diode capacitancef = 1 MHz; VR= 0; see Fig.6−2pF
reverse recovery timewhen switched from IF= 400 mA to
−6ns
IR= 400 mA; RL= 100 Ω;
measured at IR= 40 mA; see Fig.7
forward recovery voltagewhen switched from IF= 10 mA;
−2V
tr= 20 ns; see Fig.8
=25°C; device has reached the thermal equilibrium when mounted on an FR4 printed-circuit board.
THERMAL CHARACTERISTICS
SYMBOLPARAMETERCONDITIONSVALUEUNIT
R
R
th j-tp
th j-a
thermal resistance from junction to tie-point330K/W
thermal resistance from junction to ambientnote 1500K/W
Note
1. Device mounted on an FR4 printed-circuit board.
1996 Sep 103
Page 4
Philips SemiconductorsProduct specification
High-speed diodeBAS678
GRAPHICAL DATA
amb
MBG441
(oC)
300
handbook, halfpage
I
F
(mA)
200
100
0
0100200
Device mounted on an FR4 printed-circuit board.
T
Fig.2Maximum permissible continuous forward
current as a function of ambient temperature.
300
handbook, halfpage
I
F
(mA)
200
100
0
02
Tj=25°C.
1
MBH279
VF (V)
Fig.3Forward current as a function of forward
voltage; typical values.
2
10
handbook, full pagewidth
I
FSM
(A)
10
1
−1
10
1
Based on square wave currents.
Tj=25°C prior to surge.
Fig.4 Maximum permissible non-repetitive peak forward current as a function of pulse duration.
MBG703
10
2
10
3
10
tp (µs)
4
10
1996 Sep 104
Page 5
Philips SemiconductorsProduct specification
High-speed diodeBAS678
2
10
handbook, halfpage
I
R
(µA)
10
1
−1
10
−2
10
0
(1) VR= 75V; maximum values.
(2) VR= 75V; typical values.
(1)(2)
100
Fig.5Reverse current as a function of
junction temperature.
Tj (
MBH281
o
C)
200
2.0
handbook, halfpage
Cd
(pF)
1.5
1.0
0.5
0
0102030
f =1 MHz; Tj=25°C.
MBH284
V
(V)
R
Fig.6Diode capacitance as a function of reverse
voltage; typical values.
1996 Sep 105
Page 6
Philips SemiconductorsProduct specification
High-speed diodeBAS678
handbook, full pagewidth
R = 50SΩ
V = V I x R
RF S
(1) IR=40mA.
I
F
D.U.T.
SAMPLING
OSCILLOSCOPE
R = 50iΩ
MGA881
t
r
10%
V
R
90%
t
p
input signal
Fig.7 Reverse recovery voltage test circuit and waveforms.
t
I
F
t
rr
t
(1)
output signal
I
R = 50SΩ
Ω1 kΩ450
D.U.T.
I
OSCILLOSCOPE
R = 50iΩ
MGA882
Fig.8 Forward recovery voltage test circuit and waveforms.
1996 Sep 106
10%
t
r
90%
t
p
input
signal
V
V
fr
t
t
output
signal
Page 7
Philips SemiconductorsProduct specification
High-speed diodeBAS678
PACKAGE OUTLINE
3.0
handbook, full pagewidth
0.55
0.45
0.150
0.090
2.8
1.9
0.95
21
B
A
M
A
0.2
30
max
0.1
max
max
o
2.5
1.4
max
M0.1AB
1.2
MBC846
o
10
3
0.48
0.38
TOP VIEW
Dimensions in mm.
10
max
o
1.1
max
Fig.9 SOT23.
DEFINITIONS
Data Sheet Status
Objective specificationThis data sheet contains target or goal specifications for product development.
Preliminary specificationThis data sheet contains preliminary data; supplementary data may be published later.
Product specificationThis data sheet contains final product specifications.
Limiting values
Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or
more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation
of the device at these or at any other conditions above those given in the Characteristics sections of the specification
is not implied. Exposure to limiting values for extended periods may affect device reliability.
Application information
Where application information is given, it is advisory and does not form part of the specification.
LIFE SUPPORT APPLICATIONS
These products are not designed for use in life support appliances, devices, or systems where malfunction of these
products can reasonably be expected to result in personal injury. Philips customers using or selling these products for
use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting from such
improper use or sale.
1996 Sep 107
Loading...
+ hidden pages
You need points to download manuals.
1 point = 1 manual.
You can buy points or you can get point for every manual you upload.