Latch Feature Holds Inputs to Previous Logic State
•
High Reliability CMOS Process
•
20 Year Data Retention
100 Erase/Write Cyc le s
2,000V ESD Protection
200 mA Latchup Immunity
Commercial and Industrial Temperature Ranges
•
Dual-in-Line and Surface Mount Packages in Standard Pinouts
•
Block Diagram
High
Performance
2
E
PLD
ATF22V10CZ
Preliminary
Description
The ATF22V10CZ is a high performance CMOS (Electrically Erasable) Programmable Logic Device (PLD) which utilizes Atmel’s proven electrically erasable Flash memory technology. Speeds down to 12 ns with zero standby power dissipation are offered. All speed ranges are specified over the full 5V ±10% range for industrial temperature ranges; 5V ± 5% for commercial range 5-volt devices.
Note:1. For PLCC, P1, P8, P15 and P22 can be left un con-
nected. Connect V
to pin 1 and GND to 8, 15, and
CC
22.
Rev. 0778B/V10CZ-B–04/98
Page 2
The ATF22V10CZ provides a “zero” power CMOS PLD
solution with 5V operating voltages. The ATF22V10CZ
powers down automatically to th e zero power mode
through Atmel’s patented Input Transition Detection (ITD)
circuitry when the device is idle. The ATF22V10CZ has
an edge-sensing power down feature, offering “zero” (25
µA worst case) standby power. This feature allows the
user to manage total system power to meet specific application requirements and enhance reliability. Pin “ keeper”
Absolute Maximum Ratings*
circuits on input and output pins eliminate static power
consumed by pull-up resistors.
The ATF22V10CZ incorporates a superset of the generic
architectu res, which allows direc t replacement of the
22V10 family and most 24-pin combinatorial PLDs. Ten
outputs are each allocated 8 to 16 product terms. Three
different modes of operation, configured automatically
with software, allow highly complex logic functions to be
realized.
Temperature Under Bias...................-40°C to +85°C
Storage Temperature......................-65°C to +150°C
Voltage on Any Pin with
Respect to Ground.........................-2.0V to +7.0V
(1)
*NOTICE: Stresses beyond those listed under “Absolute Maxi-
mum Ratings” may cause permanent damage to the device.
This is a stress rating only and functional operation of the
device at these or an y ot he r con ditions beyond those indicated in the oper ational secti ons of this specification is not
implied. Exposure to absolute maxi mum rating conditions
for extended periods may affect device reliability.
Voltage on Input Pins
with Respect to Ground
During Programming....................-2.0V to +14.0V
Programming Voltage with
Respect to Ground.......................-2.0V to +14.0V
(1)
(1)
Note:1. Minimum voltage is -0.6V dc, which may undershoot
to -2.0V for pulses of less than 20 ns. Maximum output pin voltage is Vcc + 0.75V dc, which may overshoot to 7.0V for pulses of less than 20 ns.
DC and AC Operating Conditions
CommercialIndustrial
Operating Temperature (Case)0°C - 70°C-40°C - 85°C
V
Power Supply5V ± 5%5V ± 10%
CC
2
ATF22V10CZ
Page 3
Functional Logic Diagram Description
The Functional Logic Diagram describes the
ATF22V10CZ architecture.
The ATF22V10CZ has 12 inputs and 10 I/O macrocells.
Each macrocell can be configured into one of four output
configurations: active high/low, registered/combinatorial
output. The universal architecture of the ATF22V10CZ
can be programmed to emulate most 24-pin PAL devices.
DC Characteristics
ATF22V10CZ
Unused product terms are automatically disabled by the
compiler to decrease power consumption. A Security
Fuse, when programmed, protects the contents of the
ATF22V10CZ. Eight bytes (64 fuses) of User Signature
are accessible to the user for purposes such as storing
project nam e, part number, revision or date. The User
Signature is accessible regardless of the state of the Security Fuse.
Symbol ParameterConditionMinTypMaxUnits
I
IL
I
IH
I
CC
I
SB
I
OS
V
IL
V
IH
V
OL
V
OH
Note: 1. Not more than one output at a time should be shorted. Duration of short circuit test should not exceed 30 sec.
Input or I/O Low
Leakage Current
Input or I/O High
Leakage Current
Clocked Power
Supply Current
Power Supply Current,
Standby
Output Short Circuit
(1)
Current
0 ≤ V
3.5 ≤ V
V
Outputs Open,
f = 15 MHz
V
V
Outputs Open
V
≤ VIL(max)-10µA
IN
≤ V
IN
CC
= MAX,
CC
= MAX,
CC
= MAX,
IN
= 0.5V-150mA
OUT
Com.
Ind.
Com.
Ind.
90
90
5
5
150
180
Input Low Voltage-0.50.8V
Input High Voltage2.0VCC + 0.75V
= VIH or V
V
Output Low Voltage
Output High Voltage
IN
VCC = MIN,
I
= 16 mA
OL
= VIH or VIL,
V
IN
V
= MIN,
CC
I
= -4.0 mA
OH
IL
Com.
Ind.
2.4V
10µA
25
50
0.5V
mA
mA
µA
µA
3
Page 4
AC Waveforms
AC Characteristics
(1)
-12-15
SymbolParameter
t
PD
t
CF
t
CO
t
S
t
H
t
P
t
W
Input to Feedback to Non-Registered Output312315ns
Clock to Feedback64.5ns
Clock to Output2828ns
Input or Feedback Setup Time1010ns
Input Hold Time00ns
Clock Period1212ns
Clock Width66ns
External Feedback 1/(tS + tCO)
F
MAX
Internal Feedback 1/(t
No Feedback 1/(t
t
EA
t
ER
t
PZX
t
PXZ
t
AP
t
SP
t
AW
t
AR
t
SPR
Input to Output Enable - Product Term312315ns
Input to Output Disable - Product Term215315ns
OE Pin to Output Enable212215ns
OE Pin to Output Disable215215ns
Input or I/O to Asynchronous Reset of Register310315ns
Setup Time, Synchronous Preset1010ns
Asynchronous Reset Width78ns
Asynchronous Reset Recovery Time56ns
Synchronous Preset to Clock Recovery Time1010ns
+ tCF)
S
)
P
MinMaxMinMax
55.5
62
83.3
55.5
69
83.3
Units
MHz
MHz
MHz
Note:1. See ordering in fo rma ti on for valid part numb ers .
4
ATF22V10CZ
Page 5
ATF22V10CZ
Input Test Waveforms and
Measurement Levels
Pin Capacitance (f = 1 MHz, T = 25°C)
Output Test Loads
Note:Similar competitors’ devices are specified
with slightly different loads. These load differences may affect output signals’ delay and slew
rate. Atmel devices are tested with sufficient
margins to meet compatible device specification
conditions.
(1)
TypMaxUnitsConditions
C
IN
C
OUT
Note:1. Typical values for nominal supply voltage. This parameter is only sampled and is not 100% tested.
58pFV
68pFV
= 0V
IN
OUT
= 0V
5
Page 6
Power Up Reset
The registers in the ATF22V10CZ are designed to reset
during power up. At a point delayed slight ly from V
crossing V
, all registers will be reset to the low state.
RST
The output state will depend on the polarity of the buffer.
This feat ure is critical for s tate machine initialization.
However, due to the asynchronous nature of reset and the
uncertainty of how V
actually rises in the system, the
CC
following conditions are required:
1. The V
2. The clock must remain stable during T
rise must be monotonic and start below 0.7V.
CC
PR.
3. After TPR occurs, all input and feedback setup times
must be met before driving the clock pin high.
CC
file preload sequence will be done automatically by most
of the approved programmers after the programming.
Electronic Signature Word
There are 64 bits of programmable memory that are always available to the user, even if the device is secured.
These bits can be used for user-specific data.
Security Fuse Usage
A single fuse is provided to prevent unauthorized copying
of the ATF22V10CZ fuse patterns. Once programmed,
fuse verify and preload are inhibited. However, the 64-bit
User Signature remains accessible. The security fuse
should be programmed last, as its effect is immediate.
Preload of Register Outputs
The ATF22V10CZ’s registers are provided with circuitry to
allow loading of each register with either a high or a low.
This feature will simplify testing since any st ate can be
forced into the registers to control test sequencing. A
Programming/Erasing
Programmin g/erasing is performed using standard PLD
programmers. See CMOS PLD Programming Hardware
& Software Support for information on software/programming.
JEDEC file with preload is generated when a source file
with vectors is compiled. Once downloaded, the JEDEC
V
R
ST
POWER
t
PR
REGISTERED
OUTP UTS
C
LOCK
t
S
t
W
ParameterDescriptionTypMaxUnits
T
V
PR
RST
Power-Up
Reset Time
Power-Up
Reset Voltage
6001,000ns
3.84.5V
6
ATF22V10CZ
Page 7
Input and I/O Pull-Ups
All ATF22V10CZ family members have internal input and
I/O pin-keeper circuits. Therefore, whenever inputs or
I/Os are not being driven externally, they will maintain their
last driven state. This ensures that all logic array inputs
Input Diagram
ATF22V10CZ
and device outputs are at known states. These are relatively weak active circuits that can be easily overridden by
TTL-compatible drivers (see input and I/O diagrams below).
I/O Diagram
7
Page 8
Functional Logic Diagram ATF22V10CZ
8
ATF22V10CZ
Page 9
ATF22V10CZ
t
PD
(ns)
12108ATF22V10CZ-12JC28JCommercial
154.58ATF22V10CZ-15JC28JCommercial
t
S
(ns)
4.58ATF22V10CZ-15JI28JIndustrial
t
CO
(ns)
Ordering CodePackageOperation Range
ATF22V10CZ-12PC24P3(0°C to 70°C)
ATF22V10CZ-12SC24S
ATF22V10CZ-12XC24X
ATF22V10CZ-15PC24P3(0°C to 70°C)
ATF22V10CZ-15SC24S
ATF22V10CZ-15XC24X
ATF22V10CZ-15PI24P3(-40°C to +85°C)
ATF22V10CZ-15SI24S
ATF22V10CZ-15XI24X
28J
24P3
24S
24X
Package Type
28-Lead, Plastic J-Leaded Chip Carrier (PLCC)
24-Lead, 0.300" Wide, Plastic Dual Inline Package (DIP)
24-Lead, 0.300" Wid e, Plastic Gull WIng Smal l O ut li ne (SOI C)
24-Lead, 4.4 mm Wide, Plastic Thin Shrink Small Outline (TSSOP)
9
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