Datasheet ADuM1234 Datasheet (ANALOG DEVICES)

Isolated, Precision

FEATURES

Isolated high-side and low-side outputs

High side or low side relative to input: ±700 V
High-side/low-side differential: 700 V

PEAK

0.1 A peak output current
CMOS input threshold levels
High frequency operation: 5 MHz maximum
High common-mode transient immunity: >75 kV/μs
High temperature operation: 105°C
Wide body, RoHS compliant, 16-lead SOIC
UL1577 2500 V rms input-to-output withstand voltage

APPLICATIONS

Isolated IGBT/MOSFET gate drives
Plasma displays
Industrial inverters
Switching power supplies

PEAK

Half-Bridge Driver, 0.1 A Output

ADuM1234

GENERAL DESCRIPTION

The ADuM12341 is an isolated, half-bridge gate driver that
employs the Analog Devices, Inc. iCoupler® technology to
provide independent and isolated high-side and low-side
outputs. Combining high speed CMOS and monolithic
transformer technology, this isolation component provides
outstanding performance characteristics superior to
optocoupler-based solutions.

By avoiding the use of LEDs and photodiodes, this iCoupler
gate drive device is able to provide precision timing characteristics
not possible with optocouplers. Furthermore, the reliability and
performance stability problems associated with optocoupler
LEDs are avoided.

In comparison to gate drivers employing high voltage level
translation methodologies, the ADuM1234 offers the benefit
of true, galvanic isolation between the input and each output.
Each output can be operated up to ±700 V
input, thereby supporting low-side switching to negative voltages.
The differential voltage between the high side and low side can be
as high as 700 V

PEAK

.

As a result, the ADuM1234 provides reliable control over the
switching characteristics of IGBT/MOSFET configurations over
a wide range of positive or negative switching voltages.

relative to the

PEAK

FUNCTIONAL BLOCK DIAGRAM

ADuM1234

1 16

V

IA

2 15

V

IB

3 14

V

DD1

4 13

GND

1

DISABLE

5

6

NC

7

NC

8

V

DD1

NC = NO CONNECT

1

Protected by U.S. Patents 5,952,849; 6,873,065; 7,075,329. Other patents pending.

Rev. 0

Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.

ENCODE DECODE

ENCODE DECODE

V

DDA

V

OA

GND

A

NC

12

NC

11

V

DDB

10

V

OB

9

GND

B

06920-001

Figure 1.

One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: [phone] www.analog.com
Fax: [phone] ©2007 Analog Devices, Inc. All rights reserved.

ADuM1234

TABLE OF CONTENTS

Features .............................................................................................. 1

Applications ....................................................................................... 1 

General Description ......................................................................... 1

Functional Block Diagram .............................................................. 1

Revision History ............................................................................... 2

Specifications ..................................................................................... 3

Electrical Characteristics ............................................................. 3

Package Characteristics ............................................................... 4

Regulatory Information ............................................................... 4

Insulation and Safety-Related Specifications ............................ 4

REVISION HISTORY

7/07—Revision 0: Initial Version

Recommended Operating Conditions .......................................4

Absolute Maximum Ratings ............................................................5

ESD Caution...................................................................................5

Pin Configuration and Function Descriptions ..............................6

Typical Perfomance Characteristics ................................................7

Application Notes ..............................................................................8

Common-Mode Transient Immunity ........................................8

Insulation Lifetime ........................................................................9

Outline Dimensions ....................................................................... 10

Ordering Guide .......................................................................... 10

Rev. 0 | Page 2 of 12

ADuM1234

SPECIFICATIONS

ELECTRICAL CHARACTERISTICS

4.5 V ≤ V
operating range, unless otherwise noted. All typical specifications are at T
relative to their respective grounds.

Table 1.

Parameter Symbol Min Typ Max Unit Test Conditions

DC SPECIFICATIONS

Input Supply Current, Quiescent I
Output Supply Current A or Output Supply

Input Supply Current, 10 Mbps I
Output Supply Current A or Output Supply

Input Currents

Logic High Input Threshold VIH 0.7 × V
Logic Low Input Threshold VIL 0.3 × V
Logic High Output Voltages V

Logic Low Output Voltages V
Output Short-Circuit Pulsed Current

SWITCHING SPECIFICATIONS

Minimum Pulse Width
Maximum Switching Frequency
Propagation Delay

Pulse Width Distortion, |t
Channel-to-Channel Matching,

Channel-to-Channel Matching,

Part-to-Part Matching, Rising or Falling Edges
Part-to-Part Matching, Rising vs. Falling

Output Rise/Fall Time (10% to 90%) tR/tF 25 ns CL = 200 pF

1

Short-circuit duration less than 1 second.

2

The minimum pulse width is the shortest pulse width at which the specified timing parameters are guaranteed.

3

The maximum switching frequency is the maximum signal frequency at which the specified timing parameters are guaranteed.

4

t

propagation delay is measured from the 50% level of the falling edge of the VIx signal to the 50% level of the falling edge of the VOx signal. t

PHL

measured from the 50% level of the rising edge of the VIx signal to the 50% level of the rising edge of the VOx signal.

5

Channel-to-channel matching, rising or falling edges, is the magnitude of the propagation delay diffe

are either both rising or falling edges. The supply voltages and the loads on each channel are equal.

6

Channel-to-channel matching, rising vs. falling edges, is the magnitude of the propagation delay difference between two channels of the same part when one input is

a rising edge and the other input is a falling edge. The supply voltages and loads on each channel are equal.

7

Part-to-part matching, rising or falling edges, is the magnitude of the propagation delay difference between the same channels of two different parts when the inputs

are either both rising or falling edges. The supply voltages, temperatures, and loads of each part are equal.

8

Part-to-part matching, rising vs. falling edges, is the magnitude of the propagation delay difference between the same cha

is

a rising edge and the other input is a falling edge. The supply voltages, temperatures, and loads of each part are equal.

≤ 5.5 V, 12 V ≤ V

DD1

Current B, Quiescent

Current B, 10 Mbps

4

t

2

PW 100 ns C

≤ 18 V, 12 V ≤ V

DDA

1

I

3

10 Mbps C

≤ 18 V. All minimum/maximum specifications apply over the entire recommended

DDB

= 25°C, V

A

3.0 4.2 mA

DDI(Q)

I

,

DDA(Q)

I

DDB(Q)

6.0 9.0 mA

DDI(10)

I

,

DDA(10)

I

DDB(10)

, IIB,

I

IA

I

DISABLE

OAH,VOBH

OAL,VOBL

, I

OA(SC)

, t

PHL

PLH

0.3 1.2 mA

16 22 mA C

−10 +0.01 +10 μA 0 V ≤ VIA, VIB, V

V

DD1

V
V

DDA

DDB

− 0.1,

− 0.1

V

DDA

0.1 V IOA, I
100 mA

OB(SC)

97 124 160 ns CL = 200 pF

, V

= 5 V, V

DD1

V IOA, I

DDB

= 15 V, V

DDA

V

DD1

= 15 V. All voltages are

DDB

= 200 pF

L

= −1 mA

OB

= +1 mA

OB

= 200 pF

L

= 200 pF

L

Change vs. Temperature 100 ps/°C CL = 200 pF

− t

| PWD 8 ns CL = 200 pF

PHL

5 ns CL = 200 pF

6

13 ns CL = 200 pF

7

55 ns C

63 ns CL = 200 pF, Input tR = 3 ns

rence between two channels of the same part when the inputs

nnels of two different parts when one input

= 200 pF, Input tR = 3 ns

L

propagation delay is

PLH

Rising or Falling Edges

Rising vs. Falling Edges

8

Edges

PLH

5

DISABLE

≤ V

DD1

Rev. 0 | Page 3 of 12

ADuM1234

PACKAGE CHARACTERISTICS

Table 2.

Parameter Symbol Min Typ Max Unit Test Conditions

Resistance (Input-to-Output)
Capacitance (Input-to-Output)
Input Capacitance CI 4.0 pF
IC Junction-to-Ambient Thermal Resistance θJA 76 °C/W

1

The device is considered a 2-terminal device: Pin 1 through Pin 8 are shorted together, and Pin 9 through Pin 16 are shorted together.

REGULATORY INFORMATION

The ADuM1234 has been approved by the organization listed in Table 3. Refer to Tab l e 7 and the Insulation Lifetime section for details
regarding recommended maximum working voltages for specific cross-isolation waveforms and insulation levels.

Table 3.

UL

Recognized under the 1577 component recognition program
Single/basic insulation, 2500 V rms isolation voltage

1

In accordance with UL1577, each ADuM1234 is proof tested by applying an insulation test voltage ≥ 3000 V rms for 1 second (current leakage detection limit = 5 μA).

INSULATION AND SAFETY-RELATED SPECIFICATIONS

1

R

1

C

1012 Ω

I-O

2.0 pF f = 1 MHz

I-O

1

Table 4.

Parameter Symbol Value Unit Conditions

Rated Dielectric Insulation Voltage 2500 V rms 1 minute duration
Minimum External Air Gap (Clearance) L(I01) 7.7 min mm

Measured from input terminals to output terminals,
shortest distance through air

Minimum External Tracking (Creepage) L(I02) 8.1 min mm

Measured from input terminals to output terminals,

shortest distance path along body
Minimum Internal Gap (Internal Clearance) 0.017 min mm Insulation distance through insulation
Tracking Resistance (Comparative Tracking Index) CTI >175 V DIN IEC 112/VDE 0303 Part 1
Isolation Group IIIa Material Group (DIN VDE 0110, 1/89, Table 1)

RECOMMENDED OPERATING CONDITIONS

Table 5.

Parameter Symbol Min Max Unit

Operating Temperature TA −40 +105 °C
Input Supply Voltage
Output Supply Voltages
Input Signal Rise and Fall Times 100 ns
Common-Mode Transient Immunity, Input-to-Output
Common-Mode Transient Immunity, Between Outputs
Transient Immunity, Supply Voltages

1

All voltages are relative to their respective ground.

2

See the section for additional data. Common-Mode Transient Immunity

1

V

1

V

2

−75 +75 kV/μs

2

2

−75 +75 kV/μs

−75 +75 kV/μs

4.5 5.5 V

DD1

, V

12 18

DDA

DDB

Rev. 0 | Page 4 of 12

ADuM1234

ABSOLUTE MAXIMUM RATINGS

Ambient temperature = 25°C, unless otherwise noted.

Table 6.

Parameter Rating

Storage Temperature (TST) −55°C to +150°C
Ambient Operating Temperature (TA) −40°C to +105°C
Input Supply Voltage (V
Output Supply Voltage1 (V
Input Voltage1 (VIA, VIB)
Output Voltage

1

VOA −0.5 V to V

VOB −0.5 V to V
Input-to-Output Voltage
Output Differential Voltage
Output DC Current (IOA, IOB) −20 mA to +20 mA
Common-Mode Transients

1

All voltages are relative to their respective ground.

2

Input-to-output voltage is defined as GNDA − GND1 or GNDB − GND1.

3

Output differential voltage is defined as GNDA − GNDB.

4

Refers to common-mode transients across any insulation barrier.

Common-mode transients exceeding the absolute maximum ratings
may cause latch-up or permanent damage.

1

)

−0.5 V to +7.0 V

DD1

)

−0.5 V to +27 V

DDA

, V

DDB

−0.5 V to V

2

−700 V

3

700 V

4

PEAK

−100 kV/μs to +100 kV/μs

DDI

DDA

DDB

to +700 V

PEAK

+ 0.5 V

+ 0.5 V
+ 0.5 V

PEAK

Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.

ESD CAUTION

Table 7. Maximum Continuous Working Voltage1

Parameter Max Unit Constraint

AC Voltage, Bipolar Waveform 565 V peak
AC Voltage, Unipolar Waveform V peak

Basic Insulation 700 V peak

50-year minimum lifetime

Analog Devices recommended maximum working voltage

DC Voltage

Basic Insulation 700 V peak

1

Refers to continuous voltage magnitude imposed across the isolation barrier. See the Insulation Lifetime section for more details.

Analog Devices recommended maximum working voltage

Rev. 0 | Page 5 of 12

ADuM1234

PIN CONFIGURATION AND FUNCTION DESCRIPTIONS

V

V

V

DD1

GND

DISABLE

NC

NC

V

DD1

1

IA

2

IB

3

ADuM1234

4

1

TOP VIEW

(Not to Scale)

5

6

7

8

NC = NO CONNECT

16

V

DDA

15

V

OA

14

GND

A

NC

13

12

NC

11

V

DDB

10

V

OB

9

GND

B

6920-002

Figure 2. Pin Configuration

Table 8. ADuM1234 Pin Function Descriptions

Pin No. Mnemonic Description

1 V
2 V

1

31, 8

V

IA

IB

DD1

4 GND

1

Logic Input A.
Logic Input B.
Input Supply Voltage, 4.5 V to 5.5 V.

Ground Reference for Input Logic Signals.
5 DISABLE Input Disable. Disables the isolator inputs and refresh circuits. Outputs take on default low state.
6, 7, 122, 13
9 GND

2

NC No Connect.

B

Ground Reference for Output B.
10 VOB Output B.
11 V

Output B Supply Voltage, 12 V to 18 V.

DDB

14 GNDA Ground Reference for Output A.
15 VOA Output A.
16 V

1

Pin 3 and Pin 8 are internally connected. Connecting both pins to V

2

Pin 12 and Pin 13 are floating and should be left unconnected.

Output A Supply Voltage, 12 V to 18 V.

DDA

is recommended.

DD1

Table 9. Truth Table (Positive Logic)

VIA/VIB Input V

State DISABLE VOA/VOB Output Notes

DD1

H Powered L H
L Powered L L
X Unpowered X L Output returns to input state within 1 μs of V
X Powered H L

power restoration.

DD1

Rev. 0 | Page 6 of 12

ADuM1234

G
A

A

G
A

A

G
A

A

TYPICAL PERFOMANCE CHARACTERISTICS

7

115

6

5

4

3

2

INPUT CURRENT (mA)

1

0

DATA RATE (Mbps)

Figure 3. Typical Input Supply Current Variation with Data Rate

18

16

14

12

10

8

6

OUTPUT CURRENT (mA)

4

2

0

DATA RATE (Mbps)

Figure 4. Typical Output Supply Current Variation with Data Rate

120

114

113

Y (ns)

112

TION DEL

111

PROPA

110

1002468

06920-006

109

CH. B, FALLING EDG E

CH. A, FALLING EDGE

CH. A, RISING EDG E

CH. B, RISING EDGE

OUTPUT SUPPLY VOLTAGE (V)

1812 15

06920-009

Figure 6. Typical Propagation Delay Variation with Output Supply Voltage

(Input Supply Voltage = 5.0 V)

115

114

113

Y (ns)

112

TION DEL

111

PROPA

110

1002468

06920-007

109

CH. B, FALLING EDG E

INPUT SUPPLY VOLTAGE (V)

CH. A, FALLING EDGE

CH. A, RISING EDG E

CH. B, RISING EDGE

5.54.5 5.0

06920-010

Figure 7. Typical Propagation Delay Variation with Input Supply Voltage

(Output Supply Voltage = 15.0 V)

115

Y (ns)

110

TION DEL

105

PROPA

100

TEMPERATURE (°C)

120–40 0 20–20 40 60 80 100

06920-008

Figure 5. Typical Propagation Delay Variation with Temperature

Rev. 0 | Page 7 of 12

ADuM1234

APPLICATION NOTES

COMMON-MODE TRANSIENT IMMUNITY

In general, common-mode transients consist of linear and
sinusoidal components. The linear component of a common­mode transient is given by

V

where ΔV/Δt is the slope of the transient shown in Figure 11
and Figure 12.

The transient of the linear component is given by

dV

Figure 8 characterizes the ability of the ADuM1234 to operate
correctly in the presence of linear transients. The data is based
on design simulation and is the maximum linear transient
magnitude that the ADuM1234 can tolerate without an
operational error. This data shows a higher level of robustness
than what is listed in Tab le 5 because the transient immunity
values obtained in Tabl e 5 use measured data and apply
allowances for measurement error and margin.

= (ΔV/Δt)t

CM, linear

/dt = ΔV/Δt

CM

400

350

300

250

200

BEST-CASE PROCESS VARIATION

300

250

BEST-CASE PROCESS VARIATION

200

150

100

TRANSIENT I MMUNITY (kV/µs)

50

0

WORST-CASE PROCESS VARIATION

FREQUENCY (MHz)

Figure 9. Transient Immunity (Sinusoidal Transients),

27°C Ambient Temperature

250

200

BEST-CASE PROCESS VARIATION

150

100

50

TRANSIENT I MMUNITY (kV/ µs)

20000 500 1000 1500 1750250 750 1250

06920-012

150

100

TRANSIENT IMMUNITY (kV/µs)

50

0

WORST-CASE PROCESS VARIATION

100–40 0 40 80–20 20 60

TEMPERATURE (°C)

Figure 8. Transient Immunity (Linear Transients) vs. Temperature

The sinusoidal component (at a given frequency) is given by

V

CM, sinusoidal

= V0sin(2πft)

where:

V

is the magnitude of the sinusoidal.

0

f is the frequency of the sinusoidal.

The transient magnitude of the sinusoidal component is given by

dV

/dt = 2πf V0

CM

Figure 9 and Figure 10 characterize the ability of the
ADuM1234 to operate correctly in the presence of sinusoidal
transients. The data is based on design simulation and is the
maximum sinusoidal transient magnitude (2πf V

) that the

0

ADuM1234 can tolerate without an operational error. Values
for immunity against sinusoidal transients are not included in
Tabl e 5 because measurements to obtain such values have not
been possible.

0

WORST-CASE PROCESS VARIATION

FREQUENCY (MHz)

20000 500 1000 1500 1750250 750 1250

06920-013

Figure 10. Transient Immunity (Sinusoidal Transients),

100°C Ambient Temperature

5V

GND

V

DDA

AND V

AND GND

A

V

GND

DDB

DD1

1

15V

B

ΔV

Δt

15V

06920-003

06920-011

V

GND

DDB

DD1

15V

B

5V

1

GND

V

DDA

A

AND V

AND GND

15V

ΔV

Δt

Figure 11. Common-Mode Transient Immunity Waveforms, Input to Output

/GND

15V

B

15V

A

ΔV

Δt

15V

06920-004

V

DDA/VDDB

GND

/GND

A

V

DDB/VDDA

GNDA/GND

15V

15V

B

B

15V

ΔV

Δt

V

DDA/VDDB

GNDA/GND

V

DDB/VDDA

GND

B

Figure 12. Common-Mode Transient Immunity Waveforms,

Between Outputs

Rev. 0 | Page 8 of 12

ADuM1234

V

/

ΔV

DD

V

DDA/VDDB

GNDA/GND

B

Figure 13. Transient Immunity Waveforms, Output Supplies

Δt

V

DDA

GNDA/GND

DDB

B

INSULATION LIFETIME

All insulation structures eventually break down when subjected
to voltage stress over a sufficiently long period. The rate of
insulation degradation depends on the characteristics of the
voltage waveform applied across the insulation. In addition to
the testing performed by the regulatory agencies, Analog
Devices conducts an extensive set of evaluations to determine
the lifetime of the insulation structure within the ADuM1234.

Analog Devices performs accelerated life testing using voltage
levels higher than the rated continuous working voltage.
Acceleration factors for several operating conditions are
determined. These factors allow calculation of the time to
failure at the actual working voltage. Table 7 summarizes the
peak voltages for 50 years of service life for a bipolar ac
operating condition and the maximum Analog Devices
recommended working voltages. In many cases, the approved
working voltage is higher than the 50-year service life voltage.
Operation at these high working voltages can lead to shortened
insulation life in some cases.

The insulation lifetime of the ADuM1234 depends on the
voltage waveform type imposed across the isolation barrier.
The iCoupler insulation structure degrades at different rates
depending on whether the waveform is bipolar ac, unipolar ac,
or dc. Figure 14, Figure 15, and Figure 16 illustrate these
different isolation voltage waveforms.

Bipolar ac voltage is the most stringent environment. The goal
of a 50-year operating lifetime under the ac bipolar condition

determines the maximum working voltage recommended by
Analog Devices.

In the case of unipolar ac or dc voltage, the stress on the insu-

06920-005

lation is significantly lower. This allows operation at higher
working voltages while still achieving a 50-year service life.
The working voltages listed in Tab l e 7 can be applied while
maintaining the 50-year minimum lifetime provided the voltage
conforms to either the unipolar ac or dc voltage cases. Any cross
insulation voltage waveform that does not conform to Figure 15
or Figure 16 should be treated as a bipolar ac waveform and its
peak voltage should be limited to the 50-year lifetime voltage
value listed in Tabl e 7. Note that the voltage presented in Figure 15
is shown as sinusoidal for illustration purposes only. It is meant
to represent any voltage waveform varying between 0 V and
some limiting value. The limiting value can be positive or
negative, but the voltage cannot cross 0 V.

RATED PEAK VOLT AGE

0V

Figure 14. Bipolar AC Waveform

06920-014

RATED PEAK VOLT AGE

0V

Figure 15. Unipolar AC Waveform

06920-015

RATED PEAK VOLT AGE

0V

Figure 16. DC Waveform

06920-016

Rev. 0 | Page 9 of 12

ADuM1234

C

OUTLINE DIMENSIONS

10.50 (0.4134)

10.10 (0.3976)

0.30 (0.0 118)

0.10 (0.0039)

OPLANARITY

0.10

ORDERING GUIDE

No. of

Model

ADuM1234BRWZ

1

2 0.1 15 −40°C to +105°C 16-Lead SOIC_W RW-16

ADuM1234BRWZ-RL1,

1

Z = RoHS Compliant Part.

2

13-inch tape and reel option (1,000 units).

Channels

2

2 0.1 15 −40°C to +105°C 16-Lead SOIC_W RW-16

BSC

9

7.60 (0.2992)

7.40 (0.2913)

8

10.65 (0.4193)

10.00 (0.3937)

2.65 (0.1043)

2.35 (0.0925)

SEATING
PLANE

8°
0°

0.33 (0.0130)

0.20 (0.0079)

5

0

.

7

0

.

2

5

16

1

1.27 (0.0500)

0.51 (0.0201)

0.31 (0.0122)

CONTROLL ING DIMENS IONS ARE IN MILLIM ETERS; INCH DI MENSIONS
(IN PARENTHESES) ARE ROUNDED-O FF MIL LIMETE R EQUIVALENTS FOR
REFERENCE ONLY AND ARE NOT APPROPRI ATE FOR USE IN DESIGN.

COMPLIANT TO JEDEC STANDARDS MS-013- AA

Figure 17. 16-Lead Standard Small Outline Package [SOIC_W]

Wide Body (RW-16)

Dimensions shown in millimeters and (inches)

Output Peak
Current (A)

Output
Voltage (V)

Temperature Range Package Description

(

0

.

0

2

0

0

(

0

.

1.27 (0.0500)

0.40 (0.0157)

9

5

)

45°

9

8

)

032707-B

Package
Option

Rev. 0 | Page 10 of 12

ADuM1234

NOTES

Rev. 0 | Page 11 of 12

ADuM1234

NOTES

©2007 Analog Devices, Inc. All rights reserved. Trademarks and
registered trademarks are the property of their respective owners.
D06920-0-7/07(0)

Rev. 0 | Page 12 of 12