Datasheet AN79N24, AN79N20, AN79N18, AN79N15, AN79N12 Datasheet (Panasonic)

AN79N00 Series

3-pin Negative Output Voltage Regulator (300mA Type)

■ Overview

The AN79N00 series is 3-pin fix ed neg ati ve output v oltage regulators. Stabilized fix ed output volta ge is obtained from unstable DC input voltage without using an y external components. 12 types of output voltage are available ; –4V, –5V, –6V, –7V, –8V, –9V, –10V, –12V, –15V,

8.0

3.05

+0.5 – 0.1

Unit:mm

3.8

11.5max.15.0min.

–18V, –20V and –24V . They can be used widely in po wer circuits with current capacitance up to 300mA.

■ Features

• No external components

• Output voltage : –4V, –5V, –6V, –7V, –8V, –9V, –10V, –12V, –15V, –18V, –20V, –24V

• Short-circuit current limiting built-in

• Thermal overload protection built-in

• Output transistor safe area compensation

■ Block Diagram

1.94

0.75±0.25

0.5±0.25

2.3

4.6

123

JEDEC : TO-126 (SSIP003-P-0000E)

1.44

3.5max.

0.5±0.1

1.76

1 : Common 2 : Input 3 : Output

Starter

Voltage Reference

Thermal Protection

+ Error Amp.

–

Current Limiter

R

Q

SC

1

2

1

3

Pass Tr.

2

Common

Output

Input

■ Absolute Maximum Ratings (Ta=25˚C)

Parameter Symbol Rating Unit

1

*

Input voltage

Power dissipation Operating ambient temperature Storage temperature

*

1 AN79N04, AN79N05, AN79N06, AN79N07, AN79N08, AN79N09, AN79N10, AN79N12, AN79N15, AN79N18

*

2 AN79N20, AN79N24

*

3 Follow the derating curve, When T

exceeds 150˚C, the internal circuit cuts off the output.

j

V

I

P

D

T

opr

T

stg

–35

2

*

–40

3

*

8

–20 to +80

–55 to +150

V

V W ˚C ˚C

■ Electrical Characteristics (Ta=25˚C)

AN79N04 (–4V Type)

·

Parameter Symbol Condition min typ max Output voltage Output voltage tolerance

Line regulation

Load regulation

Bias current Input bias current fluctuation Load bias current fluctuation Output noise voltage

Ripple rejection ratio Minimum input/output voltage difference

Output short circuit current Peak output current Output voltage temperature coefficient

V V

REG

I

∆I

Bias (IN)

∆I

Bias (L)

V RR

V

DIF (min.)

I

O (Short)

I

O (Peak)

∆V

Bias

O

IN

L

no

/Ta

=25˚C

T

j

VI=–

6 to –25V, IO=5 to 200mA

=–6 to –25V, Tj=25˚C

V

I

=–7 to –17V, Tj=25˚C

V

I

=1 to 300mA, Tj=25˚C

I

O

=5 to 200mA, Tj=25˚C

I

O

=25˚C

T

j

=–7 to –25V, Tj=25˚C

V

I

=5 to 200mA, Tj=25˚C

I

O

f=10Hz to 100kHz

=–7 to –17V, IO=50mA,

V

I

f=120Hz

=200mA, Tj=25˚C

I

O

=–35V, Tj=25˚C

V

I

Tj=25˚C

=5mA

I

O

–3.84

–3.8

60

–4.16 V–4

–4.2

4

10

Note 1) The specified condition Tj=25˚C means that the test should be carried out with the test time so short (within 10ms) that the

drift in characteristic value due to the rise in chip junction temperature can be ignored.

Note 2) When not specified, VI=–9V, IO=100mA, CI=2µF, CO=1µF and Tj=0 to 125˚C

40 mV9 20 80 40

0.5

0.1

Unit

mV mV20 mV mA3

5

mA mA

µV100

mA10 mA500

mV/˚C– 0.4

V

dB

V1.1

■ Electrical Characteristics (Ta=25˚C)

AN79N05 (–5V Type)

·

Parameter Symbol Condition min typ max Output voltage Output voltage tolerance

Line regulation

Load regulation

Bias current Input bias current fluctuation Load bias current fluctuation Output noise voltage

Ripple rejection ratio Minimum input/output voltage difference

Output short circuit current Peak output current Output voltage temperature coefficient

Note 1) The specified condition T

=25˚C means that the test should be carried out with the test time so short (within 10ms) that the

j

drift in characteristic value due to the rise in chip junction temperature can be ignored.

Note 2) When not specified, VI=–10V, IO=100mA, CI=2µF, CO=1µF and Tj=0 to 125˚C

V V

REG

I

Bias

∆I

Bias (IN)

∆I

Bias (L)

V RR

V

DIF (min.)

I

O (Short)

I

O (Peak)

O

Tj=25˚C VI=–

7 to –25V, IO=5 to 200mA

VI=–7 to –25V, Tj=25˚C

IN

L

=–8 to –18V, Tj=25˚C

V

I

=1 to 300mA, Tj=25˚C

O

IO=5 to 200mA, Tj=25˚C T

=25˚C

j

VI=–8 to –25V, Tj=25˚C IO=5 to 200mA, Tj=25˚C

no

f=10Hz to 100kHz

=–8 to –18V, IO=50mA,

V

I

f=120Hz

=200mA, Tj=25˚C

I

O

=–35V, Tj=25˚C

V

I

Tj=25˚C I

=5mA

O

–4.8

–4.75

60

10

125

– 0.4

Unit

–5.2 V–5

–5.25

V

50 mV10

5

30

100

50

0.5

0.1

mV mV20 mV mA3

5

mA mA

µV

dB

V1.1 mA10 mA500

mV/˚C∆VO/Ta

AN79N06 (–6V Type)

·

Parameter Symbol Condition min typ max Output voltage Output voltage tolerance

Line regulation

Load regulation

Bias current Input bias current fluctuation Load bias current fluctuation Output noise voltage

Ripple rejection ratio Minimum input/output voltage difference

Output short circuit current Peak output current Output voltage temperature coefficient

Note 1) The specified condition T

=25˚C means that the test should be carried out with the test time so short (within 10ms) that the

j

REG

I

∆I

Bias (IN)

∆I

V RR

V

DIF (min.)

I

O (Short)

I

O (Peak)

V

O

V

O

Bias

Bias (L)

no

/Ta

O

Tj=25˚C VI=–

8 to –25V, IO=5 to 200mA

VI=–8 to –25V, Tj=25˚C

IN

L

=–9 to –19V, Tj=25˚C

V

I

=1 to 300mA, Tj=25˚C

O

IO=5 to 200mA, Tj=25˚C T

=25˚C

j

=–9 to –25V, Tj=25˚C

V

I

=5 to 200mA, Tj=25˚C

I

O

f=10Hz to 100kHz

=–9 to –19V, IO=50mA,

V

I

f=120Hz I

=200mA, Tj=25˚C

O

VI=–35V, Tj=25˚C Tj=25˚C

=5mA

I

O

drift in characteristic value due to the rise in chip junction temperature can be ignored.

Note 2) When not specified, VI=–11V, IO=100mA, CI=2µF, CO=1µF and Tj=0 to 125˚C

–5.75

–5.7

60

10

150

– 0.4

Unit

–6.25 V–6

–6.3

V

60 mV11

6

40

120

60

0.5

0.1

mV mV20 mV mA3

5

mA mA

µV

dB

V1.1 mA10 mA500

mV/˚C∆V

■ Electrical Characteristics (Ta=25˚C)

AN79N07 (–7V Type)

·

Parameter Symbol Condition min typ max Output voltage Output voltage tolerance

Line regulation

Load regulation

Bias current Input bias current fluctuation Load bias current fluctuation Output noise voltage

Ripple rejection ratio Minimum input/output voltage difference

Output short circuit current Peak output current Output voltage temperature coefficient

Note 1) The specified condition T

=25˚C means that the test should be carried out with the test time so short (within 10ms) that the

j

drift in characteristic value due to the rise in chip junction temperature can be ignored.

Note 2) When not specified, VI=–12V, IO=100mA, CI=2µF, CO=1µF and Tj=0 to 125˚C

REG

I

∆I

Bias (IN)

∆I

V RR

V

DIF (min.)

I

O (Short)

I

O (Peak)

V

O

V

O

Bias

Bias (L)

no

/Ta

O

Tj=25˚C VI=–

9 to –25V, IO=5 to 200mA

VI=–9 to –25V, Tj=25˚C

IN

L

=–10 to –20V, Tj=25˚C

V

I

=1 to 300mA, Tj=25˚C

O

IO=5 to 200mA, Tj=25˚C T

=25˚C

j

=–10 to –25V, Tj=25˚C

V

I

=5 to 200mA, Tj=25˚C

I

O

f=10Hz to 100kHz

=–10 to –20V, IO=50mA,

V

I

f=120Hz

=200mA, Tj=25˚C

I

O

VI=–35V, Tj=25˚C Tj=25˚C

=5mA

I

O

–6.7

–6.65

59

10

175

– 0.5

Unit

–7.3 V–7

–7.35

V

70 mV12

7

35

140

70

0.5

0.1

mV mV20 mV mA3

5

mA mA

µV

dB

V1.1 mA10 mA500

mV/˚C∆V

AN79N08 (–8V Type)

·

Parameter Symbol Condition min typ max Output voltage Output voltage tolerance

Line regulation

Load regulation

Bias current Input bias current fluctuation Load bias current fluctuation Output noise voltage

Ripple rejection ratio Minimum input/output voltage difference

Output short circuit current Peak output current Output voltage temperature coefficient

Note 1) The specified condition T

=25˚C means that the test should be carried out with the test time so short (within 10ms) that the

j

V V

REG

I

∆I

Bias (IN)

∆I

Bias (L)

RR

V

DIF (min.)

I

O (Short)

I

O (Peak)

Bias

O

IN

L

no

/Ta

=25˚C

T

j

VI=–

10.5 to –25V, IO=5 to 200mA

VI=–10.5 to –25V, Tj=25˚C

=–11 to –21V, Tj=25˚C

V

I

=1 to 300mA, Tj=25˚C

O

IO=5 to 200mA, Tj=25˚C T

=25˚C

j

=–10.5 to –25V, Tj=25˚C

V

I

=5 to 200mA, Tj=25˚C

I

O

f=10Hz to 100kHz

=–11.5 to –21.5V,

V

I

=50mA,f=120Hz

O

I

=200mA, Tj=25˚C

O

VI=–35V, Tj=25˚C Tj=25˚C

=5mA

I

O

drift in characteristic value due to the rise in chip junction temperature can be ignored.

Note 2) When not specified, VI=–14V, IO=100mA, CI=2µF, CO=1µF and Tj=0 to 125˚C

–7.7 –7.6

59

10

200V

– 0.6

Unit –8.3 V–8 –8.4

V

80 mV13

8

40

160

80

0.5

0.1

mV mV25 mV mA3

5

mA mA

µV

dB

V1.1 mA10 mA500

mV/˚C∆V

■ Electrical Characteristics (Ta=25˚C)

AN79N09 (–9V Type)

·

Parameter Symbol Condition min typ max Unit Output voltage Output voltage tolerance

Line regulation

Load regulation

Bias current Input bias current fluctuation Load bias current fluctuation Output noise voltage

Ripple rejection ratio Minimum input/output voltage difference

Output short circuit current Peak output current Output voltage temperature coefficient

Note 1) The specified condition T

=25˚C means that the test should be carried out with the test time so short (within 10ms) that the

j

REG

I

∆I

Bias (IN)

∆I

RR

V

DIF (min.)

I

O (Short)

I

O (Peak)

V

O

V

O

Bias

Bias (L)

no

/Ta

O

drift in characteristic value due to the rise in chip junction temperature can be ignored.

Note 2) When not specified, VI=–15V, IO=100mA, CI=2µF, CO=1µF and Tj=0 to 125˚C

Tj=25˚C VI=–

11.5 to –26V, IO=5 to 200mA

VI=–11.5 to –26V, Tj=25˚C

IN

L

=–12 to –22V, Tj=25˚C

V

I

=1 to 300mA, Tj=25˚C

O

IO=5 to 200mA, Tj=25˚C T

=25˚C

j

=–11.5 to –26V, Tj=25˚C

V

I

=5 to 200mA, Tj=25˚C

I

O

f=10Hz to 100kHz

=–12 to –22V, IO=50mA,

V

I

f=120Hz

=200mA, Tj=25˚C

I

O

VI=–35V, Tj=25˚C Tj=25˚C

=5mA

I

O

–8.65 –8.55

58

10

225V

– 0.6

–9.35 V–9 –9.45

V

80 mV14

9

50

180

90

0.5

0.1

mV mV25 mV mA3

5

mA mA

µV

dB

V1.1 mA10 mA500

mV/˚C∆V

AN79N10 (–10V Type)

·

Parameter Symbol Condition min typ max Unit Output voltage Output voltage tolerance

Line regulation

Load regulation

Bias current Input bias current fluctuation Load bias current fluctuation Output noise voltage

Ripple rejection ratio Minimum input/output voltage difference

Output short circuit current Peak output current Output voltage temperature coefficient

Note 1) The specified condition T

=25˚C means that the test should be carried out with the test time so short (within 10ms) that the

j

V V

REG

I

∆I

Bias (IN)

∆I

Bias (L)

RR

V

DIF (min.)

I

O (Short)

I

O (Peak)

Bias

O

no

T

=25˚C

j

VI=–

12.5 to –27V, IO=5 to 200mA

VI=–12.5 to –27V, Tj=25˚C

IN

L

=–13 to –23V, Tj=25˚C

V

I

=1 to 300mA, Tj=25˚C

O

IO=5 to 200mA, Tj=25˚C T

=25˚C

j

=–12.5 to –27V, Tj=25˚C

V

I

=5 to 200mA, Tj=25˚C

I

O

f=10Hz to 100kHz

=–13 to –23V,

V

I

=50mA,f=120Hz

I

O

I

=200mA, Tj=25˚C

O

VI=–35V, Tj=25˚C Tj=25˚C

=5mA

I

/Ta

O

drift in characteristic value due to the rise in chip junction temperature can be ignored.

Note 2) When not specified, VI=–16V, IO=100mA, CI=2µF, CO=1µF and Tj=0 to 125˚C

–9.6 –9.5

58

10

250V

– 0.7

–10.4 V–10 –10.5

80 mV15

50 200 100

0.5

0.1

V

mV mV25 mV mA3.0

5

mA mA

µV

dB

V1.1 mA10 mA500

mV/˚C∆V

■ Electrical Characteristics (Ta=25˚C)

AN79N12 (–12V Type)

·

Parameter Symbol Condition min typ max Unit Output voltage Output voltage tolerance

Line regulation

Load regulation

Bias current Input bias current fluctuation Load bias current fluctuation Output noise voltage

Ripple rejection ratio Minimum input/output voltage difference

Output short circuit current Peak output current Output voltage temperature coefficient

Note 1) The specified condition T

=25˚C means that the test should be carried out with the test time so short (within 10ms) that the

j

REG

I

∆I

Bias (IN)

∆I

RR

V

DIF (min.)

I

O (Short)

I

O (Peak)

V

O

V

O

Bias

Bias (L)

no

/Ta

O

drift in characteristic value due to the rise in chip junction temperature can be ignored.

Note 2) When not specified, VI=–19V, IO=100mA, CI=2µF, CO=1µF and Tj=0 to 125˚C

Tj=25˚C VI=–

14.5 to –30V, IO=5 to 200mA

VI=–14.5 to –30V, Tj=25˚C

IN

L

=–15 to –25V, Tj=25˚C

V

I

=1 to 300mA, Tj=25˚C

O

IO=5 to 200mA, Tj=25˚C T

=25˚C

j

=–14.5 to –30V, Tj=25˚C

V

I

=5 to 200mA, Tj=25˚C

I

O

f=10Hz to 100kHz

=–15 to –25V, IO=50mA,

V

I

f=120Hz

=200mA, Tj=25˚C

I

O

VI=–35V, Tj=25˚C Tj=25˚C

=5mA

I

O

–11.5 –11.4

57

10

300V

– 0.8

–12.5 V–12 –12.6

80 mV15

50 240 120

0.5

0.1

V

mV mV25 mV mA3

5

mA mA

µV

dB

V1.1 mA10 mA500

mV/˚C∆V

AN79N15 (–15V Type)

·

Parameter Symbol Condition min typ max Unit Output voltage Output voltage tolerance

Line regulation

Load regulation

Bias current Input bias current fluctuation Load bias current fluctuation Output noise voltage

Ripple rejection ratio Minimum input/output voltage difference

Output short circuit current Peak output current Output voltage temperature coefficient

Note 1) The specified condition T

=25˚C means that the test should be carried out with the test time so short (within 10ms) that the

j

REG

I

∆I

Bias (IN)

∆I

RR

V

DIF (min.)

I

O (Short)

I

O (Peak)

V

O

V

O

Bias

Bias (L)

no

/Ta

O

T

=25˚C

j

VI=–

17.5 to –30V, IO=5 to 200mA

VI=–17.5 to –30V, Tj=25˚C

IN

L

=–18 to –28V, Tj=25˚C

V

I

=1 to 300mA, Tj=25˚C

O

IO=5 to 200mA, Tj=25˚C T

=25˚C

j

=–17.5 to –30V, Tj=25˚C

V

I

=5 to 200mA, Tj=25˚C

I

O

f=10Hz to 100kHz

=–18 to –28V, IO=50mA,

V

I

f=120Hz I

=200mA, Tj=25˚C

O

VI=–35V, Tj=25˚C Tj=25˚C

=5mA

I

O

drift in characteristic value due to the rise in chip junction temperature can be ignored.

Note 2) When not specified, VI=–23V, IO=100mA, CI=2µF, CO=1µF and Tj=0 to 125˚C

–14.4

–14.25

56

11

10

375V

–0.9

–15.6 V–15

–15.75

80 mV16

50 240 120

0.5

0.1

V

mV mV25 mV mA3

5

mA mA

µV

dB

V1.1 mA10 mA500

mV/˚C∆V

■ Electrical Characteristics (Ta=25˚C)

AN79N18 (–18V Type)

·

Parameter Symbol Condition min typ max Unit Output voltage Output voltage tolerance

Line regulation

Load regulation

Bias current Input bias current fluctuation Load bias current fluctuation Output noise voltage

Ripple rejection ratio Minimum input/output voltage difference

Output short circuit current Peak output current Output voltage temperature coefficient

Note 1) The specified condition T

=25˚C means that the test should be carried out with the test time so short (within 10ms) that the

j

REG

I

∆I

Bias (IN)

∆I

RR

V

DIF (min.)

I

O (Short)

I

O (Peak)

V

O

V

O

Bias

Bias (L)

no

/Ta

O

drift in characteristic value due to the rise in chip junction temperature can be ignored.

Note 2) When not specified, VI=–27V, IO=100mA, CI=2µF, CO=1µF and Tj=0 to 125˚C

Tj=25˚C VI=–

21 to –33V, IO=5 to 200mA

VI=–21 to –33V, Tj=25˚C

IN

L

=–21 to –32V, Tj=25˚C

V

I

=1 to 300mA, Tj=25˚C

O

IO=5 to 200mA, Tj=25˚C T

=25˚C

j

=–21 to –33V, Tj=25˚C

V

I

=5 to 200mA, Tj=25˚C

I

O

f=10Hz to 100kHz

=–22 to –32V, IO=50mA,

V

I

f=120Hz

=200mA, Tj=25˚C

I

O

VI=–35V, Tj=25˚C Tj=25˚C

=5mA

I

O

–17.3 –17.1

55

–18.7 V–18 –18.9

V

80 mV18

13

50

300

10

150

0.5

0.1

450V

mV mV30 mV mA3

5

mA mA

µV

dB

V1.1 mA10 mA500

–1

mV/˚C∆V

AN79N20 (–20V Type)

·

Parameter Symbol Condition min typ max Unit Output voltage Output voltage tolerance

Line regulation

Load regulation

Bias current Input bias current fluctuation Load bias current fluctuation Output noise voltage

Ripple rejection ratio Minimum input/output voltage difference

Output short circuit current Peak output current Output voltage temperature coefficient

Note 1) The specified condition T

=25˚C means that the test should be carried out with the test time so short (within 10ms) that the

j

V

REG

I

∆I

Bias (IN)

∆I

Bias (L)

RR

V

DIF (min.)

I

O (Short)

I

O (Peak)

Bias

O

no

/Ta

T

=25˚C

j

VI=–

23 to –35V, IO=5 to 200mA

VI=–23 to –35V, Tj=25˚C

IN

L

=–24 to –34V, Tj=25˚C

V

I

=1 to 300mA, Tj=25˚C

O

IO=5 to 200mA, Tj=25˚C T

=25˚C

j

=–23 to –35V, Tj=25˚C

V

I

=5 to 200mA, Tj=25˚C

I

O

f=10Hz to 100kHz

=–24 to –34V, IO=50mA,

V

I

f=120Hz

=200mA, Tj=25˚C

I

O

VI=–35V, Tj=25˚C Tj=25˚C

=5mA

I

O

drift in characteristic value due to the rise in chip junction temperature can be ignored.

Note 2) When not specified, VI=–29V, IO=100mA, CI=2µF, CO=1µF and Tj=0 to 125˚C

–19.2

–19

54

–20.8 V–20

–21

V

80 mV19

14

70

300

10

150

0.5

0.1

500V

mV mV30 mV mA3

5

mA mA

µV

dB

V1.1 mA10 mA500

–1

mV/˚C∆V

■ Electrical Characteristics (Ta=25˚C)

AN79N24 (–24V Type)

·

Parameter Symbol Condition min typ max Unit Output voltage Output voltage tolerance

Line regulation

Load regulation

Bias current Input bias current fluctuation Load bias current fluctuation Output noise voltage

Ripple rejection ratio Minimum input/output voltage difference

Output short circuit current Peak output current Output voltage temperature coefficient

Note 1) The specified condition T

=25˚C means that the test should be carried out with the test time so short (within 10ms) that the

j

V V

REG

I

∆I

Bias (IN)

∆I

Bias (L)

RR

V

DIF (min.)

I

O (Short)

I

O (Peak)

Bias

O

no

/Ta

drift in characteristic value due to the rise in chip junction temperature can be ignored.

Note 2) When not specified, VI=–33V, IO=100mA, CI=2µF, CO=1µF and Tj=0 to 125˚C

Tj=25˚C VI=–

27 to –38V, IO=5 to 200mA

VI=–27 to –38V, Tj=25˚C

IN

L

=–27 to –37V, Tj=25˚C

V

I

=1 to 300mA, Tj=25˚C

O

IO=5 to 200mA, Tj=25˚C T

=25˚C

j

=–27 to –38V, Tj=25˚C

V

I

=5 to 200mA, Tj=25˚C

I

O

f=10Hz to 100kHz

=–28 to –38V, IO=50mA,

V

I

f=120Hz

=200mA, Tj=25˚C

I

O

VI=–35V, Tj=25˚C Tj=25˚C

=5mA

I

O

–23

–22.8

54

–25 V–24

–25.2

V

80 mV20

15

70

300

10

150

0.5

0.1

600V

mV mV30 mV mA3

5

mA mA

µV

dB

V1.1 mA10 mA500

–1

mV/˚C∆V

■ Basic Regulator Circuit ■ A pplication Circuit

–V

I

Input

Output

–V

O

AN79N00

–

C

I

+

Common

–

C

O

+

CI is connected when the input line is long. 2µF CO improves the transient response. 1µF

–V

Input Output

I

AN79N00

–

2µF

Common

+

|IO| = + I

–

1µF

V

´

O

I

Q

´

V

O

Q

R

+

I

O

■ Characteristic Curve

PD –Ta

10

(1) Infinite Heat Sink (2) 5˚C/W Heat Sink

8

(W)

D

6

4

2

Power Dissipation P

0

0 40 80 120 160

(3) 15˚C/W Heat Sink (4) No Heat Sink

(1)

(2)

(3)

(4)

Ambient Temperature Ta (˚C)

Input Transient Response

AN79N05

V

(V)

1.4

DIF (min.)

1.2

1.0

0.8

0.6

0.4 –50 0 50 100 150

Minimum Input/Output Voltage Difference V

Junction Temperature Tj (˚C)

DIF (min.)

I

O

=100mA

I

O

=50mA

I

O

=5mA

IO=300mA

– T

AN79N05

j

Load Transient Response

20

(A)

I

15

10

AN79N05

0.6

0.3

(V)

I

10

0

–10

–20

0246810

Output Voltage Fluctuation (mV)

Time t (µs)

RR– f

120

100

80

60

40

20

Ripple Rejection Ratio RR (dB)

AN79N05 I

=50mA

O

Input Current V

5

1

0

–1

–2

0 1020304050

Output Voltage Fluctuation (mV)

Time t (µs)

0

Load Current V

0

10 100

1k 10k 100k

Frequency f (Hz)