Self-Timed Byte Writes
On-chip Address and Data Latc h for SRAM-lik e Wri te Ope rati on
Fast Write Cycle Time - 1 ms
5-Volt-Only Nonvolatile Writes
End of Write Detection
•
RDY/BUSY Output
DATA Polling
High Reliabili ty
•
Endurance: 100, 000 Write Cycles
Data Retention: 10 Years Minimum
Single 5-Volt Suppl y for Rea d an d Write
•
Very Low Power
•
30 mA Active Current
100 µA Standby Curre nt
Description
The AT28C16-T is the ideal nonvolatile attribute memory: it is a low power, 5-volt-only
byte writeable nonvolatile memory (E
100 µΑ. The AT28C16-T is written like a Static RAM, eliminating complex programming algorithms. The fast write cycle times of 1 ms, allow quick card reconfiguration
in-system. Data retention is specified as 10 years minimum, precluding the necessity
for batteries. Three access times have been specified to allow for varying layers of
buffering between the memory and the PCMCIA interface.
The AT28C16-T is accessed like a Static RAM for read and write operations. During
a byte write, the address and data are latched internally. Following the initiation of a
write cycle, the device will go to a busy state and automatically write the latched data
using an internal control timer. The device provides two methods for detecting the end
of a write cycle; the RDY/
BUSY output and DATA POLLING of I/O7.
2
PROM). Standby current is typically less than
AT28C16-T
AT28C16-T
Pin Configurations
Pin NameFunction
A0 - A10Addresses
CEChip Enable
OEOutput E nable
WEWrite Enable
I/O0 - I/O7Data Inputs/Output s
RDY/
BSYReady/Busy Output
NCNo Connect
TSOP
Top View
2-175
Page 2
Block Diagram
Absolute Maximum Ratings*
Temperature Under Bias.................-55°C to +125°C
Storage Temperature...................... -65°C to +125°C
All Input Voltages
(including NC Pins)
with Respect to Ground ................... -0.6V to +6.25V
All Output Voltages
with Respect to Ground .............-0.6V to V
+ 0.6V
CC
Voltage on OE and A9
with Respect to Ground ................... -0.6V to +13.5V
*NOTICE: Stresses beyond those listed un der “Abso lute Maxi-
mum Ratings” may cause permanen t dama ge to th e de vice .
This is a stress rating only and functional operation of the
device at these or any other conditions beyond those indicated in the operational sections of this specification is not
implied. Exposure to absolute maximum rating conditions
for extended periods may affect device reliability.
2-176AT28C16-T
Page 3
Device Operation
READ:The AT28C16-T is accessed like a Static RAM.
CE and OE are low and WE is high, the data stored
When
at the memory location detemined by the address pins is
asserted on the outputs. The outputs are put in a high impedance state whenever
control gives designers increased flexibility in preventing
bus contention.
BYTE WRITE: Writing data into the AT28C16-T is similar
to writing into a Static RAM. A low pulse on
OE high and CE or WE low (respectively) initiates a
with
byte write. The address is latched on the falling edge of
WE or CE (whichever occurs last) and the data is latched
on the rising edge of
Once a byte write is started it will automatically time itself
to completion. For the AT28C16-T the write cycle time is 1
ms maximum. Once a programming operation has been
initiated and for the duration of t
effectively be a polling operation.
READY/
put that indicates the current status of the self-timed internal write cycle. READY/
the write cycle and is released at the completion of the
write. The open drain output allows OR-tying of several
devices to a common interrupt input.
BUSY: Pin 1 is an open drain READY/BUSY out-
CE or OE is high. This dual-line
WE or CE input
WE or CE (whichever occurs first).
, a read operation will
WC
BUSY is actively pulled low during
AT28C16-T
DATA POLLING: The AT28C16-T also provides DATA
polling to signal the completion of a write cycle. During a
write cycle, an attempted read of the the data being written
results in the complement of that data for I/O
outputs are indeterminate). When the write cycle is finished, true data appears on all ouputs.
WRITE PROTECTION: Inadvertent writes to the device
are protec ted against in the following ways: (a) V
sense— if VCC is below 3.8V (typical) the write function is
inhibited; (b) V
reached 3.8V the device will automatically time out 5 ms
(typical) before allowing a byte write; (c) Write Inhibit—
holding any one of
byte write cycles.
CHIP CLEAR: The contents of the entire memory of the
AT28C16-T may be set to the high state by the Chip Clear
operation. By setting
cleared when a 10ms low pulse is applied to
DEVICE IDENTIFICATION: An extra 32-bytes of
2
PROM memory are available to the user for device
E
identifcation. By raising A
dress locations 7E0H to 7FFH the additional bytes may be
written to or read from in the same manner as the regular
memory array.
Input Load CurrentVIN = 0V to VCC + 1V10µA
Output Leakage CurrentV
VCC Standby Current CMOSCE = V
VCC Standby Current TTLCE = 2.0V to VCC + 1.0V
= 0V to V
I/O
CC
CC
10µA
- 0.3V to VCC + 1.0V100µA
Com.2mA
Ind.3mA
V
Active Currentf = 5 MHz; I
CC
OUT
= 0 mA
Com.30mA
Ind.45mA
Input Low Voltage0.8V
Input High Voltage2.0V
Output Low VoltageIOL = 2.1 mA.4V
Output High VoltageIOH = -400 µA2.4V
Page 5
AC Read Characteristics
AT28C16-T
PCMCIA
Symbol
(R)t
t
C
(A)t
t
A
(CE)tCE
t
A
(OE)tOE
t
A
(CE)tLz
t
EN
(OE)t
t
EN
(A)t
t
V
(CE)tDF
t
DIS
(OE)tDF
t
DIS
Atmel
SymbolParameter
RC
ACC
(1)
(2)
(4)
(4)
OLZ
OH
(3, 4)
(3, 4)
AC Read Waveforms
AT28C16-15T
MinMax
Read Cycle Time150ns
Address Access Time150ns
CE Access Time150ns
OE Access Time075ns
Output Enable Time From CE0ns
Output Enable Time From OE0ns
Output Hold Time0ns
Output Disable Time From CE050ns
Output Disable Time From OE050ns
(1, 2, 3, 4)
Units
Notes: 1. CE may be delayed up to t
transition without impact on t
OE may be delayed up to tCE - tOE after the falling
2.
edge of
after an address chan ge wi th ou t impa ct on t
CE without impact on tCE or by t
- tCE after the address
ACC
.
ACC
- tOE
ACC
ACC
.
Input Test Waveforms and
Measurement Level
tR, tF < 5 ns
Pin Capacitance (f = 1 MHz, T = 25°C)
TypMaxUnitsConditions
C
IN
C
OUT
Note: 1. This parameter is charac terized and is not 100% tes te d.
46pFV
812pFV
(1)
is specified from OE or CE whichever occurs first
3. t
DF
= 5 pF).
(C
L
4. This parameter is characte rized and is not 100% tested.
Output Test Load
= 0V
IN
= 0V
OUT
2-179
Page 6
AC Write Characteristics
PCMCIA
Symbol
(A)t
t
SU
(OE-WE)t
t
SU
(CE-WE)t
t
SU
(WE)t
t
W
(D-WEH)t
t
SU
(A)t
t
H
(D)t
t
H
(OE-WE)t
t
H
(CE-WE)t
t
H
(B)t
t
D
(W)t
t
C
Atmel
SymbolParameterMinMax
AS
OES
CS
WP
DS
AH
DH
OEH
CH
DB
WC
Address Setup Time10ns
Output Disable Time To WE10ns
Chip Enable Time To WE0ns
Write Enable Pulse Width1001000ns
Data Setup To WE High50ns
Address Hold Time From WE50ns
Data Hold Time From WE High10ns
Output Enable Hold Time From WE High10ns
Chip Enable Hold Time From WE High0ns
Delay From WE High To BUSY Asserted50ns
Write Cycle Time1ms
Units
AC Write Waveforms
2-180AT28C16-T
Page 7
Data Polling Waveforms
Note: 1. Data Polling AC Timing Characterist ic s are the same as the AC Read Cha racteristics.
AT28C16-T
Chip Erase Wavefor ms
tS = tH = 1 µsec (min. )
= 10 msec (min.)
t
W
V
= 12.0 ± 0.5V
H
2-181
Page 8
Ordering Informati o n
(1)
t
ACC
(ns)
150300.1AT28C16-15TC28TCommercial
Notes: 1. See Valid Part Number table below.
2. The 28C16 200 ns and 250 ns speed selecti on s have bee n remov ed from val id selec ti on s ta bl e an d are re plac ed by
the faster 150 ns TAA offering.
ICC (mA)
ActiveStandby
450.1AT28C16-15TI28TIndustrial
Ordering Code
PackageOperation Range
(0°C to 70°C)
(-40°C to 85°C)
Valid Part Numbers
The following table lists standard Atmel products that can be ordered.
Device NumbersSpeedPackage and Temperature Combinations
AT28C16
15
TC, TI
Package Type
28T28 Lead, Plastic Thin Small Outline Package (TSOP)
2-182AT28C16-T
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