The AT93C46/56/66 provides 1024/2048/4096 bits of serial electrically erasable programmable read-only memory (EEPROM), organized as 64/128/256 words of 16 bits
each (when the ORG pin is connected to VCC), and 128/256/512 words of 8 bits each
(when the ORG pin is tied to ground). The device is optimized for use in many industrial and commercial applications where low-power and low-voltage operations are
essential. The AT93C46/56/66 is available in space-saving 8-lead PDIP, 8-lead
JEDEC SOIC, 8-lead EIAJ SOIC, 8-lead MAP, 8-lead TSSOP, and 8-lead dBGA2
packages.
The AT93C46/56/66 is enabled through the Chip Select pin (CS) and accessed via a
three-wire serial interface consisting of Data Input (DI), Data Output (DO), and Shift
Clock (SK). Upon receiving a Read instruction at DI, the address is decoded and the
data is clocked out serially on the DO pin. The Write cycle is completely self-timed,
and no separate Erase cycle is required before Write. The Write cycle is only enabled
when the part is in the Erase/Write Enable state. When CS is brought high following
the initiation of a Write cycle, the DO pin outputs the Ready/Busy status of the part.
The AT93C46/56/66 is available in 2.7V to 5.5V and 1.8V to 5.5V versions.
Table 1. Pin Configurations
Pin NameFunction
CSChip Select
SKSerial Data Clock
DISerial Data Input
DOSerial Data Output
GNDGround
VCCPower Supply
ORGInternal Organization
DCDon’t Connect
8-lead SOIC
1
CS
2
SK
3
DI
4
DO
8-lead PDIP
1
CS
2
SK
3
DI
4
DO
8-lead MAP8-lead TSSOP
8
VCC
7
DC
6
ORG
5
GND
VCC
8
DC
7
ORG
6
GND
5
VCC
8
DC
7
ORG
6
GND
5
1
CS
2
SK
3
DI
4
DO
VCC
DC
ORG
GND
(1K JEDEC Only)
DC
VCC
CS
SK
1
CS
2
SK
3
DI
4
DO
8-lead dBGA2
1
8
2
7
3
6
4
5
8-lead SOIC
Rotated (R)
1
8
2
7
3
6
4
5
CSSK
D1
D0
ORG
GND
DO
DI
8
VCC
7
DC
6
ORG
5
GND
2K (256 x 8 or 128 x 16)
4K (512 x 8 or 256 x 16)
AT93C46
AT93C56
AT93C66
Note: 1. This device is not recom-
mended for new designs.
Please refer to AT93C56A.
2. This device is not recommended for new designs.
Please refer to AT93C66A.
(1)
(2)
0172Z–SEEPR–9/05
1
Page 2
Absolute Maximum Ratings*
Operating Temperature......................................−55°C to +125°C
Storage Temperature .........................................−65°C to +150°C
Voltage on Any Pin
with Respect to Ground........................................ −1.0V to +7.0V
Maximum Operating Voltage .......................................... 6.25V
DC Output Current........................................................ 5.0 mA
Figure 1. Block Diagram
*NOTICE:Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent damage to the device. This is a stress rating only, and
functional operation of the device at these or any
other conditions beyond those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions for extended periods may affect
device reliability
Note:When the ORG pin is connected to VCC, the “x 16” organization is selected. When it is
connected to ground, the “x 8” organization is selected. If the ORG pin is left unconnected and the application does not load the input beyond the capability of the internal 1
Meg ohm pullup, then the “x 16” organization is selected. The feature is not available on
the 1.8V devices.
For the AT93C46, if “x 16” organization is the mode of choice and Pin 6 (ORG) is left
unconnected, Atmel recommends using the AT93C46A device. For more details, see the
AT93C46A datasheet.
2
AT93C46/56/66
0172Z–SEEPR–9/05
Page 3
AT93C46/56/66
Table 2. Pin Capacitance
(1)
Applicable over recommended operating range from TA = 25°C, f = 1.0 MHz, VCC = +5.0V (unless otherwise noted)
SymbolTest ConditionsMaxUnitsConditions
C
OUT
C
IN
Output Capacitance (DO)5pFV
OUT
= 0V
Input Capacitance (CS, SK, DI)5pFVIN = 0V
Note:1. This parameter is characterized and is not 100% tested.
Table 3. DC Characteristics
Applicable over recommended operating range from: T
T
= -40°C to +125°C, VCC = +1.8V to +5.5V (unless otherwise noted)
AE
SymbolParameterTest ConditionMinTypMaxUnit
V
CC1
V
CC2
V
CC3
I
CC
I
SB1
I
SB2
I
SB3
I
IL
I
OL
(1)
V
IL1
(1)
V
IH1
(1)
V
IL2
(1)
V
IH2
V
OL1
V
OH1
V
OL2
V
OH2
Note:1. VIL min and VIH max are reference only and are not tested.
Supply Voltage1.85.5V
Supply Voltage2.75.5V
Supply Voltage4.55.5V
Supply CurrentVCC = 5.0V
Standby CurrentVCC = 1.8VCS = 0V00.1µA
Standby CurrentVCC = 2.7VCS = 0V6.010.0µA
Standby CurrentVCC = 5.0VCS = 0V1730µA
Input LeakageVIN = 0V to VCC 0.11.0µA
Output LeakageVIN = 0V to VCC 0.11.0µA
Input Low Voltage
2.7V ≤ VCC ≤ 5.5V
Input High Voltage2.0VCC + 1
Input Low Voltage
1.8V ≤ V
Input High VoltageVCC x 0.7VCC + 1
Output Low Voltage
Output High VoltageIOH = −0.4 mA2.4V
2.7V ≤ V
≤ 5.5V
CC
Output Low Voltage
Output High VoltageIOH = −100 µAVCC – 0.2V
1.8V ≤ V
≤ 2.7V
CC
= −40°C to +85°C, VCC = +1.8V to +5.5V,
AI
READ at 1.0 MHz0.52.0mA
WRITE at 1.0 MHz0.52.0mA
−0.60.8
≤ 2.7V
−0.6V
CC
I
= 2.1 mA0.4V
OL
I
= 0.15 mA0.2V
OL
CC
x 0.3
V
V
0172Z–SEEPR–9/05
3
Page 4
Table 4. AC Characteristics
Applicable over recommended operating range from T
Note:1. This parameter is characterized and is not 100% tested.
≤ 5.5V
CC
250
250
1000
≤ 5.5V
CC
250
250
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
1000
250
250
1000
100
≤ 5.5V
CC
≤ 5.5V
CC
100
400
10ms
≤ 5.5V0.13ms
CC
ns
ns
ns
ns
4
AT93C46/56/66
0172Z–SEEPR–9/05
Page 5
Table 5. Instruction Set for the AT93C46
AT93C46/56/66
Op
InstructionSB
Code
READ110A6 – A
EWEN10011XXXXX11XXXX
ERASE111A
WRITE101A6 – A
ERAL10010XXXXX10XXXX
WRAL10001XXXXX01XXXXD7 – D
AddressData
A5 – A
A5 – A
A5 – A
0
0
0
D7 – D
6
– A
0
0
0
Commentsx 8x 16x 8x 16
Reads data stored in memory, at
specified address
Write enable must precede all
programming modes
Erases memory location An – A
D
0
15
– D
Writes memory location An – A
0
0
0
Erases all memory locations. Valid
only at V
D
0
15
– D
Writes all memory locations. Valid
0
only at VCC = 4.5V to 5.5V
= 4.5V to 5.5V
CC
EWDS10000XXXXX00XXXXDisables all programming instructions
Note:The Xs in the address field represent DON’T CARE values and must be clocked.
Table 6. Instruction Set for the AT93C56
Op
InstructionSB
READ110A8 – A
Code
(1)
and AT93C66
AddressData
0
A7 – A
EWEN10011XXXXXXX11XXXXXX
(2)
Commentsx 8x 16x 8x 16
0
Reads data stored in memory, at
specified address
Write enable must precede all
programming modes
ERASE111A
WRITE101A8 – A
8
– A
0
0
ERAL10010XXXXXXX10XXXXXX
A7 – A
A7 – A
0
0
D7 – D
D
0
15
– D
Erases memory location An – A
Writes memory location An– A
0
0
0
Erases all memory locations. Valid
only at V
= 4.5V to 5.5V
CC
Writes all memory locations. Valid
WRAL10001XXXXXXX01XXXXXXD
7
– D
D
0
15
– D
only at VCC = 5.0V ±10% and Disable
0
Register cleared
EWDS10000XXXXXXX00XXXXXXDisables all programming instructions
Notes:1. This device is not recommended for new designs. Please refer to AT93C56A.
2. This device is not recommended for new designs. Please refer to AT93C66A.
0172Z–SEEPR–9/05
5
Page 6
Functional
Description
The AT93C46/56/66 is accessed via a simple and versatile three-wire serial communication interface. Device operation is controlled by seven instructions issued by the host
processor. A valid instruction starts with a rising edge of CS and consists of a start bit
(logic “1”) followed by the appropriate op code and the desired memory address
location.
READ (READ): The Read (READ) instruction contains the address code for the memory location to be read. After the instruction and address are decoded, data from the
selected memory location is available at the serial output pin DO. Output data changes
are synchronized with the rising edges of serial clock SK. It should be noted that a
dummy bit (logic “0”) precedes the 8- or 16-bit data output string.
ERASE/WRITE ENABLE (EWEN): To assure data integrity, the part automatically goes
into the Erase/Write Disable (EWDS) state when power is first applied. An Erase/Write
Enable (EWEN) instruction must be executed first before any programming instructions
can be carried out. Please note that once in the EWEN state, programming remains
enabled until an EWDS instruction is executed or V
power is removed from the part.
CC
ERASE (ERASE): The Erase (ERASE) instruction programs all bits in the specified
memory location to the logical “1” state. The self-timed erase cycle starts once the
Erase instruction and address are decoded. The DO pin outputs the Ready/Busy status
of the part if CS is brought high after being kept low for a minimum of 250 ns (t
CS
). A
logic “1” at pin DO indicates that the selected memory location has been erased and the
part is ready for another instruction.
WRITE (WRITE): The Write (WRITE) instruction contains the 8 or 16 bits of data to be
written into the specified memory location. The self-timed programming cycle t
WP
starts
after the last bit of data is received at serial data input pin DI. The DO pin outputs the
Read/Busy status of the part if CS is brought high after being kept low for a minimum of
250 ns (t
). A logic “0” at DO indicates that programming is still in progress. A logic “1”
CS
indicates that the memory location at the specified address has been written with the
data pattern contained in the instruction and the part is ready for further instructions. A
Ready/Busy status cannot be obtained if the CS is brought high after the end of the selftimed programming cycle tWP.
ERASE ALL (ERAL): The Erase All (ERAL) instruction programs every bit in the memory array to the logic “1” state and is primarily used for testing purposes. The DO pin
outputs the Ready/Busy status of the part if CS is brought high after being kept low for a
minimum of 250 ns (t
). The ERAL instruction is valid only at VCC = 5.0V ± 10%.
CS
WRITE ALL (WRAL): The Write All (WRAL) instruction programs all memory locations
with the data patterns specified in the instruction. The DO pin outputs the Ready/Busy
status of the part if CS is brought high after being kept low for a minimum of 250 ns (t
The WRAL instruction is valid only at V
= 5.0V ± 10%.
CC
CS
).
ERASE/WRITE DISABLE (EWDS): To protect against accidental data disturb, the
Erase/Write Disable (EWDS) instruction disables all programming modes and should be
executed after all programming operations. The operation of the Read instruction is
independent of both the EWEN and EWDS instructions and can be executed at any
time.
6
AT93C46/56/66
0172Z–SEEPR–9/05
Page 7
Timing Diagrams
Figure 2. Synchronous Data Timing
AT93C46/56/66
µs
Note:1. This is the minimum SK period.
Table 7. Organization Key for Timing Diagrams
AT93C46 (1K)AT93C56 (2K)
I/O
A
N
D
N
Notes:1. This device is not recommended for new designs. Please refer to AT93C56A.
2. This device is not recommended for new designs. Please refer to AT93C66A.
is a don’t care value, but the extra clock is required.
3. A
8
4. A7 is a don’t care value, but the extra clock is required.
Notes: 1. This drawing is for general information only. Refer to JEDEC Drawing MO-153, Variation AA, for proper dimensions, tolerances,
0172Z–SEEPR–9/05
datums, etc.
2. Dimension D does not include mold Flash, protrusions or gate burrs. Mold Flash, protrusions and gate burrs shall not exceed
0.15 mm (0.006 in) per side.
3. Dimension E1 does not include inter-lead Flash or protrusions. Inter-lead Flash and protrusions shall not exceed 0.25 mm
(0.010 in) per side.
4. Dimension b does not include Dambar protrusion. Allowable Dambar protrusion shall be 0.08 mm total in excess of the
b dimension at maximum material condition. Dambar cannot be located on the lower radius of the foot. Minimum space between
protrusion and adjacent lead is 0.07 mm.
5. Dimension D and E1 to be determined at Datum Plane H.
2325 Orchard Parkway
R
San Jose, CA 95131
TITLE
8A2, 8-lead, 4.4 mm Body, Plastic
Thin Shrink Small Outline Package (TSSOP)
DRAWING NO.
8A2
5/30/02
REV.
B
17
Page 18
8U3-1 – dBGA2
E
D
PIN 1 BALL PAD CORNER
Top View
PIN 1 BALL PAD CORNER
2
31
4
(d1)
d
8
67
5
e
(e1)
Bottom View
8SOLDER BALLS
1. Dimension “b” is measured at the maximum solder ball diameter.
This drawing is for general information only.
A
2
A
Side View
COMMON DIMENSIONS
(Unit of Measure = mm)
SYMBOL
A 0.71 0.81 0.91
A1 0.10 0.15 0.20
A2 0.40 0.45 0.50
b 0.20 0.25 0.30
D 1.50 BSC
E 2.00 BSC
e 0.50 BSC
e1 0.25 REF
d 1.00 BSC
d1 0.25 REF
MIN
NOM
1.
b
A
1
MAX
NOTE
18
1150 E. Cheyenne Mtn. Blvd.
R
Colorado Springs, CO 80906
AT93C46/56/66
TITLE
8U3-1, 8-ball, 1.50 x 2.00 mm Body, 0.50 mm pitch,
Small Die Ball Grid Array Package (dBGA2)
DRAWING NO.
PO8U3-1 A
0172Z–SEEPR–9/05
6/24/03
REV.
Page 19
8Y1 – MAP
AT93C46/56/66
PIN 1 INDEX AREA
A
1
PIN 1 INDEX AREA
2
34
E1
D
D1
L
E
Top View
Side View
A
End View
8
A1
SYMBOL
b
COMMON DIMENSIONS
(Unit of Measure = mm)
MIN
A––0.90
A10.00–0.05
D4.704.905.10
E2.803.003.20
D10.851.001.15
E10.851.001.15
b0.250.300.35
e0.65 TYP
L0.500.600.70
NOM
6
7
Bottom View
MAX
5
e
NOTE
2325 Orchard Parkway
R
San Jose, CA 95131
0172Z–SEEPR–9/05
TITLE
8Y1, 8-lead (4.90 x 3.00 mm Body) MSOP Array Package
(MAP) Y1
DRAWING NO.
8Y1
2/28/03
REV.
C
19
Page 20
8Y5 – MAP
D2
b
(8x)
Pin 1
Index
Area
E
E2
Pin 1 ID
L (8x)
D
A3
e (6x)
1.50 REF.
Top View
Bottom View
A
COMMON DIMENSIONS
(Unit of Measure = mm)
A2
A1
SYMBOL
D2.00 BSC
E3.00 BSC
D21.401.501.60
E21.751.851.95
A ––0.90
A10.00.020.05
A2––0.85
A30.20 REF
L0.200.300.40
e0.50 BSC
b0.200.250.302
MIN
NOM
Side View
Notes:1. This drawing is for general information only. Refer to JEDEC Drawing MO-229, for proper dimensions,
tolerances, datums, etc.
2. Dimension b applies to metallized terminal and is measured between 0.15 mm and 0.30 mm from the terminal tip. If the
terminal has the optional radius on the other end of the terminal, the dimension should not be measured in that radius area.
2325 Orchard Parkway
R
San Jose, CA 95131
TITLE
8Y5, 8-lead 2.0 x 3.0 mm Body, 0.50 mm Pitch, Mini-Map, Dual
No Lead Package (DFN)
MAX
NOTE
DRAWING NO.
8Y5
11/12/03
REV.
A
20
AT93C46/56/66
0172Z–SEEPR–9/05
Page 21
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Tel: 1(408) 441-0311
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