The AS7C4098 and AS7C34098 are high-performance CMOS 4,194,304-bit Static Random Access Memory (SRAM) devices
organized as 262,144 words × 16 bits. They are designed for memory applications where fast data access, low power, and
simple interfacing are desired.
Equal address access and cycle times (t
are ideal for high-performance applications. The chip enable input CE
memory systems.
When CE
is High the device enters standby mode. The standard AS7C4098 is guaranteed not to exceed 110 mW power
consumption in CMOS standby mode. Both devices offer 2.0V data retention.
A write cycle is accomplished by asserting write enable (WE
written on the rising edge of WE
(write cycle 1) or CE (write cycle 2). To avoid bus contention, external devices should drive
I/O pins only after outputs have been disabled with output enable (OE
A read cycle is accomplished by asserting output enable (OE
drives I/O pins with the data word referenced by the input address. When either chip enable or output enable is inactive, or
write enable is active, output drivers stay in high-impedance mode.
These devices provide multiple center power and ground pins, and separate byte enable controls, allowing individual bytes to
be written and read. LB
controls the lower bits, I/O1–I/O8, and UB controls the higher bits, I/O9–I/O16.
All chip inputs and outputs are TTL- and CMOS-compatible, and operation is from either a single 5V (AS7C4098) or 3.3V
(AS7C34098) supply. Both devices are available in the JEDEC standard 400-mL, 44-pin SOJ and TSOP II packages.
, tRC, tWC) of 10/12/15/20 ns with output enable access times (tOE) of 5/6/7/8 ns
AA
permits easy memory expansion with multiple-bank
) and chip enable (CE). Data on the input pins I/O1–I/O16 is
) or write enable (WE).
) and chip enable (CE), with write enable (WE) High. The chip
AS7C34098
Absolute maximum ratings
ParameterDeviceSymbolMinMaxUnit
Vol tag e o n V
relative to GND
CC
AS7C4098V
AS7C34098V
Voltage on any pin relative to GNDV
Power dissipationP
Storage temperature (plastic)T
Ambient temperature with V
appliedT
CC
DC current into outputs (low)I
Note: Stresses greater than those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and functional
operation of the device at these or any other conditions outside those indicated in the operational sections of this specification is not implied. Exposure to
absolute maximum rating conditions for extended periods may affect reliability.
t1
t1
t2
D
stg
bias
OUT
–0.50+7.0V
–0.50+5.0V
–0.50VCC +0.50V
–1.5W
–65+150°C
–55 +125°C
–±20mA
Truth table
CE
HXXXXHigh ZHigh ZStandby (I
LHHXX
LXXHH
LHL
LLX
Key: X = Don’t care, L = Low, H = High.
WEOELBUBI/O1–I/O8I/O9–I/O16Mode
High ZHigh ZOutput disable (I
LH D
LL D
LH D
LL D
OUT
OUT
IN
IN
High Z
OUT
D
OUT
High Z
IN
D
IN
Read (I
Write (I
, I
)
SB
SB1
)
CC
)HL High Z D
CC
)HL High Z D
CC
3/23/01; v.1.0Alliance SemiconductorP. 2 of 9
Page 3
Recommended operating conditions
ParameterSymbolMinTypicalMaxUnit
AS7C4098V
Supply voltage
AS7C34098V
AS7C34098V
AS7C4098V
Input voltage
AS7C34098V
commercialT
Ambient operating temperature
industrialT
min = –3.0V for pulse width less than tRC/2.
* V
IL
DC operating characteristics (over the operating range)1
ParameterSymbolTest conditions
= Max
Input leakage
current
Output leakage
current
Operating
power supply
current
Standby power
supply current
Output voltage
|I
|
|I
LI
|
LO
I
CC
I
SB
I
SB1
CE
– 0.2V or V
V
OL
V
OH
V
CC
V
= GND to V
IN
= Max
V
CC
CE
= VIH or OE = VIH
or WE
V
= GND to V
I/O
VCC = Max
CC
= VIL
CC
AS7C4098–––250–220–180 mA
Min cycle, 100% duty
CE
= VIL, I
VCC = Max
CE
= VIH, f = Max
VCC = Max
≥ V
– 0.2V, V
CC
IN
= 0mA
OUT
≥ V
IN
≤ 0.2V, f = 0
AS7C34098–160–130–110–100 mA
AS7C4098–––60–60–60mA
AS7C34098–60–60–60–60mA
AS7C4098–––20–20–20mA
CC
AS7C34098–20–20–20–20mA
IOL = 8 mA, VCC = Min–0.4–0.4–0.4–0.4V
IOH = –4 mA, VCC = Min2.4–2.4–2.4–2.4–V
AS7C4098
AS7C34098
®
(10/12/15/20)4.55.05.5V
CC
(–10)3.153.33.6V
CC
(10/12/15/20)3.03.33.6V
CC
IH
IH
V
IL
A
A
–10–12–15–20
–1– 1 –1–1µA
–1– 1 –1–1µA
2.2–VCC + 0.5V
2.0–VCC + 0.5V
*
–0.5
–0.8V
0– 70°C
–40–85°C
UnitMin Max Min Max Min Max Min Max
Capacitance (f = 1MHz, T
= 25° C, V
a
= NOMINAL)2
CC
ParameterSymbolSignalsTest conditionsMaxUnit
Input capacitanceC
I/O capacitanceC
3/23/01; v.1.0Alliance SemiconductorP. 3 of 9
IN
I/O
A, CE, WE, OE, UB, LBVIN = 0V6pF
I/OVIN = V
= 0V8pF
OUT
Page 4
AS7C4098
®
AS7C34098
Read cycle (over the operating range)
ParameterSymbol
Read cycle timet
Address access timet
Chip enable (CE) access timet
Output enable (OE
) access timet
Output hold from address changet
CE Low to output in low Zt
High to output in higfch Zt
CE
OE
Low to output in low Zt
High to output in high Zt
OE
LB, UB access timet
LB
, UB Low to output in low Zt
, UB High to output in high Zt
LB
Power up timet
Power down timet
RC
AA
ACE
OE
OH
CLZ
CHZ
OLZ
OHZ
BA
BLZ
BHZ
PU
PD
3,9
–10–12–15–20
Unit NotesMinMaxMinMaxMinMaxMinMax
10–12–15–20–ns
–10–12–15–20ns
–10–12–15–20ns
– 5–6–7–8ns
3 –3–3–3–ns5
0 – 3–0–0–ns4, 5
– 5 –6–7–9ns4, 5
0 – 0–0–0–ns4, 5
– 5 –6–7–9ns4, 5
– 5–6–7–8ns
0 –0–0–0–ns
– 5–6–7–9ns
0 –0–0–0–ns5
–10–12–15–20ns5
Key to switching waveforms
Read waveform 1 (address controlled)
Address
t
OH
Data
OUT
6,7,9
Read waveform 2 (CE, OE, UB, LB controlled)
Address
t
OE
t
OLZ
CE
t
t
LZ
AA
ACE
t
AA
6,8,9
Undefined/don’t careFalling inputRising input
t
RC
t
OH
Data validPrevious data valid
t
RC
t
t
OE
t
t
OHZ
OH
CHZ
LB, UB
t
t
BLZ
Data
OUT
3/23/01; v.1.0Alliance SemiconductorP. 4 of 9
BA
Data valid
t
BHZ
Page 5
AS7C4098
AS7C34098
®
Write cycle (over the operating range)
ParameterSymbol
Write cycle timet
Chip enable (CE
) to write endt
Address setup to write endt
Address setup timet
Write pulse width (OE
Write pulse width (OE
= High)t
= Low) t
Address hold from end of writet
Data valid to write endt
Data hold timet
Write enable to output in High-Zt
Output active from write endt
Byte enable Low to write endt
Write waveform 1(WE controlled)
Address
CE
LB, UB
WE
Data
IN
Data
OUT
WC
CW
AW
AS
WP1
WP2
AH
DW
DH
WZ
OW
BW
10,11
t
11
–10–12–15–20
UnitNoteMinMaxMinMaxMinMaxMinMax
10–12–15–20–ns
7–8–10–12–ns
7–8–10–12–ns
0–0–0–0–ns
7–8–10–12–ns
10–12–15–20–ns
0–0–0–0–ns
567–9–ns
0–0–0–0–ns4, 5
05060709ns4, 5
3–3–3–3–ns4, 5
7–8–10–12–ns4, 5
t
WC
t
t
DH
High Z
t
AH
OW
AS
Data undefined
t
CW
t
BW
t
AW
t
WZ
t
WP
t
DW
Data valid
Write waveform 2 (CE controlled)
10,11
t
WC
Address
t
AH
CE
t
AS
t
CW
t
AW
t
BW
LB, UB
t
WP
WE
Data
Data
OUT
t
DW
IN
t
CLZ
High ZHigh Z
Data undefined
t
WZ
Data valid
t
DH
t
OW
3/23/01; v.1.0Alliance SemiconductorP. 5 of 9
Page 6
AS7C4098
®
AS7C34098
Write waveform 3
10,11
Address
t
AS
CE
LB, UB
WE
Data
IN
Data
OUT
Data retention characteristics
High ZHigh Z
13
ParameterSymbolTest conditionsMinMaxUnit
V
for data retentionV
CC
Data retention currentI
Chip deselect to data retention timet
Operation recovery timet
Input leakage current|I
Data retention waveform
V
CC
CE
V
CC
t
CDR
V
IH
AC test conditions
- Output load: see Figure B or Figure C.
- Input pulse level: GND to 3.0V. See Figure A.
- Input rise and fall times: 2 ns. See Figure A.
- Input and output timing reference levels: 1.5V.
+3.0V
GND
90%
10%
2 ns
Figure A: Input pulse
90%
10%
t
WC
t
t
CW
t
AW
t
BW
t
WP
t
DW
t
WZ
Data valid
AH
t
DH
Data undefined
DR
CCDR
CDR
R
|–1µA
LI
VCC = 2.0V
≥ V
CE
V
≥ V
IN
V
CC
– 0.2V or
CC
≤ 0.2V
IN
– 0.2V
2.0–V
–500µA
0–ns
t
RC
–ns
Data retention mode
VDR ≥ 2.0V
V
DR
Thevenin equivalent:
+5V
480W
D
OUT
255WC(14)
GND
Figure B: 5V Output load
D
168W
OUT
V
CC
t
R
V
IH
+1.728V (5V and 3.3V)
+3.3V
320W
D
OUT
350W
C(14)
GND
Figure C: 3.3V Output load
Notes
1During VCC power-up, a pull-up resistor to VCC on CE is required to meet ISB specification.
2This parameter is sampled, but not 100% tested.
3For test conditions, see AC Test Conditions, Figures A, B, C.
and t
4t
CLZ
5This parameter is guaranteed, but not tested.
6WE
is High for read cycle.
and OE are Low for read cycle.
7CE
8Address valid prior to or coincident with CE
9All read cycle timings are referenced from the last valid address to the first transitioning address.
or WE must be High during address transitions. Either CE or WE asserting high terminates a write cycle.
10 CE
11 All write cycle timings are referenced from the last valid address to the first transitioning address.
12 Not applicable.
13 2V data retention applies to commercial temperature range operation only.
14 C = 30pF, except on High Z and Low Z parameters, where C = 5pF.
3/23/01; v.1.0Alliance SemiconductorP. 6 of 9
are specified with CL = 5pF as in Figure C. Transition is measured ±500mV from steady-state voltage.
CHZ
transition Low.
Page 7
AS7C4098
AS7C34098
®
Typical DC and AC characteristics
Normalized supply current ICC, ISB
vs. supply voltage VCC
I
CC
I
SB
MIN
NOMINAL
Supply voltage (V)
Normalized access time t
vs. supply voltage V
MAX
AA
CC
SB
, I
CC
Normalized I
1.4
1.2
1.0
0.8
0.6
0.4
0.2
0.0
1.5
1.4
1.3
1.2
12
Normalized supply current ICC, I
vs. ambient temperature T
1.4
1.2
SB
1.0
, I
CC
0.8
0.6
0.4
Normalized I
0.2
0.0
–5580
35–10
Ambient temperature (°C)
Normalized access time t
vs. ambient temperature T
1.5
1.4
VCC = VCC(NOMINAL)Ta = 25° C
1.3
1.2
SB
a
I
CC
Normalized supply current I
vs. ambient temperature T
625
VCC = VCC(NOMINAL)
SB1
a
25
5
1
I
SB
125
0.2
0.04
Normalized ISB1 (log scale)
–5580
35–10
125
Ambient temperature (°C)
AA
a
Normalized supply current I
vs. cycle frequency 1/tRC, 1/t
1.4
CC
WC
1.2
VCC = VCC(NOMINAL)
1.0
CC
Ta = 25° C
0.8
1.1
1.0
Normalized access time
0.9
0.8
MIN
NOMINAL
MAX
Supply voltage (V)
Output source current I
vs. output voltage V
140
OH
OH
120
VCC = VCC(NOMINAL)PL
100
Ta = 25° C
80
60
40
20
Output source current (mA)
0
0750
V
Output voltage (V)
1.1
1.0
Normalized access time
0.9
0.8
–5580
35–10
125
Ambient temperature (°C)
Output sink current I
vs. output voltage V
140
OL
OL
120
VCC = VCC(NOMINAL)
100
Ta = 25° C
80
60
40
Output sink current (mA)
20
0
CC
00
V
Output voltage (V)
0.6
Normalized I
0.4
0.2
0.0
075
Cycle frequency (MHz)
Typical access time change ∆t
vs. output capacitive loading
35
30
VCC = VCC(NOMINAL)
25
(ns)
AA
20
15
10
Change in t
5
0
CC
Capacitance (pF)
5025
500250
100
AA
1000
3/23/01; v.1.0Alliance SemiconductorP. 7 of 9
Page 8
Package dimensions
O
44 43424140393837363534333231
44-pin TSOP II
1234567891011121314
A
A
1
b
e
44-pin SOJ
Pin 1
B
A1
b
AS7C4098
AS7C34098
®
3029
28
272625
23
c
A1.2
A
H
e
e
1
A
2
b0.250.45
c0.15 (typical)
1516
1718 1920
d
212422
d18.2818.54
e10.0610.26
H
e
E0.80 (typical)
A
2
E
D
0–5
°
l
l0.400.60
A0.1280.148
A10.025-
E1
E2
A21.1051.115
B0.0260.032
b0.0150.020
c0.0070.013
Seating
Plane
c
A2
A
E2
D1.1201.130
E0.370 NOM
E10.3950.405
E20.4350.445
e0.050 NOM