■ Built-in current limiting, thermal shutdown, and
SLIC protection
■ 5 V only operation, very low power consumption
■ Battery monitor, all OFF state upon loss of battery
■ No EMI
■ Latched logic level inputs, no driver circuitry
■ Only one external protector required
Applications
■ Central office
■ DLC
■ PBX
■ DAML
■ HFC/FITL
The L7583A/B has seven states: the idle talk state
(line break switches closed, all other switches open),
the power ringing state (ringing access switches
closed, all other switches open), loop access state
(loop access switches closed, all switches open),
SLIC test state (test in switches closed, all other
switches open), simultaneous loop and SLIC
access state (loop and test in switches closed, all
others open), ringing generator test state (ring test
switches closed, all others open), and an all OFF
state. The seven states in the L7583A/B are also in
the L7583C/D, with an additional simultaneous testout and ring-test state, making the L7583C/D appropriate for digital loop carrier and other Bellcore TR-57
applications.
The L7583 offers break-before-make or makebefore-break switching, with simple logic level input
control. Because of the solid-state construction, voltage transients generated when switching into an
inductive ringing lead during ring cadence or ring trip
are minimized, possibly eliminating the need for
external zero cross switching circuitry. State control
is via logic level inputs, so no additional driver circuitry is required.
The line break switch is a linear switch that has
exceptionally low ON-resistance and an excellent
ON-resistance matching characteristic. The ringing
access switch has a breakdown voltage rating
>480 V which is sufficiently high, with proper protection, to prevent breakdown in the presence of a transient fault condition (i.e., passing the transient on to
the ringing generator).
Description
The L7583A/B/C/D Line Card Access Switch is a
monolithic solid-state device providing the equivalent
switching functionality of three 2 form C switches.
The L7583 is designed to provide power ringing
access, line test access (test out), and SLIC test
access (test in) to tip and ring in central office, digital
loop carrier, private branch exchange, digitally added
main line, and hybrid fiber coax/fiber-in-the-loop analog line card applications. An additional pair of solidstate contacts are also available to provide access
for testing of the ringing generator.
Incorporated into the L7583A
xx and L7583Cxx is a
diode bridge/SCR clamping circuit, current-limiting
circuitry, and a thermal shutdown mechanism to provide protection to the SLIC device and subsequent
circuitry during fault conditions. This is shown in Figure 1 as version A. Positive and negative lightning is
reduced by the current-limiting circuitry and steered
to ground via diodes and the integrated SCR. Power
cross is also re duced
bythe current-limiting and ther-
mal shutdown circuits.
Page 2
24
23
22
21
20
19
18
17
16
15
14
13
1
2
3
4
5
6
7
V
BAT
RBAT
RLINE
NC
F
GND
NC
NC
T
LINE
VDD
SW1
8
9
10
LATCH
R
RINGING
TTESTout
SW2
SW3SW4
SW5
SW7
SW9
SW8
SW10
SW6
TTESTin
TBAT
TRINGING
NC
IN
TESTin
RTESTout
RTESTin
NC
11
12
IN
RING
DGND
TSD
INTESTout
CONTROL
LOGIC
SCR
AND
TRIP
CKT
L7583A/B/C/D Line Card Access Switch
Data Sheet
February 2001
Description (continued)
The L7583B
integrated diode bridge along with current limiting and
thermal shutdown (see Figure 2 for version B). This will
cause positive faults to be directed to ground and negative faults to battery. In either polarity, faults are
reduced by the current-limit and/or thermal shutdown
mechanisms.
To protect the L7583 from an overvoltage fault condition, use of a secondary protector is required. The secondary protector must limit the voltage seen at the tip/
ring terminals to prevent the breakdown voltage of the
switches from being exceeded. To minimize stress on
the solid-state contacts, use of a foldback- or crowbartype secondary protector is recommended. With proper
choice of secondary protection, a line card using the
L7583 will meet all relevant ITU-T, LSSGR, FCC, or
UL
* protection requirements.
xx and L7583Dxx versions provide only an
Pin Information
The L7583 operates off of a 5 V supply only. This gives
the device extremely low idle and active power dissipation and allows use with virtually any range of battery
voltage. This makes the L7583 especially appropriate
for remote power applications such as DAM L or FOC/
FITL or other Bellcore TA 909 applications where
power dissipation is particularly critical.
A battery voltage is also used by the L7583, only as a
reference for the integrated protection circuit. The
L7583 will enter an all OFF state upon loss of battery.
During power ringing, to turn on and maintain the ON
state, the ring access switch and ring test switch will
draw a nominal 2 mA or 4 mA from the ring generator.
The L7583A/B/C/D device is packaged in a 24-pin,
plastic DIP (L7583AF/BF/CF/DF) and in a 28-pin,
plastic SOG (L7583AAJ/BAJ/CAJ/DAJ).
* UL is a registered trademark of Underwriters Laboratories, Inc.
SW2
SW6
SW8
28
27
26
25
24
23
22
21
20
19
18
17
16
15
BAT
V
NC
NC
NC
RTESTin
RBAT
RLINE
NC
RINGINGNC
R
RTESTout
LATCH
INTESTin
RING
IN
INTESTout
12-2365.d (F)
12-2364.a (F)
Note: Shown with A/C version protection. The 24-pin DIP is avail-
able with either A/C or B/D version protection.
Figure 1. 24-Pin, Plastic DIP (600 mil)
1
F
GND
2
NC
3
NC
4
NC
TTESTin
TBAT
LINE
T
TRINGING
TTESTout
NC
VDD
TSD
DGND
Note: Shown with B/D version protection. The 28-pin SOG is avail-
GNDFault ground.2428VBATBattery voltage. Used as a ref-
erence for protection circuit.
TESTin Test (in) access on TIP .2124RTESTinTest (in) access on RING.
BATConnect to TIP on SLIC side.2023RBATConnect to RING on SLIC
side.
LINEConnect to TIP on line side.1922RLINEConnect to RING on line side.
RINGING Connect to return ground for ring-
1820RRINGING Connect to ringing generator.
ing generator.
TESTout Test (out) access on TIP.1719RTESTout Test (out) access on RING.
transparent low.
DD5 V supply.1517INTEST in Logic level switch input control.
SDTemperature shutdown pin. Can
1416IN
RINGLogic level switch input control.
be used as a logic le vel inpu t or an
output. See Tables 16 and 17,
Truth Tables, and the Switching
Behavior section of this data sheet
for input pin description. As an
output fla g, wi l l r ead 5 V w he n th e
device is in its operational mode
and 0 V in the thermal shutdown
mode. T o disable the thermal shutdown mechanism, tie this pin to
5 V (not recommended).
Stresses in excess of the absolute maximum ratings can cause permanent damage to the device. These are absolute stress ratings only. Functional operation of the device is not implied at these or any other conditions in excess
of those given in the operational sections of the data sheet. Exposure to absolute maximum ratings for extended
periods can adversely affect device reliability.
Table 2. Absolute Maximum Ratings
ParameterMinMaxUnit
Operating Temperature Range–40110°C
Storage Temperature Range–40150°C
Relative Humidity Range595%
Pin Soldering Temperature (t = 10 s max)—260°C
5 V Power Supply—7V
Battery Supply—–85V
Logic Input Voltage—7V
Input-to-output Isolation—330V
Pole-to-pole Isola tion—330V
Lucent Technologies Inc.3
Page 4
L7583A/B/C/D Line Card Access Switch
Data Sheet
February 2001
Handling Precautions
Although protection circuitry has been designed into this device, proper precautions should be taken to avoid exposure to electrostatic discharge (ESD) during handling and mounting. Lucent Technologies Microelectronics Group
employs a human-body model (HBM) and a charged-device model (CDM) for ESD-susceptibility testing and protection design evaluation. ESD voltage thresholds are dependent on the circuit parameters used to define the
model. No industry-wide standard has been adopted for CDM. However, a standard HBM (resistance = 1500 Ω,
capacitance = 100 pF) is widely used and therefore can be used for comparison purposes. The HBM ESD threshold presented here was obtained by using these circuit parameters.
Table 3. HBM ESD Threshold Voltage
DeviceRating
L75831000 V
Electrical Characteristics
TA = –40 °C to +85 °C, unless otherwise specified.
Minimum and maximum values are testing requirements. Typical values are characteristics of the device and are
the result of engineering evaluations. Typical values are for information purposes only and are not part of the testing requirements.
Table 4. Power Supply Specifications
SupplyMinTypMaxUnitSupplyMinTypMaxUnit
DD 4.5 5 5.5 V VBAT*–19 —–72V
V
*VBAT is used only as a reference for internal protection circuitry . If VBAT rises above –10 V, the device will enter an all OFF state and remain in
this state until the battery voltage drops below –15 V.
Table 5. Test In Switches, 1 and 2
ParameterTest ConditionMeasureMin Typ MaxUnit
OFF-state Leakage Current:
+25 °C
+85 °C
–40 °C
ON-resistance:
+25 °C
+85 °C
–40 °C
Isolation:
+25 °C
+85 °C
–40 °C
dV/dt Sensitivity*
Vswitch (differential) = –320 V to Gnd
Vswitch (differential) = –60 V to +260 V
Vswitch (differential) = –330 V to Gnd
Vswitch (differential) = –60 V to +270 V
Vswitch (differential) = –310 V to Gnd
Vswitch (differential) = –60 V to +250 V
Iswitch (on) = ±5 mA, ±10 mA
Iswitch (on) = ±5 mA, ±10 mA
Iswitch (on) = ±5 mA, ±10 mA
Vswitch (both poles) = ±320 V,
Logic inputs = Gnd
Vswitch (both poles) = ±330 V,
Logic inputs = Gnd
Vswitch (both poles) = ±310 V,
Logic inputs = Gnd
———200—V/µs
Iswitch
Iswitch
Iswitch
ON
V
∆
∆ VON
∆ VON
Iswitch
Iswitch
Iswitch
—
—
—
—
—
—
—
—
—
—
—
—
45
—
33
—
—
—
1
1
1
—
70
—
1
1
1
µA
µA
µA
Ω
Ω
Ω
µA
µA
µA
* Applied voltage is 100 Vp-p square wave at 100 Hz.
4Lucent Technologies Inc.
Page 5
Data Sheet
February 2001
Electrical Characteristics (continued)
Table 6. Break Switches, 3 and 4
ParameterTest ConditionMeasureMin Typ Max Unit
OFF-state Leakage
Current:
+25 °C
+85 °C
–40 °C
ON-resistance:
+25 °C
+85 °C
–40 °C
ON-resistance MatchPer ON-resistance test
ON-state Voltage*Iswitch = I
dc Current Limit:
+85 °C
–40 °C
Dynamic Current Limit
(t = <0.5 µs)
Isolation:
+25 °C
+85 °C
–40 °C
dV/dt Sensitivity
†
Vswitch (differential) = –320 V to Gnd
Vswitch (differential) = –60 V to +260 V
Vswitch (differential) = –330 V to Gnd
Vswitch (differential) = –60 V to +270 V
Vswitch (differential) = –310 V to Gnd
Vswitch (differential) = –60 V to +250 V
LINE = ±10 mA, ±40 mA, TBAT = –2 V
T
LINE = ±10 mA, ±40 mA, TBAT = –2 V
T
LINE = ±10 mA, ±40 mA, TBAT = –2 V
T
condition of SW3, SW4
LIMIT @ 50 Hz/60 HzVON——220V
Vswitch (on) = ±10 V
Vswitch (on) = ±10 V
Break switches in ON state; ringing
access switches OFF; apply ±1000 V at
10/1000 µs pulse; appropriate second-
ary protection in place
Vswitch (both poles) = ±320 V,
Logic inputs = Gnd
Vswitch (both poles) = ±330 V,
Logic inputs = Gnd
Vswitch (both poles) = ±310 V,
Logic inputs = Gnd
———200—V/µs
L7583A/B/C /D Line Card Access Swi t ch
Iswitch
Iswitch
Iswitch
V
ON
∆
V
∆
ON
V
∆
ON
Magnitude
ON SW3 – RON SW4
R
Iswitch
Iswitch
Iswitch—2.5—A
Iswitch
Iswitch
Iswitch
—
—
1
—
—
1
—
—
1
—
—
—
19.5
14.5
—
—
28
—
—0.21.0
80————
250mAmA
—
—
1
—
—
1
—
—
1
µA
µA
µA
Ω
Ω
Ω
Ω
µA
µA
µA
* This parameter is not tested in production. Choice of secondary protector should ensure this rating is not exceeded.
† Applied voltage is 100 Vp-p square wave at 100 Hz.
Lucent Technologies Inc.5
Page 6
L7583A/B/C/D Line Card Access Switch
Electrical Characteristics (continued)
Table 7. Ring Test Return Switch, 5
ParameterTest ConditionMeasure MinTyp Max Unit
OFF-state Leakage Current:
+25 °C
+85 °C
–40 °C
ON-resistance Iswitch (on) = ±0 mA, ±10 mA
Isolation:
+25 °C
+85 °C
–40 °C
dV/dt Sensitivity*
Vswitch (differential) = –320 V to Gnd
Vswitch (differential) = –60 V to +260 V
Vswitch (differential) = –330 V to Gnd
Vswitch (differential) = –60 V to +270 V
Vswitch (differential) = –310 V to Gnd
Vswitch (differential) = –60 V to +250 V
Vswitch (both poles) = ±320 V,
Logic inputs = Gnd
Vswitch (both poles) = ±330 V,
Logic inputs = Gnd
Vswitch (both poles) = ±310 V,
Logic inputs = Gnd
———200—V/µs
February 2001
—
Iswitch
Iswitch
Iswitch
V
ON—50100
∆
Iswitch
Iswitch
Iswitch
—
—
—
—
—
—
—
—
—
—
—
Data Sheet
µA
1
µA
1
µA
1
Ω
µA
1
µA
1
µA
1
* Applied voltage is 100 Vp-p square wave at 100 Hz.
Table 8. Ringing Test Switch, 6
ParameterTest ConditionMeasureMin Typ Max Unit
OFF-state Leakage Current:
+25 °C
Vswitch (differential) = –60 V to +190 V
Iswitch
—
1
—
Vswitch (differential) = +60 V to –190 V
+85 °C
Vswitch (differential) = –60 V to +200 V
Iswitch
—
1
—
Vswitch (differential) = +60 V to –200 V
–40 °C
Vswitch (differential) = –60 V to +180 V
Iswitch
—
1
—
Vswitch (differential) = +60 V to –180 V
ON-resistance Iswitch (on) = ±70 mA, ±80 mA
V
ON——20
∆
ON Vo ltageIswitch (on) = ±1 mA———1.5V
Steady-state Current*————100mA
Release Current———500—µA
Isolation:
+25 °C
Vswitch (both poles) = ±320 V,
Iswitch
—
1
—
Logic inputs = Gnd
+85 °C
Vswitch (both poles) = ±330 V,
Iswitch
—
1
—
Logic inputs = Gnd
–40 °C
Vswitch (both poles) = ±310 V,
Iswitch
—
1
—
Logic inputs = Gnd
dV/dt Sensitivity
* Choice of secondary protector and series current-limit resistor should ensure these ratings are not exceeded.
† Applied voltage is 100 Vp-p square wave at 100 Hz.
†
———200—V/µs
µA
µA
µA
Ω
µA
µA
µA
6Lucent Technologies Inc.
Page 7
Data Sheet
February 2001
L7583A/B/C /D Line Card Access Swi t ch
Electrical Characteristics (continued)
Table 9. Ring Return Switch, 7
ParameterTest ConditionMeasure Min Typ Max Unit
OFF-state Leakage
1
—
Current:
+25 °C
+85 °C
–40 °C
Vswitch (differential) = –320 V to Gnd
Vswitch (differential) = –60 V to +260 V
Vswitch (differential) = –330 V to Gnd
Vswitch (differential) = –60 V to +270 V
Vswitch (differential) = –310 V to Gnd
Vswitch (differential) = –60 V to +250 V
Iswitch
Iswitch
Iswitch
dc Current LimitVswitch (on) = ±10 VIswitch—200—mA
Dynamic Current Limit
(t = <0.5 µs)
Break and loop switches in OFF state; ring return
switch ON; apply ±1000 V at 10/1000 µs pulse;
Iswitch—2.5—A
appropriate secondary protection in place
ON-resistance Iswitch (on) = ±0 mA, ±10 mA
ON-state Voltage*Iswitch = I
* At the time of publication of this data sheet, the current device design will be a nominal 4 mA. Devices are being redesigned to reduce this
current to less than 2 mA nominally. Consult your Lucent Technologies Microelectronics Group account executive for additional details.
† Choice of secondary protector and series current-limit resistor should ensure these ratings are not exceeded.
‡ Applied voltage is 100 Vp-p square wave at 100 Hz.
Lucent Technologies Inc.7
Page 8
L7583A/B/C/D Line Card Access Switch
Electrical Characteristics (continued)
Table 11. Loop Access Switches, 9 and 10
ParameterTest ConditionMeasureMin Typ MaxUnit
OFF-state Leakage
Current:
+25 °C
+85 °C
–40 °C
ON-resistance:
+25 °C
+85 °C
–40 °C
ON-state Voltage*Iswitch = I
dc Current Limit:
+85 °C
–40 °C
Dynamic Current Limit
(t = <0.5 µs)
Isolation:
+25 °C
+85 °C
–40 °C
dV/dt Sensitivity
†
Vswitch (differential) = –320 V to Gnd
Vswitch (differential) = –60 V to +260 V
Vswitch (differential) = –330 V to Gnd
Vswitch (differential) = –60 V to +270 V
Vswitch (differential) = –310 V to Gnd
Vswitch (differential) = –60 V to +250 V
Iswitch (on) = ±5 mA, ±10 mA
Iswitch (on) = ±5 mA, ±10 mA
Iswitch (on) = ±5 mA, ±10 mA
* Temperature shutdown flag (TSD) will be high during normal operation and low during temperature shutdown state.
Zero Cross Current Turn Off
The ring access switch (SW8) is designed to turn off on the next zero current crossing after application of the
appropriate logic input control. This switch requires a current zero cross to turn off. Switch 8, once on, will remain
in the ON state (regardless of logic input) until a current zero cross. Therefore, to ensure proper operation of switch
8, this switch should be connected, via proper impedance, to the ringing generator or some other ac source. Do
not attempt to switch pure dc with switch 8. The ringing test access switch, SW6, also has similar characteristics to
switch 8 and should also only be used to switch signals with zero current crossings. For a detailed explanation of
the operation of switches 6 and 8, please refer to the
Switches
Application Note.
Lucent Technologies Inc.9
An Introduction to L758X Series of Line Card Access
Page 10
L7583A/B/C/D Line Card Access Switch
Data Sheet
February 2001
Switching Behavior
When switching from the power ringing state to the
idle/talk state, via simple logic level input control, the
L7583 is able to provide control with respect to the timing when the ringing access contacts are released relative to the state of the line break contacts.
Make-before-break operation occurs when the line
break switch contacts are closed (or made) before the
ringing access switch contact is opened (or broken).
Break-before-make operation occurs when the ringing
access contact is opened before the line break switch
contacts are closed.
Using the logic level input pins RING, TESTin, and
TESTout, either make-before-break or break-beforemake operation of the L7583 is easily achie ved. The
logic sequences for either mode of operation are given
in Table 13 and Table 14. See the Truth Tables (Table
16 and Table 17) for an explanation of logic states.
When using an L758X in the make-before-break mode,
during the ring-to-idle transition, for a period of up to
one-half the ringing frequency, the ring break switch
and the pnpn-type ring access switch can both be in
the ON state. This is the maximum time after the logic
signal at IN
RING has transitioned that the ring access
switch is waiting for the next zero current cross, so it
can close. During this interval, current that is limited to
the dc break switch current-limit value will be source
from the ring node of the SLIC.
This current is presented to the internal protection circuit. If the SCR-type protector is used (A or C codes), if
by random probability the ring-to-idle transition occurs
during a portion of the ring cycle when the ringing voltage exceeds the protection circuit SCR turn-on volt-
age, and if current in excess of the SCR’s turn-on
current is also available, the SCR may turn on. Once
the SCR is triggered on, if the SLIC is capable of supplying current in excess of the holding current, the SCR
may be latched on by the SLIC.
The probability of this event depends on the characteristics of the given SLIC and of the holding current of the
L7583 A or C device. The SCR hold current distribution
is designed to be safely away from the test limit of
80 mA. The higher the distribution, the lower the probability of the latch.
If this situation is of concern for a given board design,
either use the A or C series device in the break-beforemake mode (eliminates the original 25 ms current
pulse) or use a B or D series device (eliminates the
SCR).
Table 13. Make-Before-Break Operation
RING TESTin TESToutT
5 V0 V0 VFloatPower
0 V0 V0 VFloatMake-
0 V0 V0 VFloatIdle/Talk Zero cross current
SDStateTiming
—OpenClosedClosedOpen
Ringing
SW8 waiting for next
beforebreak
zero current crossing
to turn off maximum
time—one-half of
ringing. In this transi-
tion state, current
that is limited to the
dc break switch cur-
rent-limit v alue will be
sourced f rom the r ing
node of the SLIC.
has occurred.
Break
Switches
3 & 4
ClosedOpenClosedOpen
ClosedOpenOpenOpen
Ring
Return
Switch 7
Ring
Access
Switch 8
All Other
Access
Switches
1010Lucent Technologies Inc.
Page 11
Data Sheet
February 2001
Switching Behavior (continued)
Table 14. Break-Before-Make Operation
L7583A/B/C /D Line Card Access Swi t ch
INPUT TESTin TESToutTSDStateTiming
5 V0 V0 VFloatPower
—OpenClosedClosedOpen
Break
Switches
3 & 4
Ring
Return
Switch
7
Ring
Access
Switch
8
Ringing
5 V0 V5 VFloatAll OffHold this state for
OpenOpenClosedOpen
≤25 ms. SW8 waiting
for zero current to turn
off.
5 V0 V5 VFloatAll OffZero cur r e nt has
OpenOpenOpenOpen
occurred and SW8 has
opened.
0 V0 V0 VFloatIdle/T alk Release break
ClosedOpenOpenOpen
switches.
Notes:
Break-before-make operation can be achieved using T
force the all OFF state, force T
this 25 ms all OFF state, toggle the inputs from 10 (ringing state) to 00 (idle/talk state). After 25 ms, release T
input pins which will set the idle talk state.
When using the L7583A/B/C/D in this mode, forcing T
5 V will allow switch control via the logic INPUT pins. However, setting T
recommended. Therefore, to allow switch control via the logic INPUT pins, allow T
Thus, when using T
switch control via logic input pins and thermal shutdown mechanism is active). This may require use of an open-collector buffer.
Also note that T
down mechanism.
SD as an input, the two recommended states are 0 (overrides logic input pins and forces all OFF state) and float (allows
SD operation in L7583 is different than TSD operation of the L7581, where application of 5 V does not disable the thermal shut-
SD to ground. This will override the logic inputs and also force the all OFF state. Hold this state for 25 ms. During
SD as an input. In lines two and three of Table 14, instead of using the logic input pins to
SD to return switch control to the
SD to ground will override the INPUT pins and force an all OFF state. Setting TSD to
SD to 5 V will also disable the thermal shutdown mechanism. This is not
SD to float.
All Other
Switches
Power Supplies
Both the 5 V and battery supply are brought onto the
L7583. The L7583 requires only the 5 V supply for
switch operation; that is, state control is powered exclusively off of the 5 V supply. Because of this, the L7583
offers extremely low power dissipation, both in the idle
and active states.
The battery voltage is not used for switch state control.
The battery is used as a reference vol tage by the integrated secondary protection circuit. When the voltage
BAT or RBAT drops 2 V to 4 V below the battery, the
at T
integrated SCR will trigger, thus preventing faultinduced overvoltage situations at the T
BAT/RBAT nodes.
Loss of Battery Voltage
As an additional protection feature, the L7583 monitors
the battery voltage. Upon loss of battery voltage, the
L7583 will automatically enter an all OFF state and
remain in that state until the battery voltage is restored.
The L7583 is designed such that the device will enter
the all OFF state if the battery rises above –10 V and
will remain off until the battery drops below –15 V.
Monitoring the battery for the automatic shutdown feature will draw a small current from the battery, typically
4 µA. This will add slightly to the overall power dissipation of the device.
Impulse Noise
Using the L7583 will minimize and possibly eliminate
the contribution to the overall system impulse noise
that is associated with ringing access switches.
Because of this characteristic of the L7583, it may not
be necessary to incorporate a zero cross switching
scheme. This ultimately depends upon the characteristics of the individual system and is best evaluated at
the board level.
Lucent Technologies Inc.11
Page 12
L7583A/B/C/D Line Card Access Switch
Data Sheet
February 2001
Protection
Integrated SLIC Protection
Diode Bridge/SCR
In the L7583A
tion to the SLIC device or other subsequent circuitry is
provided by a combination of current-limited break
switches, a diode bridge/SCR clamping circuit, and a
thermal shutdown mechanism. In the L7583B
the L7583D
or other subsequent circuitry is provided by a combination of current-limited break switches, a diode bridge,
and a thermal shutdown mechanism.
In both protection versions, during a positive lightning
event, fault current is directed to ground via steering
diodes in the diode bridge. Voltage is clamped to a
diode drop above ground. In the A version, negative
lightning causes the SCR to conduct when the voltage
goes 2 V to 4 V more negative than the battery. Fault
currents are then directed to ground via the SCR and
steering diodes in the diode bridge.
Note that for the SCR to foldback or crowbar, the ON
voltage (see Table 14) of the SCR must be less negative than the battery reference voltage. If the battery
voltage is less negative than the SCR ON voltage, the
SCR will conduct fault currents to ground; however, it
will not crowbar.
In the B/D version, negative lightning is directed to battery via steering diodes in the diode bridge.
For power cross and power induction faults, in both
protection versions, the positive cycle of the fault is
clamped a diode drop above ground and fault currents
steered to ground. In the A/C version, the negative
cycle will cause the SCR to trigger when the voltage
exceeds the battery reference voltage by 2 V to 4 V.
When the SCR triggers, fault current is steered to
ground. In the B/D version, the negative cycle of the
power cross is steered to battery.
Current Limiting
During a lightning event, the current that is passed
through the break switches and presented to the integrated protection circuit and subsequent circuitry is limited by the dynamic current-limit response of the break
switches (assuming idle/talk state). When the voltage
seen at the T
an external secondary protector, upon application of a
1000 V , 10 x 1000 pulse (LSSGR lightning), the current
seen at the T
magnitude 2.5 A and duration less than 0.5 µs.
xx and the L7583Cxx versions, protec-
xx and
xx versions, protection to the SLIC device
LINE/RLINE nodes is properly clamp ed by
BAT/RBAT nodes will typically be a pulse of
During a power cross event, the current that is passed
through the break switches and presented to the integrated protection circuit and subsequent circuitry is limited by the dc current-limit response of the break
switches (assuming idle/talk state). The dc current limit
is specified over temperature between 100 mA and
250 mA. Note that the current-limit circuitry has a negative temperature coefficient. Thus, if the device is subjected to an extended power cross, the value of current
seen at T
BAT/RBAT will decrease as the device heats
due to the fault current. If sufficient heating occurs, the
temperature shutdown mechanism will activate and the
device will enter an all off mode.
Temperature Shutdown Mechanism
When the device temperature reaches a minimum of
110 °C, the thermal shutdown mechanism will activate
and force the device into an all OFF state, regardless
of the logic input pins. Pin T
SD, when used as an out-
put, will read 0 V when the device is in the thermal
shutdown mode and +V
DD during normal operation.
During a lightning event, due to the relatively short
duration, the thermal shutdown will not typically activate.
During an extended power cross, the device temperature will rise and cause the device to enter the thermal
shutdown mode. This forces an all off mode, and the
current seen at T
BAT/RBAT drops to zero. Once in the
thermal shutdown mode, the device will cool and exit
the thermal shutdown mode, thus reentering the state it
was in prior to thermal shutdown. Current, limited to the
dc current-limit value, will again begin to flow and
device heating will begin again. This cycle of entering
and exiting thermal shutdown will last as long as the
power cross fault is present. The frequency of entering
and exiting thermal shutdown will depend on the magnitude of the power cross. If the magnitude of the
power cross is great enough, the external secondary
protector may trigger shunting all current to ground.
In the L7583, the thermal shutdown mechanism can be
disabled by forcing the T
SD pin to +VDD. This functional-
ity is different from the L7581, whose thermal shutdown
mechanism cannot be disabled.
Electrical specifications relating to the integrated overvoltage clamping circuit are outlined in Table 15.
1212Lucent Technologies Inc.
Page 13
Data Sheet
February 2001
L7583A/B/C /D Line Card Access Swi t ch
Protection (continued)
Integrated SLIC Protection (continued)
External Seconda ry Pr ot e ct or
With the above integrated protection features, only one
overvoltage secondary protection device on the loop
side of the L7583 is required. The purpose of this
device is to limit fault voltages seen by the L7583 so as
not to exceed the breakdown voltage or input-output
isolation rating of the device. To minimize stress on the
L7583, use of a foldback- or crowbar-type device is recommended. A detailed explanation and design equations on the choice of the external secondary protection
device are given in the
of Line Card Access Switches
design equations governing the choice of external secondary protector are given below.
Series current-limiting fused resistors or PTCs should
be chosen so as not to exceed the current rating of the
external secondary protector. Refer to the manufacturer’s data sheet for requirements.
Hold Current——70——mA
Gate Trigger VoltageTrigger current—V
Reverse Leakage CurrentV
ON-State Voltage
§
0.5 A, t = 0.5 µs
2.0 A, t = 0.5 µs
* Previous versions of this data sheet specified a Trigger Current of 50 mA minimum. Trigger Current is defined as the minimum current drawn
from tip and ring to turn on the SCR. The specification in this data sheet is Gate Trigger Current, which is defined as the maximum current
that can flow into the battery before the SCR turns on.
† Typical at 25 °C.
‡ Twice ± dynamic current limit of break switches.
§ In some instances, the typical ON-state voltage can range as low as –25 V.
BAT———1.0µA
VON
—
BAT – 4—VBAT – 2V
—
—
–3
–5
—
—
V
V
Lucent Technologies Inc.13
Page 14
VBAT
<1 µA
3 V
dc CURRENT-LIMIT
BREAK SWITCHES
V
BAT – 2
V
ON
50 mA
dc CURRENT LIMIT
(OF BREAK SWITCHES)
V
BAT – 4
I
H
VBAT
<1 µA
3 V
dc CURRENT-LIMIT
BREAK SWITCHES
dc CURRENT LIMIT
(OF BREAK SWITCHES)
V
BAT – 3
L7583A/B/C/D Line Card Access Switch
Typical Performance Characteristics
ILIMIT
Data Sheet
February 2001
+I
CURRENT
LIMITING
2/3 RON
Figure 3. Protection Circuit A/C Version
12-2309.f (F)
–V
2/3 RON
CURRENT
–V
–1.5 V
RON
LIMITING
1.5 V
ILIMIT
–I
Figure 5. Switches 1—5, 7, 9, 10
+I
RON
–VOS
OS
+V
RON
+V
12-2311 (F)
+V
–I
12-2312 (F)
Figure 6. Switches 6, 8
Figure 4. Protection Circuit B/D Version
1414Lucent Technologies Inc.
12-2309.b (F)
Page 15
Data Sheet
February 2001
Application
L7583A/B/C /D Line Card Access Swi t ch
RINGING
TEST RETURN
SW5
VBAT
(REFERENCE)
TIP
RING
R1
R2
CROWBAR
PROTECTION
SW9
TEST OUTRINGING
SW10
TEST OUT
RETURN
SW3 BREAK
BREAK SW4
SW8
RINGING
ACCESS
RINGING TEST
RING
GENERATOR
BATTERY
SW6
SW1SW7
TEST IN
SW2
TEST IN
SCR
AND
TRIP
CKT
TIP
BATTERY
FEED
RING
12-2366.d (F)
Figure 7. Typical LCAS Application, Idle, or Talk State Shown (A/C-Type Internal Protection Shown)
A parallel in/parallel out data latch is integrated into the L7583A/B. Operation of the data latch is controlled by the
logic level input pin LA TCH. The data input to the latch is the INPUT pin of the L7583A/B, and the output of the data
latch is an internal node used for state control.
When the LATCH control pin is at logic 0, the data latch is transparent and data control signals flow directly from
INPUT, through the data latch to state control. Any changes in INPUT will be reflected in the state of the switches.
When the LATCH control pin is at logic 1, the data latch is active—the L7583A/B will no longer react to changes at
the INPUT control pin. The state of the switches is now latched; that is, the state of the switches will remain as they
were when the LATCH input transitioned from logic 0 to logic 1. The switches will not respond to changes in INPUT
as long as LATCH is held high.
Note that the T
SD input is not tied to the data latch. TSD is not affected by the LATCH input. TSD input will override
A parallel in/parallel out data latch is integrated into the L7583C/D. Operation of the data latch is controlled by the
logic level input pin LATCH. The data input to the latch is the INPUT pin of the L7583C/D and the output of the data
latch is an internal node used for state control.
When the LATCH control pin is at logic 0, the data latch is transparent and data control signals flow directly from
INPUT, through the data latch to state control. Any changes in INPUT will be reflected in the state of the switches.
When the LATCH control pin is at logic 1, the data latch is active; the L7583C/D will no longer react to changes at
the INPUT control pin. The state of the switches is now latched; that is, the state of the switches will remain as they
were when the LATCH input transitioned from logic 0 to logic 1. The switches will not respond to changes in INPUT
as long as LATCH is held high.
Note that the T
SD input is not tied to the data latch. TSD is not affected by the LATCH input. TSD input will override
state control via INPUT and LATCH.
Lucent Technologies Inc.17
Page 18
L7583A/B/C/D Line Card Access Switch
Data Sheet
February 2001
Outline Diagrams
24-Pin, Plastic DIP (600 mil)
Note: The dimensions in this outline diagram are intended for informational purposes only. For detailed schematics
to assist your design efforts, please contact your Lucent Technologies Sales Representative.
N
1
PIN #1 IDENTIFIER ZONE
2.54 TYP
Number
of Pins
(N)
L
Maximum
Length
(L)
0.58 MAX
B
H
SEATING PLANE
0.38 MIN
Maximum Width
Without Leads
(B)
Maximum Width
Including Leads
(W)
W
Maximum Height
Above Board
(H)
2432.2613.9715.495.49
5-4410 (F)
18Lucent Technologies Inc.
Page 19
Data Sheet
February 2001
L7583A/B/C /D Line Card Access Swi t ch
Outline Diagrams (continued)
28-Pin, Plastic SOG
Note: The dimensions in this outline diagram are intended for informational purposes only. For detailed schemat-
ics to assist your design efforts, please contact your Lucent Technologies Sales Representative.
L
N
B
1
PIN #1 IDENTIFIER ZONE
1.27 TYP
Number
of Pins
Maximum Length
(N)
(L)
0.51 MAX
H
SEATING PLANE
0.28 MAX
Maximum Width
Without Leads
(B)
0.10
0.61
Maximum Width
Including Leads
(W)
W
Maximum Height
2818.117.6210.642.67
Above Board
(H)
5-4414 (F)
Lucent Technologies Inc.19
Page 20
L7583A/B/C/D Line Card Access Switch
Data Sheet
February 2001
Ordering Information
Device Part No. Description Package Comcode
ATTL7583AAJ -D Line Card Access Switch 28-Pin SOG (Dry-bagged) 107338626
ATTL7583AAJ-DT* Line Card Access Switch 28-Pin SOG (Tape & Reel, Dry-bagged) 107338659
ATTL7583AF Line Card Access Switch 24-Pin DIP 107338592
ATTL7583BAJ-D Line Card Access Switch 28-Pin SOG (Dry-bagged) 107394355
ATTL7583BAJ-DT* Line Card Access Switch 28-Pin SOG (Tape & Reel, Dry-bagged) 107411563
ATTL7583BF Line Card Access Switch 24-Pin DIP 107394306
ATTL7583CAJ-D Line Card Access Switch 28-Pin SOG (Dry-bagged) 107602229
ATTL7583CAJ-DT* Line Card Access Switch 28-Pin SOG (Tape & Reel, Dry-bagged) 107602245
ATTL7583CF Line Card Access Switch 24-Pin DIP 107602278
ATTL7583DAJ-D Line Card Access Switch 28-Pin SOG (Dry-bagged) 107602328
ATTL7583DAJ-DT* Line Card Access Switch 28-Pin SOG (Tape & Reel, Dry-bagged) 107602344
ATTL7583DF Line Card Access Switch 24-Pin DIP 107602377
*Devices on tape and reel must be ordered in 1000-piece increments.
For additional information, contact your Microelectronics Group Account Manager or the following:
INTERNET: http://www.lucent.com/micro
E-MAIL: docmaster@micro.lucent.com
N. AMERICA:Microelectronics Group, Lucent Technologies Inc., 555 Union Boulevard, Room 30L-15P-BA, Allentown, PA 18109-3286
ASIA PACIFIC:Microelectronics Group, Lucent Technologies Singapore Pte. Ltd., 77 Science Park Drive, #03-18 Cintech III, Singapore 118256
CHINA: Microelectronics Group, Lucent Technologies (China) Co., Ltd., A-F2, 23/F, Zao Fong Universe Building, 1800 Zhong Shan Xi Road, Shanghai
JAPAN: Microelectronics Group, Lucent Technologies Japan Ltd., 7-18, Higashi-Gotanda 2-chome, Shinagawa-ku, Tokyo 141, Japan
EUROPE: Data Requests: MICROELECTRONICS GROUP DATALINE: Tel. (44) 7000 582 368, FAX (44) 1189 328 148
Lucent Technologies Inc. reserves the right to make changes to the product(s) or information contained herein without notice. No liability is assumed as a result of their use or application. No
rights under any patent accompany the sale of any such product(s) or information.