Datasheet ADIS16367 Datasheet (ANALOG DEVICES)

A

A

Six Degrees of Freedom Inertial Sensor

FEATURES

Tri-axis digital gyroscope with digital range scaling

±300°/sec, ±600°/sec, ±1200°/sec settings

Tight orthogonal alignment: 0.05°
Tri-axis digital accelerometer: ±18 g
Autonomous operation and data collection

No external configuration commands required

Start-up time: 180 ms

Sleep mode recovery time: 4 ms
Factory-calibrated sensitivity, bias, and axial alignment

Calibration temperature range: −40°C to +85°C
SPI-compatible serial interface
Wide bandwidth: 330 Hz
Embedded temperature sensor
Programmable operation and control

Automatic and manual bias correction controls

Bartlett window, FIR filter length, number of taps

Digital I/O: data ready, alarm indicator, general-purpose

Alarms for condition monitoring

Sleep mode for power management

DAC output voltage

Enable external sample clock input: up to 1.2 kHz

Single-command self-test
Single-supply operation: 4.75 V to 5.25 V
2000 g shock survivability
Operating temperature range: −40°C to +105°C

APPLICATIONS

Medical instrumentation
Robotics
Platform controls
Navigation

FUNCTIONAL BLOCK DIAGRAM

TEMPERATURE

SENSOR

MEMS

ANGULAR RATE

SENSOR

TRI-AXIS MEMS

ACCELERATIO N

SENSOR

SELF-TEST

ADIS16367

Rev. A

Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Anal og Devices for its use, nor for any infringements of patents or ot her
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.

UX_

ADC

SIGNAL

CONDITIONI NG

AND

CONVERSIO N

CONTROL

RST

UX_

DAC

DIGI TAL

Figure 1.

ADIS16367

GENERAL DESCRIPTION

The ADIS16367 iSensor® is a complete inertial system that includes
a tri-axis gyroscope and tri-axis accelerometer. Each sensor in
the ADIS16367 combines industry-leading iMEMS® technology
with signal conditioning that optimizes dynamic performance.
The factory calibration characterizes each sensor for sensitivity,
bias, alignment, and linear acceleration (gyro bias). As a result, each
sensor has its own dynamic compensation formulas that provide
accurate sensor measurements over a temperature range of

−40°C to +85°C.

The ADIS16367 provides a simple, cost-effective method for
integrating accurate, multiaxis inertial sensing into industrial
systems, especially when compared with the complexity and
investment associated with discrete designs. All necessary motion
testing and calibration are part of the production process at the
factory, greatly reducing system integration time. Tight orthogonal
alignment simplifies inertial frame alignment in navigation
systems. An improved SPI interface and register structure provide
faster data collection and configuration control.

The ADIS16367 uses a compatible pinout and the same package
as the ADIS1635x family. Therefore, systems that currently use
the ADIS1635x family can upgrade their performance with minor
firmware adjustments in their processor designs.

This compact module is approximately 23 mm × 23 mm × 23 mm
and provides a flexible connector interface that enables multiple
mounting orientation options.

CALIBRATI ON

AND

DIGI TAL

PROCESSING

ALARMS

DIO4/

DIO3DIO2DIO1

CLKIN

One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: [phone] www.analog.com
Fax: [phone] ©2010–2011 Analog Devices, Inc. All rights reserved.

OUTPUT

REGISTERS

AND SPI

INTERFACE

POWER

MANAGEMENT

CS

SCLK

DIN

DOUT

VCC

GND

08398-001

ADIS16367

TABLE OF CONTENTS

Features.............................................................................................. 1

Applications....................................................................................... 1

General Description ......................................................................... 1

Functional Block Diagram .............................................................. 1

Revision History ............................................................................... 2

Specifications..................................................................................... 3

Timing Specifications .................................................................. 5

Timing Diagrams.......................................................................... 5

Absolute Maximum Ratings............................................................ 6

ESD Caution.................................................................................. 6

Pin Configuration and Function Descriptions............................. 7

Typical Performance Characteristics ............................................. 8

Theory of Operation ........................................................................ 9

Basic Operation ............................................................................ 9

Reading Sensor Data.................................................................... 9

Device Configuration .................................................................. 9

Memory Map .............................................................................. 10

Burst Read Data Collection ...................................................... 11

Output Data Registers ............................................................... 11

Calibration................................................................................... 12

Operational Control................................................................... 12

Input/Output Functions............................................................ 14

Diagnostics.................................................................................. 15

Product Identification................................................................ 16

Applications Information.............................................................. 17

Installation/Handling................................................................. 17

Gyroscope Bias Optimization................................................... 17

Input ADC Channel................................................................... 17

Interface Printed Circuit Board (PCB).................................... 17

Outline Dimensions....................................................................... 18

Ordering Guide .......................................................................... 18

REVISION HISTORY

2/11—Rev. 0 to Rev. A

Changes to Gyroscopes Misalignment and Accelerometers

Misalignment Test Conditions/Comments, Table 1 .................... 3

Changes to Table 30 and Table 31 ................................................ 16

1/10—Revision 0: Initial Version

Rev. A | Page 2 of 20

ADIS16367

SPECIFICATIONS

TA = 25°C, VCC = 5.0 V, angular rate = 0°/sec, dynamic range = ±300°/sec ± 1 g, unless otherwise noted.

Table 1.

Parameter Test Conditions/Comments Min Typ Max Unit

GYROSCOPES

Dynamic Range ±1200 ±1400 °/sec

Initial Sensitivity Dynamic range = ±1200°/sec 0.198 0.2 0.202 °/sec/LSB

Dynamic range = ±600°/sec 0.1 °/sec/LSB

Dynamic range = ±300°/sec 0.05 °/sec/LSB

Sensitivity Temperature Coefficient −40°C ≤ TA ≤ +85°C ±40 ppm/°C

Misalignment Axis-to-axis ±0.05 Degrees

Axis-to-frame (package) ±0.5 Degrees

Nonlinearity Best-fit straight line ±0.1 % of FS

Initial Bias Error ±1 σ ±3 °/sec

In-Run Bias Stability 1 σ, SMPL_PRD = 0x0001 0.013 °/sec

Angular Random Walk 1 σ, SMPL_PRD = 0x0001 2.0 °/√hr

Bias Temperature Coefficient −40°C ≤ TA ≤ +85°C ±0.01 °/sec/°C

Linear Acceleration Effect on Bias Any axis, 1 σ (MSC_CTRL[7] = 1) 0.075 °/sec/g

Bias Voltage Sensitivity VCC = 4.75 V to 5.25 V ±0.3 °/sec/V

Output Noise ±1200°/sec range, no filtering 0.8 °/sec rms

Rate Noise Density f = 25 Hz, ±1200°/sec range, no filtering 0.044 °/sec/√Hz rms

3 dB Bandwidth 330 Hz

Sensor Resonant Frequency 14.5 kHz

Self-Test Change in Output Response ±1200°/sec range setting ±170 ±350 ±625 LSB

ACCELEROMETERS Each axis

Dynamic Range ±18

Initial Sensitivity 3.285 3.33 3.38 mg/LSB

Sensitivity Temperature Coefficient −40°C ≤ TA ≤ +85°C ±50 ppm/°C

Misalignment Axis-to-axis 0.2 Degrees

Axis-to-frame (package) ±0.5 Degrees

Nonlinearity Best-fit straight line 0.1 % of FS

Initial Bias Error ±1 σ ±50 mg

In-Run Bias Stability 1 σ 0.2 mg

Velocity Random Walk 1 σ 0.2 m/sec/√hr

Bias Temperature Coefficient −40°C ≤ TA ≤ +85°C ±0.3 mg/°C

Bias Voltage Sensitivity VCC = 4.75 V to 5.25 V 2.5 mg/V

Output Noise No filtering 9 mg rms

Noise Density No filtering 0.5 mg/√Hz rms

3 dB Bandwidth 330 Hz

Sensor Resonant Frequency 5.5 kHz

Self-Test Change in Output Response X-axis and y-axis 59 151 LSB

TEMPERATURE SENSOR

Scale Factor Output = 0x0000 at 25°C (±5°C) 0.136 °C/LSB

ADC INPUT

Resolution 12 Bits

Integral Nonlinearity ±2 LSB

Differential Nonlinearity ±1 LSB

Offset Error ±4 LSB

Gain Error ±2 LSB

Input Range 0 3.3 V

Input Capacitance During acquisition 20 pF

g

Rev. A | Page 3 of 20

ADIS16367

Parameter Test Conditions/Comments Min Typ Max Unit

DAC OUTPUT 5 kΩ/100 pF to GND

Resolution 12 Bits
Relative Accuracy 101 LSB ≤ input code ≤ 4095 LSB ±4 LSB
Differential Nonlinearity ±1 LSB
Offset Error ±5 mV
Gain Error ±0.5 %
Output Range 0 3.3 V
Output Impedance 2 Ω
Output Settling Time 10 μs

LOGIC INPUTS1

Input High Voltage, VIH 2.0 V
Input Low Voltage, VIL 0.8 V

CS Wake-Up Pulse Width
Logic 1 Input Current, IIH V
Logic 0 Input Current, IIL V

All Pins Except RST
RST Pin

signal to wake up from sleep mode

CS
20 μs

= 3.3 V ±0.2 ±10 μA

IH

= 0 V

IL

40 60 μA
1 mA

Input Capacitance, CIN 10 pF

DIGITAL OUTPUTS1

Output High Voltage, VOH I
Output Low Voltage, VOL I

= 1.6 mA 2.4 V

SOURCE

= 1.6 mA 0.4 V

SINK

FLASH MEMORY Endurance2 10,000 Cycles

Data Retention3 T

= 85°C 20 Years

J

FUNCTIONAL TIMES4 Time until data is available

Power-On, Start-Up Time Normal mode, SMPL_PRD ≤ 0x09 180 ms
Low power mode, SMPL_PRD ≥ 0x0A 250 ms
Reset Recovery Time Normal mode, SMPL_PRD ≤ 0x09 60 ms
Low power mode, SMPL_PRD ≥ 0x0A 130 ms
Sleep Mode Recovery Time Normal mode, SMPL_PRD ≤ 0x09 4 ms
Low power mode, SMPL_PRD ≥ 0x0A 9 ms
Flash Memory Test Time Normal mode, SMPL_PRD ≤ 0x09 17 ms
Low power mode, SMPL_PRD ≥ 0x0A 90 ms
Automatic Self-Test Time SMPL_PRD = 0x0001 12 ms

CONVERSION RATE SMPL_PRD = 0x0001 to 0x00FF 0.413 819.2 SPS

Clock Accuracy ±3 %
Sync Input Clock5 0.8 1.2 kHz

POWER SUPPLY Operating voltage range, VCC 4.75 5.0 5.25 V

Power Supply Current Low power mode 24 mA
Normal mode 49 mA
Sleep mode 500 μA

1

The digital I/O signals are driven by an internal 3.3 V supply, and the inputs are 5 V tolerant.

2

Endurance is qualified as per JEDEC Standard 22, Method A117, and measured at −40°C, +25°C, +85°C, and +125°C.

3

The data retention lifetime equivalent is at a junction temperature (TJ) of 85°C as per JEDEC Standard 22, Method A117. Data retention lifetime decreases with junction

temperature.

4

These times do not include thermal settling and internal filter response times (330 Hz bandwidth), which may affect overall accuracy.

5

The sync input clock functions below the specified minimum value, at reduced performance levels.

0.55 V

Rev. A | Page 4 of 20

ADIS16367

TIMING SPECIFICATIONS

TA = 25°C, VCC = 5 V, unless otherwise noted.

Table 2.

Normal Mode

(SMPL_PRD ≤ 0x09)

Parameter Description Min1 Typ Max Mi n1 Typ Max Min1 Typ Max Unit

f

Serial clock 0.01 2.0 0.01 0.3 0.01 1.0 MHz

SCLK

t

Stall period between data 9 75 1/f

STALL

t

Read rate 40 100 μs

READRATE

tCS Chip select to clock edge 48.8 48.8 48.8 ns
t

DOUT valid after SCLK edge 100 100 100 ns

DAV

t

DIN setup time before SCLK rising edge 24.4 24.4 24.4 ns

DSU

t

DIN hold time after SCLK rising edge 48.8 48.8 48.8 ns

DHD

t

, t

SCLKR

SCLK rise/fall times 5 12.5 5 12.5 5 12.5 ns

SCLKF

tDR, tDF DOUT rise/fall times 5 12.5 5 12.5 5 12.5 ns
t

SFS

t

1

high after SCLK edge

CS
Input sync positive pulse width 5 5 μs

5 5 5 ns

tx Input sync low time 100 100 μs
t

2

t

3

1

Guaranteed by design and characterization, but not tested in production.

Input sync to data-ready output 600 600 μs
Input sync period 833 833 μs

Low Power Mode

(SMPL_PRD ≥ 0x0A) Burst Read

μs

SCLK

TIMING DIAGRAMS

CS

SCLK

DOUT

DIN

CS

SCLK

t

CS

1 2 3 4 5 6 15 16

t

DAV

MSB DB14

R/W A5A6 A4 A3 A2

DB13 DB12 DB10DB11 DB2 L SBDB1

t

DSU

t

DHD

D2

Figure 2. SPI Timing and Sequence

t

READRATE

t

STALL

Figure 3. Stall Time and Data Rate

t

3

t

2

t

X

SYNC

CLOCK (DIO 4)

DATA

READY

t

1

Figure 4. Input Clock Timing Diagram

Rev. A | Page 5 of 20

D1 LSB

08398-004

t

SFS

08398-002

08398-003

ADIS16367

ABSOLUTE MAXIMUM RATINGS

Table 3.

Parameter Rating

Acceleration

Any Axis, Unpowered 2000 g

Any Axis, Powered 2000 g
VCC to GND −0.3 V to +6.0 V
Digital Input Voltage to GND −0.3 V to +5.3 V
Digital Output Voltage to GND −0.3 V to VCC + 0.3 V
Analog Input to GND −0.3 V to +3.6 V
Operating Temperature Range −40°C to +105°C
Storage Temperature Range −65°C to +125°C

1

Extended exposure to temperatures outside the specified temperature

range of −40°C to +105°C can adversely affect the accuracy of the factory
calibration. For best accuracy, store the parts within the specified operating
range of −40°C to +105°C.

2

Although the device is capable of withstanding short-term exposure to

150°C, long-term exposure threatens internal mechanical integrity.

1, 2

Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.

Table 4. Package Characteristics

Package Type θJA θ

24-Lead Module (ML-24-2) 39.8°C/W 14.2°C/W 16 grams

ESD CAUTION

Device

JC

Weight

Rev. A | Page 6 of 20

ADIS16367

PIN CONFIGURATION AND FUNCTION DESCRIPTIONS

DIO3

SCLK

DIN

DIO1

DIO2

VCC

GND

GND

DNC

DNC

AUX_ADC

DNC

1

23456789101112131415161718192021222324

CS

RST

VCC

VCC

DNC

DNC

DNC

AUX_DAC

DNC

08398-005

DOUT

DIO4/CLKIN

NOTES

1. THIS REPRESENTATION DISPLAYS THE TOP VIEW PINOUT
FOR THE MATI NG SOCKET CONNECTOR.

2. THE ACTUAL CONNECTOR PINS ARE NOT VISIBLE FROM THE TOP VIEW.

3. MATING CONNECTOR: SAMTEC CLM-112-02 OR EQUI VALENT.

4. DNC = DO NOT CONNECT.

GND

ADIS16367

TOP VIEW

(Not to Scale)

Figure 5. Pin Configuration

Z-AXIS

a

Z

g

Z

Y-AXIS

a

Y

g

Y

PIN 23

PIN 1

NOTES

1. ACCELERATI ON (
INDICATE THE DIRECTION OF MOT ION THAT P RODUCES
A POSITIVE OUTPUT.

ORIGIN ALIGNMENT REFERENCE POINT
SEE MSC_CTRL[ 6].

a

,

a

,

a

) AND ROTATIO NAL (

X

Y

Z

g

,

g

,

g

) ARROWS

X

Y

Z

X-AXIS

a

X

g

X

08398-006

Figure 6. Axial Orientation

Table 5. Pin Function Descriptions

Pin No. Mnemonic Type1 Description

1 DIO3 I/O Configurable Digital Input/Output.
2 DIO4/CLKIN I/O Configurable Digital Input/Output or Sync Clock Input.
3 SCLK I SPI Serial Clock.
4 DOUT O SPI Data Output. Clocks output on SCLK falling edge.
5 DIN I SPI Data Input. Clocks input on SCLK rising edge.
6

CS

I SPI Chip Select.

7, 9 DIO1, DIO2 I/O Configurable Digital Input/Output.
8

RST

I Reset.

10, 11, 12 VCC S Power Supply.
13, 14, 15 GND S Power Ground.
16, 17, 18, 19, 22, 23, 24 DNC N/A Do Not Connect.
20 AUX_DAC O Auxiliary, 12-Bit DAC Output.
21 AUX_ADC I Auxiliary, 12-Bit ADC Input.

1

I/O is input/output, I is input, O is output, S is supply, and N/A is not applicable.

Rev. A | Page 7 of 20

ADIS16367

A

TYPICAL PERFORMANCE CHARACTERISTICS

0.1

0.01

+1σ

MEAN

–1σ

)

g

0.01

0.001

LLAN VARIANCE (°/sec)

ROOT

0.001

0.1 1 10 100 1k 10k

Tau (Seconds)

Figure 7. Gyroscope Allan Variance

ROOT ALL AN VARIANCE (

0.0001

0.1 1 10 100 1k 10k

08398-007

Tau (S econds)

Figure 8. Accelerometer Allan Variance

+1σ

–1σ

MEAN

08398-008

Rev. A | Page 8 of 20

ADIS16367

THEORY OF OPERATION

BASIC OPERATION

The ADIS16367 is an autonomous sensor system that starts up
after it has a valid power supply voltage and begins producing
inertial measurement data at the factory default sample rate
setting of 819.2 SPS. After each sample cycle, the sensor data is
loaded into the output registers, and DIO1 pulses high, which
provides a new data-ready control signal for driving system­level interrupt service routines. In a typical system, a master
processor accesses the output data registers through the SPI
interface, using the connection diagram shown in Figure 9.
Tabl e 6 provides a generic functional description for each pin
on the master processor. Ta b le 7 describes the typical master
processor settings that are normally found in a configuration
register and used for communicating with the ADIS16367.

I/O LI NES ARE COMPATI BLE WIT H

3.3V OR 5V LOGIC LEVELS

VDD

SYSTEM
PROCESSOR
SPI MASTER

SS

SCLK

MOSI

MISO

IRQ DIO1

6

3

5

4

7

Figure 9. Electrical Connection Diagram

Table 6. Generic Master Processor Pin Names and Functions

Pin Name Function

SS

Slave select

SCLK Serial clock
MOSI Master output, slave input
MISO Master input, slave output
IRQ Interrupt request

Table 7. Generic Master Processor SPI Settings

Processor Setting Description

Master The ADIS16367 operates as a slave
SCLK Rate ≤ 2 MHz1 Normal mode, SMPL_PRD[7:0] ≤ 0x09
SPI Mode 3 CPOL = 1 (polarity), CPHA = 1 (phase)
MSB First Mode Bit sequence
16-Bit Mode Shift register/data length

1

For burst read, SCLK rate ≤ 1 MHz. For low power mode, SCLK rate ≤ 300 kHz.

CS

SCLK

DIN

DOUT

NOTES

1. THE DOUT BIT PATT ERN REFLECT S THE ENTI RE CONTENT S OF T HE REGIST ER IDENTIFIED BY [A6:A0] AND [R/W = 0]
IN THE PREVIOUS SEQUENCE.

2. IF R/W = 1 DURING T HE PREVIOUS SEQUENCE, DOUT IS NO T DEFINED.

R/W

A6 A5 A4 A3 A2 A1 A0 DC7 DC6 DC5 DC4 DC3 DC2 DC1 DC0

D14

D15

10

CS

SCLK

DIN

DOUT

13 14 15

5V

11 12

ADIS16367

SPI SLAVE

08398-009

Figure 11. SPI Communication Bit Sequence

Rev. A | Page 9 of 20

The user registers provide addressing for all input/output
operations on the SPI interface. Each 16-bit register has two
7-bit addresses: one for its upper byte and one for its lower byte.
Tabl e 8 lists the lower byte address for each register, and Figure 10
shows the generic bit assignments.

15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0

UPPER BYTE

LOWER BYTE

Figure 10. Generic Register Bit Assignments

READING SENSOR DATA

Although the ADIS16367 produces data independently, it
operates as a SPI slave device that communicates with system
(master) processors using the 16-bit segments displayed in
Figure 11. Individual register reads require two of these 16-bit
sequences. The first 16-bit sequence contains the read command

R

bit (

/W = 0) and the target register address (A6 to A0); the last
eight bits are “don’t care” bits when requesting a read. The second
16-bit sequence transmits the register contents (D15 to D0) on
the DOUT line. For example, if DIN = 0x0A00, the contents of
XACCL_OUT are shifted out on the DOUT line during the
next 16-bit sequence.

The SPI operates in full-duplex mode, which means that the master
processor can read the output data from DOUT while using the
same SCLK pulses to transmit the next target address on DIN.

DEVICE CONFIGURATION

The user register memory map (see Tabl e 8) identifies
configuration registers with either a W or R/W. Configuration
commands also use the bit sequence shown in Figure 11. If the
MSB = 1, the last eight bits (DC7 to DC0) in the DIN sequence
are loaded into the memory address associated with the address
bits (A6 to A0). For example, if DIN = 0xA11F, 0x1F is loaded
into Address 0x21 (XACCL_OFF, upper byte) at the conclusion
of the data frame.

The master processor initiates the backup function by setting
GLOB_CMD[3] = 1 (DIN = 0xBE04). This command copies
the user registers into their assigned flash memory locations
and requires the power supply to stay within its normal operating
range for the entire 50 ms process. The FLASH_CNT register
provides a running count of these events for monitoring the
long-term reliability of the flash memory.

R/W

A6 A5

D0D1D2D3D4D5D6D7D8D9D10D11D12D13

D13D14D15

08398-011

08398-010

ADIS16367

MEMORY MAP

Table 8. User Register Memory Map

Name User Access Flash Backup Address1 Default Register Description Bit Function

FLASH_CNT Read only Yes 0x00 N/A Flash memory write count N/A
SUPPLY_OUT Read only No 0x02 N/A Power supply measurement See Table 9
XGYRO_OUT Read only No 0x04 N/A X-axis gyroscope output See Table 9
YGYRO_OUT Read only No 0x06 N/A Y-axis gyroscope output See Table 9
ZGYRO_OUT Read only No 0x08 N/A Z-axis gyroscope output See Table 9
XACCL_OUT Read only No 0x0A N/A X-axis accelerometer output See Table 9
YACCL_OUT Read only No 0x0C N/A Y-axis accelerometer output See Table 9
ZACCL_OUT Read only No 0x0E N/A Z-axis accelerometer output See Table 9
XTEMP_OUT Read only No 0x10 N/A X-axis gyroscope temperature output See Table 9
YTEMP_OUT Read only No 0x12 N/A Y-axis gyroscope temperature output See Table 9
ZTEMP_OUT Read only No 0x14 N/A Z-axis gyroscope temperature output See Table 9
AUX_ADC Read only No 0x16 N/A Auxiliary ADC output See Table 9
Reserved N/A N/A 0x18 N/A Reserved N/A
XGYRO_OFF Read/write Yes 0x1A 0x0000 X-axis gyroscope bias offset factor See Table 15
YGYRO_OFF Read/write Yes 0x1C 0x0000 Y-axis gyroscope bias offset factor See Table 15
ZGYRO_OFF Read/write Yes 0x1E 0x0000 Z-axis gyroscope bias offset factor See Table 15
XACCL_OFF Read/write Yes 0x20 0x0000 X-axis acceleration bias offset factor See Table 16
YACCL_OFF Read/write Yes 0x22 0x0000 Y-axis acceleration bias offset factor See Table 16
ZACCL_OFF Read/write Yes 0x24 0x0000 Z-axis acceleration bias offset factor See Table 16
ALM_MAG1 Read/write Yes 0x26 0x0000 Alarm 1 amplitude threshold See Table 27
ALM_MAG2 Read/write Yes 0x28 0x0000 Alarm 2 amplitude threshold See Table 27
ALM_SMPL1 Read/write Yes 0x2A 0x0000 Alarm 1 sample size See Table 28
ALM_SMPL2 Read/write Yes 0x2C 0x0000 Alarm 2 sample size See Table 28
ALM_CTRL Read/write Yes 0x2E 0x0000 Alarm control See Table 29
AUX_DAC Read/write No 0x30 0x0000 Auxiliary DAC data See Table 23
GPIO_CTRL Read/write No 0x32 0x0000 Auxiliary digital input/output control See Table 21
MSC_CTRL Read/write Yes 0x34 0x0006 Data-ready, self-test, miscellaneous See Table 22
SMPL_PRD Read/write Yes 0x36 0x0001 Internal sample period (rate) control See Table 18
SENS_AVG Read/write Yes 0x38 0x0402 Dynamic range and digital filter control See Table 20
SLP_CNT Write only No 0x3A 0x0000 Sleep mode control See Table 19
DIAG_STAT Read only No 0x3C 0x0000 System status See Table 26
GLOB_CMD Write only N/A 0x3E 0x0000 System command See Table 17
Reserved N/A N/A 0x40 to 0x51 N/A Reserved N/A
LOT_ID1 Read only Yes 0x52 N/A Lot Identification Code 1 See Table 32
LOT_ID2 Read only Yes 0x54 N/A Lot Identification Code 2 See Table 32
PROD_ID Read only Yes 0x56 0x3FEF Product identification See Table 32
SERIAL_NUM Read only Yes 0x58 N/A Serial number See Table 32

1

Each register contains two bytes. The address of the lower byte is displayed. The address of the upper byte is equal to the address of the lower byte plus 1.

Rev. A | Page 10 of 20

ADIS16367

BURST READ DATA COLLECTION

Burst read data collection is a process-efficient method for
collecting data from the ADIS16367. In the burst read, all
output registers are clocked out on DOUT, 16 bits at a time, in
sequential data cycles (each separated by one SCLK period). To
start a burst read sequence, set DIN = 0x3E00. The contents of
each output register are then shifted out on DOUT, starting
with SUPPLY_OUT and ending with AUX_ADC (see Figure 13)
according to their address (see Table 8 ).

OUTPUT DATA REGISTERS

Each output data register uses the format in Figure 12 and Tabl e 9 .
Figure 6 shows the positive direction for each inertial sensor. The
ND bit is equal to 1 when the register contains unread data. The EA
bit is high when any error/alarm flag in the DIAG_STAT register is
equal to 1.

MSB FOR 14-BIT OUTPUT

ND EA

MSB FOR 12-BIT OUTPUT

Figure 12. Output Data Register Bit Assignments

Table 9. Output Data Register Formats

Register Bits Scale Reference

SUPPLY_OUT 12 2.418 mV See Table 10
XGYRO_OUT1 14 0.2°/sec See Table 11
YGYRO_OUT1 14 0.2°/sec See Table 11
ZGYRO_OUT1 14 0.2°/sec See Table 11
XACCL_OUT 14 3.333 mg See Table 12
YACCL_OUT 14 3.333 mg See Table 12
ZACCL_OUT 14 3.333 mg See Table 12
XTEMP_OUT2 12 0.136°C See Table 13
YTEMP_OUT2 12 0.136°C See Table 13
ZTEMP_OUT2 12 0.136°C See Table 13
AUX_ADC 12 805.8 μV See Table 14

1

Assumes that the scaling is set to ±1200°/sec. This factor scales with the range.

2

0x0000 = 25°C (±5°C).

Table 10. Power Supply, Offset Binary Format

Supply Voltage Decimal Hex Binary

5.25 V 2171 LSB 0x87B XXXX 1000 0111 1011

5.002418 V 2069 LSB 0x815 XXXX 1000 0001 0101
5 V 2068 LSB 0x814 XXXX 1000 0001 0100

4.997582 V 2067 LSB 0x813 XXXX 1000 0001 0011

4.75 V 1964 LSB 0x7AC XXXX 0111 1010 1100

123 12

8398-013

Table 11. Rotation Rate, Twos Complement Format

Rotation Rate Decimal Hex Binary

+1200°/sec +6000 LSB 0x1770 XX01 0111 0111 0000
+0.4°/sec +2 LSB 0x0002 XX00 0000 0000 0010
+0.2°/sec +1 LSB 0x0001
0°/sec 0 LSB 0x0000

−0.2°/sec −1 LSB 0x3FFF

−0.4°/sec −2 LSB 0x3FFE

XX00 0000 0000 0001
XX00 0000 0000 0000
XX11 1111 1111 1111
XX11 1111 1111 1110

−1200°/sec −6000 LSB 0x2890 XX10 1000 1001 0000

Table 12. Acceleration, Twos Complement Format

Acceleration Decimal Hex Binary

+18 g +5401 LSB 0x1519 XX01 0101 0001 1001
+6.667 mg +2 LSB 0x0002 XX00 0000 0000 0010
+3.333 mg +1 LSB 0x0001
0 g 0 LSB 0x0000

−3.333 mg −1 LSB 0x3FFF

−6.667 mg −2 LSB 0x3FFE

XX00 0000 0000 0001
XX00 0000 0000 0000
XX11 1111 1111 1111
XX11 1111 1111 1110

−18 g −5401 LSB 0x2AE7 XX10 1010 1110 0111

Table 13. Temperature, Twos Complement Format

Temperature Decimal Hex Binary

+105°C +588 LSB 0x24C XXXX 0010 0100 1100
+85°C +441 LSB 0x1B9 XXXX 0001 1011 1001
+25.272°C +2 LSB 0x002
+25.136°C +1 LSB 0x001
+25°C 0 LSB 0x000
+24.864°C −1 LSB 0xFFF
+24.728°C −2 LSB 0xFFE

XXXX 0000 0000 0010
XXXX 0000 0000 0001
XXXX 0000 0000 0000
XXXX 1111 1111 1111
XXXX 1111 1111 1110

−40°C −478 LSB 0xE22 XXXX 1110 0010 0010

Table 14. Analog Input, Offset Binary Format

Input Voltage Decimal Hex Binary

3.3 V 4095 LSB 0xFFF XXXX 1111 1111 1111
1 V 1241 LSB 0x4D9 XXXX 0100 1101 1001

1.6116 mV 2 LSB 0x002

805.8 μV 1 LSB 0x001

XXXX 0000 0000 0010
XXXX 0000 0000 0001

0 V 0 LSB 0x000 XXXX 0000 0000 0000

45CS

SCLK

DIN

DOUT

NOTES

1. THE DOUT LINE HAS BEEN SI MPLIF IED FOR SPACE CONSTRAINT S BUT, IDEALLY, S HOULD INCLUDE ALL REGI STERS FRO M SUPPLY_O UT
THROUGH AUX_ADC.

0x3E00

PREVIOUS

DON’T CARE

SUPPLY_OUT XGYRO_OUT

Figure 13. Burst Read Sequence

Rev. A | Page 11 of 20

YGYRO_OUT ZGYRO_OUT

AUX_ADC

08398-012

ADIS16367

CALIBRATION

Manual Bias Calibration

The bias offset registers in Tabl e 15 and Tabl e 1 6 provide a
manual adjustment function for the output of each sensor. For
example, if XGYRO_OFF = 0x1FF6 (DIN = 0x9B1F, 0x9AF6),
the XGYRO_OUT offset shifts by −10 LSBs, or −0.5°/sec.

Table 15. XGYRO_OFF, YGYRO_OFF, ZGYRO_OFF
Bit Descriptions

Bit Description (Default = 0x0000)

[15:13] Not used.
[12:0]

Table 16. XACCL_OFF, YACCL_OFF, ZACCL_OFF
Bit Descriptions

Bit Description (Default = 0x0000)

[15:12] Not used.
[11:0]

Gyroscope Automatic Bias Null Calibration

Set GLOB_CMD[0] = 1 (DIN = 0xBE01) to execute the automatic
bias null calibration function. This function measures all three
gyroscope output registers and then loads each gyroscope offset
register with the opposite value to provide a quick bias calibration.
All sensor data is then reset to 0, and the flash memory is
updated automatically within 50 ms (see Tabl e 17 ).

Gyroscope Precision Automatic Bias Null Calibration

Set GLOB_CMD[4] = 1 (DIN = 0xBE10) to execute the precision
automatic bias null calibration function. This function takes the
sensor offline for 30 sec while it collects a set of data and calculates
more accurate bias correction factors for each gyroscope. After
this function is executed, the newly calculated correction factor
is loaded into the gyroscope offset registers, all sensor data is
reset to 0, and the flash memory is updated automatically within
50 ms (see Tabl e 1 7 ).

Data bits. Twos complement, 0.05°/sec per LSB.
Typical adjustment range = ±200°/sec.

Data bits. Twos complement, 3.333 mg/LSB.
Typical adjustment range = ±6.75 g.

Restoring Factory Calibration

Set GLOB_CMD[1] = 1 (DIN = 0xBE02) to execute the factory
calibration restore function. This function resets each user
calibration register to 0x0000 (see Tab l e 1 5 and Tab l e 1 6 ), resets
all sensor data to 0, and automatically updates the flash memory
within 50 ms (see Table 1 7).

Linear Acceleration Bias Compensation (Gyroscope)

Set MSC_CTRL[7] = 1 (DIN = 0xB486) to enable correction for
low frequency acceleration influences on gyroscope bias. The
DIN sequence also preserves the factory default condition for
the data-ready function (see Tabl e 22 ).

OPERATIONAL CONTROL

Global Commands

The GLOB_CMD register provides trigger bits for several useful
functions. Setting the assigned bit to 1 starts each operation,
which returns the bit to 0 after completion. For example, set
GLOB_CMD[7] = 1 (DIN = 0xBE80) to execute a software reset,
which stops the sensor operation and runs the device through
its start-up sequence. This sequence includes loading the control
registers with the data in their respective flash memory locations
prior to producing new data. Reading the GLOB_CMD register
(DIN = 0x3E00) starts the burst read sequence.

Table 17. GLOB_CMD Bit Descriptions

Bits Description

[15:8] Not used
[7] Software reset command
[6:5] Not used
[4] Precision autonull command
[3]

[2] Auxiliary DAC data latch (see Table 24)
[1] Factory calibration restore command
[0] Autonull command

Flash update command (see the Device Configuration
section)

Rev. A | Page 12 of 20

ADIS16367

Internal Sample Rate

The SMPL_PRD register provides discrete sample rate settings
using the bit assignments in Tabl e 18 and the following equation:

t

= tB × (NS + 1)

S

For example, when SMPL_PRD[7:0] = 0x0A, the sample rate is
149 SPS.

Table 18. SMPL_PRD Bit Descriptions

Bits Description (Default = 0x0001)

[15:8] Not used
[7] Time base (tB)
0 = 0.61035 ms, 1 = 18.921 ms
[6:0] Increment setting (NS)
Internal sample period = tS = tB × (NS + 1)

The default sample rate setting of 819.2 SPS preserves the sensor
bandwidth and provides optimal performance. For systems that
value slower sample rates, keep the internal sample rate at

819.2 SPS. Use the programmable filter (SENS_AVG) to reduce
the bandwidth, which helps to prevent aliasing. The data-ready
function (MSC_CTRL) can drive an interrupt routine that uses
a counter to help ensure data coherence at the reduced rates.

Power Management

Setting SMPL_PRD ≥ 0x0A also sets the sensor to low power
mode. For systems that require lower power dissipation, in­system characterization helps users to quantify the associated
performance trade-offs. In addition to sensor performance, this
mode affects SPI data rates (see Tab l e 2 ). Set SLP_CNT[8] = 1
(DIN = 0xBB01) to start the indefinite sleep mode, which requires

CS

a

assertion (high to low), reset, or power cycle to wake up.
Use SLP_CNT[7:0] to put the device into sleep mode for a
specified period. For example, SLP_CNT[7:0] = 0x64
(DIN = 0xBA64) puts the ADIS16367 to sleep for 50 sec.

Digital Filtering

The N blocks in Figure 14 are part of the programmable low-pass
filter, which provides additional noise reduction on the inertial
sensor outputs. This filter contains two cascaded averaging filters
that provide a Bartlett window, FIR filter response (see Figure 15).
For example, set SENS_AVG[2:0] = 100 (DIN = 0xB804) to set
each stage to 16 taps. When used with the default sample rate
of 819.2 SPS, this value reduces the sensor bandwidth to
approximately 16 Hz.

0

–20

–40

–60

–80

MAGNITUDE (dB)

–100

N = 2

–120

–140

N = 4
N = 16
N = 64

0.001 0.01 0.1 1

Figure 15. Bartlett Window, FIR Filter Frequency Response

FREQUENCY (Rat io)

(Phase Delay = N Samples)

08398-015

Dynamic Range

The SENS_AVG[10:8] bits provide three dynamic range settings
for this gyroscope. The lower dynamic range settings (±300°/sec
and ±600°/sec) limit the minimum filter tap sizes to maintain
resolution. For example, set SENS_AVG[10:8] = 010 (DIN =
0xB902) for a measurement range of ±600°/sec. Because this
setting can influence the filter settings, program SENS_AVG[10:8]
and then SENS_AVG[2:0] if more filtering is required.

Table 19. SLP_CNT Bit Descriptions

Bits Description

[15:9] Not used
[8] Indefinite sleep mode; set to 1
[7:0] Programmable sleep time bits, 0.5 sec/LSB

Sensor Bandwidth

The signal chain for each MEMS sensor has several filter stages,
which shape their frequency response. Figure 14 provides a
block diagram for both gyroscope and accelerometer signal
paths. Tab l e 2 0 provides additional information for digital filter
configuration.

FROM

GYROSCOPE

SENSOR

ACCELERATION

LPF LPF

404Hz

FROM

SENSOR

Figure 14. MEMS Analog and Digital Filters

757Hz

LPF

330Hz

N N

N N

m

N = 2
m = SENS_AVG[2:0]

Rev. A | Page 13 of 20

Table 20. SENS_AVG Bit Descriptions

Bits Description (Default = 0x0402)

[15:11] Not used
[10:8] Measurement range (sensitivity) selection
100 = ±1200°/sec (default condition)
010 = ±600°/sec, filter taps ≥ 4 (Bits[2:0] ≥ 0x02)
001 = ±300°/sec, filter taps ≥ 16 (Bits[2:0] ≥ 0x04)
[7:3]
[2:0] Number of taps in each stage; value of m in N = 2

08398-022

Not used

m

ADIS16367

INPUT/OUTPUT FUNCTIONS

General-Purpose I/O

DIO1, DIO2, DIO3, and DIO4 are configurable, general-purpose
I/O lines that serve multiple purposes according to the following
control register priority: MSC_CTRL, ALM_CTRL, and
GPIO_CTRL. For example, set GPIO_CTRL = 0x080C
(DIN = 0xB308, and then 0xB20C) to configure DIO1 and
DIO2 as inputs and DIO3 and DIO4 as outputs, with DIO3
set low and DIO4 set high.

In this configuration, read GPIO_CTRL (DIN = 0x3200). The
digital state of DIO1 and DIO2 is in GPIO_CTRL[9:8].

Table 21. GPIO_CTRL Bit Descriptions

Bits Description (Default = 0x0000)

[15:12] Not used
[11] General-Purpose I/O Line 4 (DIO4) data level
[10] General-Purpose I/O Line 3 (DIO3) data level
[9] General-Purpose I/O Line 2 (DIO2) data level
[8] General-Purpose I/O Line 1 (DIO1) data level
[7:4] Not used
[3]

[2]

[1]

[0]

Input Clock Configuration

The input clock function allows for external control sampling in
the ADIS16367. Set GPIO_CTRL[3] = 0 (DIN = 0xB200) and
SMPL_PRD[7:0] = 0x00 (DIN = 0xB600) to enable this
function. See Tab l e 2 and Figure 4 for timing information.

Data Ready I/O Indicator

The factory default sets DIO1 as a positive data-ready indicator
signal. The MSC_CTRL[2:0] bits provide configuration options
for changing the default. For example, set MSC_CTRL[2:0] =
100 (DIN = 0xB404) to change the polarity of the data ready
signal on DIO1 for interrupt inputs that require negative logic
inputs for activation. The pulse width is between 100 μs and
200 μs over all conditions.

General-Purpose I/O Line 4 (DIO4) direction control
(1 = output, 0 = input)

General-Purpose I/O Line 3 (DIO3) direction control
(1 = output, 0 = input)

General-Purpose I/O Line 2 (DIO2) direction control
(1 = output, 0 = input)

General-Purpose I/O Line 1 (DIO1) direction control
(1 = output, 0 = input)

Table 22. MSC_CTRL Bit Descriptions

Bits Description (Default = 0x0006)

[15:12] Not used
[11]

[10]

[9]

[8]

[7]

[6]

[5:3] Not used
[2] Data-ready enable (1 = enabled, 0 = disabled)
[1] Data-ready polarity (1 = active high, 0 = active low)
[0] Data-ready line select (1 = DIO2, 0 = DIO1)

Memory test (cleared upon completion)
(1 = enabled, 0 = disabled)

Internal self-test enable (cleared upon completion)
(1 = enabled, 0 = disabled)

Manual self-test, negative stimulus
(1 = enabled, 0 = disabled)

Manual self-test, positive stimulus
(1 = enabled, 0 = disabled)

Linear acceleration bias compensation for gyroscopes
(1 = enabled, 0 = disabled)

Linear accelerometer origin alignment
(1 = enabled, 0 = disabled)

Auxiliary DAC

The 12-bit AUX_DAC line can drive its output to within 5 mV
of the ground reference when it is not sinking current. As the
output approaches 0 V, the linearity begins to degrade (~100 LSB
starting point). As the sink current increases, the nonlinear range
increases. The DAC latch command moves the values of the
AUX_DAC register into the DAC input register, enabling both
bytes to take effect at the same time.

Table 23. AUX_DAC Bit Descriptions

Bits Description (Default = 0x0000)

[15:12] Not used
[11:0] Data bits, scale factor = 0.8059 mV/LSB
Offset binary format, 0 V = 0 LSB

Table 24. Setting AUX_DAC = 1 V

DIN Description

0xB0D9 AUX_DAC[7:0] = 0xD9 (217 LSB)
0xB104 AUX_DAC[15:8] = 0x04 (1024 LSB)
0xBE04

GLOB_CMD[2] = 1; move values into the DAC input
register, resulting in a 1 V output level

Rev. A | Page 14 of 20

ADIS16367

DIAGNOSTICS

Self-Test

The self-test function allows the user to verify the mechanical
integrity of each MEMS sensor. It applies an electrostatic force to
each sensor element, which results in mechanical displacement that
simulates a response to actual motion. Tab le 1 lists the expected
response for each sensor, which provides pass/fail criteria.

Set MSC_CTRL[10] = 1 (DIN = 0xB504) to run the internal
self-test routine, which exercises all inertial sensors, measures
each response, makes pass/fail decisions, and reports them to
error flags in the DIAG_STAT register. MSC_CTRL[10] resets
itself to 0 after completing the routine. The MSC_CTRL[9:8] bits
provide manual control over the self-test function for
investigation of potential failures. Tab l e 2 5 outlines an example
test flow for using this option to verify the x-axis gyroscope
function.

Table 25. Manual Self-Test Example Sequence

DIN Description

0xB601 SMPL_PRD[7:0] = 0x01, sample rate = 819.2 SPS
0xB904 SENS_AVG[15:8] = 0x04, gyro range = ±1200°/sec
0xB802 SENS_AVG[7:0] = 0x02, four-tap averaging filter
Delay = 50 ms
0x0400 Read XGYRO_OUT
0xB502 MSC_CTRL[9] = 1, gyroscope negative self-test
Delay = 50 ms
0x0400 Read XGYRO_OUT

0xB501

Delay = 50 ms
0x0400 Read XGYRO_OUT

0xB500 MSC_CTRL[15:8] = 0x00

Determine whether the bias in the gyroscope
output change according to the self-test response
specified in Table 1

MSC_CTRL[9:8] = 01, gyroscope/accelerometer
positive self-test

Determine whether the bias in the gyroscope
output changed according to the self-test
response specified in Table 1

Memory Test

Setting MSC_CTRL[11] = 1 (DIN = 0xB508) performs a
checksum verification of the flash memory locations. The
pass/fail result is loaded into DIAG_STAT[6].

Status

The error flags provide indicator functions for common system
level issues. All of the flags are cleared (set to 0) after each
DIAG_STAT register read cycle. If an error condition remains,
the error flag returns to 1 during the next sample cycle. The
DIAG_STAT[1:0] bits do not require a read of this register to
return to 0. If the power supply voltage goes back into range,
these two flags are cleared automatically.

Table 26. DIAG_STAT Bit Descriptions

Bit Description (Default = 0x0000)

[15] Z-axis accelerometer self-test failure (1 = fail, 0 = pass)
[14] Y-axis accelerometer self-test failure (1 = fail, 0 = pass)
[13] X-axis accelerometer self-test failure (1 = fail, 0 = pass)
[12] Z-axis gyroscope self-test failure (1 = fail, 0 = pass)
[11] Y-axis gyroscope self-test failure (1 = fail, 0 = pass)
[10] X-axis gyroscope self-test failure (1 = fail, 0 = pass)
[9] Alarm 2 status (1 = active, 0 = inactive)
[8] Alarm 1 status (1 = active, 0 = inactive)
[7] Not used
[6] Flash test, checksum flag (1 = fail, 0 = pass)
[5] Self-test diagnostic error flag (1 = fail, 0 = pass)
[4] Sensor overrange (1 = fail, 0 = pass)
[3] SPI communication failure (1 = fail, 0 = pass)
[2] Flash update failure (1 = fail, 0 = pass)
[1]

[0]

Power supply > 5.25 V (1 = power supply > 5.25 V,
0 = power supply ≤ 5.25 V)

Power supply < 4.75 V (1 = power supply < 4.75 V,
0 = power supply ≥ 4.75 V)

Zero motion provides results that are more reliable. The settings
in Tab l e 2 5 are flexible and allow for optimization around speed
and noise influence. For example, using fewer filtering taps decreases
delay times but increases the possibility of noise influence.

Rev. A | Page 15 of 20

ADIS16367

Alarm Registers

The alarm function provides monitoring for two independent
conditions. The ALM_CTRL register provides control inputs
for data source, data filtering (prior to comparison), static
comparison, dynamic rate-of-change comparison, and output
indicator configurations. The ALM_MAGx registers establish
the trigger threshold and polarity configurations. Tab l e 3 0 gives
an example of how to configure a static alarm. The ALM_SMPLx
registers provide the numbers of samples to use in the dynamic
rate-of-change configuration. The period equals the number in
the ALM_SMPLx register multiplied by the sample period time,
which is established by the SMPL_PRD register. See Tab le 3 1 for
an example of how to configure the sensor for this type of function.

Table 27. ALM_MAG1, ALM_MAG2 Bit Descriptions

Bits Description (Default = 0x0000)

[15] Comparison polarity (1 = greater than, 0 = less than)
[14] Not used
[13:0]

Data bits that match the format of the trigger
source selection

Table 28. ALM_SMPL1, ALM_SMPL2 Bit Descriptions

Bits Description (Default = 0x0000)

[15:8] Not used
[7:0] Data bits: number of samples (both 0x00 and 0x01 = 1)

Table 29. ALM_CTRL Bit Descriptions

Bits Description (Default = 0x0000)
[15:12] Alarm 2 source selection
0000 = disable
0001 = power supply output
0010 = x-axis gyroscope output
0011 = y-axis gyroscope output
0100 = z-axis gyroscope output
0101 = x-axis accelerometer output
0110 = y-axis accelerometer output
0111 = z-axis accelerometer output
1000 = x-axis gyroscope temperature output
1001 = y-axis gyroscope temperature output
1010 = z-axis gyroscope temperature output
1011 = auxiliary ADC input
[11:8] Alarm 1 source selection (same as Alarm 2)
[7]

[6]

[5] Not used
[4]

[3] Not used
[2] Alarm output enable (1 = enabled, 0 = disabled)
[1] Alarm output polarity (1 = active high, 0 = active low)
[0] Alarm output line select (1 = DIO2, 0 = DIO1)

Rate-of-change enable for Alarm 2 (1 = rate of change,
0 = static level)

Rate-of-change enable for Alarm 1 (1 = rate of change,
0 = static level)

Comparison data filter setting (1 = filtered data,
0 = unfiltered data)

Table 30. Alarm Configuration Example 1

DIN Description

0xAF55,
0xAE17

Alarm 2 input = XACCL_OUT
Static level comparison, filtered data
DIO2 output indicator, positive polarity
0xA700,

0xA696
0xA937,

0xA86A

ALM_CTRL = 0x5517
Alarm 1 input = XACCL_OUT

ALM_MAG1 = 0x8096
Alarm 1 is true if XACCL_OUT > +0.5 g
ALM_MAG2 = 0x376A
Alarm 2 is true if XACCL_OUT < −0.5 g

Table 31. Alarm Configuration Example 2

DIN Description

0xAF76,
0xAEC7

Alarm 2 input = ZACCL_OUT

0xB601 SMPL_PRD = 0x0001
Sample rate = 819.2 SPS
0xAA08 ALM_SMPL1 = 0x0008
Alarm 1 rate-of-change period = 9.77 ms
0xAC50 ALM_SMPL2 = 0x0050
Alarm 2 rate-of-change period = 97.7 ms
0xA700,

0xA696

0xA937,
0xA86A

ALM_CTRL = 0x76C7
Alarm 1 input = YACCL_OUT

Rate-of-change comparison, unfiltered data
DIO2 output indicator, positive polarity

ALM_MAG1 = 0x8096
Alarm 1 is true if YACCL_OUT increases by more than

0.5 g in 9.77 ms.
ALM_MAG2 = 0x376A
Alarm 2 is true if ZACCL_OUT decreases by more

than 0.5 g in 97.7 ms.

PRODUCT IDENTIFICATION

Tabl e 3 2 provides a summary of the registers that identify
the product: PROD_ID, which identifies the product type;
LOT_ID1 and LOT_ID2, the 32-bit lot identification code;
and SERIAL_NUM, which displays the 12-bit serial number.
All four registers are two bytes in length. When using the
SERIAL_NUM value to calculate the serial number, mask
off the upper four bits and convert the remaining 12 bits to a
decimal number.

Table 32. Identification Registers

Register Name Address Description

LOT_ID1 0x52 Lot Identification Code 1
LOT_ID2 0x54 Lot Identification Code 2
PROD_ID 0x56

SERIAL_NUM 0x58 Serial number

Product identification = 0x3FEF
(hexadecimal number for 16,367)

Rev. A | Page 16 of 20

ADIS16367

V

APPLICATIONS INFORMATION

INSTALLATION/HANDLING

For ADIS16367 installation, use the following two-step process:

1. Secure the baseplate using machine screws.

2. Press the connector into its mate.

For removal,

1. Gently pry the connector from its mate using a small slot

screwdriver.

2. Remove the screws and lift the part up.

Never attempt to unplug the connector by pulling on the plastic
case or baseplate. Although the flexible connector is very reliable
in normal operation, it can break when subjected to unreasonable
handling. When broken, the flexible connector cannot be repaired.
The AN-1041 Application Note, iSensor® IMU Quick Start
Guide and Bias Optimization Tips, provides more information
about developing an appropriate mechanical interface design.

GYROSCOPE BIAS OPTIMIZATION

The factory calibration addresses initial bias errors along with
temperature-dependent bias behaviors. Installation and certain
environmental conditions can introduce modest bias errors.
The precision autonull command (GLOB_CMD[4]) provides
a simple predeployment method for correcting these errors to
an accuracy of approximately 0.013°/sec, using an average of
30 sec. Averaging the sensor output data for 100 sec can provide
incremental performance gains, as well. Controlling device
rotation, power supply, and temperature during these averaging
times helps to ensure optimal accuracy during this process.
Refer to the AN-1041 Application Note for more information
about optimizing performance.

INPUT ADC CHANNEL

The AUX_ADC register provides access to the auxiliary ADC
input channel. The ADC is a 12-bit successive approximation
converter that has an input circuit equivalent to the one shown
in Figure 16. The maximum input is 3.3 V. The ESD protection
diodes can handle 10 mA without causing irreversible damage.
The on resistance (R1) of the switch has a typical value of 100 Ω.
The sampling capacitor, C2, has a typical value of 16 pF.

CC

INTERFACE PRINTED CIRCUIT BOARD (PCB)

The ADIS16367/PCBZ includes one ADIS16367BLMZ and
one interface PCB. The interface PCB simplifies the process
of integrating the ADIS16367BMLZ into an existing processor
system.

J1 and J2 are dual-row, 2 mm (pitch) connectors that work with
a number of ribbon cable systems, including 3M Part Number
152212-0100-GB (ribbon crimp connector) and 3M Part Number
3625/12 (ribbon cable). Figure 17 provides a hole pattern design
for installing the ADIS16367BMLZ and the interface PCB onto
the same surface. Figure 18 provides the pin assignments for each
connector. The pin descriptions match those listed in Tab le 5 .
The ADIS16367 does not require external capacitors for normal
operation; therefore, the interface PCB does not use the C1/C2
pads (not shown in Figure 17).

23.75

J2

21

30.10 27.70

NOTES

1. DIMENSIONS IN MILLIMETERS.

11 12

J1
1

11 12

2

Figure 17. Physical Diagram for the ADIS16367/PCBZ

J1

RST

CS

DNC

GND

GND

VCC

1

3

5

7

9

11

2

SCLK

DOUT

4

DIN

6

8

GND

10

VCC

12

VCC

Figure 18. J1/J2 Pin Assignments

21.24

AUX_ADC

AUX_DAC

GND

DNC

DNC

DIO2

1.20

1 2

3 4

5 6

7 8

9 10

11 12

08398-020

J2

GND

DIO3

DIO4

DNC

DNC

DIO1

08398-021

D

C1

D

C2

R1

08398-014

Figure 16. Equivalent Analog Input Circuit

(Conversion Phase: Switch Open, Track Phase: Switch Closed)

Rev. A | Page 17 of 20

ADIS16367

OUTLINE DIMENSIONS

31.900

31.700

31.500

23.454

23.200

22.946

2.382
BSC

9.464

9.210

8.956
(2×)

4.20

4.00

3.80
(2×)

BOTTOM VIEW

2.660

2.500

2.340

1.588
BSC

10.60

BSC

1.588

14.950

14.550

14.150

N

I

1

P

DETAIL A

BSC

23.504

23.250

22.996

BSC (24×)

22.964

22.710

22.456

0.305

DETAIL A

14.00 BSC

TOP VIEW

4

2

P

N

I

10.50
BSC

FRONT VIEW

17.41

17.21

17.01
(2×)

1.00
BSC (22×)

5.20

5.00

4.80
(2×)

1.65 BSC

1.00

BSC

0.05
BSC

4.162 BSC

12.10
BSC

SIDE VIEW

7.18
BSC

2.00 BSC

4.330
BSC

21.410

21.210

21.010

CASTING
FEATURE

122208-C

Figure 19. 24-Lead Module with Connector Interface

(ML-24-2)

Dimensions shown in millimeters

ORDERING GUIDE

Model1 Temperature Range Package Description Package Option

ADIS16367BMLZ −40°C to +105°C 24-Lead Module with Connector Interface ML-24-2
ADIS16367/PCBZ Interface Board

1

Z = RoHS Compliant Part.

Rev. A | Page 18 of 20

ADIS16367

NOTES

Rev. A | Page 19 of 20

ADIS16367

NOTES

©2010–2011 Analog Devices, Inc. All rights reserved. Trademarks and
registered trademarks are the property of their respective owners.
D08398-0-2/11(A)

Rev. A | Page 20 of 20