Allows safe board insertion and removal from a live backplane
Controls supply voltages from 3.15 V to 16.5 V
Precision current sense amplifier
Precision voltage input
12-bit ADC for current and voltage readback
Charge pumped gate drive for external N-channel FET
Adjustable analog current limit with circuit breaker
±3% accurate hot swap current limit level
Fast response limits peak fault current
Automatic retry or latch-off on current fault
Programmable hot swap timing via TIMER pin
Active-high and active-low ON/ONB pin options
Convert start pin (CONV)
2
C® fast mode-compliant interface (400 kHz maximum)
I
10-lead MSOP
APPLICATIONS
Power monitoring/power budgeting
Central office equipment
Telecommunication and data communication equipment
PCs/servers
GENERAL DESCRIPTION
The ADM1175 is an integrated hot swap controller and current
sense amplifier that offers digital current and voltage monitoring
via an on-chip, 12-bit analog-to-digital converter (ADC),
communicated through an I
An internal current sense amplifier senses voltage across the sense
resistor in the power path via the VCC pin and the SENSE pin.
2
C interface.
SENSE
3.15V TO 16.5
FUNCTIONAL BLOCK DIAGRAM
ADM1175-1
MUX
VCC
ON
1.3V
UV COMPARATOR
CURRENT
SENSE
AMPLIFIER
ON
TIMER
V
0
I
R
GND
SENSE
SENSEVCC
1
FET DRIVE
CONTROLLER
TIMER
Figure 1.
N-CHANNEL FET
GATE
SDA
SCL
CONV
ADR
A
GND
ADM1175-1
Figure 2. Applications Diagram
ADM1175
12-BIT
ADC
CONTROLLER
SDA
SCL
CONV
2
I
C
P = VI
CONV
SDA
SCL
ADR
GATE
05647-001
05647-002
The ADM1175 limits the current through this resistor by controlling the gate voltage of an external N-channel FET in the power
path, via the GATE pin. The sense voltage (and, therefore, the
inrush current) is kept below a preset maximum.
The ADM1175 protects the external FET by limiting the time
that it spends with maximum current running through it. This
current limit period is set by the choice of capacitor attached to
the TIMER pin. Additionally, the device provides protection from
overcurrent events that may occur once the hot swap event is
complete. In the case of a short-circuit event, the current in the
sense resistor exceeds an overcurrent trip threshold, and the
FET is switched off immediately by pulling down the GATE pin.
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Anal og Devices for its use, nor for any infringements of p atents or other
rights ofthird partiesthatmay result fromits use. Specifications subject to change without notice. No
licenseis grantedby implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registeredtrademarks arethe property of their respective owners.
A 12-bit ADC can measure the current seen in the sense resistor,
as well as the supply voltage on the VCC pin. An industry-standard
2
I
C interface allows a controller to read current and voltage data
from the ADC. Measurements can be initiated by an I
2
or via the convert (CONV) pin. The CONV pin is especially
useful for synchronizing reads on multiple ADM1175 devices.
Alternatively, the ADC can run continuously, and the user can
read the latest conversion data whenever it is required. Up to four
unique I
2
C addresses can be created, depending on the way the
VCC = 3.15 V to 16.5 V; TA = −40°C to +85°C; typical values at TA = 25°C, unless otherwise noted.
Table 1.
Parameter Min Typ Max Unit Conditions
VCC PIN
Operating Voltage Range, V
Supply Current, ICC 1.7 2.5 mA
Undervoltage Lockout, V
Undervoltage Lockout Hysteresis, V
ON/ONB PIN
Input Current, I
INON
−2 +2 μA
Rising Threshold, V
ONTH
Trip Threshold Hysteresis, V
Glitch Filter Time 3 μs
CONV PIN
Input Current, I
Trip Threshold Low, V
Trip Threshold H igh, V
−1
INCONV
CONVL
CONVH
SENSE PIN
Input Leakage, I
−1 +1 μA V
SENSE
Overcurrent Fault Timing Threshold, V
Overcurrent Limit Threshold, V
Fast Overcurrent Trip Threshold, V
GATE PIN
Drive Voltage, V
3 6 9 V V
GATE
Pull-Up Current 8 12.5 17 μA V
Pull-Down Current 1.5 mA V
5 mA V
7 mA V
TIMER PIN
Pull-Up Current (Power On Reset), I
Pull-Up Current (Fault Mode), I
Pull-Down Current (Retry Mode), I
Pull-Down Current, I
Trip Threshold H igh, V
Trip Threshold Low, V
TIMERDN
TIMERH
TIMERL
ADR PIN
Set Address to 00, V
Set Address to 01, R
Set Address to 10, I
Set Address to 11, V
ADRLOWV
ADRLOWZ
ADRHIGHZ
ADRHIGHV
Input Current for 11 Decode, I
Input Current for 00 Decode, I
3.15 16.5 V
VCC
2.8 V VCC rising
UVLO
80 mV
UVLOHYST
−100
+100 nA ON/ONB < 1.5 V
1.26 1.3 1.34 V ON/ONB rising
35 50 65 mV
ONHYST
+1 μA V
CONV(MA X)
= 3.6 V
1.2 V
1.4 V
= V
92 mV
OCTIM
V
SENSE
OCTRIM
= (V
VCC
VCC
TIMER pin
97 100 103 mV
LIM
V
= (V
VCC
− V
LIM
a current limit
115 mV
OCFAST
V
OCFAST
= (V
VCC
turned on
− V
VCC
− V
VCC
− V
VCC
= 0 V
= 3 V, V
= 3 V, V
= 3 V, V
, V
, V
, V
VCC
VCC
VCC
VCC
VCC
VCC
TIMERUPPOR
TIMERUPFAULT
TIMERDNRETRY
GATE
9 11 13 V V
7 10 13 V V
GATE
GATE
GATE
GATE
GATE
GATE
−3.5 −5 −6.5 μA Initial cycle, V
−40 −60 −80 μA During current fault, V
2 3 μA
After current fault and during a cool-down
period on a retry device, V
100 μA Normal operation, V
1.26 1.3 1.34 V TIMER rising
0.175 0.2 0.225 V TIMER falling
0 0.8 V Low state
135 150 165 kΩ
Resistor to ground state, load pin with specified
resistance for 01 decode
−1 +1 μA
Open state, maximum load allowed on ADR pin
for 10 decode
2 5.5 V High state
3 10 μA V
ADRLOW
−40 −22 μA V
ADRHIGH
= 2.0 V to 5.5 V
ADR
= 0 V to 0.8 V
ADR
− V
), fault timing starts on the
SENSE
), closed-loop regulation to
SENSE
− V
), gate pull-down current
SENSE
= 3.15 V
= 5 V
= 16.5 V
= 3.15 V
= 5 V
= 16.5 V
= 1 V
TIMER
= 1 V
TIMER
= 1 V
TIMER
= 1 V
TIMER
Rev. 0 | Page 3 of 24
Page 4
ADM1175
Parameter Min Typ Max Unit Conditions
MONITORING ACCURACY
Current Sense Absolute Accuracy −1.45
−1.8
−2.8
−5.7
−1.5
−1.8
−2.95
−6.1
−1.95
−2.45
−3.85
−6.7
V
for ADC Full Scale 105.84 mV
SENSE
Voltage Accuracy −0.85
−0.9 +0.9 %
−0.85
−0.9 +0.9 %
−0.9
−1.15 +1.15 %
VCC for ADC Full Scale,
Low Range (VRANGE = 1)
VCC for ADC Full Scale,
High Range (VRANGE = 0)
I2C TIMING
Low Level Input Voltage, V
High Level Input Voltage, V
Low Level Output Voltage on SDA, V
Output Fall Time on SDA from V
Maximum Width of Spikes Suppressed by
Input Filtering on SDA and SCL Pins
Input Current, II, on SDA/SCL When Not
Driving Out a Logic Low
Input Capacitance on SDA/SCL 5 pF
SCL Clock Frequency, f
Low Period of the SCL Clock 600 ns
High Period of the SCL Clock 1300 ns
1
+1.45 % V
+1.8 % V
+2.8 % V
+5.7 % V
+1.5 % V
+1.8 % V
+2.95 % V
+6.1 % V
+1.95 % V
+2.45 % V
+3.85 % V
+6.7 % V
SENSE
SENSE
SENSE
SENSE
SENSE
SENSE
SENSE
SENSE
SENSE
SENSE
SENSE
SENSE
This is an absolute value to be used when
converting ADC codes to current readings;
any inaccuracy in this value is factored into
absolute current accuracy values (see specs
for Current Sense Absolute Accuracy)
+0.85 %
VCC = 3 V minimum
(low range)
= 6 V minimum
V
CC
(high range)
+0.85 %
VCC = 3 V minimum
(low range)
= 6 V minimum
V
CC
(high range)
+0.9 %
VCC = 3 V minimum
(low range)
= 6 V minimum
V
CC
(high range)
6.65
V
These are absolute values to be used when
converting ADC codes to voltage readings;
26.35
V
any inaccuracy in these values is factored into
voltage accuracy values (see specs for Voltage
Accuracy)
0.3 V
IL
0.7 V
IH
0.4 V I
OL
to V
IHMIN
ILMAX
V
BUS
20 +
0.1 C
250 ns CB = bus capacitance from SDA to GND
B
V
BUS
= 3 mA
OL
50 250 ns
−10 +10 μA
400 kHz
SCL
= 75 mV 0°C to +70°C
= 50 mV 0°C to +70°C
= 25 mV 0°C to +70°C
= 12.5 mV 0°C to +70°C
= 75 mV 0°C to +85°C
= 50 mV 0°C to +85°C
= 25 mV 0°C to +85°C
= 12.5 mV 0°C to +85°C
= 75 mV −40°C to +85°C
= 50 mV −40°C to +85°C
= 25 mV −40°C to +85°C
= 12.5 mV −40°C to +85°C
0°C to +70°C
0°C to +70°C
0°C to +85°C
0°C to +85°C
−40°C to +85°C
−40°C to +85°C
Rev. 0 | Page 4 of 24
Page 5
ADM1175
Parameter Min Typ Max Unit Conditions
Setup Time for a Repeated Start Condition,
t
SU;STA
SDA Output Data Hold Time, t
Setup Time for a Stop Condition, t
100 900 ns
HD;DAT
600 ns
SU;STO
Bus Free Time Between a Stop and a Start
Condition, t
BUF
Capacitive Load for Each Bus Line 400 pF
1
Monitoring accuracy is a measure of the error in a code that is read back for a particular voltage/current. This is a combination of amplifier error, reference error,
ADC error, and error in ADC full-scale code conversion factor.
600 ns
1300 ns
Rev. 0 | Page 5 of 24
Page 6
ADM1175
ABSOLUTE MAXIMUM RATINGS
Table 2.
Parameter Rating
VCC Pin 20 V
SENSE Pin 20 V
TIMER Pin −0.3 V to +6 V
ON/ONB Pin −0.3 V to +20 V
CONV Pin −0.3 V to +6 V
GATE Pin 30 V
SDA Pin, SCL Pin −0.3 V to +7 V
ADR Pin −0.3 V to +6 V
Storage Temperature Range −65°C to +125°C
Operating Temperature Range −40°C to +85°C
Lead Temperature (Soldering, 10 sec)300°C
Junction Temperature 150°C
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
Table 3. Thermal Resistance
Package Type θJA Unit
10-Lead MSOP 137.5 °C/W
ESD CAUTION
Rev. 0 | Page 6 of 24
Page 7
ADM1175
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
1
VCC
SENSE
2
GND
ADM1175
3
TOP VIEW
(Not to Scale)
4
5
ON/ONB
TIMER
Figure 3. Pin Configuration
Table 4. Pin Function Descriptions
Pin No. Mnemonic Description
1 VCC
Positive Supply Input Pin. The operating supply voltage range is from 3.15 V to 16.5 V. An undervoltage
lockout (UVLO) circuit resets the ADM1175 when a low supply voltage is detected.
2 SENSE
Current Sense Input Pin. A sense resistor between the VCC pin and the SENSE pin sets the analog current
limit. The hot swap operation of the ADM1175 controls the external FET gate to maintain the (V
voltage at 100 mV or below.
3 ON/ONB
Undervoltage or Overvoltage Input Pin. This pin is active high on the ADM1175-1 and ADM1175-2 and
active-low on the ADM1175-3 and ADM1175-4. An internal ON comparator has a trip threshold of 1.3 V,
and the output of this comparator is used as an enable for the hot swap operation. For the ON pin variants
with an external resistor divider from VCC to GND, this pin can be used to enable the hot swap operation
on a specific voltage on VCC, giving an undervoltage function. Similarly, for the ONB pin variants, an external
resistor divider can be used to create an overvoltage function, where the divider sets a voltage on VCC at
which the hot swap operation is switched off, pulling the GATE to ground.
4 GND Chip Ground Pin.
5 TIMER
Timer Pin. An external capacitor, C
TIMER
The GATE pin turns off when the TIMER pin is pulled beyond the upper threshold. An overvoltage detection
with an external Zener can be used to force this pin high.
6 SCL I2C Clock Pin. Open-drain input requires an external resistive pull-up.
7 SDA I2C Data I/O Pin. Open-drain input/output. Requires an external resistive pull-up.
8 ADR
9 CONV
2
C Address Pin. This pin can be tied low, tied high, left floating, or tied low through a resistor to set four
I
different I
Convert Start Pin. A high level on this pin enables an ADC conversion. The state of an internal control register,
which is set through the I
2
C addresses.
2
C interface, configures the part to convert current only, voltage only, or both
channels when the convert pin is asserted.
10 GATE
GATE Output Pin. This pin is the high-side gate drive of an external N-channel FET. This pin is driven by the
FET drive controller, which utilizes a charge pump to provide a 12.5 μA pull-up current to charge the FET
GATE pin. The FET drive controller regulates to a maximum load current (100 mV through the sense resistor)
by modulating the GATE pin.
10
GATE
CONV
9
ADR
8
SDA
7
6
SCL
05647-003
− V
SENSE
)
VCC
, sets a 270 ms/μF initial timing cycle delay and a 21.7 ms/μF fault delay.
Rev. 0 | Page 7 of 24
Page 8
ADM1175
TYPICAL PERFORMANCE CHARACTERISTICS
2.0
1.8
1.6
1.4
1.2
1.0
(mA)
CC
I
0.8
0.6
0.4
0.2
0
02468101411216
VCC (V)
Figure 4. Supply Current vs. Supply Voltage
8
05647-021
2.0
1.8
1.6
1.4
1.2
1.0
(mA)
CC
I
0.8
0.6
0.4
0.2
0
–40806040200–20
TEMPERATURE (°C)
Figure 7. Supply Current vs. Temperature (Gate On)
05647-022
12
10
8
6
DRIVE VOLTAGE (V)
4
2
0
01
Figure 5. Drive Voltage (V
0
–2
–4
–6
(µA)
–8
GATE
I
–10
VCC (V)
− VCC) vs. Supply Voltage
GATE
8161412108642
05647-029
12
10
8
6
DRIVE VOLTAGE (V)
4
2
0
–40806040200–20
Figure 8. Drive Voltage (V
0
–2
–4
–6
(µA)
–8
GATE
I
–10
5V V
3.15V V
TEMPERATURE (°C)
− VCC) vs. Temperature
GATE
CC
CC
05647-030
–12
–14
01
VCC (V)
101216148642
8
05647-027
Figure 6. Gate Pull-Up Current vs. Supply Voltage
–12
–14
–40806040200–20
Figure 9. Gate Pull-Up Current vs. Temperature
Rev. 0 | Page 8 of 24
TEMPERATURE (°C)
05647-028
Page 9
ADM1175
12
10
8
(mA)
6
GATE
I
4
2
0
01
Figure 10. Gate Pull-Down Current vs. V
2
0
–2
–4
(µA)
–6
GATE
I
–8
–10
–12
–14
01
VCC (V)
V
GATE
CC
(V)
Figure 11. Gate Pull-Up Current vs. Gate Voltage at V
20
15
(mA)
10
GATE
I
5
VCC = 3V
0
02
V
V
CC
GATE
V
CC
= 5V
= 12V
(V)
at V
GATE
2015105
161412108642
8
05647-031
= 5 V
1412108642
6
05647-040
5
05647-043
CC
= 5 V
Figure 12. Gate Pull-Down Current vs. Gate Voltage
2.0
1.8
1.6
1.4
1.2
1.0
0.8
0.6
TIMER THRES HO LD (V)
0.4
0.2
0
018101216148642
HIGH
LOW
VCC (V)
Figure 13. Timer Threshold vs. Supply Voltage
2.0
1.8
1.6
1.4
1.2
1.0
0.8
0.6
TIMER HIG H THRESHOLD (V)
0.4
0.2
0
–4080
HIGH
LOW
TEMPERATURE (°C)
Figure 14. Timer Threshold vs. Temperature
100
90
80
70
60
50
40
GATE ON TIME (ms)
30
20
10
0
05.04.54.03.53.02.52.01.51.00.5
C
TIMER
(µF)
Figure 15. Current Limit On Time vs. Timer Capacitance
05647-038
6040200–20
05647-039
05647-050
Rev. 0 | Page 9 of 24
Page 10
ADM1175
0
0
–1
–2
(µA)
–3
TIMER
I
–4
–5
–6
018101216148642
VCC (V)
Figure 16.Timer Pull-Up Current (Initial Cycle) vs. Supply Voltage
0
–10
–20
–30
(µA)
–40
TIMER
I
–50
–60
–70
–80
018101216148642
VCC (V)
Figure 17. Timer Pull-Up Current (C. B. Delay) vs. Supply Voltage
3.0
–1
–2
(µA)
–3
TIMER
I
–4
–5
–6
–40806040200–20
05647-032
TEMPERATURE (°C)
05647-033
Figure 19. Timer Pull-Up Current (Initial Cycle) vs. Temperature
0
–10
–20
–30
(µA)
–40
TIMER
I
–50
–60
–70
–80
–40806040200–20
05647-034
TEMPERATURE (°C)
05647-035
Figure 20. Timer Pull-Up Current (C. B. Delay) vs. Temperature
3.0
2.5
2.0
(µA)
1.5
TIMER
I
1.0
0.5
0
018101216148642
VCC (V)
Figure 18. Timer Pull-Down Current (Cool-Off Cycle) vs. Supply Voltage
05647-036
Rev. 0 | Page 10 of 24
2.5
2.0
(µA)
1.5
TIMER
I
1.0
0.5
0
–40806040200–20
TEMPERATURE (°C)
Figure 21. Timer Pull-Down Current (Cool-Off Cycle) vs. Temperature
05647-037
Page 11
ADM1175
120
115
110
105
(mV)
100
LIM
V
95
90
85
80
21816141210864
VCC (V)
Figure 22. Circuit Breaker Limit Voltage vs. Supply Voltage
110
108
106
104
102
100
V (mV)
98
96
94
92
90
–40806040200–20
Figure 23. V
V
OCFAST
V
LIM
V
OCTIM
TEMPERATURE (°C)
, V
, V
OCTIM
LIM
OCFAST
vs. Temperature
05647-041
05647-042
1000
900
800
700
600
500
400
300
HITS PER CODE ( 1000 READS)
200
100
0
20472048204920502046
CODE
Figure 25. ADC Noise, Current Channel, Midcode Input, 1000 Reads
1000
900
800
700
600
500
400
300
HITS PER CODE ( 1000 READS)
200
100
0
780781782783779
CODE
Figure 26. ADC Noise, 14:1 Voltage Channel, 5 V Input, 1000 Reads
05647-060
05647-061
11 DECODE10 DECODE01 DECODE 00 DECODE
3.2
3.0
2.8
2.6
2.4
2.2
2.0
1.8
1.6
ADR
V
1.4
1.2
1.0
0.8
0.6
0.4
0.2
0
–35–30–25–20–15–10–50510
I
ADR
(µA)
Figure 24. Address Pin Voltage vs. Address Pin Current
for Four Addressing Options
05647-026
Rev. 0 | Page 11 of 24
1000
900
800
700
600
500
400
300
HITS PER CO DE (1000 RE ADS)
200
100
0
30793080308130823078
CODE
Figure 27. ADC Noise, 7:1 Voltage Channel, 5 V Input, 1000 Reads
05647-062
Page 12
ADM1175
4
4
INL (LSB)
3
2
1
0
–1
–2
–3
–4
040002500 3000 3500200015001000500
CODE
Figure 28. INL for ADC
05647-023
DNL (LSB)
3
2
1
0
–1
–2
–3
–4
040002500 3000 3500200015001000500
CODE
Figure 29. DNL for ADC
05647-024
Rev. 0 | Page 12 of 24
Page 13
ADM1175
OVERVIEW OF THE HOT SWAP FUNCTION
When circuit boards are inserted into a live backplane, discharged
supply bypass capacitors draw large transient currents from the
backplane power bus as they charge. Such transient currents can
cause permanent damage to connector pins, as well as dips on
the backplane supply that can reset other boards in the system.
The ADM1175 is designed to turn a circuit board supply voltage
on and off in a controlled manner, allowing the circuit board to
be safely inserted into or removed from a live backplane. The
ADM1175 can reside either on the backplane or on the circuit
board itself.
The ADM1175 controls the inrush current to a fixed maximum
level by modulating the gate of an external N-channel FET placed
between the live supply rail and the load. This hot swap function
protects the card connectors and the FET itself from damage
and limits any problems that can be caused by high current loads
on the live supply rail.
The ADM1175 holds the GATE pin down (and, thus, the FET is
held off) until a number of conditions are met. An undervoltage
lockout circuit ensures that the device is provided with an adequate
input supply voltage. Once the input supply voltage has been
successfully detected, the device goes through an initial timing
cycle to provide a delay before it attempts to hot swap. This delay
ensures that the board is fully seated in the backplane before the
board is powered up.
The ADM1175-1 and ADM1175-3 retry the hot swap operation
indefinitely, keeping the FET in its safe operating area (SOA) by
using the TIMER pin to time a cool-down period in between
hot swap attempts. The current and voltage threshold combinations
on the TIMER pin set the retry duty cycle to 3.8%.
The ADM1175 is designed to operate over a range of supplies
from 3.15 V to 16.5 V.
UNDERVOLTAGE LOCKOUT
An internal undervoltage lockout (UVLO) circuit resets the
ADM1175 if the VCC
supply is too low for normal operation.
The UVLO has a low-to-high threshold of 2.8 V, with 80 mV
hysteresis. Above 2.8 V supply voltage, the ADM1175 starts the
initial timing cycle.
ON/ONB FUNCTION
The ADM1175-1 and ADM1175-2 have an active high ON pin.
The ON pin is the input to a comparator that has a low-to-high
threshold of 1.3 V, a 50 mV hysteresis, and a glitch filter of 3 s.
A low input on the ON pin turns off the hot swap operation by
pulling the GATE pin to ground, turning off the external FET.
The TIMER pin is also reset by turning on a pull-down current
on this pin. A low-to-high transition on the ON pin starts the
hot swap operation. A 10 k pull-up resistor connecting the
ON pin to the supply is recommended.
Once the initial timing cycle is complete, the hot swap function
is switched on under control of the ON/ONB pin. When ON/ONB
is asserted (high for the ADM1175-1 and ADM1175-2, low for
the ADM1175-3 and ADM1175-4), the hot swap operation starts.
The ADM1175 charges up the gate of the FET to turn on the
load. It continues to charge up the GATE pin until the linear
current limit (set to 100 mV/R
) is reached. For some combi-
SENSE
nations of low load capacitance and high current limit, this limit
may not be reached before the load is fully charged up. If current
limit is reached, the ADM1175 regulates the GATE pin to keep
the current at this limit. For currents above the overcurrent fault
timing threshold, nominally 100 mV/R
, the current fault is
SENSE
timed by sourcing a current out to the TIMER pin. If the load
becomes fully charged before the fault current limit time is
reached (when the TIMER pin reaches 1.3 V), the current drops
below the overcurrent fault timing threshold. The ADM1175
then charges the GATE pin higher to fully enhance the FET for
lowest R
, and the TIMER pin is pulled down again.
ON
If the fault current limit time is reached before the load drops
below the current limit, a fault has been detected, and the hot
swap operation is aborted by pulling down on the GATE pin to
turn off the FET. The ADM1175-2 and ADM1175-4 are latched
off. They attempt to hot swap again only when the ON/ONB pin is
deasserted and then asserted again.
Alternatively, an external resistor divider at the ON pin can be
used to program an undervoltage lockout value higher than the
internal UVLO circuit, thereby setting a voltage level at the
VCC supply, where the hot swap operation is to start. An RC
filter can be added at the ON pin to increase the delay time at
card insertion if the initial timing cycle delay is insufficient.
The ADM1175-3 and ADM1175-4 have an active low ONB pin.
This pin operates exactly as described above for the ON pin,
but the polarity is reversed. This allows this pin to function as
an overvoltage detector that can use the external FET as a circuit
breaker for overvoltage conditions on the monitored supply.
TIMER FUNCTION
The TIMER pin handles several timing functions with an
external capacitor, C
V
(0.2 V) and V
TIMERH
sources are a 5 µA pull-up, a 60 µA pull-up, a 2 µA pull-down,
and a 100 µA pull-down. The 100 µA pull-down is a non-ideal
current source, approximating a 7 k resistor below 0.4 V.
These current and voltage levels, together with the value of C
chosen by the user, determine the initial timing cycle time, the
fault current limit time, and the hot swap retry duty cycle.
. There are two comparator thresholds:
TIMER
(1.3 V). The four timing current
TIMERL
TIMER
Rev. 0 | Page 13 of 24
Page 14
ADM1175
GATE AND TIMER FUNCTIONS
DURING A HOT SWAP
During hot insertion of a board onto a live supply rail at VCC,
the abrupt application of supply voltage charges the external FET
drain/gate capacitance, which can cause an unwanted gate voltage
spike. An internal circuit holds GATE low before the internal
circuitry wakes up. This reduces the FET current surges substantially at insertion. The GATE pin is also held low during the
initial timing cycle and until the ON pin has been taken high
to start the hot swap operation.
During hot swap operation, the GATE pin is first pulled up by
a 12 A current source. If the current through the sense resistor
reaches the overcurrent fault timing threshold, V
current of 60 µA on the TIMER pin, is turned on, and this pin
starts charging up. At a slightly higher voltage in the sense resistor,
the error amplifier servos the GATE pin to maintain a constant
current to the load by controlling the voltage across the sense
resistor to the linear current limit, V
LIM
.
OCTIM
, a pull-up
CALCULATING CURRENT LIMITS AND
FAULT CURRENT LIMIT TIME
The nominal linear current limit is determined by a sense resistor
connected between the VCC pin and the SENSE pin, as given
by Equation 1.
I
LIMIT(NOM)
The minimum linear fault current is given by Equation 2.
I
LIMIT(MIN)
The maximum linear fault current is given by Equation 3.
I
LIMIT(MAX)
The power rating of the sense resistor should be rated at the
maximum linear fault current level.
The minimum overcurrent fault timing threshold current is
given by Equation 4.
= V
LIM(NOM)/RSENSE
= V
LIM(MIN)/RSENSE(MAX)
= V
LIM(MAX)/RSENSE(MIN)
= 100 mV/R
= 90 mV/R
= 110 mV/R
SENSE
SENSE(MAX)
SENSE(MIN)
(1)
(2)
(3)
A normal hot swap is complete when the board supply capacitors near full charge, and the current through the sense resistor
drops to eventually reach the level of the board load current.
As soon as the current drops below the overcurrent fault timing
threshold, the current into the TIMER pin switches from being
a 60 A pull-up to a 100 A pull-down. The ADM1175 then
drives the GATE voltage as high as it can to fully enhance the
FET and reduce R
losses to a minimum.
ON
A hot swap fails if the load current does not drop below the
overcurrent fault timing threshold, V
, before the TIMER
OCTIM
pin has charged up to 1.3 V. In this case, the GATE pin is then
pulled down with a 2 mA current sink. The GATE pull-down
stays on until a hot swap retry starts, which can be forced by
deasserting and then reasserting the ON/ONB pin. On the
ADM1175-1 and ADM1175-3, the device retries automatically
after a cool-down period.
The ADM1175 also features a method of protection from
sudden load current surges, such as a low impedance fault,
when the current seen across the sense resistor may go well
beyond the linear current limit. If the fast overcurrent trip
threshold, V
, is exceeded, the 2 mA GATE pull-down is
OCFAST
turned on immediately. This pulls the GATE voltage down
quickly to enable the ADM1175 to limit the length of the current
spike that gets through, and also to bring the current through
the sense resistor back into linear regulation as quickly as
possible. This process protects the backplane supply from
sustained overcurrent conditions that can otherwise cause the
backplane supply to droop during the overcurrent event.
I
OCTIM(MIN)
= V
OCTIM(MIN)/RSENSE(MAX)
= 85 mV/R
SENSE(MAX)
(4)
The maximum fast overcurrent trip threshold current is given by
Equation 5.
I
OCFAST(MAX)
= V
OCFAST(MAX)/RSENSE(MIN)
= 115 mV/R
SENSE(MIN)
(5)
The fault current limit time is the time that a device spends
timing an overcurrent fault, and is given by Equation 6.
t
FAULT
≈ 21.7 × C
ms/F (6)
TIMER
INITIAL TIMING CYCLE
When VCC is first connected to the backplane supply, the
internal supply (Time Point (1) in
must be charged up. A very short time later (significantly less
than 1 ms), the internal supply is fully up and, because the
undervoltage lockout voltage has been exceeded at VCC, the
device comes out of reset. During this first short reset period,
the GATE pin is held down with a 25 mA pull-down current,
and the TIMER pin is pulled down with a 100 A current sink.
The ADM1175 then goes through an initial timing cycle. At
Time Point (2), the TIMER pin is pulled high with 5 µA. At
Time Point (3), the TIMER reaches the V
the first portion of the initial cycle ends. The 100 µA current
source then pulls down the TIMER pin until it reaches 0.2 V
at Time Point (4). The initial cycle delay (Time Point (2) to
Time Point (4)) is related to C
t
INITIAL
≈ 270 × C
ms/F (7)
TIMER
Figure 30) of the ADM1175
threshold, and
TIMERL
by Equation 7.
TIMER
Rev. 0 | Page 14 of 24
Page 15
ADM1175
V
When the initial timing cycle terminates, the device is ready to
start a hot swap operation (assuming the ON/ONB pin is asserted).
In the example shown in
same time that V
CC
Figure 30, the ON pin is asserted at the
is applied, so the hot swap operation starts
immediately after Time Point (4). At this point, the FET gate is
charged up with a 12 A current source. At Time Point (5), the
threshold voltage of the FET is reached, and the load current
begins to flow. The FET is controlled to keep the sense voltage
at 100 mV (this corresponds to a maximum load current level
defined by the value of R
V
have reached their full potential, and the load current has
OUT
settled to its nominal level.
where the ON pin is asserted after V
(1)
(2)(3)(4) (5)(6)
V
VCC
V
ON
V
TIMER
V
GATE
). At Time Point (6), V
SENSE
GATE
Figure 31 illustrates the situation
is applied.
CC
and
(1)(2)(3)(4)(5)(6)(7)
V
VCC
V
ON
V
TIMER
V
GATE
V
SENSE
V
OUT
INITIAL TIMING
CYCLE
05647-005
Figure 31. Startup (ON Asserts After Power Is Applied)
HOT SWAP RETRY CYCLE ON THE ADM1175-1
AND THE ADM1175-3
With the ADM1175-1 and the ADM1175-3, the device turns off
the FET after an overcurrent fault and then uses the TIMER pin
to time a delay before automatically retrying to hot swap.
SENSE
As with all ADM1175 devices, on overcurrent fault is timed by
charging the TIMER cap with a 60 A pull-up current. When
the TIMER pin reaches 1.3 V, the fault current limit time has
V
OUT
been reached, and the GATE pin is pulled down. On the
ADM1175-1 and the ADM1175-3, the TIMER pin is then
INITIAL TIMING
CYCLE
05647-004
Figure 30. Startup (ON Asserts as Power Is Applied)
pulled down with a 2 A current sink. When the TIMER pin
reaches 0.2 V, it automatically restarts the hot swap operation.
The cool-down period is related to C
t
COOL
≈ 550 × C
ms/F (8)
TIMER
by Equation 8.
TIMER
Thus, the retry duty cycle is given by Equation 9.
/(t
+ t
t
FAULT
COOL
) × 100% = 3.8% (9)
FAULT
Rev. 0 | Page 15 of 24
Page 16
ADM1175
VOLTAGE AND CURRENT READBACK
In addition to providing hot swap functionality, the ADM1175
also contains the components to allow voltage and current
readback over an Inter-IC (I
2
C) bus. The voltage output of the
current sense amplifier and the voltage on the VCC pin are fed
into a 12-bit ADC via a multiplexer. The device can be
instructed to convert voltage and/or current at any time during
operation via an I
2
C command or an assertion on the convert
start (CONV) pin. When all conversions are complete, the voltage
and/or current values can be read out to 12-bit accuracy in two
or three bytes.
SERIAL BUS INTERFACE
Control of the ADM1175 is carried out via the I2C bus. This
interface is compatible with I
The ADM1175 is connected to this bus as a slave device, under
the control of a master device.
2
C fast mode (400 kHz maximum).
IDENTIFYING THE ADM1175 ON THE I2C BUS
The ADM1175 has a 7-bit serial bus slave address. When the
device powers up, it does so with a default serial bus address. The
five MSBs of the address are set to 11010; the two LSBs are determined by the state of the ADR pin. There are four different
configurations available on the ADR pin that correspond to four
2
different I
allows four ADM1175 devices to operate on a single I
Table 5. Setting I
ADR Configuration Address
Low State 0xD0
Resistor to GND 0xD2
Floating (Unconnected) 0xD4
High State 0xD6
C addresses for the two LSBs (see Table 5). This scheme
2
C bus.
2
C Addresses via the ADR Pin
GENERAL I2C TIMING
Figure 32 and Figure 33 show timing diagrams for general read
and write operations using the I
conditions for different types of read and write operations, which
are discussed later. The general I
1. The master initiates data transfer by establishing a start
condition, defined as a high-to-low transition on the serial
data line, SDA, while the serial clock line SCL remains
high. This indicates that a data stream follows.
2
C. The I2C specification defines
2
C protocol operates as follows:
All slave peripherals connected to the serial bus respond
to the start condition and shift in the next eight bits,
consisting of a 7-bit slave address (MSB first), plus an
W
bit that determines the direction of the data transfer,
R/
that is, whether data is written to or read from the slave
device (0 = write, 1 = read).
The peripheral whose address corresponds to the transmitted
address responds by pulling the data line low during the
low period before the ninth clock pulse, known as the
acknowledge bit, and holding it low during the high period
of this clock pulse. All other devices on the bus remain idle,
while the selected device waits for data to be read from it
or written to it. If the R/
slave device. If the R/
W
bit is 0, the master writes to the
W
bit is 1, the master reads from the
slave device.
2. Data is sent over the serial bus in sequences of nine clock
pulses: eight bits of data followed by an acknowledge bit
from the slave device. Data transitions on the data line
must occur during the low period of the clock signal and
remain stable during the high period, because a low-tohigh transition when the clock is high can be interpreted
as a stop signal.
If the operation is a write operation, the first data byte
after the slave address is a command byte. This tells the
slave device what to expect next. It can be an instruction,
such as telling the slave device to expect a block write; or
it can be a register address that tells the slave where subsequent data is to be written.
Because data can flow in only one direction, as defined by
W
the R/
bit, it is not possible to send a command to a
slave device during a read operation. Before doing a read
operation, it may first be necessary to do a write operation
to tell the slave what sort of read operation to expect and/or
the address from which data is to be read.
3. When all data bytes have been read or written, stop
conditions are established. In write mode, the master pulls
the data line high during the 10th clock pulse to assert a
stop condition. In read mode, the master device releases
the SDA line during the low period before the ninth clock
pulse, but the slave device does not pull it low. This is
known as a no acknowledge. The master then takes the
data line low during the low period before the 10th clock
pulse, then high during the 10th clock pulse to assert a stop
condition.
Rev. 0 | Page 16 of 24
Page 17
ADM1175
SCL
SDA
START BY MAST E R
SCL
(CONTINUED)
SDA
(CONTINUED)
SCL
SDA
START BY MAST E R
SCL
(CONTINUED)
SDA
(CONTINUED)
9
SLAVE
SLAVE
9
SLAVE
MASTER
1
D6
D7
9
2
C Write Timing Diagram
1
D7
9
2
C Read Timing Diagram
D5
1
D6
D5
1
D4
COMMAND CODE
D4
DATA BYTE
D3
FRAME 2
D3
FRAME 2
D2D1
D2D1
ACKNOWLEDGE BY
FRAME N
DATA BYTE
ACKNOWLEDGE BY
FRAME N
DATA BYTE
D0
SLAVE
D0
MASTER
1
0
0
11
FRAME 1
SLAVE ADDRESS
1
D7D6D5D4D3D2D1D0D7D6D5D4D3D2D1D0
A1A0 R/W
1
FRAME 3
DATA BYTE
ACKNOWLEDG E BY
ACKNOWLEDGE BY
Figure 32. General I
1
0
0
11
FRAME 1
SLAVE ADDRESS
1
D7D6D5D4D3D2D1D0D7D6D5D4D3D2D1D0
A1A0 R/W
1
FRAME 3
DATA BYTE
ACKNOWLEDG E BY
ACKNOWLEDGE BY
Figure 33. General I
9
9
ACKNOWLEDG E BY
SLAVE
9
9
NO ACKNOWLEDGE
STOP
BY
MASTER
STOP
BY
MASTER
05647-006
05647-007
t
SU;STA
t
HD;STA
t
SU;STO
P
05647-008
SCLSCL
SDA
t
LOW
t
HD;STA
t
BUF
S
P
t
R
t
HD;DAT
t
HIGH
t
F
t
SU;DAT
S
Figure 34. Serial Bus Timing Diagram
Rev. 0 | Page 17 of 24
Page 18
ADM1175
WRITE AND READ OPERATIONS
The I2C specification defines several protocols for different
types of read and write operations. The operations used in the
ADM1175 are discussed in the sections that follow.
Table 6 shows
the abbreviations used in the command diagrams.
Table 6. I
2
C Abbreviations
Abbreviation Condition
S Start
P Stop
R Read
W Write
A Acknowledge
N No acknowledge
QUICK COMMAND
The quick command operation allows the master to check if the
slave is present on the bus, as follows:
1. The master device asserts a start condition on SDA.
2. The master sends the 7-bit slave address, followed by the
write bit (low).
3. The addressed slave device asserts an acknowledge on SDA.
12 3
SLAVE
S
ADDRESS
Figure 35. Quick Command
WA
05647-009
WRITE COMMAND BYTE
In the write command byte operation the master device sends a
command byte to the slave device, as follows:
1. The master device asserts a start condition on SDA.
2. The master sends the 7-bit slave address, followed by the
write bit (low).
3. The addressed slave device asserts an acknowledge on SDA.
4. The master sends the command byte. The command byte
is identified by an MSB = 0. An MSB = 1 indicates an
extended register write (see the
section).
5. The slave asserts an acknowledge on SDA.
6. The master asserts a stop condition on SDA to end the
transaction.
12 3456
SLAVE
S
ADDRESS
Figure 36. Write Command Byte
The seven LSBs of the command byte are used to configure and
control the ADM1175.
Tabl e 7 provides details of the function
of each bit.
Write Extended Byte
COMMAND
WA
BYTE
AP
05647-010
Table 7. Command Byte Operations
Bit Default Name Function
C0 0 V_CONT
Set to convert voltage continuously. If readback is attempted before the first conversion is complete,
the ADM1175 asserts an acknowledge and returns all 0s in the returned data.
C1 0 V_ONCE
Set to convert voltage once. Self-clears. I
conversion is complete.
C2 0 I_CONT
Set to convert voltage continuously. If readback is attempted before the first conversion is complete,
the ADM1175 asserts an acknowledge and returns all 0s in the returned data.
C3 0 I_ONCE
Set to convert current once. Self-clears. I
conversion is complete.
C4 0 VRANGE
Selects different internal attenuation resistor networks for voltage readback. A 0 in C4 selects a 14:1 voltage
divider. A 1 in C4 selects a 7:2 voltage divider. With an ADC full scale of 1.902 V, the voltage at the VCC pin for
an ADC full-scale result is 26.35 V for VRANGE = 0 and 6.65 V for VRANGE = 1.
C5 0 N/A Unused.
C6 0 STATUS_RD
Status read. When this bit is set, the data byte read back from the ADM1175 is the STATUS byte. It contains
the status of the device alerts. See
2
C asserts a no acknowledge on attempted reads until the ADC
2
C asserts a no acknowledge on attempted reads until ADC
Table 15 for full details of the STATUS byte.
Rev. 0 | Page 18 of 24
Page 19
ADM1175
WRITE EXTENDED BYTE
In the write extended byte operation, the master device writes
to one of the three extended registers of the slave device, as follows:
1. The master device asserts a start condition on SDA.
2. The master sends the 7-bit slave address, followed by the
write bit (low).
3. The addressed slave device asserts an acknowledge on SDA.
7. The slave asserts an acknowledge on SDA.
8. The master asserts a stop condition on SDA to end the
transaction.
12 345678
S
ADDRESS
SLAVE
REGISTER
WA
ADDRESS
Figure 37. Write Extended Byte
REGISTER
A
DATA
AP
05647-011
4. The master sends the register address byte. The MSB of
this byte is set to 1 to indicate an extended register write.
The two LSBs indicate which of the three extended
registers are to be written to (see
Table 8 ). All other bits
should be set to 0.
5. The slave asserts an acknowledge on SDA.
6. The master sends the command byte. The command byte
is identified by an MSB = 0. An MSB = 1 indicates an
Tabl e 9, Ta b le 1 0, and Ta b le 1 1 give details of each extended
register.
Enabled if a single ADC conversion on the I channel has exceeded the threshold set in the ALERT_TH
register.
1 0 EN_ADC_OC4
Enabled if four consecutive ADC conversions on the I channel have exceeded the threshold set in the
ALERT_TH register.
2 1 EN_HS_ALERT
Enabled if the hot swap has either latched off or entered a cool-down cycle because of an overcurrent
event.
3 0 EN_OFF_ALERT
Enables an alert if the HS operation is turned off by a transition that deasserts the ON/ONB pin or by an
operation that writes the SWOFF bit high.
4 0 CLEAR
Clears the ON_ALERT, HS_ALERT and ADC_ALERT status bits in the STATUS register. These can
immediately reset if the source of the alert has not been cleared or disabled with the other bits in this
register. This bit self-clears to 0 after the STATUS register bits have been cleared.
Table 10. ALERT_TH Register Operations
Bit Default Function
7:0 FF
The ALERT_TH register sets the current level at which an alert occurs. Defaults to ADC full scale. The ALERT_TH 8-bit
number corresponds to the top eight bits of the current channel data.
Table 11. CONTROL Register Operations
Bit Default Name Function
0 0 SWOFF Forces hot swap off. Equivalent to deasserting the ON/ONB pin.
Rev. 0 | Page 19 of 24
Page 20
ADM1175
READ VOLTAGE AND/OR CURRENT DATA BYTES
The ADM1175 can be set up to provide information in three
different ways (see the
Write Command Byte section). Depending
on how the device is configured, the following data can be read
out of the device after a conversion (or conversions).
Voltage and Current Readback
The ADM1175 digitizes both voltage and current. Three bytes
are read out of the device in the format shown in
Tabl e 12 .
Table 12. Voltage and Current Readback Format
Byte Contents B7 B6 B5 B4 B3 B2 B1 B0
1
Voltage
V11 V10 V9 V8 V7 V6 V5 V4
MSBs
2
Current
I11 I10 I9 I8 I7 I6 I5 I4
MSBs
3 LSBs V3 V2 V1 V0 I3 I2 I1 I0
Voltage Readback
The ADM1175 digitizes voltage only. Two bytes are read out of
the device in the format shown in
The following series of events occurs when the master receives
three bytes (voltage and current data) from the slave device:
1. The master device asserts a start condition on SDA.
2. The master sends the 7-bit slave address, followed by the
read bit (high).
3. The addressed slave device asserts an acknowledge on SDA.
4. The master receives the first data byte.
5. The master asserts acknowledge on SDA.
6. The master receives the second data byte.
7. The master asserts an acknowledge on SDA.
8. The master receives the third data byte.
9. The master asserts a no acknowledge on SDA.
10. The master asserts a stop condition on SDA, and the
transaction ends.
For cases where the master is reading voltage only or current
only, only two data bytes are read. Step 7 and Step 8 are not
required.
12 345678910
SLAVE
S
ADDRESS
12 345678
S
RA
DATA 1DATA 2NPDATA 3AA
Figure 38. Three-Byte Read from ADM1175
SLAVE
ADDRESS
Figure 39. Two-Byte Read from ADM1175
RA
REGISTER
ADDRESS
REGISTER
A
DATA
NP
05647-012
05647-013
Converting ADC Codes to Voltage and Current Readings
The following equations can be used to convert ADC codes
representing voltage and current from the ADM1175 12-bit
ADC into actual voltage and current values.
Voltage = (V
FULLSCALE
/4096) × Code
where:
V
= 6.65 (7:2 range) or 26.35 (14:1 range).
FULLSCALE
Code is the ADC voltage code read from the device (Bit V0
to V11).
Current = ((I
/4096) × Code)/Sense Resistor
FULLSCALE
where:
FULLSCALE
= 105.84 mV.
I
Code is the ADC current code read from the device (Bit I0
to Bit I11).
Read Status Register
A single register of status data can also be read from the
ADM1175.
1. The master device asserts a start condition on SDA.
2. The master sends the 7-bit slave address followed by the
read bit (high).
3. The addressed slave device asserts an acknowledge on SDA.
4. The master receives the status byte.
5. The master asserts an acknowledge on SDA.
12 345
SLAVE
S
ADDRESS
Figure 40. Status Read from ADM1175
RA
DATA 1 A
05647-014
Tabl e 15 shows the ADM1175 status registers in detail. Note
that Bit 1, Bit 3, and Bit 5 are cleared by writing to Bit 4 of the
ALERT_EN register (CLEAR).
Rev. 0 | Page 20 of 24
Page 21
ADM1175
Table 15. Status Byte Operations
Bit Name Function
0 ADC_OC An ADC-based overcurrent comparison has been detected on the last three conversions
1 ADC_ALERT
2 HS_OC
3 HS_ALERT The hot swap has failed since the last time this was reset. Cleared by writing to Bit 4 of the ALERT_EN register.
4 OFF_STATUS
5 OFF_ALERT
An ADC-based overcurrent trip has happened, which has caused the alert. Cleared by writing to Bit 4 of the ALERT_EN
register.
The hot swap is off due to an analog overcurrent event. On parts that latch off, this is the same as the HS_ALERT status
bit (if EN_HS_ALERT = 1). On the retry parts, this indicates the current state: a 0 can indicate that the data was read
during a period when the device was retrying, or that it has successfully hot swapped by retrying after at least one
overcurrent timeout.
The state of the ON/ONB pin. Set to 1 if the input pin is deasserted. Can also be set to 1 by writing to the SWOFF bit of
the CONTROL register.
An alert has been caused by either the ON/ONB pin or the SWOFF bit. Cleared by writing to Bit 4 of the ALERT_EN
register.
Rev. 0 | Page 21 of 24
Page 22
ADM1175
APPLICATIONS WAVEFORMS
1
2
3
4
CH1 1.5ACH2 1.00V
CH3 20.0V CH4 10.0V
M40.0ms
Figure 41. Inrush Current Control into 220 μF Load
LOAD
, CH2 = V
(CH1 = I
1
2
3
4
TIMER
, CH3 = V
GATE
, CH4 = V
OUT
1
2
3
4
CH1 1.5ACH2 1.00V
05647-070
CH3 20.0V CH4 10.0V
M10.0ms
05647-073
Figure 44. Overcurrent Condition During Operation (ADM1175-1 Model)
)
(CH1 = I
1
2
3
4
LOAD
, CH2 = V
TIMER
, CH3 = V
GATE
, CH4 = V
OUT
)
CH1 1.5ACH2 1.00V
CH3 20.0V CH4 10.0V
M10.0ms
Figure 42. Overcurrent Condition at Startup (ADM1175-1 Model)
(CH1 = I
LOAD
1
2
3
4
CH1 1.5ACH2 1.00V
CH3 20.0V CH4 10.0V
, CH2 = V
TIMER
, CH3 = V
M20.0ms
GATE
, CH4 = V
Figure 43. Overcurrent Condition at Startup (ADM1175-2 Model)
(CH1 = I
LOAD
, CH2 = V
TIMER
, CH3 = V
GATE
, CH4 = V
OUT
OUT
CH1 1.5ACH2 1.00V
05647-071
CH3 20.0V CH4 10.0V
M20.0ms
05647-074
Figure 45. Overcurrent Condition During Operation (ADM1175-2 Model)
)
(CH1 = I
LOAD
, CH2 = V
TIMER
, CH3 = V
GATE
, CH4 = V
OUT
)
05647-072
)
Rev. 0 | Page 22 of 24
Page 23
ADM1175
KELVIN SENSE RESISTOR CONNECTION
When using a low value sense resistor for high current
measurement, the problem of parasitic series resistance may
arise. The lead resistance can be a substantial fraction of the
rated resistance, making the total resistance a function of lead
length. This problem can be avoided by using a Kelvin sense
connection. This type of connection separates the current path
through the resistor and the voltage drop across the resistor.
Figure 46 shows the correct way to connect the sense resistor
between the VCC pin and the SENSE pin of the ADM1175.
CURRENT
FLOW FROM
SUPPLY
KELVIN SENSE TRACES
SENSE RESISTOR
VCCSENSE
CURRENT
FLOW TO
LOAD
ADM1175
Figure 46. Kelvin Sense Connections
05647-015
Rev. 0 | Page 23 of 24
Page 24
ADM1175
OUTLINE DIMENSIONS
3.10
3.00
2.90
6
10
3.10
3.00
2.90
1
PIN 1
0.50 BSC
0.95
0.85
0.75
0.15
0.05
0.33
0.17
COPLANARITY
0.10
COMPLIANT TO JEDEC STANDARDS MO-187-BA
Figure 47. 10-Lead Mini Small Outline Package [MSOP]
ORDERING GUIDE
Model Hot Swap Retry Option ON/ONB Pin
ADM1175-1ARMZ-R71 Automatic Retry Version ON −40°C to +85°C 10-Lead MSOP RM-10 M5P
ADM1175-2ARMZ-R71 Latched Off Version ON −40°C to +85°C 10-Lead MSOP RM-10 M5R
ADM1175-3ARMZ-R71 Automatic Retry Version ONB −40°C to +85°C 10-Lead MSOP RM-10 M5S
ADM1175-4ARMZ-R71 Latched Off Version ONB −40°C to +85°C 10-Lead MSOP RM-10 M5T
EVAL-ADM1175EBZ1 Evaluation Board
1
Z = Pb-free part.
5.15
4.90
4.65
5
1.10 MAX
SEATING
PLANE
0.23
0.08
8°
0°
(RM-10)
Dimensions shown in millimeters
Temperature
Range
0.80
0.60
0.40
Package
Description
Package
Option Branding
Purchase of licensed I2C components of Analog Devices or one of its sublicensed Associated Companies conveys a license for the purchaser under the Philips I2C Patent
Rights to use these components in an I2C system, provided that the system conforms to the I2C Standard Specification as defined by Philips.