1.25 A charge current from dedicated charger
Up to 680 mA charging current from 500 mA USB host
Operating input voltage from 4.0 V up to 5.5 V
Tolerant input voltage −0.5 V to +20 V (USB VBUS)
Dead battery isolation FET between battery and
charger output
Battery thermistor input with automatic charger shutdown
for when battery temperature exceeds limits
Compliant with the JEITA Li-Ion battery charging
temperature specification
SYS_EN_OK flag to hold off system turn-on until battery is at
minimum required level for guaranteed system startup
due to minimum battery voltage and/or minimum battery
charge level requirements
EOC programming with C/20, C/10 and specific current level
selection
FUNCTIONAL BLOCK DIAGRAM
Figure 1.
APPLICATIONS
Digital still cameras
Digital video cameras
Single cell Li-Ion portable equipment
PDA, audio, GPS devices
Mobile phones
GENERAL DESCRIPTION
The ADP5065 charger is fully compliant with the USB 2.0,
USB 3.0, and USB Battery Charging Specification 1.1 and
enables charging via the mini USB VBUS pin from a wall
charger, car charger, or USB host port.
The ADP5065 operates from a 4 V to 5.5 V input voltage range
but is tolerant of voltages of up to 20 V. Th is alleviates the
concerns about the USB bus spiking during disconnect or
connect scenarios.
The ADP5065 also features an internal FET between the dc-todc charger output and the battery. This permits battery isolation
and, hence, system powering under a dead battery or no battery
scenario, which allows for immediate system function on
connection to a USB power supply.
Based on the type of USB source, which is detected by an external
USB detection chip, the ADP5065 can be set to apply the correct
current limit for optimal charging and USB compliance.
The ADP5065 comes in a very small and low profile 20-lead
WLCSP (0.5 mm pitch spacing) package.
The overall solution requires only five small, low profile external
components consisting of four ceramic capacitors (one of which
is the battery filter capacitor), one multilayer inductor. In addition
to these components, there is one optional dead battery situation
default setting resistor. This configuration enables a very small
PCB area to provide an integrated and performance enhancing
solution to USB battery charging and power rail provision.
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781.329.4700
www.analog.com
Page 2
ADP5065 Data Sheet
TABLE OF CONTENTS
Features .............................................................................................. 1
S = START CONDITION
Sr = REPEATED S TART CONDITION
P = STOP CONDITION
t
LOW
t
SU,DAT
t
R
t
HD,DAT
t
SU,STA
t
SU,STO
t
SPtR
t
BUF
t
HIGH
SSrPS
SDA
SCL
t
F
t
HD,STA
t
F
09370-002
I2C-COMPATIBLE INTERFACE TIMING SPECIFICATIONS
Table 3.
Parameter1 Symbol Min Typ Max Unit
Capacitive Load, Each Bus Line CS 400 pF
SCL Clock Frequency f
SCL High Time t
SCL Low Time t
Data Setup Time t
Data Hold Time t
Setup Time for Repeated Start t
Hold Time for Start/Repeated Start t
Bus Free Time Between a Stop and a Start Condition t
Setup Time for Stop Condition t
SCL
HIGH
LOW
SU DAT
0 0.9 µs
HDDAT
SU STA
HD STA
BUF
SUSTO
Rise Time of SCL/SDA tR 20 300 ns
Fall Time of SCL/SDA tF 20
Pulse Width of Suppressed Spike t
1
Guaranteed by design.
2
A master device must provide a hold time of at least 300 ns for the SDA signal to bridge the undefined region of the falling edge of SCL. See Figure 2, the I2C timing
diagram.
SP
Timing Diagram
400 kHz
0.6 µs
1.3 µs
100 ns
0.6 µs
0.6 µs
1.3 µs
0.6 µs
300 ns
0 50 ns
2
Figure 2. I
C Timing Diagram
Rev. B | Page 6 of 40
Page 7
Data Sheet ADP5065
VIN1, VIN2 to PGND1, PGND2
−0.5 V to +20 V
Stresses a bove those l isted under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ABSOLUTE MAXIMUM RATINGS
Table 4.
Parameter Rating
All Other Pins to AGND −0.3 V to +6 V
Continuous Drain Current, Battery Supple-
mentary Mode, from ISO_Bx to ISO_Sx
TJ ≤ 85°C 2.2 A
TJ = 125°C 1.1 A
Storage Temperature Range −65°C to +150°C
Operating Junction Temperature Range −40°C to +125°C
Soldering Conditions JEDEC J-STD-020
THERMAL RESISTANCE
θJA is specified for the worst-case conditions, that is, a device
soldered in a circuit board for surface-mount packages.
Table 5. Thermal Resistance
Package Type θJA θJC θJB Unit
20-Lead WLC SP1 46.8 0.7 9.2 °C/W
1
5 × 4 array, 0.5 mm pitch (2.75 mm × 2.08 mm); based on a JEDEC, 2S2P,
4-layer board with 0 m/sec airflow.
Maximum Power Dissipation
The maximum safe power dissipation in the ADP5065 package
is limited by the associated rise in junction temperature (T
) on
J
the die. At approximately 150°C, which is the glass transition
temperature, the plastic changes its properties. Even temporarily
exceeding this temperature limit may change the stresses that
the package exerts on the die, permanently shifting the parametric performance of the ADP5065. Exceeding a junction
temperature of 175°C for an extended period of time can result
in changes in the silicon devices that potentially cause failure.
ESD CAUTION
Rev. B | Page 7 of 40
Page 8
ADP5065 Data Sheet
TOP VIEW
(BALL SI DE DOWN)
Not to Scale
1
A
B
C
D
E
234
BALL A1
CORNER
V_WEAK_SET
SDA
BAT_SNS
VIN1
THR
ISO_B1
ISO_S1
SW1
IIN_EXT
ISO_B2
ISO_S2
PGND1
SCL
TRK_EXT
AGND
SYS_ON_OK
VIN2SW2PGND2
CFILT
09370-003
Pin
B1
SDA
I/O
I2C-Compatible Interface Serial Data.
A3
THR I Battery Pack Thermistor Connection. If not used, connect a dummy 10 kΩ resistor from THR to GND.
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
Table 6. Pin Function Descriptions
No. Mnemonic Typ e1 Description
D3, E3 SW1, SW2 I/O DC-to-DC Converter Inductor Connection. These pins are high current outputs when in charging mode.
D1, E1 VIN1, VIN2 I/O Power Connection to USB VBUS. These pins are high current inputs when in charging mode.
D4, E4 PGND1,
C2 AGND G Analog Ground.
E2 CF ILT I/O 4.7 μF Filter Capacitor Connection. This pin is a high current input/output when in charging mode.
C3, C4 ISO_S1, ISO_S2 I/O Charger Supply Side Input to Internal Isolation FET/Battery Current Regulation FET.
B3, B4 ISO_B1,
A2 SCL I I2C-Compatible Interface Serial Clock.
A4 IIN_EXT I Set Input Current Limit. This pin sets the input current limit directly. When IIN_EXT = low or high-Z, the
B2 TRK_EXT I Enable Trickle Charge Function. When TRK_EXT = low or high-Z, the trickle charge is enabled. When
C1 B AT_SNS I Battery Voltage Sense Pin.
D2 SYS_ON_OK O Battery Okay Open-Drain Output Flag. Active low. This pin enables the system when the battery
A1 V_WEAK_SET I/O External Resistor Setting Pin for V_WEAK threshold. The use of this pin is optional. When not in use,
1
I is input, O is output, I/O is input/output, and G is ground.
PGND2
ISO_B2
Figure 3. Pin Configuration
G Charger Power Ground. These pins are high current inputs when in charging mode.
I/O Battery Supply Side Input to Internal Isolation FET/Battery Current Regulation FET.
input limit is 100 mA. When IIN_EXT = high, the input limit is 500 mA.
TRK_EXT = high, the trickle charge is disabled.
reaches V
WEAK
.
connect to GND.
Rev. B | Page 8 of 40
Page 9
Data Sheet ADP5065
100
0
10
20
30
40
50
60
70
90
80
2.52.93.33.74.14.5
EFFICIENCY (%)
BATTERY VOLTAGE (V)
VIN INPUT LIMIT 100mA
V
IN
INPUT LIMIT 500mA
09370-004
0.0010.010.11
SYSTEM VOLTAGE (V)
SYSTEM OUTPUT CURRENT ( A)
3.25
3.26
3.27
3.28
3.29
3.30
3.31
3.32
3.33
3.34
3.35
09370-005
700
0
100
200
300
400
500
600
2.73.03.33.63.94.2
BATTERY CHARG E CURRE NT (mA)
BATTERY VOLTAGE (V)
09370-006
0.010.11
SYSTEM OUTPUT CURRENT ( A)
100
0
10
20
30
40
50
60
70
90
80
EFFICI E NCY ( %)
09370-007
2.73.03.33.63.94.2
BATTERY VOLTAGE (V)
4.5
2.5
2.7
2.9
3.1
3.3
3.5
3.7
3.9
4.3
4.1
SYSTEM VOLTAGE (V)
SYSTEM VOLTAGE
BATTERY VOLTAGE
09370-008
2.73.03.33.63.94.2
BATTERY VOLTAGE (V)
140
0
20
40
60
80
100
120
BATTERY CHARG E CURRE NT (mA)
09370-009
TYPICAL PERFORMANCE CHARACTERISTICS
Figure 4. Battery Charger Efficiency vs. Battery Voltage, VIN = 5.0 V
Figure 5. System Voltage Regulation vs. Output Current, VIN = 5.0 V
Figure 7. System Voltage Efficiency vs. Output Current, VIN = 5.0 V
Figure 8. System Voltage vs. Battery Voltage, VIN = 5.0 V, ILIM = 100 mA
Figure 6. USB Compliant Charge Current vs. Battery Voltage,
V
= 5.0 V, ILIM = 500 mA
IN
Figure 9. USB Limited Battery Charge Current vs. Battery Voltage,
V
= 5.0 V, ILIM = 100 mA
IN
Rev. B | Page 9 of 40
Page 10
ADP5065 Data Sheet
2.73.03.33.63.94.2
BATTERY VOLTAGE (V)
100
70
75
80
85
90
95
RON RESISTANCE (mΩ)
09370-010
123456
VIN VOLTAGE (V)
1.6
1.4
1.2
1.0
0.8
0.6
0.4
0.2
0
VIN CURRENT (mA)
09370-011
050100150
CHARGE TIM E ( M inutes)
4.4
4.2
4.0
3.8
3.6
3.4
3.2
3.0
0.7
0.6
0.5
0.4
0.3
0.2
0
0.1
BATTERY VOLTAGE (V)
CURRENT (A)
V
BAT_SNS
I
ISO_B
I
VIN
09370-012
Figure 10. Battery Isolation FET Resistance vs. Battery Voltage, VIN = 5.0 V,
Load Current = 1.0 A
Figure 11. VINx Current vs. VINx Voltage, Suspend Mode (EN_CHG = 0)
The ADP5065 is a fully I2C-programmable charger for singlecell lithium-ion or lithium-polymer batteries suitable for a wide
range of portable applications.
The highly efficient switcher dc-to-dc architecture enables higher
charging currents as well as a lower temperature charging
operation that results in faster charging times because of the
following features:
• 3 MHz switch mode charger.
• 1.25 A charge current from dedicated charger.
• Up to 680 mA of charging current from a 500 mA
USB host.
The ADP5065 operates from an input voltage from 4 V to 5.5 V
but is tolerant of voltages of up to 20 V. This alleviates the concern
about USB bus spiking during disconnection or connection
scenarios.
The ADP5065 features an internal FET between the dc-to-dc
charger output and the battery. This permits battery isolation
and, hence, system powering in a dead battery or no battery
scenario, which allows for immediate system function on
connection to a USB power supply.
The ADP5065 is fully compliant with the USB 3.0 battery charging
specification and enables charging via the mini USB VBUS pin
from a wall charger, car charger, or USB host port. Based on the
type of USB source, which is detected by an external USB
detection device, the ADP5065 can be set to apply the correct
current limit for optimal charging and USB compliance. The USB
charger permits correct operation under all USB compliant
sources such as, wall chargers, host chargers, hub chargers, and
standard hosts and hubs.
A processor is able to control the USB charger using the I
program the charging current and numerous other parameters
including
• Trickle charge current level.
• Trickle charge voltage threshold.
• Weak charge (constant current) charge current level.
• Fast charge (constant current) charge current level.
• Fast charge (constant voltage) charge voltage level at 1%
accuracy.
• Fast charge safety timer period.
• Watchdog safety timer parameters.
• Weak battery threshold detection.
• Charge complete threshold.
• Recharge threshold.
• Charge enable/disable.
• Battery pack temperature detection and automatic charger
shutdown.
2
C to
Rev. B | Page 15 of 40
Page 16
D1
E1
D3
E3
SW1
SW2
VIN1
VIN2
C3
C4
B3
B4
A3
THR
+
–
NTC CURRENT
CONTROL
COLD
COOL
WARM
HOT
NTC
TRICKLE
CURRENT
SOURCE
E2
CFILT
+
–
C1
BATTERY DETECTION
+
–
TRICKLE
3.4V
1.9V
0.5V
WEAK
+
–
+
–
CHARGE CONTROL
CFILT
+
–
EOC
TO SYSTEM
LOAD
+
–
VIN
OVERVOLTAGE
+
–
VIN LIMIT
BATTERY
ISOLATION FET
+
–
VIN GOOD
CFILT – 150mV
+
–
BATTERY OVERVOLTAGE
HIGH VOLTAGE
BLOCKING FET
A2
B1
SCL
SDA
TO USB VBUS
OR WALL
ADAPTER
D4 E4C2
PGND1
PGND2
AGND
A4
B2
A1
IIN_EXT
TRK_EXT
V_WEAK_SET
OPTIONAL
+
–
D2
+
–
THERMAL CONT ROL
SINGLE CELL
Li-Ion
TSD 140ºC
WARNING 130ºC
ISOTHERMAL 115ºC
TSD DOWN 110ºC
SYS_ON_OK
SYSTEM
VOLTAGE OK
LOGIC
0.5V
3.9V
5.42V
HV-FET
CONTROL
3MHz OSC
IND_PEAK_INT
COIL
CURRENT
DETECTION
DC-DC CONTROL
ISO_S1
ISO_S2
ISO_B1
ISO_B2
BATTERY
DETECTION
SINK
BAT_SNS
I
2
C INTERFACE
AND
CONTROL LOGIC
CV-MODE
RECHARGE
BATTERY:
OPEN
SHORT
09370-031
ADP5065 Data Sheet
Figure 31. Block Diagram
Rev. B | Page 16 of 40
Page 17
Data Sheet ADP5065
0
Trickle charge enabled
The ADP5065 also includes a number of significant features to
optimize charging and functionality, including
• Thermal regulation for maximum performance.
• USB host current-limit accuracy: ±5 %.
• Termination voltage accuracy: ±1 %.
• Battery thermistor input with automatic charger shutdown
in the event that the battery temperature exceeds limits.
(Compliant with the JEITA L i-Ion battery charging
temperature specification.)
•Offloads processor to manage external pin (TRK_EXT)
control to enable/disable trickle charging.
•Direct external pin (IIN_EXT) control of 100 mA or
SE T, which is used for setting the V
the battery reaches the V
threshold, the ADP5065 pulls
WEAK
threshold. When
WEAK
down the SYS_EN_OK open-drain output flag. The flag can
be used to hold off system turn on until the battery is at the
minimum required level for a guaranteed system startup.
CHARGER MODES
Input Current Limit
The VINx input current limit is controlled via an internal I2C
ILIM register. The input current limit can also be controlled via
the IIN_EXT pin as outlined in Ta b l e 7. Any change in the I
default from 100 mA dominates over the pin setting.
Table 7. IIN_EXT Operation
IIN_EXT Function
0 100 mA input current limit or I2C programmed value
1 500 mA input current limit or I2C programmed value
(or reprogrammed I
2
C value from 100 mA default)
USB Compatibility
The ADP5065 charger provides support for the following
connections through the single connector VINx pin.
The ADP5065 features a programmable input current limit to
ensure compatibility with the requirements listed in Tabl e 8.
The current limit defaults to 100 mA to allow compatibility
with a USB host or hub that is not configured.
2
The I
C register default is 100 mA. An I2C write command
to the ILIM register overrides the IIN_EXT pin and the I
register default value can be reprogrammed for alternative
requirements.
When the input current limiting feature is used, the available
input current may be too low for the charger to meet the programmed charging current, I
, and the rate of charge is
CHG
reduced. In this case, the VIN_ILIM flag is set.
When connecting voltage to VINx without having the proper
voltage level on the battery side, the HV blocking part is in a
state wherein it draws only 1.3 mA (typical) of current until the
V
has reached the VIN_OK level.
IN
2
C
2
C
Table 8. Input Current Compatibility with Standard USB Limits
Mode Standard USB Limit ADP5065 Function
USB
(China
Only)
100 mA limit for standard USB host or hub
300 mA limit for
Chinese USB
100 mA input current limit
2
or I
C programmed value
300 mA input current limit
2
or I
C programmed value
specification
USB 2.0 100 mA limit for stan-
dard USB host or hub
500 mA limit for stan-
dard USB host or hub
USB 3.0 150 mA limit for
super speed USB 3.0
100 mA input current limit
2
or I
C programmed value
500 mA input current limit
2
or I
C programmed value
150 mA input current limit
2
or I
C programmed value
host or hub
900 mA limit for
super speed, high
900 mA input current limit
2
or I
C programmed value
speed USB host or
hub charger
Dedicated
Charger
1500 mA limit for
dedicated charger or
1500 mA input current limit
2
or I
C programmed value
low/full speed USB
host or hub charger
Trickle Charge Mode
A deeply discharged Li-Ion cell may exhibit a very low cell
voltage making it unsafe to charge the cell at high current rates. The
ADP5065 charger uses a trickle charge mode to reset the battery
pack protection circuit and lift the cell voltage to a safe level for fast
charging. A cell with a voltage below V
the trickle mode current, I
. During trickle charging mode,
TRK_DEAD
TRK_DEAD
is charged with
the CHARGER_STATUS register is set.
During trickle charging, the ISO_Sx node is regulated to
V
by the dc-to-dc converter and the battery isolation FET
ISO_STRK
is off, which means the battery is isolated from the system
power supply.
Trickle charging can be controlled via the TRK_EXT external
pin (see Ta b l e 9). Note that any change in the I
2
C EN_TRK bit
dominates over the pin setting.
Table 9. TRK_EXT Operation
TRK_EXT Function
1 Trickle charge disabled
Trickle Charge Mode Timer
The duration of trickle charge mode is monitored to ensure the
battery is revived from its deeply discharged state. If trickle
charge mode runs for longer than 60 minutes without the cell
voltage reaching V
, a fault condition is assumed and
TRK_DEAD
charging stops. The fault condition is asserted on the
CHARGER_STATUS register, allowing the user to initiate
the fault recovery procedure specified in the Fault Recovery
section.
Rev. B | Page 17 of 40
Page 18
ADP5065 Data Sheet
Weak Charge Mode (Constant Current)
When the battery voltage exceeds V
V
, the charger switches to the intermediate charge mode.
WEAK
TRK_DEAD
but is less than
During the weak charge mode, the battery voltage is too low to
allow the full system to power-up. Due to the low level of the
battery, the USB transceiver cannot be powered and, therefore,
cannot enumerate for more current from a USB host.
Consequently, the USB limit remains at 100 mA.
The system microcontroller may or may not be powered by the
charger output voltage (V
) depending upon the amount of
ISO_SFC
current required by the microcontroller and/or the system
architecture. In this case, the battery charge current (I
CHG_W EAK
)
cannot be increased above 20 mA to ensure the microcontroller
can still operate (if doing so) nor increased above the 100 mA
USB limit. Thus, set the battery charging current as follows:
•Set the default 20 mA via the linear trickle charger branch (to
ensure that the microprocessor remains alive if powered by
the main switching charger output, ISO_Sx). Any residual
current on the main switching charger output, ISO_Sx, is
used to charge the battery at up to the preprogrammed
level in the I
2
C for I
(fast charge current limit) or I
CHG
LIM
(input current limit).
•During weak current mode, other features may prevent the
actual programmed weak charging current from reaching
its full programmed value. Isothermal charging mode or
input current limiting for USB compatibility may affect the
programmed weak charging current value under certain
operating conditions. During weak charging, the ISO_Sx
node is regulated to V
by the battery isolation FET.
ISO_SFC
Fast Charge Mode (Constant Current)
When the battery voltage exceeds V
TRK_DEAD
and V
WEAK
, the
charger switches to fast charge mode, charging the battery with
the constant current, I
. During fast charge mode (constant
CHG
current), the CHARGER_STATUS register is set.
During constant current mode, other features may prevent the
current, I
, from reaching its full programmed value.
CHG
Isothermal charging mode or input current limiting for USB
compatibility may affect the value of I
under certain oper-
CHG
ating conditions. The voltage on ISO_Sx is regulated to stay at
V
by the battery isolation FET when V
ISO_SFC
ISO_B
< V
ISO_SFC
.
Rev. B | Page 18 of 40
Fast Charge Mode (Constant Voltage)
As the battery charges, its voltage rises and approaches the termination voltage, V
. The ADP5065 charger monitors the voltage
TRM
on the BAT_SNS pin to determine when charging should end.
However, the internal ESR of the battery pack combined with
PCB and other parasitic series resistances creates a voltage drop
between the sense point at the BAT_SNS pin and the cell terminal
itself. To compensate for this and ensure a fully charged cell, the
ADP5065 enters a constant voltage charging mode when the
termination voltage is detected on the BAT_SNS pin. The
ADP5065 reduces charge current gradually as the cell continues to
charge, maintaining a voltage of V
on the BAT_SNS pin. During
TRM
fast charge mode (constant voltage), the CHARGER_ STAT U S
register is set.
Fast Charge Mode Timer
The duration of fast charge mode is monitored to ensure that
the battery is charging correctly. If the fast charge mode runs for
longer than t
reaching V
without the voltage at the BAT_SNS pin
CHG
, a fault condition is assumed and charging stops.
TRM
The fault condition is asserted on the CHARGER_STATUS register allowing the user to initiate the fault recovery procedure
specified in the
If the fast charge mode runs for longer than t
Fault Recovery section.
CHG
, and V
TRM
has
been reached on the BAT_SNS pin but the charge current has
not yet fallen below I
, charging stops. No fault condition is
END
asserted in this circumstance and charging resumes as normal if
the recharge threshold is breached.
Watchdog Timer
The ADP5065 charger features a programmable watchdog timer
function to ensure charging is under the control of the
processor. The watchdog timer starts running when the
ADP5065 charger determines that the processor should be
operational, that is, when the processor sets the RESET_WD bit
for the first time or when the battery voltage is greater than the
weak battery threshold, V
. When the watchdog timer has
WEAK
been triggered, it must be reset regularly within the watchdog
timer period, t
WD
.
If the watchdog timer expires without being reset while in
charger mode, the ADP5065 charger assumes there is a software
problem and triggers the safety timer, t
. For more infor-
SAFE
mation see the Safety Timer section.
Page 19
Data Sheet ADP5065
Safety Timer
If the watchdog timer (see the Watchdog Timer section for
more information) expires while in charger mode, the ADP5065
charger initiates the safety timer, t
programmed charging parameters by this time, the I
the default value. Charging continues for a period of t
. If the processor has
SAFE
is set to
LIM
SAFE
, then
the charger switches off and sets the CHARGER_STATUS register.
Charge Complete
The ADP5065 charger monitors the charging current while
in constant voltage fast charge mode. If the current falls
below I
and remains below I
END
END
for t
END
, charging stops
and the CHDONE flag is set. If the charging current falls below
I
for less than t
END
and then rises above I
END
again, the t
END
END
timer resets.
Recharge
After the detection of charge complete, and the cessation of
charging, the ADP5065 charger monitors the BAT_SNS pin as
the battery discharges through normal use. If the BAT_SNS pin
voltage falls to V
, the charger reactivates charging. Under
RCH
most circumstances, triggering the recharge threshold results in
the charger starting directly into fast charge constant voltage
mode.
Battery Charging Enable/Disable
The ADP5065 charging function can be disabled by setting the
2
I
C EN_CHG bit to low.
THERMAL MANAGEMENT
Isothermal Charging
To assist with the thermal management of the ADP5065
charge r, the battery charger provides an isothermal charging
function. As the on-chip power dissipation and die temperature
increase, the ADP5065 charger monitors die temperature and
limits output current when the temperature reaches T
(typically at 115°C). The die temperature is maintained at T
through the control of the charging current into the battery. A
reduction in power dissipation or ambient temperature may
allow the charging current to return to its original value, and
the die temperature subsequently drops below T
LIM
isothermal charging, the THERM_LIM flag is set to high.
LIM
. During
LIM
Rev. B | Page 19 of 40
Thermal Shutdown and Thermal Early Warning
The ADP5065 switching charger features a thermal shutdown
threshold detector. If the die temperature exceeds T
SD
, the
ADP5065 charger is disabled, and the TSD 140°C bit is set. The
ADP5065 charger can be reenabled when the die temperature
drops below the T
To reset the TSD 140°C bit, write to the I
falling limit and the TSD 140°C bit is reset.
SD
2
C Fault Register 0x0D
or cycle the power.
Before die temperature reaches T
T
is exceeded. This allows the system to accommodate power
SDL
, the early warning bit is set if
SD
consumption before thermal shutdown occurs.
Fault Recovery
Before performing the following operation, it is important to
ensure that the cause of the fault has been rectified.
To recover from a charger fault (when the CHARGER_STATUS
equals 110), cycle power on VINx or write high to reset the I
2
C
fault bits in the fault register.
BATTERY ISOLATION FET
The ADP5065 charger features an integrated battery isolation
FET for power path control. The battery isolation FET isolates a
deeply discharged Li-Ion cell from the system power supply in
both trickle and fast charge modes, thereby allowing the system
to be powered at all times.
When VINx is below V
conducting mode.
The battery isolation FET is off during trickle charge mode.
When the battery voltage exceeds V
FET switches to the system voltage regulation mode. During
system voltage regulation mode, the battery isolation FET
maintains the V
ISO_SFC
battery voltage exceeds V
full conducting mode.
The battery isolation FET supplements the battery to support
high current functions on the system power supply.
When voltage on ISO_Sx drops below ISO_Bx, the battery
isolation FET enters into full conducting mode.
When voltage on ISO_Sx rises above ISO_Bx, the isolation FET
enters regulating mode or full conduction mode, depending on the
Li-Ion cell voltage and the dc-to-dc charger mode.
, the battery isolation FET is in full
VIN_OK
, the battery isolation
TRK
voltage on the ISO_Sx pins. When the
, the battery isolation FET is in
ISO_SFC
Page 20
ADP5065 Data Sheet
BATTERY DETECTION
Battery Level Detection
The ADP5065 charger features a battery detection mechanism to
detect an absent battery. The charger actively sinks and sources
current into the ISO_Bx/BAT_SNS node, and voltage vs. time is
detected. The sink phase is used to detect a charged battery,
whereas the source phase is used to detect a discharged b atter y.
The sink phase (see Figure 32) sinks I
ISO_Bx/ BAT_SNS pins for a time, t
below V
when the t
BATL
timer expires, the charger assumes no
BATOK
battery is present, and starts the source phase. If the BAT_SNS
exceeds the V
voltage when the t
BATL
charger assumes the battery is present, and begins a new charge
cycle.
The source phase sources I
BAT_SNS pins for a time, t
V
before the t
BATH
BATOK
SOURCE
BATOK
timer expires, the charger assumes that
no battery is present. If the BAT_SNS does not exceed the V
voltage when the t
timer expires, the charger assumes that a
BATOK
battery is present, and begins a new charge cycle.
current from the
SINK
. If the BAT_SNS pin is
BATOK
timer expires, the
BATOK
current to ISO_Bx or the
. If the BAT_SNS pin exceeds
BATH
Battery (ISO_Bx) Short Detection
A battery short occurs under a damaged battery condition or
when the battery protection circuitry is enabled.
On commencing trickle charging, the ADP5065 charger monitors the battery voltage. If this battery voltage does not exceed
V
within the specified timeout period, t
BAT_ SHR
BAT_ SHR
, a fault is
declared and the charger is stopped by turning the battery
isolation FET off but the system voltage is maintained at
V
by the linear regulator.
ISO_STRK
The trickle charge branch is active during the battery short
scenario, and trickle charge current to the battery is maintained
until the 60 minute trickle charge mode timer expires.
After source phase, if the ISO_Bx or BAT_SNS level remains
below V
, either the battery voltage is low or the battery node
BATH
can be shorted. As a result of the battery voltage being low,
trickle charging mode is initiated (see Figure 33). If the
BAT_SNS level remains below V
BAT_ SHR
after t
BAT_ SHR
has elapsed,
the ADP5065 assumes that the battery node is shorted.
Rev. B | Page 20 of 40
Page 21
Data Sheet ADP5065
OPEN
ISO_Bx
SINK PHASE
LOGIC
STATUS
OPEN
OR
SHORT
t
BAT_OK
V
BATL
I
SINK
ISO_Bx
OPEN
OPEN
LOGIC
STATUS
SOURCE PHASE
t
BAT_OK
V
BATH
I
SOURCE
09370-032
SHORT
SINK PHASESOURCE P HAS ETRICKLE CHARGE
ISO_Bx
SHORT
ISO_Bx
SHORT
ISO_Bx
LOGIC
STATUS
OPEN
OR
SHORT
t
BAT_OK
LOGIC
STATUS
SHORT
OR
LOW
BATTERY
t
BAT_OK
LOGIC
STATUS
SHORT
t
BAT_SHR
V
BATL
V
BATH
V
BAT_SHR
I
SOURCE
I
TRK_DEAD
I
SINK
09370-033
Figure 32. Battery Detection Sequence
Figure 33. Battery Short Detection Sequence
Rev. B | Page 21 of 40
Page 22
ADP5065 Data Sheet
JEITA Cool Temperature Limit—Reduced Charge Current Levels
BATTERY PACK TEMPERATURE SENSING
Battery Thermistor Input
The ADP5065 charger features battery pack temperature
sensing that precludes charging when the battery pack
temperature is outside the specified range. The THR pin
provides an on and off switching current source, which should
be connected directly to the battery pack thermistor terminal.
The activation interval of the THR current source is 167 ms.
The battery pack temperature sensing can be controlled by
2
I
C using the conditions shown in Tab l e 10. Note that the
2
I
C register default setting for EN_THR (Register 0x07) is
0 = temperature sensing off.
Table 10. THR Input Function
Conditions
VINx V
Open or VIN = 0 V to 4.0 V <2.5 V Off
Open or VIN = 0 V to 4.0 V >2.5 V Off, controlled by I2C
4.0 V to 5.5 V Don't care Always on
If the battery pack thermistor is not connected directly to the
ADP5065 THR pin, a 10 kΩ (tolerance ±20%) dummy resistor
must be connected between the THR input and GND. Leaving
the THR pin open results in a false detection of the battery
temperature being <0°C and charging is disabled.
ISO_B
THR Function
The ADP5065 charger monitors the voltage in the THR pin and
suspends charging if the current is outside the range of less than
0°C or greater than 60°C. For temperatures greater than 0°C,
the THR_STATUS register is set accordingly, and for temperatures
lower than 60°C, the THR_STATUS register is, likewise, set
accordingly.
The ADP5065 charger is designed for use with an NTC
thermistor in the battery pack with a nominal room temperature value of either 10 kΩ at 25°C or 100 kΩ at 25°C, which is
selected by a fuse.
The ADP5065 charger is designed for use with an NTC
thermistor in the battery pack with a temperature coefficient
curve (beta). Fuse-selectable beta programming is supported by
eight steps covering a range from 3150 to 4400 (see Tabl e 34).
JEITA Li-Ion Battery Temperature Charging Specification
The ADP5065 is compliant with the JEITA Li-Ion battery
charging temperature specifications as outlined in Table 11.
The JEITA function can be enabled via the I
2
C interface. When
the ADP5065 detects a JEITA cool condition, charging current
is reduced according to Table 12.
When the ADP5065 identifies a hot or cold battery condition,
the ADP5065 takes the following actions:
• Stops charging the battery.
• Connects/enables the battery isolation FET such that the
system power supply node is connected to the battery.
JEITA Cold Temperature Limits I
JEITA Cool Temperature Limits I
No battery charging occurs. 0 °C
JEITA_COLD
Battery charging occurs at approximately 50% of programmed level.
JEITA_COOL
0 10 °C
See Table 12 for specific charging current reduction levels.
JEITA Typical Temperature Limits I
JEITA Warm Temperature Limits I
Normal battery charging occurs at default/programmed levels. 10 45 °C
JEITA_TYP
JEITA_WARM
Battery termination voltage (V
) is reduced by 100 mV from
TRM
45 60 °C
programmed value.
JEITA Hot Temperature Limits I
No battery charging occurs. 60 °C
JEITA_HOT
Table 12. JEITA Reduced Charge Current Levels
ICHG[2:0] (Default) ICHG JEITA (mA)
000 = 550 mA 250
001 = 650 mA 300
010 = 750 mA 350
011 = 850 mA 400
100 = 950 mA 450
101 = 1050 mA 500
110 = 1150 mA 550
111 = 1250 mA 600
Rev. B | Page 22 of 40
Page 23
Data Sheet ADP5065
20
17.8
2.8 V
2.7 V
EXTERNAL RESISTOR FOR V_WEAK_SET
The ADP5065 charger features a V
used for enabling the main PMU system. When battery voltage
at the BAT_SNS pin exceeds the V
down the SYS_ON_OK open-drain flag.
threshold, which can be
WEAK
level, the ADP5065 pulls
WEAK
The V
an external resistor connected between the V_WEAK_SET pin
and GND. Recommended resistor values for each threshold are
listed in Table 13.
If an external resistor is not used, it is recommended to tie the
V_WEAK_SET pin to AGND for V
Table 13. Resistor Values for V_WEAK_SET Pin
Target Resistor Value E24 (kΩ) Actual Threshold (kΩ)
Short to GND Not applicable I2C (3.0 V default) I2C programmed − 100 mV
15 13.2 2.7 V 2.6 V
27 23.5 2.9 V 2.8 V
36 31.0 3.0 V 2.9 V
47 41.3 3.1 V 3.0 V
68 56.2 3.2 V 3.1 V
100 79.7 3.3 V 3.2 V
Open 122.4 3.4 V 3.3 V
threshold can be programmed set either by I2C or by
WEAK
to obtain its default value.
WEAK
Voltage
V
WEAK
(Rising Threshold)
V
Voltage
WEAK
(Falling Threshold)
Rev. B | Page 23 of 40
Page 24
ADP5065 Data Sheet
I2C INTERFACE
The ADP5065 includes an I2C-compatible serial interface for
control of the charging and for a readback of system status
registers. The I
in read mode.
Register values are reset to the default values, when the supply
voltage at the VINx pin falls below the V
threshold. The I
disconnected and V
ST0010100000SP000
2
C chip address is 0x28 in write mode and 0x29
falling voltage
2
C registers are also reset when the battery is
is 0 V.
IN
ST0010100000
VIN_OK
0 = WRITEMASTER STOP
0
CHIP ADDRESS
ADP5065 ACK
Figure 34. I
0 = WRITEMASTER STOP
CHIP ADDRESS
SUBADDRESS
REGISTER N
SUBADDRESS
2
C Single Register Write Sequence
ADP5065 RECEIVES
DATA TO REGISTER N
See Figure 34 for an example of the I
single register. The subaddress content selects which one of the
five ADP5065 registers is written to first. The ADP5065 sends
an acknowledgement to the master after the 8-bit data byte has
been written. The ADP5065 increments the subaddress
automatically and starts receiving a data byte to the following
register until the master sends an I
2
Figure 36 shows the I
C read sequence of a single register.
ADP5065 sends the data from the register denoted by the
subaddress and increments the subaddress automatically,
sending data from the next register until the master sends an
2
I
C stop condition as shown in Figure 37.
ADP5065 RECEIV E S
DATA
ADP5065 ACK
ADP5065 RECEIVES
DATA TO REGISTER N + 1
ADP5065 ACK
2
C write sequence to a
2
C stop as shown in Figure 35.
SP
09370-034
ADP5065 RECEIVES
DATA TO LAST REGISTER
ADP5065 ACK
0 = WRITE
ST00101000000000110ST001010001SP01
CHIP ADDRESSSUBADDRESSCHIP ADDRESSADP5065 SENDS DATA
ADP5065 ACK
0 = WRITE
S
0010100 000
T
CHIP ADDRESSS UB ADDRE SS
0
REGISTER N
ADP5065 ACK
S
T
ADP5065 ACK
ADP5065 ACK
2
Figure 35. I
Figure 36. I
001010001
Figure 37. I
C Multiple Register Write Sequence
ADP5065 ACK
2
C Single Register Read Sequence
1 = READMASTER STOP
0
CHIP ADDRESSADP5065 SENDS
2
C Multiple Register Read Sequence
DATA OF RE GISTER N
ADP5065 ACK
ADP5065 ACK
MASTER ACK
ADP5065 ACK
1 = READ
ADP5065 ACK
ADP5065 SENDS
DATA OF RE GISTER
N + 1
ADP5065 ACK
01
ADP5065 SENDS
DATA OF L AST
REGISTER
MASTER ACK
ADP5065 NO ACK
MASTER ACK
09370-035
09370-036
S
P
09370-037
Rev. B | Page 24 of 40
Page 25
Data Sheet ADP5065
VINOK
Y
N
FAST CHARGE
Y
WATCHDOG
EXPIRED
START
t
SAFE
I
BUS
= 100mA
TFAULT/
BAD BATTERY
RUN
BATTERY
DETECTION
IBUSLIM = HIGH
I
VIN
= I
LIM
THERMLIM = HIGH
TEMP = T
LIM
WATCHDOG
EXPIRED
START
t
SAFE
I
BUS
= 100mA
TFAULT/
BAD BATTERY
(SEE TIMER SECTION)
CC-MODE
CHARGING
CV-MODE
CHARGING
N
N
CHARGE
COMPLETE
Y
Y
N
N
TRICKLE
CHARGE
Y
Y
N
N
Y
N
N
Y
N
N
Y
VINOK
VINOK
Y
Y
N
N
N
Y
Y
N
Y
Y
N
Y
POWER ON RESET
RESET ALL
REGISTERS
RUN
BATTERY
DETECTION
t
START
EXPIRED
t
WD
EXPIRED
t
WD
EXPIRED
t
SAFE
/
t
TRK
EXPIRED
t
SAFE
/
t
CHG
EXPIRED
V
BAT_SNS
=
V
TRM
V
BAT_SNS
≤
V
NOBAT
V
BAT_SNS
≤
V
RCH
I
OUT
< I
END
POWER
DOWN
V
BAT_SNS
<
V
TRK
V
BAT_SNS
<
V
TRK
I
VIN
< I
LIM
TEMP < T
LIM
09370-038
CHARGER OPERATIONAL FLOWCHART
Figure 38. ADP5065 Operational Flowchart
Rev. B | Page 25 of 40
Page 26
ADP5065 Data Sheet
D7
D6
D5
D4
D3
D2
D1
D0
Addr.
Name
0x04
Charging
C/20 EOC
C/10 EOC
High
ICHG
ITRK_DEAD
0x09
Interrupt
EN_IND_PEAK_INT
EN_THERM_LIM_INT
EN_WD_INT
EN_TSD_INT
EN_THR_INT
EN_BAT_INT
EN_CHG_INT
EN_VIN_INT
Charger
I2C REGISTER MAP
Table 14. I2C Register Map1
Register
Manufac-
0x00
turer and
model ID
Silicon
0x01
revision
VINx pins
0x02
settings
Termina-
0x03
tion
settings
current
Voltage
0x05
threshold
Timer
0x06
settings
Functional
0x07
Settings1
Functional
0x08
Settings2
enable
Interrupt
0x0A
active
0x0B
Status 1
Charger
0x0C
Status 2
Fault
0x0D
register
Battery
0x10
short
1
Each blank cell indicates a bit that is not used.
REV
RFU ILIM
VRCH VTRK_DEAD VWEAK
EN_TEND EN_CHG_TIMER CHG_TMR_PERIOD EN_WD WD PERIOD RESET_WD
Table 15. Manufacturer and Model ID, Register Address 0x00 Bit Descriptions
Bit No. Mnemonic Access Default Description
[3:0] MODEL[3:0] R 1000 The 4-bit model identification bus.
Table 16. Silicon Revision, Register Address 0x01 Bit Descriptions
[7:4] Not Used R
[3:0] REV[3:0] R 0011 The 4-bit silicon revision identification bus.
Table 17. VINx Settings, Register Address 0x02 Bit Descriptions
Bit No. Mnemonic Access Default Description
[7:5] Not Used R
4 RFU R/W 0 Reserved for future use.
[3:0] ILIM[3:0] R/W 0000 = 100 mA VINx pin input current-limit programming bus. The current into VINx
Table 18. Termination Settings, Register Address 0x03 Bit Descriptions
Bit No. Mnemonic Access Default Description
[7:2] VTRM[5:0] R/W 100011 = 4.20 V Termination voltage programming bus. The values of the float
voltage can be programmed as per the following values:
000000 = 3.50 V.
000001 = 3.52 V.
000010 = 3.54 V.
000011 = 3.56 V.
000100 = 3.58 V.
000101 = 3.60 V.
000110 = 3.62 V.
001000 = 3.66 V.
001001 = 3.68 V.
001010 = 3.70 V.
001011 = 3.72 V.
001100 = 3.74 V.
001101 = 3.76 V.
001110 = 3.78 V.
001111 = 3.80 V.
010000 = 3.82 V.
010001 = 3.84 V.
010010 = 3.86 V.
010011 = 3.88 V.
010100 = 3.90 V.
010101 = 3.92 V.
010110 = 3.94 V.
010111 = 3.96 V.
011001 = 4.00 V.
011010 = 4.02 V.
011011 = 4.04 V.
011100 = 4.06 V.
011101 = 4.08 V.
011110 = 4.10 V.
011111 = 4.12 V.
100000 = 4.14 V.
100001 = 4.16 V.
100010 = 4.18 V.
100011 = 4.20 V.
100100 = 4.22 V.
100101 = 4.24 V.
100110 = 4.26 V.
100111 = 4.28 V.
101000 = 4.30 V.
101010 = 4.34 V.
101011 = 4.36 V.
101100 = 4.38 V.
101101 = 4.40 V.
101110 to 111111 = 4.42 V.
Rev. B | Page 28 of 40
Page 29
Data Sheet ADP5065
Termination current programming bus. The values of the termination
00 = 5 mA.
01 = 140 mV.
Bit No. Mnemonic Access Default Description
[1:0] IEND[1:0] R/W 01 = 52.5 mA
current can be programmed as per the following values:
00 = 32.5 mA.
01 = 52.5 mA.
10 = 72.5 mA.
11 = 92.5 mA.
Table 19. Charging Current, Register Address 0x04 Bit Descriptions
Bit No. Mnemonic Access Default Description
7 C/20 EOC R/W The C/20 bit has priority over the other settings (C/10 EOC and IEND).
6 C/10 EOC R/W
5 Tied high in metal R 1
[4:2] ICHG[2:0] R/W 111 = 1250 mA Fast charge current programming bus. The values of the constant
[1:0] ITRK_DEAD[1:0] R/W 10 = 20 mA Trickle and weak charge current programming bus. The values of the
When this bit is set to high, C/20 programming is used. 27.5 mA
minimum value.
The C/10 bit has priority over the other setting (END) but not C/20
EOC.
When this bit is set to high, C/10 programming is used unless C/20
EOC is set to high. 27.5 mA minimum value.
current charge can be programmed as per the following values:
000 = 550 mA.
001 = 650 mA.
010 = 750 mA.
011 = 850 mA.
100 = 950 mA.
101 = 1050 mA.
110 = 1150 mA.
111 = 1250 mA.
trickle and weak charge currents can be programmed as per the
following values:
01 = 10 mA.
10 = 20 mA.
11 = 20 mA.
Table 20. Voltage Threshold, Register Address 0x05 Bit Descriptions
Bit No. Mnemonic Access Default Description
7 Not used R
[6:5] VRCH[1:0] R/W 11 = 260 mV Recharge voltage programming bus. The values of the recharge
threshold can be programmed as per the following values:
00 = 80 mV.
10 = 200 mV.
11 = 260 mV.
[4:3] VTRK_DEAD[1:0] R/W 01 = 2.5 V Trickle to fast charge dead battery voltage programming bus. The
values of the trickle to fast charge threshold can be programmed as
per following values:
00 = 2.4 V.
01 = 2.5 V.
10 = 2.6 V.
11 = 3.3 V.
Rev. B | Page 29 of 40
Page 30
ADP5065 Data Sheet
011 = 3.0 V.
3
CHG_TMR_PERIOD
R/W
1
Trickle/fast charge timer period.
4
EN_THR
R/W 0 When high, the THR current source is enabled even when the
Bit No. Mnemonic Access Default Description
[2:0] VWEAK[1:0] R/W 011 = 3.0 V Weak battery voltage rising threshold.
000 = 2.7 V.
001 = 2.8 V.
010 = 2.9 V.
100 = 3.1 V.
101 = 3.2 V.
110 = 3.3 V.
111 = 3.4 V.
Table 21. Timer Settings, Register Address 0x06 Bit Descriptions
Bit No. Mnemonic Access Default Description
[7:6] Not used
5 EN_TEND R/W 1 When low, this bit disables the charge complete timer (t
ms deglitch timer remains on this function.
4 EN_CHG_TIMER R/W 1 When high, the trickle/fast charge timer is enabled.
0 = 30 sec/300 minutes.
1 = 60 sec/600 minutes.
2 EN_WD R/W 1 When high, the watchdog timer safety timer is enabled.
When low, the watchdog timer is disabled even when BAT_SNS
exceeds V
DEAD
.
1 WD PERIOD R/W 0 Watchdog safety timer period.
0 = 32 sec/40 minutes.
1 = 64 sec/40 minutes.
0 RESET_WD W 0 High resets the watchdog safety timer. Bit is reset automatically.
), and a 31
END
Table 22. Functional Settings1, Register Address 0x07 Bit Descriptions
Bit No. Mnemonic Access Default Description
7 EN_JEITA R/W 0 When low, this bit disables the JEITA Li-Ion temperature battery
6 DIS_IPK_SD R/W 1 When high, this bit disables the automatic shutdown of the device if
5 EN_BMON R/W 0 When high, the battery monitor is enabled even when the voltage at
3 Not used R/W 0
2 EN_EOC R/W 1 When high, end of charge is allowed.
1 EN_TRK R/W 1 When low, trickle charger is disabled and the dc-to-dc converter is
0 EN_CHG R/W 1 When low, the dc-to-dc converter is disabled.
Table 23. Functional Settings2, Register Address 0x08 Bit Descriptions
Bit No. Mnemonic Access Default Description
[7:0] Not used R/W
Table 24. Interrupt Enable, Register Address 0x09 Bit Descriptions
Bit No. Mnemonic Access Default Description
7 EN_IND_PEAK_INT R/W 0 When high, the inductor peak current-limit interrupt is allowed.
6 EN_THERM_LIM_INT R/W 0 When high, the isothermal charging interrupt is allowed.
5 EN_WD_INT R/W 0 When high, the watchdog alarm interrupt is allowed.
4 EN_TSD_INT R/W 0 When high, the overtemperature interrupt is allowed.
3 EN_THR_INT R/W 0 When high, the THR temperature thresholds interrupt is allowed.
charging specification.
four peak inductor current limits are reached in succession. In
addition, when high, it only flags the Status Bit IPK_STAT.
the VINx pins is below V
voltage at the VINx pins is below V
enabled.
Rev. B | Page 30 of 40
VIN_OK
.
.
VIN_OK
Page 31
Data Sheet ADP5065
1
EN_CHG_INT
R/W 0 When high, the charger mode change interrupt is allowed.
2
BAT_INT
R 0 When high, this bit indicates an interrupt caused by battery voltage thresholds.
5
VIN_ILIM
R
Not applicable
When high, this bit indicates that the current into a VINx pin is
101 = suspend.
Bit No. Mnemonic Access Default Description
2 EN_BAT_INT R/W 0 When high, the battery voltage thresholds interrupt is allowed.
0 EN_VIN_INT R/W 0 When high, the VINx pin voltage thresholds interrupt is allowed.
Table 25. Interrupt Active, Register Address 0x0A Bit Descriptions
Bit
No. Mnemonic Access Default Description
7 IND_PEAK_INT R 0 When high, this bit indicates an interrupt caused by an inductor peak current limit.
6 THERM_LIM_INT R 0 When high, this bit indicates an interrupt caused by isothermal charging.
5 WD_INT R 0 When high, this bit indicates an interrupt caused by the watchdog alarm. The watchdog
timer expires within 2 sec or 4 sec depending on the WDPERIOD setting of 32 sec or 64 sec,
respectively.
4 TSD_INT R 0 When high, this bit indicates an interrupt caused by an overtemperature fault.
3 THR_INT R 0 When high, this bit indicates an interrupt caused by THR temperature thresholds.
1 CHG_INT R 0 When high, this bit indicates an interrupt caused by a charger mode change.
0 VIN_INT R 0 When high, this bit indicates an interrupt caused by VINx voltage thresholds.
Table 26. Charger Status 1, Register Address 0x0B Bit Descriptions
Bit No. Mnemonic Access Default Description
7 VIN_OV R Not applicable When high, this bit indicates that the voltage at the VINx pins
exceeds V
6 VIN_OK R Not applicable When high, this bit indicates that the voltage at the VINx pins
exceeds V
VIN_OV
VIN_OK
.
.
limited by the high voltage blocking FET and the charger is not
running at the full programmed I
CHG
.
4 THERM_LIM R Not applicable When high, this bit indicates that the charger is not running at the
full programmed I
but is limited by the die temperature.
CHG
3 CHDONE R Not applicable When high, this bit indicates the end of charge cycle has been
reached. This bit latches on, in that it does not reset to low when the
threshold is breached.
V
RCH
[2:0] CHAGER_STATUS[2:0] R Not applicable Charger status bus.
4 IPK_STAT R Not applicable Peak current limit status bit. Set high if four or more peak inductor
current limits are reached in succession.
[2:0] B ATT E RY_STATUS[2:0] R Battery status bus.
000 = battery monitor off.
001 = no battery.
010 = BAT_SNS < V
011 = V
≤ BAT_SNS < V
TRK
100 = BAT_SNS ≥ V
Table 28. Fault Register, Register Address 0x0D Bit Descriptions1
Bit No. Mnemonic Access Default Description
[7:4] Not Used
3 BAT_SHR R/W 0 When high, a battery short detection has occurred.
2 IND_PEAK_INT R/W 0 When high, an inductor peak current-limit fault has occurred.
1 TSD 130°C R/W 0 When high, the overtemperature (lower) fault has occurred.
0 TSD 140°C R/W 0 When high, the overtemperature fault has occurred.
1
To reset the fault bits in the fault register, cycle power on VINx or write high to the corresponding I2C bit.
Table 29. Battery Short, Register Address 0x10 Bit Descriptions
The high switching frequency of the ADP5065 buck converter
allows for the selection of small chip inductors. Suggested
inductors are shown in Tab l e 33.
The peak-to-peak inductor current ripple is calculated using
the following equation:
where:
V
is the ISO_Sx node output voltage.
OUT
V
is the converter input voltage at the CFILT node.
IN
f
is the switching frequency.
SW
L is the inductor value.
The minimum dc current rating of the inductor must be greater
than the inductor peak current. The inductor peak current is
calculated using the following equation:
The worst-case capacitance accounting for capacitor variation
over temperature, component tolerance, and voltage is calculated using the following equation:
C
= C
EFF
× (1 − TEMPCO) × (1 − TOL)
OUT
where:
C
is the effective capacitance at the operating voltage.
EFF
TEMPCO is the worst-case capacitor temperature coefficient.
TOL is the worst-case component tolerance.
In this example, the worst-case temperature coefficient
(TEMPCO) over −40°C to +85°C is assumed to be 15% for an
X5R dielectric. The tolerance of the capacitor (TOL) is assumed
to be 10%, and C
is 16 μF at 4.2 V, as shown in Figure 39.
OUT
Substituting these values in the equation yields
C
= 16 μF × (1 − 0.15) × (1 − 0.1) ≈ 12.24 μF
EFF
Inductor conduction losses are caused by the flow of current
through the inductor, which has an associated internal dc
resistance (DCR). Larger sized inductors have smaller DCR,
which may decrease inductor conduction losses. Inductor core
losses are related to the magnetic permeability of the core material.
Because the bucks are high switching frequency dc-to-dc
converters, shielded ferrite core material is recommended for
its low core losses and low EMI.
ISO_Sx (V
) and ISO_Bx Capacitor Selection
OUT
To safely obtain stable operation of the ADP5065, the ISO_Sx
and ISO_Bx effective capacitance (including temperature and
dc bias effects) must not be less than 10 µF at any point during
operation. The combined effective capacitance of the ISO_Sx
capacitor and the system capacitance must not exceed 50 µF at
any point during operation.
Higher output capacitor values reduce the output voltage ripple
and improve load transient response. When choosing this value,
Figure 39. Murata GRM31CR60J226ME19C DC Characteristic
To guarantee the performance of the charger in various
operation modes including trickle charge, constant current
charge, and constant voltage charge, it is imperative that the
effects of dc bias, temperature, and tolerances on the behavior
of the capacitors be evaluated for each application.
The peak-to-peak output voltage ripple for the selected output
capacitor and inductor values is calculated using the following
equation:
it is also important to account for the loss of capacitance due to
output voltage dc bias.
trics, each with a different behavior over temperature and
applied voltage. Capacitors must have a dielectric adequate
Ceramic capacitors are manufactured with a variety of dielec-
enough to ensure the minimum capacitance over the necessary
Capacitors with lower effective series resistance (ESR) are
preferable to guarantee low output voltage ripple, as shown in
the following equation:
temperature range and dc bias conditions. X5R or X7R dielectrics
with a voltage rating of 6.3 V or 10 V are recommended for best
performance. Y5V and Z5U dielectrics are not recommended
for use with any dc-to-dc converter because of their poor temperature and dc bias characteristics.
Rev. B | Page 33 of 40
Page 34
ADP5065 Data Sheet
CFILT
SISO
CFILT
SISO
MAXCHGLOAD
CIN
V
VVV
II
)(
__
)(
−
≥
+
Murata
GRM188R60J475ME84
4.7 μF
6.3 V
0603
Murata
LQH32PN1R0NN0
2.3 A
45
3.5 × 2.7 × 1.7
VINx Capacitor Selection
According to the USB 2.0 specification, USB peripherals have a
detectable change in capacitance on VBUS when they are attached.
The peripheral device VBUS bypass capacitance must be at least
1 µF but not larger than 10 µF. The combined capacitance for
the VINx and CFILT pins must not exceed 10 µF at any temperature or dc bias condition. Suggestions for a VINx capacitor is
given in Table 32.
CFILT Capacitor Selection
CFILT pin serves the ADP5065 as the step-down dc-to-dc
converter input capacitor. Maximum input capacitor current
is calculated using the following equation:
Table 30. ISO_Sx and ISO_Bx Capacitor Suggestions
Vendor Part Number Value Voltage Size
Murata GRM31CR61A226KE19 22 μF 10 V 1206
Murata GRM31CR60J226ME19 22 μF 6.3 V 1206
TDK C3216X5R0J226M 22 µF 6.3 V 1206
TAIYO -
JMK316ABJ226KL 22 µF 6.3 V 1206
YUDEN
Table 31. CFILT Capacitor Suggestions
Vendor Part Number Value Voltage Size
Murata GRM219R61C475KE15 4.7 μF 16 V 0805
TDK C1608X5R0J475K 4.7 μF 6.3 V 0603
TAIYO -
JMK107ABJ106MA 10 µF 6.3 V 0603
YUDEN
To minimize supply noise, place the input capacitor as close as
possible to the CFILT pin of the charger. As with the output
capacitor, a low ESR capacitor is recommended.
The effective capacitance needed for stability, which includes
temperature and dc bias effects, is a minimum of 2 µF and a
maximum of 5 µF. A list of suggested capacitors is shown in
Tabl e 31.
Poor layout can affect ADP5065 performance, causing electromagnetic interference (EMI) and electromagnetic compatibility
(EMC) problems, ground bounce, and voltage losses. Poor
layout can also affect regulation and stability. A good layout is
implemented using the following guidelines:
•Place the inductor, input capacitor, and output capacitor
close to the IC using short tracks. These components carry
high switching frequencies, and large tracks act as antennas.
•Route the output voltage path away from both the inductor
and SWxnode to minimize noise and magnetic interference.
•Maximize the size of ground metal on the component side
to help with thermal dissipation.
•Use a ground plane with several vias connecting to the
component side ground to further reduce noise
interference on sensitive circuit nodes.
Figure 40. Reference Circuit Diagram
Rev. B | Page 35 of 40
Page 36
ADP5065 Data Sheet
8mm
PGND
PGND
PGND
11.5mm
V
IN
ADP5065
C
IN
2.2µF
C
CFILT
4.7µF
C
ISO_S
22µF
L 1µH
C
ISO_B
22µF
09370-041
Figure 41. PCB Layout Suggestion
Rev. B | Page 36 of 40
Page 37
Data Sheet ADP5065
100%×=
IN
OUT
P
P
η
12
+1
)(
r
II
OUT
RMSOUT
×=
POWER DISSIPATION AND THERMAL CONSIDERATIONS
The ADP5065 is a highly efficient USB compliant charger.
However, if the device operates at high ambient temperatures
and maximum current charging and loading conditions, the
junction temperature can reach the maximum allowable
operating limit (125°C).
When the temperature exceeds 140°C, the ADP5065 turns off
allowing the device to cool down. When the die temperature
falls below 110°C and the TSD 140°C fault bit in Register 0x0D
is cleared by an I
2
C write, the ADP5065 resumes normal
operation.
This section provides guidelines to calculate the power dissipated in the device and ensure that the ADP5065 operates
below the maximum allowable junction temperature.
The output power of the ADP5065 charger is gived by
P
= V
× I
OUT
ISO_S
LOAD
+ V
ISO_B
× I
(1)
CHG
where:
P
is the total output power to the system and battery.
OUT
V
is the ISO_Sx pin voltage.
ISO_S
I
is the load current from ISO_Sx node.
LOAD
V
is the battery voltage.
ISO_B
I
is the charge current.
CHG
The efficiency of the ADP5065 is given by
(2)
where:
η is the efficiency.
P
is the input power.
IN
Power loss is given by
P
= PIN − P
LOSS
(3a)
OUT
or
P
= P
LOSS
(1− η)/η (3b)
OUT
Power dissipation can be calculated in several ways. The most
intuitive and practical is to measure the power dissipated at the
input and both outputs (ISO_Sx and ISO_Bx). Perform the measurements at the worst-case conditions (voltages, currents, and
temperature). The difference between input and output power
is dissipated in the device and the inductor. Use Equation 5
to derive the power lost in the inductor and, from this, use
Equation 4 to calculate the power dissipation in the ADP5065
charger.
A second method to estimate the power dissipation uses the
system voltage and charging efficiency curves provided for the
ADP5065. When the efficiency is known, use Equation 3b to
derive the total power lost in the dc-to-dc converter, isolation
FET and inductor; use Equation 5 to derive the power lost in
the inductor, and then calculate the power dissipation in the
buck converter using Equation 4.
Note that the ADP5065 efficiency curves are typical values and
may not be provided for all possible combinations of V
and I
To account for these variations, it is necessary to
OU T.
, V
IN
OUT
include a safety margin when calculating the power dissipated in
the charger.
CHARGER POWER DISSIPATION
The power loss of the step-down charger is approximated by
= P
P
LOSS
where:
P
is the power dissipation of the ADP5065 charger.
DCHG
P
is the inductor power losses.
L
The inductor losses are external to the device, and they do not
have any effect on the die temperature. Equation 5 estimates the
inductor losses without core losses. Some inductor manufacturers
provide web tools to estimate power inductor core losses based
on inductor type, switching frequency, and ripple current. At a
switching frequency of 3 MHz, the core losses can add inductor
losses significantly.
P
≈ I
L
where:
DCR
is the inductor series resistance.
L
I
is the summary of rms load current and charging
OUT(RMS)
current (I
where r is the normalized inductor ripple current.
r = V
where:
L is the inductance.
f
is the switching frequency.
SW
D is the duty cycle.
D = V
+ PL (4)
DCHG
2
× DCRL (5)
OUT(RMS)
+ I
LOAD(RMS)
CHG
).
(6)
× (1 − D)/(I
OUT
OUT/VIN
(8)
× L × fSW) (7)
OUT
,
Rev. B | Page 37 of 40
Page 38
ADP5065 Data Sheet
JUNCTION TEMPERATURE
In cases where the ambient temperature, TA, is known, the
thermal resistance parameter, θ
junction temperature rise. T
the formula
T
= TA + (PD × θJA) (9)
J
The typical θ
value for the 20-bump WLCSP is 46.8°C/W (see
JA
Tabl e 5). A very important factor to consider is that θ
on a 4-layer, 4 in × 3 in, 2.5 oz copper board as per JEDEC
standard, and real applications may use different sizes and
layers. It is important to maximize the copper to remove the heat
from the device. Copper exposed to air dissipates heat better
than copper used in the inner layers.
When designing an application for a particular ambient
temperature range, calculate the expected ADP5065 power
dissipation (P
temperature, T
). From this power calculation, the junction
D
, can be estimated using Equation 9.
J
, can be used to estimate the
JA
is calculated from TA and PD using
J
is based
JA
Maximum junction temperature (T
from the board temperature (T
using the formula
T
= TA + (PD × θJB) (10)
J
where θ
is the junction-to-board thermal resistance.
JB
The typical value for the 20-bump WLCSP is 9.2°C/W (see
Tabl e 5). θ
is based on a 4-layer, 4 in × 3 in, 2.5 oz copper
JB
board, as per the JEDEC standard.
For a WLCSP device, where possible, remove heat from every
current carrying bump (PGNDx, VINx, SWx, ISO_Sx, and
ISO_Bx). For example, thermal vias to the board power planes
can be placed close to these pins, where available.
The reliable operation of the charger can be achieved only if the
estimated die junction temperature of the ADP5065 (Equation 9)
is less than 125°C. Reliability and mean time between failures
(MTBF) are highly affected by increasing the junction temperature. Additional information about product reliability is
available in the ADI Reliability Handbook at the following URL: