Datasheet BCR1002N3 Datasheet (CYStech) [ru]

Page 1
CYStech Electronics Corp.
PNPN Epitaxial Planar SCR
Spec. No. : C700N3 Issued Date : 2008.02.25 Revised Date :2012.10.16 Page No. : 1/6
BCR1002N3
Descriptions
The BCR1002N3 is designed for high volume consumer applications such as temperature, light, and speed control; process and remote control, and warning systems where reliability of operation is important.
Features
Practical level triggering and holding characteristics
On state current rating of 0.2A
Sensitive gate allows triggering by microcontrollers and other logic circuits
Pb-free package
RMS
Symbol Outline
BCR1002N3
GGate AAnode KCathode
SOT-23
A
G
K
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CYStech Electronics Corp.
Absolute Maximum Ratings (TJ=25°C)
Parameter Symbol Limits Unit
Spec. No. : C700N3 Issued Date : 2008.02.25 Revised Date :2012.10.16 Page No. : 2/6
Peak Repetitive Off-State Voltage @TJ=-40 to 125℃,
V
GK=1KΩ
R On-State Current @TC=80 Average On-State Current @ TC=80 Reverse Peak Gate Voltage @TA=25, Pulse Width≤1μs Forward Peak Gate Current @TA=25, Pulse Width≤1μs Forward Average Gate Power @ TA=25, t=8.3ms Thermal Resistance, Junction to Ambient RθJA 556 Thermal Resistance, Junction to Case RθJC 208 Junction Temperature Tj -40~+125 Storage Temperature Tstg -40~+150
Note : Stress exceeding maximum ratings may damage the device. Maximum ratings are stress ratings only. Functional
operation above the recommended operating conditions is not implied. Extended exposure to stresses above the recommended operating conditions may affect device reliability.
V
DRM can be applied on a continuous basis. Ratings apply for zero or negative gate voltage; however , positive gate
voltage shall not be applied concurrent with negative potential on the anode. Blocking voltage shall not be tested with a constant current source such that the voltage ratings of the device are exceeded.
DRM 140 V
IT(RMS) 350 mA
IT(AV) 220 mA
VGRM 8 V
IGM 500 mA
G(AV) 100 mW
P
°C/W °C/W
°C °C
Characteristics
(Ta=25°C)
Symbol Min. Typ. Max. Unit Test Conditions
I
- - 100 μA
DRM
I
- - 10 μA
DRM
VD=140V, RGK=1KΩ, TC=125℃ VD=140V, RGK=1KΩ, TC=25℃
*VTM - - 1.5 V ITM=200mA
IGT - - 100
IH - - 5
μA
mA
VD=7V, RL=100Ω VD=7V, RGK=1KΩ
IL - - 6 mA VD=7V, IG=200μA
VGT - - 0.8 V
dV/dt 25 - - V/μs
VD=7V, RL=100Ω VD=35V, RGK=1KΩ
dI/dt 30 - - A/μs IG=10mA, dIG/dt=100mA/μs, PW=10μs
*Pulse Test: Pulse Width ≤300μs, Duty Cycle≤2%
Ordering Information
Device Package Shipping Marking
BCR1002N3
SOT-23
(Pb-free)
3000 pcs / Tape & Box CR
Page 3
CYStech Electronics Corp.
Typical Characteristics
Spec. No. : C700N3 Issued Date : 2008.02.25 Revised Date :2012.10.16 Page No. : 3/6
Gate Trigger Current vs Junction Temperature
70
60
A)
μ
(
GT
50
40
30
20
Gate Trigger Current---I
10
0
-50 -25 0 25 50 75 100 125
JunctionTemperature---T
(℃)
J
Holding Current vs Junction Temperature
10
(mA)
H
Gate Trigger Voltage vs Junction Temperature
1
0.9
(V)
0.8
GT
0.7
0.6
0.5
0.4
0.3
0.2
Gate Trigger Voltage---V
0.1
0
-50-250 255075100125 Junction Temperature---T
(°C)
J
Latching Current vs Junction Temperature
1000
A)
μ
(
L
1
Holding Current---I
0.1
-50 -25 0 25 50 75 100 125
Junction Temperature---T
(°C)
J
On-state Characteristics
1000
(mA)
T
100
Instantaneous On-state Current---I
TJ=125°C
TJ=25°C
TJ=-40°C
100
Latching Current---I
10
-50 -25 0 25 50 75 100 125
Junction Temperature---T
(°C)
J
10
00.40.81.21.62
Instantaneous On-state Voltage---V
T
(V)
Page 4
Reel Dimension
CYStech Electronics Corp.
Spec. No. : C700N3 Issued Date : 2008.02.25 Revised Date :2012.10.16 Page No. : 4/6
Carrier Tape Dimension
Page 5
CYStech Electronics Corp.
Recommended wave soldering condition
Product Peak Temperature Soldering Time
Spec. No. : C700N3 Issued Date : 2008.02.25 Revised Date :2012.10.16 Page No. : 5/6
Pb-free devices
260 +0/-5 °C
Recommended temperature profile for IR reflow
5 +1/-1 seconds
Profile feature Sn-Pb eutectic Assembly
Average ramp-up rate
(Tsmax to Tp)
Preheat
Temperature Min(T
Temperature Max(TS max)
Time(ts min to ts max)
Time maintained above:
Temperature (TL)
Time (tL)
Peak Temperature(TP)
Time within 5°C of actual peak
temperature(tp)
Ramp down rate
Time 25 °C to peak temperature
Note : All temperatures refer to topside of the package, measured on the package body surface.
S min)
3°C/second max. 3°C/second max.
100°C 150°C
60-120 seconds
183°C
60-150 seconds
240 +0/-5 °C 260 +0/-5 °C
10-30 seconds 20-40 seconds
6°C/second max. 6°C/second max.
6 minutes max. 8 minutes max.
Pb-free Assembly
150°C 200°C
60-180 seconds
217°C
60-150 seconds
Page 6
SOT-23 Dimension
CYStech Electronics Corp.
Spec. No. : C700N3 Issued Date : 2008.02.25 Revised Date :2012.10.16 Page No. : 6/6
Marking:
CR
TE
XX
3-Lead SOT-23 Plastic Surface Mounted Package CYStek Package Code: N3
*: Typical
C
DIM
A
L
3
S
B
1
V
D
G
2
H
K
Inches Millimeters
Min. Max. Min. Max.
J
DIM
Device Code
Date Code
Style: Pin 1.Cathode 2.Gate 3.Anode
Inches Millimeters
Min. Max. Min. Max. A 0.1102 0.1204 2.80 3.04 J 0.0034 0.0070 0.085 0.177 B 0.0472 0.0630 1.20 1.60 K 0.0128 0.0266 0.32 0.67 C 0.0335 0.0512 0.89 1.30 L 0.0335 0.0453 0.85 1.15 D 0.0118 0.0197 0.30 0.50 S 0.0830 0.1083 2.10 2.75
G 0.0669 0.0910 1.70 2.30 V 0.0098 0.0256 0.25 0.65
H 0.0005 0.0040 0.013 0.10
Notes: 1.Controlling dimension: millimeters.
Material:
Lead: Pure tin plated.
Mold Compound: Epoxy resin family, flammability solid burning class: UL94V-0.
2.Maximum lead thickness includes lead finish thickness, and minimum lead thickness is the minimum thickness of base material.
3.If there is any question with packing specification or packing method, please contact your local CYStek sales office.
Important Notice:
All rights are reserved. Reproduction in whole or in part is prohibited without the prior written approval of CYStek.
CYStek reserves the right to make changes to its products without notice.
CYStek semiconductor products are not warranted to be suitable for use in Life-Support Applications, or systems.
CYStek assumes no liability for any consequence of customer product design, infringement of patents, or application assistance.
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