Complete rate gyroscope on a single chip
Z-axis (yaw rate) response
High vibration rejection over wide frequency
2000 g pow
Ratiometric to referenced supply
5 V single-supply operation
105°C operation
Self-test on digital command
Ultrasmall and light (< 0.15 cc, < 0.5 gram)
Temperature sensor output
RoHS compliant
APPLICATIONS
Vehicle chassis rollover sensing
Inertial measurement units
Platform stabilization
ered shock survivability
GENERAL DESCRIPTION
The ADXRS610 is a complete angular rate sensor (gyroscope)
that uses the Analog Devices, Inc. surface-micromachining
process to create a functionally complete and low cost angular
rate sensor integrated with all required electronics on one chip.
The manufacturing technique for this device is the same high
volume BiMOS process used for high reliability automotive
airbag accelerometers.
The output signal, RATEOUT (1B, 2A), is a voltage proportional
angular rate about the axis normal to the top surface of the
to
package. The output is ratiometric with respect to a provided
reference supply. A single external resistor can be used to lower
the scale factor. An external capacitor sets the bandwidth. Other
external capacitors are required for operation.
A temperature output is provided for compensation techniques.
T
wo digital self-test inputs electromechanically excite the sensor
to test proper operation of both the sensor and the signal
conditioning circuits. The ADXRS610 is available in a 7 mm ×
7 mm × 3 mm BGA ceramic package.
FUNCTIONAL BLOCK DIAGRAM
+5
(ADC REF)
ADXRS610
100nF
+5V
AV
CC
100nF
AGND
+5V
V
DD
100nF
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Anal og Devices for its use, nor for any infringements of patents or ot her
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
Clockwise rotation is positive output
Full-scale range over specifications range ±300 °/sec
−40°C to +105°C 5.52 6 6.48 mV/°/sec
±2 %
TA ≤ 25°C
0.01 2500 Hz
ST1 pin from Logic 0 to Logic 1 −650 −450 −250 mV
−5
@25°C, V
= 5 V 9
RATIO
−40 +105 °C
.
RATIO
. Reducing bandwidth below 0.01 Hz does not reduce noise further.
OUT
is ratiometric to V
TEMP
. See the Tem section for more details. perature Output and Calibration
RATIO
= 0.01 µF),
OUT
ADXRS610BBGZ
Min Typ Max
0.05
+5
25
25
Unit
°/sec/√Hz
%
mV/°C
kΩ
kΩ
Rev. 0 | Page 3 of 12
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ADXRS610
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ABSOLUTE MAXIMUM RATINGS
Table 2.
Parameter Rating
Acceleration (Any Axis, 0.5 ms)
Unpowered 2000 g
Powered 2000 g
V
AV
DD,
CC
V
AVCC
RATIO
−0.3 V to +6.0 V
ST1, ST2 AVCC
Output Short-Circuit Duration
Indefinite
(Any Pin to Common)
Operating Temperature Range −55°C to +125°C
Storage Temperature Range −65°C to +150°C
Stresses above those listed under the Absolute Maximum
Ratings may cause permanent damage to the device. This is a
stress rating only; functional operation of the device at these or
any other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
RATE SENSITIVE AXIS
The ADXRS610 is a Z-axis rate-sensing device (also called a
yaw rate sensing device). It produces a positive going output
voltage for clockwise rotation about the axis normal to the
package top, that is, clockwise when looking down at the
package lid.
RATE
AXIS
LONGITUDI NAL
AXIS
ABCDG
A1
EF
LATERAL AXIS
Figure 2. RATEOUT Signal Increa
ESD CAUTION
RATE OUT
VCC = 5V
+
7
1
GND
/2
V
RATIO
2
RATIO
ses with Clockwise Rotation
4.75V
4.75
RATE IN
0.25V
06520-002
Drops onto hard surfaces can cause shocks of greater than
g and can exceed the absolute maximum rating of the
2000
device. Exercise care during handling to avoid damage.
Figure 19. Typical Shift in 90 sec Null Averages Accumulated
ov
er 140 Hours
0.10
0.05
0
(°/sec)
–0.05
–400
02
Figure 17. Typical High g (2500 g) Sho
020050
(ms)
ck Response
5015010
06520-016
–0.10
036001800120030002400600
Figure 20. Typical Shift in Short Term Null (Bandwidth = 1 Hz)
(Sensor Bandwidth = 40 Hz)
1
0.1
(°/sec rms)
0.01
0.001
0.010.1100k10k1k100101
AVERAGE TI ME (Secon ds)
Figure 18. Typical Root Allan Deviation at 25°C vs. Averaging Time
06520-017
0.1
0.01
(°/sec/ Hz rms)
0.001
0.0001
10100k1k100
Figure 21. Typical Noise Spectral Density (Bandwidth = 40 Hz)
TIME (Seconds)
(Hz)
10k
06520-019
06520-020
Rev. 0 | Page 8 of 12
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ADXRS610
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)
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THEORY OF OPERATION
The ADXRS610 operates on the principle of a resonator gyro.
Two polysilicon sensing structures each contain a dither frame
that is electrostatically driven to resonance, producing the
necessary velocity element to produce a Coriolis force during
angular rate. At two of the outer extremes of each frame,
orthogonal to the dither motion, are movable fingers that are
placed between fixed pickoff fingers to form a capacitive pickoff
structure that senses Coriolis motion. The resulting signal is fed
to a series of gain and demodulation stages that produce the
electrical rate signal output. The dual-sensor design rejects
external g-forces and vibration. Fabricating the sensor with the
signal conditioning electronics preserves signal integrity in
noisy environments.
The electrostatic resonator requires 18 V to 20 V for operation.
B
ecause only 5 V are typically available in most applications, a
charge pump is included on-chip. If an external 18 V to 20 V
supply is available, the two capacitors on CP1 through CP4 can
be omitted and this supply can be connected to CP5 (Pin 6D,
Pin 7D). Note that CP5 should not be grounded when power is
applied to the ADXRS610. Although no damage occurs, under
certain conditions the charge pump may fail to start up after the
ground is removed without first removing power from the
ADXRS610.
SETTING BANDWIDTH
External Capacitor C
chip R
resistor to create a low-pass filter to limit the
OUT
bandwidth of the ADXRS610 rate response. The –3 dB
frequency set by R
=
f
O
UT
()
and can be well controlled because R
during manufacturing to be 180 kΩ ±1%. Any external resistor
applied between the RATEOUT pin (1B, 2A) and SUMJ pin
(1C, 2C) results in
R
=
O
UT
()
In general, an additional hardware or software filter is added to
ttenuate high frequency noise arising from demodulation
a
spikes at the gyro’s 14 kHz resonant frequency (the noise spikes
at 14 kHz can be clearly seen in the power spectral density
curve shown in
rner frequency is set to greater than 5× the required
co
Figure 21). Typically, this additional filter’s
bandwidth to preserve good phase response.
is used in combination with the on-
OUT
π2
OUT
k180
k180
and C
1
R
×
+
is
OUT
CR
×××
OUTOUT
has been trimmed
OUT
EXT
R
EXT
0.1
0.01
0.001
0.0001
(°/sec/ Hz rms)
0.00001
0.000001
10100k1k100
(Hz)
Figure 22. Noise Spectral Density with Additional 250 Hz Filter
10k
6520-021
TEMPERATURE OUTPUT AND CALIBRATION
It is common practice to temperature-calibrate gyros to improve
their overall accuracy. The ADXRS610 has a temperature proportional voltage output that provides input to such a calibration
method. The temperature sensor structure is shown in
Figure
23. The temperature output is characteristically nonlinear, and
a
ny load resistance connected to the TEMP output results in
decreasing the TEMP output and temperature coefficient.
Therefore, buffering the output is recommended.
The voltage at the TEMP pin (3F, 3G) is nominally 2.5 V at
25°C, an
d V
= 5 V. The temperature coefficient is ~9 mV/°C
RATIO
at 25°C. Although the TEMP output is highly repeatable, it has
only modest absolute accuracy.
RATIO
R
FIXEDRTEMP
Figure 23. ADXRS610 Temperature Sensor Structure
V
TEMP
6520-022
CALIBRATED PERFORMANCE
Using a 3-point calibration technique, it is possible to calibrate
the null and sensitivity drift of the ADXRS610 to an overall
accuracy of nearly 200°/hour. An overall accuracy of 40°/hour
or better is possible using more points.
Limiting the bandwidth of the device reduces the flat-band
n
oise during the calibration process, improving the
measurement accuracy at each calibration point.
Figure 22 shows the effect of adding a 250 Hz filter to the
o
utput of an ADXRS610 set to 40 Hz bandwidth (as shown in
Figure 21). High frequency demodulation artifacts are
a
ttenuated by approximately 18 dB.
Rev. 0 | Page 9 of 12
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ADXRS610
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ADXRS610 AND SUPPLY RATIOMETRICITY
The ADXRS610 RATEOUT and TEMP signals are ratiometric
to the V
temperature outputs are proportional to V
ADXRS610 is most easily used with a supply-ratiometric ADC
that results in self-cancellation of errors due to minor supply
variations. There is some small error due to nonratiometric
behavior. Typical ratiometricity error for null, sensitivity, selftest, and temperature output is outlined in
Note that V
Table 3. Ratiometricity Error for Various Parameters
Parameter VS = V
ST1
Mean −0.4% −0.3%
Sigma 0.6% 0.6%
ST2
Mean −0.4% −0.3%
Sigma 0.6% 0.6%
Null
Mean −0.04% −0.02%
Sigma 0.3% 0.2%
Sensitivity
Mean 0.03% 0.1%
Sigma 0.1% 0.1%
V
TEMP
Mean −0.3% −0.5%
Sigma 0.1% 0.1%
NULL ADJUSTMENT
The nominal 2.5 V null is for a symmetrical swing range at
RATEOUT (1B, 2A). However, a nonsymmetrical output swing
voltage, that is, the null voltage, rate sensitivity, and
RATIO
. Thus, the
RATIO
Tabl e 3.
must never be greater than AV
RATIO
= 4.75 V VS = V
RATIO
CC.
RATIO
= 5.25 V
may be suitable in some applications. Null adjustment is
possible by injecting a suitable current to SUMJ (1C, 2C). Note
that supply disturbances may reflect some null instability.
Digital supply noise should be avoided particularly in this case.
SELF-TEST FUNCTION
The ADXRS610 includes a self-test feature that actuates each of
the sensing structures and associated electronics as if subjected
to angular rate. It is activated by standard logic high levels
applied to Input ST1 (5F, 5G), Input ST2 (4F, 4G), or both. ST1
causes the voltage at RATEOUT to change about –0.5 V, and
ST2 causes an opposite change of +0.5 V. The self-test response
follows the viscosity temperature dependence of the package
atmosphere, approximately 0.25%/°C.
Activating both ST1 and ST2 simultaneously is not damaging.
S
T1 and ST2 are fairly closely matched (±5%), but actuating
both simultaneously may result in a small apparent null bias
shift proportional to the degree of self-test mismatch.
ST1 and ST2 are activated by applying a voltage equal to V
RATIO
to the ST1 and ST2 pins. The voltage applied to ST1 and ST2
must never be greater than AV
.
CC
CONTINUOUS SELF-TEST
The on-chip integration of the ADXRS610 gives it higher reliability
than is obtainable with any other high volume manufacturing
method. In addition, it is manufactured under a mature BiMOS
process with field-proven reliability. As an additional failure
detection measure, a power-on self-test can be performed.
However, some applications may warrant continuous self-test
while sensing rate. Details outlining continuous self-test
techniques are also available in a separate application note.
Rev. 0 | Page 10 of 12
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ADXRS610
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OUTLINE DIMENSIONS
7.05
6.85 SQ
6.70
76543
*
A1 CORNER
INDEX AREA
21
A
B
C
D
E
F
G
3.30 MAX
2.50 MIN
COPLANARIT Y
0.15
060506-A
3.80 MAX
A1 BALL PAD
INDICATOR
4.80
TOP VIEW
DETAIL A
*
BALL A1 IDENTIFIER IS GOLD PLATED AND CONNECTED
TO THE D/A PAD INTERNALL Y VIA HOLE S.
BSC SQ
0.60
0.25
SEATING
PLANE
0.80 BSC
(BALL PITCH)
DETAIL A
0.60
0.55
0.50
BALL DIAMETER
B
T
O
T
M
O
W
V
IE
Figure 24. 32-Lead Ceramic Ball Grid Array [CBGA]
(BG-32-
3)
Dimensions shown in millimeters
ORDERING GUIDE
Model Temperature Range Package Description Package Option