Datasheet AS7C3256-20TI, AS7C3256-20TC, AS7C3256-20PC, AS7C3256-20JI, AS7C3256-20JC Datasheet (Alliance Semiconductor Corporation)

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Page 1
January 2001 Advance Information
Copyright © Alliance Semiconductor. All rights reserved.
AS7C256
AS7C3256
1/10/2001 Alliance Semiconductor P. 1 of 9
5V/3.3V 32K X 8 CMOS SRAM (Common I/O)
®
• AS7C256 (5V version)
• AS7C3256 (3.3V version)
• Industrial and commercial temperature
• Organization: 262,144 words × 16 bits
• High speed
- 12/15/20 ns address access time
- 5/6/7/9 ns output enable access time
• Very low power consumption: ACTIVE
- 660mW (AS7C256) / max @ 12 ns
- 216mW (AS7C3256) / max @ 12 ns
• Very low power consumption: STANDBY
- 22 mW (AS7C256) / max CMOS I/O
- 7.2 mW (AS7C3256) / max CMOS I/O
• 2.0V data retention
• Easy memory expansion with CE
and OE inputs
• TTL-compatible, three-state I/O
• 28-pin JEDEC standard packages
-300 mil PDIP
-300 mil SOJ
-8 × 13.4 TSOP
• ESD protection ≥ 2000 volts
• Latch-up current ≥ 200 mA
Logic block diagram
A8A
7
256 X 128 X 8
Array
(262,144)
Input buffer
A0
A1
A2
A3
A4
A5
A6
A14
A9A10A11A12A
13
I/O0
I/O7
V
CC
GND
OE
CE
WE
Column decoder
Row decoder
Control
circuit
Sense amp
Pin arrangement
1 2 3 4 5 6 7 8 9 10 11 12 13 14
28 27 26 25 24 23 22 21 20 19 18 17
V
CC
WE A13
A8 A9
A11 OE A10 CE I/O7
I/O6
I/O5 I/O4
I/O3
A14 A12
A7 A6
A5
A4 A3 A2 A1 A0
I/O0
I/O1 I/O2
GND
AS7C256
AS7C3256
16 15
1 2 3 4 5 6 7 8 9 10 11 12 13 14
28 27 26 25 24 23 22 21 20 19 18 17
V
CC
WE
A13
A8
A9
A11
OE A10
CE I/O7 I/O6 I/O5 I/O4
I/O3 A14 A12
A7 A6 A5 A4 A3 A2
A1
A0
I/O0
I/O1
I/O2
GND
AS7C256
AS7C3256
16 15
28-pin TSOP I (8×13.4)
28-pin DIP, SOJ (300 mil)
Note: This part is compatible with both pin numbering
conventions used by various manufacturers.
(21) (20) (19) (18) (17) (16) (15) (14) (13) (12) (11) (10) (9) (8)
(22) (23) (24) (25) (26) (27) (28) (1) (2) (3) (4) (5) (6) (7)
Selection guide
AS7C256-10
AS7C3256-10
AS7C256-12
AS7C3256-12
AS7C256-15
AS7C3256-15
AS7C256-20
AS7C3256-20 Unit
Maximum address access time 10 12 15 20 ns
Maximum output enable access time 5 6 7 ns
Maximum operating current
AS7C256 120 115 110 mA
AS7C3256 60 55 50 mA
Maximum CMOS standby current
AS7C256 4 4 4 mA
AS7C3256 2 2 2 mA
Page 2
®
AS7C256
AS7C3256
1/10/2001 Alliance Semiconductor P. 2 of 9
Functional description
The AS7C(3)256 is a 5V/3.3V high-performance CMOS 262,144-bit Static Random-Access Memory (SRAM) device organized as 262,144 words × 16 bits. It is designed for memory applications requiring fast data access at low voltage, including Pentium
TM
, PowerPCTM, and portable computing. Alliance’s advanced circuit design and process techniques permit 3.3V
operation without sacrificing performance or operating margins.
The device enters standby mode when
CE
is high. CMOS standby mode consumes 3.6 mW. Normal operation offers 75% power
reduction after initial access, resulting in significant power savings during CPU idle, suspend, and stretch mode. Both versions of the AS7C256 offer 2.0V data retention.
Equal address access and cycle times (t
AA
, tRC, tWC) of 12/15/20 ns with output enable access times (tOE) of 5/6/7/9 ns are
ideal for high-performance applications. The chip enable (
CE
) input permits easy memory expansion with multiple-bank
memory organizations.
A write cycle is accomplished by asserting chip enable (
CE
) and write enable (WE) LOW. Data on the input pins I/O0-I/O7 is
written on the rising edge of
WE
(write cycle 1) or CE (write cycle 2). To avoid bus contention, external devices should drive
I/O pins only after outputs have been disabled with
output enable (OE) or write enable (
WE
).
A read cycle is accomplished by asserting chip enable (
CE
) and output enable (OE) LOW, with write enable (WE) high. The chip drives I/O pins with the data word referenced by the input address. When chip enable or output enable is high, or write enable is low, output drivers stay in high-impedance mode.
All chip inputs and outputs are TTL-compatible and 5V tolerant. Operation is from a single 3.3±0.3V supply. The AS7C(3)256A is packaged in high volume industry standard packages.
Absolute maximum ratings
Stresses greater than those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions outside those indicated in the operational sections of this specification is not implied. Exposure to absolute max­imum rating conditions for extended periods may affect reliability.
Truth table
Key:
X = Don’t care, L = Low, H = High
Parameter Device Symbol Min Max Unit
Vol t a g e o n V
CC
relative to GND
AS7C256 V
t1
–0.5 +7.0 V
AS7C3256 V
t1
–0.5 +5.0 V
Voltage on any pin relative to GND V
t2
–0.5 VCC + 0.5 V
Power dissipation P
D
–1.0W
Storage temperature (plastic) T
stg
–65 +150
o
C
Ambient temperature with V
CC
applied T
bias
–55 +125
o
C
DC current into outputs (low) I
OUT
–20mA
CE WE OE
Data Mode
H X X High Z Standby (I
SB
, I
SB1
)
L H H High Z Output disable (I
CC
)
LHLD
OUT
Read (ICC)
LLXD
IN
Write (ICC)
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AS7C256
AS7C3256
1/10/2001 Alliance Semiconductor P. 3 of 9
Recommended operating conditions
*
VIL min = –2.0V for pulse width less than tRC/2.
DC operating characteristics (over the operating range)1
Capacitance (f = 1MHz, Ta = room temperature, VCC = NOMINAL)
2
Parameter Device Symbol Min Typical Max Unit
Supply voltage
AS7C256 V
CC
4.5 5.0 5.5 V
AS7C3256 V
CC
3.0 3.3 3.6 V
Input voltage
AS7C256 V
IH
2.2 VCC+0.5 V
AS7C3256 V
IH
2.0 VCC+0.5 V
—V
IL
*
-0.5
*
–0.8V
Ambient operating temperature
commercial T
A
0–70oC
industrial T
A
–40 85
o
C
Parameter Sym Test conditions Device
-10 -12 -15 -20
UnitMin Max Min Max Min Max Min Max
Input leakage current
|I
LI
|
V
CC
= Max,
V
in
= GND to V
CC
–1–1–1µA
Output leakage current
|I
LO
|
V
CC
= Max,
V
OUT
= GND to V
CC
–1–1–1µA
Operating power supply current
I
CC
V
CC
= Max, CE V
IL
f = f
Max
, I
OUT
= 0mA
AS7C256
120 115 110
mA
AS7C3256
–60– 55 – 50
Standby power supply current
I
SB
V
CC
= Max, CE V
IL
f = f
Max
, I
OUT
= 0mA
AS7C256
–40– 35 – 30
mA
AS7C3256
–20– 20 – 20
I
SB1
V
CC
= Max, CE > V
CC
–0.2V
V
IN
< GND + 0.2V or
V
IN
> VCC–0.2V, f = 0
AS7C256
4.0 4.0 4.0
mA
AS7C3256
2.0 2.0 2.0
Output voltage
V
OLIOL
= 8 mA, VCC = Min 0.4 0.4 0.4 V
V
OHIOH
= –4 mA, VCC = Min 2.4 2.4 2.4 V
Parameter Symbol Signals Test conditions Max Unit
Input capacitance C
IN
A, CE, WE,
OE
Vin = 0V 5 pF
I/O capacitance C
I/O
I/O Vin = V
out
= 0V 7 pF
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AS7C256
AS7C3256
1/10/2001 Alliance Semiconductor P. 4 of 9
Read cycle (over the operating range)
3,9
Key to switching waveforms
Read waveform 1 (address controlled)
3,6,7,9
Read waveform 2 (CE controlled)
3,6,8,9
Parameter Symbol
-10 -12 -15 -20
Unit NotesMin Max Min Max Min Max Min Max
Read cycle time t
RC
12 15 20 ns
Address access time t
AA
–12–15–20ns 3
Chip enable (CE
) access time
t
ACE
–12–15–20ns 3
Output enable (OE
) access time
t
OE
–5–6–7ns
Output hold from address change t
OH
3–3–3–ns 5
CE
LOW to output in low Z
t
CLZ
3–3–3–ns4, 5
CE
HIGH to output in high Z
t
CHZ
–3–4–5ns4, 5
OE
LOW to output in low Z
t
OLZ
0–0–0–ns4, 5
OE
HIGH to output in high Z
t
OHZ
–3–4–5ns4, 5
Power up time t
PU
0–0–0–ns4, 5
Power down time t
PD
–12–15–20ns 4, 5
Undefined output/don’t careFalling inputRising input
Address
D
out
Data valid
t
OH
t
AA
t
RC
Supply
current
CE
OE
D
out
t
RC
1
t
OE
t
OLZ
t
ACE
t
CHZ
t
CLZ
t
PU
t
PD
I
CC
I
SB
50% 50%
t
OHZ
Data valid
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AS7C256
AS7C3256
1/10/2001 Alliance Semiconductor P. 5 of 9
Write cycle (over the operating range)
11
Shaded areas contain advance information.
Write waveform 1 (WE controlled)
10,11
Write waveform 2 (CE controlled)
10,11
Parameter Symbol
-10 -12 -15 -20
Unit NotesMin Max Min Max Min Max
Write cycle time t
WC
12 15 20 ns
Chip enable to write end t
CW
8–10–12– ns
Address setup to write end t
AW
8–10–12– ns
Address setup time t
AS
0–0–0– ns
Write pulse width t
WP
8–9–12– ns
Address hold from end of write t
AH
0–0–0– ns
Data valid to write end t
DW
6–8–10– ns
Data hold time t
DH
0–0–0– ns4, 5
Write enable to output in high Z t
WZ
–5–5–5 ns4, 5
Output active from write end t
OW
3–3–3– ns4, 5
t
AW
t
AH
t
WC
Address
WE
D
in
D
out
t
DH
t
OW
t
DW
t
WZ
t
WP
t
AS
Data valid
t
AW
Address
CE
WE
D
in
D
out
Data valid
t
CW
t
WP
t
DW
t
DH
t
AH
t
WZ
t
WC
t
AS
Page 6
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AS7C256
AS7C3256
1/10/2001 Alliance Semiconductor P. 6 of 9
Data retention characteristics (over the operating range)
13
Data retention waveform
AC test conditions
Notes
1During VCC power-up, a pull-up resistor to VCC on CE is required to meet ISB specification.
2 This parameter is sampled, but not 100% tested.
3 For test conditions, see
AC Test Conditions
, Figures A, B, C.
4 These parameters are specified with CL = 5pF, as in Figures B or C. Transition is measured
±
500mV from steady-state voltage.
5 This parameter is guaranteed, but not tested.
6WE
is High for read cycle.
7CE
and OE are Low for read cycle.
8 Address valid prior to or coincident with CE
transition Low.
9 All read cycle timings are referenced from the last valid address to the first transitioning address.
10 CE
or WE must be High during address transitions. Either CE or WE asserting high terminates a write cycle.
11 All write cycle timings are referenced from the last valid address to the first transitioning address.
12 CE1
and CE2 have identical timing.
13 2V data retention applies to the commercial operating range only.
14 C=30pF, except on High Z and Low Z parameters, where C=5pF.
Parameter Symbol Test conditions Min Max Unit
V
CC
for data retention V
DR
VCC = 2.0V
CE
V
CC
–0.2V
V
IN
V
CC
–0.2V
or
V
IN
0.2V
2.0 V
Data retention current I
CCDR
–500µA
––µA
Chip enable to data retention time t
CDR
0–ns
Operation recovery time t
R
t
RC
–ns
Input leakage current | I
LI
| –1µA
V
CC
CE
t
R
t
CDR
Data retention mode
VCC VCC
V
DR
2.0V
V
IH
V
IH
V
DR
350
C(14)
320
D
out
GND
+3.3V
168
D
out
+1.72V (5V and 3.3V)
Figure C: Output load
255
C(14)
480
D
out
GND
+5V
Figure B: Output lo
ad
Thevenin equivalent
- Output load: see Figure B or Figure C.
- Input pulse level: GND to 3.0V. See Figure A.
- Input rise and fall times: 2 ns. See Figure A.
- Input and output timing reference levels: 1.5V.
10%
90%
10%
90%
GND
+3.0V
Figure A: Input pulse
2 ns
Page 7
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AS7C256
AS7C3256
1/10/2001 Alliance Semiconductor P. 7 of 9
Typical DC and AC characteristics
Supply voltage (V)
MIN
MAX
NOMINAL
0.0
0.2
0.6
0.8
0.4
1.0
1.2
1.4
Normalized I
CC
, I
SB
Normalized supply current ICC, I
SB
Ambient temperature (°C)
–55 80
125
35–10
0.0
0.2
0.6
0.8
0.4
1.0
1.2
1.4
Normalized I
CC
, I
SB
Normalized supply current ICC, I
SB
vs. ambient temperature T
a
vs. supply voltage V
CC
I
CC
I
SB
I
CC
I
SB
Ambient temperature (°C)
-55 80
125
35-10
0.2
1
0.04
5
25
625
Normalized I
SB1
(log scale)
Normalized supply current ISB1
vs. ambient temperature T
a
VCC = VCC(NOMINAL)
Supply voltage (V)
MIN
MAX
NOMINAL
0.8
0.9
1.1
1.2
1.0
1.3
1.4
1.5
Normalized access time
Normalized access time t
AA
Ambient temperature (°C)
–55 80
125
35–10
0.8
0.9
1.1
1.2
1.0
1.3
1.4
1.5
Normalized access time
Normalized access time t
AA
Cycle frequency (MHz)
075
100
5025
0.0
0.2
0.6
0.8
0.4
1.0
1.2
1.4
Normalized I
CC
Normalized supply current I
CC
vs. ambient temperature T
a
vs. cycle frequency 1/tRC, 1/t
WC
vs. supply voltage V
CC
VCC = VCC(NOMINAL)
Ta = 25°C
VCC = VCC(NOMINAL)Ta = 25°C
Output voltage (V)
V
CC
0
20
60
80
40
100
120
140
Output source current (mA)
Output source current I
OH
Output voltage (V)
V
CC
Output sink current (mA)
Output sink current I
OL
vs. output voltage V
OL
vs. output voltage V
OH
0
20
60
80
40
100
120
140
VCC = VCC(NOMINAL)PL
Ta = 25°C
VCC = VCC(NOMINAL)
Ta = 25°C
Capacitance (pF)
0 750
1000
500250
0
5
15
20
10
25
30
35
Change in t
AA
(ns)
Typical access time change ∆t
AA
vs. output capacitive loading
VCC = V
CC(NOMINAL)
00
Page 8
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AS7C256
AS7C3256
1/10/2001 Alliance Semiconductor P. 8 of 9
Package diagrams
c
eA
α
Seating
b
A1
E1
E
D
e
L
S
Plane
B
A
Pin 1
28-pin PDIP
Min Max
A - 0.175
A1 0.010 -
B 0.058 0.064
b 0.016 0.022
c 0.008 0.014
D - 1.400
E 0.295 0.320
E1 0.278 0.298
e0.100 BSC
eA 0.330 0.370
L 0.120 0.140
α 15°
S - 0.055
28-pin SOJ
Min Max
A
- 0.140
A1
0.025 -
A2
0.095 0.105
B
0.028 TYP
b
0.018 TYP
c
0.010 TYP
D
- 0.730
E
0.245 0.285
E1
0.295 0.305
E2
0.327 0.347
e
0.050 BSC
28-pin 8×13.4
Min Max
A
–1.20
A1
0.10 0.20
A2 0.95 1.05
b
0.15 0.25
c
0.10 0.20
D
11.60 11.80
e
0.55 nominal
e
D
E1
Pin 1
b
B
A1
A2
c
E
Seating
Plane
E2
A
e
b
E
HdD
c
L
A1AA2
α
28-pin
pin 8(21)
pin 1(7) pin 5(8)
pin 1(22)
Note: This part is compatible with both pin numbering
conventions used by various manufacturers.
Page 9
© Copyright Alliance Semiconductor Corporation. All rights reserved. Our three-point logo, our name and Intelliwatt are trademarks or registered trademarks of Alliance. All other brand and product names may be the trademarks of their respective companies. Alliance reserves the right to make changes to this document and its products at any time without notice. Alliance assumes no responsibility for any errors that may appear in this document. The data conta ined herein represents Alliance’s bes t da ta a nd/or e s timate s at the time of issuance. Alliance reserves the right to change or correct this data at any time, without notice. If the product described herein is under development, significant changes to these specifications are possible. The information in this product data sheet is intended to be general descriptive information for potential customers and users, and is not intended to operate as, or provide, any guarantee or warran tee to any user or customer. Alliance does not assume any responsibility or liability arising out of the application or use of any product described herein, and disclaims any express or implied warranties related to the sale and/or use of Alliance products including lia bility or warranties related to fitne ss for a par­ticular purpose, merchantability , or infringement of any intellectual property rights , except as express agreed to in Alliance’s Terms and Conditions of Sale (which are available from Alliance). All sales of Alli­ance products are made exclusively according to A lliance’s Terms and Conditions of Sale. The purchase of products from Alliance doe s not convey a license under any patent rights, copyrights, mask works rights, trademarks, or any other intellectual property rights of Alliance or third parties. Alliance does not authorize its products for use as critical components in life-supporting systems where a malfunction or failure may reasonably be expected to result in significant injury to the user, and the inclusion of Alliance products in such life-supporting systems implies that the manufacturer assumes all risk of such use and agrees to indemnify Alliance against all claims arising from such use.
®
AS7C256
AS7C3256
1/10/2001 Alliance Semiconductor P. 9 of 9
Ordering information
Part numbering system
Package / Access time Volt/Temp 10 ns 12 ns 15 ns 20 ns
Plastic DIP, 300 mil
5V commercial AS7C256-10PC AS7C256-12PC AS7C256-15PC AS7C256-20PC
3.3V commercial AS7C3256-10PC AS7C3256-12PC AS7C3256-15PC AS7C3256-20PC
Plastic SOJ, 300 mil
5V commercial AS7C256-10JC AS7C256-12JC AS7C256-15JC AS7C256-20JC
3.3V commercial AS7C3256-10JC AS7C3256-12JC AS7C3256-15JC AS7C3256-20JC
5V industrial AS7C256-10JI AS7C256-12JI AS7C256-15JI AS7C256-20JI
3.3V industrial AS7C3256-10JI AS7C3256-12JI AS7C3256-15JI AS7C3256-20JI
TSOP 8x13.4
5V commercial AS7C256-10TC AS7C256-12TC AS7C256-15TC AS7C256-20TC
3.3V commercial AS7C3256-10TC AS7C3256-12TC AS7C3256-15TC AS7C3256-20TC
5V industrial AS7C256-10TI AS7C256-12TI AS7C256-15TI AS7C256-20TI
3.3V industrial AS7C3256-10TI AS7C3256-12TI AS7C3256-15TI AS7C3256-20TI
AS7C 3 256 –XX X C or I
SRAM prefix 3 = 3.3V supply Device number Access time
Package: J = SOJ 300 mil
T = TSOP 8x13.4
Commercial temperature range: 0
o
C to 70 0C
Industrial temperature range:
-40C to 85C
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