
40V Dual N-Channel MOSFET
Absolute Maximum Ratings T
=25°C unless otherwise noted
General Description Product Summary
AO4884
The AO4884 uses advanced trench technology to provide
excellent R
with low gate charge. This is an all
DS(ON)
purpose device that is suitable for use in a wide range of
power conversion applications.
DS
ID (at VGS=10V) 10A
R
R
(at VGS=10V) < 13mΩ
DS(ON)
(at VGS = 4.5V) < 16mΩ
DS(ON)
40V
100% UIS Tested
100% Rg Tested
SOIC-8
Top View Bottom View
D1
Top View
S2
138
G2
2
S1
G1
4 5
A
D2
D2
7
D1
6
G1
D1
G2
S1
Maximum UnitsParameter
Drain-Source Voltage 40
Continuous Drain
Current
Pulsed Drain Current
Avalanche Current
Avalanche energy L=0.1mH
TA=25°C
TA=70°C
C
C
C
TA=25°C
B
Power Dissipation
TA=70°C
Junction and Storage Temperature Range -55 to 150 °C
V
DS
V
GS
I
D
I
DM
IAS, I
EAS, E
P
D
TJ, T
AR
STG
10
8
50
AR
61
mJ
2
1.3
D2
S2
V
V±20Gate-Source Voltage
A
A35
W
Thermal Characteristics
Maximum Junction-to-Ambient
Maximum Junction-to-Ambient
Maximum Junction-to-Lead
Rev 1: Nov 2010 www.aosmd.com Page 1 of 6
t ≤ 10s
Steady-State
Steady-State
Symbol
R
θJA
R
θJL
48
74
32
62.5
90
40
UnitsParameter Typ Max
°C/W
°C/W
°C/W

Electrical Characteristics (TJ=25°C unless otherwise noted)
AO4884
Symbol Min Typ Max Units
Parameter Conditions
STATIC PARAMETERS
BV
I
DSS
I
GSS
V
GS(th)
I
D(ON)
R
DS(ON)
g
FS
V
SD
I
S
Drain-Source Breakdown Voltage
DSS
Zero Gate Voltage Drain Current
Gate-Body leakage current
Gate Threshold Voltage
On state drain current
Static Drain-Source On-Resistance
Forward Transconductance
Diode Forward Voltage
Maximum Body-Diode Continuous Current
ID=250µA, VGS=0V
40 V
VDS=40V, VGS=0V 1
TJ=55°C 5
VDS=0V, VGS= ±20V
VDS=V
GS ID
=250µA
VGS=10V, VDS=5V
VGS=10V, ID=10A
1.55 2.2 2.7 V
50 A
±100 nA
11 13
TJ=125°C 16.5 20
VGS=4.5V, ID=10A
VDS=5V, ID=10A
IS=1A,VGS=0V
12.7 16 mΩ
50 S
0.7 1 V
2.5 A
µA
mΩ
DYNAMIC PARAMETERS
C
iss
C
oss
C
rss
R
g
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Gate resistance
VGS=0V, VDS=20V, f=1MHz
VGS=0V, VDS=0V, f=1MHz
1200 1500 1950 pF
150 215 280 pF
80 135 190 pF
1.7 3.5 5.3 Ω
SWITCHING PARAMETERS
Qg(10V) 22 27.2 33 nC
Qg(4.5V) 10 13.6 16 nC
Q
gs
Q
gd
t
D(on)
t
r
t
D(off)
t
f
t
rr
Q
rr
A. The value of R
value in any given application depends on the user's specific board design.
B. The power dissipation PD is based on T
C. Repetitive rating, pulse width limited by junction temperature T
initialTJ=25°C.
D. The R
E. The static characteristics in Figures 1 to 6 are obtained using <300µs pulses, duty cycle 0.5% max.
F. These curves are based on the junction-to-ambient thermal impedence which is measured with the device mounted on 1in2 FR-4 board with
2oz. Copper, assuming a maximum junction temperature of T
Total Gate Charge
Total Gate Charge
Gate Source Charge
VGS=10V, VDS=20V, ID=10A
Gate Drain Charge
Turn-On DelayTime
Turn-On Rise Time
Turn-Off DelayTime
VGS=10V, VDS=20V, RL=2Ω,
R
Turn-Off Fall Time
Body Diode Reverse Recovery Time
Body Diode Reverse Recovery Charge
is measured with the device mounted on 1in2 FR-4 board with 2oz. Copper, in a still air environment with TA =25°C. The
θJA
=150°C, using ≤ 10s junction-to-ambient thermal resistance.
J(MAX)
is the sum of the thermal impedence from junction to lead R
θJA
IF=10A, dI/dt=500A/µs
IF=10A, dI/dt=500A/µs
J(MAX)
3.6 4.5 5.4 nC
3.8 6.4 9 nC
6.4 ns
17.2 ns
GEN
=3Ω
29.6 ns
16.8 ns
9
13 17 ns
25
=150°C. Ratings are based on low frequency and duty cycles to keep
J(MAX)
and lead to ambient.
θJL
=150°C. The SOA curve provides a single pulse ratin g.
35 45
nC
COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS ARE NOT AUTHORIZED. AOS DOES NOT ASSUME ANY LIABILITY ARISING
OUT OF SUCH APPLICATIONS OR USES OF ITS PRODUCTS. AOS RESERVES THE RIGHT TO IMPROVE PRODUCT DESIGN,
FUNCTIONS AND RELIABILITY WITHOUT NOTICE.
Rev 1: Nov 2010 www.aosmd.com Page 2 of 6

TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS
AO4884
120
100
80
60
(A)
D
I
40
20
0
0 1 2 3 4 5
Fig 1: On-Region Characteristics (Note E)
20
18
16
)
14
Ω
Ω
Ω
Ω
(m
12
DS(ON)
10
R
8
6
4
0 5 10 15 20
Figure 3: On-Resistance vs. Drain Current and Gate
4.5V
4V
VGS=3V
VDS (Volts)
VGS=4.5V
VGS=10V
ID (A)
Voltage (Note E)
100
VDS=5V
80
60
(A)
D
I
40
25°C
20
0
2 2.5 3 3.5 4 4.5
Figure 2: Transfer Characteristics (Note E)
1.8
1.6
1.4
1.2
1
Normalized On-Resistance
0.8
0 25 50 75 100 125 150 175
Figure 4: On-Resistance vs. Junction Temperature
VGS=10V
ID=10A
VGS(Volts)
VGS=4.5V
ID=10A
Temperature (°C)
(Note E)
17
5
2
10
0
18
25
ID=10A
20
)
Ω
Ω
Ω
Ω
(m
15
DS(ON)
R
10
5
2 4 6 8 10
Figure 5: On-Resistance vs. Gate-Source Voltage
VGS (Volts)
(Note E)
1.0E+02
1.0E+01
1.0E+00
1.0E-01
(A)
S
I
1.0E-02
1.0E-03
1.0E-04
1.0E-05
40
0.0 0.2 0.4 0.6 0.8 1.0 1.2
VSD (Volts)
Figure 6: Body-Diode Characteristics (Note E)
Rev 1: Nov 2010 www.aosmd.com Page 3 of 6

TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS
AO4884
10
VDS=20V
ID=10A
8
6
(Volts)
GS
4
V
2
0
0 5 10 15 20 25 30
Qg (nC)
Figure 7: Gate-Charge Characteristics
100
TA=25°C
TA=150°C
(A) Peak Avalanche Current
AR
I
TA=125°C
10
1 10 100 1000
Time in avalanche, tA (µµµµs)
Figure 9: Single Pulse Avalanche capability (Note
C)
TA=100°C
2500
2000
C
iss
1500
1000
Capacitance (pF)
C
500
oss
0
0 10 20 30 40
VDS (Volts)
Figure 8: Capacitance Characteristics
1000.0
100.0
R
DS(ON)
10.0
(Amps)
1.0
D
I
T
=150°C
0.1
J(Max)
TA=25°C
0.0
0.01 0.1 1 10 100
VDS (Volts)
Figure 10: Maximum Forward Biased
Safe Operating Area (Note F)
10ms
10000
TA=25°C
1000
100
Power (W)
10
1
0.00001 0.001 0.1 10 1000
Pulse Width (s)
Figure 11: Single Pulse Power Rating Junction-to-Ambient (Note F)
Rev 1: Nov 2010 www.aosmd.com Page 4 of 6

TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS
10
D=Ton/T
T
R
=90°C/W
θJA
1
In descending order
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse
0.1
Normalized Transient
Thermal Resistance
0.01
JA
θ
θ
θ
θ
Z
Single Pulse
0.001
0.00001 0.0001 0.001 0.01 0.1 1 10 100 1000
Pulse Width (s)
Figure 12: Normalized Maximum Transient Thermal Impedance (Note F)
AO4884
Rev 1: Nov 2010 www.aosmd.com Page 5 of 6

VDC
Rg
AO4884
Gate Charge Test Circuit & Waveform
Vgs
Qg
Vds
10V
Qgs
Qgd
Charge
90%
10%
+
+
Vds
DUT
VDC
-
-
Vgs
Ig
Resistive Switching Test Circuit & Waveforms
RL
Vds
Vgs
DUT
+
Vdd
VDC
-
Vgs
Vds +
Vds -
Ig
Vgs
Rg
Vgs
Isd
Vgs
Vds
Id
DUT
Vgs
t t
d(on)
r
t
on
t
t
d(off)
t
off
Unclamped Inductive Switching (UIS) Test Circuit & Waveforms
L
DUT
Vgs
E = 1/2 LI
AR
Vds
+
Vdd
VDC
-
Id
Vgs
2
AR
Diode Recovery Test Circuit & Waveforms
Q = - Idt
rr
Vgs
t
L
+
Vdd
VDC
-
Isd
Vds
I
F
dI/dt
rr
I
RM
f
BV
DSS
I
AR
Vdd
Rev 1: Nov 2010 www.aosmd.com Page 6 of 6