Allows safe board insertion and removal from a live
backplane
Controls supply voltages from 3.15 V to 16.5 V
Precision current sense amplifier
Precision voltage input
12-bit ADC for current and voltage readback
Charge pumped gate drive for external N-channel FET
Adjustable analog current limit with circuit breaker
±3% accurate hot swap current limit level
Fast response limits peak fault current
Automatic retry or latch-off on current fault
Programmable hot swap timing via TIMER pin
Soft start pin for reference adjustment and programming of
initial current ramp rate
Active-high ON pin
2
C® fast mode-compliant interface (400 kHz maximum)
I
10-lead MSOP
APPLICATIONS
Power monitoring/power budgeting
Central office equipment
Telecommunication and data communication equipment
PCs/servers
GENERAL DESCRIPTION
The ADM1177 is an integrated hot swap controller that offers
digital current and voltage monitoring via an on-chip, 12-bit
analog-to-digital converter (ADC), communicated through an
2
I
C interface.
VCC
SENSE
3.15V TO 16.5
FUNCTIONAL BLOCK DIAGRAM
ADM1177
MUX
V
AMPLIFIER
ON
1.3V
UV COMPARATOR
0
I
R
GND
1
SENSE
SENSEVCC
GATE
SDA
SCL
ADR
A
CURRENT
SENSE
GND
ADM1177
ON
SS
TIMER
Figure 2. Applications Diagram
12-BIT
ADC
FET DRIVE
CONTROLLER
TIMERSS
Figure 1.
N-CHANNEL FET
ADM1177
C
P = VI
SDA
SCL
ADR
GATE
2
I
CONTROLLER
SDA
SCL
06047-001
06047-002
An internal current sense amplifier senses voltage across the sense
resistor in the power path via the VCC pin and the SENSE pin.
The ADM1177 limits the current through this resistor by controlling the gate voltage of an external N-channel FET in the power
path, via the GATE pin. The sense voltage (and, therefore, the
inrush current) is kept below a preset maximum.
The ADM1177 protects the external FET by limiting the time
that it spends with maximum current running through it. This
current limit period is set by the choice of capacitor attached to
the TIMER pin. Additionally, the device provides protection from
overcurrent events that may occur once the hot swap event is
complete. In the case of a short-circuit event, the current in the
sense resistor exceeds an overcurrent trip threshold, and the FET
is switched off immediately by pulling down the GATE pin.
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Anal og Devices for its use, nor for any infringements of patents or ot her
rightsof third parties that mayresultfrom its use. Specifications subject to change without notice. No
license isgranted by implicationorotherwise under any patent or patent rights of Analog Devices.
Trademarks and registeredtrademarks are the property of their respective owners.
A soft start (SS) pin is also included. This gives the user control
over the reference on the current sense amplifier. An internal
current source charges a capacitor on this pin at startup, allowing
the user to set the profile of the initial current ramp. A voltage
can also be driven on this pin to alter the reference.
A 12-bit ADC can measure the current seen in the sense resistor,
as well as the supply voltage on the VCC pin. An industry-standard
2
I
C interface allows a controller to read current and voltage data
from the ADC. Measurements can be initiated by an I
2
Alternatively, the ADC can run continuously, and the user can
read the latest conversion data whenever it is required. Up to
four unique I
C Timing.................................................................... 16
2
C Bus............................... 16
REVISION HISTORY
9/06—Revision 0: Initial Version
Rev. 0 | Page 2 of 24
Page 3
ADM1177
SPECIFICATIONS
VCC = 3.15 V to 16.5 V; TA = −40°C to +85°C; typical values at TA = 25°C, unless otherwise noted.
Table 1.
Parameter Min Typ Max Unit Conditions
VCC PIN
Operating Voltage Range, V
Supply Current, ICC 1.7 2.5 mA
Undervoltage Lockout, V
Undervoltage Lockout Hysteresis, V
ON PIN
Input Current, I
INON
−2 +2 μA
Rising Threshold, V
ONTH
Trip Threshold Hysteresis, V
Glitch Filter Time 3 μs
SS PIN
Pull-Up Current, I
ISSPU
Current Setting Gain, GAINSS 9.5 10 10.5 V/V VSS/VCB; VSS = 0.5 V to 1 V.
Soft Start Completion Voltage, SS
Pull-Down Current, I
ISSPD
SENSE PIN
Input Leakage, I
−1 +1 μA V
SENSE
Overcurrent Fault Timing Threshold, V
Overcurrent Limit Threshold, V
Fast Overcurrent Trip Threshold, V
GATE PIN
Drive Voltage, V
3 6 9 V V
GATE
Pull-Up Current 8 12.5 17 μA V
Pull-Down Current 1.5 mA V
5 mA V
7 mA V
TIMER PIN
Pull-Up Current (Power On Reset), I
Pull-Up Current (Fault Mode), I
Pull-Down Current (Retry Mode), I
Pull-Down Current, I
Trip Threshold Hig h, V
Trip Thresho ld Low, V
TIMERDN
TIMERH
TIMERL
ADR PIN
Set Address to 00, V
Set Address to 01, R
Set Address to 10, I
Set Address to 11, V
ADRLOWV
ADRLOWZ
ADRHIGHZ
ADRHIGHV
Input Current for 11 Decode, I
Input Current for 00 Decode, I
3.15 16.5 V
VCC
2.8 V VCC rising
UVLO
80 mV
UVLOHYST
−100
+100 nA ON < 1.5 V
1.26 1.3 1.34 V ON rising
35 50 65 mV
ONHYST
1 V SS continues to pull up beyond 1 V
HIGHV
10
μA VSS = 0 V to 1 V
70 μA Under fault
= V
92 mV
OCTIM
SENSE
V
OCTRIM
= (V
VCC
VCC
− V
), fault timing starts on the
SENSE
TIMER pin
97 100 103 mV
LIM
V
= (V
− V
LIM
VCC
), closed-loop regulation to a
SENSE
current limit
115 mV
OCFAST
V
OCFAST
= (V
VCC
− V
), gate pull-down current
SENSE
turned on
− V
, V
VCC
VCC
VCC
, V
, V
VCC
VCC
VCC
VCC
VCC
VCC
TIMER
= 3.15 V
= 5 V
= 16.5 V
= 3.15 V
= 5 V
= 16.5 V
= 1 V
TIMER
TIMER
= 1 V
= 1 V
TIMER
= 1 V
GATE
TIMERUPPOR
TIMERUPFAULT
TIMERDNRETRY
9 11 13 V V
7 10 13 V V
−3.5 −5 −6.5 μA Initial cycle, V
−40 −60 −80 μA During current fault, V
2 3 μA
− V
GATE
− V
GATE
= 0 V
GATE
= 3 V, V
GATE
= 3 V, V
GATE
= 3 V, V
GATE
After current fault and during a cool-down
period on a retry device, V
100 μA Normal operation, V
1.26 1.3 1.34 V TIMER rising
0.175 0.2 0.225 V TIMER falling
0 0.8 V Low state
135 150 165 kΩ
Resistor to ground state, load pin with specified
resistance for 01 decode
−1 +1 μA
Open state, maximum load allowed on ADR pin
for 10 decode
2 5.5 V High state
3 10 μA V
ADRLOW
−40 −22 μA V
ADRHIGH
= 2.0 V to 5.5 V
ADR
= 0 V to 0.8 V
ADR
Rev. 0 | Page 3 of 24
Page 4
ADM1177
Parameter Min Typ Max Unit Conditions
MONITORING ACCURACY
Current Sense Absolute Accuracy −1.45
−1.8
−2.8
−5.7
−1.5
−1.8
−2.95
−6.1
−1.95
−2.45
−3.85
−6.7
V
for ADC Full Scale 105.84 mV
SENSE
Voltage Sense Accuracy −0.85
−0.9 +0.9 %
−0.85
−0.9 +0.9 %
−0.9
−1.15 +1.15 %
VCC for ADC Full Scale,
Low Range (VRANGE = 1)
VCC for ADC Full-Scale,
High Range (VRANGE = 0)
I2C TIMING
Low Level Input Voltage, V
High Level Input Voltage, V
Low Level Output Voltage on SDA, V
Output Fall Time on SDA from V
Maximum Width of Spikes Suppressed by
Input Filtering on SDA and SCL Pins
Input Current, II, on SDA/SCL When Not
Driving Out a Logic Low
Input Capacitance on SDA/SCL 5 pF
SCL Clock Frequency, f
Low Period of the SCL Clock 600 ns
High Period of the SCL Clock 1300 ns
1
+1.45 % V
+1.8 % V
+2.8 % V
+5.7 % V
+1.5 % V
+1.8 % V
+2.95 % V
+6.1 % V
+1.95 % V
+2.45 % V
+3.85 % V
+6.7 % V
SENSE
SENSE
SENSE
SENSE
SENSE
SENSE
SENSE
SENSE
SENSE
SENSE
SENSE
SENSE
This is an absolute value to be used when
converting ADC codes to current readings;
any inaccuracy in this value is factored into
absolute current accuracy values (see specs
for Current Sense Absolute Accuracy)
+0.85 %
VCC = 3 V minimum
(low range)
= 6 V minimum
V
CC
(high range)
+0.85 %
VCC = 3 V minimum
(low range)
= 6 V minimum
V
CC
(high range)
+0.9 %
VCC = 3 V minimum
(low range)
= 6 V minimum
V
CC
(high range)
6.65 V
These are absolute values to be used when
converting ADC codes to voltage readings;
26.35 V
any inaccuracy in these values is factored into
voltage accuracy values (see specs for Voltage
Accuracy)
0.3 V
IL
0.7 V
IH
0.4 V I
OL
to V
IHMIN
ILMAX
V
BUS
20 +
0.1 C
250 ns CB = bus capacitance from SDA to GND
B
V
BUS
= 3 mA
OL
50 250 ns
−10 +10 μA
400 kHz
SCL
= 75 mV 0°C to +70°C
= 50 mV 0°C to +70°C
= 25 mV 0°C to +70°C
= 12.5 mV 0°C to +70°C
= 75 mV 0°C to +85°C
= 50 mV 0°C to +85°C
= 25 mV 0°C to +85°C
= 12.5 mV 0°C to +85°C
= 75 mV −40°C to +85°C
= 50 mV −40°C to +85°C
= 25 mV −40°C to +85°C
= 12.5 mV −40°C to +85°C
0°C to +70°C
0°C to +70°C
0°C to +85°C
0°C to +85°C
−40°C to +85°C
−40°C to +85°C
Rev. 0 | Page 4 of 24
Page 5
ADM1177
Parameter Min Typ Max Unit Conditions
Setup Time for a Repeated Start Condition,
t
SU;STA
SDA Output Data Hold Time, t
Setup Time for a Stop Condition, t
100 900 ns
HD;DAT
600 ns
SU;STO
Bus Free Time Between a Stop and a Start
Condition, t
BUF
Capacitive Load for Each Bus Line 400 pF
1
Monitoring accuracy is a measure of the error in a code that is read back for a particular voltage/current. This is a combination of amplifier error, reference error, ADC
error, and error in ADC full-scale code conversion factor.
600 ns
1300 ns
Rev. 0 | Page 5 of 24
Page 6
ADM1177
ABSOLUTE MAXIMUM RATINGS
Table 2.
Parameter Rating
VCC Pin 20 V
SENSE Pin 20 V
TIMER Pin −0.3 V to +6 V
ON Pin −0.3 V to +20 V
SS Pin −0.3 V to +6 V
GATE Pin 30 V
SDA Pin, SCL Pin −0.3 V to +7 V
ADR Pin −0.3 V to +6 V
Storage Temperature Range −65°C to +125°C
Operating Temperature Range −40°C to +85°C
Lead Temperature (Soldering, 10 sec) 300°C
Junction Temperature 150°C
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
Table 3. Thermal Resistance
Package Type θJA Unit
10-Lead MSOP 137.5 °C/W
ESD CAUTION
Rev. 0 | Page 6 of 24
Page 7
ADM1177
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
1
VCC
SENSE
2
ADM1177
ON
3
TOP VIEW
(Not to S cale)
GND
4
5
TIMER
Figure 3. Pin Configuration
Table 4. Pin Function Descriptions
Pin No. Mnemonic Description
1 VCC
Positive Supply Input Pin. The operating supply voltage range is from 3.15 V to 16.5 V. An undervoltage
lockout (UVLO) circuit resets the ADM1175 when a low supply voltage is detected.
2 SENSE
Current Sense Input Pin. A sense resistor between the VCC pin and the SENSE pin sets the analog current
limit. The hot swap operation of the ADM1175 controls the external FET gate to maintain the (V
voltage at 100 mV or below.
3 ON
Undervoltage Input Pin. Active-high pin. An internal ON comparator has a trip threshold of 1.3 V, and the
output of this comparator is used as an enable for the hot swap operation. With an external resistor divider
from VCC to GND, this pin can be used to enable the hot swap operation on a specific voltage on VCC, giving
an undervoltage function.
4 GND Chip Ground Pin.
5 TIMER
Timer Pin. An external capacitor, C
, sets a 270 ms/μF initial timing cycle delay and a 21.7 ms/μF fault delay.
TIMER
The GATE pin turns off when the TIMER pin is pulled beyond the upper threshold. An overvoltage detection
with an external Zener can be used to force this pin high.
6 SCL I2C Clock Pin. Open-drain input requires an external resistive pull-up.
7 SDA I2C Data I/O Pin. Open-drain input/output. Requires an external resistive pull-up.
8 ADR
9 SS
2
C Address Pin. This pin can be tied low, tied high, left floating, or tied low through a resistor to set four
I
different I
2
C addresses.
Soft Start Pin. This pin controls the reference on the current sense amplifier. A 10 μA current source charges
this pin at startup. A capacitor on this pin then sets the slope of the initial current ramp. This pin can also be
driven to a voltage to alter the reference directly, thereby adjusting the current limit level with a gain of 10.
10 GATE
GATE Output Pin. This pin is the high-side gate drive of an external N-channel FET. This pin is driven by the
FET drive controller, which utilizes a charge pump to provide a 12.5 μA pull-up current to charge the FET
GATE pin. The FET drive controller regulates to a maximum load current (100 mV through the sense resistor)
by modulating the GATE pin.
10
GATE
SS
9
ADR
8
SDA
7
6
SCL
06047-003
− V
SENSE
)
VCC
Rev. 0 | Page 7 of 24
Page 8
ADM1177
TYPICAL PERFORMANCE CHARACTERISTICS
2.0
1.8
1.6
1.4
1.2
1.0
(mA)
CC
I
0.8
0.6
0.4
0.2
0
02468101411216
VCC (V)
Figure 4. Supply Current vs. Supply Voltage
8
06047-021
2.0
1.8
1.6
1.4
1.2
1.0
(mA)
CC
I
0.8
0.6
0.4
0.2
0
–40806040200–20
TEMPERATURE (°C)
Figure 7. Supply Current vs. Temperature (Gate On)
06047-022
12
10
8
6
DRIVE VOLTAGE (V)
4
2
0
01
Figure 5. Drive Voltage (V
0
–2
–4
–6
(µA)
–8
GATE
I
–10
VCC (V)
− VCC) vs. Supply Voltage
GATE
8161412108642
06047-029
12
10
8
6
DRIVE VOLTAGE ( V)
4
2
0
–40806040200–20
Figure 8. Drive Voltage (V
0
–2
–4
–6
(µA)
–8
GATE
I
–10
5V V
3.15V V
TEMPERATURE (°C)
− VCC) vs. Temperature
GATE
CC
CC
06047-030
–12
–14
01
VCC (V)
101216148642
8
06047-027
Figure 6. Gate Pull-Up Current vs. Supply Voltage
–12
–14
–40806040200–20
Figure 9. Gate Pull-Up Current vs. Temperature
Rev. 0 | Page 8 of 24
TEMPERATURE (°C)
06047-028
Page 9
ADM1177
12
10
8
(mA)
6
GATE
I
4
2
0
01
Figure 10. Gate Pull-Down Current vs. V
VCC (V)
CC
at V
GATE
161412108642
8
06047-031
= 5 V
2.0
1.8
1.6
1.4
1.2
1.0
0.8
0.6
TIMER THRES HO LD (V)
0.4
0.2
0
018101216148642
HIGH
LOW
VCC (V)
06047-038
Figure 13. Timer Threshold vs. Supply Voltage
2
0
–2
–4
(µA)
–6
GATE
I
–8
–10
–12
–14
01
V
GATE
(V)
Figure 11. Gate Pull-Up Current vs. Gate Voltage at V
20
15
(mA)
10
GATE
I
5
VCC = 3V
0
02
V
V
CC
GATE
V
CC
= 5V
= 12V
(V)
1412108642
6
06047-040
= 5 V
CC
2015105
5
06047-043
Figure 12. Gate Pull-Down Current vs. Gate Voltage
2.0
1.8
1.6
1.4
1.2
1.0
0.8
0.6
TIMER HIG H THRESHOLD (V )
0.4
0.2
0
–4080
Figure 14. Timer Threshold vs. Temperature
100
90
80
70
60
50
40
GATE ON TIME (ms)
30
20
10
0
05.04.54.03.53.02.52.01.51.00.5
Figure 15. Current Limit On Time vs. Timer Capacitance
HIGH
LOW
TEMPERATURE (°C)
C
(µF)
TIMER
6040200–20
06047-039
06047-050
Rev. 0 | Page 9 of 24
Page 10
ADM1177
0
0
–1
–2
(µA)
–3
TIMER
I
–4
–5
–6
018
VCC (V)
101216148642
06047-032
Figure 16.Timer Pull-Up Current (Initial Cycle) vs. Supply Voltage
0
–10
–20
–30
(µA)
–40
TIMER
I
–50
–60
–1
–2
(µA)
–3
TIMER
I
–4
–5
–6
–40806040200–20
Figure 19. Timer Pull-Up Current (Initial Cycle) vs. Temperature
0
–10
–20
–30
(µA)
–40
TIMER
I
–50
–60
TEMPERATURE (°C)
06047-033
–70
–80
018
VCC (V)
101216148642
06047-034
Figure 17. Timer Pull-Up Current (C. B. Delay) vs. Supply Voltage
3.0
2.5
2.0
(µA)
1.5
TIMER
I
1.0
0.5
0
018101216148642
VCC (V)
06047-036
Figure 18. Timer Pull-Down Current (Cool-Off Cycle) vs. Supply Voltage
–70
–80
–40806040200–20
Figure 20. Timer Pull-Up Current (C. B. Delay) vs. Temperature
3.0
2.5
2.0
(µA)
1.5
TIMER
I
1.0
0.5
0
–40806040200–20
Figure 21. Timer Pull-Down Current (Cool-Off Cycle) vs. Temperature
TEMPERATURE (°C)
TEMPERATURE (°C)
06047-035
06047-037
Rev. 0 | Page 10 of 24
Page 11
ADM1177
120
115
110
105
(mV)
100
LIM
V
95
90
85
80
21
VCC (V)
8
16141210864
06047-041
Figure 22. Circuit Breaker Limit Voltage vs. Supply Voltage
110
108
106
104
102
100
V (mV)
98
96
94
92
90
–40806040200–20
Figure 23. V
V
OCFAST
V
LIM
V
OCTIM
TEMPERATURE (°C)
, V
, V
OCTIM
LIM
OCFAST
vs. Temperature
06047-042
1000
900
800
700
600
500
400
300
HITS PER CO DE ( 1000 RE ADS)
200
100
0
20472048204920502046
CODE
Figure 25. ADC Noise, Current Channel, Midcode Input, 1000 Reads
1000
900
800
700
600
500
400
300
HITS PER CO DE ( 1000 RE ADS)
200
100
0
780781782783779
CODE
Figure 26. ADC Noise, 14:1 Voltage Channel, 5 V Input, 1000 Reads
06047-060
06047-061
11 DECODE10 DECODE01 DECODE 00 DECODE
3.2
3.0
2.8
2.6
2.4
2.2
2.0
1.8
1.6
1.4
V (A0/A1)
1.2
1.0
0.8
0.6
0.4
0.2
0
–35–30–25–20–15–10–50510
I (A0/A1) (µA)
Figure 24. Address Pin Voltage vs. Address Pin Current
for Four Addressing Options
06047-026
Rev. 0 | Page 11 of 24
1000
900
800
700
600
500
400
300
HITS PER CO DE ( 1000 RE ADS)
200
100
0
30793080308130823078
CODE
Figure 27. ADC Noise, 7:1 Voltage Channel, 5 V Input, 1000 Reads
06047-062
Page 12
ADM1177
11.0
10.8
10.6
10.4
10.2
(µA)
10.0
9.8
SOFT_START
I
9.6
9.4
9.2
9.0
–40806040200–20
VCC = 5V
VCC = 3.15V
TEMPERATURE (°C)
Figure 30. SS Pin Pull-Up Current vs. Temperature
06047-044
INL (LSB)
4
3
2
1
0
–1
–2
–3
–4
040002500 3000 3500200015001000500
CODE
Figure 28. INL for ADC
06047-023
(mV)
LIM
V
110
100
90
80
70
60
50
40
30
20
10
0
011.21.00.80.60.40.2
V
SOFT_START
Figure 31. V
LIM
(V)
vs. VSS
.4
06047-045
DNL (LSB)
4
3
2
1
0
–1
–2
–3
–4
040002500 3000 3500200015001000500
CODE
Figure 29. DNL for ADC
06047-024
Rev. 0 | Page 12 of 24
Page 13
ADM1177
OVERVIEW OF THE HOT SWAP FUNCTION
When circuit boards are inserted into a live backplane, discharged
supply bypass capacitors draw large transient currents from the
backplane power bus as they charge. Such transient currents can
cause permanent damage to connector pins, as well as dips on
the backplane supply that can reset other boards in the system.
The ADM1177 is designed to turn a circuit board supply voltage
on and off in a controlled manner, allowing the circuit board to
be safely inserted into or removed from a live backplane. The
ADM1177 can reside either on the backplane or on the circuit
board itself.
The ADM1177 controls the inrush current to a fixed maximum
level by modulating the gate of an external N-channel FET placed
between the live supply rail and the load. This hot swap function
protects the card connectors and the FET itself from damage
and limits any problems that can be caused by the high current
loads on the live supply rail.
The ADM1177 holds the GATE pin down (and, thus, the FET is
held off) until a number of conditions are met. An undervoltage
lockout circuit ensures that the device is provided with an adequate
input supply voltage. Once the input supply voltage has been
successfully detected, the device goes through an initial timing
cycle to provide a delay before it attempts to hot swap. This delay
ensures that the board is fully seated in the backplane before
the board is powered up.
Once the initial timing cycle is complete, the hot swap function
is switched on under control of the ON pin. When the ON pin
is asserted high, the hot swap operation starts.
The ADM1177 charges up the gate of the FET to turn on the
load. It continues to charge up the GATE pin until the linear
current limit (set to 100 mV/R
) is reached. For some combi-
SENSE
nations of low load capacitance and high current limit, this limit
may not be reached before the load is fully charged up. If current
limit is reached, the ADM1177 regulates the GATE pin to keep
the current at this limit. For currents above the overcurrent
fault timing threshold, nominally 100 mV/R
, the current
SENSE
fault is timed by sourcing a current out to the TIMER pin. If the
load becomes fully charged before the fault current limit time is
reached (when the TIMER pin reaches 1.3 V), the current drops
below the overcurrent fault timing threshold. The ADM1177
then charges the GATE pin higher to fully enhance the FET for
lowest R
, and the TIMER pin is pulled down again.
ON
If the fault current limit time is reached before the load drops
below the current limit, a fault has been detected, and the hot
swap operation is aborted by pulling down on the GATE pin to
turn off the FET. The ADM1177-2 latches off at this point and
attempts to hot swap again only when the ON pin is deasserted
and then asserted again.
The ADM1177-1 retries the hot swap operation indefinitely,
keeping the FET in its safe operating area (SOA) by using the
TIMER pin to time a cool-down period between hot swap
attempts. The current and voltage threshold combinations on
the TIMER pin set the retry duty cycle to 3.8%.
The ADM1177 is designed to operate over a range of supplies
from 3.15 V to 16.5 V.
UNDERVOLTAGE LOCKOUT
An internal undervoltage lockout (UVLO) circuit resets the
ADM1177 if the VCC
supply is too low for normal operation.
The UVLO has a low-to-high threshold of 2.8 V, with 80 mV
hysteresis. Above 2.8 V supply voltage, the ADM1177 starts
the initial timing cycle.
ON FUNCTION
The ADM1177-1 has an active-high ON pin. The ON pin is the
input to a comparator that has a low-to-high threshold of 1.3 V,
a 50 mV hysteresis, and a glitch filter of 3 s. A low input on the
ON pin turns off the hot swap operation by pulling the GATE
pin to ground, turning off the external FET. The TIMER pin is
also reset by turning on a pull-down current on this pin. A lowto-high transition on the ON pin starts the hot swap operation.
A 10 k pull-up resistor connecting the ON pin to the supply is
recommended.
Alternatively, an external resistor divider at the ON pin can be
used to program an undervoltage lockout value higher than the
internal UVLO circuit, thereby setting a voltage level at the
VCC supply where the hot swap operation is to start. An RC
filter can be added at the ON pin to increase the delay time at
card insertion if the initial timing cycle delay is insufficient.
TIMER FUNCTION
The TIMER pin handles several timing functions with an
external capacitor, C
V
(0.2 V) and V
TIMERH
sources are a 5 µA pull-up, a 60 µA pull-up, a 2 µA pull-down,
and a 100 µA pull-down. The 100 µA pull-down is a non-ideal
current source, approximating a 7 k resistor below 0.4 V.
. There are two comparator thresholds:
TIMER
(1.3 V). The four timing current
TIMERL
These current and voltage levels, together with the value of
C
TIMER
time, the fault current limit time, and the hot swap retry duty cycle.
Rev. 0 | Page 13 of 24
chosen by the user, determine the initial timing cycle
Page 14
ADM1177
GATE AND TIMER FUNCTIONS DURING A HOT
SWAP
During hot insertion of a board onto a live supply rail at VCC,
the abrupt application of supply voltage charges the external
FET drain/gate capacitance, which can cause an unwanted gate
voltage spike. An internal circuit holds GATE low before the
internal circuitry wakes up. This reduces the FET current surges
substantially at insertion. The GATE pin is also held low during
the initial timing cycle and until the ON pin has been taken
high to start the hot swap operation.
During hot swap operation, the GATE pin is first pulled up by
a 12 A current source. If the current through the sense resistor
reaches the overcurrent fault timing threshold, V
current of 60 µA on the TIMER pin, is turned on; and this pin
starts charging up. At a slightly higher voltage in the sense
resistor, the error amplifier servos the GATE pin to maintain
a constant current to the load by controlling the voltage across
the sense resistor to the linear current limit, V
A normal hot swap is complete when the board supply
capacitors near full charge, and the current through the sense
resistor drops to eventually reach the level of the board load
current. As soon as the current drops below the overcurrent
fault timing threshold, the current into the TIMER pin switches
from being a 60 A pull-up to a 100 A pull-down. The
ADM1177 then drives the GATE voltage as high as it can to
fully enhance the FET and reduce R
losses to a minimum.
ON
A hot swap fails if the load current does not drop below the
overcurrent fault timing threshold, V
, before the TIMER
OCTIM
pin has charged up to 1.3 V. In this case, the GATE pin is then
pulled down with a 2 mA current sink. The GATE pull-down
stays on until a hot swap retry starts, which can be forced by
deasserting and then reasserting the ON pin. On the ADM1177-1,
the device retries automatically after a cool-down period.
The ADM1177 also features a method of protection from
sudden load current surges, such as a low impedance fault,
when the current seen across the sense resistor can go well
beyond the linear current limit. If the fast overcurrent trip
threshold, V
, is exceeded, the 2 mA GATE pull-down is
OCFAST
turned on immediately. This pulls the GATE voltage down
quickly to enable the ADM1177 to limit the length of the
current spike that gets through and to bring the current through
the sense resistor back into linear regulation as quickly as
possible. This process protects the backplane supply from
sustained overcurrent conditions that may otherwise cause the
backplane supply to droop during the overcurrent event.
LIM
OCTIM
.
, a pull-up
CALCULATING CURRENT LIMITS AND FAULT
CURRENT LIMIT TIME
The nominal linear current limit is determined by a sense
resistor connected between the VCC pin and the SENSE pin,
as given by Equation 1.
I
LIMIT(NOM)
= V
LIM(NOM)/RSENSE
= 100 mV/R
SENSE
(1)
The minimum linear fault current is given by Equation 2.
I
LIMIT(MIN)
= V
LIM(MIN)/RSENSE(MAX)
= 90 mV/R
SENSE(MAX)
(2)
The maximum linear fault current is given by Equation 3.
I
LIMIT(MAX)
= V
LIM(MAX)/RSENSE(MIN)
= 110 mV/R
SENSE(MIN)
(3)
The power rating of the sense resistor should be rated at the
maximum linear fault current level.
The minimum overcurrent fault timing threshold current is
given by Equation 4.
I
OCTIM(MIN)
= V
OCTIM(MIN)/RSENSE(MAX)
= 85 mV/R
SENSE(MAX)
(4)
The maximum fast overcurrent trip threshold current is given
by Equation 5.
I
OCFAST(MAX)
= V
OCFAST(MAX)/RSENSE(MIN)
= 115 mV/R
SENSE(MIN)
(5)
The fault current limit time is the time that a device spends
timing an overcurrent fault, and is given by Equation 6.
t
FAULT
≈ 21.7 × C
ms/F (6)
TIMER
INITIAL TIMING CYCLE
When VCC is first connected to the backplane supply, the
internal supply (Time Point (1) in
must be charged up. A very short time later (significantly less
than 1 ms), the internal supply is fully up and, because the
undervoltage lockout voltage has been exceeded at VCC, the
device comes out of reset. During this first short reset period,
the GATE pin is held down with a 25 mA pull-down current,
and the TIMER pin is pulled down with a 100 A current sink.
The ADM1177 then goes through an initial timing cycle. At
Time Point (2) the TIMER pin is pulled high with 5 µA. At
Time Point (3), the TIMER reaches the V
the first portion of the initial cycle ends. The 100 µA current
source then pulls down the TIMER pin until it reaches 0.2 V at
Time Point (4). The initial cycle delay (Time Point (2) to Time
Point (4)) is related to C
≈ 270 × C
t
INITIAL
TIMER
ms/F (7)
TIMER
When the initial timing cycle terminates, the device is ready to
start a hot swap operation (assuming the ON pin is asserted).
In the example shown in
Figure 32, the ON pin is asserted at the
same time that VCC is applied, so the hot swap operation starts
immediately after Time Point (4).
Figure 32) of the ADM1177
threshold, and
TIMERL
by Equation 7.
Rev. 0 | Page 14 of 24
Page 15
ADM1177
V
At this point, the FET gate is charged up with a 12 A current
source. At Time Point (5), the threshold voltage of the FET is
reached, and the load current begins to flow. The FET is
controlled to keep the sense voltage at 100 mV (this corresponds
to a maximum load current level defined by the value of R
At Time Point (6), V
GATE
and V
have reached their full
OUT
SENSE
potential, and the load current has settled to its nominal level.
Figure 33 illustrates the situation where the ON pin is asserted
after V
is applied.
VCC
V
VCC
(1)
(2)(3)(4)(5)(6)
).
HOT SWAP RETRY CYCLE ON THE ADM1177-1
With the ADM1177-1, the device turns off the FET after an
overcurrent fault and then uses the TIMER pin to time a delay
before automatically retrying to hot swap.
As with all ADM1177 devices, an overcurrent fault is timed by
charging the TIMER cap with a 60 A pull-up current. When
the TIMER pin reaches 1.3 V, the fault current limit time has
been reached and the GATE pin is pulled down. On the
ADM1177-1, the TIMER pin is then pulled down with a 2 A
current sink. When the TIMER pin reaches 0.2 V, it automatically
restarts the hot swap operation.
The cool-down period is related to C
by Equation 8.
TIMER
V
ON
V
TIMER
V
GATE
SENSE
V
OUT
INITIAL TIMING
CYCLE
Figure 32. Startup (ON Asserts as Power Is Applied)
(1)(2)(3)(4)(5)(6)(7)
V
VCC
V
ON
t
COOL
≈ 550 × C
ms/F (8)
TIMER
Thus, the retry duty cycle is given by Equation 9.
/(t
+ t
t
FAULT
COOL
) × 100% = 3.8% (9)
FAULT
SOFT START (SS PIN)
The SS pin is used to determine the inrush current profile.
A capacitor should be attached to this pin. When the FET is
requested to turn on, the SS pin is held at ground until the
SENSE pin reaches a few millivolts. A current source is then
turned on, which linearly ramps the capacitor up to 1.0 V. The
reference voltage for the GATE linear control amplifier is derived
from the soft start voltage, such that the inrush linear current
limit is defined as I
6047-004
This pin can also be driven to a voltage to alter the reference
directly, thereby adjusting the current limit level with a gain
of 10. See
Figure 31 for an illustration of this relationship.
= VSS/(20 × R
LIMIT
SENSE
).
V
TIMER
V
GATE
V
SENSE
V
OUT
INITIAL TIMING
CYCLE
06047-005
Figure 33. Startup (ON Asserts After Power Is Applied)
Rev. 0 | Page 15 of 24
Page 16
ADM1177
VOLTAGE AND CURRENT READBACK
In addition to providing hot swap functionality, the ADM1177
also contains the components to allow voltage and current
readback over an Inter-IC (I
2
C) bus. The voltage output of the
current sense amplifier and the voltage on the VCC pin are fed
into a 12-bit ADC via a multiplexer. The device can be
instructed to convert voltage and/or current at any time during
operation via an I
2
C command. When all conversions are
complete, the voltage and/or current values can be read out to
12-bit accuracy in two or three bytes.
The peripheral whose address corresponds to the transmitted address responds by pulling the data line low during
the low period before the ninth clock pulse, known as the
acknowledge bit, and holding it low during the high period of
this clock pulse. All other devices on the bus now remain idle
while the selected device waits for data to be read from it or
written to it. If the R/
device. If the R/
W
bit is 0, the master writes to the slave
W
bit is 1, the master reads from the slave
device.
SERIAL BUS INTERFACE
Control of the ADM1177 is carried out via the I2C bus. This
interface is compatible with I
The ADM1177 is connected to this bus as a slave device under
the control of a master device.
2
C fast mode (400 kHz maximum).
IDENTIFYING THE ADM1177 ON THE I2C BUS
The ADM1177 has a 7-bit serial bus slave address. When the
device powers up, it does so with a default serial bus address.
The five MSBs of the address are set to 10110; the two LSBs are
determined by the state of the ADR pin. There are four different
configurations available on the ADR pin that correspond to four
different I
allows four ADM1177 devices to operate on a single I
Table 5. Setting I
ADR Configuration Address
Low state 0xB0
Resistor to GND 0xB2
Floating (unconnected) 0xB4
High state 0xB6
2
C addresses for the two LSBs (see Tabl e 5). This scheme
2
C Addresses via the ADR Pin
2
C bus.
GENERAL I2C TIMING
Figure 34 and Figure 35 show timing diagrams for general read
and write operations using the I
specific conditions for different types of read and write
operations, which are discussed later. The general I
operates as follows:
1. The master initiates data transfer by establishing a start
condition, defined as a high-to-low transition on the serial
data line, SDA, while the serial clock line SCL remains
high. This indicates that a data stream follows. All slave
peripherals connected to the serial bus respond to the start
condition and shift in the next eight bits, consisting of a 7-bit
slave address (MSB first), plus an R/
the direction of the data transfer, that is, whether data is
written to or read from the slave device (0 = write,
1 = read).
2
C. The I2C specification defines
2
C protocol
W
bit that determines
2. Data is sent over the serial bus in sequences of nine clock
pulses: eight bits of data followed by an acknowledge bit
from the slave device. Data transitions on the data line
must occur during the low period of the clock signal and
remain stable during the high period, because a low-tohigh transition when the clock is high can be interpreted as
a stop signal.
If the operation is a write operation, the first data byte after
the slave address is a command byte. This tells the slave
device what to expect next. It can be an instruction, such
as telling the slave device to expect a block write; or it can
be a register address that tells the slave where subsequent
data is to be written.
Because data can flow in only one direction, as defined by
W
the R/
bit, it is not possible to send a command to a slave
device during a read operation. Before doing a read operation, it may first be necessary to do a write operation to tell
the slave what sort of read operation to expect and/or the
address from which data is to be read.
3. When all data bytes have been read or written, stop conditions
are established. In write mode, the master pulls the data line
high during the 10th clock pulse to assert a stop condition. In
read mode, the master device releases the SDA line during the
low period before the ninth clock pulse, but the slave device
does not pull it low. This is known as a no acknowledge.
The master then takes the data line low during the low
period before the 10th clock pulse, then high during the
10th clock pulse to assert a stop condition.
Rev. 0 | Page 16 of 24
Page 17
ADM1177
SCL
SDA
START BY MAST E R
SCL
(CONTINUED)
SDA
(CONTINUED)
(CONTINUED)
(CONTINUED)
1
0
1
D7D6D5D4D3D2D1D0D7D6D5D4D3D2D1D0
1
SCL
SDA
START BY MAST E R
SCL
SDA
0
11
FRAME 1
SLAVE ADDRESS
FRAME 3
DATA BYTE
A1A0 R/W
1
9
1
ACKNOWLEDG E BY
SLAVE
9
ACKNOWLEDGE BY
SLAVE
D6
D7
D4
D5
COMMAND CODE
1
D3
FRAME 2
D2D1
FRAME N
DATA BYT E
9
D0
ACKNOWLEDGE BY
SLAVE
ACKNOWLEDG E BY
Figure 34. General I2C Write Timing Diagram
9
1
0
0
11
FRAME 1
SLAVE ADDRESS
1
D7D6D5D4D3D2D1D0D7D6D5D4D3D2D1D0
A1A0 R/W
1
FRAME 3
DATA BYTE
ACKNOWLEDG E BY
SLAVE
ACKNOWLEDGE BY
MASTER
Figure 35. General I
D6
D7
9
2
C Read Timing Diagram
D4
D5
DATA BYTE
1
D3
FRAME 2
D2D1
FRAME N
DATA BYTE
9
D0
ACKNOWLEDGE BY
MASTER
9
STOP
SLAVE
NO ACKNOWLEDGE
BY
MASTER
9
06047-006
STOP
BY
MASTER
06047-007
t
SU;STA
t
HD;STA
t
SU;STO
P
06047-008
SCLSCL
SDA
t
LOW
t
HD;STA
t
BUF
S
P
t
t
HD;DAT
HIGH
t
F
t
SU;DAT
S
R
t
Figure 36. Serial Bus Timing Diagram
Rev. 0 | Page 17 of 24
Page 18
ADM1177
WRITE AND READ OPERATIONS
The I2C specification defines several protocols for different
types of read and write operations. The operations used in the
ADM1177 are discussed in the sections that follow.
Tabl e 6
shows the abbreviations used in the command diagrams.
Table 6. I
2
C Abbreviations
Abbreviation Condition
S Start
P Stop
R Read
W Write
A Acknowledge
N No acknowledge
QUICK COMMAND
The quick command operation allows the master to check if the
slave is present on the bus, as follows:
1. The master device asserts a start condition on SDA.
2. The master sends the 7-bit slave address, followed by the
write bit (low).
3. The addressed slave device asserts an acknowledge on SDA.
12 3
SLAVE
S
ADDRESS
Figure 37. Quick Command
Table 7. Command Byte Operations
Bit Default Name Function
C0 0 V_CONT
C1 0 V_ONCE
C2 0 I_CONT
C3 0 I_ONCE
C4 0 VRANGE
C5 0 N/A Unused.
C6 0 STATUS_RD
WA
06047-009
Set to convert voltage continuously. If readback is attempted before the first conversion is complete,
the ADM1177 asserts an acknowledge and returns all 0s in the returned data.
Set to convert voltage once. Self-clears. I
conversion is complete.
Set to convert voltage continuously. If readback is attempted before the first conversion is complete, the
ADM1177 asserts an acknowledge and returns all 0s in the returned data.
Set to convert current once. Self-clears. I
conversion is complete.
Selects different internal attenuation resistor networks for voltage readback. A 0 in C4 selects a 14:1 voltage
divider. A 1 in C4 selects a 7:2 voltage divider. With an ADC full scale of 1.902 V, the voltage at the VCC pin for
an ADC full-scale result is 26.35 V for VRANGE = 0 and 6.65 V for VRANGE = 1.
Status read. When this bit is set, the data byte read back from the ADM1177 is the STATUS byte. It contains
the status of the device alerts. See
Table 15 for full details of the STATUS byte.
WRITE COMMAND BYTE
In the write command byte operation, the master device sends
a command byte to the slave device, as follows:
1. The master device asserts a start condition on SDA.
2. The master sends the 7-bit slave address, followed by the
write bit (low).
3. The addressed slave device asserts an acknowledge on SDA.
4. The master sends the command byte. The command byte
is identified by an MSB = 0. An MSB =1 indicates an extended
register write (see the
5. The slave asserts an acknowledge on SDA.
6. The master asserts a stop condition on SDA to end the
transaction.
12 3456
S
The seven LSBs of the command byte are used to configure and
control the ADM1177.
of each bit.
2
C asserts a no acknowledge on attempted reads until the ADC
2
C asserts a no acknowledge on attempted reads until the ADC
Write Extended Byte section).
SLAVE
ADDRESS
Figure 38. Write Command Byte
WA
COMMAND
BYTE
AP
06047-010
Tabl e 7 provides details of the function
Rev. 0 | Page 18 of 24
Page 19
ADM1177
WRITE EXTENDED BYTE
In the write extended byte operation, the master device writes
to one of the three extended registers of the slave device, as
follows:
1. The master device asserts a start condition on SDA.
2. The master sends the 7-bit slave address, followed by the
write bit (low).
3. The addressed slave device asserts an acknowledge on SDA.
4. The master sends the register address byte. The MSB of
this byte is set to 1 to indicate an extended register write.
The two LSBs indicate which of the three extended
registers are to be written to (see
Table 8 ). All other bits
should be set to 0.
5. The slave asserts an acknowledge on SDA.
6. The master sends the command byte. The command byte
is identified by an MSB = 0. An MSB = 1 indicates an
extended register write.
Table 9. ALERT_EN Register Operations
Bit Default Name Function
0 0 EN_ADC_OC1
Enabled if a single ADC conversion on the I channel has exceeded the threshold set in the ALERT_TH
register.
1 0 EN_ADC_OC4
Enabled if four consecutive ADC conversions on the I channel have exceeded the threshold set in the
ALERT_TH register.
2 1 EN_HS_ALERT
Enabled if the hot swap has either latched off or entered a cool-down cycle because of an overcurrent
event.
3 0 EN_OFF_ALERT
Enables an alert if the HS operation is turned off by a transition that deasserts the ON pin or by an
operation that writes the SWOFF bit high.
4 0 CLEAR
Clears the ON_ALERT, HS_ALERT, and ADC_ALERT status bits in the STATUS register. These may
immediately reset if the source of the alert has not been cleared or disabled with the other bits in this
register. This bit self-clears to 0 after the STATUS register bits have been cleared.
Table 10. ALERT_TH Register Operations
Bit Default Function
7:0 FF
The ALERT_TH register sets the current level at which an alert occurs. Defaults to ADC full scale. The ALERT_TH 8-bit
number corresponds to the top eight bits of the current channel data.
Table 11. CONTROL Register Operations
Bit Default Name Function
0 0 SWOFF Forces hot swap off. Equivalent to deasserting the ON pin.
7. The slave asserts an acknowledge on SDA.
8. The master asserts a stop condition on SDA to end the
transaction.
12 345678
SLAVE
S
ADDRESS
REGISTER
WA
ADDRESS
Figure 39. Write Extended Byte
REGISTER
A
DATA
AP
06047-011
Tabl e 9 , Ta bl e 10 , and Tabl e 11 give details of each extended
register.
The ADM1177 can be set up to provide information in three
different ways (see the
Write Command Byte section). Depending
on how the device is configured, the following data can be read
out of the device after a conversion (or conversions).
Voltage and Current Readback
The ADM1177 digitizes both voltage and current. Three bytes
are read out of the device in the format shown in
Tabl e 12 .
Table 12. Voltage and Current Readback Format
Byte Contents B7 B6 B5 B4 B3 B2 B1 B0
1
Voltage
V11 V10 V9 V8 V7 V6 V5 V4
MSBs
2
Current
I11 I10 I9 I8 I7 I6 I5 I4
MSBs
3 LSBs V3 V2 V1 V0 I3 I2 I1 I0
Voltage Readback
The ADM1177 digitizes voltage only. Two bytes are read out of
the device in the format shown in
The following series of events occurs when the master receives
three bytes (voltage and current data) from the slave device:
1. The master device asserts a start condition on SDA.
2. The master sends the 7-bit slave address, followed by the
read bit (high).
3. The addressed slave device asserts an acknowledge on SDA.
4. The master receives the first data byte.
5. The master asserts an acknowledge on SDA.
6. The master receives the second data byte.
7. The master asserts an acknowledge on SDA.
8. The master receives the third data byte.
9. The master asserts a no acknowledge on SDA.
10. The master asserts a stop condition on SDA, and the
transaction ends.
For cases where the master is reading voltage only or current
only, only two data bytes are read. Step 7 and Step 8 are not
required.
12 345678910
SLAVE
S
ADDRESS
RA
DATA 1DATA 2NPDATA 3AA
Figure 40. Three-Byte Read from ADM1175
05647-012
12 345678
SLAVE
S
ADDRESS
Figure 41. Two-Byte Read from ADM1175
RA
REGISTER
ADDRESS
REGISTER
A
DATA
NP
05647-013
Converting ADC Codes to Voltage and Current Readings
The following equations can be used to convert ADC codes
representing voltage and current from the ADM1175 12-bit
ADC into actual voltage and current values.
Voltage = (V
FULLSCALE
/4096) × Code
where:
V
= 6.65 (7:2 range) or 26.35 (14:1 range).
FULLSCALE
Code is the ADC voltage code read from the device (Bit V0
to
Bit V11).
Current = ((I
/4096) × Code)/Sense Resistor
FULLSCALE
where:
FULLSCALE
= 105.84 mV.
I
Code is the ADC current code read from the device (Bit I0 to
Bit I11).
Read Status Register
A single register of status data can also be read from the
ADM1177.
1. The master device asserts a start condition on SDA.
2. The master sends the 7-bit slave address followed by the
read bit (high).
3. The addressed slave device asserts an acknowledge on SDA.
4. The master receives the status byte.
5. The master asserts an acknowledge on SDA.
12 345
SLAVE
S
ADDRESS
Figure 42. Status Read from ADM1175
RA
DATA 1 A
05647-014
Tabl e 1 5 shows the ADM1177 status registers in detail. Note
that Bit 1, Bit 3, and Bit 5 are cleared by writing to Bit 4 of the
ALERT_EN register (CLEAR).
Rev. 0 | Page 20 of 24
Page 21
ADM1177
Table 15. Status Byte Operations
Bit Name Function
0 ADC_OC An ADC-based overcurrent comparison has been detected on the last three conversions
1 ADC_ALERT
2 HS_OC
3 HS_ALERT The hot swap has failed since the last time this was reset. Cleared by writing to Bit 4 of the ALERT_EN register.
4 OFF_STATUS
5 OFF_ALERT An alert has been caused by either the ON pin or the SWOFF bit. Cleared by writing to Bit 4 of the ALERT_EN register.
An ADC-based overcurrent trip has happened, which has caused the alert. Cleared by writing to Bit 4 of the ALERT_EN
register.
The hot swap is off due to an analog overcurrent event. On parts that latch off, this is the same as the HS_ALERT status
bit (if EN_HS_ALERT = 1). On the retry parts, this indicates the current state: a 0 can indicate that the data was read
during a period when the device was retrying, or that it has successfully hot swapped by retrying after at least one
overcurrent timeout.
The state of the ON pin. Set to 1 if the input pin is deasserted. Can also be set to 1 by writing to the SWOFF bit of the
CONTROL register.
Rev. 0 | Page 21 of 24
Page 22
ADM1177
APPLICATIONS WAVEFORMS
1
2
3
4
CH1 1.5ACH2 1.00V
CH3 20.0V CH4 10.0V
M40.0ms
Figure 43. Inrush Current Control into 220 μF Load
LOAD
, CH2 = V
(CH1 = I
1
2
3
4
TIMER
, CH3 = V
GATE
, CH4 = V
OUT
1
2
3
4
CH1 1.5ACH2 1.00V
06047-070
CH3 20.0V CH4 10.0V
M10.0ms
06047-073
Figure 46. Overcurrent Condition During Operation (ADM1177-1 Model)
)
(CH1 = I
1
2
3
4
LOAD
, CH2 = V
TIMER
, CH3 = V
GATE
, CH4 = V
OUT
)
CH1 1.5ACH2 1.00V
CH3 20.0V CH4 10.0V
M10.0ms
Figure 44. Overcurrent Condition at Startup (ADM1177-1 Model)
(CH1 = I
LOAD
1
2
3
4
CH1 1.5ACH2 1.00V
CH3 20.0V CH4 10.0V
, CH2 = V
TIMER
, CH3 = V
M20.0ms
GATE
, CH4 = V
Figure 45. Overcurrent Condition at Startup (ADM1177-2 Model)
(CH1 = I
LOAD
, CH2 = V
TIMER
, CH3 = V
GATE
, CH4 = V
OUT
OUT
CH1 1.5ACH2 1.00V
06047-071
CH3 20.0V CH4 10.0V
M20.0ms
06047-074
Figure 47. Overcurrent Condition During Operation (ADM1177-2 Model)
)
06047-072
(CH1 = I
1
2
3
4
CH1 1.5ACH2 1.00V
CH3 20.0V CH4 10.0V
LOAD
, CH2 = V
TIMER
, CH3 = V
M20.0ms
GATE
, CH4 = V
OUT
)
06047-075
Figure 48. Inrush Current Control with Profiling of
)
Initial Current Edge via a Capacitor on the SS Pin
(CH1 = I
LOAD
, CH2 = V
TIMER
, CH3 = V
GATE
, CH4 = V
OUT
)
Rev. 0 | Page 22 of 24
Page 23
ADM1177
KELVIN SENSE RESISTOR CONNECTION
When using a low value sense resistor for high current
measurement, the problem of parasitic series resistance may
arise. The lead resistance can be a substantial fraction of the
rated resistance, making the total resistance a function of lead
length. This problem can be avoided by using a Kelvin sense
connection. This type of connection separates the current path
through the resistor and the voltage drop across the resistor.
Figure 49 shows the correct way to connect the sense resistor
between the VCC pin and the SENSE pin of the ADM1177.
CURRENT
FLOW FROM
SUPPLY
KELVIN SENSE T RACE S
SENSE RESISTOR
VCCSENSE
ADM1177
Figure 49. Kelvin Sense Connections
CURRENT
FLOW TO
LOAD
06047-015
Rev. 0 | Page 23 of 24
Page 24
ADM1177
OUTLINE DIMENSIONS
3.10
3.00
2.90
6
10
3.10
3.00
2.90
1
PIN 1
0.50 BSC
0.95
0.85
0.75
0.15
0.05
0.33
0.17
COPLANARITY
0.10
COMPLIANT TO JEDEC STANDARDS MO-187-BA
Figure 50. 10-Lead Mini Small Outline Package [MSOP]
ORDERING GUIDE
Model Hot Swap Retry Option Temperature Range Package Description Package Option Branding
ADM1177-1ARMZ-R71 Automatic Retry Version −40°C to +85°C 10-Lead MSOP RM-10 M5Y
ADM1177-2ARMZ-R71 Latched Off Version −40°C to +85°C 10-Lead MSOP RM-10 M5Z
EVAL-ADM1177EBZ1 Evaluation Board
1
Z = Pb-free part.
5.15
4.90
4.65
5
1.10 MAX
SEATING
PLANE
0.23
0.08
8°
0°
(RM-10)
Dimensions shown in millimeters
0.80
0.60
0.40
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Rights to use these components in an I