Datasheet ADIS16209 Datasheet (ANALOG DEVICES)

Page 1
High-Accuracy, Dual-Axis
Digital Inclinometer and Accelerometer

FEATURES

Dual-mode inclinometer system
Dual-axis, horizontal operation, ±90°
Single-axis, vertical operation, ±180° High accuracy, 0.1° 14-bit digital inclination data, 0.025° resolution 14-bit digital acceleration data, 0.244 mg resolution ±1.7 g accelerometer measurement range 12-bit digital temperature sensor output Digitally controlled bias calibration Digitally controlled sample rate Digitally controlled frequency response Dual alarm settings with rate/threshold limits Auxiliary digital I/O Digitally activated self-test Digitally activated low power mode SPI-compatible serial interface Auxiliary 12-bit ADC input and DAC output Single-supply operation: 3.0 V to 3.6 V 3500 g powered shock survivability
VDD
GND

FUNCTIONAL BLOCK DIAGRAM

AUX
AUX
TEMPERATURE
SENSOR
DUAL-AXIS
ACCELEROMETER
SELF-TEST
MANAGEMENT
ADC
POWER
VREF
DAC
SIGNAL
CONDITIONI NG
AND
CONVERSION
RST DIO1 DIO2
Figure 1.
ALARMS
CALIBRATION
PROCESSING
DIGITAL
CONTROL
DIGIT AL
AUXILIARY
ADIS16209
ADIS16209
AND
SPI
PORT
I/O
CS
SCLK
DIN
DOUT
07096-001

APPLICATIONS

Platform control, stabilization, and alignment Tilt sensing, inclinometers, leveling Motion/position measurement Monitor/alarm devices (security, medical, safety) Navigation

GENERAL DESCRIPTION

The ADIS16209 is a high-accuracy, digital inclinometer that accommodates both single axis (±180°) and dual-axis (±
peration. The standard supply voltage (3.3 V) and serial
o peripheral interface (SPI) serial interface enable simple integration into most industrial system designs. A simple internal register structure handles all output data and configuration features. This includes access to the following output data: calibrated acceleration, accurate incline angles, power supply, internal temperature, auxiliary analog and digital input signals, diagnostic error flags, and programmable alarm conditions.
90°)
Configurable operating parameters include sample rate, power management, digital filtering, auxiliary analog and digital output, offset/null adjustment, and self-test for sensor mechanical structure.
The ADIS16209 is available in a 9.2 mm × 9.2 mm × 3.9 mm LGA package that operates over a temperature range of −40°C to +125°C. It can be attached using standard RoHS-compliant solder reflow processes.
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 www.analog.com Fax: 781.461.3113 ©2008 Analog Devices, Inc. All rights reserved.
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ADIS16209

TABLE OF CONTENTS

Features .............................................................................................. 1
Applications ....................................................................................... 1
Functional Block Diagram .............................................................. 1
General Description ......................................................................... 1
Revision History ............................................................................... 2
Specifications ..................................................................................... 3
Timing Specifications .................................................................. 5
Timing Diagrams .......................................................................... 5
Absolute Maximum Ratings ............................................................ 6
Thermal Resistance ...................................................................... 6
ESD Caution .................................................................................. 6

REVISION HISTORY

3/08—Revison 0: Initial Version
Pin Configuration and Function Descriptions ..............................7
Recommended Pad Geometry ....................................................7
Typical Performance Characteristics ..............................................8
Theory of Operation ...................................................................... 10
Basic Operation .............................................................................. 11
Output Data Registers ............................................................... 12
Operation Control Registers ..................................................... 12
Calibration Registers .................................................................. 14
Alarm Registers .......................................................................... 14
Outline Dimensions ....................................................................... 16
Ordering Guide .......................................................................... 16
Rev. 0 | Page 2 of 16
Page 3
ADIS16209

SPECIFICATIONS

TA = 25°C, VDD = 3.3 V, tilt = 0°, unless otherwise noted.
Table 1.
Parameter Conditions Min Typ Max Unit
HORIZONTAL INCLINE Each axis
Input Range ±90 Degrees
Relative Accuracy ±30° from horizon, AVG_CNT = 0x08 ±0.1 Degrees
Sensitivity ±30° from horizon 0.025 °/LSB
VERTICAL ROTATION Rotational plane within ±30 degrees of vertical
Input Range −180 +180 Degrees
Relative Accuracy 360° of rotation ±0.25 Degrees
Sensitivity −40°C to +85°C 0.025 °/LSB
ACCELEROMETER Each axis
Input Range
Nonlinearity
Alignment Error X sensor to Y sensor ±0.1 Degrees
Cross Axis Sensitivity ±2 %
Sensitivity −40°C to +85°C, VDD = 3.0 V to 3.6 V 0.243 0.244 0.245 mg/LSB
ACCELEROMETER NOISE PERFORMANCE
Output Noise AVG_CNT = 0x00 1.7 mg rms
Noise Density AVG_CNT = 0x00 0.19 mg/√Hz rms
ACCELEROMETER FREQUENCY RESPONSE
Sensor Bandwidth 50 Hz
Sensor Resonant Frequency 5.5 kHz
ACCELEROMETER SELF-TEST STATE
Output Change When Active At 25°C 706 1343 1973 LSB
TEMPERATURE SENSOR
Output at 25°C 1278 LSB
Scale Factor −0.47 °C/LSB
ADC INPUT
Resolution 12 Bits
Integral Nonlinearity (INL) ±2 LSB
Differential Nonlinearity (DNL) ±1 LSB
Offset Error ±4 LSB
Gain Error ±2 LSB
Input Range 0 2.5 V
Input Capacitance During acquisition 20 pF
ON-CHIP VOLTAGE REFERENCE 2.5 V
Accuracy At 25°C −10 +10 mV
Reference Temperature Coefficient ±40 ppm/oC
Output Impedance 70
DAC OUTPUT 5 kΩ/100 pF to GND
Resolution 12 Bits
Relative Accuracy For Code 101 to Code 4095 4 LSB
Differential Nonlinearity 1 LSB
Offset Error ±5 mV
Gain Error ±0.5 %
Output Range 0 to 2.5 V
Output Impedance 2 Ω
Output Settling Time 10 µs
1
1
2
25°C ±1.7 % of full scale ±0.1 ±0.2 %
g
Rev. 0 | Page 3 of 16
Page 4
ADIS16209
Parameter Conditions Min Typ Max Unit
LOGIC INPUTS
Input High Voltage, V Input Low Voltage, V
Logic 1 Input High Current, I Logic 0 Input Low Current, I
All except RST
RST
3
Input Capacitance, CIN 10 pF
DIGITAL OUTPUTS
Output High Voltage, VOH I Output Low Voltage, VOL I
SLEEP TIMER
Timeout Period
START-UP TIME
5
Power-On Fast mode, SMPL_PRD ≤ 0x07 150 ms Normal mode, SMPL_PRD ≥ 0x08 190 ms Reset Recovery Fast mode, SMPL_PRD ≤ 0x07 30 ms Normal mode, SMPL_PRD ≥ 0x08 70 ms Sleep Mode Recovery 2.5 ms
FLASH MEMORY
Endurance
6
Data Retention CONVERSION RATE SETTING 1.04 2731 SPS POWER SUPPLY
Operating Voltage Range 3.0 3.3 3.6 V
Power Supply Current Normal mode, SMPL_PRD ≥ 0x08 11 14 mA
Fast mode, SMPL_PRD ≤ 0x07 36 42 mA Sleep mode, −40°C to +85°C 140 350 µA
1
Guaranteed by iMEMS® packaged part testing, design, and/or characterization.
2
Self-test response changes as the square of VDD.
3
RST
The
pin has an internal pull-up.
4
Guaranteed by design.
5
The times presented in this section do not include the sensor’s transient response time, which is associated with a 50 Hz single-pole system. System accuracy goals
should be given consideration when determining the amount of time it takes to start acquiring accurate readings. These times do not include the time it takes to arrive at thermal stability, which can also introduce transient errors.
6
Endurance is qualified as per JEDEC Standard 22 Method A117 and measured at −40°C, +25°C, +85°C, and +125°C.
7
Retention lifetime equivalent at junction temperature (TJ) 55°C as per JEDEC Standard 22 Method A117. Retention lifetime decreases with junction temperature.
2.0 V
INH
0.8 V
INL
CS
For
signal when used to wake up from sleep mode
VIH = 3.3 V ±0.2 ±10 µA
INH
V
INL
= 0 V
IL
−40 −60 A
0.55 V
−1 mA
= 1.6 mA 2.4 V
SOURCE
= 1.6 mA 0.4 V
SINK
4
0.5 128 Seconds Time until data is available
20,000 Cycles
7
TJ = 85°C 20 Years
Rev. 0 | Page 4 of 16
Page 5
ADIS16209
K

TIMING SPECIFICATIONS

TA = 25°C, VDD = 3.3 V, tilt = 0°, unless otherwise noted.
Table 2.
Parameter Description Min1 Typ Max Unit
f
Fast mode, SMPL_PRD ≤ 0x07 (fS ≥ 546 Hz)2 0.01 2.5 MHz
SCLK
Normal mode, SMPL_PRD ≥ 0x08 (fS ≤ 482 Hz)2 0.01 1.0 MHz t
Chip select period, fast mode, SMPL_PRD ≤ 0x07 (fS ≥ 546 Hz)2 40 s
DATARATE
tCS Chip select to clock edge 48.8 ns t
Data output valid after SCLK edge 100 ns
DAV
t
Data input setup time before SCLK rising edge 24.4 ns
DSU
t
Data input hold time after SCLK rising edge 48.8 ns
DHD
tDF Data output fall time 5 12.5 ns tDR Data output rise time 5 12.5 ns t
SFS
1
Guaranteed by design, not tested.
2
Note that fS means internal sample rate.

TIMING DIAGRAMS

Chip select period, normal mode, SMPL_PRD ≥ 0x08 (fS ≤ 482 Hz)2 100 s
high after SCLK edge
CS
t
DATARATE
t
STALL
5 ns
CS
SCLK
t
=
t
– 16/
STALL
DATARATE
f
SCLK
07096-002
Figure 2. SPI Chip Select Timing
CS
SCLK
DOUT
DIN
t
CS
1 2 3 4 5 6 15 16
t
DAV
MSB DB14
W/R A5 A4 A3 A2
DB13 DB12 DB10DB11 DB2 LSBDB1
t
DSU
t
DHD
D2
D1 L SB
t
SFS
07096-003
Figure 3. SPI Timing
(Utilizing SPI Settings Typically Identified as Phase = 1, Polarity = 1)
CS
SCL
DATA FRAME
DIN
W/R A5 A4 A3 A2 A1 A0 DC7 DC6 DC5 DC4 DC3 DC2 DC1 DC0
WRITE = 1
READ = 0
REGISTER ADDRESS DATA FOR WRITE COMMANDS
DON’T CARE FO R READ COMMANDS
07096-004
Figure 4. DIN Bit Sequence
Rev. 0 | Page 5 of 16
Page 6
ADIS16209

ABSOLUTE MAXIMUM RATINGS

Table 3.
Parameter Rating
Acceleration (Any Axis, Unpowered) 3500 g Acceleration (Any Axis, Powered) 3500 g VDD to GND −0.3 V to +7.0 V Digital Input/Output Voltage to GND −0.3 V to +5.5 V Analog Inputs to GND −0.3 to VDD + 0.3 V Analog Inputs to GND −0.3 to VDD + 0.3 V Operating Temperature Range −40°C to +125°C Storage Temperature Range −65°C to +150°C
Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.

THERMAL RESISTANCE

Table 4. Package Characteristics
Package Type θJA θ
16-Terminal LGA 250°C/W 25°C/W 0.6 grams
Device Weight
JC

ESD CAUTION

Rev. 0 | Page 6 of 16
Page 7
ADIS16209
2

PIN CONFIGURATION AND FUNCTION DESCRIPTIONS

F
AUX ADC
VRE
GND
16 15 14 13
A
SCLK
DOUT
DIN
CS
NOTES
1. NC = NO CONNECT. . THIS IS NOT AN ACTUAL TO P VIEW, BECAUSE THE PINS ARE NOT VIS IBLE FROM THE TOP. THIS IS
A LAYOUT VI EW, WHI CH REPRESENTS T HE PIN CONFI GURATIO N, IF THE PACKAGE IS LOOKED THROUGH FRO M THE TOP . THIS CO NFIGURATI ON IS PRO VIDED FOR PCB L AYOUT PURPO SES.
Y
A
X
PIN 1 INDICATO R
ADIS16209
TOP
LOOK THRO UGH
VIEW
(Not to Scale)
4 3 2 1
5 6 7 8
DIO2
DIO1
Figure 5. Pin Configuration
VDD
AUX DAC
NC
NC
9 10 11 12
RST
NC
NC
07096-005
Table 5. Pin Function Descriptions
Pin No. Mnemonic Type
1
Description
1 SCLK I SPI, Serial Clock. 2 DOUT O SPI, Data Output. 3 DIN I SPI, Data Input. 4
CS
I SPI, Chip Select.
5, 6 DIO1, DIO2 I/O Digital Input/Output Pins. 7, 8, 10, 11 NC N/A No Connect. 9
RST
I Reset, Active Low. 12 AUX DAC O Auxiliary DAC Output. 13 VDD S Power Supply, 3.3 V. 14 AUX ADC I Auxiliary ADC Input. 15 VREF O Precision Reference. 16 GND S Ground.
1
S = supply; O = output; I = input.

RECOMMENDED PAD GEOMETRY

4.1865 8×
0.670 12×
8.373 2×
5.391 4×
2.6955 8×
0.500
1.127 16×
9.2mm × 9.2mm S TACKED LGA PACKAGE
16×
07096-006
Figure 6. Example of a Pad Layout
Rev. 0 | Page 7 of 16
Page 8
ADIS16209

TYPICAL PERFORMANCE CHARACTERISTICS

0.20
0.15
0.10
0.05
0
–0.05
ERROR (Degrees)
–0.10
–0.15
–0.20
–40 –30 –20 –10 0 10 20 30 40
INCLINATI ON ANGLE (Degrees)
MAXIMUM
INCLINE
ERROR
Figure 7. Horizontal Inclination Error (8 Parts), Autonull at Horizontal
Position, Stable Temperature, 3.3 V
0.3
07096-018
0.25
0.20
0.15
0.10
0.05
0
–0.05
ERROR (Degrees)
–0.10
–0.15
–0.20
–0.25
0 100 200 300 400
ROTATIO NAL ANGLE (Degrees)
Figure 10. Vertical Mode Rotational Error (8 parts), 25°C, 3.3 V
0.3
07096-021
0.2
0.1
0
–0.1
ERROR (Degrees)
–0.2
–0.3
–60 –4 0 – 20 0 20 40 60 80 100
TEMPERATURE (°C)
07096-019
Figure 8. Maximum Incline Error over a ±30° Incline Range (8 Parts) over
Temperature, Autonull at Horizontal Position, 25°C, 3.3 V
0.15
0.10
0.05
0
–0.05
ERROR (Degrees)
–0.10
–0.15
0.2
0.1
0
–0.1
–0.2
ERROR (Degrees)
–0.3
–0.4
–0.5
–60 –40 –20 0 20 40 60 80 100
TEMPERATURE ( °C)
Figure 11. Vertical Mode Error (8 Parts) vs. Temperature, 0° to 360°, 3.3 V
0.3
0.2
0.1
0
–0.1
–0.2
ERROR (Degrees)
–0.3
–0.4
07096-022
–0.20
3.0 3.3 3.6
SUPPLY VOLTAGE (V)
Figure 9. Maximum Incline Error over a ±30° Incline Range (8 Parts) over
Supply Voltage, Autonull Horizontal Position, 25°C, 3.3 V
07096-020
Rev. 0 | Page 8 of 16
–0.5
3.0 3.3 3.6
SUPPLY VOLTAGE (V)
07096-023
Figure 12. Vertical Mode Error (8 Parts) vs. Supply Voltage, 0° to 360°, 25°C
Page 9
ADIS16209
30
25
VDD = 3.0V, 3. 3V, 3.6V TEMP = –40°C, +25°C, +85°C
3.5
3.0
20
15
10
5
PERCENTAGE O F POPULAT ION (%)
0 –0.50 –0. 38 –0.26 –0.14 –0. 02 0.10 0.22 0.34 0.46
SENSITIV ITY ERROR (%)
Figure 13. Accelerometer Output Sensitivity Error Distribution
20
18
16
14
12
10
8
6
4
PERCENTAGE O F POPULAT ION (%)
2
0
–6.0 –4.4 –2.8 –1.2 0.4 2.0 3.6 5.2
BIAS ERROR (mg)
VDD = 3.0V, 3. 3V, 3.6V TEMP = –40 °C, +25°C, +85°C
Figure 14. Accelerometer Output Bias Error Distribution
2.5
2.0
1.5
ERROR (Degrees)
1.0
0.5
0
0 102030405060708090
07096-013
OFF-VE RTICAL T ILT (Deg rees)
7096-015
Figure 15. Error vs. Off-Vertical Tilt, 25°C, 3.3 V
07096-014
Rev. 0 | Page 9 of 16
Page 10
ADIS16209
G
G

THEORY OF OPERATION

The ADIS16209 tilt sensing system uses gravity as its only stimulus, and a MEMS accelerometer as its sensing element. MEMS accelerometers typically employ a tiny, spring-loaded structure that is interlaced with a fixed pick-off finger structure. The spring constant of the floating structure determines how far it moves when subjected to a force. This structure responds to dynamic forces associated with acceleration and to static forces, such as gravity.
Figure 16 and Figure 17 illustrate how the accelerometer responds to gravity, according to its orientation, with respect to gravity. Figure 16 displays the configuration for the incline angle outputs, and Figure 17 displays the configuration used for the rotational angle position. This configuration provides greater measurement range than a single axis. The ADIS16209 incorporates the signal processing circuit that converts accelera­tion into an incline angle, and corrects for several known error sources that would otherwise degrade the accuracy level.
0° TIL T LEVEL PLANE
POSITIVE X AXIS TILT DIRECTION
58
4
Y AXIS Y AXIS
POSITIVE Y AXIS TILT DIRECTION
4
16
1
XINCL_OUT = 0° YINCL_OUT = 0°
13
12
9
85
Figure 18. Horizontal Incline Angle Orientation
POSITIVE DIRECTION
1
9
1316
XINCL_OUT 90° YINCL_OUT = 0°
RAVITY = 1g
Figure 16. Single-Axis Tilt Theory Diagram
RAVITY = 1g
Figure 17. Dual-Axis Tilt Theory Diagram
12
4
θ
x
a
x
θ
x
HORIZON
a
y
θ
x
a
x
θ
x
HORIZON
16
1
5
13
12
9
8
XINCL_OUT = 0° 0° YINCL_OUT 90°
07096-007
07096-008
X AXISX AXIS
07096-011
1
6
2
0
9
1
6
2
0
16209
ROT_OUT = 0°
9
90° ROT_OUT 180°
–180° ROT_OUT –90°
07096-012
Figure 19. Vertical Angle Orientation
Rev. 0 | Page 10 of 16
Page 11
ADIS16209

BASIC OPERATION

The ADIS16209 requires only power/ground and SPI connec­tions. The SPI is simple to hook up and is supported by many common digital hardware platforms. Figure 20 provides a simple hook-up diagram, while Table 2, Figure 2, and Figure 3 provide timing and bit assignments. Figure 4 provides the bit sequence for accessing the register memory structure. Each function within the ADIS16209 has its own 16-bit, 2-byte reg­ister. Each byte has its own unique, 6-bit address. Note that all 16 SCLK cycles are required for the DIN bit sequence to configure the output for the next data frame. The ADIS16209 supports full duplex mode operation. Table 6 provides the entire user register map for the ADIS16209. For each register, the lower bytes address is given. For those registers that have two bytes, the upper bytes address is simply the lower bytes
Many of the configuration registers have also been assigned mirror locations in the flash memory, which effectively provides them with a backup storage function. To assure the backup of these registers, the COMMAND register provides an initiation bit for manual flash updates. The ENDURANCE register provides a running count of these events.
ADIS16209
CS
SCLK
DIN
DOUT
Figure 20. Typical SPI Hook-up
address, incremented by 0x01.
Table 6. User Register Map
Name R/W Flash Backup Address Size (Bytes) Function Reference
ENDURANCE R Yes 0x00 2 Diagnostics, flash write counter (16-bit binary) SUPPLY_OUT R No 0x02 2 Output, power supply Table 7 XACCL_OUT R No 0x04 2 Output, x-axis acceleration Table 7 YACCL_OUT R No 0x06 2 Output, y-axis acceleration Table 7 AUX_ADC R No 0x08 2 Output, auxiliary ADC Table 7 TEMP_OUT R No 0x0A 2 Output, temperature Table 7 XINCL_OUT R No 0x0C 2 Output, ±90° x-axis inclination Table 7 YINCL_OUT R No 0x0E 2 Output, ±90° y-axis inclination Table 7 ROT_OUT R No 0x10 2 Output, ±180° vertical rotational position Table 7 XACCL_NULL R/W Yes 0x12 2 Calibration, x-axis acceleration offset null Table 16 YACCL_NULL R/W Yes 0x14 2 Calibration, y-axis acceleration offset null Table 16 XINCL_NULL R/W Yes 0x16 2 Calibration, x-axis inclination offset null Table 17 YINCL_NULL R/W Yes 0x18 2 Calibration, y-axis inclination offset null Table 17 ROT_NULL R/W Yes 0x1A 2 Calibration, vertical rotation offset null Table 17 0x1C to 0x1F 4 Reserved, do not write to these locations ALM_MAG1 R/W Yes 0x20 2 Alarm 1, amplitude threshold Table 18 ALM_MAG2 R/W Yes 0x22 2 Alarm 2, amplitude threshold Table 18 ALM_SMPL1 R/W Yes 0x24 2 Alarm 1, sample period Table 19 ALM_SMPL2 R/W Yes 0x26 2 Alarm 2, sample period Table 19 ALM_CTRL R/W Yes 0x28 2 Alarm, source control register Table 20 No 0x2A to 0x2F 6 Reserved AUX_DAC R/W No 0x30 2 Auxiliary DAC data Table 14 GPIO_CTRL R/W No 0x32 2 Operation, digital I/O configuration and data Table 13 MSC_CTRL R/W No 0x34 2 Operation, data-ready and self-test control Table 12 SMPL_PRD R/W Yes 0x36 2 Operation, sample rate configuration Table 8 AVG_CNT R/W Yes 0x38 2 Operation, filter configuration Table 10 SLP_CNT W Yes 0x3A 2 Operation, sleep mode control Table 9 STATUS R No 0x3C 2 Diagnostics, system status register Table 21 COMMAND W No 0x3E 2 Operation, system command register Table 15
EMBEDDED
PROCESSOR/
DSP/FPGA
PF SCK MOSI MISO
07096-009
Rev. 0 | Page 11 of 16
Page 12
ADIS16209

OUTPUT DATA REGISTERS

Tabl e 7 provides the data configuration for each output data register in the ADIS16209. Starting with the MSB of the upper byte, each output data register has the following bit sequence: new data (ND) flag, error/alarm (EA) flag, followed by 14 data bits. The data bits are LSB-justified and, in the case of the 12-bit data formats, the remaining two bits are not used. The ND flag indicates that unread data resides in the output data registers. This flag clears and returns to 0 during an output register read sequence. It returns to 1 after the next internal sample update cycle completes. The EA flag indicates an error condition. The STATUS register contains all of the error flags and provides the ability to investigate root cause.
Table 7. Output Data Register Formats
Register Bits Format Scale1
SUPPLY_OUT 14 Binary, 3.3 V = 0x2A3D 0.30518 mV XACCL_OUT 14 Twos complement 0.24414 mg YACCL_OUT 14 Twos complement 0.24414 mg AUX_ADC 12 Binary, 2 V = 0x0CCC 0.6105 mV TEMP_OUT 12 Binary, 25°C = 0x04FE −0.47°C XINCL_OUT2 14 Twos complement 0.025° YINCL_OUT2 14 Twos complement 0.025° ROT_OUT3 14 Twos complement 0.025°
1
Scale denotes quantity per LSB.
2
Range is −90° to +90°.
3
Range is −180° to +179.975°.
of 68%. The two different modes of operation offer a system­level trade-off between performance (sample rate, serial transfer rate) and power dissipation.

Power Management

In addition to offering two different performance modes for power optimization, the ADIS16209 offers a programmable shutdown period that the SLP_CNT register controls.
Table 9. SLP_CNT Bit Descriptions
Bit Description (Default = 0x0000)
15:8 Not used 7:0 Data bits, 0.5 seconds/LSB
For example, writing 0x08 to the SLP_CNT register places the ADIS16209 into sleep mode for 4 seconds. The only way to stop this process is to remove power or reset the device.

Digital Filtering

The AVG_CNT register controls the moving average digital filter, which determines the size of the moving average filter, in eight power-of-two step sizes (that is, 2
M
= 1, 2, 4, 16, 32, 64, 128, and
256). Filter setup requires one simple step: write the appropriate M factor to the assigned bits in the AVG_CNT register.
Table 10. AVG_CNT Bit Descriptions
Bit Description (Default = 0x0004)
15:4 Not used 3:0 Power-of-two step size, maximum binary value = 1000

OPERATION CONTROL REGISTERS

Internal Sample Rate

The SMPL_PRD register controls the ADIS16209 internal sample rate and has two parts: a selectable time base and a multiplier. The following relationship produces the sample rate:
= tB × NS + 122.07μs
t
S
Table 8. SMPL_PRD Bit Descriptions
Bit Description (Default = 0x0004)
15:8 Not used 7 Time base (tB)
0 = 244.14 µs, 1 = 7.568 ms
6:0 Increment setting (NS)
An example calculation of the default sample period follows:
SMPL_PRD = 0x01, B7B0 = 00000001
B7 = 0 → t
t
= tB × NS + 122.07μs = 244.14 × 1 + 122.07 = 366.21 μs
S
f
= 1∕tS = 2731 SPS
S
The sample rate setting has a direct impact on the SPI data rate capability. For sample rates ≥546 SPS, the SPI SCLK can run at a rate up to 2.5 MHz. For sample rates <546 SPS, the SPI SCLK can run at a rate up to 1 MHz. The sample rate setting also affects power dissipation. When the sample rate is set to <546 SPS, power dissipation typically reduces by a factor
= 244.14 μs, B6B0 = 000000001 → NS = 1
B
The following equation offers a frequency response relationship for this filter:
)sin(
tfN
×××π
S
)(
fH
=
A
20
0
–20
–40
MAGNITUDE (d B)
–60
–80
–100
0.001 0. 01 0.1
Figure 21. Frequency Response—Moving Average Filter
××π×
tfN
S
N = 128
)sin(
N = 4
N = 16
f/f
S
07096-010
Rev. 0 | Page 12 of 16
Page 13
ADIS16209

Digital I/O Lines

The ADIS16209 provides two, general purpose, digital input/output lines that have several configuration options.
Table 11. Digital I/O Line Configuration Registers
Function [Priority] Register
Data-Ready I/O Indicator [1] MSC_CTRL Alarm Indicator [2] ALM_CTRL General-Purpose I/O Configuration [3] GPIO_CTRL General-Purpose I/O Line Communication GPIO_CTRL
Table 13. GPIO_CTRL Bit Descriptions
Bit Description (Default = 0x0000)
15:10 Not used 9 General-Purpose I/O Line 2 data 8 General-Purpose I/O Line 1 data 7:2 Not used 1 General-Purpose I/O Line 2, data direction control
1 = output, 0 = input
0 General-Purpose I/O Line 1, data direction control
1 = output, 0 = input
Data-Ready I/O Indicator
The MSC_CTRL register provides controls for a data-ready function. For example, writing 0x05 to this register enables this function and establishes DIO2 as an active-low, data-ready line. The duty cycle is 25% (±10% tolerance).
Table 12. MSC_CTRL Bit Descriptions
Bit Description (Default = 0x0000)
15:11 Not used 10 Self-test at power-on: 1 = disabled, 0 = enabled 9 Not used 8 Self-test enable (temporary, bit is volatile)
1 = enabled, 0 = disabled 7:3 Not used 2 Data-ready enable: 1 = enabled, 0 = disabled 1 Data-ready polarity: 1 = active high, 0 = active low 0 Data-ready line select: 1 = DIO2, 0 = DIO1
Self-Test
Self-test exercises the mechanical structure of the sensor and provides a simple method for verifying the operation of the entire sensor signal conditioning circuit. There are two different self-test options: startup and manual. If either of these self-tests results in a failure, the self-test error flag, located in the STATUS register, sets to 1. The manual self-test option results in a repeating pattern, until the bit is set back to 0. While in the manual self-test loop, SMPL_PRD and AVG_CNT cannot be changed. See Ta ble 1 2 for the appropriate MSC_CTRL bit designations.
General Purpose I/O
The GPIO_CTRL register controls the direction and data of the general-purpose digital lines, DIO1 and DIO2. For example, writing a 0x02 to the GPIO_CTRL register sets DIO2 as an output line and DIO1 as an input line. Reading the data bits in GPIO_CTRL reveals the line logic level.

Auxiliary DAC

The auxiliary DAC provides a 12-bit level adjustment function. The AUX_DAC register controls the operation of the auxiliary DAC function, which is useful for systems that require analog level controls. It offers a rail-to-rail buffered output that has a range of 0 V to 2.5 V. The DAC can drive its output to within 5 mV of the ground reference when it is not sinking current. As the output approaches ground, the linearity begins to degrade (100 LSB beginning point). As the sink current increases, the nonlinear range increases. The DAC output latch function, contained in the COMMAND register, provides continuous operation while writing to each byte of this register. The contents of this register are volatile, which means that the desired output level must be set after every reset and power cycle event.
Table 14. AUX_DAC Bit Descriptions
Bit Description (Default = 0x0000) 15:12 Not used 11:0 Data bits, scale factor = 0.6105 mV/code
Offset binary format, 0 V = 0 codes

Global Commands

The COMMAND register provides initiation bits for several commands that simplify many common operations. Writing a 1 to the assigned COMMAND bit exercises its function.
Table 15. COMMAND Bit Descriptions
Bit Description (Default = 0x0000)
15:8 Not used 7 Software reset 6:5 Not used 4 Clear status register (reset all bits to 0) 3 Flash update; backs up all registers, see Table 6 2 DAC data latch 1 Factory calibration restore 0 Autonull
The software reset command restarts the internal processor, which loads all registers with the contents in their flash memory locations.
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ADIS16209
The flash update copies the contents of all the flash backup registers into their assigned, nonvolatile, flash memory loca­tions. This process takes approximately 50 ms and requires a power supply that is within the specified operating range. After waiting the appropriate time for the flash update to complete, verify successful completion by reading the STATUS register (if successful, the flash update error is 0). If the flash update was not successful, reading this error bit accomplishes two things: (1) alerting the system processor to try again, and (2) clearing the error flag, which is required for flash memory access.
The DAC data latch command loads the contents of AUX_DAC into the DAC latches. Because the AUX_DAC contents must be updated one byte at a time, this command ensures a stable DAC output voltage during updates.
The autonull command provides a simple method for removing offset from the sensor outputs. This command takes the contents of the output data registers and loads the equal but opposite number into the offset calibration registers. The accuracy of this operation depends on zero force, zero motion, and optimal noise management during the measurement (see the Digital Filtering section). The factory calibration restore sets the offset null registers (XACCL_NULL, for example) back to their default values.

CALIBRATION REGISTERS

The ADIS16209 incorporates an extensive factory calibration and provides precision acceleration, incline, and rotational position data. For systems that require on-site calibration, user-programmable offset adjustment registers are available.
Tabl e 16 provides the bit assignments for the following user­programmable calibration registers: XACCL_NULL and YACCL_NULL. Ta b le 1 7 provides the bit assignments for the following user-programmable calibration registers: XINCL_NULL, YINCL_NULL, and ROT_NULL.
Table 16. Acceleration Offset Register Bit Designations
Bit Description (Default = 0x0000)
15:14 Not used 13:0 Data bits, twos complement, sensitivity = 0.24414 mg/LSB
Table 17. Incline/Rotation Offset Register Bit Designations
Bit Description (Default = 0x0000)
15:14 Not used 13:0 Data bits, twos complement, sensitivity = 0.025°/LSB

ALARM REGISTERS

The alarm function provides monitoring for two independent conditions. The ALM_CTRL register provides control inputs for data source, data filtering (prior to comparison), static/ dynamic, and output indicator configurations. The ALM_MAGx registers establish the trigger threshold and polarity configura­tions. The ALM_SMPLx registers provide the numbers of samples to use in the dynamic, rate-of-change configuration. The rate-of-change calculation is
N
DS
1
Y <>+=
C
N
DS
=1
n
where: N
is the number of samples in ALM_SMPLx.
DS
y(n) is the sampled output data. M
is the magnitude for comparison in ALM_MAGx.
C
> or < is determined by the MSB in ALM_MAGx.
Table 18. ALM_MAG1/ALM_MAG2 Bit Designations
Bit Description (Default = 0x0000)
15 Comparison polarity: 1 = greater than, 0 = less than 14 Not used 13:0 Data bits, matches format of trigger source selection
Table 19. ALM_SMPL1/ALM_SMPL2 Bit Designations
Bit Description (Default = 0x0001)
15:8 Not used 7:0 Data bits: number of samples (both 0x00 and 0x01 = 1)
Table 20. ALM_CTRL Bit Descriptions
Bit Value Description (Default = 0x0000)
15:12 Trigger source, Alarm 2 0000 Disabled 0001 0010 0011 0100 0101 0110 0111 1000 11:8 7 6 Alarm 2 rate of change control: 1 = enabled 5 4 3 2 1 0 Alarm indicator line select: 1 = DIO2, 0 = DIO1
1
Incline and vertical angles always use filtered data in this comparison.
Power supply X-acceleration Y-acceleration Auxiliary ADC Temperature sensor X-axis incline angle Y-axis incline angle
Rotational position Trigger source, Alarm 1, same as Bits [15:12] Not used
Alarm 1 rate of change control: 1 = enabled Alarm 2 filter: 1 = filtered data, 0 = no filter1 Alarm 1 filter: 1 = filtered data, 0 = no filter1 Alarm indicator, using DIO1/DIO2: 1 = enabled Alarm indicator polarity: 1 = active high
?oris)()1(
MYAlarmnyny
CC
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ADIS16209

Status

The STATUS register provides a series of error flags that provide indicator functions for common system-level issues. All of the flags clear (set to 0) after each STATUS register read cycle. If an error condition remains, the error flag returns to 1 during the next sample cycle.
Table 21. STATUS Bit Descriptions
Bit Description (Default = 0x0000)
15:10 Not used 9 Alarm 2 status:
1 = active, 0 = inactive
8 Alarm 1 status
1 = active, 0 = inactive 7:6 Not used 5 Self-test diagnostic error flag
1 = error condition, 0 = normal operation 4 Not used 3 SPI communications failure
1 = error condition, 0 = normal operation 2 Flash update failed
1 = error condition, 0 = normal operation 1 Power supply above 3.625 V
1 ≥ 3.625 V, 0 ≤ 3.625 V (normal) 0 Power supply below 2.975 V
1 ≤ 2.975 V, 0 ≥ 2.975 V (normal)
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ADIS16209

OUTLINE DIMENSIONS

5.391 BSC
9.35
MAX
TOP VIEW
5.00 TYP
9.20 TYP
3.90
MAX
8.373 BSC
(2×)
0.200
MIN
(ALL SIDES)
2.6955 BSC
(8×)
13 16
12
9
(4×)
BOTTOM VIEW
1
4
58
PIN 1 INDICATOR
1.000 BSC (16×)
0.797 BSC (12×)
0.373 BSC (16×)
SIDE VIEW
022007-B
Figure 22. 16-Terminal Land Grid Array [LGA]
(CC-16-2)
Dimensions shown in millimeters

ORDERING GUIDE

Model Temperature Range Package Description Package Option
ADIS16209CCCZ ADIS16209/PCBZ1 Evaluation Board
1
Z = RoHS Compliant Part.
1
−40°C to +125°C 16-Terminal Land Grid Array [LGA] CC-16-2
©2008 Analog Devices, Inc. All rights reserved. Trademarks and registered trademarks are the property of their respective owners. D07096-0-3/08(0)
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