Datasheet BLF0810-90, BLF0810S-90 Datasheet (Philips)

Page 1
M3D379
查询BLF0810-90供应商
DISCRETE SEMICONDUCTORS
DATA SHEET
BLF0810-90; BLF0810S-90
Base station LDMOS transistors
Preliminary specification 2002 Mar 18
Page 2
Philips Semiconductors Preliminary specification
handbook, halfpage
Top view MBK394
1
2
3
Fig.1 Simplified outline SOT502A (BLF0810-90)
5
Base station LDMOS transistors BLF0810-90; BLF0810S-90
FEATURES
High power gain
Easy power control
Excellent ruggedness
Source on underside eliminates DC isolators, reducing
DESCRIPTION
Silicon N-channel enhancement mode lateral D-MOS transistors encapsulated in a 2-lead flange package (BLF0810-90) with a ceramic cap or in a 2-lead earless package (BLF0810S-90). The common source is connected to the flange.
common mode inductance
Designed for broadband operation (750 MHz to 1 GHz).
Typical CDMA IS95 performance at standard settings at a supply voltage of 27 V and I
APPLICATIONS
Common source class-AB operation in CDMA applications in the 750 to 960 MHz frequency range.
P
=18W
L
G
=16dB
P
η =26% ACPR <−45 dBc at 750 kHz and BW = 30 kHz ACPR <−63 dBc at 1.98 MHz and BW = 30 kHz
PINNING - SOT502A PINNING - SOT502B
PIN DESCRIPTION
1drain
2 gate
3 source; connected to flange
PIN DESCRIPTION
1drain
2
3 source; connected to flange
gate
=500mA
DQ
1
3
2
Top view
MBL10
Fig.2 Simplified outline SOT502B (BLF0810S-90)
QUICK REFERENCE DATA
2-tone performance at T
MODE OF OPERATION
=25°C in a common source test circuit.
h
f
(MHz)
V
(V)
DS
P
PEP
L
(W)
G
(dB)
p
η
D
(%)
d
3
(dBc)
Class-AB 881.4 - 881.6 27 60 typ. 16.5 typ. 35 typ. −30
MODE OF OPERATION
(1)
CDMA
f
(MHz)
881.5 27 18 typ. 16 typ. 26
V
(V)
DS
P
avg
L
(W)
G
(dB)
p
η
D
(%)
ACPR
(dB)
typ. 46 typ. 63
Note
1. IS95 CDMA (pilot, Paging, Sync, and Trafic Codes 8 trough 13)
2. ACPR 750 kHz at BW = 30 kHz
3. ACPR 1.98 MHz at BW = 30 kHz.
(2)
(3)
2002 Mar 18 2
Page 3
Philips Semiconductors Preliminary specification
Base station LDMOS transistors BLF0810-90; BLF0810S-90
LIMITING VALUES
In accordance with the Absolute Maximum Rating System (IEC 60134).
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
V
DS
V
GS
T
stg
T
j
THERMAL CHARACTERISTICS
SYMBOL PARAMETER CONDITIONS VALUE UNIT
R
th j-c
Note
1. Thermal resistance is determined under RF operating conditions.
drain-source voltage 75 V
gate-source voltage −±15 V
storage temperature −65 150 °C
junction temperature 200 °C
thermal resistance from junction to case Th=25°C, PL= 18 W avg, note 1 <0.75 K/W
CHARACTERISTICS
T
=25°C unless otherwise specified.
j
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
V
(BR)DSS
V
GSth
I
DSS
I
DSX
I
GSS
g
fs
R
DSon
drain-source breakdown voltage VGS=0; ID=3mA 75 −−V
gate-source threshold voltage VDS=10V; ID= 300 mA 4 5V
drain-source leakage current VGS=0; VDS=36V −−1 µA
on-state drain current VGS=V
+9V; VDS=10V 28 −−A
GS(th)
gate leakage current VGS= ±20 V; VDS=0 −−1 µA
forward transconductance VDS=10V; ID=10A 4.8 S
drain-source on-state resistance VGS=9V; ID=10A 120 mΩ
2002 Mar 18 3
Page 4
Philips Semiconductors Preliminary specification
Fig.3 Power gain and efficiency as functions of
peak envelope load power, typical values.
VDS=27V; IDQ= 500 mA; f1=881.4MHz; f2=881.6MHz.
Base station LDMOS transistors BLF0810-90; BLF0810S-90
APPLICATION INFORMATION
RF performance in a common source-AB circuit; T
=25°C.
h
MODE OF OPERATION
f
(MHz)
V
(V)
DS
I
DQ
(mA)
P
PEP
L
(W)
G
(dB)
p
η
D
(%)
d
3
(dBc)
Class-AB 881.4 - 881.6 27 500 60 >16 >35 <30
MODE OF OPERATION
(1)
CDMA
f
(MHz)
V
(V)
DS
I
DQ
(mA)
P
avg
L
(W)
881.5 27 500 >16 >15 >26
G
(dB)
p
η
D
(%)
ACPR
(dB)
<46
<63
Note
1. IS95 CDMA (pilot, Paging, Sync, and Trafic Codes 8 trough 13)
2. ACPR 750 kHz at BW = 30 kHz
3. ACPR 1.98 MHz at BW = 30 kHz.
Ruggedness in class-AB operation
The BLF0810-90 and BLF0810S-90 are capable of withstanding a load mismatch corresponding to VSWR = 10 : 1 through all phases at V
=27V; PL= 60 W (PEP).
DS
(2)
(3)
20
G
P
(dB)
16
12
8
4
0
0 20406080100
G
P
η
D
2002 Mar 18 4
(PEP) (W)
P
L
50
40
30
20
10
0
η
(%)
0
d
D
3
(dBc)
-20
IDQ=400mA
-40
450mA
500mA
-60
-80 0 20406080100
VDS=27V; f1= 881.4 MHz; f2=881.6MHz.
600mA
P
(PEP) (W)
L
Fig.4 Intermodulation distortion as a function of
peak envelope load power, typical values.
Page 5
Philips Semiconductors Preliminary specification
Fig.5 Intermodulation distortion as a function of
peak envelope load power, typical values.
VDS=27V; f1= 881.4 MHz; f2=881.6MHz.
Fig.7 Power gain and efficiency as functions of
the average load power, typical values.
VDS=27V; IDQ= 500 mA; f = 881.5 MHz;
measured under CDMA conditions; test signal Standard IS-95
Base station LDMOS transistors BLF0810-90; BLF0810S-90
0
d
5
(dBc)
-20
IDQ=600mA
-40
400mA
450mA
500mA
-60
-80 0 20406080100
P
(PEP) (W)
L
0
d
7
(dBc)
-20
-40
-60
IDQ=600mA
450mA
500mA
400mA
-80 0 20406080100
P
(PEP) (W)
L
VDS=27V; f1= 881.4 MHz; f2=881.6MHz.
Fig.6 Intermodulation distortion as a function of
peak envelope load power, typical values.
20
G
P
(dB)
15
10
5
0
20 30 40 50
P
2002 Mar 18 5
G
P
η
D
avg (dBm)
L
40
30
20
10
0
η
(%)
0
D
ACPR
(dB)
-20
-40
750 kHz
-60
1.98 MHz
-80 20 30 40 50
P
avg (dBm)
L
VDS=27V; IDQ= 500 mA; f = 881.5 MHz;
measured under CDMA conditions; test signal Standard IS-95
Fig.8 Intermodulation distortion as a function of
the average load power, typical values.
Page 6
Philips Semiconductors Preliminary specification
Fig.9 Input impedance as a function of frequency
(series components); typical values.
Class-AB operation; VDS=27V; IDQ=500mA; PL=18W.
Fig.11 Definition of transistor impedance.
Base station LDMOS transistors BLF0810-90; BLF0810S-90
2
Z
IN
()
1
0
-1
-2
0.8 0.85 0.9 0.95 1
r
i
x
i
f (GHz)
2
Z
L
()
1
0
-1
-2
0.8 0.85 0.9 0.95 1
Class-AB operation; VDS=27V; IDQ=500mA; PL=18W.
R
L
X
L
f (GHz)
Fig.10 Load impedance as a function of frequency
(series components); typical values.
DRAIN
BLF0810-90
GATE
Z
IN
2002 Mar 18 6
Z
L
Page 7
Philips Semiconductors Preliminary specification
Base station LDMOS transistors BLF0810-90; BLF0810S-90
5)2XW
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/
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Fig.12 Circuit for 850 to 960 MHz test circuit.
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2002 Mar 18 7
Page 8
Philips Semiconductors Preliminary specification
Base station LDMOS transistors BLF0810-90; BLF0810S-90
,Q
&
9G
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= 6.15); t hickness = 25 mils.
r
ε
&
/
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/
Fig.13 Circuit for 850 to 960 MHz test circuit.
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2002 Mar 18 8
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The other side is unetched and serves as a ground plane.
Dimensions in mm.
The components are situated on one side of the copper-clad Rogers 6006 printed-circuit board (
Page 9
Philips Semiconductors Preliminary specification
Base station LDMOS transistors BLF0810-90; BLF0810S-90
List of components
COMPONENT DESCRIPTION VALUE DIMENSIONS
C1, C6, C13, C14, C15, C16, C17
C2 multilayer ceramic chip capacitor; note 1 330 nF
C3 multilayer ceramic chip capacitor; note 1 100 nF
C4, C9, C10, C11, C12 tantalum capacitor 10 µF
C5, C18 air trimmer capacitor 8 pF
C7, C8 multilayer ceramic chip capacitor 8.2 pF
R1 potentiometer 1 k
Q1 7808 voltage regulator
Q2 BLF0910-140 LDMOS transistor
L1 stripline; note 2 204 × 36 mils
L2 stripline; note 2 253 × 36 mils
L3 stripline; note 2 210 × 188 mils
L4 stripline; note 2 94 × 36 mils
L5 Ferroxcube
L6 stripline; note 2 380 × 36 mils
L7 stripline; note 2 71 × 363 mils
L8 stripline; note 2 319 × 700 mils
L9 stripline; note 2 1724 × 36 mils
L10 stripline; note 2 721 × 1106 mils
L11 stripline; note 2 389 × 210 mils
L12, L13 stripline; note 2 1470 × 131 mils
L14 stripline; note 2 92 × 36 mils
L15, L16 stripline; note 2 165 × 36 mils
multilayer ceramic chip capacitor; note 1 68 pF
Notes
1. American Technical Ceramics type 100A or capacitor of same quality.
2. The striplines are on a double copper-clad Rogers 6006 printed-circuit board (ε
2002 Mar 18 9
= 6.15); thickness = 25 mils.
r
Page 10
Philips Semiconductors Preliminary specification
Base station LDMOS transistors BLF0810-90; BLF0810S-90
PACKAGE OUTLINE
Flanged LDMOST ceramic package; 2 mounting holes; 2 leads SOT502A
D
A
3
D
1
U
1
q
1
H
U
2
A
2
b
w
M M
C
2
0 5 10 mm
scale
F
B
C
L
p
w
M M M
AB
1
c
E
1
Q
E
DIMENSIONS (millimetre dimensions are derived from the original inch dimensions)
UNIT
mm
inches
A
4.72
3.99
0.186
0.157
OUTLINE VERSION
SOT502A
12.83
12.57
0.505
0.495
c
Db
20.02
19.61
0.788
0.772
19.96
19.66
0.786
0.774
0.15
0.08
0.006
0.003
IEC JEDEC EIAJ
D
1
EE
9.50
9.53
9.30
9.25
0.375
0.374
0.364
0.366
REFERENCES
1
0.045
0.035
F
1.14
0.89
H
19.94
18.92
0.785
0.745
L
5.33
4.32
0.210
0.170
p
3.38
3.12
0.133
0.123
Q
1.70
1.45
0.067
0.057
qw
U
1
34.16
33.91
1.345
1.335
EUROPEAN
PROJECTION
U
9.91
9.65
0.390
0.380
w
2
1
2
0.25 0.5127.94
0.01 0.021.100
ISSUE DATE
99-10-13 99-12-28
2002 Mar 18 10
Page 11
Philips Semiconductors Preliminary specification
Base station LDMOS transistors BLF0810-90; BLF0810S-90
PACKAGE OUTLINE
Earless flanged LDMOST ceramic package; 2 leads SOT502B
Package under
development
Philips Semiconductors reserves the
right to make changes without notice.
D
A
F
3
D
1
U
1
L
H
U
2
1
D
c
E
1
E
2
b
w
M M
D
2
0 5 10 mm
scale
Q
DIMENSIONS (millimetre dimensions are derived from the original inch dimensions)
UNIT
mm
inches
A
4.72
3.99
0.186
0.157
OUTLINE VERSION
SOT502B
12.83
12.57
0.505
0.495
c
Db
20.02
19.61
0.788
0.772
19.96
19.66
0.786
0.774
0.15
0.08
0.006
0.003
IEC JEDEC EIAJ
D
1
EE
9.53
9.50
9.25
9.30
0.375
0.374
0.364
0.366
REFERENCES
1
0.045
0.035
F
1.14
0.89
H
19.94
18.92
0.785
0.745
L
5.33
4.32
0.210
0.170
Q
1.70
1.45
0.067
0.057
U
20.70
20.45
0.815
0.805
U
w
2
1
9.91
9.65
0.390
0.380
2
0.25
0.010
EUROPEAN
PROJECTION
ISSUE DATE
99-12-16 99-12-28
2002 Mar 18 11
Page 12
Philips Semiconductors Preliminary specification
Base station LDMOS transistors BLF0810-90; BLF0810S-90
DATA SHEET STATUS
DATA SHEET
STATUS
(1)
PRODUCT STATUS
(2)
DEFINITIONS
Objective data Development This data sheet contains data from the objective specification for product
development. Philips Semiconductors reserves the right to change the specification in any manner without notice.
Preliminary data Qualification This data sheet contains data from the preliminary specification.
Supplementary data will be published at a later date. Philips Semiconductors reserves the right to change the specification without notice, in order to improve the design and supply the best possible product.
Product data Production This data sheet contains data from the product specification. Philips
Semiconductors reserves the right to make changes at any time in order to improve the design, manufacturing and supply. Changes will be communicated according to the Customer Product/Process Change Notification (CPCN) procedure SNW-SQ-650A.
Notes
1. Please consult the most recently issued data sheet before initiating or completing a design.
2. The product status of the device(s) described in this data sheet may have changed since this data sheet was published. The latest information is available on the Internet at URL http://www.semiconductors.philips.com.
DEFINITIONS
Short-form specification The data in a short-form
specification is extracted from a full data sheet with the same type number and title. For detailed information see the relevant data sheet or data handbook.
Limiting values definition Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 60134). Stress above one or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or at any other conditions above those given in the Characteristics sections of the specification is not implied. Exposure to limiting values for extended periods may affect device reliability.
Application information Applications that are described herein for any of these products are for illustrative purposes only. Philips Semiconductors make no representation or warranty that such applications will be suitable for the specified use without further testing or modification.
DISCLAIMERS
Life support applications These products are not
designed for use in life support appliances, devices, or systems where malfunction of these products can reasonably be expected to result in personal injury. Philips Semiconductors customers using or selling these products for use in such applications do so at their own risk and agree to fully indemnify Philips Semiconductors for any damages resulting from such application.
Right to make changes Philips Semiconductors reserves the right to make changes, without notice, in the products, including circuits, standard cells, and/or software, described or contained herein in order to improve design and/or performance. Philips Semiconductors assumes no responsibility or liability for the use of any of these products, conveys no licence or title under any patent, copyright, or mask work right to these products, and makes no representations or warranties that these products are free from patent, copyright, or mask work right infringement, unless otherwise specified.
CAUTION
This product is supplied in anti-static packing to prevent damage caused by electrostatic discharge during transport and handling. For further information, refer to Philips specs.: SNW-EQ-608, SNW-FQ-302A and SNW-FQ-302B.
2002 Mar 18 12
Page 13
Philips Semiconductors – a worldwide company
Contact information
For additional information please visit http://www.semiconductors.philips.com.Fax: +31 40 27 24825 For sales offices addresses send e-mail to: sales.addresses@www.semiconductors.philips.com.
© Koninklijke Philips Electronics N.V. 2001
All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the copyright owner.
The information presented in this document does not form part of a ny quotation or contract, is believed to be accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license under patent- or other industrial or intellectual property rights.
Printed in The Netherlands budgetnum/printrun/ed/pp13 Date of release: 2002 Mar 18 Do cument order number: 9397 750 09 548
SCA73
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