®
AS7C256
AS7C3256
1/10/2001 Alliance Semiconductor P. 2 of 9
Functional description
The AS7C(3)256 is a 5V/3.3V high-performance CMOS 262,144-bit Static Random-Access Memory (SRAM) device organized
as 262,144 words × 16 bits. It is designed for memory applications requiring fast data access at low voltage, including
Pentium
TM
, PowerPCTM, and portable computing. Alliance’s advanced circuit design and process techniques permit 3.3V
operation without sacrificing performance or operating margins.
The device enters standby mode when
CE
is high. CMOS standby mode consumes ≤3.6 mW. Normal operation offers 75% power
reduction after initial access, resulting in significant power savings during CPU idle, suspend, and stretch mode. Both versions
of the AS7C256 offer 2.0V data retention.
Equal address access and cycle times (t
AA
, tRC, tWC) of 12/15/20 ns with output enable access times (tOE) of 5/6/7/9 ns are
ideal for high-performance applications. The chip enable (
CE
) input permits easy memory expansion with multiple-bank
memory organizations.
A write cycle is accomplished by asserting chip enable (
CE
) and write enable (WE) LOW. Data on the input pins I/O0-I/O7 is
written on the rising edge of
WE
(write cycle 1) or CE (write cycle 2). To avoid bus contention, external devices should drive
I/O pins only after outputs have been disabled with
output enable (OE) or write enable (
WE
).
A read cycle is accomplished by asserting chip enable (
CE
) and output enable (OE) LOW, with write enable (WE) high. The
chip drives I/O pins with the data word referenced by the input address. When chip enable or output enable is high, or write
enable is low, output drivers stay in high-impedance mode.
All chip inputs and outputs are TTL-compatible and 5V tolerant. Operation is from a single 3.3±0.3V supply. The
AS7C(3)256A is packaged in high volume industry standard packages.
Absolute maximum ratings
Stresses greater than those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and functional operation
of the device at these or any other conditions outside those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
Truth table
Key:
X = Don’t care, L = Low, H = High
Parameter Device Symbol Min Max Unit
Vol t a g e o n V
CC
relative to GND
AS7C256 V
t1
–0.5 +7.0 V
AS7C3256 V
t1
–0.5 +5.0 V
Voltage on any pin relative to GND V
t2
–0.5 VCC + 0.5 V
Power dissipation P
D
–1.0W
Storage temperature (plastic) T
stg
–65 +150
o
C
Ambient temperature with V
CC
applied T
bias
–55 +125
o
C
DC current into outputs (low) I
OUT
–20mA
CE WE OE
Data Mode
H X X High Z Standby (I
SB
, I
SB1
)
L H H High Z Output disable (I
CC
)
LHLD
OUT
Read (ICC)
LLXD
IN
Write (ICC)