The AS7C1025 and AS7C31025 are high-performance CMOS 1,048,576-bit Static Random Access Memory (SRAM) devices
organized as 131,072 words × 8 bits. They are designed for memory applications where fast data access, low power, and
simple interfacing are desired.
Equal address access and cycle times (t
for high-performance applications. The chip enable input CE
memory systems.
When
is high the devices enter standby mode. The standard AS7C1025 is guaranteed not to exceed 27.5 mW power
CE
consumption in standby mode, and typically requires only 5 mW. Both devices also offer 2.0V data retention.
A write cycle is accomplished by asserting write enable (
(write cycle 1) or CE (write cycle 2). To avoid bus contention, external devices should drive
written on the rising edge of
WE
I/O pins only after outputs have been disabled with
A read cycle is accomplished by asserting output enable (
drive I/O pins with the data word referenced by the input address. When either chip enable or output enable is inactive, or
write enable is active, output drivers stay in high-impedance mode.
All chip inputs and outputs are TTL-compatible, and operation is from a single 5V supply (AS7C1025) or 3.3V supply
(AS7C31025). The AS7C1025 and AS7C31025 are packaged in common industry standard packages.
, tRC, tWC) of 12/15/20 ns with output enable access times (tOE) of 6,7,8 ns are ideal
AA
permits easy memory and expansion with multiple-bank
) and chip enable (CE). Data on the input pins I/O0-I/O7 is
WE
output enable (OE) or write enable (
) and chip enable (CE), with write enable (WE) high. The chips
OE
WE
).
Absolute maximum ratings
ParameterDeviceSymbolMinMaxUnit
Vo l t a g e o n V
relative to GND
CC
AS7C31025V
Voltage on any pin relative to GND V
Power dissipationP
Storage temperature (plastic)T
AS7C1025V
Ambient temperature with V
appliedT
CC
DC current into outputs (low)I
NOTE: Stresses greater than those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and functional
operation of the device at these or any other conditions outside those indicated in the operational sections of this specification is not implied. Exposure to
absolute maximum rating conditions for extended periods may affect reliability.
t1
t1
t2
D
stg
bias
OUT
–0.50+7.0V
–0.50+5.0V
–0.50VCC + 0.5V
–1.0W
–65+150
–55+125
o
C
o
C
–20mA
Truth table
CEWEOE
HXXHigh ZStandby (I
LHHHigh ZOutput disable (I
LHLD
LLXD
Key: X = Don’t Care, L = Low, H = High
DataMode
OUT
IN
Read (ICC)
Write (ICC)
, I
)
SB
SB1
)
CC
3/23/01; v.1.0Alliance SemiconductorP. 2 of 9
Page 3
Recommended operating conditions
ParameterDeviceSymbolMinNominalMaxUnit
Supply voltage
AS7C1025V
AS7C31025V
AS7C1025V
Input voltage
AS7C31025V
commercialT
Ambient operating temperature
industrialT
†
VIL min = –3.0V for pulse width less than tRC/2.
DC operating characteristics (over the operating range)1
ParameterSymTest conditionsDevice
Input leakage
current
| I
LI
Output
leakage
| I
LO
current
Operating
power supply
I
CC
current
I
Standby
SB
power supply
1
current
Output
voltage
Shaded areas contain advance information.
I
SB1
V
OL
V
OH
= Max, VIN = GND to V
| V
CC
V
= Max, CE = VIH, V
CC
|
GND to V
CC
out
CC
=
AS7C1025–130–120–110
CE = VIL, f = f
Max, IOUT
= 0 mA
AS7C31025–100–85–80
AS7C1025–50–40–40
CE = VIH, f = f
CE
V
IN
≥ V
≥ V
CC
CC
–0.2V, V
–0.2V, f = 0, f
, f
Max
≤ 0.2V or
IN
OUT
= 0
OUT
AS7C31025–50–40–40
AS7C1025–5–5–5
= 0
AS7C31025–5–5–5
IOL = 8 mA, VCC = Min–0.4–0.4–0.4V
IOH = –4 mA, VCC = Min2.4–2.4–2.4– V
®
AS7C31025
CC
CC
IH
IH
V
IL
A
A
-12-15-20
–1–1–1µA
–1–1–1µA
4.55.05.5V
3.03.33.6V
2.2–VCC + 0.5V
2.0–VCC + 0.5V
†
–0.5–0.8V
0–70oC
–40–85
AS7C1025
o
C
UnitMinMaxMinMaxMinMax
mA
mA
mA
Capacitance (
f = 1 MHz, Ta = 25 oC, VCC = NOMINAL
)2
ParameterSymbolSignalsTest conditionsMaxUnit
Input capacitanceC
I/O capacitanceC
3/23/01; v.1.0Alliance SemiconductorP. 3 of 9
IN
I/O
A, CE, WE,
OE
I/OVIN = V
VIN = 0V5pF
= 0V7pF
OUT
Page 4
AS7C1025
AS7C31025
®
Read cycle (over the operating range)
ParameterSymbol
Read cycle timet
Address access timet
CE
Chip enable (
Output enable (
) access timet
OE
) access timet
Output hold from address changet
CE
Low to output in low Zt
CE
Low to output in high Zt
OE
Low to output in low Zt
OE
High to output in high Zt
Power up timet
Power down timet
RC
AA
ACE
OE
OH
CLZ
CHZ
OLZ
OHZ
PU
PD
Key to switching waveforms
Read waveform 1 (address controlled)
Address
D
OUT
t
AA
3,9
3,6,7,9
t
-12-15-20
UnitNotesMinMaxMinMaxMinMax
12–15–20–ns
–12–15–20 ns3
–12–15–20 ns3
–6–7–8 ns
3–3–3– ns5
0–0–0– ns 4, 5
–3–4–5 ns 4, 5
0–0–0– ns 4, 5
–3–4–5 ns 4, 5
0–0–0– ns 4, 5
–12–15–20 ns4, 5
Undefined/don’t careFalling inputRising input
RC
t
OH
Data valid
Read waveform 2 (CE and OE controlled)
t
CE
OE
D
OUT
Supply
current
t
ACE
t
CLZ
t
PU
RC1
t
OE
t
OLZ
50%50%
3,6,8,9
Data valid
t
OHZ
t
CHZ
t
PD
I
CC
I
SB
3/23/01; v.1.0Alliance SemiconductorP. 4 of 9
Page 5
AS7C1025
AS7C31025
®
Write cycle (over the operating range)
ParameterSymbol
Write cycle timet
CE
Chip enable (
) to write endt
Address setup to write endt
Address setup timet
Write pulse widtht
Address hold from end of writet
Data valid to write endt
Data hold timet
Write enable to output in high Zt
Output active from write endt
Shaded areas contain advance information.
Write waveform 1 ( WE controlled)
Address
WE
t
AS
D
IN
D
OUT
WC
CW
AW
AS
WP
AH
DW
DH
WZ
OW
10,11
11
-12-15-20
UnitNotesMinMaxMinMaxMinMax
12–15–20–ns
8–12–12– ns
8–12–12– ns
0–0–0– ns
8–9–12– ns
0–0–0– ns
6–8–12– ns
0–0–0–ns4, 5
–5–5–5ns4, 5
3–3–3–ns4, 5
t
WC
t
WZ
t
AW
t
WP
t
DW
Data valid
t
AH
t
DH
t
OW
Write waveform 2 (CE controlled)
10,11
t
WC
t
AW
t
AH
Address
t
AS
t
CW
CE
t
WP
t
DW
t
DH
Data validD
D
WE
OUT
t
WZ
IN
3/23/01; v.1.0Alliance SemiconductorP. 5 of 9
Page 6
AS7C1025
AS7C31025
®
Data retention characteristics (over the operating range)
ParameterSymbolTest conditionsMinMaxUnit
for data retentionV
V
CC
Data retention currentI
Chip enable to data retention timet
Operation recovery timet
Input leakage current| I
DR
CCDR
CDR
R
|–1µA
LI
V
Data retention waveform
Data retention mode
V
CC
CE
V
CC
t
CDR
V
IH
VDR ≥ 2.0V
AC test conditions
– 5V output load: see Figure B or Figure C.
– Input pulse level: GND to 3.0V. See Figure A.
– Input rise and fall times: 2 ns. See Figure A.
– Input and output timing reference levels: 1.5V.
13
VCC = 2.0V
CE
≥ V
≥ V
IN
V
IN
V
DR
+5V
– 0.2V
CC
– 0.2V or
CC
≤ 0.2V
2.0–V
–500µA
0–ns
t
RC
V
CC
V
IH
Thevenin equivalent:
D
168W
OUT
–ns
t
R
+1.728V (5V and 3.3V)
+3.3V
D
+3.0V
GND
90%
10%
2 ns
Figure A: Input pulse
90%
10%
OUT
255W
C(14)
GND
Figure B: 5V Output load
Notes
1During VCC power-up, a pull-up resistor to VCC on CE is required to meet ISB specification.
2This parameter is sampled, but not 100% tested.
3For test conditions, see AC Test Conditions, Figures A, B, and C.
4t
and t
480W
CLZ
5This parameter is guaranteed, but not 100% tested.
6WE
7CE
and OE are Low for read cycle.
8Address valid prior to or coincident with CE
9All read cycle timings are referenced from the last valid address to the first transitioning address.
10 CE
or WE must be High during address transitions. Either CE or WE asserting high terminates a write cycle.
11 All write cycle timings are referenced from the last valid address to the first transitioning address.
12 NA.
13 2V data retention applies to commercial temperature operating range only.
14 C=30pF, except all high Z and low Z parameters, where C=5pF.
are specified with CL = 5pF, as in Figure C. Transition is measured ±500mV from steady-state voltage.
CHZ
is High for read cycle.
transition Low.
D
OUT
255W
C(14)
GND
Figure C: 3.3V Output load
320W
3/23/01; v.1.0Alliance SemiconductorP. 6 of 9
Page 7
Typical DC and AC characteristics
AS7C1025
AS7C31025
®
Normalized supply current ICC, I
vs. supply voltage V
1.4
1.2
I
SB
1.0
, I
CC
0.8
CC
0.6
I
0.4
Normalized I
SB
0.2
0.0
MIN
NOMINAL
Supply voltage (V)
Normalized access time t
vs. supply voltage V
1.5
1.4
1.3
Ta = 25° C
1.2
1.1
1.0
Normalized access time
0.9
SB
CC
Normalized supply current ICC, I
vs. ambient temperature T
1.4
1.2
SB
1.0
, I
CC
0.8
SB
a
I
CC
0.6
I
0.4
Normalized I
SB
0.2
Normalized supply current I
vs. ambient temperature T
625
25
(log scale)
SB1
VCC = VCC(NOMINAL)
5
1
0.2
Normalized I
0.04
SB1
a
0.0
MAX
–5580
Ambient temperature (°C)
AA
CC
Normalized access time t
vs. ambient temperature T