– 20 Year Data Retention
– 100 Erase/Write Cycles
– 2,000V ESD Protection
– 200 mA Latchup Immunity
• Commercial, and Industrial Temperature Ranges
• Dual-in-line and Surface Mount Packages in Standard Pinouts
• PCI-compliant
• Green Package Options (Pb/Halide-free/RoHS Compliant) Available
1.Description
The ATF16V8B is a high-performance CMOS (electricallyerasable) programmable
logic device (PLD) that utilizes Atmel’s proven electrically-erasable Flash memory
technology. All speed ranges are specified over the full 5V ± 10% range for industrial
temperature ranges, and 5V ± 5% for commercial temperature ranges.
Highperformance
EE PLD
ATF16V8B
ATF16V8BQ
ATF16V8BQL
Several low-power options allow selection of the best solution for various types of
power-limited applications. Each of these options significantly reduces total system
power and enhances system reliability.
The ATF16V8Bs incorporate a superset of the generic architectures, which allows
direct replacement of the 16R8 family and most 20-pin combinatorial PLDs. Eight outputs are each allocated eight product terms. Three different modes of operation,
configured automatically with software, allow highly complex logic functions to be
realized.
0364J–PLD–7/05
Page 2
Figure 1-1.Block Diagram
2.Pin Configurations
Table 2-1.Pin Configurations (All Pinouts Top View)
Pin NameFunction
CLKClock
ILogic Inputs
I/OBi-directional Buffers
OE
Output Enable
VCC+5V Supply
Figure 2-1.TSSOPFigure 2-2.DIP/SOIC
1
I/CLK
GND
2
I1
3
I2
4
I3
5
I4
6
I5
7
I6
8
I7
9
I8
10
VCC
20
I/O
19
I/O
18
I/O
17
I/O
16
I/O
15
I/O
14
I/O
13
I/O
12
I9/OE
11
I/CLK
GND
1
2
I1
3
I2
4
I3
5
I4
6
I5
7
I6
8
I7
9
I8
10
Figure 2-3.PLCC
I2I1I/CLK
VCC
I/O
321
20
19
18
I3
I4
I5
I6
I7
4
5
6
7
8
910111213
I8
GND
I9/OE
I/O
17
I/O
16
I/O
15
I/O
14
I/O
I/O
I/O
20
VCC
19
I/O
18
I/O
17
I/O
16
I/O
15
I/O
14
I/O
13
I/O
12
I/O
11
I9/OE
2
ATF16V8B/BQ/BQL
0364J–PLD–7/05
Page 3
ATF16V8B/BQ/BQL
3.Absolute Maximum Ratings*
Temperature Under Bias.................................-55oC to +125oC
Storage Temperature ......................................-65
Voltage on Any Pin with
Respect to Ground .......................................-2.0 V to +7.0 V
o
C to +150oC
(1)
Voltage on Input Pins
with Respect to Ground
During Programming...................................-2.0 V to +14.0 V
Programming Voltage with
Respect to Ground .....................................-2.0 V to +14.0 V
(1)
(1)
4.DC and AC Operating Conditions
Operating Temperature (Ambient)0
Power Supply5V ± 5%5V ± 10%
V
CC
*NOTICE:Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and
functional operation of the device at these or any
other conditions beyond those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions for extended periods may affect device
reliability.
Note:1. Minimum voltage is -0.6V DC, which may under-
shoot to -2.0V for pulses of less than 20 ns.
Maximum output pin voltage is V
which may overshoot to 7.0V for pulses of less
than 20 ns.
CommercialIndustrial
o
C - 70oC-40
CC
o
C - 85oC
+ 0.75V DC,
0364J–PLD–7/05
3
Page 4
4.1DC Characteristics
SymbolParameterConditionMinTypMaxUnits
I
IL
Input or I/O Low
Leakage Current
0 ≤ V
≤ VIL(Max)-35-100µA
IN
I
IH
Input or I/O High
Leakage Current
3.5 ≤ V
IN
≤ V
CC
10µA
Com.5585mA
B-10
Ind.5595mA
= Max,
V
I
CC
Power Supply
Current, Standby
CC
= Max,
V
IN
Outputs Open
B-15Com.5075mA
B-15Ind.5080mA
BQ-10Com.3555mA
BQL-15Com.510mA
BQL-15Ind.515mA
Com.6090mA
B-10
Ind.60100mA
B-15Com.5585mA
B-15Ind.5595mA
BQ-10Com.4055mA
I
CC2
Clocked Power
Supply Current
= Max,
V
CC
Outputs Open,
f = 15 MHz
BQL-15Com.2035mA
BQL-15Ind.2040mA
(1)
I
OS
V
IL
V
IH
V
OL
V
OH
Output Short
Circuit Current
= 0.5 V-130mA
V
OUT
Input Low Voltage-0.50.8V
Input High Voltage2.0VCC+0.75V
V
Output High Voltage
Output High Voltage
= VIH or VIL,
IN
V
= Min
CC
= VIH or VIL,
V
IN
= Min
V
CC
IOL = -24 mA
Com., Ind.
= -4.0 mA2.4V
I
OH
0.5V
Note:1. Not more than one output at a time should be shorted. Duration of short circuit test should not exceed 30 sec.
4
ATF16V8B/BQ/BQL
0364J–PLD–7/05
Page 5
ATF16V8B/BQ/BQL
4.2AC Waveforms
(1)
Note:1. Timing measurement reference is 1.5V. Input AC driving levels are 0.0V 3.0V, unless otherwise
4.3AC Characteristics
SymbolParameter
specified.
(1)
-10-15
UnitsMinMaxMinMax
t
PD
t
CF
t
CO
t
S
t
H
t
P
t
W
Input or Feedback to
Non-Registered Output
8 outputs switching
Clock to Feedback68ns
Clock to Output27210ns
Input or Feedback
Setup Time
Hold Time00ns
Clock Period1216ns
Clock Width68ns
External Feedback 1/(tS + tCO)6845MHz
f
MAX
t
EA
t
ER
t
PZX
t
PXZ
Internal Feedback 1/(t
No Feedback 1/(t
Input to Output Enable — Product Term310315ns
Input to Output Disable — Product Term210215ns
OE pin to Output Enable210215ns
OE pin to Output Disable1.5101.515ns
+ tCF)7450MHz
S
)8362MHz
P
Note:1. See ordering information for valid part numbers and speed grades.
310315
ns
7.512ns
0364J–PLD–7/05
5
Page 6
4.4Input Test Waveforms
4.4.1Input Test Waveforms and Measurement Levels
t
, tF < 5 ns (10% to 90%)
R
4.4.2Output Test Loads (Commercial)
C
includes Test fixture and Probe capacitance
L
4.5Pin Capacitance
Table 4-1.Pin Capacitance (f = 1 MHz, T = 25°C
TypMaxUnitsConditions
C
IN
C
OUT
Note:1. Typical values for nominal supply voltage. This parameter is only sampled and is not 100%
tested.
58 pFV
68 pFV
(1)
)
= 0V
IN
= 0V
OUT
6
ATF16V8B/BQ/BQL
0364J–PLD–7/05
Page 7
4.6Power-up Reset
The registers in the ATF16V8Bs are designed to reset during power-up. At a point delayed
slightly from V
tered output state will always be high on power-up.
This feature is critical for state machine initialization. However, due to the asynchronous nature
of reset and the uncertainty of how V
required:
crossing V
CC
ATF16V8B/BQ/BQL
, all registers will be reset to the low state. As a result, the regis-
RST
actually rises in the system, the following conditions are
CC
1. The V
rise must be monotonic,
CC
2. After reset occurs, all input and feedback setup times must be met before driving the
clock pin high, and
3. The clock must remain stable during t
PR
.
Figure 4-1.Power-up Reset Waveforms
Table 4-2.Power-up Reset Parameters
ParameterDescriptionTypMaxUnits
t
PR
V
RST
Power-up
Reset Time
Power-up
Reset Voltage
6001,000ns
3.84.5V
4.7Preload of Registered Outputs
The ATF16V8B’s registers are provided with circuitry to allow loading of each register with either
a high or a low. This feature will simplify testing since any state can be forced into the registers
to control test sequencing. A JEDEC file with preload is generated when a source file with vectors is compiled. Once downloaded, the JEDEC file preload sequence will be done automatically
by most of the approved programmers after the programming.
5.Security Fuse Usage
A single fuse is provided to prevent unauthorized copying of the ATF16V8B fuse patterns. Once
programmed, fuse verify and preload are inhibited. However, the 64-bit User Signature remains
accessible.
The security fuse should be programmed last, as its effect is immediate.
0364J–PLD–7/05
7
Page 8
6.Electronic Signature Word
There are 64 bits of programmable memory that are always available to the user, even if the
device is secured. These bits can be used for user-specific data.
7.Programming/Erasing
Programming/erasing is performed using standard PLD programmers. See CMOS PLD Programming Hardware and Software Support for information on software/programming.
8.Input and I/O Pull-ups
All ATF16V8B family members have internal input and I/O pull-up resistors. Therefore, whenever inputs or I/Os are not being driven externally, they will float to V
logic array inputs are at known states. These are relatively weak active pull-ups that can easily
be overdriven by TTL-compatible drivers (see input and I/O diagrams below).
Figure 8-1.Input Diagram
. This ensures that all
CC
Figure 8-2.I/O Diagram
9.Functional Logic Diagram Description
The Logic Option and Functional Diagrams describe the ATF16V8B architecture. Eight configurable macrocells can be configured as a registered output, combinatorial I/O, combinatorial
output, or dedicated input.
The ATF16V8B can be configured in one of three different modes. Each mode makes the
ATF16V8B look like a different device. Most PLD compilers can choose the right mode automatically. The user can also force the selection by supplying the compiler with a mode selection.
The determining factors would be the usage of register versus combinatorial outputs and dedicated outputs versus outputs with output enable control.
The ATF16V8B universal architecture can be programmed to emulate many 20-pin PAL
devices. These architectural subsets can be found in each of the configuration modes described
8
ATF16V8B/BQ/BQL
0364J–PLD–7/05
Page 9
in the following pages. The user can download the listed subset device JEDEC programming file
to the PLD programmer, and the ATF16V8B can be configured to act like the chosen device.
Check with your programmer manufacturer for this capability.
Unused product terms are automatically disabled by the compiler to decrease power consumption. A security fuse, when programmed, protects the content of the ATF16V8B. Eight bytes (64
fuses) of User Signature are accessible to the user for purposes such as storing project name,
part number, revision, or date. The User Signature is accessible regardless of the state of the
security fuse.
10. Software Support
Atmel-WinCUPL is a free tool, available on Atmel’s web site and can be used to design in all
members of the Atmel ATF16V8B family of SPLDs. Table 10-1 lists popular compilers with the
appropriate device mnemonics
Software compilers support the three different OMC modes as different device types. Most compilers have the ability to automatically select the device type, generally based on the register
usage and output enable (OE) usage. Register usage on the device forces the software to
choose the registered mode. All combinatorial outputs with OE controlled by the product term
will force the software to choose the complex mode. The software will choose the simple mode
only when all outputs are dedicated combinatorial without OE control. The different device types
can be used to override the automatic device selection by the software. For further details, refer
to the compiler software manuals.
When using compiler software to configure the device, the user must pay special attention to the
following restrictions in each mode.
In registered mode pin 1 and pin 11 are permanently configured as clock and output enable,
respectively. These pins cannot be configured as dedicated inputs in the registered mode.
In complex mode pin 1 and pin 11 become dedicated inputs and use the feedback paths of pin
19 and pin 12 respectively. Because of this feedback path usage, pin 19 and pin 12 do not have
the feedback option in this mode.
In simple mode all feedback paths of the output pins are routed via the adjacent pins. In doing
so, the two inner most pins (pins 15 and 16) will not have the feedback option as these pins are
always configured as dedicated combinatorial output.
0364J–PLD–7/05
9
Page 10
11.1ATF16V8B Registered Mode
PAL Device Emulation/PAL Replacement. The registered mode is used if one or more regis-
ters are required. Each macrocell can be configured as either a registered or combinatorial
output or I/O, or as an input. For a registered output or I/O, the output is enabled by the OE
and the register is clocked by the CLK pin. Eight product terms are allocated to the sum term.
For a combinatorial output or I/O, the output enable is controlled by a product term, and seven
product terms are allocated to the sum term. When the macrocell is configured as an input, the
output enable is permanently disabled.
Any register usage will make the compiler select this mode. The following registered devices
can be emulated using this mode:
16R8 16RP8
16R6 16RP6
16R4 16RP4
pin,
Figure 11-1. Registered Configuration for Registered Mode
Notes: 1. Pin 1 controls common CLK for the registered outputs. Pin 11 controls common OE for the reg-
istered outputs. Pin 1 and Pin 11 are permanently configured as CLK and OE.
2. The development software configures all the architecture control bits and checks for proper pin
usage automatically.
Figure 11-2. Combinatorial Configuration for Registered Mode
(1)(2)
(1)(2)
10
Notes: 1. Pin 1 and Pin 11 are permanently configured as CLK and OE.
2. The development software configures all the architecture control bits and checks for proper pin
usage automatically.
ATF16V8B/BQ/BQL
0364J–PLD–7/05
Page 11
Figure 11-3. Registered Mode Logic Diagram
ATF16V8B/BQ/BQL
0364J–PLD–7/05
11
Page 12
11.2ATF16V8B Complex Mode
PAL Device Emulation/PAL Replacement. In the complex mode, combinatorial output and I/O
functions are possible. Pins 1 and 11 are regular inputs to the array. Pins 13 through 18 have pin
feedback paths back to the AND-array, which makes full I/O capability possible. Pins 12 and 19
(outermost macrocells) are outputs only. They do not have input capability. In this mode, each
macrocell has seven product terms going to the sum term and one product term enabling the
output.
Combinatorial applications with an OE requirement will make the compiler select this mode. The
following devices can be emulated using this mode:
16L8
16H8
16P8
Figure 11-4. Complex Mode Option
12
ATF16V8B/BQ/BQL
0364J–PLD–7/05
Page 13
Figure 11-5. Complex Mode Logic Diagram
ATF16V8B/BQ/BQL
0364J–PLD–7/05
13
Page 14
11.3ATF16V8B Simple Mode
PAL Device Emulation/PAL Replacement. In the Simple Mode, 8 product terms are allocated
to the sum term. Pins 15 and 16 (center macrocells) are permanently configured as combinatorial outputs. Other macrocells can be either inputs or combinatorial outputs with pin feedback to
the AND-array. Pins 1 and 11 are regular inputs.
The compiler selects this mode when all outputs are combinatorial without OE control. The following simple PALs can be emulated using this mode:
10L8 10H8 10P8
12L6 12H6 12P6
14L4 14H4 14P4
16L2 16H2 16P2
Figure 11-6. Simple Mode Option
14
Note:* Pins 15 and 16 are always enabled.
ATF16V8B/BQ/BQL
0364J–PLD–7/05
Page 15
Figure 11-7. Simple Mode Logic Diagram
ATF16V8B/BQ/BQL
0364J–PLD–7/05
15
Page 16
12. Test Characterization Data
SUPPLY CURRENT vs. INPUT FREQUENCY
ATF16V8B/BQ (VCC = 5V, TA = 25C)
75
I
50
C
C
m
25
A
0
0255075100
FREQUENCY (MHz)
SUPPLY CURRENT vs. SUPPLY VOLTAGE
65
55
I
C
C
45
m
A
35
25
4.504.755.005.255.50
ATF16V8B/BQ (TA = 25C)
SUPPLY VOLTAGE (V)
ATF16V8B
ATF16V8BQ
ATF16V8B
ATF16V8BQ
SUPPLY CURRENT vs. INPUT FREQUENCY
ATF16V8BL/BQL (VCC = 5V, TA = 25C)
75
I
50
C
C
m
25
A
0
0 20406080100
FREQUENCY (MHz)
ATF16V8B
ATF16V8BQL
16
OUTPUT SOURCE CURRENT
vs. SUPPLY VOLTAGE (TA = 25C)
-10
-12
I
-14
O
-16
H
-18
m
-20
A
-22
-24
4.54.74.95.15.35.5
SUPPLY VOLTAGE (V)
ATF16V8B/BQ/BQL
0364J–PLD–7/05
Page 17
ATF16V8B/BQ/BQL
NORMALIZED TPD
vs. SUPPLY VOLTAGE (TA=25°C)
1.3
N
1.15
O
R
M
1
T
0.85
P
D
0.7
4.504.755.0 05.255.50
1.3
N
1.15
O
R
M
1
T
0.85
C
O
0.7
4.504.755.005.255.50
SUPPLY VOLTAGE (V)
NORMALIZED TCO
vs. SUPPLY VOLTAGE(TA=25°C)
SUPPLY VOLTAGE (V)
ATF16V8B/BQ
ATF16V8BQL
ATF16V8B/BQ
ATF16V8BQL
0364J–PLD–7/05
17
Page 18
18
ATF16V8B/BQ/BQL
0364J–PLD–7/05
Page 19
13. ATF16V8B Ordering Information
13.1ATF16V8B Standard Package Options
ATF16V8B/BQ/BQL
t
PD
(ns)
107.57
151210
Note:The last time buy date is Sept. 30, 2005 for shaded parts.
To use commercial product for Industrial temperature ranges, down-grade one speed grade
from the “I” to the “C” device (7 ns “C” = 10 ns “I”) and de-rate power by 30%.
Package Type
20J20-lead, Plastic J-leaded Chip Carrier (PLCC)
20P320-lead, 0.300" Wide, Plastic Dual Inline Package (PDIP)
20S20-lead, 0.300" Wide, Plastic Gull-wing Small Outline (SOIC)
20X20-lead, 4.4 mm Wide, Plastic Thin Shrink Small Outline (TSSOP)
Industrial
(-40°C to 85°C)
0364J–PLD–7/05
19
Page 20
14. ATF16V8BQ/BQL Ordering Information
14.1ATF16V8BQ and ATF16V8BQL Ordering Information
t
PD
(ns)
107.57
151210
Note:The last time buy date is Sept. 30, 2005 for shaded parts.
To use commercial product for Industrial temperature ranges, down-grade one speed grade
from the “I” to the “C” device (7 ns “C” = 10 ns “I”) and de-rate power by 30%.
Package Type
20J20-lead, Plastic J-leaded Chip Carrier (PLCC)
20P320-lead, 0.300" Wide, Plastic Dual Inline Package (PDIP)
20S20-lead, 0.300" Wide, Plastic Gull-Wing Small Outline (SOIC)
20X20-lead, 4.4 mm Wide, Plastic Thin Shrink Small Outline (TSSOP)
20
ATF16V8B/BQ/BQL
0364J–PLD–7/05
Page 21
15. Packaging Information
15.120J – PLCC
ATF16V8B/BQ/BQL
1.14(0.045) X 45˚
B
0.51(0.020)MAX
45˚ MAX (3X)
Notes:1. This package conforms to JEDEC reference MS-018, Variation AA.
2. Dimensions D1 and E1 do not include mold protrusion.
Allowable protrusion is .010"(0.254 mm) per side. Dimension D1
and E1 include mold mismatch and are measured at the extreme
material condition at the upper or lower parting line.
1150 East Cheyenne Mtn. Blvd.
Colorado Springs, CO 80906, USA
Tel: 1(719) 576-3300
Fax: 1(719) 540-1759
Biometrics/Imaging/Hi-Rel MPU/
High Speed Converters/RF Datacom
Avenue de Rochepleine
BP 123
38521 Saint-Egreve Cedex, France
Tel: (33) 4-76-58-30-00
Fax: (33) 4-76-58-34-80
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