Datasheet ADM1175 Datasheet (ANALOG DEVICES)

Page 1
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Hot Swap Controller and
Digital Power Monitor with Convert Pin
FEATURES
Allows safe board insertion and removal from a live backplane Controls supply voltages from 3.15 V to 16.5 V Precision current sense amplifier Precision voltage input 12-bit ADC for current and voltage readback Charge pumped gate drive for external N-channel FET Adjustable analog current limit with circuit breaker ±3% accurate hot swap current limit level Fast response limits peak fault current Automatic retry or latch-off on current fault Programmable hot swap timing via TIMER pin Active-high and active-low ON/ONB pin options Convert start pin (CONV)
2
C® fast mode-compliant interface (400 kHz maximum)
I 10-lead MSOP
APPLICATIONS
Power monitoring/power budgeting Central office equipment Telecommunication and data communication equipment PCs/servers
GENERAL DESCRIPTION
The ADM1175 is an integrated hot swap controller and current sense amplifier that offers digital current and voltage monitoring via an on-chip, 12-bit analog-to-digital converter (ADC), communicated through an I
An internal current sense amplifier senses voltage across the sense resistor in the power path via the VCC pin and the SENSE pin.
2
C interface.
SENSE
3.15V TO 16.5
FUNCTIONAL BLOCK DIAGRAM
ADM1175-1
MUX
VCC
ON
1.3V UV COMPARATOR
CURRENT
SENSE
AMPLIFIER
ON
TIMER
V
0
I
R
GND
SENSE
SENSEVCC
1
FET DRIVE
CONTROLLER
TIMER
Figure 1.
N-CHANNEL FET
GATE
SDA
SCL
CONV
ADR
A
GND
ADM1175-1
Figure 2. Applications Diagram
ADM1175
12-BIT
ADC
CONTROLLER
SDA SCL
CONV
2
I
C
P = VI
CONV
SDA SCL ADR
GATE
05647-001
05647-002
The ADM1175 limits the current through this resistor by control­ling the gate voltage of an external N-channel FET in the power path, via the GATE pin. The sense voltage (and, therefore, the inrush current) is kept below a preset maximum.
The ADM1175 protects the external FET by limiting the time that it spends with maximum current running through it. This current limit period is set by the choice of capacitor attached to the TIMER pin. Additionally, the device provides protection from overcurrent events that may occur once the hot swap event is complete. In the case of a short-circuit event, the current in the sense resistor exceeds an overcurrent trip threshold, and the FET is switched off immediately by pulling down the GATE pin.
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Anal og Devices for its use, nor for any infringements of p atents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners.
A 12-bit ADC can measure the current seen in the sense resistor, as well as the supply voltage on the VCC pin. An industry-standard
2
I
C interface allows a controller to read current and voltage data
from the ADC. Measurements can be initiated by an I
2
or via the convert (CONV) pin. The CONV pin is especially useful for synchronizing reads on multiple ADM1175 devices. Alternatively, the ADC can run continuously, and the user can read the latest conversion data whenever it is required. Up to four unique I
2
C addresses can be created, depending on the way the
ADR pin is connected.
The ADM1175 is packaged in a 10-lead MSOP.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 www.analog.com Fax: 781.461.3113 ©2006 Analog Devices, Inc. All rights reserved.
C command
Page 2
ADM1175
TABLE OF CONTENTS
Features.............................................................................................. 1
Applications....................................................................................... 1
General Description ......................................................................... 1
Functional Block Diagram .............................................................. 1
Revision History ............................................................................... 2
Specifications..................................................................................... 3
Absolute Maximum Ratings............................................................ 6
ESD Caution.................................................................................. 6
Pin Configuration and Function Descriptions............................. 7
Typical Performance Characteristics ............................................. 8
Overview of the Hot Swap Function............................................ 13
Undervoltage Lockout ............................................................... 13
ON/ONB Function..................................................................... 13
TIMER Function ........................................................................13
GATE and TIMER Functions During a Hot Swap ................ 14
Hot Swap Retry Cycle on the ADM1175-1 and the
ADM1175-3 ................................................................................ 15
Voltage and Current Readback..................................................... 16
Serial Bus Interface..................................................................... 16
Identifying the ADM1175 on the I
General I
Write and Read Operations ...................................................... 18
Quick Command........................................................................ 18
Write Command Byte................................................................ 18
Write Extended Byte .................................................................. 19
Read Voltage and/or Current Data Bytes................................ 20
Applications Waveforms................................................................ 22
Kelvin Sense Resistor Connection ........................................... 23
Outline Dimensions....................................................................... 24
Ordering Guide .......................................................................... 24
2
C Timing.................................................................... 16
2
C Bus............................... 16
Calculating Current Limits and Fault Current Limit Time.. 14
Initial Timing Cycle ................................................................... 14
REVISION HISTORY
9/06—Revision 0: Initial Version
Rev. 0 | Page 2 of 24
Page 3
ADM1175
SPECIFICATIONS
VCC = 3.15 V to 16.5 V; TA = −40°C to +85°C; typical values at TA = 25°C, unless otherwise noted.
Table 1.
Parameter Min Typ Max Unit Conditions
VCC PIN
Operating Voltage Range, V Supply Current, ICC 1.7 2.5 mA Undervoltage Lockout, V Undervoltage Lockout Hysteresis, V
ON/ONB PIN
Input Current, I
INON
−2 +2 μA Rising Threshold, V
ONTH
Trip Threshold Hysteresis, V Glitch Filter Time 3 μs
CONV PIN
Input Current, I
Trip Threshold Low, V
Trip Threshold H igh, V
−1
INCONV
CONVL
CONVH
SENSE PIN
Input Leakage, I
−1 +1 μA V
SENSE
Overcurrent Fault Timing Threshold, V
Overcurrent Limit Threshold, V
Fast Overcurrent Trip Threshold, V
GATE PIN
Drive Voltage, V
3 6 9 V V
GATE
Pull-Up Current 8 12.5 17 μA V Pull-Down Current 1.5 mA V 5 mA V 7 mA V
TIMER PIN
Pull-Up Current (Power On Reset), I Pull-Up Current (Fault Mode), I Pull-Down Current (Retry Mode), I
Pull-Down Current, I Trip Threshold H igh, V Trip Threshold Low, V
TIMERDN
TIMERH
TIMERL
ADR PIN
Set Address to 00, V Set Address to 01, R
Set Address to 10, I
Set Address to 11, V
ADRLOWV
ADRLOWZ
ADRHIGHZ
ADRHIGHV
Input Current for 11 Decode, I Input Current for 00 Decode, I
3.15 16.5 V
VCC
2.8 V VCC rising
UVLO
80 mV
UVLOHYST
−100
+100 nA ON/ONB < 1.5 V
1.26 1.3 1.34 V ON/ONB rising 35 50 65 mV
ONHYST
+1 μA V
CONV(MA X)
= 3.6 V
1.2 V
1.4 V
= V
92 mV
OCTIM
V
SENSE
OCTRIM
= (V
VCC
VCC
TIMER pin
97 100 103 mV
LIM
V
= (V
VCC
− V
LIM
a current limit
115 mV
OCFAST
V
OCFAST
= (V
VCC
turned on
− V
VCC
− V
VCC
− V
VCC
= 0 V = 3 V, V = 3 V, V = 3 V, V
, V , V , V
VCC
VCC
VCC
VCC
VCC
VCC
TIMERUPPOR
TIMERUPFAULT
TIMERDNRETRY
GATE
9 11 13 V V 7 10 13 V V
GATE
GATE
GATE
GATE
GATE
GATE
−3.5 −5 −6.5 μA Initial cycle, V
−40 −60 −80 μA During current fault, V 2 3 μA
After current fault and during a cool-down period on a retry device, V
100 μA Normal operation, V
1.26 1.3 1.34 V TIMER rising
0.175 0.2 0.225 V TIMER falling
0 0.8 V Low state
135 150 165
Resistor to ground state, load pin with specified resistance for 01 decode
−1 +1 μA
Open state, maximum load allowed on ADR pin for 10 decode
2 5.5 V High state
3 10 μA V
ADRLOW
−40 −22 μA V
ADRHIGH
= 2.0 V to 5.5 V
ADR
= 0 V to 0.8 V
ADR
− V
), fault timing starts on the
SENSE
), closed-loop regulation to
SENSE
− V
), gate pull-down current
SENSE
= 3.15 V = 5 V = 16.5 V
= 3.15 V = 5 V = 16.5 V
= 1 V
TIMER
= 1 V
TIMER
= 1 V
TIMER
= 1 V
TIMER
Rev. 0 | Page 3 of 24
Page 4
ADM1175
Parameter Min Typ Max Unit Conditions
MONITORING ACCURACY
Current Sense Absolute Accuracy −1.45
−1.8
−2.8
−5.7
−1.5
−1.8
−2.95
−6.1
−1.95
−2.45
−3.85
−6.7
V
for ADC Full Scale 105.84 mV
SENSE
Voltage Accuracy −0.85
−0.9 +0.9 %
−0.85
−0.9 +0.9 %
−0.9
−1.15 +1.15 %
VCC for ADC Full Scale, Low Range (VRANGE = 1)
VCC for ADC Full Scale, High Range (VRANGE = 0)
I2C TIMING
Low Level Input Voltage, V High Level Input Voltage, V Low Level Output Voltage on SDA, V Output Fall Time on SDA from V
Maximum Width of Spikes Suppressed by Input Filtering on SDA and SCL Pins
Input Current, II, on SDA/SCL When Not Driving Out a Logic Low
Input Capacitance on SDA/SCL 5 pF
SCL Clock Frequency, f
Low Period of the SCL Clock 600 ns High Period of the SCL Clock 1300 ns
1
+1.45 % V
+1.8 % V
+2.8 % V
+5.7 % V
+1.5 % V
+1.8 % V
+2.95 % V
+6.1 % V
+1.95 % V
+2.45 % V
+3.85 % V
+6.7 % V
SENSE
SENSE
SENSE
SENSE
SENSE
SENSE
SENSE
SENSE
SENSE
SENSE
SENSE
SENSE
This is an absolute value to be used when converting ADC codes to current readings; any inaccuracy in this value is factored into absolute current accuracy values (see specs for Current Sense Absolute Accuracy)
+0.85 %
VCC = 3 V minimum (low range)
= 6 V minimum
V
CC
(high range)
+0.85 %
VCC = 3 V minimum (low range)
= 6 V minimum
V
CC
(high range)
+0.9 %
VCC = 3 V minimum (low range)
= 6 V minimum
V
CC
(high range)
6.65
V
These are absolute values to be used when converting ADC codes to voltage readings;
26.35
V
any inaccuracy in these values is factored into voltage accuracy values (see specs for Voltage Accuracy)
0.3 V
IL
0.7 V
IH
0.4 V I
OL
to V
IHMIN
ILMAX
V
BUS
20 +
0.1 C
250 ns CB = bus capacitance from SDA to GND
B
V
BUS
= 3 mA
OL
50 250 ns
−10 +10 μA
400 kHz
SCL
= 75 mV 0°C to +70°C
= 50 mV 0°C to +70°C
= 25 mV 0°C to +70°C
= 12.5 mV 0°C to +70°C
= 75 mV 0°C to +85°C
= 50 mV 0°C to +85°C
= 25 mV 0°C to +85°C
= 12.5 mV 0°C to +85°C
= 75 mV −40°C to +85°C
= 50 mV −40°C to +85°C
= 25 mV −40°C to +85°C
= 12.5 mV −40°C to +85°C
0°C to +70°C
0°C to +70°C
0°C to +85°C
0°C to +85°C
−40°C to +85°C
−40°C to +85°C
Rev. 0 | Page 4 of 24
Page 5
ADM1175
Parameter Min Typ Max Unit Conditions
Setup Time for a Repeated Start Condition, t
SU;STA
SDA Output Data Hold Time, t Setup Time for a Stop Condition, t
100 900 ns
HD;DAT
600 ns
SU;STO
Bus Free Time Between a Stop and a Start Condition, t
BUF
Capacitive Load for Each Bus Line 400 pF
1
Monitoring accuracy is a measure of the error in a code that is read back for a particular voltage/current. This is a combination of amplifier error, reference error,
ADC error, and error in ADC full-scale code conversion factor.
600 ns
1300 ns
Rev. 0 | Page 5 of 24
Page 6
ADM1175
ABSOLUTE MAXIMUM RATINGS
Table 2.
Parameter Rating
VCC Pin 20 V SENSE Pin 20 V TIMER Pin −0.3 V to +6 V ON/ONB Pin −0.3 V to +20 V CONV Pin −0.3 V to +6 V GATE Pin 30 V SDA Pin, SCL Pin −0.3 V to +7 V ADR Pin −0.3 V to +6 V Storage Temperature Range −65°C to +125°C Operating Temperature Range −40°C to +85°C Lead Temperature (Soldering, 10 sec) 300°C Junction Temperature 150°C
Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
Table 3. Thermal Resistance
Package Type θJA Unit
10-Lead MSOP 137.5 °C/W
ESD CAUTION
Rev. 0 | Page 6 of 24
Page 7
ADM1175
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
1
VCC
SENSE
2
GND
ADM1175
3
TOP VIEW
(Not to Scale)
4 5
ON/ONB
TIMER
Figure 3. Pin Configuration
Table 4. Pin Function Descriptions
Pin No. Mnemonic Description
1 VCC
Positive Supply Input Pin. The operating supply voltage range is from 3.15 V to 16.5 V. An undervoltage lockout (UVLO) circuit resets the ADM1175 when a low supply voltage is detected.
2 SENSE
Current Sense Input Pin. A sense resistor between the VCC pin and the SENSE pin sets the analog current limit. The hot swap operation of the ADM1175 controls the external FET gate to maintain the (V voltage at 100 mV or below.
3 ON/ONB
Undervoltage or Overvoltage Input Pin. This pin is active high on the ADM1175-1 and ADM1175-2 and active-low on the ADM1175-3 and ADM1175-4. An internal ON comparator has a trip threshold of 1.3 V, and the output of this comparator is used as an enable for the hot swap operation. For the ON pin variants with an external resistor divider from VCC to GND, this pin can be used to enable the hot swap operation on a specific voltage on VCC, giving an undervoltage function. Similarly, for the ONB pin variants, an external resistor divider can be used to create an overvoltage function, where the divider sets a voltage on VCC at
which the hot swap operation is switched off, pulling the GATE to ground. 4 GND Chip Ground Pin. 5 TIMER
Timer Pin. An external capacitor, C
TIMER
The GATE pin turns off when the TIMER pin is pulled beyond the upper threshold. An overvoltage detection
with an external Zener can be used to force this pin high. 6 SCL I2C Clock Pin. Open-drain input requires an external resistive pull-up. 7 SDA I2C Data I/O Pin. Open-drain input/output. Requires an external resistive pull-up. 8 ADR
9 CONV
2
C Address Pin. This pin can be tied low, tied high, left floating, or tied low through a resistor to set four
I
different I
Convert Start Pin. A high level on this pin enables an ADC conversion. The state of an internal control register,
which is set through the I
2
C addresses.
2
C interface, configures the part to convert current only, voltage only, or both
channels when the convert pin is asserted. 10 GATE
GATE Output Pin. This pin is the high-side gate drive of an external N-channel FET. This pin is driven by the
FET drive controller, which utilizes a charge pump to provide a 12.5 μA pull-up current to charge the FET
GATE pin. The FET drive controller regulates to a maximum load current (100 mV through the sense resistor)
by modulating the GATE pin.
10
GATE CONV
9
ADR
8
SDA
7 6
SCL
05647-003
− V
SENSE
)
VCC
, sets a 270 ms/μF initial timing cycle delay and a 21.7 ms/μF fault delay.
Rev. 0 | Page 7 of 24
Page 8
ADM1175
TYPICAL PERFORMANCE CHARACTERISTICS
2.0
1.8
1.6
1.4
1.2
1.0
(mA)
CC
I
0.8
0.6
0.4
0.2
0
024681014112 16
VCC (V)
Figure 4. Supply Current vs. Supply Voltage
8
05647-021
2.0
1.8
1.6
1.4
1.2
1.0
(mA)
CC
I
0.8
0.6
0.4
0.2
0
–40 806040200–20
TEMPERATURE (°C)
Figure 7. Supply Current vs. Temperature (Gate On)
05647-022
12
10
8
6
DRIVE VOLTAGE (V)
4
2
0
01
Figure 5. Drive Voltage (V
0
–2
–4
–6
(µA)
–8
GATE
I
–10
VCC (V)
− VCC) vs. Supply Voltage
GATE
8161412108642
05647-029
12
10
8
6
DRIVE VOLTAGE (V)
4
2
0
–40 806040200–20
Figure 8. Drive Voltage (V
0
–2
–4
–6
(µA)
–8
GATE
I
–10
5V V
3.15V V
TEMPERATURE (°C)
− VCC) vs. Temperature
GATE
CC
CC
05647-030
–12
–14
01
VCC (V)
10 12 16148642
8
05647-027
Figure 6. Gate Pull-Up Current vs. Supply Voltage
–12
–14
–40 806040200–20
Figure 9. Gate Pull-Up Current vs. Temperature
Rev. 0 | Page 8 of 24
TEMPERATURE (°C)
05647-028
Page 9
ADM1175
12
10
8
(mA)
6
GATE
I
4
2
0
01
Figure 10. Gate Pull-Down Current vs. V
2
0
–2
–4
(µA)
–6
GATE
I
–8
–10
–12
–14
01
VCC (V)
V
GATE
CC
(V)
Figure 11. Gate Pull-Up Current vs. Gate Voltage at V
20
15
(mA)
10
GATE
I
5
VCC = 3V
0
02
V
V
CC
GATE
V
CC
= 5V
= 12V
(V)
at V
GATE
2015105
161412108642
8
05647-031
= 5 V
1412108642
6
05647-040
5
05647-043
CC
= 5 V
Figure 12. Gate Pull-Down Current vs. Gate Voltage
2.0
1.8
1.6
1.4
1.2
1.0
0.8
0.6
TIMER THRES HO LD (V)
0.4
0.2
0
01810 12 16148642
HIGH
LOW
VCC (V)
Figure 13. Timer Threshold vs. Supply Voltage
2.0
1.8
1.6
1.4
1.2
1.0
0.8
0.6
TIMER HIG H THRESHOLD (V)
0.4
0.2
0
–40 80
HIGH
LOW
TEMPERATURE (°C)
Figure 14. Timer Threshold vs. Temperature
100
90
80
70
60
50
40
GATE ON TIME (ms)
30
20
10
0
05.04.54.03.53.02.52.01.51.00.5 C
TIMER
(µF)
Figure 15. Current Limit On Time vs. Timer Capacitance
05647-038
6040200–20
05647-039
05647-050
Rev. 0 | Page 9 of 24
Page 10
ADM1175
0
0
–1
–2
(µA)
–3
TIMER
I
–4
–5
–6
01810 12 16148642
VCC (V)
Figure 16.Timer Pull-Up Current (Initial Cycle) vs. Supply Voltage
0
–10
–20
–30
(µA)
–40
TIMER
I
–50
–60
–70
–80
01810 12 16148642
VCC (V)
Figure 17. Timer Pull-Up Current (C. B. Delay) vs. Supply Voltage
3.0
–1
–2
(µA)
–3
TIMER
I
–4
–5
–6
–40 806040200–20
05647-032
TEMPERATURE (°C)
05647-033
Figure 19. Timer Pull-Up Current (Initial Cycle) vs. Temperature
0
–10
–20
–30
(µA)
–40
TIMER
I
–50
–60
–70
–80
–40 806040200–20
05647-034
TEMPERATURE (°C)
05647-035
Figure 20. Timer Pull-Up Current (C. B. Delay) vs. Temperature
3.0
2.5
2.0
(µA)
1.5
TIMER
I
1.0
0.5
0
01810 12 16148642
VCC (V)
Figure 18. Timer Pull-Down Current (Cool-Off Cycle) vs. Supply Voltage
05647-036
Rev. 0 | Page 10 of 24
2.5
2.0
(µA)
1.5
TIMER
I
1.0
0.5
0
–40 806040200–20
TEMPERATURE (°C)
Figure 21. Timer Pull-Down Current (Cool-Off Cycle) vs. Temperature
05647-037
Page 11
ADM1175
120
115
110
105
(mV)
100
LIM
V
95
90
85
80
21816141210864
VCC (V)
Figure 22. Circuit Breaker Limit Voltage vs. Supply Voltage
110
108
106
104
102
100
V (mV)
98
96
94
92
90
–40 806040200–20
Figure 23. V
V
OCFAST
V
LIM
V
OCTIM
TEMPERATURE (°C)
, V
, V
OCTIM
LIM
OCFAST
vs. Temperature
05647-041
05647-042
1000
900
800
700
600
500
400
300
HITS PER CODE ( 1000 READS)
200
100
0
2047 2048 2049 20502046
CODE
Figure 25. ADC Noise, Current Channel, Midcode Input, 1000 Reads
1000
900
800
700
600
500
400
300
HITS PER CODE ( 1000 READS)
200
100
0
780 781 782 783779
CODE
Figure 26. ADC Noise, 14:1 Voltage Channel, 5 V Input, 1000 Reads
05647-060
05647-061
11 DECODE 10 DECODE 01 DECODE 00 DECODE
3.2
3.0
2.8
2.6
2.4
2.2
2.0
1.8
1.6
ADR
V
1.4
1.2
1.0
0.8
0.6
0.4
0.2 0
–35 –30 –25 –20 –15 –10 –5 0 5 10
I
ADR
(µA)
Figure 24. Address Pin Voltage vs. Address Pin Current
for Four Addressing Options
05647-026
Rev. 0 | Page 11 of 24
1000
900
800
700
600
500
400
300
HITS PER CO DE (1000 RE ADS)
200
100
0
3079 3080 3081 30823078
CODE
Figure 27. ADC Noise, 7:1 Voltage Channel, 5 V Input, 1000 Reads
05647-062
Page 12
ADM1175
4
4
INL (LSB)
3
2
1
0
–1
–2
–3
–4
0 40002500 3000 3500200015001000500
CODE
Figure 28. INL for ADC
05647-023
DNL (LSB)
3
2
1
0
–1
–2
–3
–4
0 40002500 3000 3500200015001000500
CODE
Figure 29. DNL for ADC
05647-024
Rev. 0 | Page 12 of 24
Page 13
ADM1175
OVERVIEW OF THE HOT SWAP FUNCTION
When circuit boards are inserted into a live backplane, discharged supply bypass capacitors draw large transient currents from the backplane power bus as they charge. Such transient currents can cause permanent damage to connector pins, as well as dips on the backplane supply that can reset other boards in the system. The ADM1175 is designed to turn a circuit board supply voltage on and off in a controlled manner, allowing the circuit board to be safely inserted into or removed from a live backplane. The ADM1175 can reside either on the backplane or on the circuit board itself.
The ADM1175 controls the inrush current to a fixed maximum level by modulating the gate of an external N-channel FET placed between the live supply rail and the load. This hot swap function protects the card connectors and the FET itself from damage and limits any problems that can be caused by high current loads on the live supply rail.
The ADM1175 holds the GATE pin down (and, thus, the FET is held off) until a number of conditions are met. An undervoltage lockout circuit ensures that the device is provided with an adequate input supply voltage. Once the input supply voltage has been successfully detected, the device goes through an initial timing cycle to provide a delay before it attempts to hot swap. This delay ensures that the board is fully seated in the backplane before the board is powered up.
The ADM1175-1 and ADM1175-3 retry the hot swap operation indefinitely, keeping the FET in its safe operating area (SOA) by using the TIMER pin to time a cool-down period in between hot swap attempts. The current and voltage threshold combinations on the TIMER pin set the retry duty cycle to 3.8%.
The ADM1175 is designed to operate over a range of supplies from 3.15 V to 16.5 V.
UNDERVOLTAGE LOCKOUT
An internal undervoltage lockout (UVLO) circuit resets the ADM1175 if the VCC
supply is too low for normal operation. The UVLO has a low-to-high threshold of 2.8 V, with 80 mV hysteresis. Above 2.8 V supply voltage, the ADM1175 starts the initial timing cycle.
ON/ONB FUNCTION
The ADM1175-1 and ADM1175-2 have an active high ON pin. The ON pin is the input to a comparator that has a low-to-high threshold of 1.3 V, a 50 mV hysteresis, and a glitch filter of 3 s. A low input on the ON pin turns off the hot swap operation by pulling the GATE pin to ground, turning off the external FET. The TIMER pin is also reset by turning on a pull-down current on this pin. A low-to-high transition on the ON pin starts the hot swap operation. A 10 k pull-up resistor connecting the ON pin to the supply is recommended.
Once the initial timing cycle is complete, the hot swap function is switched on under control of the ON/ONB pin. When ON/ONB is asserted (high for the ADM1175-1 and ADM1175-2, low for the ADM1175-3 and ADM1175-4), the hot swap operation starts.
The ADM1175 charges up the gate of the FET to turn on the load. It continues to charge up the GATE pin until the linear current limit (set to 100 mV/R
) is reached. For some combi-
SENSE
nations of low load capacitance and high current limit, this limit may not be reached before the load is fully charged up. If current limit is reached, the ADM1175 regulates the GATE pin to keep the current at this limit. For currents above the overcurrent fault timing threshold, nominally 100 mV/R
, the current fault is
SENSE
timed by sourcing a current out to the TIMER pin. If the load becomes fully charged before the fault current limit time is reached (when the TIMER pin reaches 1.3 V), the current drops below the overcurrent fault timing threshold. The ADM1175 then charges the GATE pin higher to fully enhance the FET for lowest R
, and the TIMER pin is pulled down again.
ON
If the fault current limit time is reached before the load drops below the current limit, a fault has been detected, and the hot swap operation is aborted by pulling down on the GATE pin to turn off the FET. The ADM1175-2 and ADM1175-4 are latched off. They attempt to hot swap again only when the ON/ONB pin is deasserted and then asserted again.
Alternatively, an external resistor divider at the ON pin can be used to program an undervoltage lockout value higher than the internal UVLO circuit, thereby setting a voltage level at the VCC supply, where the hot swap operation is to start. An RC filter can be added at the ON pin to increase the delay time at card insertion if the initial timing cycle delay is insufficient.
The ADM1175-3 and ADM1175-4 have an active low ONB pin. This pin operates exactly as described above for the ON pin, but the polarity is reversed. This allows this pin to function as an overvoltage detector that can use the external FET as a circuit breaker for overvoltage conditions on the monitored supply.
TIMER FUNCTION
The TIMER pin handles several timing functions with an external capacitor, C V
(0.2 V) and V
TIMERH
sources are a 5 µA pull-up, a 60 µA pull-up, a 2 µA pull-down, and a 100 µA pull-down. The 100 µA pull-down is a non-ideal current source, approximating a 7 k resistor below 0.4 V.
These current and voltage levels, together with the value of C chosen by the user, determine the initial timing cycle time, the fault current limit time, and the hot swap retry duty cycle.
. There are two comparator thresholds:
TIMER
(1.3 V). The four timing current
TIMERL
TIMER
Rev. 0 | Page 13 of 24
Page 14
ADM1175
GATE AND TIMER FUNCTIONS DURING A HOT SWAP
During hot insertion of a board onto a live supply rail at VCC, the abrupt application of supply voltage charges the external FET drain/gate capacitance, which can cause an unwanted gate voltage spike. An internal circuit holds GATE low before the internal circuitry wakes up. This reduces the FET current surges substan­tially at insertion. The GATE pin is also held low during the initial timing cycle and until the ON pin has been taken high to start the hot swap operation.
During hot swap operation, the GATE pin is first pulled up by a 12 A current source. If the current through the sense resistor reaches the overcurrent fault timing threshold, V current of 60 µA on the TIMER pin, is turned on, and this pin starts charging up. At a slightly higher voltage in the sense resistor, the error amplifier servos the GATE pin to maintain a constant current to the load by controlling the voltage across the sense resistor to the linear current limit, V
LIM
.
OCTIM
, a pull-up
CALCULATING CURRENT LIMITS AND FAULT CURRENT LIMIT TIME
The nominal linear current limit is determined by a sense resistor connected between the VCC pin and the SENSE pin, as given by Equation 1.
I
LIMIT(NOM)
The minimum linear fault current is given by Equation 2.
I
LIMIT(MIN)
The maximum linear fault current is given by Equation 3.
I
LIMIT(MAX)
The power rating of the sense resistor should be rated at the maximum linear fault current level.
The minimum overcurrent fault timing threshold current is given by Equation 4.
= V
LIM(NOM)/RSENSE
= V
LIM(MIN)/RSENSE(MAX)
= V
LIM(MAX)/RSENSE(MIN)
= 100 mV/R
= 90 mV/R
= 110 mV/R
SENSE
SENSE(MAX)
SENSE(MIN)
(1)
(2)
(3)
A normal hot swap is complete when the board supply capaci­tors near full charge, and the current through the sense resistor drops to eventually reach the level of the board load current. As soon as the current drops below the overcurrent fault timing threshold, the current into the TIMER pin switches from being a 60 A pull-up to a 100 A pull-down. The ADM1175 then drives the GATE voltage as high as it can to fully enhance the FET and reduce R
losses to a minimum.
ON
A hot swap fails if the load current does not drop below the overcurrent fault timing threshold, V
, before the TIMER
OCTIM
pin has charged up to 1.3 V. In this case, the GATE pin is then pulled down with a 2 mA current sink. The GATE pull-down stays on until a hot swap retry starts, which can be forced by deasserting and then reasserting the ON/ONB pin. On the ADM1175-1 and ADM1175-3, the device retries automatically after a cool-down period.
The ADM1175 also features a method of protection from sudden load current surges, such as a low impedance fault, when the current seen across the sense resistor may go well beyond the linear current limit. If the fast overcurrent trip threshold, V
, is exceeded, the 2 mA GATE pull-down is
OCFAST
turned on immediately. This pulls the GATE voltage down quickly to enable the ADM1175 to limit the length of the current spike that gets through, and also to bring the current through the sense resistor back into linear regulation as quickly as possible. This process protects the backplane supply from sustained overcurrent conditions that can otherwise cause the backplane supply to droop during the overcurrent event.
I
OCTIM(MIN)
= V
OCTIM(MIN)/RSENSE(MAX)
= 85 mV/R
SENSE(MAX)
(4)
The maximum fast overcurrent trip threshold current is given by Equation 5.
I
OCFAST(MAX)
= V
OCFAST(MAX)/RSENSE(MIN)
= 115 mV/R
SENSE(MIN)
(5)
The fault current limit time is the time that a device spends timing an overcurrent fault, and is given by Equation 6.
t
FAULT
≈ 21.7 × C
ms/F (6)
TIMER
INITIAL TIMING CYCLE
When VCC is first connected to the backplane supply, the internal supply (Time Point (1) in must be charged up. A very short time later (significantly less than 1 ms), the internal supply is fully up and, because the undervoltage lockout voltage has been exceeded at VCC, the device comes out of reset. During this first short reset period, the GATE pin is held down with a 25 mA pull-down current, and the TIMER pin is pulled down with a 100 A current sink.
The ADM1175 then goes through an initial timing cycle. At Time Point (2), the TIMER pin is pulled high with 5 µA. At Time Point (3), the TIMER reaches the V the first portion of the initial cycle ends. The 100 µA current source then pulls down the TIMER pin until it reaches 0.2 V at Time Point (4). The initial cycle delay (Time Point (2) to Time Point (4)) is related to C
t
INITIAL
≈ 270 × C
ms/F (7)
TIMER
Figure 30) of the ADM1175
threshold, and
TIMERL
by Equation 7.
TIMER
Rev. 0 | Page 14 of 24
Page 15
ADM1175
V
When the initial timing cycle terminates, the device is ready to start a hot swap operation (assuming the ON/ONB pin is asserted). In the example shown in same time that V
CC
Figure 30, the ON pin is asserted at the
is applied, so the hot swap operation starts immediately after Time Point (4). At this point, the FET gate is charged up with a 12 A current source. At Time Point (5), the threshold voltage of the FET is reached, and the load current begins to flow. The FET is controlled to keep the sense voltage at 100 mV (this corresponds to a maximum load current level defined by the value of R V
have reached their full potential, and the load current has
OUT
settled to its nominal level. where the ON pin is asserted after V
(1)
(2) (3)(4) (5) (6)
V
VCC
V
ON
V
TIMER
V
GATE
). At Time Point (6), V
SENSE
GATE
Figure 31 illustrates the situation
is applied.
CC
and
(1) (2) (3)(4) (5)(6) (7)
V
VCC
V
ON
V
TIMER
V
GATE
V
SENSE
V
OUT
INITIAL TIMING
CYCLE
05647-005
Figure 31. Startup (ON Asserts After Power Is Applied)
HOT SWAP RETRY CYCLE ON THE ADM1175-1 AND THE ADM1175-3
With the ADM1175-1 and the ADM1175-3, the device turns off the FET after an overcurrent fault and then uses the TIMER pin to time a delay before automatically retrying to hot swap.
SENSE
As with all ADM1175 devices, on overcurrent fault is timed by charging the TIMER cap with a 60 A pull-up current. When the TIMER pin reaches 1.3 V, the fault current limit time has
V
OUT
been reached, and the GATE pin is pulled down. On the ADM1175-1 and the ADM1175-3, the TIMER pin is then
INITIAL TIMING
CYCLE
05647-004
Figure 30. Startup (ON Asserts as Power Is Applied)
pulled down with a 2 A current sink. When the TIMER pin reaches 0.2 V, it automatically restarts the hot swap operation.
The cool-down period is related to C
t
COOL
≈ 550 × C
ms/F (8)
TIMER
by Equation 8.
TIMER
Thus, the retry duty cycle is given by Equation 9.
/(t
+ t
t
FAULT
COOL
) × 100% = 3.8% (9)
FAULT
Rev. 0 | Page 15 of 24
Page 16
ADM1175
VOLTAGE AND CURRENT READBACK
In addition to providing hot swap functionality, the ADM1175 also contains the components to allow voltage and current readback over an Inter-IC (I
2
C) bus. The voltage output of the current sense amplifier and the voltage on the VCC pin are fed into a 12-bit ADC via a multiplexer. The device can be instructed to convert voltage and/or current at any time during operation via an I
2
C command or an assertion on the convert start (CONV) pin. When all conversions are complete, the voltage and/or current values can be read out to 12-bit accuracy in two or three bytes.
SERIAL BUS INTERFACE
Control of the ADM1175 is carried out via the I2C bus. This interface is compatible with I The ADM1175 is connected to this bus as a slave device, under the control of a master device.
2
C fast mode (400 kHz maximum).
IDENTIFYING THE ADM1175 ON THE I2C BUS
The ADM1175 has a 7-bit serial bus slave address. When the device powers up, it does so with a default serial bus address. The five MSBs of the address are set to 11010; the two LSBs are deter­mined by the state of the ADR pin. There are four different configurations available on the ADR pin that correspond to four
2
different I allows four ADM1175 devices to operate on a single I
Table 5. Setting I
ADR Configuration Address
Low State 0xD0 Resistor to GND 0xD2 Floating (Unconnected) 0xD4 High State 0xD6
C addresses for the two LSBs (see Table 5). This scheme
2
C bus.
2
C Addresses via the ADR Pin
GENERAL I2C TIMING
Figure 32 and Figure 33 show timing diagrams for general read and write operations using the I conditions for different types of read and write operations, which are discussed later. The general I
1. The master initiates data transfer by establishing a start
condition, defined as a high-to-low transition on the serial data line, SDA, while the serial clock line SCL remains high. This indicates that a data stream follows.
2
C. The I2C specification defines
2
C protocol operates as follows:
All slave peripherals connected to the serial bus respond to the start condition and shift in the next eight bits, consisting of a 7-bit slave address (MSB first), plus an
W
bit that determines the direction of the data transfer,
R/ that is, whether data is written to or read from the slave device (0 = write, 1 = read).
The peripheral whose address corresponds to the transmitted address responds by pulling the data line low during the low period before the ninth clock pulse, known as the acknowledge bit, and holding it low during the high period of this clock pulse. All other devices on the bus remain idle, while the selected device waits for data to be read from it or written to it. If the R/ slave device. If the R/
W
bit is 0, the master writes to the
W
bit is 1, the master reads from the
slave device.
2. Data is sent over the serial bus in sequences of nine clock
pulses: eight bits of data followed by an acknowledge bit from the slave device. Data transitions on the data line must occur during the low period of the clock signal and remain stable during the high period, because a low-to­high transition when the clock is high can be interpreted as a stop signal.
If the operation is a write operation, the first data byte after the slave address is a command byte. This tells the slave device what to expect next. It can be an instruction, such as telling the slave device to expect a block write; or it can be a register address that tells the slave where subse­quent data is to be written.
Because data can flow in only one direction, as defined by
W
the R/
bit, it is not possible to send a command to a slave device during a read operation. Before doing a read operation, it may first be necessary to do a write operation to tell the slave what sort of read operation to expect and/or the address from which data is to be read.
3. When all data bytes have been read or written, stop
conditions are established. In write mode, the master pulls the data line high during the 10th clock pulse to assert a stop condition. In read mode, the master device releases the SDA line during the low period before the ninth clock pulse, but the slave device does not pull it low. This is known as a no acknowledge. The master then takes the data line low during the low period before the 10th clock pulse, then high during the 10th clock pulse to assert a stop condition.
Rev. 0 | Page 16 of 24
Page 17
ADM1175
SCL
SDA
START BY MAST E R
SCL
(CONTINUED)
SDA
(CONTINUED)
SCL
SDA
START BY MAST E R
SCL
(CONTINUED)
SDA
(CONTINUED)
9
SLAVE
SLAVE
9
SLAVE
MASTER
1
D6
D7
9
2
C Write Timing Diagram
1
D7
9
2
C Read Timing Diagram
D5
1
D6
D5
1
D4
COMMAND CODE
D4
DATA BYTE
D3
FRAME 2
D3
FRAME 2
D2 D1
D2 D1
ACKNOWLEDGE BY
FRAME N
DATA BYTE
ACKNOWLEDGE BY
FRAME N
DATA BYTE
D0
SLAVE
D0
MASTER
1
0
0
11
FRAME 1
SLAVE ADDRESS
1
D7 D6 D5 D4 D3 D2 D1 D0 D7 D6 D5 D4 D3 D2 D1 D0
A1 A0 R/W
1
FRAME 3
DATA BYTE
ACKNOWLEDG E BY
ACKNOWLEDGE BY
Figure 32. General I
1
0
0
11
FRAME 1
SLAVE ADDRESS
1
D7 D6 D5 D4 D3 D2 D1 D0 D7 D6 D5 D4 D3 D2 D1 D0
A1 A0 R/W
1
FRAME 3
DATA BYTE
ACKNOWLEDG E BY
ACKNOWLEDGE BY
Figure 33. General I
9
9
ACKNOWLEDG E BY
SLAVE
9
9
NO ACKNOWLEDGE
STOP BY MASTER
STOP BY MASTER
05647-006
05647-007
t
SU;STA
t
HD;STA
t
SU;STO
P
05647-008
SCLSCL
SDA
t
LOW
t
HD;STA
t
BUF
S
P
t
R
t
HD;DAT
t
HIGH
t
F
t
SU;DAT
S
Figure 34. Serial Bus Timing Diagram
Rev. 0 | Page 17 of 24
Page 18
ADM1175
WRITE AND READ OPERATIONS
The I2C specification defines several protocols for different types of read and write operations. The operations used in the ADM1175 are discussed in the sections that follow.
Table 6 shows
the abbreviations used in the command diagrams.
Table 6. I
2
C Abbreviations
Abbreviation Condition
S Start P Stop R Read W Write A Acknowledge N No acknowledge
QUICK COMMAND
The quick command operation allows the master to check if the slave is present on the bus, as follows:
1. The master device asserts a start condition on SDA.
2. The master sends the 7-bit slave address, followed by the
write bit (low).
3. The addressed slave device asserts an acknowledge on SDA.
12 3
SLAVE
S
ADDRESS
Figure 35. Quick Command
WA
05647-009
WRITE COMMAND BYTE
In the write command byte operation the master device sends a command byte to the slave device, as follows:
1. The master device asserts a start condition on SDA.
2. The master sends the 7-bit slave address, followed by the
write bit (low).
3. The addressed slave device asserts an acknowledge on SDA.
4. The master sends the command byte. The command byte
is identified by an MSB = 0. An MSB = 1 indicates an extended register write (see the section).
5. The slave asserts an acknowledge on SDA.
6. The master asserts a stop condition on SDA to end the
transaction.
12 3456
SLAVE
S
ADDRESS
Figure 36. Write Command Byte
The seven LSBs of the command byte are used to configure and control the ADM1175.
Tabl e 7 provides details of the function
of each bit.
Write Extended Byte
COMMAND
WA
BYTE
AP
05647-010
Table 7. Command Byte Operations
Bit Default Name Function
C0 0 V_CONT
Set to convert voltage continuously. If readback is attempted before the first conversion is complete, the ADM1175 asserts an acknowledge and returns all 0s in the returned data.
C1 0 V_ONCE
Set to convert voltage once. Self-clears. I conversion is complete.
C2 0 I_CONT
Set to convert voltage continuously. If readback is attempted before the first conversion is complete, the ADM1175 asserts an acknowledge and returns all 0s in the returned data.
C3 0 I_ONCE
Set to convert current once. Self-clears. I conversion is complete.
C4 0 VRANGE
Selects different internal attenuation resistor networks for voltage readback. A 0 in C4 selects a 14:1 voltage divider. A 1 in C4 selects a 7:2 voltage divider. With an ADC full scale of 1.902 V, the voltage at the VCC pin for
an ADC full-scale result is 26.35 V for VRANGE = 0 and 6.65 V for VRANGE = 1. C5 0 N/A Unused. C6 0 STATUS_RD
Status read. When this bit is set, the data byte read back from the ADM1175 is the STATUS byte. It contains
the status of the device alerts. See
2
C asserts a no acknowledge on attempted reads until the ADC
2
C asserts a no acknowledge on attempted reads until ADC
Table 15 for full details of the STATUS byte.
Rev. 0 | Page 18 of 24
Page 19
ADM1175
WRITE EXTENDED BYTE
In the write extended byte operation, the master device writes to one of the three extended registers of the slave device, as follows:
1. The master device asserts a start condition on SDA.
2. The master sends the 7-bit slave address, followed by the
write bit (low).
3. The addressed slave device asserts an acknowledge on SDA.
7. The slave asserts an acknowledge on SDA.
8. The master asserts a stop condition on SDA to end the
transaction.
12 345678
S
ADDRESS
SLAVE
REGISTER
WA
ADDRESS
Figure 37. Write Extended Byte
REGISTER
A
DATA
AP
05647-011
4. The master sends the register address byte. The MSB of
this byte is set to 1 to indicate an extended register write. The two LSBs indicate which of the three extended registers are to be written to (see
Table 8 ). All other bits
should be set to 0.
5. The slave asserts an acknowledge on SDA.
6. The master sends the command byte. The command byte
is identified by an MSB = 0. An MSB = 1 indicates an
Tabl e 9, Ta b le 1 0, and Ta b le 1 1 give details of each extended register.
Table 8. Extended Register Addresses
A6 A5 A4 A3 A2 A1 A0 Extended Register
0 0 0 0 0 0 1 ALERT_EN 0 0 0 0 0 1 0 ALERT_TH 0 0 0 0 0 1 1 CONTROL
extended register write.
Table 9. ALERT_EN Register Operations
Bit Default Name Function
0 0 EN_ADC_OC1
Enabled if a single ADC conversion on the I channel has exceeded the threshold set in the ALERT_TH register.
1 0 EN_ADC_OC4
Enabled if four consecutive ADC conversions on the I channel have exceeded the threshold set in the ALERT_TH register.
2 1 EN_HS_ALERT
Enabled if the hot swap has either latched off or entered a cool-down cycle because of an overcurrent event.
3 0 EN_OFF_ALERT
Enables an alert if the HS operation is turned off by a transition that deasserts the ON/ONB pin or by an operation that writes the SWOFF bit high.
4 0 CLEAR
Clears the ON_ALERT, HS_ALERT and ADC_ALERT status bits in the STATUS register. These can immediately reset if the source of the alert has not been cleared or disabled with the other bits in this register. This bit self-clears to 0 after the STATUS register bits have been cleared.
Table 10. ALERT_TH Register Operations
Bit Default Function
7:0 FF
The ALERT_TH register sets the current level at which an alert occurs. Defaults to ADC full scale. The ALERT_TH 8-bit number corresponds to the top eight bits of the current channel data.
Table 11. CONTROL Register Operations
Bit Default Name Function
0 0 SWOFF Forces hot swap off. Equivalent to deasserting the ON/ONB pin.
Rev. 0 | Page 19 of 24
Page 20
ADM1175
READ VOLTAGE AND/OR CURRENT DATA BYTES
The ADM1175 can be set up to provide information in three different ways (see the
Write Command Byte section). Depending on how the device is configured, the following data can be read out of the device after a conversion (or conversions).
Voltage and Current Readback
The ADM1175 digitizes both voltage and current. Three bytes are read out of the device in the format shown in
Tabl e 12 .
Table 12. Voltage and Current Readback Format
Byte Contents B7 B6 B5 B4 B3 B2 B1 B0
1
Voltage
V11 V10 V9 V8 V7 V6 V5 V4
MSBs
2
Current
I11 I10 I9 I8 I7 I6 I5 I4
MSBs
3 LSBs V3 V2 V1 V0 I3 I2 I1 I0
Voltage Readback
The ADM1175 digitizes voltage only. Two bytes are read out of the device in the format shown in
Tabl e 13 .
Table 13. Voltage Only Readback Format
Byte Contents B7 B6 B5 B4 B3 B2 B1 B0
1 Voltage MSBs V11 V10 V9 V8 V7 V6 V5 V4 2 Voltage LSBs V3 V2 V1 V0 0 0 0 0
Current Readback
The ADM1175 digitizes current only. Two bytes are read out of the device in the format shown in
Tabl e 14 .
Table 14. Current Only Readback Format
Byte Contents B7 B6 B5 B4 B3 B2 B1 B0
1 Current MSBs I11 I10 I9 I8 I7 I6 I5 I4 2 Current LSBs I3 I2 I1 I0 0 0 0 0
The following series of events occurs when the master receives three bytes (voltage and current data) from the slave device:
1. The master device asserts a start condition on SDA.
2. The master sends the 7-bit slave address, followed by the
read bit (high).
3. The addressed slave device asserts an acknowledge on SDA.
4. The master receives the first data byte.
5. The master asserts acknowledge on SDA.
6. The master receives the second data byte.
7. The master asserts an acknowledge on SDA.
8. The master receives the third data byte.
9. The master asserts a no acknowledge on SDA.
10. The master asserts a stop condition on SDA, and the
transaction ends.
For cases where the master is reading voltage only or current only, only two data bytes are read. Step 7 and Step 8 are not required.
12 345678910
SLAVE
S
ADDRESS
12 345678
S
RA
DATA 1 DATA 2 NPDATA 3AA
Figure 38. Three-Byte Read from ADM1175
SLAVE
ADDRESS
Figure 39. Two-Byte Read from ADM1175
RA
REGISTER ADDRESS
REGISTER
A
DATA
NP
05647-012
05647-013
Converting ADC Codes to Voltage and Current Readings
The following equations can be used to convert ADC codes representing voltage and current from the ADM1175 12-bit ADC into actual voltage and current values.
Voltage = (V
FULLSCALE
/4096) × Code
where:
V
= 6.65 (7:2 range) or 26.35 (14:1 range).
FULLSCALE
Code is the ADC voltage code read from the device (Bit V0
to V11).
Current = ((I
/4096) × Code)/Sense Resistor
FULLSCALE
where:
FULLSCALE
= 105.84 mV.
I Code is the ADC current code read from the device (Bit I0
to Bit I11).
Read Status Register
A single register of status data can also be read from the ADM1175.
1. The master device asserts a start condition on SDA.
2. The master sends the 7-bit slave address followed by the read bit (high).
3. The addressed slave device asserts an acknowledge on SDA.
4. The master receives the status byte.
5. The master asserts an acknowledge on SDA.
12 345
SLAVE
S
ADDRESS
Figure 40. Status Read from ADM1175
RA
DATA 1 A
05647-014
Tabl e 15 shows the ADM1175 status registers in detail. Note that Bit 1, Bit 3, and Bit 5 are cleared by writing to Bit 4 of the ALERT_EN register (CLEAR).
Rev. 0 | Page 20 of 24
Page 21
ADM1175
Table 15. Status Byte Operations
Bit Name Function
0 ADC_OC An ADC-based overcurrent comparison has been detected on the last three conversions 1 ADC_ALERT
2 HS_OC
3 HS_ALERT The hot swap has failed since the last time this was reset. Cleared by writing to Bit 4 of the ALERT_EN register. 4 OFF_STATUS
5 OFF_ALERT
An ADC-based overcurrent trip has happened, which has caused the alert. Cleared by writing to Bit 4 of the ALERT_EN register.
The hot swap is off due to an analog overcurrent event. On parts that latch off, this is the same as the HS_ALERT status bit (if EN_HS_ALERT = 1). On the retry parts, this indicates the current state: a 0 can indicate that the data was read during a period when the device was retrying, or that it has successfully hot swapped by retrying after at least one overcurrent timeout.
The state of the ON/ONB pin. Set to 1 if the input pin is deasserted. Can also be set to 1 by writing to the SWOFF bit of the CONTROL register.
An alert has been caused by either the ON/ONB pin or the SWOFF bit. Cleared by writing to Bit 4 of the ALERT_EN register.
Rev. 0 | Page 21 of 24
Page 22
ADM1175
APPLICATIONS WAVEFORMS
1
2
3
4
CH1 1.5A CH2 1.00V CH3 20.0V CH4 10.0V
M40.0ms
Figure 41. Inrush Current Control into 220 μF Load
LOAD
, CH2 = V
(CH1 = I
1
2
3
4
TIMER
, CH3 = V
GATE
, CH4 = V
OUT
1
2
3
4
CH1 1.5A CH2 1.00V
05647-070
CH3 20.0V CH4 10.0V
M10.0ms
05647-073
Figure 44. Overcurrent Condition During Operation (ADM1175-1 Model)
)
(CH1 = I
1
2
3
4
LOAD
, CH2 = V
TIMER
, CH3 = V
GATE
, CH4 = V
OUT
)
CH1 1.5A CH2 1.00V CH3 20.0V CH4 10.0V
M10.0ms
Figure 42. Overcurrent Condition at Startup (ADM1175-1 Model)
(CH1 = I
LOAD
1
2
3
4
CH1 1.5A CH2 1.00V CH3 20.0V CH4 10.0V
, CH2 = V
TIMER
, CH3 = V
M20.0ms
GATE
, CH4 = V
Figure 43. Overcurrent Condition at Startup (ADM1175-2 Model)
(CH1 = I
LOAD
, CH2 = V
TIMER
, CH3 = V
GATE
, CH4 = V
OUT
OUT
CH1 1.5A CH2 1.00V
05647-071
CH3 20.0V CH4 10.0V
M20.0ms
05647-074
Figure 45. Overcurrent Condition During Operation (ADM1175-2 Model)
)
(CH1 = I
LOAD
, CH2 = V
TIMER
, CH3 = V
GATE
, CH4 = V
OUT
)
05647-072
)
Rev. 0 | Page 22 of 24
Page 23
ADM1175
KELVIN SENSE RESISTOR CONNECTION
When using a low value sense resistor for high current measurement, the problem of parasitic series resistance may arise. The lead resistance can be a substantial fraction of the rated resistance, making the total resistance a function of lead length. This problem can be avoided by using a Kelvin sense connection. This type of connection separates the current path through the resistor and the voltage drop across the resistor. Figure 46 shows the correct way to connect the sense resistor between the VCC pin and the SENSE pin of the ADM1175.
CURRENT FLOW FROM SUPPLY
KELVIN SENSE TRACES
SENSE RESISTOR
VCC SENSE
CURRENT FLOW TO LOAD
ADM1175
Figure 46. Kelvin Sense Connections
05647-015
Rev. 0 | Page 23 of 24
Page 24
ADM1175
OUTLINE DIMENSIONS
3.10
3.00
2.90
6
10
3.10
3.00
2.90
1
PIN 1
0.50 BSC
0.95
0.85
0.75
0.15
0.05
0.33
0.17
COPLANARITY
0.10
COMPLIANT TO JEDEC STANDARDS MO-187-BA
Figure 47. 10-Lead Mini Small Outline Package [MSOP]
ORDERING GUIDE
Model Hot Swap Retry Option ON/ONB Pin
ADM1175-1ARMZ-R71 Automatic Retry Version ON −40°C to +85°C 10-Lead MSOP RM-10 M5P ADM1175-2ARMZ-R71 Latched Off Version ON −40°C to +85°C 10-Lead MSOP RM-10 M5R ADM1175-3ARMZ-R71 Automatic Retry Version ONB −40°C to +85°C 10-Lead MSOP RM-10 M5S ADM1175-4ARMZ-R71 Latched Off Version ONB −40°C to +85°C 10-Lead MSOP RM-10 M5T EVAL-ADM1175EBZ1 Evaluation Board
1
Z = Pb-free part.
5.15
4.90
4.65
5
1.10 MAX
SEATING PLANE
0.23
0.08
8° 0°
(RM-10)
Dimensions shown in millimeters
Temperature Range
0.80
0.60
0.40
Package Description
Package Option Branding
Purchase of licensed I2C components of Analog Devices or one of its sublicensed Associated Companies conveys a license for the purchaser under the Philips I2C Patent Rights to use these components in an I2C system, provided that the system conforms to the I2C Standard Specification as defined by Philips.
©2006 Analog Devices, Inc. All rights reserved. Trademarks and registered trademarks are the property of their respective owners. D05647-0-9/06(0)
Rev. 0 | Page 24 of 24
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