 -- -- ns
0--300--25 ns
30 -- -- 25 -- -- ns
0 -- -- 0 -- -- ns
0--300--25 ns
5 -- -- 5 -- -- ns
BS616LV2015-55
MIN. TYP. MAX.
t WC
UNIT
ADDRESS
OE
CE
LB,UB
WE
D
OUT
D
IN
t AS
(4,10)
t OHZ
(3)
t WR
(11)
(5)
t CW
t BW
t AW
t WP
(2)
(3)
t DH
t DW
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BS616LV2015
WRITE CYCLE2
ADDRESS
CE
LB,UB
WE
D
OUT
D
IN
(1,6)
t AS
(5)
t AW
(4,10)
t WHZ
t WC
t CW
t WP
t BW
(11)
t WR
(3)
(2)
t DH
(7) (8)
t DW
t DH
(8,9)
NOTES:
1. WE must be high during address transitions.
2. The internal write time of the memory is defined by the overlap of CE and WE low. All signals must be active to initiate a write and any one signal can terminate a write by going inactive. The data input setup and hold timing should be referenced to the second transition edge of the signal that terminates the write.
3. T
WR is measured from the earlier of CE or WE going high at the end of write cycle.
4. During this period, DQ pins are in the output state so that the input signals of opposite phase to the outputs must not be applied.
5. If the CE low transition occurs simultaneously with the WE low transitions or after the WE transition, output remain in a high impedance state.
6. OE is continuously low (OE = V
7. D
OUT is the same phase of write data of this write cycle.
8. D
OUT is the read data of next address.
9. If CE is low during this period, DQ pins are in the output state. Then the data input signals of opposite phase to the outputs must not be applied to them.
10. Transition is measured 500mV from steady state with C
The parameter is guaranteed but not 100% tested.
CW is measured from the later of CE going low to the end of write.
11. T
IL ).
±
L = 5pF as shown in Figure 1B.
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ORDERING INFORMATION
BS616LV2015 X X -- Y Y
BS616LV2015
SPEED
70: 70ns 55: 55ns
GRADE
o
C: +0
C ~ +70oC
o
I: -40
C ~ +85oC
PACKAGE
E: TSOP 2 T: TSOP 1 A: BGA - 48 PIN(6x8mm) D: DICE
PACKAGE DIMENSIONS
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TSOP2-44
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PACKAGE DIMENSIONS (continued)
BS616LV2015
1
24
24
1
TSOP1-48PIN
HD
C
L
D
48
25
"A"
25
48
12(2X)
WITH PLATING
c
BASE METAL
12(2X)
Seating Plane
c1
e
b
E
y
A2
A
A1
SEATING PLANE
b
"A" DETAIL VIEW
b1
SECTION A-A
UNIT
SYMBOL
0.0433
0.004
A
0.002
0.004
A1
0.002
A2
0.039
0.002
b
0.009
0.001
0.008
b1
0.004 ~ 0.008
c
0.004 ~ 0.006
c1
0.004
D
0.645
0.472
0.004
E e
0.004
0.020
HD
0.708
0.008
L L1 y
Ӱ
A
A
L
L1
0.02360.006
0.004
0.0315
0.004 Max. 0
~ 8
GAUGE PLANE
0
12(2x)
12(2x)
4 5 2
. 0
MMINCH
0.10
1.10
0.05
0.10
0.05
1.00
0.05
0.22
0.03
0.20
0.10 ~ 0.21
0.10 ~ 0.16
16.400.10
12.00
0.10
0.10
0.50
0.20
18.00
0.15
0.60
0.10
0.80
0.1 Max. 0
~ 8
A15 A14
A13
A12
A11
A10
/WE CE2
/UB
1
A9 A8
NC
9
NC
10
NC
13
/LB NC
16
NC
17 A7 A6 A5 A4
A3
A2
24
A1
Pkg Type :
48TSOP(I)-12x18mm
A16
48
NC
47
VSS
46
IO15 IO7 IO14 IO6 IO13 IO5 IO12 IO4 VCC
37
IO11 IO3 IO10 IO2 IO9 IO1 IO8 IO0 /OE
27
VSS /CE
25
A0
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PACKAGE DIMENSIONS (continued)
1.4 Max.
D1
e
VIEW A
BS616LV2015
NOTES:
1: CONTROLLING DIMENSIONS ARE IN MILLIMETERS.
2: PIN#1 DOT MARKING BY LASER OR PAD PRINT.
3: SYMBOL "N" IS THE NUMBER OF SOLDER BALLS.
BALL PITCH e = 0.75
D
EN
8.0 6.0
E1
48 3.75
E1D1
5.25
48 mini-BGA (6 x 8)
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BS616LV2015
REVISION HISTORY
Revision Description Date Note
2.2 2001 Data Sheet release Apr. 15, 2001
2.3 Modify Standby Current (Typ. and Max.)
2.4 Modify CSP Pin Configuration Pin number : E3 “ VSS ” rename to “ N.C. “
2.5 Modify some AC parameters. April,12,2002
Jun. 29, 2001
Sep.12, 2001
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