4 mm × 4 mm × 1.45 mm LFCSP
Low power: 350 μA typical
Single-supply operation: 1.8 V to 3.6 V
10,000 g shock survival
Excellent temperature stability
Bandwidth adjustment with a single capacitor per axis
RoHS/WEEE lead-free compliant
APPLICATIONS
Cost-sensitive, low power, motion- and tilt-sensing applications
Mobile devices
Gaming systems
Disk drive protection
Image stabilization
Sports and health devices
Accelerometer
ADXL327
GENERAL DESCRIPTION
The ADXL327 is a small, low power, complete 3-axis accelerometer
with signal conditioned voltage outputs. The product measures
acceleration with a minimum full-scale range of ±2 g. It can
measure the static acceleration of gravity in tilt-sensing
applications, as well as dynamic acceleration, resulting from
motion, shock, or vibration.
The user selects the bandwidth of the accelerometer using
the C
, CY, and CZ capacitors at the X
X
Bandwidths can be selected to suit the application with a
range of 0.5 Hz to 1600 Hz for X and Y axes and a range of
0.5 Hz to 550 Hz for the Z axis.
The ADXL327 is available in a small, low profile, 4 mm ×
4 mm × 1.45 mm, 16-lead, plastic lead frame chip scale package
(LFCSP_LQ).
OUT
, Y
OUT
, and Z
OUT
pins.
FUNCTIONAL BLOCK DIAGRAM
+3
V
S
ADXL327
OUTPUT AMP
3-AXIS
SENSOR
C
DC
COMST
AC AMPDEMOD
Figure 1.
OUTPUT AMP
OUTPUT AMP
~32kΩ
~32kΩ
~32kΩ
X
OUT
C
X
Y
OUT
C
Y
Z
OUT
C
Z
7949-001
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
TA = 25°C, VS = 3 V, CX = CY = CZ = 0.1 µF, acceleration = 0 g, unless otherwise noted. All minimum and maximum specifications are
guaranteed. Typical specifications are not guaranteed.
Table 1.
Parameter Conditions Min Typ Max Unit
SENSOR INPUT Each axis
Measurement Range ±2 ±2.5
Nonlinearity Percent of full scale ±0.2 %
Package Alignment Error ±1 Degrees
Interaxis Alignment Error ±0.1 Degrees
Cross Axis Sensitivity1 ±1 %
SENSITIVITY (RATIOMETRIC)2 Each axis
Sensitivity at X
Sensitivity Change Due to Temperature3 V
OUT
, Y
, Z
V
OUT
OUT
= 3 V 378 420 462 mV/g
S
= 3 V ±0.01 %/°C
S
ZERO g BIAS LEVEL (RATIOMETRIC)
0 g Voltage at X
0 g Voltage at Z
, Y
V
OUT
OUT
V
OUT
= 3 V 1.3 1.5 1.7 V
S
= 3 V 1.2 1.5 1.8 V
S
0 g Offset vs. Temperature ±1 mg/°C
NOISE PERFORMANCE
Noise Density X
OUT
, Y
OUT, ZOUT
250 μg/√Hz rms
FREQUENCY RESPONSE4
Bandwidth X
Bandwidth Z
R
Tolerance 32 ± 15% kΩ
FILT
5
, Y
OUT
OUT
No external filter 1600 Hz
OUT
5
No external filter 550 Hz
Sensor Resonant Frequency 5.5 kHz
SELF TEST6
Logic Input Low +0.6 V
Logic Input High +2.4 V
ST Actuation Current +60 μA
Output Change at X
Output Change at Y
Output Change at Z
Self test 0 to 1 −210 −450 −850 mV
OUT
Self test 0 to 1 +210 +450 +850 mV
OUT
Self test 0 to 1 +210 +770 +1400 mV
OUT
OUTPUT AMPLIFIER
Output Swing Low No load 0.1 V
Output Swing High No load 2.8 V
POWER SUPPLY
Operating Voltage Range 1.8 3.6 V
Supply Current VS = 3 V 350 μA
Turn-On Time7 No external filter 1 ms
TEMPERATURE
Operating Temperature Range −40 +85 °C
1
Defined as coupling between any two axes.
2
Sensitivity is essentially ratiometric to VS.
3
Defined as the output change from ambient-to-maximum temperature or ambient-to-minimum temperature.
4
Actual frequency response controlled by user-supplied external filter capacitors (CX, CY, CZ).
5
Bandwidth with external capacitors = 1/(2 × π × 32 kΩ × C). For CX, CY = 0.003 μF, bandwidth = 1.6 kHz. For CZ = 0.01 μF, bandwidth = 500 Hz. For CX, CY, CZ = 10 μF,
bandwidth = 0.5 Hz.
6
Self test response changes cubically with VS.
7
Turn-on time is dependent on CX, CY, CZ and is approximately 160 × CX or CY or CZ + 1 ms, where CX, CY, CZ are in μF.
g
Rev. 0 | Page 3 of 16
Page 4
ADXL327
http://www.BDTIC.com/ADI
ABSOLUTE MAXIMUM RATINGS
Table 2.
Parameter Rating
Acceleration (Any Axis, Unpowered) 10,000 g
Acceleration (Any Axis, Powered) 10,000 g
VS −0.3 V to +3.6 V
All Other Pins (COM − 0.3 V) to (VS + 0.3 V)
Output Short-Circuit Duration
(Any Pin to Common)
Temperature Range (Powered) −55°C to +125°C
Temperature Range (Storage) −65°C to +150°C
Indefinite
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION
Rev. 0 | Page 4 of 16
Page 5
ADXL327
http://www.BDTIC.com/ADI
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
S
V
14
ADXL327
TOP VIEW
+Z
+X
S
NC
13
12
X
OUT
11
+Y
NC
10
Y
OUT
9
NC
NC
COM
NC
1
2
ST
3
4
NC15V
16
(Not to Scale)
5678
COM
COM
NC = NO CONNECT
OUT
COM
Z
07949-003
Figure 2. Pin Configuration
Table 3. Pin Function Descriptions
Pin No. Mnemonic Description
1 NC No Connect (or Optionally Ground)
2 ST Self Test
3 COM Common
4 NC No Connect
5 COM Common
6 COM Common
7 COM Common
8 Z
Z Channel Output
OUT
9 NC No Connect (or Optionally Ground)
10 Y
Y Channel Output
OUT
11 NC No Connect
12 X
X Channel Output
OUT
13 NC No Connect
14 V
S
Supply Voltage (1.8 V to 3.6 V)
15 VS Supply Voltage (1.8 V to 3.6 V)
16 NC No Connect
EP Exposed pad Not internally connected. Solder for mechanical integrity.
Rev. 0 | Page 5 of 16
Page 6
ADXL327
A
A
A
A
A
A
http://www.BDTIC.com/ADI
TYPICAL PERFORMANCE CHARACTERISTICS
N > 1000 for all typical performance plots, unless otherwise noted.
Figure 14. Z-Axis Zero g Bias vs. Temperature, Eight Parts Soldered to PCB
Rev. 0 | Page 7 of 16
Page 8
ADXL327
A
A
A
http://www.BDTIC.com/ADI
60
50
40
TION (%)
30
POPUL
20
10
0
0.38 0.39 0.40 0.41 0.42 0.43 0.44 0.45 0.46
SENSITIVITY (V/
g
)
Figure 15. X-Axis Sensitivity at 25°C, VS = 3 V
70
60
50
40
TION (%)
30
POPUL
20
10
07949-017
0.46
N = 8
0.45
0.44
0.43
0.42
0.41
SENSITIVITY (V/g)
0.40
0.39
0.38
–30–40–20 –10 0 10 20 30 40 50 60 70 80 90
TEMPERATURE (°C)
07949-020
Figure 18. X-Axis Sensitivity vs. Temperature,
Eight Parts Soldered to PCB, V
0.46
N = 8
0.45
0.44
0.43
0.42
0.41
SENSITIVITY (V/g)
0.40
0.39
= 3 V
S
0
0.38 0.39 0.40 0.41 0.42 0.43 0.44 0.45 0.46
g
SENSITIVITY (V/
)
Figure 16. Y-Axis Sensitivity at 25°C, VS = 3 V
60
50
40
TION (%)
30
POPUL
20
10
0
0.38 0.39 0.40 0.41 0.42 0.43 0.44 0.45 0.46
SENSITIVITY (V/g)
Figure 17. Z-Axis Sensitivity at 25°C, VS = 3 V
0.38
–40–30–20–100 102030405060708090
07949-018
TEMPERATURE (°C)
07949-021
Figure 19. Y-Axis Sensitivity vs. Temperature,
Eight Parts Soldered to PCB, V
0.46
N = 8
0.45
0.44
0.43
0.42
0.41
SENSITIVITY (V/g)
0.40
0.39
0.38
–40 –30 –20 –10 0 10 20 30 40 50 60 70 80 90
7949-019
TEMPERATURE (°C)
= 3 V
S
07949-022
Figure 20. Z-Axis Sensitivity vs. Temperature,
Eight Parts Soldered to PCB, V
= 3 V
S
Rev. 0 | Page 8 of 16
Page 9
ADXL327
http://www.BDTIC.com/ADI
600
CH4: Z
, 500mV/DIV
500
400
CH3: Y
CH2: X
OUT
, 500mV/DIV
OUT
, 500mV/DIV
OUT
300
CURRENT (µA)
200
100
0
1.52.02.53.03.54.0
SUPPLY (V)
Figure 21. Typical Current Consumption vs. Supply Voltage
4
3
2
1
07949-023
Figure 22. Typical Turn-On Time, V
CH1: POWER, 2V/DIV
OUTPUTS ARE OFFSET
FOR CLARITY
TIME (1ms/DIV)
= CY = CZ = 0.0047 μF
C
X
= 3 V
S
07949-024
Rev. 0 | Page 9 of 16
Page 10
ADXL327
http://www.BDTIC.com/ADI
THEORY OF OPERATION
The ADXL327 is a complete 3-axis acceleration measurement
system. The ADXL327 has a measurement range of ±2 g minimum.
It contains a polysilicon surface micromachined sensor and signal
conditioning circuitry to implement an open-loop acceleration
measurement architecture. The output signals are analog voltages
that are proportional to acceleration. The accelerometer can
measure the static acceleration of gravity in tilt sensing applications,
as well as dynamic acceleration, resulting from motion, shock,
or vibration.
The sensor is a polysilicon surface micromachined structure
built on top of a silicon wafer. Polysilicon springs suspend the
structure over the surface of the wafer and provide a resistance
against acceleration forces. Deflection of the structure is measured
using a differential capacitor that consists of independent fixed
plates and plates attached to the moving mass. The fixed plates
are driven by 180° out-of-phase square waves. Acceleration deflects
the moving mass and unbalances the differential capacitor resulting
in a sensor output whose amplitude is proportional to acceleration.
Phase-sensitive demodulation techniques are then used to
determine the magnitude and direction of the acceleration.
The demodulator output is amplified and brought off-chip through
a 32 kΩ resistor. The user then sets the signal bandwidth of the
device by adding a capacitor. This filtering improves measurement
resolution and helps prevent aliasing.
MECHANICAL SENSOR
The ADXL327 uses a single structure for sensing the X, Y, and Z axes.
As a result, the three axes sense directions are highly orthogonal
with little cross-axis sensitivity. Mechanical misalignment of the
sensor die to the package is the chief source of cross-axis sensitivity.
Mechanical misalignment can, of course, be calibrated out at
the system level.
PERFORMANCE
Rather than using additional temperature compensation circuitry,
innovative design techniques ensure that high performance is
built-in to the ADXL327. As a result, there is neither quantization
error nor nonmonotonic behavior, and temperature hysteresis is
very low (typically <3 mg over the −25°C to +70°C temperature
range).
Rev. 0 | Page 10 of 16
Page 11
ADXL327
http://www.BDTIC.com/ADI
APPLICATIONS INFORMATION
POWER SUPPLY DECOUPLING
For most applications, a single 0.1 µF capacitor, CDC, placed
close to the ADXL327 supply pins adequately decouples the
accelerometer from noise on the power supply. However, in
applications where noise is present at the 50 kHz internal clock
frequency (or any harmonic thereof), additional care in power
supply bypassing is required because this noise can cause errors
in acceleration measurement. If additional decoupling is needed, a
100 Ω (or smaller) resistor or ferrite bead can be inserted in the
supply line. Additionally, a larger bulk bypass capacitor (1 µF or
greater) can be added in parallel to C
. Ensure that the
DC
connection from the ADXL327 ground to the power supply
ground is low impedance because noise transmitted through
ground has a similar effect as noise transmitted through V
.
S
SETTING THE BANDWIDTH USING CX, CY, AND CZ
The ADXL327 has provisions for band limiting the X
Y
OUT
, and Z
pins. Capacitors must be added at these pins to
OUT
implement low-pass filtering for antialiasing and noise reduction.
The 3 dB bandwidth equation is
f
= 1/(2π(32 kΩ) × C
−3 dB
(X, Y, Z)
)
or more simply
f
= 5 F/C
–3 dB
The tolerance of the internal resistor (R
(X, Y, Z)
) typically varies as
FILT
much as ±15% of its nominal value (32 kΩ), and the bandwidth
varies accordingly. A minimum capacitance of 0.0047 µF for C
C
, and CZ is recommended in all cases.
Y
Table 4. Filter Capacitor Selection, C
, CY, and CZ
X
Bandwidth (Hz) Capacitor (μF)
1 4.7
10 0.47
50 0.10
100 0.05
200 0.027
500 0.01
OUT
,
,
X
SELF TEST
The ST pin controls the self test feature. When this pin is set to
, an electrostatic force is exerted on the accelerometer beam.
V
S
The resulting movement of the beam allows the user to test
whether the accelerometer is functional. The typical change in
output is −1.08 g (corresponding to −450 mV) in the X axis,
+1.08 g (+450 mV) on the Y axis, and +1.83 g (+770 mV) on
the Z axis. This ST pin can be left open circuit or connected to
common (COM) in normal use.
Never expose the ST pin to voltages greater than V
this cannot be guaranteed due to the system design (for instance,
there are multiple supply voltages), then a low V
diode between ST and V
is recommended.
S
+ 0.3 V. If
S
clamping
F
Rev. 0 | Page 11 of 16
DESIGN TRADE-OFFS FOR SELECTING FILTER
CHARACTERISTICS: THE NOISE/BW TRADE-OFF
The selected accelerometer bandwidth ultimately determines
the measurement resolution (smallest detectable acceleration).
Filtering can be used to lower the noise floor to improve the
resolution of the accelerometer. Resolution is dependent on the
analog filter bandwidth at X
OUT
, Y
OUT
, and Z
OUT
.
The output of the ADXL327 has a typical bandwidth greater than
500 Hz. The user must filter the signal at this point to limit
aliasing errors. The analog bandwidth must be no more than
half the analog-to-digital sampling frequency to minimize
aliasing. The analog bandwidth can be further decreased to
reduce noise and improve resolution.
The ADXL327 noise has the characteristics of white Gaussian
noise, which contributes equally at all frequencies and is described
in terms of µg/√Hz (the noise is proportional to the square root
of the accelerometer bandwidth). The user should limit bandwidth
to the lowest frequency needed by the application to maximize the
resolution and dynamic range of the accelerometer.
With the single-pole roll-off characteristic, the typical noise of
the ADXL327 is determined by
rms Noise = Noise Density ×
)1.6(×BW
Often, the peak value of the noise is desired. Peak-to-peak noise
can only be estimated by statistical methods. Table 5 is useful
for estimating the probabilities of exceeding various peak
values, given the rms value.
Table 5. Estimation of Peak-to-Peak Noise
% of Time That Noise Exceeds
Peak-to-Peak Value
Nominal Peak-to-Peak Value
2 × rms 32
4 × rms 4.6
6 × rms 0.27
8 × rms 0.006
USE WITH OPERATING VOLTAGES OTHER THAN 3 V
The ADXL327 is tested and specified at VS = 3 V; however, it can be
powered with V
performance parameters change as the supply voltage is varied.
The ADXL327 output is ratiometric; therefore, the output
sensitivity (or scale factor) varies proportionally to the supply
voltage. At V
= 2 V, the output sensitivity is typically 289 mV/g.
At V
S
The zero g bias output is also ratiometric; therefore, the zero g
output is nominally equal to V
The output noise is not ratiometric but is absolute in volts;
therefore, the noise density decreases as the supply voltage
increases. This is because the scale factor (mV/g) increases while
the noise voltage remains constant. At V
axis noise density is typically 200 µg/√Hz, while at V
X- and Y-axis noise density is typically 300 µg/√Hz.
as low as 1.8 V or as high as 3.6 V. Note that some
S
= 3.6 V, the output sensitivity is typically 500 mV/g.
S
/2 at all supply voltages.
S
= 3.6 V, the X- and Y-
S
= 2 V, the
S
Page 12
ADXL327
A
X
Y
Z
http://www.BDTIC.com/ADI
Self test response in g is roughly proportional to the square of
the supply voltage. However, when ratiometricity of sensitivity
is factored in with supply voltage, the self test response in volts
is roughly proportional to the cube of the supply voltage.
For example, at V
= 3.6 V, the self test response for the ADXL327
S
is approximately −780 mV for the X axis, +780 mV for the Y axis,
and +1330 mV for the Z axis. At V
= 2 V, the self test response
S
is approximately −130 mV for the X axis, +130 mV for the Y axis,
and −220 mV for the Z axis.
The supply current decreases as the supply voltage decreases.
Typical current consumption at V
typical current consumption at V
= 3.6 V is 375 µA, and
S
= 2 V is 300 µA.
S
X
= –1g
OUT
Y
= 0g
OUT
Z
= 0g
OUT
AXES OF ACCELERATION SENSITIVITY
Z
A
Y
T
O
P
A
X
07949-025
Figure 23. Axes of Acceleration Sensitivity (Corresponding Output Voltage
Increases When Accelerated Along the Sensitive Axis)
TOP
GRAVITY
= 0g
OUT
OUT
OUT
= 0g
= 1g
= 0g
TOP
TOP
TOP
X
= 1g
OUT
Y
= 0g
OUT
Z
= 0g
OUT
X
OUT
Y
= –1g
OUT
Z
= 0g
OUT
T
O
P
= 0g
X
OUT
Y
= 0g
OUT
Z
= 1g
OUT
= 0g
X
OUT
Y
= 0g
OUT
Z
= –1g
OUT
07949-026
Figure 24. Output Response vs. Orientation to Gravity
Rev. 0 | Page 12 of 16
Page 13
ADXL327
C
http://www.BDTIC.com/ADI
LAYOUT AND DESIGN RECOMMENDATIONS
The recommended soldering profile is shown in Figure 25, followed by a description of the profile features in Table 6. The recommended
PCB layout or solder land drawing is shown in Figure 26.
CRITICAL ZONE
t
L
T
TO T
L
P
TEMPERATURE
t
T
P
T
L
T
SMAX
T
SMIN
PREHEAT
RAMP-UP
t
S
P
RAMP-DOWN
t25°C TO PE AK
TIME
07949-002
Figure 25. Recommended Soldering Profile
Table 6. Recommended Soldering Profile
Profile Feature Sn63/Pb37 Pb-Free
Average Ramp Rate (TL to TP) 3°C/sec maximum 3°C/sec maximum
Preheat
Minimum Temperature (T
Maximum Temperature (T
Time (T
T
to TL
SMAX
SMIN
to T
), tS 60 sec to 120 sec 60 sec to 180 sec
SMAX
) 100°C 150°C
SMIN
) 150°C 200°C
SMAX
Ramp-Up Rate 3°C/sec maximum 3°C/sec maximum
Time Maintained Above Liquidous (TL)
Liquidous Temperature (TL) 183°C 217°C
Time (tL) 60 sec to 150 sec 60 sec to 150 sec
Peak Temperature ( TP) 240°C + 0°C/−5°C 260°C + 0°C/−5°C
Time Within 5°C of Actual Peak Temperature (tP) 10 sec to 30 sec 20 sec to 40 sec
Ramp-Down Rate 6°C/sec maximum 6°C/sec maximum
Time 25°C to Peak Temperature 6 minutes maximum 8 minutes maximum
0.50
MAX
0.650.325
4
0.35
MAX
ENTER PAD IS NO T
INTERNALLY CONNECTED
BUT SHOULD BE SOLDERED
FOR MECHANICAL INTEGRIT Y
1.95
1.95
DIMENSIONS SHOWN IN MILLIMETERS
Figure 26. Recommended PCB Layout
Rev. 0 | Page 13 of 16
0.65
0.325
4
07949-004
Page 14
ADXL327
http://www.BDTIC.com/ADI
OUTLINE DIMENSIONS
0.20 MIN
13
12
EXPOSED
PAD
(BOTTOM VIE W)
9
8
1.95 BSC
FOR PROPER CONNECTION OF
THE EXPOSED PAD, REFER TO
THE PIN CONF IGURATIO N AND
FUNCTION DES CRIPTIONS
SECTION OF THIS DATA SHEET.
PIN 1
INDICATOR
1.50
1.45
1.40
SEATING
PLANE
TOP VIEW
0.20 MIN
4.15
4.00 SQ
3.85
0.65 BSC
0.55
0.50
0.45
0.05 MAX
0.02 NOM
0.35
COPLANARITY
0.30
0.25
*
0.05
STACKED DIE WI TH GLASS SEAL.
Figure 27. 16-Lead Lead Frame Chip Scale Package [LFCSP_LQ]
4 mm × 4 mm Body, 1.45 mm Thick Quad
(CP-16-5a*)
Dimensions shown in millimeters
ORDERING GUIDE
Model Measurement Range Specified Voltage Temperature Range Package Description Package Option
ADXL327BCPZ1 ±2 g 3 V −40°C to +85°C 16-Lead LFCSP_LQ CP-16-5a
ADXL327BCPZ–RL1 ±2 g3 V −40°C to +85°C 16-Lead LFCSP_LQ CP-16-5a
ADXL327BCPZ–RL71 ±2 g3 V −40°C to +85°C 16-Lead LFCSP_LQ CP-16-5a
EVAL-ADXL327Z1 Evaluation Board
1
Z = RoHS Compliant Part.
PIN 1
INDICATOR
16
1
2.43
1.75 SQ
1.08
4
5
112008-A
Rev. 0 | Page 14 of 16
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