The AS7C1024A and AS7C31024A are high performance CMOS 1,048,576-bit Static Random Access Memory (SRAM) devices organized as
131,012 words x 8 bits. It is designed for memory applications where fast data access, low power, and simple interfacing are desired.
Equal address access and cycle times (tAA, tRC, tWC) of 10/12/15/20 ns with output enable access times (tOE) of 3/3/4/5 ns are ideal for high
performance applications. Active high and low chip enables (CE1
When CE1
static, then full standby power is reached (I
conditions. All devices in this family will retain data when VCC is reduced as low as 2.0V.
A write cycle is accomplished by asserting write enable (WE) and both chip enables (CE1, CE2). Data on the input pins I/O0-I/O7 is written
on the rising edge of WE
should drive I/O pins only after outputs have been disabled with output enable (OE
A read cycle is accomplished by asserting output enable (OE
I/O pins with the data word referenced by the input address. When either chip enable is inactive, output enable is inactive, or write enable is
active, output drivers stay in high-impedance mode.
is high or CE2 is low the devices enter standby mode. If inputs are still toggling, the device will consume ISB power. If the bus is
). For example, the AS7C31024A is guaranteed not to exceed 36mW under nominal full standby
SB1
(write cycle 1) or the active-to-inactive edge of CE1 or CE2 (write cycle 2). To avoid bus contention, external devices
Absolute maximum ratings
ParameterSymbolMinMaxUnit
Vo l ta ge o n V
Voltage on any pin relative to GND BothV
Power dissipationBothP
Storage temperature (plastic)BothT
Ambient temperature with V
DC current into outputs (low)BothI
Note: Stresses greater than those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and functional oper-
ation of the device at these or any other conditions outside those indicated in the operational sections of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect reliability.
relative to GND
CC
appliedBothT
CC
, CE2) permit easy memory expansion with multiple-bank systems.
) or write enable (WE).
) and both chip enables (CE1, CE2), with write enable (WE) high. The chips drive
AS7C1024AV
AS7C31024AV
t1
t1
t2
D
stg
bias
OUT
–0.50+7.0V
-0.50+5.0V
–0.50VCC +0.50V
–1.0W
–65+150°C
–55+125°C
–20mA
Truth table
CE1
HXXXHigh ZStandby (I
XLXXHigh ZStandby (I
LHHHHigh ZOutput disable (I
LHHLD
LHLXD
Key: X = Don’t Care, L = Low, H = High
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CE2WEOEDataMode
OUT
IN
Read (ICC)
Write (
SB
SB
ICC
, I
, I
SB1
SB1
)
CC
)
)
)
Page 3
Recommended operating conditions
ParameterDeviceSymbolMinNominalMaxUnit
Supply voltage
Input voltage
Ambient operating temperature
†
VILmin. = –3.0V for pulse width less than t
AS7C1024AV
AS7C31024AV
ASAS7C1024AV
AS7C31024AV
commercialT
industrialT
.
RC/2
CC
CC
IH
IH
V
IL
A
A
DC operating characteristics (over the operating range)1
ParameterSymTest conditionsDevice
®
4.55.05.5V
3.03.33.6V
2.2–VCC + 0.5V
2.0–VCC + 0.5V
†
–0.5–0.8V
0–70°C
–40–85°C
-10-12-15-20
Min Max Min Max Min Max Min Max
AS7C1024A
AS7C31024A
Unit
Input leakage
current
Output leakage
current
Operating power
supply current
Standby power
supply current
Output voltage
Data retention
current
|VCC = Max, VIN = GND to V
|I
LI
V
= Max, CE1 = VIH or
CC
|
|I
LO
CE2 = V
, V
IL
= GND to V
OUT
VCC = Max, CE1 = VIL,
CE2 = V
I
CC
IH
, f = f
Max
mA
VCC = Max, CE1 ≥ VIH and/or
I
SB
I
SB1
V
OL
V
OH
ICCDR
CE2 ≤ V
VCC = Max, CE1
IOH = –4 mA, VCC = Min2.4–2.4–2.4–2.4–V
, VIN = VIH or VIL,
IL
, I
f = f
Max
OUT
≥
≤ GND + 0.2V or
V
IN
≥ VCC –0.2V, f = 0
V
IN
IOL = 8 mA, VCC = Min–0.4–0.4–0.4–0.4V
= 2.0V
V
CC
CE1
≥ VCC–0.2V or
CE2 ≤ 0.2V
V
≥
V
CC
≤ 0.2V
IN
–0.2V or
V
IN
, I
OUT
= 0mA
V
–0.2V
CC
CC
Both –1–1–1–1µA
Both –1–1–1–1µA
CC
AS7C1024A–120–110–100–100
= 0
AS7C31024A–90–80–80–80
AS7C1024A–30–25–20–20
AS7C31024A–30–25–20–20
AS7C1024A–10–10–10–15
AS7C31024A–10–10–10–15
AS7C1024A-1-1-1-5mA
AS7C31024A-1-1-1-5mA
mA
mA
mA
Capacitance (f = 1 MHz, T
= 25 °C, V
a
= NOMINAL)
CC
2
ParameterSymbolSignalsTest conditionsMaxUnit
Input capacitanceC
I/O capacitanceC
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IN
I/O
A, CE1, CE2, WE, OEVIN = 0V5pF
I/OVIN = V
= 0V7pF
OUT
Page 4
AS7C1024A
AS7C31024A
®
Read cycle (over the operating range)
ParameterSymbol
Read cycle timet
Address access timet
Chip enable (CE1
Chip enable (CE2) access timet
Output enable (OE) access timet
Output hold from address changet
CE1
Low to output in low Zt
CE2 High to output in low Zt
Low to output in high Zt
CE1
CE2 Low to output in high Zt
OE
Low to output in low Zt
High to output in high Zt
OE
Power up timet
Power down timet
) access timet
ACE1
ACE2
CLZ1
CLZ2
CHZ1
CHZ2
OLZ
OHZ
RC
AA
OE
OH
PU
PD
3,9,12
-10-12-15-20
UnitNotesMinMaxMinMaxMinMaxMinMax
10–12–15–20–ns
–10–12–15–20ns3
–10–12–15–20ns3, 12
–10–12–15–20ns3, 12
–3–3–4–5 ns
2–3–3–3– ns5
0–0–0–0– ns4, 5, 12
0–0–0–0– ns4, 5, 12
–3–3–4–5 ns4, 5, 12
–3–3–4–5 ns4, 5, 12
0–0–0–0– ns 4, 5
–3–3–4–5 ns 4, 5
0–0–0–0– ns4, 5, 12
–10–12–15–20ns4, 5, 12
Key to switching waveforms
t
AA
3,6,7,9,12
t
RC
Read waveform 1 (address controlled)
Address
D
OUT
Read waveform 2 (CE1, CE2, and OE controlled)
t
CE1
CE2
OE
D
OUT
Current
supply
t
ACE 1, tACE2
t
CLZ1
t
PU
, t
CLZ2
RC1
t
OE
t
OLZ
50%50%
3,6,8,9,12
Data valid
Data valid
Undefined / don’t careFalling inputRising input
t
OH
t
OHZ
t
, t
CHZ1
CHZ2
t
PD
I
CC
I
SB
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Page 5
AS7C1024A
AS7C31024A
®
Write cycle (over the operating range)
ParameterSymbol
Write cycle timet
Chip enable (CE1) to write endt
Chip enable (CE2) to write endt
Address setup to write endt
Address setup timet
Write pulse widtht
Address hold from end of writet
Data valid to write endt
Data hold timet
Write enable to output in high Zt
Output active from write endt
Write waveform 1 (WE controlled)
Address
WE
t
AS
D
IN
D
OUT
WC
CW1
CW2
AW
AS
WP
AH
DW
DH
WZ
OW
10,11,12
11, 12
-10-12-15-20
UnitNotesMinMaxMinMaxMinMaxMinMax
10–12–15–20–ns
8–10–12–12–ns12
8–10–12–12–ns12
8–9–10–12– ns
0–0–0–0–ns12
7–8–9–12– ns
0–0–0–0–ns
5–6–8–10– ns
0–0–0–0–ns 4, 5
–6–6–6–8 ns 4, 5
1–1–1–2–ns 4, 5
t
WC
t
WZ
t
AW
t
WP
t
DW
Data valid
t
AH
t
DH
t
OW
Write waveform 2 (CE1 and CE2 controlled)
10,11,12
t
WC
t
AW
t
AH
Address
t
t
AS
CW1
, t
CW2
CE1
CE2
t
WP
WE
D
D
OUT
t
WZ
IN
t
DW
Data valid
t
DH
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Page 6
AS7C1024A
AS7C31024A
®
Data retention characteristics (over the operating range)
ParameterSymbolTest conditionsDeviceMinMaxUnit
V
for data retentionVDRVCC = 2.0V
CC
Chip deselect to data retention timetCDR0–ns
Operation recovery timetRt
Input leakage current| ILI |–1µA
CE1
≥ V
CE2 ≤ 0.2V
V
≥ V
IN
V
CC
CC
≤ 0.2V
IN
–0.2V or
–0.2V or
Data retention waveform
Data retention mode
2.0–V
RC
–ns
V
CC
CE1
V
CC
t
CDR
V
IH
VDR ≥ 2.0V
V
DR
AC test conditions
– Output load: see Figure B or Figure C.
– Input pulse level: GND to 3.0V. See Figure A.
– Input rise and fall times: 2 ns. See Figure A.
– Input and output timing reference levels: 1.5V.
D
+3.0V
GND
90%
10%
2 ns
Figure A: Input pulse
90%
10%
OUT
Figure B: 5V Output load
255W
+5V
480W
C(14)
GND
D
OUT
D
OUT
Notes
1During VCC power-up, a pull-up resistor to VCC on CE1 is required to meet I
2This parameter is sampled and not 100% tested.
3For test conditions, see AC Test Conditions, Figures A, B, and C.
4t
and t
CLZ
5This parameter is guaranteed, but not 100% tested.
6WE
is High for read cycle.
7CE1
8Address valid prior to or coincident with CE1
9All read cycle timings are referenced from the last valid address to the first transitioning address.
10 CE1
11 All write cycle timings are referenced from the last valid address to the first transitioning address.
12 CE1
13 C=30pF, except all high Z and low Z parameters, C=5pF.
are specified with CL = 5pF, as in Figure C. Transition is measured ±500mV from steady-state voltage.
CHZ
and OE are Low and CE2 is High for read cycle.
transition Low.
or WE must be High or CE2 Low during address transitions. Either CE1 or WE asserting high terminates a write cycle.