Datasheet ADP3211, ADP3211A Datasheet (ON Semiconductor)

Page 1
© Semiconductor Components Industries, LLC, 2009
April, 2009 Rev. 0
1 Publication Order Number:
ADP3211/D
ADP3211, ADP3211A
7-Bit, Programmable, Single-Phase, Synchronous Buck Controller
The ADP3211 uses a multimode architecture. It provides programmable switching frequency that can be optimized for efficiency depending on the output current requirement. In addition, the ADP3211 includes a programmable load line slope function to adjust the output voltage as a function of the load current so that the core voltage is always optimally positioned for a load transient. The ADP3211 also provides accurate and reliable current overload protection and a delayed powergood output. The IC supports onthefly (OTF) output voltage changes requested by the chip−set.
1.2 V in CPU mode.
The ADP3211 is specified over the extended commercial temperature range of −10°C to 100°C and is available in a 32−lead QFN.
Features
SingleChip Solution
Fully Compatible with the Intel
®
IMVP6.5t CPU and GMCH Chipset Voltage Regulator Specifications Integrated MOSFET Drivers
Input Voltage Range of 3.3 V to 22 V
±7 mV WorstCase Differentially Sensed Core Voltage Error
Overtemperature
Automatic PowerSaving Modes Maximize Efficiency During
Light Load Operation
Soft Transient Control Reduces Inrush Current and Audio Noise
Independent Current Limit and Load Line Setting Inputs for
Additional Design Flexibility
Builtin PowerGood Masking Supports Voltage Identification
(VID) OTF Transients
7Bit, Digitally Programmable DAC with 0 V to 1.5 V Output
ShortCircuit Protection
Current Monitor Output Signal
This is a PbFree Device
Fully RoHS Compliant
32Lead QFN
Applications
Notebook Power Supplies for Next Generation Intel Chipsets
Intel Netbook Atom Processors
http://onsemi.com
QFN32
MN SUFFIX
CASE 488AM
See detailed ordering and shipping information in the package dimensions section on page 31 of this data sheet.
ORDERING INFORMATION
32
1
xxxxxx xxxxxx
AWLYYWW
1
xxx = Specific Device Code A = Assembly Location WL = Wafer Lot YY = Year WW = Work Week
PIN ASSIGNMENT
MARKING DIAGRAM
VCC
BST
DRVH
SW
PVCC
DRVL
PGND
GND
EN
VID0
VID1
VID2
VID3
VID4
VID5
VID6
PWRGD
IMON
CLKEN
FBRTN
FB
COMP
GPU
ILIM
IREF
RPM
RT
RAMP
LLINE
CSREF
CSFB
CSCOMP
1
ADP3211
ADP3211A
(top view)
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VID
DAC
VID6
VID5
VID4
VID3
VID2
VID1
VID0
Precision
Reference
FBRTN
Start Up
Delay
Open Drain
PWRGD
PWRGD
Open Drain
+
+
CSREF
DAC + 200mV
DAC 300 mV
DAC
+
CSREF
CSFB
CSCOMP
ILIM
+
OVP
CSREF
1.55V
+
_
+
LLINE
REF
REF
+
+
VEA
FB
COMP
UVLO Shutdown
and Bias
VCCGND
Oscillator
RPM RT
MOSFET
Driver
IMON
Current
Monitor
IREF
PGND
DRVL
GPU
Soft Start
and Soft
Transient
Control
OCP
Shutdown
Delay
PVCC
Delay Disable
Soft
Transient
Delay
Current
Limit
Circuit
PWRGD
Startup
Delay
Figure 1. Functional Block Diagram
EN
CLKEN
CLKEN
CLKEN
RAMP
BST
DRVH
SW
S
S
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ABSOLUTE MAXIMUM RATINGS
Parameter Rating Unit
V
CC
0.3 to +6.0 V
FBRTN, PGND −0.3 to +0.3 V
BST, DRVH
DC t < 200 ns
0.3 to +28
0.3 to +33
V
BST to PV
CC
DC t < 200 ns
0.3 to +22
0.3 to +28
V
BST to SW 0.3 to +6.0 V
SW
DC t < 200 ns
1.0 to +22
6.0 to +28
V
DRVH to SW 0.3 to +6.0 V
DRVL to PGND
DC t < 200 ns
0.3 to +6.0
5.0 to +6.0
V
RAMP (in Shutdown)
DC t < 200 ns
0.3 to +22
0.3 to +26
V
All Other Inputs and Outputs 0.3 to +6.0 V
Storage Temperature Range −65 to +150 °C
Operating Ambient Temperature Range −10 to 100 °C
Operating Junction Temperature 125 °C
Thermal Impedance (qJA) 2Layer Board 32.6 °C/W
Lead Temperature
Soldering (10 sec) Infrared (15 sec)
300 260
°C
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. NOTE: This device is ESD sensitive. Use standard ESD precautions when handling.
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PIN FUNCTION DESCRIPTIONS
Pin No. Mnemonic Description
1 PWRGD PowerGood Output. Opendrain output. A low logic state means that the output voltage is outside of the
VID DAC defined range.
2 IMON Current Monitor Output. This pin sources current proportional to the output load current. A resistor connected
to FBRTN sets the current monitor gain.
3 CLKEN Clock Enable Output. Open drain output. The pullhigh voltage on this pin cannot be higher than VCC.
4 FBRTN Feedback Return Input/Output. This pin remotely senses the GMCH voltage. It is also used as the ground
return for the VID DAC and the voltage error amplifier blocks.
5 FB Voltage Error Amplifier Feedback Input. The inverting input of the voltage error amplifier.
6 COMP Voltage Error Amplifier Output and Frequency Compensation Point.
7 GPU GMCH/CPU select pin. Connect to ground when powering the CPU. Connect to 5.0 V when powering the
GMCH. When GPU is connected to ground, the boot voltage is 1.1 V for the ADP3211 and 1.2 V for the ADP3211A. When GPU is connected to 5.0 V, there is no boot voltage.
8 ILIM Current Limit Set pin. Connect a resistor between ILIM and CSCOMP to the current limit threshold.
9 IREF This pin sets the internal bias currents. A 80 kW is connected from IREF to ground.
10 RPM RPM Mode Timing Control Input. A resistor is connected from RPM to ground sets the RPM mode turnon
threshold voltage.
11 RT PWM Oscillator Frequency Setting Input. An external resistor from this pin to GND sets the PWM oscillator
frequency.
12 RAMP PWM Ramp Slope Setting Input. An external resistor from the converter input voltage node to this pin sets
the slope of the internal PWM stabilizing ramp.
13 LLINE Load Line Programming Input. The center point of a resistor divider connected between CSREF and
CSCOMP tied to this pin sets the load line slope.
14 CSREF Current Sense Reference Input. This pin must be connected to the opposite side of the output inductor.
15 CSFB Noninverting Input of the Current Sense Amplifier. The combination of a resistor from the switch node to this
pin and the feedback network from this pin to the CSCOMP pin sets the gain of the current sense amplifier.
16 CSCOMP Current Sense Amplifier Output and Frequency Compensation Point.
17 GND Analog and Digital Signal Ground.
18 PGND LowSide Driver Power Ground. This pin should be connected close to the source of the lower MOSFET(s).
19 DRVL LowSide Gate Drive Output.
20 PVCC Power Supply Input/Output of LowSide Gate Driver.
21 SW Current Return For HighSide Gate Drive.
22 DRVH HighSide Gate Drive Output.
23 BST HighSide Bootstrap Supply. A capacitor from this pin to SW holds the bootstrapped voltage while the
highside MOSFET is on.
24 VCC Power Supply Input/Output of the Controller.
25 to 31 VID6 to VID0 Voltage Identification DAC Inputs. A 7bit word (the VID Code) programs the DAC output voltage, the
reference voltage of the voltage error amplifier without a load (see the VID Code Table, Table NO TAG). In normal operation mode, the VID DAC output programs the output voltage to a value within the 0 V to 1.5 V range. The input is actively pulled down.
32 EN Enable Input. Driving this pin low shuts down the chip, disables the driver outputs, and pulls PWRGD low.
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ELECTRICAL CHARACTERISTICS (V
CC
= PVCC = 5.0 V, FBRTN = GND = PGND = 0 V, H = 5.0 V, L = 0 V, V
VID
= V
DAC
= 1.2 V,
TA = 10°C to 100°C, unless otherwise noted. (Note 1) Current entering a pin (sunk by the device) has a positive sign.
Parameter Symbol Conditions Min Typ Max Units
VOLTAGE CONTROL Voltage Error Amplifier (VEAMP)
FB, LLINE Voltage Range (Note 2)
VFB, V
LLINE
Relative to CSREF = V
DAC
200 +200 mV
FB, LLINE Offset Voltage (Note 2)
V
OSVEA
Relative to CSREF = V
DAC
0.5 +0.5 mV
FB Bias Current I
FB
1.0 +1.0 mA
LLINE Bias Current I
LL
50 +50 nA
LLINE Positioning Accuracy VFB V
DAC
Measured on FB relative to nominal V
DAC
LLINE forced 80 mV below CSREF
78 80 82 mV
COMP Voltage Range V
COMP
Voltage range of interest 0.85 4.0 V
COMP Current I
COMP
COMP = 2.0 V, CSREF = V
DAC
FB forced 200 mV below CSREF FB forced 200 mV above CSREF
650
2.0
mA
mA
COMP Slew Rate SR
COMP
C
COMP
= 10 pF, CSREF = V
DAC
, Open loop configuration FB forced 200 mV below CSREF FB forced 200 mV above CSREF
10
10
V/ms
Gain Bandwidth (Note 2) GBW Noninverting unit gain configuration,
RFB = 1 kW
20 MHz
VID DAC VOLTAGE REFERENCE
V
DAC
Voltage Range (Note 2) See VID Code Table 0 1.5 V
V
DAC
Accuracy VFB V
DAC
Measured on FB (includes offset), relative to nominal V
DAC
V
DAC
= 0.3000 V to 1.2000 V
V
DAC
= 1.2125 V to 1.5000 V
7.0
9.0
+7.0 +9.0
mV
V
DAC
Differential Nonlinearity (Note 2) −1.0 +1.0 LSB
V
DAC
Line Regulation ΔV
FB
VCC = 4.75 V to 5.25 V 0.05 %
V
DAC
Boot Voltage V
BOOTFB
Measured during boot delay period, GPU = 0 V ADP3211 ADP3211A
1.100
1.200
V
SoftStart Delay (Note 2) t
DSS
Measured from EN pos edge to FB = 50 mV 200 ms
SoftStart Time t
SS
Measured from EN pos edge to FB settles to V
boot
= 1.1 V within 5%
1.4 ms
Boot Delay t
BOOT
Measured from FB settling to Vboot = 1.1 V within 5% to CLKEN neg edge
100 ms
V
DAC
Slew Rate SoftStart
Arbitrary VID step
0.0625
1.0
LSB/ms
FBRTN Current I
FBRTN
70 200 mA
VOLTAGE MONITORING and PROTECTION − Power Good
CSREF Undervoltage Threshold
V
UVCSREF
V
DAC
Relative to nominal V
DAC
Voltage −360 −300 −240 mV
CSREF Overvoltage Threshold
V
OVCSREF
V
DAC
Relative to nominal V
DAC
Voltage 150 200 250 mV
CSREF Crowbar Voltage Threshold
V
CBCSREF
Relative to FBRTN 1.5 1.55 1.6 V
CSREF Reverse Voltage Threshold
V
RVCSREF
Relative to FBRTN, Latchoff Mode CSREF is falling CSREF is rising
350 300
75 5.0
mV
PWRGD Low Voltage V
PWRGD
I
PWRGD(SINK)
= 4 mA 75 200 mV
1. All limits at temperature extremes are guaranteed via correlation using standard statistical quality control (SQC).
2. Guaranteed by design or bench characterization, not production tested.
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ELECTRICAL CHARACTERISTICS (V
CC
= PVCC = 5.0 V, FBRTN = GND = PGND = 0 V, H = 5.0 V, L = 0 V, V
VID
= V
DAC
= 1.2 V,
TA = 10°C to 100°C, unless otherwise noted. (Note 1) Current entering a pin (sunk by the device) has a positive sign.
Parameter UnitsMaxTypMinConditionsSymbol
VOLTAGE MONITORING and PROTECTION − Power Good
PWRGD High Leakage Current
I
PWRGD
V
PWRDG
= 5.0 V 1.0 mA
PWRGD Startup Delay T
SSPWRGD
Measured from CLKEN neg edge to PWRGD pos edge
8.0 ms
PWRGD Latchoff Delay T
LOFFPWRGD
Measured from OutoffGoodWindow event to Latchoff (switching stops)
8.0 ms
PWRGD Propagation Delay (Note 2)
T
PDPWRGD
Measured from OutoffGoodWindow event to PWRGD neg edge
200 ns
Crowbar Latchoff Delay (Note 2)
T
LOFFCB
Measured from Crowbar event to Latchoff (switching stops)
200 ns
PWRGD Masking Time T
MSkPWRGD
Triggered by any VID change 100 ms
CSREF SoftStop Resistance EN = L or Latchoff condition 60 W
CURRENT CONTROL Current Sense Amplifier (CSAMP)
CSFB, CSREF CommonMode Range (Note 2)
Voltage range of interest 0 2.0 V
CSFB, CSREF Offset Voltage V
OSCSA
CSREF – CSSUM, TA = 0°C to 85°C TA = 25°C
1.4
0.4
+1.4 +0.4
V
CSFB Bias Current I
BCSFB
50 +50 nA
CSREF Bias Current I
BCSREF
2.0 2.0 mA
CSCOMP Voltage Range (Note 2)
Voltage range of interest 0.05 2.0 V
CSCOMP Current
I
CSCOMPsource
I
CSCOMPsink
CSCOMP = 2.0 V CSFB forced 200 mV below CSREF CSFB forced 200 mV above CSREF
650
1.0
mA
mA
CSCOMP Slew Rate (Note 2) C
CSCOMP
= 10 pF, CSREF = V
DAC
, Open loop configuration CSFB forced 200 mV below CSREF CSFB forced 200 mV above CSREF
10
10
V/ms
Gain Bandwidth (Note 2) GBW
CSA
Noninverting unit gain configuration RFB = 1 kW
20 MHz
CURRENT MONITORING AND PROTECTION Current Reference
I
REF
Voltage V
REF
R
REF
= 80 kW to set I
REF
= 20 mA 1.55 1.6 1.65 V
CURRENT LIMITER (OCP)
Current Limit (OCP) Threshold
V
LIMTH
Measured from CSCOMP to CSREF R
LIM
= 4.5 kW
130 100 70 mV
Current Limit Latchoff Delay Measured from OCP event to PWRGD
deassertion
8.0 ms
CURRENT MONITOR
Current Gain Accuracy I
MON/ILIM
Measured from I
LIM
to I
MON
I
LIM
= 20 mA
I
LIM
= 10 mA
I
LIM
= 5 mA
9.5
9.4
9.0
10 10 10
10.6
10.8 11
I
MON
Clamp Voltage V
MAXMON
Relative to FBRTN, I
LIM
= 30 mA
R
IMON
= 8 kW
1.0 1.15 V
1. All limits at temperature extremes are guaranteed via correlation using standard statistical quality control (SQC).
2. Guaranteed by design or bench characterization, not production tested.
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ELECTRICAL CHARACTERISTICS (V
CC
= PVCC = 5.0 V, FBRTN = GND = PGND = 0 V, H = 5.0 V, L = 0 V, V
VID
= V
DAC
= 1.2 V,
TA = 10°C to 100°C, unless otherwise noted. (Note 1) Current entering a pin (sunk by the device) has a positive sign.
Parameter UnitsMaxTypMinConditionsSymbol
PULSE WIDTH MODULATOR − Clock Oscillator
RT Voltage V
RT
RT = 243 kW, V
VID
= 1.2 V
See also VRT(V
VID
) formula
1.08 1.2 1.35 V
PWM Clock Frequency Range (Note 2)
f
CLK
Operation of interest 0.3 3.0 MHz
RAMP GENERATOR
RAMP Voltage V
RAMP
EN = H, I
RAMP
= 60 mA
EN = L
0.9 1.0 V
IN
1.1 V
RAMP Current Range (Note 2) I
RAMP
EN = H EN = L, RAMP = 19 V
1.0
0.5
100
+0.5
mA
PWM COMPARATOR
PWM Comparator Offset (Note 2)
V
OSRPM
3.0 +3.0 mV
RPM COMPARATOR
RPM Current I
RPM
V
VID
= 1.2 V, RT = 243 kW
See also I
RPM(RT
) formula
6.0 mA
RPM Comparator Offset (Note 2)
V
OSRPM
V
COMP
(1 + V
RPM
) 3.0 +3.0 mV
SWITCH AMPLIFIER
SW Input Resistance R
SW
Measured from SW to PGND 1.3 kW
ZERO CURRENT SWITCHING COMPARATOR
SW ZCS Threshold V
ZCSSW
DCM mode, DPRSLP = 3.3 V −4.0 mV
Masked Off−Time t
OFFMSKD
Measured from DRVH neg edge to DRVH pos edge at max frequency of operation
700 ns
SYSTEM I/O BUFFERS EN and VID[6:0] INPUTS
Input Voltage V
EN,VID[6:0]
Refers to driving signal level Logic low, I
sink
= 1 mA
Logic high, I
source
= 5 mA 1.0
0.3
V
Input Current I
EN,VID[6:0]
V
EN,VID[6:0]
= 0 V
0.2 V < V
EN,VID[6:0]
V
CC
10
1.0
nA mA
VID Delay Time (Note 2) Any VID edge to 10% of FB change 200 ns
GPU INPUT
Input Voltage V
GPU
Refers to driving signal level Logic low, I
sink
= 1 mA
Logic high, I
source
= 5 mA 4.0
0.3
V
Input Current I
GPU
GPU = L or GPU = H (static)
0.8 V < EN < 1.6 V (during transition)
10 70
nA mA
CLKEN OUTPUT
Output Low Voltage V
CLKEN
Logic low, I
CLKEN
= 4 mA 30 300 mV
Output High, Leakage Current I
CLKEN
Logic high, V
CLKEN
= V
CC
3.0 mA
SUPPLY
Supply Voltage Range V
CC
4.5 5.5 V
Supply Current EN = H
EN = L
6.0 60
10
200
mA
mA
VCC OK Threshold V
CCOK
VCC is rising 4.4 4.5 V
VCC UVLO Threshold V
CCUVLO
VCC is falling 4.0 4.15 V
VCC Hysteresis (Note 2) 150 mV
1. All limits at temperature extremes are guaranteed via correlation using standard statistical quality control (SQC).
2. Guaranteed by design or bench characterization, not production tested.
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ELECTRICAL CHARACTERISTICS (V
CC
= PVCC = 5.0 V, FBRTN = GND = PGND = 0 V, H = 5.0 V, L = 0 V, V
VID
= V
DAC
= 1.2 V,
TA = 10°C to 100°C, unless otherwise noted. (Note 1) Current entering a pin (sunk by the device) has a positive sign.
Parameter UnitsMaxTypMinConditionsSymbol
HIGHSIDE MOSFET DRIVER
Pullup Resistance, Sourcing Current Pulldown Resistance, Sinking Current
BST = PV
CC
2.0
1.0
3.3
2.8
W
Transition Times tr
DRVH,
tf
DRVH
BST = PVCC, CL = 3 nF, Figure 2 15
13
35 31
ns
Dead Delay Times tpdh
DRVH
BST = PVCC, Figure 2 10 45 ns
BST Quiescent Current EN = L (Shutdown)
EN = H, No Switching
5.0
200
15 mA
LOWSIDE MOSFET DRIVER
Pullup Resistance, Sourcing Current Pulldown Resistance, Sinking Current
1.8
0.9
3.0
2.7
W
Transition Times tr
DRVL,
tf
DRVL
CL = 3 nF, Figure 2 15
14
35 35
ns
Propagation Delay Times tpdh
DRVL
CL = 3 nF, Figure 2 15 30 ns
SW Transition Timeout t
SWTO
DRVH = L, SW = 2.5 V 150 250 450 ns
SW Off Threshold V
OFFSW
2.2 V
PVCC Quiescent Current EN = L (Shutdown)
EN = H, No Switching
14
200
50 mA
BOOTSTRAP RECTIFIER SWITCH
OnResistance EN = L or EN = H and DRVL = H 4 7 11 W
1. All limits at temperature extremes are guaranteed via correlation using standard statistical quality control (SQC).
2. Guaranteed by design or bench characterization, not production tested.
3. Timing is referenced to the 90% and 10% points, unless otherwise noted.
DRVH
(with respect to SW)
DRVL
SW
1.0 V
Figure 2. Timing Diagram
V
TH
V
TH
tf
DRVL
tpdh
DRVH
tr
DRVH
tf
DRVH
tr
DRVL
tpdh
DRVL
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TYPICAL PERFORMANCE CHARACTERISTICS
V
VID
= 1.5 V, TA = 20°C to 100°C, unless otherwise noted.
1
2
3
1: 200mV/div 2: 2V/div
3
: 10V/div
Input = 12V, 1A Load VID Step 0.7V to 1.2V
Figure 3. VID Change Soft Transient
1
2
3
1: 200mV/div 2: 2V/div
3: 10V/div
Input = 12V, 1A Load VID Step 1.2V to 0.7V
Figure 4. VID Change Soft Transient
20 ms/div
Output Voltage
VID5
Switch Node
20 ms/div
VID5
Switch
Node
Output Voltage
Figure 5. Switching Frequency vs. Load
Current in RPM Mode
Figure 6. I
MON
Voltage vs. Load Current
LOAD CURRENT (A) LOAD CURRENT (A)
151050
0
50
100
150
200
250
300
2520151050
0
0.2
0.4
0.6
0.8
1.0
1.2
Figure 7. Load Line Accuracy Figure 8. VCC Current vs. VCC Voltage with
Enable Low
LOAD CURRENT (A) VCC VOLTAGE (V)
151050
1.15
1.20
1.25
1.30
1.35
6543210
0
10
20
30
50
60
70
80
SWITCHING FREQUENCY (kHz)
I
MON
(V)
VID VOLTAGE (V)
V
CC
CURRENT (mA)
OUTPUT RIPPLE
SWITCHING
FREQUENCY
OUTPUT RIPPLE (mV)
30
35
40
45
50
55
60
+2%
2%
Specified Load Line
Measured Load Line
40
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TYPICAL PERFORMANCE CHARACTERISTICS
EN
1
2
3
4
1: 0.5V/div 2: 5V/div
3: 5V/div 4: 5V/div
2ms/div
GPU = 0V
Figure 9. Startup Waveforms CPU Mode
EN
1
2
3
4
1: 0.5V/div 2: 5V/div
3: 5V/div 4: 5V/div
4ms/div
GPU = 5V
Figure 10. Startup Waveforms GPU Mode
1
2
3 4
1 : 100mV/div 2 : 10V/div
3: 5A/div 4 : 5V/div
Low Side Gate Drive
Figure 11. DCM Waveforms, 1 A Load Current
1
2
3
4
1 : 100mV/div 2 : 10V/div
3 : 5A/div 4 : 5V/div
Figure 12. CCM Waveforms, 10 A Load Current
1
2
1: 50mV/div 2: 10V/div
Output Voltage
Switch Node
Input = 12V Output = 1.2V 3A to 15A Step
Figure 13. Load Transient Figure 14. Load Transient
1
2
1: 50mV/div 2: 10V/div
Output Voltage
Switch Node
Input = 12V Output = 1.2V 3A to 15A Step
Output Voltage
CLKEN
PWRGD
40 ms/div
40 ms/div
2 ms/div
Low Side Gate Drive
Output Voltage
Inductor
Current
Switch Node
4 ms/div
Inductor
Current
Output Voltage
Switch Node
PWRGD
Output Voltage
CLKEN
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TYPICAL PERFORMANCE CHARACTERISTICS
Figure 15. Load Transient
1
2
1: 50mV/div 2: 10V/div
Input = 12V Output = 1.2V 15A to 3A Step
Figure 16. VID on the Fly
1
2
1: 100mV/div 2: 10V/div
Input = 12V No Load DVID = 250mV
Figure 17. VID on the Fly
1
2
1: 100mV/div 2: 10V/div
Input = 12V 10A Load DVID = 250mV
Figure 18. Over Current Protection
1
2
3
4
1 : 500mV/div 2 : 10V/div
3 : 5V/div 4 : 2V/div
2ms/div
Output Voltage
Switch
Node
PWRGD
CLKEN
40 ms/div
Switch Node
Output Voltage
200 ms/div
Switch Node
Output Voltage
200 ms/div
Switch Node
Output Voltage
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Theory of Operation
The ADP3211 is a Ramp Pulse Modulated (RPM) controller for synchronous buck Intel GMCH and CPU core power supply. The internal 7bit VID DAC conforms to the Intel IMVP6.5 specifications. The ADP3211 is a stable, high performance architecture that includes
High speed response at the lowest possible switching
frequency and minimal count of output decoupling capacitors
Minimized thermal switching losses due to lower
frequency operation
High accuracy load line regulation
High power conversion efficiency with a light load by
automatically switching to DCM operation
Operation Modes
The ADP3211 runs in RPM mode for the purpose of fast transient response and high light load efficiency. During the following transients, the ADP3211 runs in PWM mode:
SoftStart
Soft transient: the period of 110 ms following any VID
change
Current overload
Q
S
RD
1.0 V
S
RD
FLIPFLOP
VDC
DRVH
DRVL
GATE DRIVER
SW
VCC
L
LOAD
COMP FB FBRTN
CSCOMP
CSFB
CSREF
DRVL1
SW1
DRVH1
VRMP
BST
BST1
5.0 V
400ns
R2
R1
R1R2
1.0 V
30mV
IN
DCM
LLINE
+
+
+
Figure 19. RPM Mode Operation
C
FB
R
B
C
B
V
CS
C
A
R
A
Q
Q
Q
FLIPFLOP
C
R
C
CS
R
CS
R
PH
R
I
IR = AR X I
RAMP
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Figure 20. PWM Mode Operation
0.2 V
CLOCK
OSCILLATOR
QS
RD
FLIPFLOP
VCC
L
LOAD
DRVH
DRVL
GATE
SW
VCC
DRVL1
SW1
DRVH1
BST
BST1
5.0 V
IN
RAMP
VDC
COMP
FB FBRTN
CSFB
CSSUM
CSREF
LLINE
+
+
+
IR = AR X I
RAMP
A
D
C
R
R
PH
R
I
DRIVER
C
CS
R
CS
R
A
C
A
C
B
R
B
C
FB
V
CS
Setting Switch Frequency
Master Clock Frequency in PWM Mode
When the ADP3211 runs in PWM, the clock frequency is set by an external resistor connected from the RT pin to GND. The frequency varies with the VID voltage: the lower the VID voltage, the lower the clock frequency. The variation of clock frequency with VID voltage maintains constant V
CCGFX
ripple and improves power conversion
efficiency at lower VID voltages.
Switching Frequency in RPM Mode
When the ADP3211 operates in RPM mode, its switching frequency is controlled by the ripple voltage on the COMP pin. Each time the COMP pin voltage exceeds the RPM pin voltage threshold level determined by the VID voltage and the external resistor connected between RPM and ground, an internal ramp signal is started and DRVH is driven high. The slew rate of the internal ramp is programmed by the current entering the RAMP pin. Onethird of the RAMP current charges an internal ramp capacitor (5 pF typical) and creates a ramp. When the internal ramp signal intercepts the COMP voltage, the DRVH pin is reset low.
In continuous current mode, the switching frequency of RPM operation is almost constant. While in discontinuous current conduction mode, the switching frequency is reduced as a function of the load current.
Differential Sensing of Output Voltage
The ADP3211 combines differential sensing with a high accuracy VID DAC, referenced by a precision band gap source and a low offset error amplifier, to meet the rigorous accuracy requirement of the Intel IMVP−6.5 specification. In steadystate mode, the combination of the VID DAC and error amplifier maintain the output voltage for a worstcase scenario within ±7 mV of the full operating output voltage and temperature range.
The V
CCGFX
output voltage is sensed between the FB and FBRTN pins. FB should be connected through a resistor to the positive regulation point, the VCC remote sensing pin of the GMCH or CPU. FBRTN should be connected directly to the negative remote sensing point, the VSS sensing point of the GMCH or CPU. The internal VID DAC and precision voltage reference are referenced to FBRTN and have a typical current of 70 mA for guaranteed accurate remote sensing.
Output Current Sensing
The ADP3211 includes a dedicated current sense amplifier (CSA) to monitor the total output current of the converter for proper voltage positioning vs. load current and for overcurrent detection. Sensing the current delivered to the load is an inherently more accurate method than detecting peak current or sampling the current across
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a sense element, such as the lowside MOSFET. The current sense amplifier can be configured several ways, depending on system optimization objectives, and the current information can be obtained by:
Output inductor ESR sensing without the use of a
thermistor for the lowest cost
Output inductor ESR sensing with the use of a
thermistor that tracks inductor temperature to improve accuracy
Discrete resistor sensing for the highest accuracy
At the positive input of the CSA, the CSREF pin is connected to the output voltage. At the negative input (that is, the CSFB pin of the CSA), signals from the sensing element (in the case of inductor DCR sensing, signals from the switch node side of the output inductors) are connected with a resistor. The feedback resistor between the CSCOMP and CSFB pins sets the gain of the current sense amplifier, and a filter capacitor is placed in parallel with this resistor. The current information is then given as the voltage difference between the CSCOMP and CSREF pins. This signal is used internally as a differential input for the current limit comparator.
An additional resistor divider connected between the CSCOMP and CSREF pins with the midpoint connected to the LLINE pin can be used to set the load line required by the GMCH specification. The current information to set the load line is then given as the voltage difference between the LLINE and CSREF pins. This configuration allows the load line slope to be set independent from the current limit threshold. If the current limit threshold and load line do not have to be set independently, the resistor divider between the CSCOMP and CSREF pins can be omitted and the CSCOMP pin can be connected directly to LLINE. To disable voltage positioning entirely (that is, to set no load line), LLINE should be tied to CSREF.
To provide the best accuracy for current sensing, the CSA has a low offset input voltage and the sensing gain is set by an external resistor ratio.
Active Impedance Control Mode
To control the dynamic output voltage droop as a function of the output current, the signal that is proportional to the total output current, converted from the voltage difference between LLINE and CSREF, can be scaled to be equal to the required droop voltage. This droop voltage is calculated by multiplying the droop impedance of the regulator by the output current. This value is used as the control voltage of the PWM regulator. The droop voltage is subtracted from the DAC reference output voltage, and the resulting voltage is used as the voltage positioning setpoint. The arrangement results in an enhanced feedforward response.
Voltage Control Mode
A high−gain bandwidth error amplifier is used for the voltage mode control loop. The noninverting input voltage is set via the 7bit VID DAC. The VID codes are
listed in Table NO TAG. The noninverting input voltage is offset by the droop voltage as a function of current, commonly known as active voltage positioning. The output of the error amplifier is the COMP pin, which sets the termination voltage of the internal PWM ramps.
At the negative input, the FB pin is tied to the output sense location using RFB, a resistor for sensing and controlling the output voltage at the remote sensing point. The main loop compensation is incorporated in the feedback network connected between the FB and COMP pins.
PowerGood Monitoring
The powergood comparator monitors the output voltage via the CSREF pin. The PWRGD pin is an opendrain output that can be pulled up through an external resistor to a voltage rail, not necessarily the same V
CC
voltage rail that is running the controller. A logic high level indicates that the output voltage is within the voltage limits defined by a range around the VID voltage setting. PWRGD goes low when the output voltage is outside of this range.
Following the GMCH and CPU specification, the PWRGD range is defined to be 300 mV less than and 200 mV greater than the actual VID DAC output voltage. To prevent a false alarm, the powergood circuit is masked during any VID change and during softstart. The duration of the PWRGD mask is set to approximately 130 ms by an internal timer. In addition, for a VID change from high to low, there is an additional period of PWRGD masking before the internal DAC voltage drops within 200 mV of the new lower VID DAC output voltage, as shown in Figure 21.
Figure 21. PWRGD Masking for VID Change
VID SIGNAL
CHANGE
INTERNAL
DAC VOLTAGE
PWRGD MASK
100 ms
100 ms
Powerup Sequence and SoftStart
The poweron rampup time of the output voltage is set internally. With GPU pulled to ground, the ADP3211 steps sequentially through each VID code until it reaches the boot voltage. With GPU pulled to 5.0 V, the ADP3211 steps sequentially through each VID code until it reaches the set VID code voltage. The powerup sequence is illustrated in Figure 22 for GPU connected to ground and Figure 23 for GPU connected to 5.0 V.
When GPU is connected to ground, the ADP3211 has a boot voltage of 1.1 V for IMVP6.5 CPU applications. When GPU is connected to ground, the ADP3211A has a boot voltage of 1.2 V. The boot voltage is the only difference between the ADP3211 and ADP3211A.
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VCC = 5.0 V
EN
PWRGD
GPU = 0 V
Figure 22. ADP3211 Powerup Sequence for CPU
t
BOOT
CLKEN
DAC and V
CORE
t
CPU_PWRGD
V
BOOT
= 1.1 V
PWRGD
V5_S
EN
PGDELAY
GPU = 5.0 V
Figure 23. Powerup Sequence for GPU
V
CCGFX
VID Change and Soft Transient
With GPU connected to 5.0 V for GPU operation, when a VID input changes, the ADP3211 detects the change but ignores new code for a minimum of 400 ns. This delay is required to prevent the device from reacting to digital signal skew while the 7bit VID input code is in transition. Additionally, the VID change triggers a PWRGD masking timer to prevent a PWRGD failure. Each VID change resets and retriggers the internal PWRGD masking timer.
The ADP3211 provides a soft transient function to reduce inrush current during VID transitions. Reducing the inrush current helps decrease the acoustic noise generated by the MLCC input capacitors and inductors.
The soft transient feature is implemented internally. When a new VID code is detected, the ADP3211 steps sequentially through each VID voltage to the final VID voltage.
Current Limit, ShortCircuit, and Latchoff Protection
The ADP3211 has an adjustable current limit set by the
R
CLIM
resistor. The ADP3211 compares a programmable current limit set point to the voltage from the output of the current sense amplifier. The level of current limit is set with the resistor from the ILIM pin to CSCOMP. During operation, the voltage on ILIM is equal to the voltage on CSREF. The current through the external resistor connected between I
LIM
and CSCOMP is then compared to the internal current limit current Icl. If the current generated through this resistor into the ILIM pin (Ilim) exceeds the internal current limit threshold current (Icl), the internal current limit amplifier controls the internal COMP voltage to maintain the average output current at the limit.
Normally, the ADP3211 operates in RPM mode. During
a current overload, the ADP3211 switches to PWM mode.
With low impedance loads, the ADP3211 operates in a constant current mode to ensure that the external MOSFETs and inductor function properly and to protect the GPU or CPU. With a low constant impedance load, the output voltage decreases to supply only the set current limit. If the output voltage drops below the power−good limit, the PWRGD signal transitions. After the PWRGD single transitions, internal waits 8 ms before latching off the ADP3211.
Figure 24 shows how the ADP3211 reacts to a current overload.
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CURRENT LIMIT
APPLIED
LATCHED
OFF
Figure 24. Current Overload
2 ms/div
SWITCH NODE 10 V/div
Output Voltage 0.5 V/div
PWRGD 5.0 V/div
2.0 V/div
CLKEN
The latchoff function can be reset either by removing and
reapplying VCC or by briefly pulling the EN pin low.
During startup, when the output voltage is below 200 mV, a secondary current limit is active. This is necessary because the voltage swing of CSCOMP cannot extend below ground. This secondary current limit clamp controls the minimum internal COMP voltage to the PWM comparators to 1.5 V. This limits the voltage drop across the lowside MOSFETs through the current balance circuitry.
Light Load RPM DCM Operation
The ADP3211 operates in RPM mode. With higher loads, the ADP3211 operates in continuous conduction mode (CCM), and the upper and lower MOSFETs run synchronously and in complementary phase. See Figure 25 for the typical waveforms of the ADP3211 running in CCM with a 10 A load current.
Figure 25. Single−Phase Waveforms in CCM
2 ms/div
LOW SIDE GATE 5.0 V/div
CSREF to CSCOMP 50mV/div
SWITCH NODE
5.0 V/div
With lighter loads, the ADP3211 enters discontinuous conduction mode (DCM). Figure 26 shows a typical single−phase buck with one upper FET, one lower FET, an output inductor, an output capacitor, and a load resistor. Figure 27 shows the path of the inductor current with the upper FET on and the lower FET off. In Figure 28 the high−side FET is off and the low−side FET is on. In CCM, if one FET is on, its complementary FET must be off; however, in DCM, both high and lowside FETs are off and no current flows into the inductor (see Figure 29). Figure 30 shows the inductor current and switch node voltage in DCM.
In DCM with a light load, the ADP3211 monitors the switch node voltage to determine when to turn off the low−side FET. Figure 31 shows a typical waveform in DCM with a 1 A load current. Between t1 and t2, the inductor current ramps down. The current flows through the source drain of the lowside FET and creates a voltage drop across the FET with a slightly negative switch node. As the inductor current ramps down to 0 A, the switch voltage approaches 0 V, as seen just before t2. When the switch voltage is approximately −4 mV, the low−side FET is turned off.
Figure 30 shows a small, dampened ringing at t2. This is caused by the LC created from capacitance on the switch node, including the CDS of the FETs and the output inductor. This ringing is normal.
The ADP3211 automatically goes into DCM with a light load. Figure 31 shows the typical DCM waveform of the ADP3211 with a 1 A load current. As the load increases, the ADP3211 enters into CCM. In DCM, frequency decreases with load current, and switching frequency is a function of the inductor, load current, input voltage, and output voltage.
Figure 26. Buck Topology
SWITCH
NODE
L
DRVL
DRVH
Q1
Q2
C
OUTPUT
VOLTAGE
LOAD
VOLTAGE
INPUT
L
C
ON
OFF
LOAD
Figure 27. Buck Topology Inductor Current During
t
0
and t
1
Figure 28. Buck Topology Inductor Current During
t
1
and t
2
L
C
ON
OFF
LOAD
Figure 29. Buck Topology Inductor Current During
t
2
and t
3
L
C
OFF
OFF
LOAD
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Figure 30. Inductor Current and Switch Node in
DCM
Inductor
Current
Switch
Node
Voltage
t0t
1
t
2
t3t
4
Figure 31. SinglePhase Waveforms in DCM with
1 A Load Current
4 ms/div
CSREF to CSCOMP 50mV/div
LOW SIDE GATE 5V/div
SWITCH NODE
5.0 V/div
Output Crowbar
To protect the load and output components of the supply, the DRVL output is driven high (turning the low−side MOSFETs on) and DRVH is driven low (turning the highside MOSFETs off) when the output voltage exceeds the CPU or GMCH OVP threshold.
Turning on the lowside MOSFETs forces the output capacitor to discharge and the current to reverse due to current build up in the inductors. If the output overvoltage is due to a drain−source short of the high−side MOSFET, turning on the lowside MOSFET results in a crowbar across the input voltage rail. The crowbar action blows the fuse of the input rail, breaking the circuit and thus protecting the CPU or GMCH chipset from destruction.
When the OVP feature is triggered, the ADP3211 is latched off. The latchoff function can be reset by removing and reapplying VCC to the ADP3211 or by briefly pulling the EN pin low.
Reverse Voltage Protection
Very large reverse current in inductors can cause
negative V
CCGFX
voltage, which is harmful to the chipset and other output components. The ADP3211 provides a reverse voltage protection (RVP) function without additional system cost. The V
CCGFX
voltage is monitored through the CSREF pin. When the CSREF pin voltage drops to less than 300 mV, the ADP3211 triggers the RVP function by setting both DRVH and DRVL low, thus turning off all MOSFETs. The reverse inductor currents can be quickly reset to 0 by discharging the builtup energy in the inductor into the input dc voltage source via the forwardbiased body diode of the highside MOSFETs. The RVP function is terminated when the CSREF pin voltage returns to greater than 100 mV.
Sometimes the crowbar feature inadvertently results in
negative V
CCGFX
voltage because turning on the lowside MOSFETs results in a very large reverse inductor current. To prevent damage to the chipset caused from negative voltage, the ADP3211 maintains its RVP monitoring function even after OVP latchoff. During OVP latchoff, if the CSREF pin voltage drops to less than 300 mV, the lowside MOSFETs is turned off by setting DRVL low. DRVL will be set high again when the CSREF voltage recovers to greater than 100 mV.
Figure 32 shows the reverse voltage protection function of the ADP3211. The CSREF pin is disconnected from the output voltage and pulled negative. As the CSREF pin drops to less than 300 mV, the lowside and high−side FETs turn off.
OVP RVP
Figure 32. ADP3211 RVP Function
20 ms/div
LOW SIDE GATE
5.0 V/div
OUTPUT VOLTAGE
0.5 V/div
PWRGD
5.0 V/div
SWITCH NODE
10 V/div
Output Enable and UVLO
For the ADP3211 to begin switching, the VCC supply voltage to the controller must be greater than the V
CCOK
threshold and the EN pin must be driven high. If the V
CC
voltage is less than the V
CCUVLO
threshold or the EN pin is logic low, the ADP3211 shuts off. In shutdown mode, the controller holds DRVH and DRVL low and drives PWRGD to low.
The user must adhere to proper power−supply sequencing during startup and shutdown of the ADP3211. All input pins must be at ground prior to removing or applying VCC, and all output pins should be left in high impedance state while VCC is off.
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Overlay Protection Circuit
The overlap protection circuit prevents both main power switches, the high side MOSFET Q1 and the low side MOSFET Q2, from being on at the same time. This is done to prevent shootthrough currents from flowing through both power switches and the associated losses that can occur during their onoff transitions. The overlap protection circuit accomplishes this by adaptively controlling the delay from Q1’s turnoff to Q2’s turn−on, and the delay from Q2’s turnoff to Q1’s turn−on.
To prevent the overlap of the gate drives during Q1’s turnoff and Q2’s turn−on, the overlap circuit monitors the voltage at the SW pin and DRVH pin. When the internal PWM signal goes low, Q1 begins to turn off. The overlap protection circuit waits for the voltage at the SW and DRVH pins to both fall below 2.2 V. Once both of these conditions are met, Q2 begins to turn on. Using this method, the overlap protection circuit ensures that Q1 is off before Q2 turns on, regardless of variations in temperature,
supply voltage, gate charge, and drive current. There is, however, a timeout circuit that overrides the waiting period for the SW and DRVH pins to reach 2.2 V. After the timeout period has expired, DRVL is asserted high regardless of the SW and DRVH voltages. The timeout period is approximately 250 ns. In the opposite case, when the internal PWM signal goes high, Q2 begins to turn off after a propagation delay. The overlap protection circuit waits for the voltage at DRVL to fall below 2.2 V, after which DRVH is asserted high and Q1 turns on.
Output Current Monitor
The ADP3211 includes an output current monitor
function. The I
MON
pin outputs an accurate current that is directly proportional to the output current. This current is then run through a parallel RC connected from the I
MON
pin to the FBRTN pin to generate an accurately scaled and filtered voltage. The maximum voltage on I
MON
is
internally clamped by the ADP3211 at 1.15.V.
Table 1. VID Code Table
VID6 VID5 VID4 VID3 VID2 VID1 VID0 Output (V)
0 0 0 0 0 0 0 1.5000
0 0 0 0 0 0 1 1.4875
0 0 0 0 0 1 0 1.4750
0 0 0 0 0 1 1 1.4625
0 0 0 0 1 0 0 1.4500
0 0 0 0 1 0 1 1.4375
0 0 0 0 1 1 0 1.4250
0 0 0 0 1 1 1 1.4125
0 0 0 1 0 0 0 1.4000
0 0 0 1 0 0 1 1.3875
0 0 0 1 0 1 0 1.3750
0 0 0 1 0 1 1 1.3625
0 0 0 1 1 0 0 1.3500
0 0 0 1 1 0 1 1.3375
0 0 0 1 1 1 0 1.3250
0 0 0 1 1 1 1 1.3125
0 0 1 0 0 0 0 1.3000
0 0 1 0 0 0 1 1.2875
0 0 1 0 0 1 0 1.2750
0 0 1 0 0 1 1 1.2625
0 0 1 0 1 0 0 1.2500
0 0 1 0 1 0 1 1.2375
0 0 1 0 1 1 0 1.2250
0 0 1 0 1 1 1 1.2125
0 0 1 1 0 0 0 1.2000
0 0 1 1 0 0 1 1.1875
0 0 1 1 0 1 0 1.1750
0 0 1 1 0 1 1 1.1625
0 0 1 1 1 0 0 1.1500
0 0 1 1 1 0 1 1.1375
0 0 1 1 1 1 0 1.1250
0 0 1 1 1 1 1 1.1125
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Table 1. VID Code Table
VID6 Output (V)VID0VID1VID2VID3VID4VID5
0 1 0 0 0 0 0 1.1000
0 1 0 0 0 0 1 1.0875
0 1 0 0 0 1 0 1.0750
0 1 0 0 0 1 1 1.0625
0 1 0 0 1 0 0 1.0500
0 1 0 0 1 0 1 1.0375
0 1 0 0 1 1 0 1.0250
0 1 0 0 1 1 1 1.0125
0 1 0 1 0 0 0 1.0000
0 1 0 1 0 0 1 0.9875
0 1 0 1 0 1 0 0.9750
0 1 0 1 0 1 1 0.9625
0 1 0 1 1 0 0 0.9500
0 1 0 1 1 0 1 0.9375
0 1 0 1 1 1 0 0.9250
0 1 0 1 1 1 1 0.9125
0 1 1 0 0 0 0 0.9000
0 1 1 0 0 0 1 0.8875
0 1 1 0 0 1 0 0.8750
0 1 1 0 0 1 1 0.8625
0 1 1 0 1 0 0 0.8500
0 1 1 0 1 0 1 0.8375
0 1 1 0 1 1 0 0.8250
0 1 1 0 1 1 1 0.8125
0 1 1 1 0 0 0 0.8000
0 1 1 1 0 0 1 0.7875
0 1 1 1 0 1 0 0.7750
0 1 1 1 0 1 1 0.7625
0 1 1 1 1 0 0 0.7500
0 1 1 1 1 0 1 0.7375
0 1 1 1 1 1 0 0.7250
0 1 1 1 1 1 1 0.7125
1 0 0 0 0 0 0 0.7000
1 0 0 0 0 0 1 0.6875
1 0 0 0 0 1 0 0.6750
1 0 0 0 0 1 1 0.6625
1 0 0 0 1 0 0 0.6500
1 0 0 0 1 0 1 0.6375
1 0 0 0 1 1 0 0.6250
1 0 0 0 1 1 1 0.6125
1 0 0 1 0 0 0 0.6000
1 0 0 1 0 0 1 0.5875
1 0 0 1 0 1 0 0.5750
1 0 0 1 0 1 1 0.5625
1 0 0 1 1 0 0 0.5500
1 0 0 1 1 0 1 0.5375
1 0 0 1 1 1 0 0.5250
1 0 0 1 1 1 1 0.5125
1 0 1 0 0 0 0 0.5000
1 0 1 0 0 0 1 0.4875
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Table 1. VID Code Table
VID6 Output (V)VID0VID1VID2VID3VID4VID5
1 0 1 0 0 1 0 0.4750
1 0 1 0 0 1 1 0.4625
1 0 1 0 1 0 0 0.4500
1 0 1 0 1 0 1 0.4375
1 0 1 0 1 1 0 0.4250
1 0 1 0 1 1 1 0.4125
1 0 1 1 0 0 0 0.4000
1 0 1 1 0 0 1 0.3875
1 0 1 1 0 1 0 0.3750
1 0 1 1 0 1 1 0.3625
1 0 1 1 1 0 0 0.3500
1 0 1 1 1 0 1 0.3375
1 0 1 1 1 1 0 0.3250
1 0 1 1 1 1 1 0.3125
1 1 0 0 0 0 0 0.3000
1 1 0 0 0 0 1 0.2875
1 1 0 0 0 1 0 0.2750
1 1 0 0 0 1 1 0.2625
1 1 0 0 1 0 0 0.2500
1 1 0 0 1 0 1 0.2375
1 1 0 0 1 1 0 0.2250
1 1 0 0 1 1 1 0.2125
1 1 0 1 0 0 0 0.2000
1 1 0 1 0 0 1 0.1875
1 1 0 1 0 1 0 0.1750
1 1 0 1 0 1 1 0.1625
1 1 0 1 1 0 0 0.1500
1 1 0 1 1 0 1 0.1375
1 1 0 1 1 1 0 0.1250
1 1 0 1 1 1 1 0.1125
1 1 1 0 0 0 0 0.1000
1 1 1 0 0 0 1 0.0875
1 1 1 0 0 1 0 0.0750
1 1 1 0 0 1 1 0.0625
1 1 1 0 1 0 0 0.0500
1 1 1 0 1 0 1 0.0375
1 1 1 0 1 1 0 0.0250
1 1 1 0 1 1 1 0.0125
1 1 1 1 0 0 0 0.0000
1 1 1 1 0 0 1 0.0000
1 1 1 1 0 1 0 0.0000
1 1 1 1 0 1 1 0.0000
1 1 1 1 1 0 0 0.0000
1 1 1 1 1 0 1 0.0000
1 1 1 1 1 1 0 0.0000
1 1 1 1 1 1 1 0.0000
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Figure 33. Typical Application Circuit
VID6
VID5
VID4
VID1
VID2
VID3
VID0
PWRGD
IMON
FBRTN
FB
COMP
GPU
ILIM
VCC
BST
DRVH
SW
PVCC
DRVL
PGND
IREF
RPM
RT
LLINE
CSREF
CSFB
CSCOMP
32
EN
VID0
VID1
VID2
VID3
VID4
VID5
VID6
ADP3211
RAMP
1
CLKEN
CLKEN
AGND
VR_ON
PWRGD
R16
10 kΩ
V3.3V
VCCSENSE
V3.3V
R2
10 Ω
RB1
20 kΩ
R18
4.53 kΩ
CB1
220 pF
CA1
470 pF
CFB1
22 pF
R20
R25
7.68 kΩ
VSSSENSE
R17
0 Ω
C8
4.7 mF
Q2
NTMS4846N
Q3
NTMFS4846N
Q1
NTMFS4821N
C1
10mF
25V
C2
10mF
25V
C3
10mF
25V
VDC
L1, 560nH/
1.3mΩ
C21, 0.33 mF
GND
VDC
GND
RTH1, 220kΩ
8% NTC
R23
0 Ω
R21
0 Ω
C28
1 nF
C27
100 pF
1nF
RPH1
53.6
kΩ
RPH2
DNP
TP8
SW
TP11
DRVH
R55
0 Ω
TP12
DRVL
C9
22mF
6.3V
C10
22mF
6.3V
C11
0.22mF
C12
0.1mF
C13
0.1mF
C14
1nF
C15
DNP
VGFX_CORE_RTN
C22
220mF
2.5V
C23
220mF
2.5V
C30
DNP
C31
DNP
VGFX_CORE
V5S
IMON
5V
R13
100Ω
R53
100 Ω
VGFX_CORE
VGFX_CORE_RTN
R14 200 kΩ
R15 340 kΩ
VDC
DNP
R24 DNP
R54
DNP
C18, 0.1 mF
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Application Information
The ADP3211 application circuit should be fine−tuned in the final design. The equations in the Application Information section are used as a starting point for a new design.
The design parameters for a typical IMVP−6.5− compliant GPU core VR application are as follows:
Maximum input voltage (V
INMAX
) = 19 V
Minimum input voltage (V
INMIN
) = 8.0 V
Output voltage by VID setting (V
VID
) = 1.1 V
Maximum output current (I
O
) = 10 A
Droop resistance (R
O
) = 8 mW
Nominal output voltage at 10 A load (V
OFL
) = 1.02 V
Static output voltage drop from no load to full load
(DV) = V
ONL
V
OFL
= 1.1 V 1.02 V = 80 mV
Maximum output current step (DI
O
) = 8 A
Switching frequency (f
SW
) = 400 kHz
Duty cycle at maximum input voltage (D
MAX
) = 0.14
Duty cycle at minimum input voltage (D
MIN
) = 0.054
Setting the Clock Frequency for PWM
The ADP3211 operates in fixed frequency PWM mode during startup, for 100 ms after a VID change, and in current limit. In PWM operation, the ADP3211 uses a fixed−frequency control architecture. The frequency is set by an external timing resistor (RT). The clock frequency determines the switching frequency, which relates directly to the switching losses and the sizes of the inductors and input and output capacitors. For example, a clock frequency of 400 kHz sets the switching frequency to 400 kHz. This selection represents the trade−off between the switching losses and the minimum sizes of the output filter components. To achieve a 400 kHz oscillator frequency at a VID voltage of 1.1 V, R
T
must be 274 kW. Alternatively, the value for RT can be calculated by using the following equation:
RT+
V
VID
) 1.0 V
2 fSW 9pF
* 16 kW
(eq. 1)
where: 9 pF and 16 kW are internal IC component values. V
VID
is the VID voltage in volts.
fSW is the switching frequency in hertz.
For good initial accuracy and frequency stability, it is recommended to use a 1% resistor.
Ramp Resistor Selection
The ramp resistor (RR) is used for setting the size of the internal PWM ramp. The value of this resistor is chosen to provide the best combination of thermal balance, stability, and transient response. Use this equation to determine a starting value:
RR+
AR L
3 A
D
RDS C
R
(eq. 2)
RR+
0.5 560 nH
3 5 5.2 mW 5pF
+ 718 kW
where: AR is the internal ramp amplifier gain. AD is the current balancing amplifier gain. RDS is the total lowside MOSFET on−resistance, CR is the internal ramp capacitor value.
Setting the Switching Frequency for RPM Operation
During the RPM operation, the ADP3211 runs in pseudoconstant frequency if the load current is high enough for continuous current mode. While in DCM, the switching frequency is reduced with the load current in a linear manner. To save power with light loads, lower switching frequency is usually preferred during RPM operation. However, the V
CCGFX
ripple specification of IMVP6.5 sets a limitation for the lowest switching frequency. Therefore, depending on the inductor and output capacitors, the switching frequency in RPM can be equal to, greater than, or less than its counterpart in PWM.
A resistor from RPM to GND sets the pseudo constant
frequency as following:
R
RPM
+
2 R
T
V
VID
) 1.0 V
AR (1 * D) V
VID
RR CR f
SW
* 0.5 kW
(eq. 3)
where: AR is the internal ramp amplifier gain. CR is the internal ramp capacitor value. R
R
is an external resistor on the RAMPADJ pin to set the
internal ramp magnitude.
Because R
R
= 718 kW, the following resistance sets up
400 kHz switching frequency in RPM operation.
2 274 kW
1.1 V ) 1.0 V
0.5 (1 * 0.054) 1.1 V
718 kW 5pF 400 kHz
* 500 W + 93.1 kW
(eq. 4)
R
RPM
+
Inductor Selection
The choice of inductance determines the ripple current of the inductor. Less inductance results in more ripple current, which increases the output ripple voltage and the conduction losses in the MOSFETs. However, this allows the use of smallersize inductors, and for a specified peaktopeak transient deviation, it allows less total output capacitance. Conversely, a higher inductance results in lower ripple current and reduced conduction losses, but it requires larger−size inductors and more output capacitance for the same peak−to−peak transient deviation. For a buck converter, the practical value for peak−to−peak inductor ripple current is less than 50% of the maximum dc current of that inductor. Equation 5 shows the relationship between the inductance, oscillator frequency, and peak−to−peak ripple current. Equation 6 can be used to determine the minimum inductance based on a given output ripple voltage.
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23
IR+
V
VID
(1 * D
MIN
)
f
SW
L
(eq. 5)
L w
V
VID
RO (1 * D
MIN
)
f
SW
V
RIPPLE
(eq. 6)
In this example, RO is assumed to be the ESR of the output capacitance, which results in an optimal transient response. Solving Equation 6 for a 16 mV peak−to−peak output ripple voltage yields:
L w
1.1 V 8mW (1 * 0.054) 400 kHz 16 mV
+ 1.4 mH
(eq. 7)
If the resultant ripple voltage is less than the initially selected value, the inductor can be changed to a smaller value until the ripple value is met. This iteration allows optimal transient response and minimum output decoupling. In this example, the iteration showed that a 560 nH inductor was sufficient to achieve a good ripple.
The smallest possible inductor should be used to minimize the number of output capacitors. Choosing a 560 nH inductor is a good choice for a starting point, and it provides a calculated ripple current of 6.6 A. The inductor should not saturate at the peak current of 18.3 A, and it should be able to handle the sum of the power dissipation caused by the winding’s average current (10 A) plus the ac core loss.
Another important factor in the inductor design is the DCR, which is used for measuring the inductor current. Too large of a DCR causes excessive power losses, whereas too small of a value leads to increased measurement error. For this example, an inductor with a DCR of 1.3 mW is used.
Selecting a Standard Inductor
After the inductance and DCR are known, select a standard inductor that best meets the overall design goals. It is also important to specify the inductance and DCR tolerance to maintain the accuracy of the system. Using 10% tolerance for the inductance and 7% for the DCR at room temperature are reasonable values that most manufacturers can meet.
Power Inductor Manufacturers
The following companies provide surface−mount power inductors optimized for high power applications upon request.
Vishay Dale Electronics, Inc. (605) 6659301 Panasonic (714) 3737334 Sumida Electric Company (847) 5456700 NEC Tokin Corporation (510) 3244110
Output Droop Resistance
The design requires that the regulator output voltage measured at the chipset pins decreases when the output current increases. The specified voltage drop corresponds to the droop resistance (RO).
The output current is measured by low−pass filtering the voltage across the inductor or current sense resistor. The filter is implemented by the CS amplifier that is configured with RPH, RCS, and CCS. The output resistance of the regulator is set by the following equations:
RO+
R
CS
R
PH
R
SENSE
(eq. 8)
CCS+
L
R
SENSE
R
CS
(eq. 9)
where R
SENSE
is the DCR of the output inductors.
Either RCS or RPH can be chosen for added flexibility. Due to the current drive ability of the CSCOMP pin, the RCS resistance should be greater than 100 kW. For example, initially select RCS to be equal to 200 kW, and then use Equation 9 to solve for CCS:
CCS+
560 nH
1.3 mW 200 kW
+ 2.2 nF
(eq. 10)
If CCS is not a standard capacitance, RCS can be tuned. In this case, the required CCS is a standard value and no tuning is required. For best accuracy, CCS should be a 5% NPO capacitor.
Next, solve for RPH by rearranging Equation 8 as follows:
RPHw
1.3 mW 8mW
200 kW + 32.5 kW
(eq. 11)
The standard 1% resistor for RPH is 32.4 kW.
Inductor DCR Temperature Correction
If the DCR of the inductor is used as a sense element and copper wire is the source of the DCR, the temperature changes associated with the inductor’s winding must be compensated for. Fortunately, copper has a well−known temperature coefficient (TC) of 0.39%/°C.
If RCS is designed to have an opposite but equal percentage of change in resistance, it cancels the temperature variation of the inductor’s DCR. Due to the nonlinear nature of NTC thermistors, series resistors R
CS1
and R
CS2
(see Figure 34) are needed to linearize the NTC
and produce the desired temperature coefficient tracking.
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24
ADP3211
16
15
14
CSCOMP
CSFB
CSREF
+
Place as close as possible
to nearest inductor
To Switch Node
Keep This Path As Short As Possible And Well Away From Switch Node Lines
Figure 34. TemperatureCompensation Circuit Values
C
CS1
R
CS1
R
CS2
R
TH
R
PH
To V
OUT
Sense
The following procedure and expressions yield values
for R
CS1
, R
CS2
, and RTH (the thermistor value at 25°C) for
a given RCS value.
1. Select an NTC to be used based on its type and value. Because the value needed is not yet determined, start with a thermistor with a value close to RCS and an NTC with an initial tolerance of better than 5%.
2. Find the relative resistance value of the NTC at two temperatures. The appropriate temperatures will depend on the type of NTC, but 50°C and 90°C have been shown to work well for most types of NTCs. The resistance values are called A (A is RTH(50°C)/RTH(25°C)) and B (B is RTH(90°C)/RTH(25°C)). Note that the relative value of the NTC is always 1 at 25°C.
3. Find the relative value of RCS required for each of the two temperatures. The relative value of RCS is based on the percentage of change needed, which is initially assumed to be 0.39%/°C in this example. The relative values are called r1 (r1 is 1/(1+ TC × (T1 25))) and r2 (r2 is 1/(1 + TC × (T2 25))), where TC is 0.0039, T1 is 50°C, and T2 is 90°C.
4. Compute the relative values for r
CS1
, r
CS2
, and
rTH by using the following equations:
r
CS2
(A * B) r1 r2* A (1 * B) r2) B (1 * A) r
1
A (1 * B) r1* B (1 * A) r2* (A * B)
(eq. 12)
r
CS1
+
(1 * A)
1
1*r
CS2
*
A
r1*r
CS2
rTH+
1
1
1*r
CS2
*
1
r
CS1
5. Calculate RTH = rTH × RCS, and then select a thermistor of the closest value available. In addition, compute a scaling factor k based on the ratio of the actual thermistor value used relative to the computed one:
k +
R
TH(ACTUAL)
R
TH(CALCULATED)
(eq. 13)
6. Calculate values for R
CS1
and R
CS2
by using the
following equations:
R
CS1
+ RCS k r
CS1
(eq. 14)
R
CS2
+ RCS ǒ(1 * k) )(k r
CS2
)
Ǔ
For example, if a thermistor value of 100 kW is selected
in Step 1, an available 0603size thermistor with a value close to RCS is the Vishay NTHS0603N04 NTC thermistor, which has resistance values of A = 0.3359 and B = 0.0771. Using the equations in Step 4, r
CS1
is 0.359, r
CS2
is 0.729,
and rTH is 1.094. Solving for rTH yields 219 kW, so a thermistor of 220 kW would be a reasonable selection, making k equal to 1.005. Finally, R
CS1
and R
CS2
are found
to be 72.2 kW and 146 kW. Choosing the closest 1% resistor values yields a choice of 71.5 kW and 147 kW.
C
out
Selection
The required output decoupling for processors and platforms is typically recommended by Intel. For systems containing both bulk and ceramic capacitors, however, the following guidelines can be a helpful supplement.
Select the number of ceramics and determine the total ceramic capacitance (CZ). This is based on the number and type of capacitors used. Keep in mind that the best location to place ceramic capacitors is inside the socket; however, the physical limit is twenty 0805size pieces inside the socket. Additional ceramic capacitors can be placed along the outer edge of the socket. A combined ceramic capacitor value of 40 mF to 50 mF is recommended and is usually composed of multiple 10 mF or 22 mF capacitors.
Ensure that the total amount of bulk capacitance (CX) is within its limits. The upper limit is dependent on the VID OTF output voltage stepping (voltage step, VV, in time, tV, with error of V
ERR
); the lower limit is based on meeting the
critical capacitance for load release at a given maximum load step, DIO. The current version of the IMVP−6.5 specification allows a maximum V
CCGFX
overshoot
(V
OSMAX
) of 10 mV more than the VID voltage for a
stepoff load current.
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25
C
X(MIN)
w
ȧ
ȧ
ȡ
Ȣ
L DI
O
ǒ
RO)
V
OSMAX
DI
O
Ǔ
V
VID
* C
Z
ȧ
ȧ
ȣ
Ȥ
(eq. 15)
C
X(MAX)
v
L
k
2
R
o
2
V
V
V
VID
ȧ
ȡ Ȣ
1 )ǒt
v
V
VID
V
V
k R
o
L
Ǔ
2
Ǹ
* 1
ȧ
ȣ Ȥ
* C
Z
(eq. 16)
where k + 1n
ǒ
V
ERR
V
V
Ǔ
To meet the conditions of these expressions and the transient response, the ESR of the bulk capacitor bank (RX) should be less than two times the droop resistance, RO. If the C
X(MIN)
is greater than C
X(MAX)
, the system does not meet the VID OTF specifications and may require less inductance. In addition, the switching frequency may have to be increased to maintain the output ripple.
For example, if two pieces of 22 mF, 0805−size MLC
capacitors (CZ = 44 mF) are used during a VID voltage change, the V
CCGFX
change is 220 mV in 22 ms with a
setting error of 10 mV. If k = 3.1, solving for the bulk capacitance yields:
C
X(MIN)
w
ȧ
ȡ
Ȣ
560 nH 8A
ǒ
5.1 mW)
10 mV
8A
Ǔ
1.174 V
44 mF
ȧ
ȣ
Ȥ
+ 256 m
F
C
X(MAX)
v
560 nH 220 mV
3.1
2
(5.1 mW)2 1.174 V
ȧ
ȡ Ȣ
1)
ǒ
22 ms 1.174 V 3.1 5.1 mW
220 mV 560 nH
Ǔ
2
Ǹ
1
ȧ
ȣ Ȥ
44 mF
+ 992 mF (eq. 17)
Using two 220 mF Panasonic SP capacitors with a typical
ESR of 7 mW each yields CX = 440 mF and RX = 3.5 mW.
Ensure that the ESL of the bulk capacitors (LX) is low enough to limit the high frequency ringing during a load change. This is tested using:
LXv CZ R
O
2
Q
2
(eq. 18)
LXv 44 mF (5.1 mW)2 2 + 2.3 nH
where: Q is limited to the square root of 2 to ensure a critically damped system. LX is about 450 pH for the two SP capacitors, which is low enough to avoid ringing during a load change. If the LX of the chosen bulk capacitor bank is too large, the number of ceramic capacitors may need to be increased to prevent excessive ringing.
For this multi−mode control technique, an all ceramic capacitor design can be used if the conditions of Equations 15, 16, and 18 are satisfied.
Power MOSFETs
For typical 15 A applications, the N−channel power MOSFETs are selected for one highside switch and two lowside switch. The main selection parameters for the power MOSFETs are V
GS(TH)
, QG, C
ISS
, C
RSS
, and
R
DS(ON)
. Because the voltage of the gate driver is 5.0 V,
logiclevel threshold MOSFETs must be used.
The maximum output current, IO, determines the R
DS(ON)
requirement for the lowside (synchronous) MOSFETs. With conduction losses being dominant, the following expression shows the total power that is dissipated in each synchronous MOSFET in terms of the ripple current per phase (IR) and the average total output current (IO):
PSF+ (1 * D)
ƪ
ǒ
I
O
n
SF
Ǔ
2
)
1
12
ǒ
I
R
n
SF
Ǔ
2
ƫ
R
DS(SF)
(eq. 19)
where: D is the duty cycle and is approximately the output voltage divided by the input voltage. IR is the inductor peak−to−peak ripple current and is approximately:
IR+
(1 * D) V
OUT
L f
SW
(eq. 20)
Knowing the maximum output current and the maximum allowed power dissipation, the user can calculate the required R
DS(ON)
for the MOSFET. For an 8−lead SOIC or 8lead SOICcompatible MOSFET, the junction to ambient (PCB) thermal impedance is 50°C/W. In the worst case, the PCB temperature is 70°C to 80°C during heavy load operation of the notebook, and a safe limit for PSF is about 0.8 W to 1.0 W at 120°C junction temperature. Therefore, for this example (15 A maximum), the R
DS(SF)
per MOSFET is less than 18.8 mW for the low−side MOSFET. This R
DS(SF)
is also at a junction temperature of
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26
about 120°C; therefore, the R
DS(SF)
per MOSFET should
be less than 13.3 mW at room temperature, or 18.8 mW at high temperature.
Another important factor for the synchronous MOSFET is the input capacitance and feedback capacitance. The ratio of the feedback to input must be small (less than 10% is recommended) to prevent accidentally turning on the synchronous MOSFETs when the switch node goes high.
The highside (main) MOSFET must be able to handle two main power dissipation components: conduction losses and switching losses. Switching loss is related to the time for the main MOSFET to turn on and off and to the current and voltage that are being switched. Basing the switching speed on the rise and fall times of the gate driver impedance and MOSFET input capacitance, the following expression provides an approximate value for the switching loss per main MOSFET:
P
S(MF)
+ 2 fSW
V
DC
I
O
n
MF
RG nMF C
ISS
(eq. 21)
where: nMF is the total number of main MOSFETs. RG is the total gate resistance. C
ISS
is the input capacitance of the main MOSFET.
The most effective way to reduce switching loss is to use lower gate capacitance devices.
The conduction loss of the main MOSFET is given by the following equation:
P
C(MF)
+ D
ƪ
ǒ
I
O
n
MF
Ǔ
2
)
1
12
ǒ
I
R
n
MF
Ǔ
2
ƫ
R
DS(MF)
(eq. 22)
where R
DS(MF)
is the on resistance of the MOSFET.
Typically, a user wants the highest speed (low C
ISS
) device for a main MOSFET, but such a device usually has higher on resistance. Therefore, the user must select a device that meets the total power dissipation (about 0.8 W to 1.0 W for an 8lead SOIC) when combining the switching and conduction losses.
For example, an NTMFS4821N device can be selected as the main MOSFET (one in total; that is, nMF = 1), with approximately C
ISS
= 1400 pF (maximum) and R
DS(MF)
=
8.6 mW (maximum at TJ = 120°C), and an NTMFS4846N device can be selected as the synchronous MOSFET (two in total; that is, nSF = 2), with R
DS(SF)
= 3.8 mW (maximum
at TJ = 120°C). Solving for the power dissipation per MOSFET at IO = 15 A and IR = 5.0 A yields 178 mW for each synchronous MOSFET and 446 mW for each main MOSFET. A third synchronous MOSFET is an option to further increase the conversion efficiency and reduce thermal stress.
Finally, consider the power dissipation in the driver. This is best described in terms of the QG for the MOSFETs and is given by the following equation:
ƪ
f
SW
2
(nMF Q
GMF
) nSF Q
GSF
) ) I
CC
ƫ
VCC
(eq. 23)
P
DRV
+
where Q
GMF
is the total gate charge for each main
MOSFET, and Q
GSF
is the total gate charge for each
synchronous MOSFET.
The previous equation also shows the standby dissipation
(ICC times the VCC) of the driver.
Current Limit SetPoint
To select the current limit set point, we need to find the
resistor value for R
LIM
. The current limit threshold for the
ADP3211 is set when the current in R
LIM
is equal to the
internal reference current of 20 mA. The current in R
LIM
is
equal to the inductor current times RO. R
LIM
can be found
using the following equation:
R
LIM
+
I
LIM
R
O
20 mA
(eq. 24)
where: R
LIM
is the current limit resistor. R
LIM
is connected from
the I
LIM
pin to the CSCOMP pin. RO is the output load line resistance. I
LIM
is the current limit set point. This is the peak inductor
current that will trip current limit.
In this example, if choosing 20 A for I
LIM
, R
LIM
is
6.9 kW, which is close to a standard 1% resistance of
6.98 kW.
The per phase current limit described earlier has its limit
determined by the following:
I
PHLIM
^
V
COMP(MAX)
* VR* V
BIAS
AD R
DS(MAX)
)
I
R
2
(eq. 25)
For the ADP3211, the maximum COMP voltage
(V
COMP(MAX)
) is 3.3 V, the COMP pin bias voltage (V
BIAS
) is 1.0 V, and the current balancing amplifier gain (AD) is 5. Using a VR of 0.55 V, and a R
DS(MAX)
of 3.8 mW (lowside
onresistance at 150°C) results in a per phase limit of 85 A. Although this number seems high, this current level can only be reached with a absolute short at the output and the current limit latchoff function shutting down the regulator before overheating occurs.
This limit can be adjusted by changing the ramp voltage VR. However, users should not set the per phase limit lower than the average per phase current (I
LIM
/n).
There is also a per phase initial dutycycle limit at maximum input voltage:
D
LIM
+ D
MIN
V
COMP(MAX)
* V
BIAS
V
R
(eq. 26)
RC Snubber
It is important in any buck topology to use a resistorcapacitor snubber across the low side power MOSFET. The RC snubber dampens ringing on the switch
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27
node when the high side MOSFET turns on. The switch node ringing could cause EMI system failures and increased stress on the power components and controller. The RC snubber should be placed as close as possible to the low side MOSFET. Typical values for the resistor range from 1 W to 10 W. Typical values for the capacitor range from 330 pF to 4.7 nF. The exact value of the RC snubber depends on the PCB layout and MOSFET selection. Some fine tuning must be done to find the best values. The equation below is used to find the starting values for the RC snubber.
R
Snubber
+
1
2 p f
Ringing
C
OSS
(eq. 27)
C
Snubber
+
1
p f
Ringing
R
Snubber
(eq. 28)
P
Snubber
+ C
Snubber
V
2
Input
f
Switching
(eq. 29)
Where R
Snubber
is the snubber resistor.
C
Snubber
is the snubber capacitor.
f
Ringing
is the frequency of the ringing on the switch node when the high side MOSFET turns on. C
OSS
is the low side MOSFET output capacitance at V
Input
. This is taken from the low side MOSFET data sheet. V
input
is the input voltage.
f
Switching
is the switching frequency.
P
Snubber
is the power dissipated in R
Snubber
.
Current Monitor
The ADP3211 has an output current monitor. The I
MON
pin sources a current proportional to the total inductor current. A resistor, R
MON
, from I
MON
to FBRTN sets the
gain of the output current monitor. A 0.1 mF is placed in parallel with R
MON
to filter the inductor current ripple and
high frequency load transients. Since the I
MON
pin is connected directly to the CPU, it is clamped to prevent it from going above 1.15 V.
The I
MON
pin current is equal to the R
LIM
times a fixed
gain of 10. R
MON
can be found using the following
equation:
R
MON
+
1.15 V R
LIM
10 RO I
FS
(eq. 30)
where: R
MON
is the current monitor resistor. R
MON
is connected
from I
MON
pin to FBRTN.
R
LIM
is the current limit resistor. RO is the output load line resistance. IFS is the output current when the voltage on I
MON
is at full
scale.
Feedback Loop Compensation Design
Optimized compensation of the ADP3211 allows the best possible response of the regulator’s output to a load change. The basis for determining the optimum compensation is to make the regulator and output decoupling appear as an output impedance that is entirely resistive over the widest possible
frequency range, including dc, and that is equal to the droop resistance (RO). With the resistive output impedance, the output voltage droops in proportion with the load current at any load current slew rate, ensuring the optimal position and allowing the minimization of the output decoupling.
With the multimode feedback structure of the ADP3211, it is necessary to set the feedback compensation so that the converter’s output impedance works in parallel with the output decoupling. In addition, it is necessary to compensate for the several poles and zeros created by the output inductor and decoupling capacitors (output filter).
A Type III compensator on the voltage feedback is adequate for proper compensation of the output filter. Figure 35 shows the Type III amplifier used in the ADP3211. Figure 36 shows the locations of the two poles and two zeros created by this amplifier.
COMP
FB
REFERENCE
VOLTAGE
VOLTAGE ERROR
AMPLIFIER
ADP3211
OUTPUT
VOLTAGE
Figure 35. Voltage Error Amplifier
R
A
C
A
C
B
C
FB
R
FB
Figure 36. Poles and Zeros of Voltage Error Amplifier
GAIN
0dB
FREQUENCY
–20dB/DEC
f
P1
fZ2fZ1f
P2
–20dB/DEC
The following equations give the locations of the poles and zeros shown in Figure 36:
fZ1+
1
2p C
A
R
A
(eq. 31)
fZ2+
1
2p C
FB
R
FB
(eq. 32)
fP1+
1
2p(C
A
) CB) R
FB
(eq. 33)
fP2+
CA) C
B
2p RA CB C
A
(eq. 34)
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28
The expressions that follow compute the time constants for the poles and zeros in the system and are intended to yield an optimal starting point for the design; some adjustments may be necessary to account for PCB and component parasitic effects (see the Tuning Procedure for ADP3211 section):
RE+ RO) AD RDS)
R
DCR
V
RT
V
VID
)
(eq. 35)
2 L (1 * D) V
RT
CX RO V
VID
TA+ CX (RO* RȀ) )
L
X
R
O
R
O
* RȀ
R
X
(eq. 36)
TB+ (RX) RȀ*RO) C
X
(eq. 37)
TC+
V
RT
ǒL *
A
D RDS
2 f
SW
Ǔ
V
VID
R
E
(eq. 38)
TD+
C
X
CZ R
O
2
CX (RO* RȀ) ) CZ R
O
(eq. 39)
where: R’ is the PCB resistance from the bulk capacitors to the ceramics and is approximately 0.4 mW (assuming an 8layer motherboard). RDS is the total lowside MOSFET for on resistance. AD is 5. VRT is 1.25 V. LX is the ESL of the bulk capacitors (450 pH for the two Panasonic SP capacitors).
The compensation values can be calculated as follows:
CA+
R
O
T
A
RE R
FB
(eq. 40)
RA+
T
C
C
A
(eq. 41)
CFB+
T
B
R
FB
(eq. 42)
CB+
T
D
R
A
(eq. 43)
The standard values for these components are subject to the tuning procedure described in the Tuning Procedure for ADP3211 section.
CIN Selection and Input Current DI/DT Reduction
In continuous inductor−current mode, the source current of the highside MOSFET is approximately a square wave with a duty ratio equal to V
OUT/VIN
. To prevent large voltage transients, use a low ESR input capacitor sized for the maximum RMS current.
The maximum RMS capacitor current occurs at the lowest input voltage and is given by:
I
CRMS
+ D IO
1
D
* 1
Ǹ
(eq. 44)
I
CRMS
+ 0.15 15 A
1
0.15
* 1Ǹ+ 5.36 A
where IO is the output current.
In a typical notebook system, the battery rail decoupling is achieved by using MLC capacitors or a mixture of MLC capacitors and bulk capacitors. In this example, the input capacitor bank is formed by four pieces of 10 mF, 25 V MLC capacitors, with a ripple current rating of about 1.5 A each.
Tuning Procedure for ADP3211
Set Up and Test the Circuit
1. Build a circuit based on the compensation values computed from the design spreadsheet.
2. Connect a dc load to the circuit.
3. Turn on the ADP3211 and verify that it operates properly.
4. Check for jitter with no load and full load conditions.
Set the DC Load Line
1. Measure the output voltage with no load (VNL) and verify that this voltage is within the specified tolerance range.
2. Measure the output voltage with a full load when the device is cold (V
FLCOLD
). Allow the board to run for ~10 minutes with a full load and then measure the output when the device is hot (V
FLHOT
). If the difference between the two measured voltages is more than a few millivolts, adjust R
CS2
using Equation 45.
R
CS2(NEW)
+ R
CS2(OLD)
V
NL
* V
FLCOLD
VNL* V
FLHOT
(eq. 45)
3. Repeat Step 2 until no adjustment of R
CS2
is
needed.
4. Compare the output voltage with no load to that with a full load using 5 A steps. Compute the load line slope for each change and then find the average to determine the overall load line slope (R
OMEAS
).
5. If the difference between R
OMEAS
and RO is more
than 0.05 mW, use the following equation to adjust the RPH values:
R
PH(NEW)
+ R
PH(OLD)
R
OMEAS
R
O
(eq. 46)
6. Repeat Steps 4 and 5 until no adjustment of R
PH
is needed. Once this is achieved, do not change RPH, R
CS1
, R
CS2
, or RTH for the rest of the
procedure.
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29
7. Measure the output ripple with no load and with a full load with scope, making sure both are within the specifications.
Set the AC Load Line
1. Remove the dc load from the circuit and connect a dynamic load.
2. Connect the scope to the output voltage and set it to dc coupling mode with a time scale of 100 ms/div.
3. Set the dynamic load for a transient step of about 40 A at 1 kHz with 50% duty cycle.
4. Measure the output waveform (note that use of a dc offset on the scope may be necessary to see the waveform). Try to use a vertical scale of 100 mV/div or finer.
5. The resulting waveform will be similar to that shown in Figure 37. Use the horizontal cursors to measure V
ACDRP
and V
DCDRP
, as shown in Figure 37. Do not measure the undershoot or overshoot that occurs immediately after the step.
Figure 37. AC Load Line Waveform
V
DCDRP
V
ACDRP
6. If the difference between V
ACDRP
and V
DCDRP
is more than a couple of millivolts, use Equation 47 to adjust CCS. It may be necessary to try several parallel values to obtain an adequate one because there are limited standard capacitor values available (it is a good idea to have locations for two capacitors in the layout for this reason).
C
CS(NEW)
+ C
CS(OLD)
V
ACDRP
V
DCDRP
(eq. 47)
7. Repeat Steps 5 and 6 until no adjustment of C
CS
is needed. Once this is achieved, do not change CCS for the rest of the procedure.
8. Set the dynamic load step to its maximum step size (but do not use a step size that is larger than needed) and verify that the output waveform is square, meaning V
ACDRP
and V
DCDRP
are equal.
9. Ensure that the load step slew rate and the
powerup slew rate are set to ~150 A/ms to 250 A/ms (for example, a load step of 10 A should take 50 ns to 100 ns) with no overshoot. Some dynamic loads have an excessive overshoot at powerup if a minimum current is incorrectly set (this is an issue if a VTT tool is in use).
Set the Initial Transient
1. With the dynamic load set at its maximum step
size, expand the scope time scale to 2 ms/div to 5 ms/div. This results in a waveform that may have two overshoots and one minor undershoot before achieving the final desired value after V
DROOP
(see Figure 38).
Figure 38. Transient Setting Waveform, Load Step
V
TRAN1
V
DROOP
V
TRAN2
2. If both overshoots are larger than desired, try the following adjustments in the order shown.
a. Increase the resistance of the ramp resistor
(R
RAMP
) by 25%.
b. For V
TRAN1
, increase CB or increase the
switching frequency.
c. For V
TRAN2
, increase RA by 25% and decrease
CA by 25%. If these adjustments do not change the response, it is because the system is limited by the output decoupling. Check the output response and the switching nodes each time a change is made to ensure that the output decoupling is stable.
3. For load release (see Figure 39), if V
TRANREL
is larger than the value specified by IMVP6.5, a greater percentage of output capacitance is needed. Either increase the capacitance directly or decrease the inductor values. (If inductors are changed, however, it will be necessary to redesign the circuit using the information from the spreadsheet and to repeat all tuning guide procedures).
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30
Figure 39. Transient Setting Waveform, Load Release
V
TRANREL
V
DROOP
Layout and Component Placement
The following guidelines are recommended for optimal
performance of a switching regulator in a PC system.
General Recommendations
1. For best results, use a PCB of four or more layers. This should provide the needed versatility for control circuitry interconnections with optimal placement; power planes for ground, input, and output; and wide interconnection traces in the rest of the power delivery current paths. Keep in mind that each square unit of 1 oz copper trace has a resistance of ~0.53 mW at room temperature.
2. When high currents must be routed between PCB layers, vias should be used liberally to create several parallel current paths so that the resistance and inductance introduced by these current paths is minimized and the via current rating is not exceeded.
3. If critical signal lines (including the output voltage sense lines of the ADP3211) must cross through power circuitry, it is best if a signal ground plane can be interposed between those signal lines and the traces of the power circuitry. This serves as a shield to minimize noise injection into the signals at the expense of increasing signal ground noise.
4. An analog ground plane should be used around and under the ADP3211 for referencing the components associated with the controller. This plane should be tied to the nearest ground of the output decoupling capacitor, but should not be tied to any other power circuitry to prevent power currents from flowing into the plane.
5. The components around the ADP3211 should be located close to the controller with short traces. The most important traces to keep short and away from other traces are those to the FB and CSFB pins. Refer to Figure 34 for more details on the layout for the CSFB node.
6. The output capacitors should be connected as close as possible to the load (or connector) that
receives the power (for example, a microprocessor core). If the load is distributed, the capacitors should also be distributed and generally placed in greater proportion where the load is more dynamic.
7. Avoid crossing signal lines over the switching power path loop, as described in the Power Circuitry section.
8. Connect a 1 mF decoupling ceramic capacitor from VCC to AGND. Place this capacitor as close as possible to the controller. Connect a 4.7 mF decoupling ceramic capacitor from PVCC to PGND. Place this capacitor as close as possible to the controller.
Power Circuitry
1. The switching power path on the PCB should be routed to encompass the shortest possible length to minimize radiated switching noise energy (that is, EMI) and conduction losses in the board. Failure to take proper precautions often results in EMI problems for the entire PC system as well as noiserelated operational problems in the powerconverter control circuitry. The switching power path is the loop formed by the current path through the input capacitors and the power MOSFETs, including all interconnecting PCB traces and planes. The use of short, wide interconnection traces is especially critical in this path for two reasons: it minimizes the inductance in the switching loop, which can cause high energy ringing, and it accommodates the high current demand with minimal voltage loss.
2. When a powerdissipating component (for example, a power MOSFET) is soldered to a PCB, the liberal use of vias, both directly on the mounting pad and immediately surrounding it, is recommended. Two important reasons for this are improved current rating through the vias and improved thermal performance from vias extended to the opposite side of the PCB, where a plane can more readily transfer heat to the surrounding air. To achieve optimal thermal dissipation, mirror the pad configurations used to heat sink the MOSFETs on the opposite side of the PCB. In addition, improvements in thermal performance can be obtained using the largest possible pad area.
3. The output power path should also be routed to encompass a short distance. The output power path is formed by the current path through the inductor, the output capacitors, and the load.
4. For best EMI containment, a solid power ground plane should be used as one of the inner layers and extended under all power components.
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31
Signal Circuitry
1. The output voltage is sensed and regulated between the FB and FBRTN pins, and the traces of these pins should be connected to the signal ground of the load. To avoid differential mode noise pickup in the sensed signal, the loop area should be as small as possible. Therefore, the FB and FBRTN traces should be routed adjacent to each other, atop the power ground plane, and back to the controller.
2. The feedback traces from the switch nodes should be connected as close as possible to the inductor. The CSREF signal should be Kelvin connected to the center point of the copper bar, which is the V
CCGFX
common node for the inductor.
3. On the back of the ADP3211 package, there is a metal pad that can be used to heat sink the device. Therefore, running vias under the ADP3211 is not recommended because the metal pad may cause shorting between vias.
ORDERING INFORMATION
Device Number* Temperature Range Package Package Option Shipping
ADP3211MNR2G 10°C to 100°C 32Lead QFN IMVP6.5 1.1 V
Boot Voltage
5000 / Tape & Reel
ADP3211AMNR2G 10°C to 100°C 32Lead QFN 1.2 V Boot Voltage 5000 / Tape & Reel
*The “G’’ suffix indicates Pb−Free package. †For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specification
Brochure, BRD8011/D.
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32
PACKAGE DIMENSIONS
QFN32 5*5*1 0.5 P
CASE 488AM01
ISSUE O
SEATING
32 X
K
0.15 C
(A3)
A
A1
D2
b
1
9
16
17
32
2 X
2 X
E2
32 X
8
24
32 X
L
32 X
BOTTOM VIEW
EXPOSED PAD
TOP VIEW
SIDE VIEW
D
A
B
E
0.15 C
PIN ONE
LOCATION
0.10 C
0.08 C
C
25
e
A0.10 BC
0.05 C
NOTES:
1. DIMENSIONS AND TOLERANCING PER ASME Y14.5M, 1994.
2. CONTROLLING DIMENSION: MILLIMETERS.
3. DIMENSION b APPLIES TO PLATED TERMINAL AND IS MEASURED BETWEEN
0.25 AND 0.30 MM TERMINAL
4. COPLANARITY APPLIES TO THE EXPOSED PAD AS WELL AS THE TERMINALS.
PLANE
DIM MIN NOM MAX
MILLIMETERS
A 0.800 0.900 1.000 A1 0.000 0.025 0.050 A3 0.200 REF
b 0.180 0.250 0.300
D 5.00 BSC D2 2.950 3.100 3.250
E 5.00 BSC E2
e 0.500 BSC
K 0.200 −−− −−−
L 0.300 0.400 0.500
2.950 3.100 3.250
*For additional information on our PbFree strategy and soldering
details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D.
SOLDERING FOOTPRINT*
0.50 PITCH
3.20
0.28
3.20
32 X
28 X
0.63
32 X
5.30
5.30
ON Semiconductor and are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. “Typical” parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. SCILLC does not convey any license under its patent rights nor the rights of others. SCILLC products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications intended to support or sustain life, or for any other application in which the failure of the SCILLC product could create a situation where personal injury or death may occur. Should Buyer purchase or use SCILLC products for any such unintended or unauthorized application, Buyer shall indemnify and hold SCILLC and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that SCILLC was negligent regarding the design or manufacture of the part. SCILLC is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner.
PUBLICATION ORDERING INFORMATION
N. American Technical Support: 8002829855 Toll Free
USA/Canada
Europe, Middle East and Africa Technical Support:
Phone: 421 33 790 2910
Japan Customer Focus Center
Phone: 81−3−5773−3850
ADP3211/D
All brand names and product names appearing in this document are registered trademarks or trademarks of their respective holders.
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Literature Distribution Center for ON Semiconductor P.O. Box 5163, Denver, Colorado 80217 USA
Phone: 3036752175 or 8003443860 Toll Free USA/Canada Fax: 3036752176 or 8003443867 Toll Free USA/Canada Email: orderlit@onsemi.com
ON Semiconductor Website: www.onsemi.com
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For additional information, please contact your loc
a
Sales Representative
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