preprograms and erases the entire chip or any
combination of designated sectors
— Embedded Program algorithm automatically
writes and verifies data at specified addresses
■ Minimum 1,000,000 write cycle guarantee per
sector
■ Package option
— 48-ball FBGA
— 48-pin TSOP
— 44-pin SO
■ Compatibility with JEDEC standards
— Pinout and software compatible with single-
power supply Flash
— Superior inadvertent write protection
■ Data# Polling and toggle bits
— Provides a software method of detecting
program or erase operation completion
■ Ready/Busy# pin (RY/BY#)
— Provides a hardware method of detecting
program or erase cycle completion
■ Erase Suspend/Erase Resume
— Suspends an erase operati on to read dat a from,
or program data to, a sector that is not being
erased, then resumes the erase operation
■ Hardware reset pin (RESET#)
— Hardware method to reset the de vi ce to reading
array data
This document contains information on a product under development at Advanced Micro Devices. The information
is intended to help you ev aluate this product. AMD reserves the right to change or dis continue work on thi s proposed
product without notice.
Publication# 21523 Rev: A Amendment/0
Issue Date: January 1998
Page 2
ADVANCE INFORMATION
GENERAL DESCRIPTION
The Am29LV400B is a 4 Mbit, 3.0 volt-only Flash
memory organized as 524,288 bytes or 262,144 words.
The device is offered in 48-ball FBGA, 44-pin SO, and
48-pin TSOP packages. The wor d-wide data (x16)
appears on DQ 15–DQ0; the byte-wide (x8) data
appears on DQ7–DQ0. This device is designed to be
programmed in-system using only a single 3.0 volt V
supply. No VPP is required for write or erase operations. The device can also be programmed in standard
EPROM programmers.
This device is manufactured usin g AMD’s 0.35 µm
process technology, and offers all the features and
benefits of the Am29LV400, which was manufactured
using 0.5 µm process technology. In addition, the
Am29LV400B features unlock bypass programming
and in-system sector protection/unprotection.
The standard device offers access times of 70, 80, 90
and 120 ns, allowing high speed microprocessors to
operate without wait s tates. To el iminate bus contention the device has separate chip enable (CE#), write
enable (WE#) and output enable (OE#) controls.
The device requires only a single 3. 0 v o lt po wer sup-ply for both read and write functions. Internally generated and regulated voltages are provided for the
program and erase operations.
The device is entirely command set compatible with the
JEDEC single-power-supply Flash standard. Commands are written to the command regis ter using
standard micropr ocessor wri te timings. Register co ntents serve as input to an internal state-machine that
controls the erase and programming circuitry. Write
cycles also internally latch addresses and data needed
for the programming and erase operations. Reading
data out of the device is similar to reading from other
Flash or EPROM devices.
Device programming occurs by executing the program
command sequence. This initiates the EmbeddedProgram algorithm—an internal algorithm that automatically times the program pulse widths and verifies
proper cell margin. The Unlock Bypass mode facilitates faster programming times by requir ing only two
write cycles to program data instead of four.
Device erasure occurs by executing the erase command sequence. This initiates the Embedded Erase
algorithm—an internal algorithm that automatically pre-
CC
programs the array (if it is not already progra mmed) before executing the erase operation. During erase, the
device automatically tim es the erase pulse widths and
verifies proper cell margin.
The host system can detect whether a program or
erase operation is complete by observing the RY/BY#
pin, or by reading the DQ7 (Data# Polling) and DQ6
(toggle) status bits. After a program or erase cycle
has been completed, the device is ready to read array
data or accept another command.
The sector erase ar chitecture allo ws memo ry secto rs
to be erased and reprogrammed without affecting the
data contents of other sectors. The device is fully
erased when shipped from the factory.
Hardware data protection meas ures include a low
detector that automatically in hibits write opera-
V
CC
tions during power transitions. The hardware sector
protection feature disables both program and erase
operations in any combination of the sectors of memory. This can be achieved in-system or via programming equipment.
The Erase Suspend feature enables the user to put
erase on hold for any period of time to read data from,
or program data to, any sector that is not selected for
erasure. True background erase can thus be achieved.
The hardware RESET# pi n terminates any operation
in progress and resets the internal state machine to
reading array dat a. The RESET# pin ma y be tied to the
system reset circuitry. A system reset would thus also
reset the device, enabling the system microprocessor
to read the boot-up firmware from the Flash memory.
The device offers two power-saving features. When
addresses have been stable for a specified amount of
time, the device enters the automatic sleep m ode.
The system can also place the de vice into the standbymode. Power consumption is greatly reduced in both
these modes.
AMD’s Flash technology combines years of Flash
memory manufacturing experience to produce the
highest levels of quality, reliability and cost effectiveness. The device electrically erases all b its wit hin
a sector simultaneously via Fowler-Nordheim tunneling. The data is programmed using hot electron
injection.
1/29/98Am29LV400B2
Page 3
ADVANCE INFORMATION
PRODUCT SELECTOR GUIDE
Family Part NumberAm29LV400B
Speed Options
Max access time, ns (t
Max CE# access time, ns (tCE)708090120
Max OE# access time, ns (tOE)30303550
Regulated Voltage Range: VCC =3.0–3.6 V70R
Full Voltage Range: VCC = 2.7–3.6 V8090120
)708090120
ACC
Note: See “AC Characteristics” for full specifications.
Flash memory devices in FBGA packages may be
damaged if exposed to ultrasonic cleaning methods.
The package and/or data integrity may be
compromised if the package bod y is ex posed to
temperatures above 150°C for prolonged periods of
time.
LOGIC SYMBOL
18
A0–A17
DQ0–DQ15
(A-1)
CE#
OE#
WE#
RESET#
BYTE#RY/BY#
16 or 8
21523A-4
V
SS
= Device ground
NC= Pin not connected internally
1/29/98Am29LV400B6
Page 7
ADVANCE INFORMATION
ORDERING INFORMATION
Standard Pr od ucts
AMD standard products are available in s everal packages and operating ranges. The order number (Valid Combination) is formed by a combination of the elements below.
CE70RAm29LV400BT
OPTIONAL PROCESSING
Blank = Standard Processing
B = Burn-in
(Contact an AMD representative for more information)
TEMPERATURE RANGE
C=Commercial (0°C to +70°C)
I = Industrial (–40°C to +85°C)
E = Extended (–55°C to +125°C)
PACKAGE TYPE
E= 48-Pin Thin Small Outline Package (TSOP)
Standard Pinout (TS 048)
F= 48-Pin Thin Small Outline Package (TSOP)
Reverse Pinout (TSR048)
S= 44-Pin Small Outline Package (SO 044)
WA = 48-ball Fine Pitch Ball Grid Array (FBGA)
0.80 mm pitch, 6 x 8 mm package
SPEED OPTION
See Product Selector Guide and Valid Combinations
BOOT CODE SECTOR ARCHITECTURE
T = Top Sector
B = Bottom Sector
DEVICE NUMBER/DESCRIPTION
Am29LV400B
4 Megabit (512 K x 8-Bit/256 K x 16-Bit) CMOS Flash Memory
Valid Combinations list configurations planned to be supported in volume for this device. Consult the local AMD sales
office to confirm availability of specific valid combinations and
to check on newly released combinations.
7Am29LV400B
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