• Die Sales: Wafer Form, Tape and Reel, and Bumped Wafers
Description
The AT93C46D provides 1024 bits of serial electrically erasable programmable readonly memory (EEPROM), organized as 64 words of 16 bits each (when the ORG pin is
connected to VCC), and 128 words of 8 bits each (when the ORG pin is tied to
ground). The device is optimized for use in many industrial and commercial applications where low-power and low-voltage operations are essential. The AT93C46D is
available in space-saving 8-lead PDIP, 8-lead JEDEC SOIC, 8-lead Ultra Thin miniMAP (MLP 2x3), 8-lead TSSOP, and 8-lead dBGA2 packages.
Three-wire
Serial
EEPROM
1K (128 x 8 or 64 x 16)
AT93C46D
The AT93C46D is enabled through the Chip Select pin (CS) and accessed via a
three-wire serial interface consisting of Data Input (DI), Data Output (DO), and Shift
Clock (SK). Upon receiving a Read instruction at DI, the address is decoded and the
data is clocked out serially on the DO pin. The Write cycle is completely self-timed,
and no separate Erase cycle is required before Write. The Write cycle is only enabled
when the part is in the Erase/Write Enable state. When CS is brought high following
the initiation of a Write cycle, the DO pin outputs the Ready/Busy status of the part.
The AT93C46D is available in 1.8 (1.8V to 5.5V) version.
Table 0-1.Pin Configurations
Pin NameFunction
CSChip Select
SKSerial Data Clock
DISerial Data Input
DOSerial Data Output
GNDGround
VCCPower Supply
ORGInternal Organization
NCNo Connect
5193F–SEEPR–1/08
Page 2
1.Absolute Maximum Ratings*
Operating Temperature ......................................−55°C to +125°C
Storage Temperature .........................................−65°C to +150°C
Voltage on Any Pin
with Respect to Ground ........................................ −1.0V to +7.0V
Maximum Operating Voltage .......................................... 6.25V
DC Output Current........................................................ 5.0 mA
Figure 1-1.Block Diagram
*NOTICE:Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent damage to the device. This is a stress rating only, and
functional operation of the device at these or any
other conditions beyond those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions for extended periods may affect
device reliability
Notes:1. When the ORG pin is connected to VCC, the “x 16” organization is selected. When it is con-
nected to ground, the “x 8” organization is selected. If the ORG pin is left unconnected and the
application does not load the input beyond the capability of the internal 1 Meg ohm pullup, then
the “x 16” organization is selected.
2. For the AT93C46D, if the “x 16” organization is the mode of choice and pin 6 (ORG) is left
unconnected, Atmel
AT93C46E datasheet.
2
AT93C46D
®
recommends using AT93C46E device. For more details, see the
5193F–SEEPR–1/08
Page 3
AT93C46D
Table 1-1.Pin Capacitance
(1)
Applicable over recommended operating range from TA = 25°C, f = 1.0 MHz, VCC = +1.8V (unless otherwise noted)
SymbolTest ConditionsMaxUnitsConditions
C
OUT
C
IN
Output Capacitance (DO)5pFV
OUT
= 0V
Input Capacitance (CS, SK, DI)5pFVIN = 0V
Note:1. This parameter is characterized and is not 100% tested.
Table 1-2.DC Characteristics
Applicable over recommended operating range from: T
SymbolParameterTest ConditionMinTypMaxUnit
V
CC1
V
CC2
V
CC3
I
CC
I
SB1
I
SB2
I
SB3
I
IL
I
OL
(1)
V
IL1
(1)
V
IH1
(1)
V
IL2
(1)
V
IH2
V
OL1
V
OH1
V
OL2
V
OH2
Note:1. VIL min and VIH max are reference only and are not tested.
Supply Voltage1.85.5V
Supply Voltage2.75.5V
Supply Voltage4.55.5V
Supply CurrentVCC = 5.0V
Standby CurrentVCC = 1.8VCS = 0V0.41.0µA
Standby CurrentVCC = 2.7VCS = 0V6.010.0µA
Standby CurrentVCC = 5.0VCS = 0V10.015.0µA
Input LeakageVIN = 0V to VCC 0.11.0µA
Output LeakageVIN = 0V to VCC 0.11.0µA
Input Low Voltage
2.7V ≤ V
Input High Voltage2.0VCC + 1
Input Low Voltage
1.8V ≤ V
Input High VoltageVCC x 0.7VCC + 1
Output Low Voltage
2.7V ≤ VCC ≤ 5.5V
Output High VoltageIOH = −0.4 mA2.4V
Output Low Voltage
Output High VoltageIOH = −100 µAVCC – 0.2V
1.8V ≤ V
≤ 2.7V
CC
= −40°C to +85°C, VCC = +1.8V to +5.5V (unless otherwise noted)
AI
READ at 1.0 MHz0.52.0mA
WRITE at 1.0 MHz0.52.0mA
−0.60.8
≤ 5.5V
CC
≤ 2.7V
−0.6V
CC
IOL = 2.1 mA0.4V
I
= 0.15 mA0.2V
OL
CC
x 0.3
V
V
5193F–SEEPR–1/08
3
Page 4
Table 1-3.AC Characteristics
Applicable over recommended operating range from T
Note:1. This parameter is ensured by characterization.
4.5V ≤ V
2.7V ≤ V
1.8V ≤ V
4.5V ≤ V
2.7V ≤ V
1.8V ≤ V
4.5V ≤ V
2.7V ≤ V
1.8V ≤ V
4.5V ≤ V
2.7V ≤ V
1.8V ≤ V
4.5V ≤ V
2.7V ≤ V
1.8V ≤ V
4.5V ≤ V
2.7V ≤ V
1.8V ≤ V
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
4.5V ≤ VCC ≤ 5.5V
2.7V ≤ V
1.8V ≤ V
1.8V ≤ V
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V0.135ms
CC
0
0
0
250
250
1000
250
250
1000
250
250
1000
50
50
200
100
100
400
100
100
400
2
1
0.25
250
250
1000
250
250
1000
250
250
1000
100
150
400
MHz
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
4
AT93C46D
5193F–SEEPR–1/08
Page 5
Table 1-4.Instruction Set for the AT93C46D
AT93C46D
Op
InstructionSB
Code
READ110A6 – A
EWEN10011XXXXX11XXXX
ERASE111A6 – A
WRITE101A6 – A
ERAL10010XXXXX10XXXX
WRAL10001XXXXX01XXXXD7 – D
AddressData
0
0
0
A5 – A
A5 – A
A5 – A
0
0
0
D7 – D
0
0
Commentsx 8x 16x 8x 16
Reads data stored in memory, at
specified address
Write enable must precede all
programming modes
Erases memory location An – A
D
15
– D
Writes memory location An – A
0
0
0
Erases all memory locations. Valid
only at V
D
– D
15
Writes all memory locations. Valid
0
only at VCC = 4.5V to 5.5V
= 4.5V to 5.5V
CC
EWDS10000XXXXX00XXXXDisables all programming instructions
Note:The Xs in the address field represent DON’T CARE values and must be clocked.
2.Functional Description
The AT93C46D is accessed via a simple and versatile three-wire serial communication interface. Device operation is controlled by seven instructions issued by the host processor. A validinstruction starts with a rising edge of CS and consists of a start bit (logic “1”) followed by the
appropriate op code and the desired memory address location.
READ (READ): The Read (READ) instruction contains the address code for the memory location to be read. After the instruction and address are decoded, data from the selected memory
location is available at the serial output pin DO. Output data changes are synchronized with the
rising edges of serial clock SK. It should be noted that a dummy bit (logic “0”) precedes the 8- or
16-bit data output string.
ERASE/WRITE ENABLE (EWEN): To assure data integrity, the part automatically goes into the
Erase/Write Disable (EWDS) state when power is first applied. An Erase/Write Enable (EWEN)
instruction must be executed first before any programming instructions can be carried out.
Please note that once in the EWEN state, programming remains enabled until an EWDS instruction is executed or V
power is removed from the part.
CC
ERASE (ERASE): The Erase (ERASE) instruction programs all bits in the specified memory
location to the logical “1” state. The self-timed erase cycle starts once the Erase instruction and
address are decoded. The DO pin outputs the Ready/Busy status of the part if CS is brought
high after being kept low for a minimum of 250 ns (t
). A logic “1” at pin DO indicates that the
CS
selected memory location has been erased and the part is ready for another instruction.
WRITE (WRITE): The Write (WRITE) instruction contains the 8 or 16 bits of data to be written
into the specified memory location. The self-timed programming cycle t
starts after the last bit
WP
of data is received at serial data input pin DI. The DO pin outputs the Read/Busy status of the
part if CS is brought high after being kept low for a minimum of 250 ns (t
). A logic “0” at DO
CS
indicates that programming is still in progress. A logic “1” indicates that the memory location at
the specified address has been written with the data pattern contained in the instruction and the
5193F–SEEPR–1/08
5
Page 6
part is ready for further instructions. A Ready/Busy status cannot be obtained if the CS is
brought high after the end of the self-timed programming cycle tWP.
ERASE ALL (ERAL): The Erase All (ERAL) instruction programs every bit in the memory array
to the logic “1” state and is primarily used for testing purposes. The DO pin outputs the
Ready/Busy status of the part if CS is brought high after being kept low for a minimum of 250 ns
(t
). The ERAL instruction is valid only at VCC = 5.0V ± 10%.
CS
WRITE ALL (WRAL): The Write All (WRAL) instruction programs all memory locations with the
data patterns specified in the instruction. The DO pin outputs the Ready/Busy status of the part if
CS is brought high after being kept low for a minimum of 250 ns (t
valid only at V
= 5.0V ± 10%.
CC
). The WRAL instruction is
CS
ERASE/WRITE DISABLE (EWDS): To protect against accidental data disturb, the Erase/Write
Disable (EWDS) instruction disables all programming modes and should be executed after all
programming operations. The operation of the Read instruction is independent of both the
EWEN and EWDS instructions and can be executed at any time.
6
AT93C46D
5193F–SEEPR–1/08
Page 7
3.Timing Diagrams
μs
High Impedance
t
CS
Figure 3-1.Synchronous Data Timing
AT93C46D
Note:1. This is the minimum SK period.
Table 3-1.Organization Key for Timing Diagrams
I/O
A
D
Figure 3-2.READ Timing
AT93C46D (1K)
x 8x 16
N
N
A
6
D
7
A
5
D
15
5193F–SEEPR–1/08
7
Page 8
Figure 3-3.EWEN Timing
CS
11
...
001
SK
DI
t
CS
CS
t
CS
SK
DI10
000
...
SK
CS
t
CS
t
WP
11
A
N
D
N
0A0D0
......
DI
DO
HIGH IMPEDANCE
BUSY
READY
Figure 3-4.EWDS Timing
Figure 3-5.WRITE Timing
8
AT93C46D
5193F–SEEPR–1/08
Page 9
AT93C46D
CS
SK
DI
DO
HIGH IMPEDANCE
BUSY
READY
1001...D
N
t
CS
t
WP
...D00
SK
11...1
CS
DIA
N
t
CS
t
SV
t
DF
t
WP
A
N-1AN-2
A0
CHECK
STATUS
STANDBY
READY
BUSY
DO
HIGH IMPEDANCE
HIGH IMPEDANCE
Figure 3-6.WRAL Timing
(1)
Note:1. Valid only at VCC = 4.5V to 5.5V.
Figure 3-7.ERASE Timing
5193F–SEEPR–1/08
9
Page 10
Figure 3-8.ERAL Timing
SK
CS
DI11000
DO
HIGH IMPEDANCE
HIGH IMPEDANCE
READY
BUSY
CHECK
STATUS
STANDBY
t
WP
t
CS
t
SV
t
DF
(1)
Note:1. Valid only at VCC = 4.5V to 5.5V.
10
AT93C46D
5193F–SEEPR–1/08
Page 11
AT93C46D
4.AT93C46D Ordering Information
Ordering CodeVoltagePackageOperation Range
AT93C46D-PU (Bulk form only)1.88P3
(1)
AT93C46DN-SH-B
AT93C46DN-SH-T
AT93C46D-TH-B
AT93C46D-TH-T
AT93C46DY6-YH-T
AT93C46DU3-UU-T
AT93C46D-W-11
Notes:1. “-B” denotes bulk
2. “-T” denotes tape and reel. SOIC = 4K per reel. TSSOP, Ultra Thin Mini MAP, and dBGA2 = 5K per reel.
3. Available in tape and reel, and wafer form; order as SL788 for inkless wafer form. Bumped die available upon request.
Please contact Serial Interface Marketing.
These drawings are for general information only. Refer to JEDEC Drawing MS-012, Variation AA for proper dimensions, tolerances, datums, etc.
A 1.35 – 1.75
b 0.31 – 0.51
C 0.17 – 0.25
D 4.80 – 5.05
E1 3.81 – 3.99
E 5.79 – 6.20
e 1.27 BSC
L 0.40 – 1.27
θ 0° – 8°
ØØ
EE
11
NN
TOP VIEW
CC
E1E1
END VIEW
AA
bb
LL
A1A1
ee
DD
SIDE VIEW
16
AT93C46D
5193F–SEEPR–1/08
Page 17
8A2 - TSSOP
2325 Orchard Parkway
San Jose, CA 95131
TITLE
DRAWING NO.
R
REV.
5/30/02
COMMON DIMENSIONS
(Unit of Measure = mm)
SYMBOL
MIN
NOM
MAX
NOTE
D2.903.003.102, 5
E6.40 BSC
E14.304.404.503, 5
A––1.20
A20.801.001.05
b0.19–0.304
e0.65 BSC
L0.450.600.75
L11.00 REF
8A2, 8-lead, 4.4 mm Body, Plastic
Thin Shrink Small Outline Package (TSSOP)
Notes: 1. This drawing is for general information only. Refer to JEDEC Drawing MO-153, Variation AA, for proper dimensions, tolerances,
datums, etc.
2. Dimension D does not include mold Flash, protrusions or gate burrs. Mold Flash, protrusions and gate burrs shall not exceed
0.15 mm (0.006 in) per side.
3. Dimension E1 does not include inter-lead Flash or protrusions. Inter-lead Flash and protrusions shall not exceed 0.25 mm
(0.010 in) per side.
4. Dimension b does not include Dambar protrusion. Allowable Dambar protrusion shall be 0.08 mm total in excess of the
b dimension at maximum material condition. Dambar cannot be located on the lower radius of the foot. Minimum space between
protrusion and adjacent lead is 0.07 mm.
5. Dimension D and E1 to be determined at Datum Plane H.
8A2
B
Side View
End View
Top View
A2
A
L
L1
D
123
E1
N
b
Pin 1 indicator
this corner
E
e
AT93C46D
5193F–SEEPR–1/08
17
Page 18
8U3-1 – dBGA2
R
1150 E. Cheyenne Mtn. Blvd.
Colorado Springs, CO 80906
TITLE
8U3-1, 8-ball, 1.50 x 2.00 mm Body, 0.50 mm pitch,
Small Die Ball Grid Array Package (dBGA2)
PO8U3-1B
DRAWING NO.
REV.
COMMON DIMENSIONS
(Unit of Measure - mm)
SYMBOL
MIN
NOM
MAXNOTE
A0.730.790.85
A10.090.140.19
A20.400.450.50
b0.200.250.302
D1.50 BSC
E2.0 BSC
e0.50 BSC
e10.25 REF
d1.00 BSC
d10.25 REF
5/3/05
b
D
E
A
A
2
A
1
8 SOLDER BALLS
1.
This drawing is for general information only.
2.
Dimension 'b' is measured at maximum solder ball diameter.
Bottem View
Side View
4
5
31
e
2
67
8
d
Top View
(e1)
(d1)
1.
PIN 1 BALL PAD CORNER
PIN 1 BALL PAD CORNER
18
AT93C46D
5193F–SEEPR–1/08
Page 19
8Y6 – MLP 2x3
2325 Orchard ParkwaySan Jose, CA 95131
TITLE
DRAWING NO.
R
REV.
8Y6, 8-lead 2.0 x 3.0 mm Body, 0.50 mm Pitch, Utlra Thin Mini-Map,
Dual No Lead Package (DFN) ,(MLP 2x3)
D
8Y6
10/16/07
Notes: 1. This drawing is for general information only. Refer to JEDEC Drawing MO-229, for proper dimensions,
tolerances, datums, etc.
2. Dimension bapplies to metallized terminal and is measured between 0.15 mm and 0.30 mm from the terminal tip. If the
terminal has the optional radius on the other end of the terminal, the dimension should not be measured in that radiusarea.
3. Soldering the large thermal pad i
s optional, but not recommended. No electrical connection isaccomplished to the
device through this pad, so if soldered it should be tied to ground
COMMON DIMENSIONS
(Unit of Measure = mm)
SYMBOL
MIN
NOM
MAX
NOTE
D 2.00 BSC
E 3.00 BSC
D2 1.40 1.50 1.60
E2 - - 1.40
A - - 0.60
A1 0.0 0.02 0.05
A2 - - 0.55
A3 0.20 REF
L 0.20 0.30 0.40
e 0.50 BSC
b 0.20 0.25 0.30 2
A2A2
b
(8X)
(8X)
Pin 1 IDPin 1 ID
Pin 1Pin 1
IndexIndex
AreaArea
A1A1
A3A3
D
E
A
L (8X)L (8X)
e (6X)e (6X)
1.50 REF.1.50 REF.
D2D2
E2E2
AT93C46D
5193F–SEEPR–1/08
19
Page 20
7.Revision History
Doc. Rev.DateComments
5193F1/2008Removed ‘preliminary’ status
5193E11/2007Modified ‘max’ value in AC Characteristics table
5193D8/2007
5193C6/2007
5193C3/2007Corrected Figures 4 and 5.
5193B2/2007Added ‘Ultra Thin’ description to 8-lead Mini-MAP package.
5193A1/2007Initial document release.
Moved Pinout figure
Added new feature for Die Sales
Modified Ordering Information table layout
Modified Park Marking Schemes
Updated to new template
Added Product Markup Scheme
Added Technical email contact
20
AT93C46D
5193F–SEEPR–1/08
Page 21
HeadquartersInternational
Atmel Corporation
2325 Orchard Parkway
San Jose, CA 95131
USA
Tel: 1(408) 441-0311
Fax: 1(408) 487-2600
Atmel Asia
Room 1219
Chinachem Golden Plaza
77 Mody Road Tsimshatsui
East Kowloon
Hong Kong
Tel: (852) 2721-9778
Fax: (852) 2722-1369
Product Contact
Web Site
www.atmel.com
Literature Requests
www.atmel.com/literature
Atmel Europe
Le Krebs
8, Rue Jean-Pierre Timbaud
BP 309
78054 Saint-Quentin-enYvelines Cedex
France
Tel: (33) 1-30-60-70-00
Fax: (33) 1-30-60-71-11
Technical Support
s_eeprom@atmel.com
Atmel Japan
9F, Tonetsu Shinkawa Bldg.
1-24-8 Shinkawa
Chuo-ku, Tokyo 104-0033
Japan
Tel: (81) 3-3523-3551
Fax: (81) 3-3523-7581
Sales Contact
www.atmel.com/contacts
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