Datasheet AT49BV1614T-12TI, AT49BV1614T-12TC, AT49BV1614T-12CI, AT49BV1614T-12CC, AT49BV1614-90TI Datasheet (ATMEL)

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Features
2.7V to 3.6V Read/Write
Access Time - 90 ns
Sector Erase Architecture
– Thirty 32K word (64K byte) Sectors with Individual Write Lockout – Eight 4K word (8K byte) Sectors with Individual Write Lockout – Two 16K word (32K byte) Sectors with Individual Write Lockout
Fast Word Program Time - 20
µµµµ
s
Fast Sector Erase Time - 200 ms
Dual Plane Organization, Permitting Concurrent Read while Program/E rase
– Memory Plane A: Eight 4K Word, Two 16K Word and Six 32K Word Sectors – Memory Plane B: Twenty-Four 32K Word Sectors
Erase Suspend Capability
– Supports Reading/Programming Data from Any Sector by Suspending Erase of
Any Different Sector
Low Power Operation
– 25 mA Active –10
µµµµ
A Standby
Data Polling, Toggle Bit, Ready/Busy for End of Program Detection
Optional VPP Pin for Fast Programming
RESET Input for Device Initialization
Sector Program Unlock Command
TSOP, CBGA, and
µµµµ
BGA Package Options
Top or Bottom Boot Block Configuration Available
Description
The AT49BV16X4(T) is 2.7 to 3.6 volt 16-megabit Flash memory organized as 1,048,576 words of 16 bits each or 2,097,152 bytes of 8 bits each. The x16 data appears on I/O0 - I/O15; the x8 data appears on I/O0 - I/O7. The memory is divided into 40 blocks for er ase ope ratio ns. The device is o ffered in 48-p in TSOP and 48 -ball
µ
BGA packages. The device has CE
, and OE control signals to avoid any bus con­tention. This de vic e c an be read or repro gra mmed using a s ingle 2. 7V p ower s uppl y, making it ideally suited for in-system programming.
Rev. 0925B–05/98
AT49BV1604
16-Megabit (1M x 16/2M x 8) 3-volt Only Flash Memory
AT49BV1604 AT49BV1604T AT49BV1614 AT49BV1614T Adv ance Information
AT49BV16X4(T)
Pin Configurations
Pin Name Function
A0 - A19 Addresses CE
Chip Enable
OE
Output Enable
WE
Write Enable
RESET
Reset
RDY/BUSY
READY/BUSY Output
V
PP
Optional Pow er Supply for Faster Program/Erase Operations
I/O0 - I/O14 Data Inputs/Outputs
I/O15 (A-1)
I/O15 (Data Input/Output, Word Mode) A-1 (LSB Address Input, Byte Mode)
BYTE
Selects Byte or Word Mode NC No Connect V
CCQ
Output Power Supply DC Don’t Connect
(continued)
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AT49BV16X4(T)
2
The device powers on in the read mode. Command sequences are used to place the device in other operation modes such as program and erase. The device has the capability to protect the data in any se ctor. Once the d ata protection for a given sector is enabled, the data in that sector cannot be changed usin g input levels between ground and V
CC
.
The device is segmented into two memory planes. Reads from memory plane B may be performed even while pro­gram or erase functions are being executed in memory plane A and vice versa. This operation allows improved system performance by no t requiri ng the syst em to wait for a program or erase operation to complete before a read is performed. To further increase the flexibility of the device, it
contains an Erase Suspend feature. This feature will put the Erase on hold for any amount of time and let the user read data from or program data to any of the remaining sectors within the same memo ry plane. There is no rea son to suspend the erase operation if the data to be read is in the other memory plane. The end of a program or an Erase cycle is det ect e d by th e Rea dy / Bu sy
pin, Data polling, or by
the toggle bit. A V
PP
pin is provided to improve program/erase times at lower supply vo ltages. Thi s pin does not ne ed to be uti­lized. If it is not used the pin should be connected to ground or V
CC
. To take advantage of faster pr ogramming, the pi n should supply 5.0 volts during program and erase opera­tions.
TSOP Top View
Type 1
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24
48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25
A15 A14 A13 A12 A11 A10
A9
A8 NC NC
WE
RESET
VPP
NC
A19 A18 A17
A7
A6
A5
A4
A3
A2
A1
A16 VCCQ GND I/O15 I/O7 I/O14 I/O6 I/O13 I/O5 I/O12 I/O4 VCC I/O11 I/O3 I/O10 I/O2 I/O9 I/O1 I/O8 I/O0 OE GND CE A0
CBGA Top View
1 2 3 4 5 6
H
GFEDCB
VSS
I/O1
I/O3
I/O4
I/O6
VSS
OE
I/O9
I/O11
VCC
I/O13
I/O15
/A-1
CE
I/O8
I/O10
I/O12
I/O14
BYTE
A0
I/O0
I/O2
I/O5
I/O7
A16
A1
A5
NC
A19
A11
A15
A2
A6
A18
NC
A10
A14
A4
A17
NC
RESET
A8
A12
A3
A7
RDY/BUSY
WE
A9
A13
A
µ
BGA Top View (Ball Down)
A
B C D
E
F
1
234567
A13
A14
A15
A16
VCCQ
GND
A11
A10
A12
I/O14
I/O15
I/O7
A8
WE
A9
I/O5
I/O6
I/O13
VPP
RST
NC
I/O11
I/O12
I/O4
NC
A18
NC
I/O2
I/O3
VCC
A19
A17
A6
I/O8
I/O9
I/O10
A7
A5
A3
CE
I/O0
I/O1
A4
A2
A1
A0
GND
OE
8
TSOP T op View
Type 1
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24
48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25
A15 A14 A13 A12 A11 A10
A9 A8
A19
NC
WE
RESET
VPP
NC
RDY/BUSY
A18 A17
A7 A6 A5 A4 A3 A2 A1
A16 BYTE GND I/O15/A-1 I/O7 I/O14 I/O6 I/O13 I/O5 I/O12 I/O4 VCC I/O11 I/O3 I/O10 I/O2 I/O9 I/O1 I/O8 I/O0 OE GND CE A0
AT49BV1604(T)
AT49BV1614(T)
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AT49BV16X4(T)
3
A six byte command (bypass unlock) sequence to remove the requirement of entering the three byte prog ram sequence is offered to further improve programming time. After entering the six byte code, only si ngle pulses on the write control lines are required for writing into the device. This mode (single pulse byte/word program) is exited by powering down the device, or by pulsing the RESET
pin
low and then bringing it back to V
CC
. Erase and Erase Sus­pend/Resume commands will not work while in this mode; if entered they will result in data being programmed into the device. It is not recommended that the six byte code reside
in the software of the final produ ct but only exist in external programming code.
The BYTE
pin controls whethe r the device data I/O pins
operate in the byte or word configuration. If the BYTE
pin is set at logic “1”, the device is in word configuration, I/O0­I/O15 are active and controlled by CE
and OE.
If the BYTE
pin is set at logic “0”, the devi ce is in byte con­figuration, and only data I/O pins I/O0-I/O7 are active and controlled by CE
and OE. The data I/O pins I/O8-I/O14 are tri-stated, and the I/O1 5 pin is us ed a s an inp ut for the LSB (A-1) address function.
Block Diagram
Device Operation
READ:
The AT49BV16X4(T) is accessed like an EPROM.
When CE
and OE are low and WE is high, the data stored at the memory location determined by the address pins are asserted on the outputs. The outputs are put in the high impedance state whenever CE
or OE is high. This dual-line control gives designers flexibility in preventing bus conten­tion.
COMMAND SEQUENCES:
When the device is first pow­ered on it will be reset to the read or standby mode depending upon the state of the control line inputs. In order to perform other device functions, a series of command
sequences are entered into the device. The command sequences are shown in the Com mand Definition s table (I/O8 - I/O15 are don't care inputs for the command codes). The command sequences are written by applying a low pulse on the WE
or CE input with CE or WE low (respec-
tively) and OE
high. The address is latched on the falling
edge of CE
or WE, whichever occurs last. The data is
latched by the first rising edge of CE
or WE. Standard microprocessor write timings are used. The address loca­tions used in the command sequences are not affected by entering the command sequences.
IDENTIFIER
REGISTER
STATUS
REGISTER
DATA
COMPARATOR
OUTPUT
MULTIPLEXER
OUTPUT BUFFER
INPUT
BUFFER
COMMAND REGISTER
DATA
REGISTER
Y-GATING
WRITE STATE
MACHINE
PROGRAM/ERASE VOLTAGE SWITCH
CE WE OE RESET BYTE
RDY/BUSY
VPP
VCC GND
Y-DECODER
X-DECODER
INPUT
BUFFER
ADDRESS
LATCH
I/O0 - I/O15/A-1
A0 - A19
PLANE B
SECTORS
PLANE A SECTORS
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AT49BV16X4(T)
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RESET:
A RESET
input pin is p rov ided to e ase some sy s-
tem application s. When RE SET
is at a logic high level, the device is in its standa rd oper at ing mod e. A low l evel on th e RESET
input halts the prese nt device oper ation and puts the outputs of the de vice in a hi gh impedan ce stat e. When a high level is reasse rted on the RES ET
pin, the device returns to the Read or Standby mod e, depending upon the state of the control inputs. By applying a 12V ± 0.5V input signal to the RESET
pin any sector can be reprogrammed even if the sector lockout feature has been enabled (see Sector Programming Lockout Override section).
ERASURE:
Before a byte/word ca n be reprogramm ed, it must be erased. The erased state of memory bits is a logi­cal “1”. The entire device can be erased by using the Chip Erase command or individual sectors can be erased by using the Sector Erase commands.
CHIP ERASE:
The entire device can be erased at one time by using the 6-byte chip erase software code. After the chip erase has been in itiate d, the devi ce wil l internal ly tim e the erase operation so that no external clocks are required. The maximum time to erase the chip is t
EC
.
If the sector lockout has been enabled, the Chip Erase will not erase the data in the secto r th at ha s be en l oc ked; it wi ll erase only the unprotected sectors. After the chip erase, the device will return to the read or standby mode.
SECTOR ERASE:
As an alternative to a full chip erase, the device is organized into forty sectors (SA0 - SA39) that can be individually erased . The Secto r Erase comm and is a six bus cycle operation. The sector ad dress is latched on the falling WE
edge of the sixth cy cle whil e the 30H d ata inpu t
command is latched on the rising edge of WE
. The sector
erase starts after the rising edge of WE
of the sixth cycle. The erase operation is i nterna ll y con troll ed ; it wi ll aut oma ti­cally time to completion. The maximum time to erase a sec­tion is t
SEC
. When the sector programming lockout feature is not enabled, the sector will erase (from the same sector erase command). Once a sector has been protected, data in the protected s ectors cannot be changed unles s the RESET pin is taken to 12V ± 0. 5V. An attempt to erase a sector that has been pr otected wi ll result in the operation terminating in 2 µs.
BYTE/WORD PROGRAMMING:
Once a memory block is erased, it is programmed (to a logical “0”) on a byte-by-byte or on a word-by- word ba si s. Pr o gr amm ing i s ac co mpl is he d via the intern al device command r egister and is a 4-b us cycle operation. The devic e will automati cally gener ate the required internal program pulses.
Any commands written to the c hip during the em bedded programming cycle will be ignored. If a hardware reset hap­pens during programming, the data at the location being programmed will be corrupted. Please note that a data “0” cannot be programmed back to a “1”; only erase operations can convert “0”s to “1”s. Programming is completed after
the specified t
BP
cycle time. The DATA polling feature or the toggle bit feature may be used to indicate the end of a program cycle.
SECTOR PROGRAMMING LOCKOUT:
Each sector has a programming lockout featur e. This feature prevents pro­gramming of data in the design ated sectors o nce the fea­ture has been enabled. These sectors can contain secure code that is used to bring up the system. Enabling the lock­out feature will all ow the boot code to stay i n the device while data in the rest of the device is upd ated. Thi s featur e does not have to be activated; any sector’s usage as a write protected region is optional to the user.
Once the feature is enabled, the data in the protected sec­tors can no longer be erased or programmed when input levels of 5.5V or less are used. Data in the remaining sec­tors can still be changed through the regular programming method. To activate the lo ck ou t fea tur e, a seri es of s ix pr o­gram commands to specific addresses with specific data must be performed. Please refer to the Command Defini­tions table.
SECTOR PROGRAMMING LOCKOUT OVERRIDE:
The user can override the sector programming lockout by taking the RESET
pin to 12V ± 0.5V. By doing this prote cted da ta can be altered through a chip erase, sector era se or byte/word program ming. When the RESET
pin is brought back to TTL levels th e secto r programm ing lock out featu re is again active.
ERASE SUSPEND/ERASE RESUME:
The erase suspen d command allows the system to interrupt a sector erase operation and then program or read data from a different sector within the same plane. Since this device has a dual plane architecture, there is no need to use the erase sus­pend feature while erasin g a sec tor when y ou want to r ead data from a sector in the other plane. After the erase sus­pend command is given, the device requires a maximum time of 15 µs to suspend the erase operation. After the erase operation has been suspended, the plane which con­tains the suspended sec tor enters th e erase-s uspend-r ead mode. The system can then read data or program da ta to any other sector within the device. An address is not required during the erase suspend comm and. During a sector erase suspend, another sector cannot be erased. To resume the sector erase operation, the system must write the erase resume command. The erase resume command is a one bus cycl e co mma nd, whi c h d oes req ui re the p lan e address (determined by A18 and A19). The device also supports an erase suspend during a complete chip erase. While the chip erase is suspen ded, the use r can read from any sector within the me mory that is protec ted. The com­mand sequence for a ch ip erase suspen d and a sector erase suspend are the same.
PRODUCT IDENTIFICATION:
The product identification
mode identifies the device and manufacturer as Atmel. It
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AT49BV16X4(T)
5
may be accessed by hardware or software operation. The hardware operation mode can be used by an external pro­grammer to identify the correct programming algorithm for the Atmel product.
For details, see O peratin g Modes (for har dware operatio n) or Software Product Identification. The manufacturer and device code is the same for both modes.
DATA POLLING:
The AT49BV16X4(T) features DATA polling to indicate the end of a program cycle. During a pro­gram cycle an attempted read of the last byte/word loaded will result in the complement of the loaded data on I/O7. Once the program cycle has been completed, true data is valid on all outputs and th e next cyc le may be gin. Du ring a chip or sector erase operation, an attempt to read the device will give a “0” on I/O7. Once the program or erase cycle has completed, true data will be read from the device. DATA
polling may begi n at any ti me during the program
cycle. Please see “Status Bit Table” for more details.
TOGGLE BIT:
In addition to DATA
polling the AT49BV16X4(T) provides another method for determining the end of a program or erase cycle. Du ring a program or erase operation, successive attempts to read data from the same memory plane will result in I/O6 toggling between one and zero. Once the program cycle has completed, I/O6 will stop toggling and valid data will be read. Examining the toggle bit may begin at any time during a program cycle.
An additional to ggle bit is available on I/O2 whi ch can be used in conjunction with the toggle bit which is available on I/O6. While a sector is erase suspe nded, a read or a pro­gram operation fr om th e su sp ended sector will re sul t in th e
I/O2 bit togglin g. Please see s tatus bit table fo r more details.
RDY/BUSY
:
An open drain READY/BUSY
output pin pro­vides another method of detecting the end of a progr am or erase operation. RDY/BUSY
is actively pulled low during the internal program and erase cycles and is released at the completion of the cycle. The open drain connection allows for OR-tying of several devices to the same RDY/BUSY
line.
HARDWARE DATA PROTECTION:
Hardware features protect against inadvertent programs to the AT49BV16X4(T) in the following ways: (a) V
CC
sense: if
V
CC
is below 1.8V (typical), the program function is inhib-
ited. (b) V
CC
power on delay: once VCC has reached the
V
CC
sense level, the device will automatically time out 10 ms (typical) before prog ramming. (c) Program inhibi t: hold­ing any one of OE
low, CE high or WE high inhib its pro­gram cycles. (d) Noise filter: pulses of less than 15 ns (typical) on the WE
or CE inputs will not initiate a program
cycle.
INPUT LEVELS:
While operating with a 2.7V to 3.6V
power supply, the ad dress inpu ts and cont rol inputs (OE
,
CE
, and WE) may be dr iven from 0 to 5.5V without adversely affecting the operation of the device. The I/O lines can only be driven from 0 to V
CC
+ 0.6V.
OUTPUT LEVELS:
Output High Levels (V
OH
) are equal to
V
CCQ
- 0.2V (n ot VCC). For 2.7V - 3.6V output levels, V
CCQ
must be tied to VCC. For 1.8V - 2.2V output leve ls, V
CCQ
must be regulated to 2.0V ± 10% while VCC must be regu­lated to 2.7V - 3.0V (for minimum power).
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AT49BV16X4(T)
6
Notes: 1. The DATA FORMAT in each bus cycle is as follows: I/O15 - I/O8 (Don’t Care); I/O7 - I/O0 (Hex).
The ADDRESS FORMAT in each bus cycle is as follows: A15 - A0 (Hex), A-1, A14 - A19 (Don’t Care).
2. Either one of the Product ID Exit commands can be used.
3. SA = sector address. Any byte/word address within a sector can be used to designate the sector address (see next four pages for details).
4. When the sector programming lockout feature is not enabled, the sector will erase (from the same sector erase command). Once the sector has been protected, data in the protected sectors cannot be changed unless the RESET
pin is taken to
12V ± 0.5V.
5. PA is the plane address (A19 - A18).
Command Definition in (Hex)
(1)
Command Sequence
Bus
Cycles
1st Bus
Cycle
2nd Bus
Cycle
3rd Bus
Cycle
4th Bus
Cycle
5th Bus
Cycle
6th Bus
Cycle
Addr Data Addr Data Addr Data Addr Data Addr Data Addr Data
Read 1 Addr D
OUT
Chip Erase 6 5555 AA 2AAA 55 5555 80 5555 AA 2AAA 55 5555 10 Sector Erase 6 5555 AA 2AAA 55 5555 80 5555 AA 2AAA 55 SA
(3)(4)
30
Byte/Word Program 4 5555 AA 2AAA 55 5555 A0 Addr D
IN
Bypass Unlock 6 5555 AA 2AAA 55 5555 80 5555 AA 2AAA 55 5555 A0 Single Pulse
Byte/Word Program
1 Addr D
IN
Sector Lockout 6 5555 AA 2AAA 55 5555 80 5555 AA 2AAA 55 SA
(3)(4)
40 Erase Suspend 1 xxxx B0 Erase Resume 1 PA
(5)
30 Product ID Entry 3 5555 AA 2AAA 55 5555 90 Product ID Exit
(2)
3 5555 AA 2AAA 55 5555 F0
Product ID Exit
(2)
1 xxxx F0
Absolute Maximum Ratings*
Temperature Under Bias................................ -55°C to +125°C
*NOTICE: Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent dam­age to the dev ice. Th is is a s tress rating only an d functional oper ati on of the devi ce at t hes e o r any other conditions beyond those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions f or e xtended periods ma y af fect dev ice reliability .
Storage Temperature..................................... -65°C to +150°C
All Input Voltages (including NC Pins)
with Respect to Ground...................................-0.6V to +6.25V
All Output Voltages
with Respect to Ground.............................-0.6V to V
CC
+ 0.6V
Voltage on OE
with Respect to Ground...................................-0.6V to +13.5V
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AT49BV16X4(T)
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Memory Plane A - Bottom Boot
Sector Size (Bytes/Words)
x8
Address Range (A19 - A-1)
x16
Address Range (A19 - A0)
SA0 8K/4K 000000 - 001FFF 00000 - 00FFF SA1 8K/4K 002000 - 003FFF 01000 - 01FFF SA2 8K/4K 004000 - 005FFF 02000 - 02FFF SA3 8K/4K 006000 - 007FFF 03000 - 03FFF SA4 8K/4K 008000 - 009FFF 04000 - 04FFF SA5 8K/4K 00A000 - 00BFFF 05000 - 05FFF SA6 8K/4K 00C000 - 00DFFF 06000 - 06FFF SA7 8K/4K 00E000 - 00FFFF 07000 - 07FFF SA8 32K/16K 010000 - 017FFF 08000 - 0BFFF SA9 32K/16K 018000 - 01FFFF 0C000 - 0FFFF SA10 64K/32K 020000 - 02FFFF 10000 - 17FFF SA11 64K/32K 030000 - 03FFFF 18000 - 1FFFF SA12 64K/32K 040000 - 04FFFF 20000 - 27FFF SA13 64K/32K 050000 - 05FFFF 28000 - 2FFFF SA14 64K/32K 060000 - 06FFFF 30000 - 37FFF SA15 64K/32K 070000 - 07FFFF 38000 - 3FFFF
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AT49BV16X4(T)
8
Memory Plane B - Bottom Boot
Sector Size (Bytes/Words)
x8
Address Range (A19 - A-1)
x16
Address Range (A19 - A0)
SA16 64K/32K 080000 - 08FFFF 40000 - 47FFF SA17 64K/32K 090000 - 09FFFF 48000 - 4FFFF SA18 64K/32K 0A0000 - 0AFFFF 50000 - 57FFF SA19 64K/32K 0B0000 - 0BFFFF 58000 - 5FFFF SA20 64K/32K 0C0000 - 0CFFFF 60000 - 67FFF SA21 64K/32K 0D0000 - 0DFFFF 68000 - 6FFFF SA22 64K/32K 0E0000 - 0EFFFF 70000 - 77FFF SA23 64K/32K 0F0000 - 0FFFFF 78000 - 7FFFF SA24 64K/32K 100000 - 10FFFF 80000 - 87FFF SA25 64K/32K 110000 - 11FFFF 88000 - 8FFFF SA26 64K/32K 120000 - 12FFFF 90000 - 97FFF SA27 64K/32K 130000 - 13FFFF 98000 - 9FFFF SA28 64K/32K 140000 - 14FFFF A0000 - A7FFF SA29 64K/32K 150000 - 15FFFF A8000 - AFFFF SA30 64K/32K 160000 - 16FFFF B0000 - B7FFF SA31 64K/32K 170000 - 17FFFF B8000 - BFFFF SA32 64K/32K 180000 - 18FFFF C0000 - C7FFF SA33 64K/32K 190000 - 19FFFF C8000 - CFFFF SA34 64K/32K 1A0000 - 1AFFFF D0000 - D7FFF SA35 64K/32K 1B0000 - 1BFFFF D8000 - DFFFF SA36 64K/32K 1C0000 - 1CFFFF E0000 - E7FFF SA37 64K/32K 1D0000 - 1DFFFF E8000 - EFFFF SA38 64K/32K 1E0000 - 1EFFFF F0000 - F7FFF SA39 64K/32K 1F0000 - 1FFFFF F8000 - FFFFF
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AT49BV16X4(T)
9
Memory Plane B - Top Boot
Sector Size (Bytes/Words)
x8
Address Range (A19 - A-1)
x16
Address Range (A19 - A0)
SA0 64K/32K 000000 - 00FFFF 00000 - 07FFF SA1 64K/32K 010000 - 01FFFF 08000 - 0FFFF SA2 64K/32K 020000 - 02FFFF 10000 - 17FFF SA3 64K/32K 030000 - 03FFFF 18000 - 1FFFF SA4 64K/32K 040000 - 04FFFF 20000 - 27FFF SA5 64K/32K 050000 - 05FFFF 28000 - 2FFFF SA6 64K/32K 060000 - 06FFFF 30000 - 37FFF SA7 64K/32K 070000 - 07FFFF 38000 - 3FFFF SA8 64K/32K 080000 - 08FFFF 40000 - 47FFF SA9 64K/32K 090000 - 09FFFF 48000 - 4FFFF SA10 64K/32K 0A0000 - 0AFFFF 50000 - 57FFF SA11 64K/32K 0B0000 - 0BFFFF 58000 - 5FFFF SA12 64K/32K 0C0000 - 0CFFFF 60000 - 67FFF SA13 64K/32K 0D0000 - 0DFFFF 68000 - 6FFFF SA14 64K/32K 0E0000 - 0EFFFF 70000 - 77FFF SA15 64K/32K 0F0000 - 0FFFFF 78000 - 7FFFF SA16 64K/32K 100000 - 10FFFF 80000 - 87FFF SA17 64K/32K 110000 - 11FFFF 88000 - 8FFFF SA18 64K/32K 120000 - 12FFFF 90000 - 97FFF SA19 64K/32K 130000 - 13FFFF 98000 - 9FFFF SA20 64K/32K 140000 - 14FFFF A0000 - A7FFF SA21 64K/32K 150000 - 15FFFF A8000 - AFFFF SA22 64K/32K 160000 - 16FFFF B0000 - B7FFF SA23 64K/32K 170000 - 17FFFF B8000 - BFFFF
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AT49BV16X4(T)
10
Memory Plane A - Top Boot
Sector Size (Bytes/Words)
x8
Address Range (A19 - A-1)
x16
Address Range (A19 - A0)
SA24 64K/32K 180000 - 18FFFF C0000 - C7FFF SA25 64K/32K 190000 - 19FFFF C8000 - CFFFF SA26 64K/32K 1A0000 - 1AFFFF D0000 - D7FFF SA27 64K/32K 1B0000 - 1BFFFF D8000 - DFFFF SA28 64K/32K 1C0000 - 1CFFFF E0000 - E7FFF SA29 64K/32K 1D0000 - 1DFFFF E8000 - EFFFF SA30 32K/16K 1E0000 - 1E7FFF F0000 - F3FFF SA31 32K/16K 1E8000 - 1EFFFF F4000 - F7FFF SA32 8K/4K 1F0000 - 1F1FFF F8000 - F8FFF SA33 8K/4K 1F2000 - 1F3FFF F9000 - F9FFF SA34 8K/4K 1F4000 - 1F5FFF FA000 - FAFFF SA35 8K/4K 1F6000 - 1F7FFF FB000 - FBFFF SA36 8K/4K 1F8000 - 1F9FFF FC000 - FCFFF SA37 8K/4K 1FA000 - 1FBFFF FD000 - FDFFF SA38 8K/4K 1FC000 - 1FDFFF FE000 - FEFFF SA39 8K/4K 1FE000 - 1FFFFF FF000 - FFFFF
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AT49BV16X4(T)
11
Operating Modes
Notes: 1. X can be VIL or VIH.
2. Refer to AC Programming Waveforms.
3. V
H
= 12.0V ± 0.5V.
4. Manufacturer Code: 1FH (x8); 161F (x16), Device Code: C0H (x8); 16CO (x16).
5. See details under Software Product Identification Entry/Exit.
6. The use of the V
PP
pin is optional.
Note: 1. In the erase mode, I
CC
is 50 mA.
DC and AC Operating Range
AT49BV16X4-90 AT49BV16X4-12
Operating Temperature (Case)
Com. 0°C - 70°C 0°C - 70°C Ind. -40°C - 85°C -40°C - 85°C
V
CC
Power Supply 2.7V to 3.6V 2.7V to 3.6V
Mode CE OE WE RESET V
PP
(6)
Ai I/O
Read V
IL
V
IL
V
IH
V
IH
XAiD
OUT
Program/ Erase
(2)
V
IL
V
IH
V
IL
V
IH
5V ± 10% Ai D
IN
Standby/Program Inhibit
V
IH
X
(1)
XVIHX X High Z
Program Inhibit X X V
IH
V
IH
V
IL
Program Inhibit X V
IL
XVIHV
IL
Output Disable X V
IH
XVIHX High Z
Reset X X X V
IL
X X High Z
Product Identification
Hardware V
IL
V
IL
V
IH
V
IH
A1 - A19 = VIL, A9 = V
H
(3)
A0 = V
IL
Manufacturer Code
(4)
A1 - A19 = VIL, A9 = V
H
(3)
A0 = V
IH
Device Code
(4)
Software
(5)
V
IH
A0 = VIL, A1 - A19 = V
IL
Manufacturer Code
(4)
A0 = VIH, A1 - A19 = V
IL
Device Code
(4)
DC Characteristics
Symbol Parameter Condition Min Max Units
I
LI
Input Load Current VIN = 0V to V
CC
10
µ
A
I
LO
Output Leakage Current V
I/O
= 0V to V
CC
10
µ
A
I
SB1
VCC Standby Current CMOS CE = VCC - 0.3V to V
CC
10
µ
A
I
SB2
VCC Standby Current TTL CE = 2.0V to V
CC
1mA
I
CC
(1)
V
CC
Active Current f = 5 MHz; I
OUT
= 0 mA 25 mA
I
CCRW
VCC Read While Write Current f = 5 MHz; I
OUT
= 0 mA 50 mA
V
IL
Input Low Voltage 0.8 V
V
IH
Input High Voltage 2.0 V
V
OL
Output Low Voltage IOL = 2.1 mA 0.45 V
V
OH
Output High Voltage IOH = -400 µA2.4V
Page 12
AT49BV16X4(T)
12
AC Read Wa veforms
(1)(2)(3)(4)
Notes: 1. CE may be delayed up to t
ACC
- tCE after the address transition without impact on t
ACC
.
2. OE may be d elayed up to tCE - tOE after the falling edge of CE without impac t on tCE or by t
ACC
- tOE after an address c han ge
without impact on t
ACC
.
3. tDF is specified from OE or CE whichever occurs first (CL = 5 pF).
4. This parameter is characterized and is not 100% tested.
Input Test Wavef orms and Measurement Level
tR, tF < 5 ns
Output Test Load
Note: 1. This parameter is characterized and is not 100% tested.
AC Read Characteristics
Symbol Parameter
AT49BV16X4-90 AT49BV16X4-12
UnitsMin Max Min Max
t
ACC
Address to Output Delay 90 120 ns
t
CE
(1)
CE to Output Delay 90 120 ns
t
OE
(2)
OE to Output Dela y 0 40 0 50 ns
t
DF
(3)(4)
CE or OE to Output Float 0 25 0 30 ns
t
OH
Output Hold from OE, CE or Address, whichever occurred first 0 0 ns
t
RO
RESET to Output Delay 800 800 ns
OUTPUT
VALID
OUTPUT
HIGH Z
RESET
OE
tOE
tCE
ADDRESS VALID
tDF
tOH
tACC
tRO
CE
ADDRESS
Pin Capacitance
f = 1 MHz, T = 25°C
(1)
T yp Max Units Conditions
C
IN
46 pFV
IN
= 0V
C
OUT
812 pFV
OUT
= 0V
Page 13
AT49BV16X4(T)
13
A C Byte/Word Load Waveforms
WE Controlled
CE Controlled
AC Byte/Word Load Characteristics
Symbol Parameter Min Max Units
tAS, t
OES
Address, OE Set-up Time 10 ns
t
AH
Address Hold Time 100 ns
t
CS
Chip Select Set-up Time 0 ns
t
CH
Chip Select Hold Time 0 ns
t
WP
Write Pulse Width (WE or CE)100ns
t
DS
Data Set-up Time 100 ns
tDH, t
OEH
Data, OE Hold Time 10 ns
t
WPH
Write Pulse Width High 50 ns
Page 14
AT49BV16X4(T)
14
Program Cyc le Waveforms
Sector or Chip Erase Cycle Waveforms
Notes: 1. OE must be high only when WE and CE are both low.
2. For chip erase, the address should be 5555. For sector erase, the address depends on what sector is to be erased. (See note 3 under command definitions.)
3. For chip erase, the data should be 10H, and for sector erase, the data should be 30H.
Program Cycle Characteristics
Symbol Parameter Min Typ Max Units
t
BP
Byte/Word Programming Time 20 50 µs
t
AS
Address Set-up Time 0 ns
t
AH
Address Hold Time 100 ns
t
DS
Data Set-up Time 100 ns
t
DH
Data Hold Time 0 ns
t
WP
Write Pulse Width 100 ns
t
WPH
Write Pulse Width High 50 ns
t
EC
Chip Erase Cycle Time 10 seconds
t
SEC
Sector Erase Cycle Time 200 ms
OE
PROGRAM CYCLE
INPUT
DATA
ADDRESS
A0
55
5555 5555
AA
2AAA
t
BP
t
WPH
t
WP
CE
WE
A0 -A19
DATA
t
AS
t
AH
t
DH
t
DS
5555
AA
OE
(1)
AA
80
Note 3
55 55
5555
5555
Note 2
AA
WORD 0
WORD 1 WORD 2
WORD 3
WORD 4
WORD 5
2AAA 2AAA
t
WPH
t
WP
CE
WE
A0-A19
DATA
t
AS
t
AH
t
EC
t
DH
t
DS
5555
Page 15
AT49BV16X4(T)
15
Notes: 1. These parameters are characterized and not 100% tested.
2. See tOE spec in AC Read Characteristics.
Data Polling Waveforms
Toggle Bit Characteristics
(1)
Notes: 1. These parameters are characterized and not 100% tested.
2. See tOE spec in AC Read Characteristics.
Toggle Bit Waveforms
(1)(2)(3)
Notes: 1. Toggling either OE or CE or both OE and CE will operate toggle bit.
The t
OEHP
specification must be met by the toggling input(s).
2. Beginning and ending state of I/O6 will vary.
3. Any address location may be used but the address should not vary.
Data Polling Characteristics
(1)
Symbol Parameter Min Typ Max Units
t
DH
Data Hold Time 10 ns
t
OEH
OE Hold Time 10 ns
t
OE
OE to Output Delay
(2)
ns
t
WR
Write Recovery Time 0 ns
Symbol Parameter Min Typ Max Units
t
DH
Data Hold Time 10 ns
t
OEH
OE Hold Time 10 ns
t
OE
OE to Output Delay
(2)
ns
t
OEHP
OE High Pulse 150 ns
t
WR
Write Recovery Time 0 ns
Page 16
AT49BV16X4(T)
16
Status Bit Table
Status Bit
I/O 7 I/O 6 I/O 2
Read Address In Plane A Plane B Plane A Plane B Plane A Plane B While
Programming in Plane A I/O7
DATA TOGGLE DATA 1 DATA
Programming in Plane B DATA I/O7
DATA TOGGLE DATA 1
Erasing in Plane A 0 DATA TOGGLE DATA TOGGLE DATA Erasing in Plane B DATA 0 DATA TOGGLE DATA TOGGLE
Erase Suspended & Read Erasing Sector
1 1 1 1 TOGGLE TOGGLE
Erase Suspended & Read Non-Erasing Sector
DA TA DATA DATA DATA DATA DATA
Erase Suspended & Program Erasing Sector
1 1 1 1 TOGGLE TOGGLE
Erase Suspended & Program Non-Erasing Sector in Plane A
I/O7
DATA TOGGLE D ATA TOGGLE DATA
Erase Suspended & Program Non-Erasing Sector in Plane B
DATA I/O7
DATA TOGGLE DATA TOGGLE
Page 17
AT49BV16X4(T)
17
Ordering Information
t
ACC
(ns)
ICC (mA)
Ordering Code Package Operation RangeActive Standby
90 25 0.01 AT49BV1604-90TC
AT49BV1604-90UC
48T 48U
Commercial (0° to 70°C)
AT49BV1614-90CC AT49BV1614-90TC
48C2 48T
25 0.01 AT49BV1604-90TI
AT49BV1604-90UI
48T 48U
Industrial
(-40° to 85°C)
AT49BV1614-90CI AT49BV1614-90TI
48C2 48T
120 25 0.01 AT49BV1604-12TC
AT49BV1604-12UC
48T 48U
Commercial (0° to 70°C)
AT49BV1614-12CC AT49BV1614-12TC
48C2 48T
25 0.01 AT49BV1604-12TI
AT49BV1604-12UI
48T 48U
Industrial
(-40° to 85°C)
AT49BV1614-12CI AT49BV1614-12TI
48C2 48T
90 25 0.01 AT49BV1604T-90TC
AT49BV1604T-90UC
48T 48U
Commercial (0° to 70°C)
AT49BV1614T-90CC AT49BV1614T-90TC
48C2 48T
25 0.01 AT49BV1604T-90TI
AT49BV1604T-90UI
48T 48U
Industrial
(-40° to 85°C)
AT49BV1614T-90CI AT49BV1614T-90TI
48C2 48T
120 25 0.01 AT49BV1604T-12TC
AT49BV1604T-12UC
48T 48U
Commercial (0° to 70°C)
AT49BV1614T-12CC AT49BV1614T-12TC
48C2 48T
25 0.01 AT49BV1604T-12TI
AT49BV1604T-12UI
48T 48U
Industrial
(-40° to 85°C)
AT49BV1614T-12CI AT49BV1614T-12TI
48C2 48T
Package Type
48C2 48-Ball, Plastic Chip-Size Ball Grid Array Package (CBGA) 48T 48-Lead, Thin Small Outline Package (TSOP) 48U 48-Ball, Mic ro Ball Grid Array Package (µBGA)
Page 18
AT49BV16X4(T)
18
Packaging Information
A
B
C
D
E
F
G
H
6 54321
5.6
NON-ACCUMULATIVE
0.40 DIA TYP
4.0
8.2
7.8
1.2 MAX
0.35
11.2
10.8
0.85
0.75
TYP
*Controlling dimension: millimeters
1
2
3
4
5
6
7
8
FEDCBA
5.25
8.4
8.0
NON-ACCUMULATIVE
0.30 DIA TYP
3.75
6.8
6.4
0.70
0.15 MIN.
0.75 TYP
1.00
0.85
48C2, 48-Ball, Plastic Chip-size Ball Grid Array Package (CBGA)
48T, 48-Lead, Plastic Thin Small Outline Package (TSOP) Dimensions in Millimeters and (Inches)*
JEDEC OUTLINE MO-142 DD
48U,
48-Ball, Micro Ball Grid Array Package (µBGA)
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