Datasheet AS7C33128PFS36A-166TQI, AS7C33128PFS36A-166TQC, AS7C33128PFS36A, AS7C33128PFS36A-150TQC, AS7C33128PFS36A-133TQI Datasheet (Alliance Semiconductor Corporation)

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Page 1
January 2001 Preliminary Information
Copyright © Alliance Semiconductor. All rights reserved.
®
7C33128PFS32A 7C33128PFS36A
3.3V 128K X 32/36 pipeline burst synchronous SRAM
2/1/01; V.0.9 Alliance Semiconductor P. 1 of 11
Features
• Fast clock speeds to 166 MHz in LVTTL/LVCMOS
• Fast clock to data access: 3.5/3.8/4.0/5.0 ns
•Fast OE
access time: 3.5/3.8/4.0/5.0 ns
• Fully synchronous register-to-register operation
• Single register “Flow-through” mode
• Single-cycle deselect
- Dual-cycle deselect also available (AS7C33128PFD32A/ AS7C33128PFD36A)
•Pentium®
*
compatible architecture and timing
• Asynchronous output enable control
• Economical 100-pin TQFP package
• Byte write enables
• Multiple chip enables for easy expansion
• 3.3 core power supply
• 2.5V or 3.3V I/O operation with separate V
DDQ
• 30 mW typical standby power in power down mode
•NTD™
*
pipeline architecture available
(AS7C33128NTD32A/ AS7C33128NTD36A)
Logic block diagram
Q0
Q1
128K × 32/36
Memory
array
Burst logic
CLK
CLR
CE
Address
DQ CE CLK
DQ
d
CLK
DQ
Byte write
registers
regist er
DQ
c
CLK
DQ
Byte write
registers
DQ
b
CLK
DQ
Byte write
registers
DQ
a
CLK
DQ
Byte write
regist ers
Enable
CLK
DQ
register
Enable
CLK
DQ
delay
register
CE
Output
registers
Input
registers
Power down
DATA [35: 0]
4
36/32
171517
17
GWE BWE
BW
d
ADV ADSC ADSP
CLK
CE0 CE1
CE2
BW
c
BW
b
BW
a
OE
A[16:0]
ZZ
LBO
OE
FT
CLK CLK
36/32
DATA [31: 0]
Pin arrangement
DQPc/NC
DQ
c
DQ
c
V
DDQ
V
SSQ
DQ
c
DQ
c
DQ
c
DQ
c
V
SSQ
V
DDQ
DQ
c
DQ
c
FT
V
DD
NC V
SS
DQ
d
DQ
d
V
DDQ
V
SSQ
DQ
d
DQ
d
DQ
d
DQ
d
V
SSQ
V
DDQ
DQ
d
DQ
d
DQPd/NC
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30
80 79 78 77 76 75 74 73 72 71 70 69 68 67 66 65 64 63 62 61 60 59 58 57 56 55 54 53 52 51
DQPb/NC DQ
b
DQ
b
V
DDQ
V
SSQ
DQ
b
DQ
b
DQ
b
DQ
b
V
SSQ
V
DDQ
DQ
b
DQ
b
V
SS
ZZ DQ
a
DQ
a
V
DDQ
V
SSQ
DQ
a
DQ
a
DQ
a
DQ
a
V
SSQ
V
DDQ
DQ
a
DQ
a
DQPa/NC
LBO
A5A4A3A2A1
A0
NC
NC
V
SS
V
DD
NC
NC
A10
A11
A12
A13
A14
A15
31323334353637383940414243444546474849
50
100
99989796959493929190898887868584838281
A6A7CE0
CE1
BWdBWcBWbBWaCE2
V
DD
VSSCLK
GWE
BWEOEADSC
ADSP
ADVA8A9
NC VDD
A16
Note: Pins 1,30,51,80 are NC for ×32
TQFP 14 × 20 mm
Selection guide
*
Pentium® is a registered trademark of Intel Corporation. NTD™ is a trademark of Alliance Semiconductor Corporation. All trademarks mentioned in this document
are the property of their respective owners.
AS7C33128PFS32A
–166
AS7C33128PFS32A
–150
AS7C33128PFS32A
–133
AS7C33128PFS32A
–100 Units
Minimum cycle time 6 6.7 7.5 10 ns Maximum clock frequency 166 150 133 100 MHz Maximum pipelined clock access time 3.5 3.8 4 5 ns Maximum operating current 475 450 425 325 mA Maximum standby current 130 110 100 90 mA Maximum CMOS standby current (DC) 30 30 30 30 mA
Page 2
7C33128PFS32A 7C33128PFS36A
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Functional description
The AS7C33128PFS32A and AS7C33128PFS36A are high-performance CMOS 4-Mbit synchronous Static Random Access Memory (SRAM) devices organized as 131,072 words × 32 or 36 bits, and incorporate a two-stage register-register pipeline for highest frequency on any given technology.
Timing for these devices is compatible with existing Pentium
®
synchronous cache specifications. This architecture is suited for ASIC, DSP
(TMS320C6X), and PowerPC
*
-based systems in computing, datacomm, instrumentation, and telecommunications systems.
Fast cycle times of 6/6.7/7.5/10 ns with clock access times (t
CD
) of 3.5/3.8/4.0/5.0 ns enable 166, 150, 133 and 100 MHz bus frequencies.
Three chip enable (CE
) inputs permit easy memory expansion. Burst operation is initiated in one of two ways: the controller address strobe
(ADSC
), or the processor address strobe (ADSP). The burst advance pin (ADV) allows subsequent internally generated burst addresses.
Read cycles are initiated with ADSP
(regardless of WE and ADSC) using the new external address clocked into the on-chip address register
when ADSP
is sampled Low, the chip enables are sampled active, and the output buffer is enabled with OE. In a read operation the data accessed by the current address, registered in the address registers by the positive edge of CLK, are carried to the data-out registers and driven on the output pins on the next positive edge of CLK. ADV
is ignored on the clock edge that samples ADSP asserted, but is sampled on all subsequent
clock edges. Address is incremented internally for the next access of the burst when ADV
is sampled Low, and both address strobes are High.
Burst operation is selectable with the
LBO
input. With
LBO
unconnected or driven High, burst operations use a Pentium® count sequence. With
LBO
driven LOW, the device uses a linear count sequence suitable for PowerPC™ and many other applications.
Write cycles are performed by disabling the output buffers with OE
and asserting a write command. A global write enable GWE writes all 32/
36 bits regardless of the state of individual BW[a:d]
inputs. Alternately, when GWE is High, one or more bytes may be written by asserting
BWE
and the appropriate individual byte BWn signal(s).
BWn
is ignored on the clock edge that samples ADSP Low, but is sampled on all subsequent clock edges. Output buffers are disabled when BWn is sampled LOW (regardless of OE). Data is clocked into the data input register when BWn is sampled Low. Address is incremented internally to the next burst address if BWn
and ADV are sampled Low.
Read or write cycles may also be initiated with ADSC
instead of ADSP. The differences between cycles initiated with ADSC and ADSP follow.
•ADSP
must be sampled HIGH when ADSC is sampled LOW to initiate a cycle with ADSC.
•WE
signals are sampled on the clock edge that samples ADSC LOW (and ADSP High).
•Master chip enable CE0
blocks ADSP, but not ADSC.
AS7C33128PFS32A and AS7C33128PFS36A family operates from a core 3.3V power supply. I/Os use a separate power supply that can operate at 2.5V or 3.3V. These devices are available in a 100-pin 14 × 20 mm TQFP package.
*PowerPC™ is a tradenark International Business Machines Corporation.
Capacitance
Write enable truth table (per byte)
Key:
X = Don’t Care, L = Low, H = High, T = True, F = False; *= Valid read; n = a, b, c, d; WE,
WEn
= internal write signal.
Parameter Symbol Signals Test conditions Max Unit
Input capacitance C
IN
Address and control pins VIN = 0V 5 pF
I/O capacitance C
I/O
I/O pins VIN = V
OUT
= 0V 7 pF
GWE
BWE BWn WEn
LXX T HLL T HHX F* HLH F
*
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Signal descriptions
Absolute maximum ratings
Stresses greater than those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions outside those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions may affect reliability.
Signal
I/ O Properties Description
CLK I CLOCK Clock. All inputs except OE
, FT, ZZ, LBO are synchronous to this clock.
A0–A16 I SYNC Address. Sampled when all chip enables are active and ADSC
or ADSP are asserted.
DQ[a,b,c,d] I/O SYNC Data. Driven as output when the chip is enabled and OE
is active.
CE0 ISYNC
Master chip enable. Sampled on clock edges when ADSP
or ADSC is active. When CE0 is
inactive, ADSP
is blocked. Refer to the Synchronous Truth Table for more information.
CE1, CE2
ISYNC
Synchronous chip enables. Active HIGH and active Low, respectively. Sampled on clock edges when ADSC
is active or when CE0 and ADSP are active.
ADSP
ISYNC
Address strobe processor. Asserted LOW to load a new bus address or to enter standby mode.
ADSC
I SYNC Address strobe controller. Asserted LOW to load a new address or to enter standby mode.
ADV
I SYNC Advance. Asserted LOW to continue burst read/write.
GWE
ISYNC
Global write enable. Asserted LOW to write all 32/36 bits. When High, BWE
and BW[a:d]
control write enable.
BWE
I SYNC Byte write enable. Asserted LOW with GWE = HIGH to enable effect of BW[a:d] inputs.
BW[a,b,c,d] ISYNC
Write enables. Used to control write of individual bytes when GWE
= HIGH and BWE =
Low. If any of BW[a:d]
is active with GWE = HIGH and BWE = LOW the cycle is a write
cycle. If all BW[a:d]
are inactive the cycle is a read cycle.
OE
IASYNC
Asynchronous output enable. I/O pins are driven when OE
is active and the chip is in read
mode.
LBO
I
STATIC default = HIGH
Count mode. When driven High, count sequence follows Intel XOR convention. When driven Low, count sequence follows linear convention. This signal is internally pulled High.
18
FT ISTATIC
Flow-through mode.When low, enables single register flow-through mode. Connect to V
DD
if unused or for pipelined operation.
ZZ I ASYNC Sleep. Places device in low power mode; data is retained. Connect to GND if unused.
Parameter Symbol Min Max Unit
Power supply voltage relative to GND V
DD
, V
DDQ
–0.5 +4.6 V
Input voltage relative to GND (input pins) V
IN
–0.5 VDD + 0.5 V
Input voltage relative to GND (I/O pins) V
IN
–0.5 V
DDQ
+ 0.5 V
Power dissipation P
D
–1.8W
DC output current I
OUT
–50mA
Storage temperature (plastic) T
stg
–65 +150
o
C
Temperature under bias T
bias
–65 +135
o
C
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Synchronous truth table
Key: X = Don’t Care, L = Low, H = High.
1
See “Write enable truth table”on page 2 for more information.
2
Q in flow through mode.
3
For write operation following a READ,
OE
must be HIGH before the input data set up time and held HIGH throughout the input hold time.
Recommended operating conditions
CE0 CE1 CE2 ADSP ADSC ADV
WEn
1
OE
Address accessed CLK Operation DQ
HXXXLXXX NA L to H Deselect Hi−Z
LLXLXXXX NA L to H Deselect Hi−Z LLXHLXXX NA L to H Deselect Hi−Z LXHLXXXX NA L to H Deselect Hi−Z LXHHLXXX NA L to H Deselect Hi−Z L H L L XXXL External L to H Begin read Hi−Z
2
LHLLXXXH External L to H Begin read Hi−Z LHLHLXFL External L to H Begin read Hi−Z
2
LHLHLXFH External L to H Begin read Hi−Z
XXXHHLFL Next L to H Cont. read Q XXXHHLFH Next L to H Cont. read Hi−Z XXXHHHFL Current L to H Suspend read Q XXXHHHFH Current L to H Suspend read Hi−Z HXXXHLFL Next L to H Cont. read Q HXXXHLFH Next L to H Cont. read Hi−Z HXXXHHFL Current L to H Suspend read Q HXXXHHFH Current L to H Suspend read Hi−Z
LHLHLXTX External L to H Begin write D
3
XXXHHLTX Next L to H Cont. write D HXXXHLTX Next L to H Cont. write D XXXHHHTX Current L to H Suspend write D HXXXHHTX Current L to H Suspend write D
Parameter Symbol Min Nominal Max Unit
Supply voltage
V
DD
3.135 3.3 3.6 V
V
SS
0.0 0.0 0.0
3.3V I/O supply voltage
V
DDQ
3.135 3.3 3.6 V
V
SSQ
0.0 0.0 0.0
2.5V I/O supply voltage
V
DDQ
2.35 2.5 2.9 V
V
SSQ
0.0 0.0 0.0
Input voltages
Address and control pins
V
IH
2.0 VDD + 0.3 V
V
IL
–0.5
*
* V
IL
min = –2.0V for pulse width less than 0.2 × tRC.
† Input voltage ranges apply to 3.3V I/O operation. For 2.5V I/O operation, contact factory for input specifications.
–0.8
I/O pins
V
IH
2.0 V
DDQ
+ 0.3
V
V
IL
–0.5
*
–0.8
Ambient operating temperature T
A
0–70°C
Page 5
7C33128PFS32A 7C33128PFS36A
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TQFP thermal resistance
* This parameter is sampled.
DC electrical characteristics
DC electrical characteristics for 2.5V I/O operation
Description Conditions Symbol Typical Units
Thermal resistance (junction to ambient)
* Test conditions follow standard test methods and
procedures for measuring thermal impedance, per EIA/
JESD51
θ
JA
46 °C/W
Thermal resistance (junction to top of case)
*
θ
JC
2.8 °C/W
Parameter Symbol Test conditions
–166 –150 –133 –100
UnitMin Max Min Max Min Max Min Max
Input leakage current
*
* LBO
pin has an internal pull-up and input leakage = ±10 µa.
Note: ICC given with no output loading. ICC increases with faster cycles times and greater output loading.
|ILI|VDD = Max, VIN = GND to V
DD
–2–2–2–2µA
Output leakage current
|I
LO
|
OE
V
IH
, VDD = Max,
V
OUT
= GND to V
DD
–2–2–2–2µA
Operating power supply current
I
CC
CE0 = VIL, CE1 = VIH, CE2 = VIL,
f = f
Max
, I
OUT
= 0 mA
475 450 425 325 mA
Standby power supply current
I
SB
Deselected, f = f
Max
, ZZ ≤ V
IL
–130–110–100– 90
mA
I
SB1
Deselected, f = 0, ZZ 0.2V
all V
IN
0.2V or V
DD
– 0.2V
–30–30–30–30
I
SB2
Deselected, f = f
Max
, ZZ ≥ VDD – 0.2V
All V
IN
VIL or ≥ V
IH
–30–30–30–30
Output voltage
V
OL
IOL = 8 mA, V
DDQ
= 3.465V –0.4–0.4–0.4–0.4
V
V
OH
IOH = –4 mA, V
DDQ
= 3.135V 2.4 2.4 2.4 2.4
Parameter Symbol Test conditions
–166 –150 –133 –100
UnitMinMaxMinMaxMinMaxMinMax
Output leakage current
|I
LO
|
OE
V
IH
, VDD = Max,
V
OUT
= GND to V
DD
11–11–11–11µA
Output voltage
V
OL
IOL = 2 mA, V
DDQ
= 2.65V –0.7–0.7–0.7–0.7
V
V
OH
IOH = –2 mA, V
DDQ
= 2.35V 1.7 1.7 1.7 1.7
Page 6
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Timing characteristics over operating range
*See “Notes” on page 10.
Key to switching waveforms
Parameter
Symbo
l
–166 –150 –133 –100
Unit
Notes
*Min Max Min Max Min Max Min Max
Clock frequency f
Max
166 150 133 100 MHz
Cycle time (pipelined mode) t
CYC
6 6.6 7.5 10 ns
Cycle time (flow-through mode) t
CYCF
10–10–12–12– ns
Clock access time (pipelined mode) t
CD
3.5 3.8 4.0 5.0 ns
Clock access time (flow-through mode)
t
CDF
– 9 –10–10–12ns
Output enable LOW to data valid t
OE
3.5 3.8 4.0 5.0 ns
Clock HIGH to output Low Z t
LZC
0–0–0–0–ns2,3,4
Data output invalid from clock HIGH t
OH
1.5 1.5 1.5 1.5 ns 2
Output enable LOW to output Low Z t
LZOE
0–0–0–0–ns2,3,4
Output enable HIGH to output High Z t
HZOE
3.5 3.8 4.0 4.5 ns 2,3,4
Clock HIGH to output High Z t
HZC
3.5 3.8 4.0 5.0 ns 2,3,4
Output enable HIGH to invalid output t
OHOE
0–0–0–0–ns
Clock HIGH pulse width t
CH
2.4 2.5 2.5 3.5 ns 5
Clock LOW pulse width t
CL
2.4 2.5 2.5 3.5 ns 5
Address setup to clock HIGH t
AS
1.5 1.5 1.5 2.0 ns 6
Data setup to clock HIGH t
DS
1.5 1.5 1.5 2.0 ns 6
Write setup to clock HIGH t
WS
1.5 1.5 1.5 2.0 ns 6,7
Chip select setup to clock HIGH t
CSS
1.5 1.5 1.5 2.0 ns 6,8
Address hold from clock HIGH t
AH
0.5 0.5 0.5 0.5 ns 6
Data hold from clock HIGH t
DH
0.5 0.5 0.5 0.5 ns 6
Write hold from clock HIGH t
WH
0.5 0.5 0.5 0.5 ns 6,7
Chip select hold from clock HIGH t
CSH
0.5 0.5 0.5 0.5 ns 6,8
ADV setup to clock HIGH t
ADVS
1.5 1.5 1.5 2.0 ns 6
ADSP
setup to clock HIGH t
ADSPS
1.5 1.5 1.5 2.0 ns 6
ADSC
setup to clock HIGH t
ADSCS
1.5 1.5 1.5 2.0 ns 6
ADV
hold from clock HIGH t
ADVH
0.5 0.5 0.5 0.5 ns 6
ADSP
hold fromclock HIGH t
ADSPH
0.5 0.5 0.5 0.5 ns 6
ADSC
hold from clock HIGH t
ADSCH
0.5 0.5 0.5 0.5 ns 6
Undefined/don’t careFalling inputRising input
Page 7
7C33128PFS32A 7C33128PFS36A
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Timing waveform of read cycle
Note: Ý = XOR when MODE = HIGH/No Connect; Ý = ADD when MODE = LOW. BW[a:d]
is don’t care.
t
CYC
t
CH
t
CL
t
ADSPS
t
ADSPH
t
AS
t
AH
t
WS
t
ADVS
t
OH
CLK
ADSP
ADSC
Address
GWE, BWE
CE0, CE2
ADV
OE
D
OUT
t
CSS
t
CSH
t
HZC
t
CD
t
WH
t
ADVH
t
HZOE
t
ADSCS
t
ADSCH
LOAD NEW ADDRESS
ADV INSERTS WAIT STATES
Q(A2Ý10)
Q(A2Ý11) Q(A3)
Q(A2)
Q(A2Ý01) Q(A3Ý01) Q(A3Ý10)
Q(A1)
A2A1 A3
CE1
(pipelined mode)
D
OUT
Q(A2Ý10)
Q(A2Ý11)
Q(A3)
Q(A2Ý01) Q(A3Ý01) Q(A3Ý10)
Q(A3Ý11)
Q(A1)
(flow-through mode)
t
HZC
t
OE
t
LZOE
Page 8
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Timing waveform of write cycle
Note: Ý = XOR when MODE = HIGH/No Connect; Ý = ADD when MODE = LOW.
t
CYC
t
CL
t
ADSPS
t
ADSPH
t
ADSCS
t
ADSCH
t
AS
t
AH
t
WS
t
WH
t
CSS
t
ADVS
t
DS
t
DH
CLK
ADSP
ADSC
Address
BWE
CE0, CE2
ADV
OE
Data In
t
CSH
t
ADVH
D(A2Ý01) D(A2Ý10) D(A3)D(A2) D(A2Ý01) D(A3Ý01) D(A3Ý10)
D(A1)
D(A2Ý11)
ADV SUSPENDS BURST
ADSC LOADS NEW ADDRESS
A1
A2 A3
t
CH
CE1
BW[a:d]
Page 9
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Timing waveform of read/write cycle
Note: Ý = XOR when MODE = HIGH/No Connect; Ý = ADD when MODE = LOW.
t
CH
t
CYC
t
CL
t
ADSPS
t
ADSPH
t
AS
t
AH
t
WS
t
WH
t
ADVS
t
DS
t
DH
t
OH
CLK
ADSP
Address
GWE
CE0, CE2
ADV
OE
D
IN
D
OUT
t
LZC
t
ADVH
t
LZOE
t
OE
t
CD
Q(A1)
Q(A3Ý01)
D(A2)
Q(A3)
Q(A3Ý10) Q(A3Ý11)
A1
A2
A3
CE1
t
HZOE
(pipeline mode)
D
OUT
Q(A1)
Q(A3Ý01) Q(A3Ý10)
(flow-through mode)
t
CDF
Q(A3Ý11)
Page 10
7C33128PFS32A 7C33128PFS36A
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AC test conditions
Notes 1 For test conditions, see AC Test Conditions, Figures A, B, C. 2 This parameter measured with output load condition in Figure C. 3 This parameter is sampled, but not 100% tested. 4t
HZOE
is less than t
LZOE
; and t
HZC
is less than t
LZC
at any given temperature and voltage. 5 tCH measured as HIGH above VIH and tCL measured as LOW below VIL. 6 This is a synchronous device. All addresses must meet the specified setup and hold times for all rising edges of CLK. All other synchronous inputs must
meet the setup and hold times for all rising edges of CLK when chip is enabled.
7 Write refers to
GWE, BWE, BW[a:d].
8 Chip select refers to
CE0, CE1, CE2
.
351
5 pF*
317
D
OUT
GND
Figure C: Output load(B)
*including scope
and jig capacitance
Z
0
= 50
D
OUT
50
Figure B: Output load (A)
30 pF*
Figure A: Input waveform
10%
90%
GND
90%
10%
+3.0V
• Output load: see Figure B, except for t
LZC
, t
LZOE
, t
HZOE
, t
HZC
, see Figure C.
• Input pulse level: GND to 3V. See Figure A.
• Input rise and fall time (measured at 0.3V and 2.7V): 2 ns. See Figure A.
• Input and output timing reference levels: 1.5V.
VL = 1.5V
for 3.3V I/O; = V
DDQ
/2
for 2.5V I/O
Thevenin equivalent:
+3.3V for 3.3V I/O; +2.5V for 2.5V I/O
Package Dimensions
100-pin quad flat pack (TQFP)
Dimensions in millimeters
TQFP
Min Max
A1 0.05 0.15 A2 1.35 1.45
b 0.22 0.38
c 0.09 0.20
D 13.90 14.10
E 19.90 20.10 e 0.65 nominal
Hd 15.90 16.10
He 21.90 22.10
L 0.45 0.75
L1 1.00 nominal
α
He
E
Hd
D
b
e
A1 A2
L1
L
c
α
Page 11
®
AS7C33128PFS32A AS7C33128PFS36A
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2/1/01; V.0.9 Alliance Semiconductor P. 11 of 11
Ordering information
Part numbering guide
1.Alliance Semiconductor SRAM prefix
2.Operating voltage: 33=3.3V
3.Organization: 128=128K
4.Pipeline-Flowthrough (each device works in both modes)
5.Deselect: S=Single cycle deselect
6.Organization: 32=x32; 36=x36
7.Production version: A=first production version
8.Clock speed (MHz)
9.Package type: TQ=TQFP
10.Operating temperature: C=Commercial (
0° C to 70° C); I=Industrial (
-40
°
C to 85° C)
–166 MHz –150 MHz –133 MHz –100 MHz
AS7C33128PFS32A-166TQC AS7C33128PFS32A-150TQC AS7C33128PFS32A-133TQC AS7C33128PFS32A-100TQC
AS7C33128PFS32A-166TQI AS7C33128PFS32A-150TQI AS7C33128PFS32A-133TQI AS7C33128PFS32A-100TQI
AS7C33128PFS36A-166TQC AS7C33128PFS36A-150TQC AS7C33128PFS36A-133TQC AS7C33128PFS36A-100TQC
AS7C33128PFS36A-166TQI AS7C33128PFS36A-150TQI AS7C33128PFS36A-133TQI AS7C33128PFS36A-100TQI
AS7C 33 128 PF S 32/36 A –XXX TQ C/I
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