Datasheet AT28C256-15PU, AT28C256-15JU Specification

Page 1

Features

Fast Read Access Time – 150 ns
Automatic Page Write Operation
– Internal Address and Data Latches for 64 Bytes – Internal Control Timer
Fast Write Cycle Times
– Page Write Cycle Time: 3 ms or 10 ms Maximum – 1 to 64-byte Page Write Operation
– 50 mA Active Current – 200 µA CMOS Standby Current
Hardware and Software Data Protection
DATA Polling for End of Write Detection
High Reliability CMOS Technology
– Endurance: 10 – Data Retention: 10 Years
Single 5V ± 10% Supply
CMOS and TTL Compatible Inputs and Outputs
JEDEC Approved Byte-wide Pinout
Full Military and Industrial Temperature Ranges
Green (Pb/Halide-free) Packaging Option
4
or 105Cycles
256K (32K x 8) Paged Parallel EEPROM
AT28C256

1. Description

The AT28C256 is a high-performance electrically erasable and programmable read­only memory. Its 256K of memory is organized as 32,768 words by 8 bits. Manufac­tured with Atmel’s advanced nonvolatile CMOS technology, the device offers access times to 150 ns with power dissipation of just 440 mW. When the device is deselected, the CMOS standby current is less than 200 µA.
The AT28C256 is accessed like a Static RAM for the read or write cycle without the need for external components. The device contains a 64-byte page register to allow writing of up to 64 bytes simultaneously. During a write cycle, the addresses and 1 to 64 bytes of data are internally latched, freeing the address and data bus for other operations. Following the initiation of a write cycle, the device will automatically write the latched data using an internal control timer. The end of a write cycle can be detected by DATA Polling of I/O7. Once the end of a write cycle has been detected a new access for a read or write can begin.
Atmel’s AT28C256 has additional features to ensure high quality and manufacturabil­ity. The device utilizes internal error correction for extended endurance and improved data retention characteristics. An optional software data protection mechanism is available to guard against inadvertent writes. The device also includes an extra 64 bytes of EEPROM for device identification or tracking.
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2. Pin Configurations

Pin Name Function
A0 - A14 Addresses
CE Chip Enable
OE Output Enable
WE Write Enable
I/O0 - I/O7 Data Inputs/Outputs
NC No Connect
DC Don’t Connect

2.1 28-lead TSOP Top View

1
OE
2
A11
3
A9
4
A8
5
A13
6
WE
A14 A12
A7 A6 A5 A4 A3
7 8 9 10 11 12 13 14
VCC

2.2 28-lead PGA Top View

2.3 32-pad LCC, 28-lead PLCC Top View

A7
A12
28
A10
27
CE
26
I/O7
25
I/O6
24
I/O5
23
I/O4
22
I/O3
21
GND
20
I/O2
19
I/O1
18
I/O0
17
A0
16
A1
15
A2
A6 A5 A4 A3 A2 A1 A0
NC
I/O0
5 6 7 8 9 10 11 12 13
A14DCVCCWEA13
432
14151617181920
I/O1
I/O2
GND
1
DC
323130
I/O3
I/O4
29 28 27 26 25 24 23 22 21
I/O5
A8 A9 A11 NC OE A10 CE I/O7 I/O6
Note: PLCC package pins 1 and 17 are Don’t Connect.

2.4 28-lead Cerdip/PDIP/Flatpack/SOIC – Top View

A14 A12
A7 A6 A5 A4 A3 A2 A1
A0 I/O0 I/O1 I/O2
GND
1 2 3 4 5 6 7 8 9 10 11 12 13 14
28
VCC
27
WE
26
A13
25
A8
24
A9
23
A11
22
OE
21
A10
20
CE
19
I/O7
18
I/O6
17
I/O5
16
I/O4
15
I/O3
2
AT28C256
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3. Block Diagram

4. Device Operation

4.1 Read

The AT28C256 is accessed like a Static RAM. When CEandOE are low and WE is high, the data stored at the memory location determined by the address pins is asserted on the outputs. The outputs are put in the high impedance state when either CEorOE is high. This dual-line control gives designers flexibility in preventing bus contention in their system.
AT28C256

4.2 Byte Write

4.3 Page Write

4.4 DATA Polling

A low pulse on the WE or CE input with CE or WE low (respectively) and OE high initiates a write cycle. The address is latched on the falling edge of CE or WE, whichever occurs last. The data is latched by the first rising edge of CE or WE. Once a byte write has been started it will automati­cally time itself to completion. Once a programming operation has been initiated and for the duration of tWC, a read operation will effectively be a polling operation.
The page w rite operation of the AT28C256 allows 1 to 64 bytes of data to be written into the device during a single internal programming period. A page write operation is initiated in the same m anner as a byte write; the first byte written can then be followed by 1 to 63 additional bytes. Each successive byte must be written within 150 µs (t limit is exceeded the AT28C256 will cease accepting data and commence the internal program­ming operation. All bytes during a page write operation must reside on the same page as defined by the state of the A6 - A14 inputs. For each WE high to low transition during the page write operation, A6 - A14 must be the same.
The A0 to A5 inputs are used to specify which bytes within the page are to be written. The bytes may be loaded in any order and may be altered within the same load period. Only bytes which are specified for writing will be written; unnecessary cycling of other bytes within the page does not occur.
The AT28C256 features DATA Polling to indicate the end of a write cycle. During a byte or page write cycle an attempted read of the last byte written will result in the complement of the written data to be presented on I/O7. Once the write cycle has been completed, true data is valid on all outputs, and the next write cycle may begin. DATA Polling may begin at anytime during the write cycle.
) of the previous byte. If the t
BLC
BLC
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4.5 Toggle Bit

In addition to DATA Polling the AT28C256 provides another method for determining the end of a write cycle. During the write operation, successive attempts to read data from the device will result in I/O6 toggling between one and zero. Once the write has completed, I/O6 will stop tog­gling and valid data will be read. Reading the toggle bit may begin at any time during the write cycle.

4.6 Data Protection

If precautions are not taken, inadvertent writes may occur during transitions of the host system power supply. Atmel has incorporated both hardware and software features that will protect the memory against inadvertent writes.

4.6.1 Hardware Protection

Hardware features protect against inadvertent writes to the AT28C256 in the following ways: (a) VCCsense – if VCCis below 3.8V (typical) the write function is inhibited; (b) VCCpower-on delay – once VCChas reached 3.8V the device will automatically time out 5 ms (typical) before allowing a write; (c) write inhibit – holding any one of OE low, CE high or WE high inhibits write cycles; and (d) noise filter – pulses of less than 15 ns (typical) on the WE or CE inputs will not initiate a write cycle.

4.6.2 Software Data Protection

A software controlled data protection feature has been implemented on the AT28C256. When enabled, the software data protection (SDP), will prevent inadvertent writes. The SDP feature may be enabled or disabled by the user; the AT28C256 is shipped from Atmel with SDP disabled.
SDP is enabled by the host system issuing a series of three write commands; three specific bytes of data are written to three specific addresses (refer to “Software Data Protection” algo­rithm). After writing the 3-byte command sequence and after tWCthe entire AT28C256 will be protected against inadvertent write operations. It should be noted, that once protected the host may still perform a byte or page write to the AT28C256. This is done by preceding the data to be written by the same 3-byte command sequence used to enable SDP.
Once set, SDP will remain active unless the disable command sequence is issued. Power transi­tions do not disable SDP and SDP will protect the AT28C256 during power-up and power-down conditions. All command sequences must conform to the page write timing specifications. The data in the enable and disable command sequences is not written to the device and the memory addresses used in the sequence may be written with data in either a byte or page write operation.
After setting SDP, any attempt to write to the device without the 3-byte command sequence will start the internal write timers. No data will be written to the device; however, for the duration of tWC, read operations will effectively be polling operations.

4.7 Device Identification

An extra 64 bytes of EEPROM memory are available to the user for device identification. By rais­ing A9 to 12V ± 0.5V and using address locations 7FC0H to 7FFFH the additional bytes may be written to or read from in the same manner as the regular memory array.

4.8 Optional Chip Erase Mode

The entire device can be erased using a 6-byte software code. Please see “Software Chip Erase” application note for details.
4
AT28C256
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AT28C256

5. DC and AC Operating Range

AT28C256-15 AT28C256-20 AT28C256-25 AT28C256-35
Operating Temperature (Case)
Power Supply 5V ± 10% 5V ± 10% 5V ± 10% 5V ± 10%
V
CC

6. Operating Modes

Mode CE OE WE I/O
Read V
(2)
Write
Standby/Write Inhibit V
Write Inhibit X X V
Write Inhibit X V
Output Disable X V
Chip Erase V
Notes: 1. X can be VILor VIH.
2. Refer to AC programming waveforms.
= 12.0V ± 0.5V.
3. V
H
Ind. -40°C - 85°C
Mil. -55°C - 125°C -55°C - 125°C -55°C - 125°C -55°C - 125°C
IL
V
IL
IH
IL
V
IL
V
IH
(1)
X
IL
IH
(3)
V
H
V
IH
V
IL
X High Z
IH
X
X High Z
V
IL
D
OUT
D
IN
High Z

7. Absolute Maximum Ratings*

Temperature under Bias ................................ -55°C to +125°C
Storage Temperature..................................... -65°C to +150°C
All Input Voltages (including NC Pins)
with Respect to Ground ...................................-0.6V to +6.25V
All Output Voltages
with Respect to Ground .............................-0.6V to V
Voltage on
OE and A9
CC
+ 0.6V
with Respect to Ground ...................................-0.6V to +13.5V
*NOTICE: Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent dam­age to the device. This is a stress rating only and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability

8. DC Characteristics

Symbol Parameter Condition Min Max Units
I
I
I
I
I
V
V
V
V
LI
LO
SB1
SB2
CC
IL
IH
OL
OH
Input Load Current VIN=0VtoVCC+1V 10 µA
Output Leakage Current V
VCCStandby Current CMOS CE = VCC- 0.3V to VCC+1V
=0VtoV
I/O
CC
10 µA
Ind. 200 µA
Mil. 300 µA
VCCStandby Current TTL CE = 2.0V to VCC+1V 3 mA
VCCActive Current f = 5 MHz; I
=0mA 50 mA
OUT
Input Low Voltage 0.8 V
Input High Voltage 2.0 V
Output Low Voltage IOL= 2.1 mA 0.45 V
Output High Voltage IOH= -400 µA 2.4 V
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9. AC Read Characteristics

AT28C256-15 AT28C256-20 AT28C256-25 AT28C256-35
Symbol Parameter
t
ACC
t
CE
t
OE
t
DF
t
OH
(1)
(2)
(3)(4)
Address to Output Delay 150 200 250 350 ns
CE to Output Delay 150 200 250 350 ns
OE to Output Delay 0 70 0 80 0 100 0 100 ns
CE or OE to Output Float 0 50 0 55 0 60 0 70 ns
Output Hold from OE, CE or Address, whichever occurred first
10. AC Read Waveforms
UnitsMin Max Min Max Min Max Min Max
0000 ns
(1)(2)(3)(4)
Notes: 1. CE may be delayed up to t
OE may be delayed up to tCE-tOEafter the falling edge of CE without impact on tCEor by t
2. without impact on t
is specified from OE or CE whichever occurs first (CL= 5 pF).
3. t
DF
ACC
.
4. This parameter is characterized and is not 100% tested.
ACC-tCE
after the address transition without impact on t
ACC
.
ACC-tOE
after an address change
6
AT28C256
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11. Input Test Waveforms and Measurement Level

tR,tF<5ns

12. Output Test Load

13. Pin Capacitance

f = 1 MHz, T = 25°C
(1)
AT28C256
Symbol Typ Max Units Conditions
C
IN
C
OUT
Note: 1. This parameter is characterized and is not 100% tested.
4 6 pF VIN=0V
812pFV
OUT
=0V
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14. AC Write Characteristics

Symbol Parameter Min Max Units
t
AS,tOES
t
AH
t
CS
t
CH
t
WP
t
DS
t
DH,tOEH
t
DV
Address, OE Setup Time 0 ns
Address Hold Time 50 ns
Chip Select Setup Time 0 ns
Chip Select Hold Time 0 ns
Write Pulse Width (WE or CE) 100 ns
Data Setup Time 50 ns
Data, OE Hold Time 0 ns
Time to Data Valid NR
(1)
Note: 1. NR = No Restriction

15. AC Write Waveforms

15.1 WE Controlled

15.2 CE Controlled

8
AT28C256
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AT28C256

16. Page Mode Characteristics

Symbol Parameter Min Max Units
t
WC
t
AS
t
AH
t
DS
t
DH
t
WP
t
BLC
t
WPH
Write Cycle Time (option available)
Address Setup Time 0 ns
Address Hold Time 50 ns
Data Setup Time 50 ns
Data Hold Time 0 ns
Write Pulse Width 100 ns
Byte Load Cycle Time 150 µs
Write Pulse Width High 50 ns
17. Page Mode Write Waveforms
AT28C256 10 ms
AT28C256F 3 ms
(1)(2)
Notes: 1. A6 through A14 must specify the same page address during each high to low transition of WE (or CE).
OE must be high only when WE and CE are both low.
2.

18. Chip Erase Waveforms

tS=tH= 5 µsec (min.) t
= 10 msec (min.)
W
V
= 12.0V ± 0.5V
H
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19. Software Data Protection Enable Algorithm
LOAD DATA AA
TO
ADDRESS 5555
(1)
20. Software Data Protection Disable Algorithm
LOAD DATA AA
TO
ADDRESS 5555
(1)
LOAD DATA 55
TO
ADDRESS 2AAA
LOAD DATA A0
TO
ADDRESS 5555
LOAD DATA XX
TO
ANY ADDRESS
LOAD LAST BYTE
TO
LAST ADDRESS
WRITES ENABLED
(4)
ENTER DATA PROTECT STATE
Notes: 1. Data Format: I/O7 - I/O0 (Hex);
Address Format: A14 - A0 (Hex).
2. Write Protect state will be activated at end of write even if no other data is loaded.
3. Write Protect state will be deactivated at end of write period even if no other data is loaded.
4. 1 to 64 bytes of data are loaded.
LOAD DATA 55
TO
ADDRESS 2AAA
LOAD DATA 80
TO
(2)
ADDRESS 5555
LOAD DATA AA
TO
ADDRESS 5555
LOAD DATA 55
TO
ADDRESS 2AAA
LOAD DATA 20
TO
ADDRESS 5555
LOAD DATA XX
TO
ANY ADDRESS
LOAD LAST BYTE
TO
LAST ADDRESS
EXIT DATA PROTECT STATE
(4)
(3)
21. Software Protected Write Cycle Waveforms
(1)(2)
Notes: 1. A6 through A14 must specify the same page address during each high to low transition of WE (or CE) after the software
code has been entered.
OE must be high only when WE and CE are both low.
2.
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AT28C256
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AT28C256
22. Data Polling Characteristics
Symbol Parameter Min Typ Max Units
t
DH
t
OEH
t
OE
t
WR
Notes: 1. These parameters are characterized and not 100% tested.
Data Hold Time 0 ns
OE Hold Time 0 ns
OE to Output Delay
Write Recovery Time 0 ns
2. See“AC Read Characteristics” on page 6.
(2)
(1)

23. Data Polling Waveforms

ns
24. Toggle Bit Characteristics
Symbol Parameter Min Typ Max Units
t
DH
t
OEH
t
OE
t
OEHP
t
WR
Notes: 1. These parameters are characterized and not 100% tested.
Data Hold Time 10 ns
OE Hold Time 10 ns
OE to Output Delay
OE High Pulse 150 ns
Write Recovery Time 0 ns
2. See “AC Read Characteristics” on page 6.
(2)
25. Toggle Bit Waveforms
(1)
(1)(2)(3)
ns
Notes: 1. Toggling either OE or CE or both OE and CE will operate toggle bit.
2. Beginning and ending state of I/O6 will vary.
3. Any address location may be used but the address should not vary.
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26. Normalized ICCGraphs

12
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27. Ordering Information

27.1 27.1Military Dual Marked Package

27.1.1 AT28C256

AT28C256
t
ACC
ICC(mA)
(ns) Active Standby Ordering Code Package Operation Range
150 50 0.3
AT28C256-15DM/883
5962-88525 14 XX
(1)
28D6
5962-88525 06 XX
AT28C256-15FM/883
5962-88525 14 ZX
5962-88525 06 ZX
(1)
28F
Military/883C
Class B, Fully Compliant
AT28C256-15LM/883
5962-88525 14 YX
(1)
32L
(-55°C to 125°C)
5962-88525 06 YX
AT28C256-15UM/883
5962-88525 14 UX
(1)
28U
5962-88525 06 UX
200 50 0.3
AT28C256-20DM/883
5962-88525 12 XX
(1)
28D6
5962-88525 04 XX
AT28C256-20FM/883
5962-88525 12 ZX
5962-88525 04 ZX
(1)
28F
Military/883C
Class B, Fully Compliant
AT28C256-20LM/883
5962-88525 12 YX
(1)
32L
(-55°C to 125°C)
5962-88525 04 YX
AT28C256-20UM/883
5962-88525 12 UX
(1)
28U
5962-88525 04 UX
250 50 0.3
AT28C256-25DM/883
5962-88525 11 XX
(1)
28D6
5962-88525 03 XX
AT28C256-25FM/883
5962-88525 11 ZX
5962-88525 03 ZX
(1)
28F
Military/883C
Class B, Fully Compliant
AT28C256-25LM/883
5962-88525 11 YX
(1)
32L
(-55°C to 125°C)
5962-88525 03 YX
AT28C256-25UM/883
5962-88525 11 UX
(1)
28U
5962-88525 03 UX
Note: 1. Where two DESC numbers apply to the Atmel ordering code apply SL815 to receive parts with the noted DESC number dual
marked along with Atmel part number.
13
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27.1.2 AT28C256E

t
ACC
ICC(mA)
(ns) Active Standby Ordering Code Package Operation Range
150 50 0.3
AT28C256E-15DM/883
5962-88525 16 XX
(1)
28D6
5962-88525 08 XX
AT28C256E-15FM/883
5962-88525 16 ZX
5962-88525 08 ZX
(1)
28F
Military/883C
Class B, Fully Compliant
AT28C256E-15LM/883
5962-88525 16 YX
(1)
32L
(-55°C to 125°C)
5962-88525 08 YX
AT28C256E-15UM/883
5962-88525 16 UX
(1)
28U
5962-88525 08 UX
200 50 0.3
AT28C256E-20DM/883 28D6
AT28C256E-20FM/883 28F
Military/883C
Class B, Fully Compliant
AT28C256E-20LM/883 32L
(-55°C to 125°C)
AT28C256E-20UM/883 28U
250 50 0.3
AT28C256E-25DM/883
5962-88525 13 XX
(1)
28D6
5962-88525 05 XX
5962-88525 05 XX
5962-88525 13 ZX
5962-88525 05 ZX
(1)
28F
Military/883C
Class B, Fully Compliant
AT28C256E-25LM/883
5962-88525 13 YX
(1)
32L
(-55°C to 125°C)
5962-88525 05 YX
AT28C256E-25UM/883
5962-88525 13 UX
(1)
28U
5962-88525 05 UX
Note: 1. Where two DESC numbers apply to the Atmel ordering code apply SL815 to receive parts with the noted DESC number dual
marked along with Atmel part number.
14
AT28C256
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27.1.3 AT28C256F

AT28C256
t
ACC
ICC(mA)
(ns) Active Standby Ordering Code Package Operation Range
150 50 0.3 AT28C256F-15DM/883
5962-88525 15 XX
(3)
28D6
5962-88525 07 XX
AT28C256F-15FM/883
5962-88525 15 ZX
5962-88525 07 ZX
AT28C256F-15LM/883
5962-88525 15 YX
(3)
28F
Military/883C
Class B, Fully Compliant
(3)
32L
(-55°C to 125°C)
5962-88525 07 YX
AT28C256F-15UM/883
5962-88525 15 UX
(3)
28U
5962-88525 07 UX
Notes: 1. Electrical specifications for these speeds are defined by Standard Microcircuit Drawing 5962-88525.
2. SMD specifies Software Data Protection feature for device type, although Atmel product supplied to every device type in the SMD is 100% tested for this feature.
3. Where two DESC numbers apply to the Atmel ordering code apply SL815 to receive parts with the noted DESC number dual marked along with Atmel part number.
Package Type
28D6 28-lead, 0.600" Wide, Non-windowed, Ceramic Dual Inline Package (Cerdip)
28F 28-lead, Non-windowed, Ceramic Bottom-brazed Flat Package (Flatpack)
32L 32-pad, Non-windowed, Ceramic Leadless Chip Carrier (LCC)
28U 28-pin, Ceramic Pin Grid Array (PGA)
W Die
Options
Blank Standard Device: Endurance = 10K Write Cycles; Write Time = 10 ms
E High Endurance Option: Endurance = 100K Write Cycles
F Fast Write Option: Write Time=3ms
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27.2 Industrial Green Package Option (Pb/Halide-free)

27.2.1 AT28C256

t
ACC
(ns) Active Standby Ordering Code Package Operation Range
150 50 0.2 AT28C256-15JU
ICC(mA)
AT28C256-15PU AT28C256-15SU AT28C256-15TU
32J
28P6
28S 28T
(-40°C to 85°C)

27.2.2 AT28C256E

t
ACC
(ns) Active Standby Ordering Code Package Operation Range
150 50 0.2 AT28C256E-15JU
ICC(mA)
AT28C256E-15SU AT28C256E-15TU
32J 28S 28T
(-40°C to 85°C)

27.2.3 AT28C256F

t
ACC
(ns) Active Standby Ordering Code Package Operation Range
150 50 0.2 AT28C256F-15JU
ICC(mA)
AT28C256F-15SU
AT28C256F-15TU
32J 28S 28T
(-40°C to 85°C)
Industrial
Industrial
Industrial
Package Type
32J 32-lead, Plastic J-leaded Chip Carrier (PLCC)
28P6 28-lead, 0.600" Wide, Plastic Dual Inline Package (PDIP)
28S 28-lead, 0.300" Wide, Plastic Gull Wing Small Outline (SOIC)
28T 28-lead, Plastic Thin Small Outline Package (TSOP)
Options
Blank Standard Device: Endurance = 10K Write Cycles; Write Time = 10 ms
E High Endurance Option: Endurance = 100K Write Cycles
F Fast Write Option: Write Time=3ms

28. Die Products

Reference Section: Contact Atmel sales for die sales options.
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AT28C256
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29. Packaging Information

29.1 28D6 – Cerdip

Dimensions in Millimeters and (Inches). Controlling dimension: Inches. MIL-STD 1835 D-10 Config A (Glass Sealed)
37.85(1.490)
36.58(1.440)
AT28C256
PIN
1
15.49(0.610)
12.95(0.510)
5.72(0.225)
SEATING
PLANE
5.08(0.200)
3.18(0.125)
2325 Orchard Parkway
R
San Jose, CA 95131
33.02(1.300) REF
MAX
1.65(0.065)
2.54(0.100)BSC
1.14(0.045)
15.70(0.620)
15.00(0.590)
0.46(0.018)
0.20(0.008)
TITLE
28D6, 28-lead, 0.600" Wide, Non-windowed,
Ceramic Dual Inline Package (Cerdip)
0.127(0.005)MIN
1.52(0.060)
0.38(0.015)
0.66(0.026)
0.36(0.014)
0º~ 15º REF
17.80(0.700) MAX
DRAWING NO.
28D6
10/23/03
REV.
B
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Page 18

29.2 28F – Flatpack

PIN #1 ID
9.40(0.370)
6.35(0.250)
0.56(0.022)
0.38(0.015)
1.27(0.050) BSC
1.14(0.045) MAX
3.02(0.119)
2.29(0.090)
1.14(0.045)
0.660(0.026)
7.26(0.286)
6.96(0.274)
1.96(0.077)
1.09(0.043)
0.23(0.009)
0.10(0.004)
10.57(0.416)
9.75(0.384)
Dimensions in Millimeters and (Inches). Controlling dimension: Inches. MIL-STD 1835 F-12 Config B
18
2325 Orchard Parkway
R
San Jose, CA 95131
AT28C256
TITLE
28F, 28-lead, Non-windowed, Ceramic Bottom-brazed
Flat Package (FlatPack)
DRAWING NO.
28F
0006M–PEEPR–12/09
10/21/03
REV.
B
Page 19

29.3 32J – PLCC

AT28C256
1.14(0.045) X 45
B
e
0.51(0.020)MAX
45 MAX (3X)
Notes: 1. This package conforms to JEDEC reference MS-016, Variation AE.
2. Dimensions D1 and E1 do not include mold protrusion. Allowable protrusion is .010"(0.254 mm) per side. Dimension D1 and E1 include mold mismatch and are measured at the extreme material condition at the upper or lower parting line.
3. Lead coplanarity is 0.004" (0.102 mm) maximum.
PIN NO. 1 IDENTIFIER
D1
D
D2
1.14(0.045) X 45
E1 E
0.318(0.0125)
0.191(0.0075)
E2
B1
A2
A1
A
COMMON DIMENSIONS
(Unit of Measure = mm)
SYMBOL
A 3.175 3.556
A1 1.524 2.413
A2 0.381
D 12.319 12.573
D1 11.354 11.506 Note 2
D2 9.906 10.922
E 14.859 15.113
E1 13.894 14.046 Note 2
E2 12.471 13.487
B 0.660 0.813
B1 0.330 0.533
e 1.270 TYP
MIN
NOM
MAX
NOTE
10/04/01
2325 Orchard Parkway
R
San Jose, CA 95131
0006M–PEEPR–12/09
TITLE
32J, 32-lead, Plastic J-leaded Chip Carrier (PLCC)
DRAWING NO.
32J
REV.
B
19
Page 20

29.4 32L – LCC

Dimensions in Millimeters and (Inches). Controlling dimension: Inches. MIL-STD 1835 C-12
11.63(0.458)
11.23(0.442)
2.54(0.100)
2.16(0.085)
14.22(0.560)
13.72(0.540)
10.16(0.400) BSC
2325 Orchard Parkway
R
San Jose, CA 95131
1.91(0.075)
1.40(0.055)
INDEX CORNER
X 45˚
RADIUS
2.41(0.095)
1.91(0.075)
1.27(0.050) TYP
PIN 1
1.40(0.055)
1.14(0.045)
7.62(0.300) BSC
0.635(0.025)
0.381(0.015)
0.305(0.012)
0.178(0.007)
0.737(0.029)
0.533(0.021)
1.02(0.040) X 45˚
2.16(0.085)
1.65(0.065)
TITLE
32L, 32-pad, Non-windowed, Ceramic Lid, Leadless Chip
Carrier (LCC)
DRAWING NO.
32L
10/21/03
REV.
B
20
AT28C256
0006M–PEEPR–12/09
Page 21

29.5 28P6 – PDIP

PIN
1
E1
A1
B
REF
E
B1
C
L
SEATING PLANE
A
AT28C256
D
e
0º ~ 15º
eB
Notes: 1. This package conforms to JEDEC reference MS-011, Variation AB.
2. Dimensions D and E1 do not include mold Flash or Protrusion. Mold Flash or Protrusion shall not exceed 0.25 mm (0.010").
TITLE
2325 Orchard Parkway
R
San Jose, CA 95131
28P6, 28-lead (0.600"/15.24 mm Wide) Plastic Dual Inline Package (PDIP)
COMMON DIMENSIONS
(Unit of Measure = mm)
SYMBOL
A 4.826
A1 0.381
D 36.703 37.338 Note 2
E 15.240 15.875
E1 13.462 13.970 Note 2
B 0.356 0.559
B1 1.041 1.651
L 3.048 3.556
C 0.203 0.381
eB 15.494 17.526
e 2.540 TYP
MIN
NOM
MAX
DRAWING NO.
28P6
NOTE
09/28/01
REV.
B
0006M–PEEPR–12/09
21
Page 22

29.6 28S – SOIC

Dimensions in Millimeters and (Inches). Controlling dimension: Millimeters.
0.51(0.020)
0.33(0.013)
PIN 1
TOP VIEW
18.10(0.7125)
17.70(0.6969)
0.30(0.0118)
0.10(0.0040)
0º ~ 8º
7.60(0.2992)
7.40(0.2914)
1.27(0.50) BSC
1.27(0.050)
0.40(0.016)
10.65(0.419)
10.00(0.394)
2.65(0.1043)
2.35(0.0926)
SIDE VIEWS
0.32(0.0125)
0.23(0.0091)
22
2325 Orchard Parkway
R
San Jose, CA 95131
AT28C256
TITLE
28S, 28-lead, 0.300" Body, Plastic Gull Wing Small Outline (SOIC)
JEDEC Standard MS-013
DRAWING NO.
28S
0006M–PEEPR–12/09
8/4/03
REV.
B
Page 23

29.7 28T – TSOP

AT28C256
PIN 1
Pin 1 Identifier Area
D1
D
e
E
b
A2
A
A1
Notes: 1. This package conforms to JEDEC reference MO-183.
2. Dimensions D1 and E do not include mold protrusion. Allowable protrusion on E is 0.15 mm per side and on D1 is 0.25 mm per side.
3. Lead coplanarity is 0.10 mm maximum.
0º ~ 5º
SEATING PLANE
SYMBOL
c
L
L1
GAGE PLANE
COMMON DIMENSIONS
(Unit of Measure = mm)
MIN
A 1.20
A1 0.05 0.15
A2 0.90 1.00 1.05
D 13.20 13.40 13.60
D1 11.70 11.80 11.90 Note 2
E 7.90 8.00 8.10 Note 2
L 0.50 0.60 0.70
L1 0.25 BASIC
b 0.17 0.22 0.27
c 0.10 0.21
e 0.55 BASIC
NOM
MAX
NOTE
2325 Orchard Parkway
R
San Jose, CA 95131
0006M–PEEPR–12/09
TITLE
28T, 28-lead (8 x 13.4 mm) Plastic Thin Small Outline
Package, Type I (TSOP)
DRAWING NO.
28T
12/06/02
REV.
C
23
Page 24

29.8 28U – PGA

Dimensions in Millimeters and (Inches). Controlling dimension: Inches.
7.26(0.286)
6.50(0.256)
16.71(0.658)
16.31(0.642)
13.74(0.540)
13.36(0.526)
14.17(0.558)
13.77(0.542)
2.57(0.101)
2.06(0.081)
15.24(0.600)
14.88(0.586)
2.54(0.100) TYP
12.70(0.500) TYP
1.40(0.055)
1.14(0.045)
0.58(0.023)
0.43(0.017)
3.12(0.123)
2.62(0.103)
1.83(0.072)
1.57(0.062)
24
2325 Orchard Parkway
R
San Jose, CA 95131
AT28C256
2.54(0.100) TYP
10.41(0.410)
9.91(0.390)
TITLE
28U, 28-pin, Ceramic Pin Grid Array (PGA)
DRAWING NO.
28U
0006M–PEEPR–12/09
10/21/03
REV.
B
Page 25
Headquarters International
Atmel Corporation
2325 Orchard Parkway San Jose, CA 95131 USA Tel: 1(408) 441-0311 Fax: 1(408) 487-2600
Atmel Asia
Unit 1-5 & 16, 19/F BEA Tower, Millennium City 5 418 Kwun Tong Road Kwun Tong, Kowloon Hong Kong Tel: (852) 2245-6100 Fax: (852) 2722-1369
Product Contact
Web Site
www.atmel.com
Literature Requests
www.atmel.com/literature
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Technical Support
p_eeprom@atmel.com
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Sales Contact
www.atmel.com/contacts
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TIONS OF SALE LOCATED ON ATMEL’S WEB SITE, ATMEL ASSUMES NO LIABILITY WHATSOEVER AND DISCLAIMS ANY EXPRESS, IMPLIED OR STATUTORY WARRANTY RELATING TO ITS PRODUCTS INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTY OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE, OR NON-INFRINGEMENT. IN NO EVENT SHALL ATMEL BE LIABLE FOR ANY DIRECT, INDIRECT, CONSEQUENTIAL, PUNITIVE, SPECIAL OR INCIDEN­TAL DAMAGES (INCLUDING, WITHOUT LIMITATION, DAMAGES FOR LOSS OF PROFITS, BUSINESS INTERRUPTION, OR LOSS OF INFORMATION) ARISING OUT OF THE USE OR INABILITY TO USE THIS DOCUMENT, EVEN IF ATMEL HAS BEEN ADVISED OF THE POSSIBILITY OF SUCH DAMAGES. Atmel makes no
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0006M–PEEPR–12/09
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