Datasheet AS7C4096A Datasheet (Alliance Semiconductor)

Page 1
查询AS7C4096A-10JC供应商
May 2005 Preliminary
AS7C4096A
®
5.0V 512K × 8 CMOS SRAM
Features
• Industrial and commercial temperature
• Organization: 524,288 words × 8 bits
• Center power and ground pins
• High speed
- 10/12/15/20 ns address access time
- 5/6 ns output enable access time
• Low power consumption: ACTIVE
- 880mW/max @ 10 ns
• Low power consumption: STANDBY
- 55mW/max CMOS
Logic block diagram
V
CC
GND
Input buffer
A0 A1 A2 A3 A4 A5 A6 A7 A8
A9
Row decoder
Column decoder
524,288 × 8
Array
(4,194,304)
Sense amp
Control
Circuit
WE OE CE
I/O1
I/O8
• Equal access and cycle times
• Easy memory expansion with
CE, OE
• TTL-compatible, three-state I/O
• JEDEC standard packages
- 400 mil 36-pin SOJ
- 44-pin TSOP 2
• ESD protection 2000 volts
• Latch-up current 200 mA
Pin arrangements
36-pin SOJ (400 mil) 44-pin TSOP 2
A0 A1 A2 A3 A4
CE I/O1 I/O2
V GND I/O3 I/O4
WE
A5 A6 A7 A8 A9
CC
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18
36 35 34 33 32 31 30 29 28 27 26 25 24 23 22 21 20 19
NC A18 A17 A16 A15 OE I/O8 I/O7 GND
V
CC
I/O6 I/O5 A14 A13 A12 A11 A10 NC
NC
NC A0 A1 A2 A3 A4 CE
I/O1 I/O2
V
GND I/O3 I/O4
WE
A5 A6 A7 A8 A9
NC
NC
CC
inputs
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22
44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25 24 23
NC NC NC
A18 A17
A16 A15 OE I/O8 I/O7 GND
V
CC
I/O6 I/O5 A14 A13 A12 A11 A10 NC NC NC
A10
A11
A12
A13
A14
A15
A16
A17
A18
Selection guide
–10 –12 –15 –20 Unit
Maximum address access time 10 12 15 20 ns
Maximum outputenable access time 5 6 6 6 ns
Maximum operating current 160 140 120 100 mA
Maximum CMOS standby current 10 10 10 10 mA
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Copyright © Alliance Semiconductor. All rights reserved.
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AS7C4096A
®
Functional description
The AS7C4096A is a high-performance CMOS 4,194,304-bit Static Random Access Memory (SRAM) device organized as 524,288 words × 8 bits. It is designed for memory applications where fast data access, low power, and simple interfacing are desired.
Equal address access and cycle times (t for high-performance applications. The chip enable input CE systems.
When CE standby mode.
A write cycle is accomplished by asserting write enable (WE on the rising edge of WE only after outputs have been disabled with output enable (OE
A read cycle is accomplished by asserting output enable (OE drives I/O pins with the data word referenced by the input address. When either chip enable or output enable is inactive, or write enable is active, output drivers stay in high-impedance mode.
All chip inputs and outputs are TTL-compatible, and operation is from a single 5.0V supply voltage. This device is available as per industry standard 400-mil 36-pin SOJ and 44-pin TSOP 2 packages.
is high the device enters standby mode. The device is guaranteed not to exceed 55mW power consumption in CMOS
(write cycle 1) or CE (write cycle 2). To avoid bus contention, external devices should drive I/O pins
, tRC, tWC) of 10/12/15/20 ns with output enable access times (tOE) of 5/6 ns are ideal
AA
permits easy memory expansion with multiple-bank memory
) and chip enable (CE). Data on the input pins I/O1–I/O8 is written
) or write enable (WE).
) and chip enable (CE), with write enable (WE) high. The chip
Absolute maximum ratings
Parameter Symbol Min Max Unit
Voltage on V
Voltage on any pin relative to GND V
Power dissipation P
Storage temperature (plastic) T
Temperature with V
DC current into output (low) I
NOTE: Stresses greater than those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and func­tional operation of the device at these or any other conditions outside those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
relative to GND V
CC
applied T
CC
t1
t2
D
stg
bias
OUT
–0.5 +7.0 V
–0.5 VCC +0.5 V
–1.0W
–65 +150 °C
–55 +125 °C
–20mA
Truth table
CE WE OE Data Mode
H X X High Z
L H H High Z
LHL
D
OUT
Standby (ISB, I
Output disable (ICC)
Read (ICC)
SB1
)
LLX
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D
IN
Write (ICC)
Page 3
®
Recommended operating condition
Parameter Symbol Min Nominal Max Unit
Supply voltage V
Input voltage
Ambient operating temperature
*
max = V
V
IH
**
min = –1.0V for pulse width less than 5 nS.
V
IL
.
+ 1.5V for pulse width less than 5 nS.
CC
commercial T
industrial T
(10/12/15/20) 4.5 5.0 5.5 V
CC
*
V
IH
**
V
IL
A
A
DC operating characteristics (over the operating range)1
Parameter Symbol Test conditions
Input leakage
current
Output leakage
current
Operating power
supply current
Standby power
supply current
Output voltage
|I
V
V
|I
I
I
I
SB1
LI
LO
CC
SB
OL
OH
|
V
= Max, VIN = GND to V
CC
= Max, CE = V
V
|
V
CC
OUT
= GND to V
VCC = Max, CE < V
f = f
Max
, I
OUT
= 0mA
VCC = Max, CE > V
f = f
Max
, I
OUT
= 0mA
CC
IH
CC
IL
IH
–1–1–1–1µA
–1–1–1–1µA
–160–140–120–100mA
–60–55–50–40mA
VCC = Max,
CE
V
– 0.2V,
V
0.2V or VIN VCC – 0.2V,
IN
CC
–10–10–10–10mA
f = 0
IOL = 6 mA, VCC = Min
I
= 8 mA, VCC = Min
OL
IOH = –4 mA, VCC = Min
–0.4–0.4–0.4–0.4
–0.5–0.5–0.5–0.5
2.4–2.4–2.4–2.4– V 4
AS7C4096A
2.2 VCC + 0.5 V
–0.5 0.8 V
0– 70°C
–40 85 °C
–10 –12 –15 –20
Unit NotesMin Max Min Max Min Max Min Max
V4
Capacitance (f = 1MHz, Ta = 25° C, VCC = NOMINAL)
4
Parameter Symbol Signals Te st c o nd i tio n s Max Unit
Input capacitance C
I/O capacitance C
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IN
I/O
A, CE, WE, OE
I/O
VIN = 0V 5 pF
= V
V
IN
= 0V 7 pF
OUT
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AS7C4096A
®
Read cycle (over the operating range)
Parameter Symbol
Read cycle time
Address access time
Chip enable (CE
Output enable (OE
) access time
) access time
Output hold from address change
CE
Low to output in low Z
CE
High to output in high Z
OE
Low to output in low Z
OE
High to output in high Z
Power up time
Power down time
t
t
AA
t
ACE
t
OE
t
OH
t
CLZ
t
CHZ
t
OLZ
t
OHZ
t
PU
t
PD
RC
Key to switching waveforms
2,8
–10 –12 –15 –20
Unit NotesMin Max Min Max Min Max Min Max
10–12–15–20–ns
–10–12–15–20ns2
–10–12–15–20ns2
–5–6–6–6ns
3–3–3–3–ns4
3–3–3–3–ns3,4
–5–6–7–9ns3,4
0–0–0–0–ns3,4
–5–6–7–9ns3,4
0–0–0–0–ns3,4
–10–12–15–20ns3,4
Undefined/don’t careFalling inputRising input
Read waveform 1 (address controlled)
Address
t
AA
D
OUT
Read waveform 2 (CE
CE
OE
D
OUT
Supply
current
, OE controlled)
t
OE
t
OLZ
t
ACE
t
CLZ
t
PU
50% 50%
t
RC1
2,5,6,8
t
RC
2,5,7,8
Data valid
Data valid
t
OH
t
OHZ
t
CHZ
t
PD
I
CC
I
SB
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AS7C4096A
®
Write cycle (over the operating range)
Parameter Symbol
Write cycle time
Chip enable (CE
) to write end
Address setup to write end
Address setup time
Write pulse width (OE
Write pulse width (OE
= high)
= low
Address hold from end of write
Write recovery time
Data valid to write end
Data hold time
Write enable to output in high Z
Output active from write end
t
t
t
t
t
WP1
t
WP2
t
t
t
DW
t
t
t
OW
WC
CW
AW
AS
AH
WR
DH
WZ
10–12–15–20–ns
10–12–15–20–ns
Write waveform 1 (WE controlled)9
Address
WE
t
AS
D
IN
t
WZ
D
OUT
9
–10 –12 –15 –20
Unit NotesMin Max Min Max Min Max Min Max
7–8–10–12–ns
7–8–10–12–ns
0–0–0–0–ns
7–8–10–12–ns
0–0–0–0–ns
0–0–0–0–ns
5–6–7–9–ns
0–0–0–0–ns3,4
25262729ns3,4
3–3–3–3–ns3,4
t
t
AW
WC
t
WP
t
DW
Data valid
t
OW
t t
t
WR
AH
DH
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Write waveform 2 (CE controlled)9
Address
t
AS
CE
WE
D
IN
AC test conditions
- Output load: see Figure B.
- Input pulse level: GND to V
- Input rise and fall times: 2 ns. See Figure A.
- Input and output timing reference levels: 1.5V.
- 0.5V. See Figures A and B.
CC
t
AW
t
WP
t
CW
t
WC
t
DW
Data valid
®
+5.0V
t
WR
t
AH
AS7C4096A
t
DH
Thevenin equivalent:
480
10
C
GND
V
CC
- 0.5V
GND
90%
10%
2 ns
Figure A: Input pulse
90%
10%
D
OUT
255
Figure B: 5.0V Output load
Notes
1During V 2 For test conditions, see AC Test Conditions. 3t
CLZ
4 This parameter is guaranteed, but not tested. 5WE 6CE
and OE are LOW for read cycle. 7 Address valid prior to or coincident with CE 8 All read cycle timings are referenced from the last valid address to the first transitioning address. 9 All write cycle timings are referenced from the last valid address to the first transitioning address. 10 C = 30pF, except at high Z and low Z parameters, where C = 5pF.
power-up, a pull-up resistor to V
CC
and t
is HIGH for read cycle.
are specified with CL = 5pF as in Figure B. Transition is measured ±500 mV from steady-state voltage.
CHZ
on CE is required to meet ISB specification.
CC
transition Low.
D
OUT
168
+1.728V
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Package dimensions
AS7C4096A
®
44434241403938 37 36 35 34333231
44-pin TSOP 2
12
3 4 5 6 7 8 9 10111213 14
A
A
1
b
D
e
36-pin SOJ
Pin 1
30 29
28 2726
25
24
23
c
44-pin TSOP 2
Min(mm) Max(mm)
A 1.2
E
E
1
A
A
0.05 0.15
1
0.95 1.05
2
b 0.30 0.45
21
15 16
17 18 19 20
22
d
A
2
0–5°
e
L
c 0.12
d 18.31 18.52
E
10.06 10.26
1
E 11.68 11.94
e 0.80 (typical)
L 0.40 0.60
0.21
36-pin SOJ 400
Min(mils) Max(mils)
A 0.128 0.148
A2
A
1
A
2
b
1
E
E
2
1
A1
b
c
E
Seating
Plane
A
b 0.015 0.020
b
1
c 0.007 0.013
D .920 .930
e 0.045 0.055
E 0.370 BSC
E
1
E
2
0.025
0.105 0.115
0.026 0.032
0.395 0.405
0.435 0.445
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AS7C4096A
®
Ordering codes
Package Ver si on 10 ns 12 ns 15 ns 20 ns
SOJ
TSOP 2
Note: Add suffix ‘N’ to the above part number for Lead Free Parts. (Ex: AS7C4096A - 10 TIN)
Part numbering system
AS7C 4096A –XX J or T X X
SRAM
prefix
Commercial AS7C4096A-10JC AS7C4096A-12JC AS7C4096A-15JC AS7C4096A-20JC
Industrial AS7C4096A-10JI AS7C4096A-12JI AS7C4096A-15JI AS7C4096A-20JI
Commercial AS7C4096A-10TC AS7C4096A-12TC AS7C4096A-15TC AS7C4096A-20TC
Industrial AS7C4096A-10TI AS7C4096A-12TI AS7C4096A-15TI AS7C4096A-20TI
Device
number
Access time
Packages:
J: SOJ 400 mil
T: TSOP 2
Temperature ranges:
C: Commercial, 0°C to 70°C
I: Industrial, –40°C to 85°C
N=Lead Free Parts
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AS7C4096A
®
Revision History
Rev. No. History Revised Date
v1.0 Initial release 11/08/04
v1.1
Included I
Corrected the following: T
, ISB & I
CC
parameters
SB1
OE
, V
IH, VOL
& t
05/27/05
WZ
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®
AS7C4096A
®
Alliance Semiconductor Corporation 2575, Augustine Drive, Santa Clara, CA 95054 Tel: 408 - 855 - 4900
Copyright © Alliance Semiconductor All Rights Reserved Part Number: AS7C4096A Document Version: v. 1.1
Fax: 408 - 855 - 4999
www.alsc.com
© Copyright 2003 Alliance Semiconductor Corporation. All rights reserved. Our three-point logo, our name and Intelliwatt are trademarks or registered trademarks of Alliance. All other brand and product names may be the trademarks of their respective companies. Alliance reserves the right to make changes to this document and its products at any time without notice. Alliance assumes no responsibility for any errors that may appear in this document. The data contained herein represents Alliance's best data and/or estimates at the time of issuance. Alliance reserves the right to change or correct this data at any time, without notice. If the product described herein is under development, significant changes to these specifications are possible. The information in this product data sheet is intended to be general descriptive information for potential customers and users, and is not intended to operate as, or provide, any guarantee or warrantee to any user or customer. Alliance does not assume any responsibility or liability arising out of the application or use of any product described herein, and disclaims any express or implied warranties related to the sale and/or use of Alliance products including liability or warranties related to fitness for a particular purpose, merchantability, or infringement of any intellectual property rights, except as express agreed to in Alliance's Terms and Conditions of Sale (which are available from Alliance). All sales of Alliance products are made exclusively according to Alliance's Terms and Conditions of Sale. The purchase of products from Alliance does not convey a license under any patent rights, copyrights; mask works rights, trademarks, or any other intellectual property rights of Alliance or third parties. Alliance does not authorize its products for use as critical components in life-supporting systems where a malfunction or failure may reasonably be expected to result in significant injury to the user, and the inclusion of Alliance products in such life­supporting systems implies that the manufacturer assumes all risk of such use and agrees to indemnify Alliance against all claims arising from such use.
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