– 5.0 (VCC = 4.5V to 5.5V)
– 2.7 (VCC = 2.7V to 5.5V)
– 2.5 (VCC = 2.5V to 5.5V)
•
User Selectable Internal Organization
– 1K: 128 x 8 or 64 x 16
– 2K: 256 x 8 or 128 x 16
– 4K: 512 x 8 or 256 x 16
•
4-Wire Serial Interface
•
Self-Timed Write Cycle (10 ms max)
•
High Reliability
– Endurance: 1 Million Write Cycles
– Data Retention: 100 Years
– ESD Protection: >4000V
•
8-Pin PDIP and 8-Pin EIAJ SOIC Packages
4-Wire Serial
EEPROMs
1K (128 x 8 or 64 x 16)
Description
The AT59C11/22/13 provides 1024/2048/4096 bits of serial EEPROM (Electrically
Erasable Programmable R ead Only Mem ory) organ ized as 64/128 /256 words of 16
bits each, when the ORG Pin is connecte d to V
each when it is tied to ground. The devic e is optimiz ed for use in many in dustrial an d
commercial applications where low power and low voltage operation are essential.
The AT59C11/22/13 is available in space saving 8-pin PDIP and 8-pin EIAJ SOIC
packages.
The AT59C11/22/13 is enabled through the Chi p S el ec t pi n (CS ) , a nd ac ces sed via a
4-wire serial interf ace consis ting of Data In put (DI), Data O utput (DO), a nd Clock
(CLK). Upon receiving a RE AD i nstr uc tion at DI, the a ddr ess is dec od ed an d th e dat a
is clocked out ser ially on th e data output pin DO, th e WR ITE cycl e is complet ely selftimed and no separate ERASE cycle is required before WRITE. The WRITE cycle is
only enabled when the p art is i n the ERASE/W RITE E NABLE state. Ready /Busy
tus can be monitored upon completion of a programm ing operation by polling th e
Ready/Busy
The AT59C11/22/13 is available in 5.0 V ± 10%, 2.7V to 5.5 V and 2.5V to 5.5V versions.
pin.
and 128/256/512 wor ds of 8 bits
CC
sta-
Pin Configurations
Pin NameFunction
CSChip Select
CLKSerial Data Clock
8-Pin PDIP
2K (256 x 8 or 128 x 16)
4K (512 x 8 or 256 x 16)
AT59C11
AT59C22
AT59C13
4-Wire, 1K
Serial E
2
PROM
DISerial Data Input
DOSerial Data Output
GNDGround
V
CC
ORGInternal Organization
RDY/BUSY
Power Supply
Status Output
8-Pin SOIC
Rev. 0173K–07/98
1
Absolute Maximum Ratings*
Operating Temperature.................................. -55°C to +125°C
Storage Temperature..................................... -65°C to +150°C
Voltage on Any Pin
with Respect to Ground.....................................-1.0V to +7.0V
Maximum Operating Voltage........................................... 6.25V
DC Output Current........................................................5 .0 mA
*NOTICE:Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent damage to the de vic e. T his is a stres s r ating o nly an d
functional opera tion of the device at these or any
other conditions beyond those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions for extended periods may affect
device reli abi li ty
Block Diagram
(1)
Note:1.When the ORG pin is connected to VCC, the x 16 org ani za tio n is selected. When it is connected to ground, the x 8 organiza-
tion is selected. If the ORG pin is left unconnected, then an internal pullup device will select the x 16 organization.
2
AT59C11/22/13
AT59C11/22/13
Pin Capacitance
(1)
Applicable over recommended operating range from TA = 25°C, f = 1.0 MHz, VCC = +5.0V (unless otherwise noted).
WRITE at 1.0 MHz0.52.0mA
Standby CurrentVCC = 2.5VCS = 0V6.010.0µA
Standby CurrentVCC = 2.7VCS = 0V6.010.0µA
Standby CurrentVCC = 5.0VCS = 0V21.030.0µA
Input LeakageVIN = 0V to VCC 0.11.0µA
Output LeakageVIN = 0V to VCC 0.11.0µA
Input Low Voltage
Input High Voltage
Input Low Voltage
Input High Voltage
Output Low Voltage
Output High Voltage
Output Low Voltage
Output High Voltage
min and VIH max are reference only and are not tested.
IL
4.5V ≤ VCC ≤ 5.5V
2.5V ≤ VCC ≤ 2.7V
4.5V ≤ VCC ≤ 5.5V
2.5V ≤ VCC ≤ 2.7V
IOL = 2.1 mA
IOH = 0.4 mA2.4
IOL = 0.15 mA
IOH = -0.1 mAVCC - 0.2
-0.6
2.0
-0.6
VCC x 0.7
0.8
VCC + 1
VCC x 0.3
VCC + 1
0.4V
0.2V
V
V
3
AC Characteristics
Applicable over recommended operating range from TA = -40°C to +85°C, VCC = +2.5V to +5.5V,
CL = 1 TTL Gate and 100 pF (unless otherwise noted).
SymbolParameterTest ConditionMinTypMaxUn it s
250
250
500
1000
250
250
500
1000
250
250
500
1000
50
50
100
200
100
100
200
400
100
100
200
400
0
0
0
0
1
1
0.5
0.25
250
250
500
1000
250
250
500
1000
250
250
500
1000
100
100
200
400
f
t
t
t
CLK
CKH
CKL
CS
CLK Clock Frequency
CLK High Time
CLK Low Time
Minimum CS Low Time
4.5V ≤ V
2.7V ≤ V
2.5V ≤ V
1.8V ≤ V
4.5V ≤ V
2.7V ≤ V
2.5V ≤ V
1.8V ≤ V
4.5V ≤ V
2.7V ≤ V
2.5V ≤ V
1.8V ≤ V
4.5V ≤ V
2.7V ≤ V
2.5V ≤ V
1.8V ≤ V
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
4.5V ≤ V
t
CSS
CS Setup TimeRelative to SK
2.7V ≤ V
2.5V ≤ V
1.8V ≤ V
4.5V ≤ V
t
DIS
DI Setup TimeRelative to SK
2.7V ≤ V
2.5V ≤ V
1.8V ≤ V
t
CSH
CS Hold TimeRelative to SK0ns
4.5V ≤ V
t
DIH
DI Hold TimeRelative to SK
2.7V ≤ V
2.5V ≤ V
1.8V ≤ V
4.5V ≤ V
t
PD1
Output Delay to ‘1’AC Test
2.7V ≤ V
2.5V ≤ V
1.8V ≤ V
4.5V ≤ V
t
PD0
Output Delay to ‘0’AC Test
2.7V ≤ V
2.5V ≤ V
1.8V ≤ V
4.5V ≤ V
t
RBD
RDY/BUSY Delay to
Status Valid
AC Test
2.7V ≤ V
2.5V ≤ V
1.8V ≤ V
4.5V ≤ VCC ≤ 5.5V
t
CZ
CS to DO in High
Impedance
AC Test
CS = V
2.7V ≤ V
IL
2.5V ≤ V
1.8V ≤ V
t
WC
Endurance
Write Cycle Time0.110ms
(1)
5.0V, 25°C, Page Mode1MWrite Cycles
Note:1. This paramter is characterized and is not 100% tested.
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
≤ 5.5V
CC
MHz
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
4
AT59C11/22/13
Instruction Set for the AT59C11
AT59C11/22/13
Op
InstructionSB
Code
READ110XXA
AddressData
- A
6
0
A5 - A
0
Commentsx 8x 16x 8x 16
Reads data stored in memory, at
specified address.
EWEN10011XXXXXXXXXXXXXWrite enable must precede all
programming modes.
WRITE1X1XXA
- A
6
0
A5 - A
0
D7 - D0D
- D0Writes memory location An - A0.
15
ERAL10010XXXXXXXXXXXXXErases all memory locations. Valid only
= 4.5V to 5.5V.
at V
CC
WRAL10001XXXXXXXXXXXXXD
- D0D
7
- D0Writes all memory locations. Valid only
15
at V
= 4.5V to 5.5V.
CC
EWDS10000XXXXXXXXXXXXXDisables all programming
instructions.
Instruction Set for the AT59C22
Op
InstructionSB
Code
READ110XXA
EWEN10011XXXXXXXXXXXXXXXWrite enable must precede all
WRITE1X1XXA
ERAL10010XXXXXXXXXXXXXXXErases all memory locations. Valid only
WRAL10001XXXXXXXXXXXXXXXD7 - D0D
EWDS10000XXXXXXXXXXXXXXXDisables all programming instructions.
AddressData
7
7
- A
- A
0
0
A6 - A
A6 - A
0
0
D7 - D0D
Commentsx 8x 16x 8x 16
Reads data stored in memory, at
specified address.
programming modes.
- D0Writes memory location An - A0.
15
at VCC = 4.5V to 5.5V.
- D0Writes all memory locations. Valid when
15
= 5.0V ± 10% and Disable Register
V
CC
cleared.
5
Instruction Set for the AT59C13
Op
InstructionSB
Code
READ110XXA
AddressData
8
- A
0
A7 - A
0
Commentsx 8x 16x 8x 16
Reads data stored in memory, at
specified address.
EWEN10011XXXXXXXXXXXXXXXXXWrite enable must precede all
programming modes.
WRITE1X1XXA
- A
8
0
A7 - A
0
D7 - D0D
- D0Writes memory location An - A0.
15
ERAL10010XXXXXXXXXXXXXXXXXErases all memory locations. Valid only
= 4.5V to 5.5V.
at V
CC
WRAL10001XXXXXXXXXXXXXXXXXD
- D0D
7
- D0Writes all memory locations. Valid when
15
V
= 5.0V ± 10% and Disable Register
CC
cleared.
EWDS10000XXXXXXXXXXXXXXXXXDisables all programming instructions.
6
AT59C11/22/13
Functional Description
The AT59C11/22/1 3 are acce ssed v ia a simpl e and vers atile 4-wire serial communication interface. Device operation
is controlled by six instructions issued by the host proces-
A valid instruction starts with a rising edge of CS
sor.
and consists of a Start Bit (l ogic ‘ 1’) f ollo wed b y th e ap propriate Op Code and the desired memory Address location.
READ (READ):
the Address code fo r the me mor y l oc ati on to be re ad. A fter
the instruction and address are decoded, data from the
selected memory location is available at the serial output
pin DO. Output data changes are synchronized with the rising edges of serial clock CLK. It should be noted that a
dummy bit (logic ‘0’) precedes the 8- or 16-bit data output
string.
ERASE/WRITE (EWEN):
part automatically go es into the Erase/Write Dis able
(EWDS) state when power is first applied. An Erase/Write
Enable (EWEN) instruction must be executed first before
any programming instructions can be carried out. Please
note that once in the Erase/Write Enable state, programming remains e nabled until an Erase/Write Disable
(EWDS) instruction is executed or V
from the part.
WRITE (WRITE):
the 8 or 16 bits of data to be written into the specified memory location. The self-timed programming cycle, t
The Read (READ) instructio n contains
To assure data integrity, the
power is removed
CC
The Write (WRITE) ins truct ion contains
, starts
WP
AT59C11/22/13
after the last bit of data is received at serial data input pin
DI. The Ready/Bus y
determined by polling the RDY/BUSY
RDY/BUSY
A logic ‘1’ indicates that the memory location at the specified address has been written with the data pattern contained in the ins truction an d the part is re ady for furth er
instructions .
ERASE ALL (E RAL):
programs every bit in the memory array to the logic ‘1’ state
and is primarily used for testing purposes. The Ready/Busy
status of the AT59 C11/22/1 3 can be de termined by poll ing
the RDY/BUSY
= 5.0V ± 10%.
V
CC
WRITE ALL (WRAL):
programs all memory locations with the data patterns specified in the instruction. The Ready/Busy
AT59C11/22/13 can be determined by polling the
RDY/BUSY
5.0V ± 10%.
ERASE/WRITE DI SABLE (EWDS):
accidental data disturb, the Erase/Write Disable (EWDS)
instruction disables all programming modes and should be
executed after all programming operations. The operation
of the READ instruction is independent of both the EWEN
and EWDS instructions and can be executed at any time.