• Build in Biasing Circuit; To reduce using parts cost & PC board space.
• High gain;
(PG = 29 dB typ. at f = 200 MHz)
• Low noise characteristics;
(NF = 1.2 dB typ. at f = 200 MHz)
• Wide supply voltage range;
Applicable with 5V to 9V supply voltage.
• Withstanding to ESD;
Build in ESD absorbing diode. Withstand up to 200V at C=200pF, Rs=0 conditions.
• Provide mini mold packages; MPAK-4R(SOT-143 var.)
ADE-208-717A (Z)
2nd. Edition
Dec. 1998
Outline
Notes: 1. Marking is “DX–”.
2. BB404M is individual type number of HITACHI BBFET.
MPAK-4R
3
4
2
1
1. Source
2. Drain
3. Gate2
4. Gate1
Page 2
BB404M
Absolute Maximum Ratings (Ta = 25°C)
ItemSymbolRatingsUnit
Drain to source voltageV
Gate1 to source voltageV
Gate2 to source voltageV
Drain currentI
DS
G1S
G2S
D
Channel power dissipationPch150mW
Channel temperatureTch150°C
Storage temperatureTstg–55 to +150°C
Electrical Characteristics (Ta = 25°C)
ItemSymbol MinTypMaxUnitTest Conditions
Drain to source breakdown voltage V
Gate1 to source breakdown voltage V
Gate2 to source breakdown voltage V
Gate1 to source cutoff currentI
Gate2 to source cutoff currentI
Gate1 to source cutoff voltageV
Gate2 to source cutoff voltageV
Input capacitancec
Output capacitancec
Reverse transfer capacitancec
Drain currentI
(BR)DSS
(BR)G1SS
(BR)G2SS
G1SS
G2SS
G1S(off)
G2S(off)
iss
oss
rss
D(op)
I
D(op)
Forward transfer admittance|yfs|1222734mSVDS = 5V, VG1 = 5V, V
|yfs|2—27—mSVDS = 9V, VG1 = 9V, V
Power gainPG1242932dBVDS = 5V, VG1 = 5V, V
PG2—29—dBVDS = 9V, VG1 = 9V, V
Noise figureNF1—1.21.9dBVDS = 5V, VG1 = 5V, V
NF2—1.2—dBVDS = 9V, VG1 = 9V, V
12——V I
+10——VIG1 = +10µA, V
±10——V IG2 = ±10µA, V
——+100nAV
——±100nAV
0.40.71.0VVDS = 5V, V
0.50.71.0VVDS = 5V, V
2.32.83.6pFVDS = 5V, VG1 = 5V
0.91.32.0pFV
0.0030.020.05pFf = 1MHz
191519mAVDS = 5V, VG1 = 5V
2—13—mAVDS = 9V, VG1 = 9V
12V
±10
V
– 0
Å}10V
25mA
= 200µA, V
D
= +9V, V
G1S
= ±9V, V
G2S
=4V, RG = 180kΩ
G2S
V
= 4V, RG = 180kΩ
G2S
V
=6V, RG = 470kΩ
G2S
R
= 180kΩ, f = 1kHz
G
R
= 470kΩ, f = 1kHz
G
R
= 180kΩ, f = 200MHz
G
R
= 470kΩ, f = 200MHz
G
R
= 180kΩ, f = 200MHz
G
R
= 470kΩ, f = 200MHz
G
= V
G1S
= VDS = 0
G2S
= VDS = 0
G1S
= VDS = 0
G2S
= VDS = 0
G1S
= 4V, ID = 100µA
G2S
= 5V, ID = 100µA
G1S
G2S
G2S
G2S
G2S
G2S
G2S
G2S
= 0
=4V
=6V
=4V
=6V
=4V
=6V
2
Page 3
Main Characteristics
BB404M
Test Circuit for Operating Items (I , |yfs|, Ciss, Coss, Crss, NF, PG)
V
1000p
G1
V
T
R
G
Gate 1
Source
Power Gain, Noise Figure Test Circuit
V
G2
1000p
D(op)
Gate 2
V
G2
Drain
A
I
D
V
T
1000p
Input (50Ω)
1000p
36p
BBFET
L2
180k (VD=5V)
470k (VD=9V)
1000p
47k
R
G
1000p
47k
L1
1SV70
L1 :φ1mm Enameled Copper Wire,Inside dia 10mm, 2Turns
L2 :φ1mm Enameled Copper Wire,Inside dia 10mm, 2Turns
RFC :φ1mm Enameled Copper Wire,Inside dia 5mm, 2Turns
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