Datasheet ADIS16003 Datasheet (ANALOG DEVICES)

Dual-Axis ±1.7 g Accelerometer

T

C

Data Sheet

FEATURES

Dual-axis accelerometer
SPI digital output interface
Internal temperature sensor
Highly integrated; minimal external components
Bandwidth externally selectable
1 mg resolution at 60 Hz
Externally controlled electrostatic self-test

3.0 V to 5.25 V single-supply operation
Low power: <2 mA
3500 g shock survival

7.2 mm × 7.2 mm × 3.7 mm package

APPLICATIONS

Industrial vibration/motion sensing
Platform stabilization
Dual-axis tilt sensing
Tracking, recording, and analysis devices
Alarms and security devices

with SPI Interface

ADIS16003

GENERAL DESCRIPTION

The ADIS16003 is a low cost, low power, complete dual-axis
accelerometer with an integrated serial peripheral interface
(SPI). An integrated temperature sensor is also available on the
SPI interface. The ADIS16003 measures acceleration with a full­scale range of ±1.7 g (minimum), and it can measure both dynamic
acceleration (vibration) and static acceleration (gravity).

The typical noise floor is 110 μg/√Hz, allowing signals below
1 mg (60 Hz bandwidth) to be resolved.

The bandwidth of the accelerometer is set with optional capaci­tors C

and CY at the XFILT and YFILT pins. Selection of the

X

two analog input channels is controlled via the serial interface.
An externally driven self-test pin (ST) allows the user to verify

the accelerometer functionality.
The ADIS16003 is available in a 7.2 mm × 7.2 mm × 3.7 mm,

12-terminal LGA package.

FUNCTIONAL BLOCK DIAGRAM

V

CC

DUAL-AXIS

±1.7g

ACCELEROMETER

DC

COM ST

YFILT

C

XFILT

Y

Figure 1.

C

X

SERIAL

INTERFACE

TEMP

SENSOR

SCLK
DIN
DOU
CS
TCS

056463-001

Rev. B

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ADIS16003 Data Sheet

TABLE OF CONTENTS

Features.............................................................................................. 1

Applications....................................................................................... 1

General Description......................................................................... 1

Functional Block Diagram ..............................................................1

Revision History ...............................................................................2

Specifications..................................................................................... 3

Timing Specifications ..................................................................4

Circuit and Timing Diagrams..................................................... 5

Absolute Maximum Ratings............................................................ 6

ESD Caution.................................................................................. 6

Pin Configuration and Function Descriptions............................. 7

Typical Performance Characteristics............................................. 8

Theory of Operation ......................................................................11

Accelerometer Data Format...................................................... 11

REVISION HISTORY

3/12—Rev. A to Rev. B

Added Accelerometer Data Format Section and Table 6;

Renumbered Sequentially.............................................................. 11

10/07—Rev. 0 to Rev. A

Changes to Features and General Description .............................1

Added Note 6 to Table 2 .................................................................. 4

Changes to Figure 5.......................................................................... 6

Changes to Serial Interface Section and Layout......................... 11

Changes to Layout.......................................................................... 14

Deleted Figure 24 and Table 11..................................................... 14

Changes to Converting Acceleration to Tilt Section and

Second-Level Assembly Section ...................................................15

Updated Outline Dimensions....................................................... 16

Changes to Ordering Guide.......................................................... 16

10/05—Revision 0: Initial Version

Self-Test ....................................................................................... 11

Serial Interface............................................................................ 11

Accelerometer Serial Interface.................................................. 11

Temperature Sensor Serial Interface........................................ 12

Power Supply Decoupling......................................................... 12

Setting the Bandwidth ............................................................... 13

Selecting Filter Characteristics: The Noise/Bandwidth Trade-

Off................................................................................................. 13

Applications Information.............................................................. 15

Dual-Axis Tilt Sensor ................................................................15

Second Level Assembly ............................................................. 15

Outline Dimensions....................................................................... 16

Ordering Guide .......................................................................... 16



Rev. B | Page 2 of 16

Data Sheet ADIS16003

SPECIFICATIONS

TA = –40°C to +125°C, VCC = 5 V, CX, CY = 0 μF, acceleration = 0 g, unless otherwise noted. All minimum and maximum specifications are
guaranteed. Typical specifications are not guaranteed.

Table 1.

Parameter Conditions Min Typ Max Unit

ACCELEROMETER SENSOR INPUT Each axis

Measurement Range1 ±1.7
Nonlinearity % of full scale ±0.5 ±2.5 %
Package Alignment Error ±1.5 Degrees
Alignment Error X sensor to Y sensor ±0.1 Degrees
Cross-Axis Sensitivity ±2 ±5 %

ACCELEROMETER SENSITIVITY Each axis

Sensitivity at XFILT, YFILT 769 820 885 LSB/g
Sensitivity Change due to Temperature2 Delta from 25°C ±8 LSB

ZERO g BIAS LEVEL Each axis

0 g Voltage at XFILT, YFILT 1905 2048 2190 LSB
0 g Offset vs. Temperature ±0.14 LSB/°C

ACCELEROMETER NOISE PERFORMANCE

Noise Density At 25°C 110 μg/√Hz rms

ACCELEROMETER FREQUENCY RESPONSE3

CX, CY Range4 0 10 μF
R

Tolerance 24 32 40 kΩ

FILT

Sensor Resonant Frequency 5.5 kHz

ACCELEROMETER SELF-TEST

Logic Input Low 0.2 × VCC V
Logic Input High 0.8 × VCC V
ST Input Resistance to COM 30 50 kΩ
Output Change at X

OUT

5

, Y

Self-Test 0 to Self-Test 1 323 614 904 LSB

OUT

TEMPERATURE SENSOR

Accuracy VCC = 3 V to 5.25 V ±2 °C
Resolution 10 Bits
Update Rate 400 μs
Temperature Conversion Time 25 μs

DIGITAL INPUT

Input High Voltage (V
V
Input Low Voltage (V

) VCC = 4.75 V to 5.25 V 2.4 V

INH

= 3.0 V to 3.6 V 2.1 V

CC

) VCC = 3.0 V to 5.25 V 0.8 V

INL

Input Current VIN = 0 V or VCC −10 +1 +10 μA
Input Capacitance 10 pF

DIGITAL OUTPUT

Output High Voltage (VOH) I
Output Low Voltage (VOL) I

= 200 μA, VCC = 3.0 V to 5.25 V VCC − 0.5 V

SOURCE

= 200 μA 0.4 V

SINK

POWER SUPPLY

Operating Voltage Range 3.0 5.25 V
Quiescent Supply Current f

= 50 kSPS 1.5 2.0 mA

SCLK

Power-Down Current 1.0 mA
Turn-On Time6 C

1

Guaranteed by measurement of initial offset and sensitivity.

2

Defined as the output change from ambient-to-maximum temperature or ambient-to-minimum temperature.

3

Actual bandwidth response controlled by user-supplied external capacitor (CX, CY).

4

Bandwidth = 1/(2π × 32 kΩ × (2200 pF + C)). For CX, CY = 0 μF, bandwidth = 2260 Hz. For CX, CY = 10 μF, bandwidth = 0.5 Hz. Minimum/maximum values not tested.

5

Self-test response changes as the square of VCC.

6

Larger values of CX, CY increase turn-on time. Turn-on time is approximately 160 × (0.0022 μF + Cx + Cy) + 4 ms, where CX, CY are in μF.

, CY = 0.1 μF 20 ms

X

Rev. B | Page 3 of 16

g

ADIS16003 Data Sheet

TIMING SPECIFICATIONS

TA = −40°C to +125°C, acceleration = 0 g, unless otherwise noted.

Table 2.

Parameter

f

SCLK

1, 2

3

V

10 10 kHz min

= 3.3 V VCC = 5 V Unit Description

CC

2 2 MHz max
t

14.5 × t

CONVER T

t

1.5 × t

ACQ

t1 10 10 ns min

4

t

60 30 ns max

2

4

t

100 75 ns max Data access time after SCLK falling edge

3

14.5 × t

SCLK

1.5 × t

SCLK

SCLK

Throughput time = t

SCLK

/CS to SCLK setup time

TCS
Delay from TCS

+ t

CONVER T

ACQ

= 16 t

SCLK

/CS until DOUT three-state disabled

t4 20 20 ns min Data setup time prior to SCLK rising edge
t5 20 20 ns min Data hold time after SCLK rising edge
t6 0.4 × t
t7 0.4 × t

5

t

80 80 ns max

8

6

t

5 5 μs typ Power-up time from shutdown

9

1

Guaranteed by design. All input signals are specified with tr and tf = 5 ns (10% to 90% of VCC) and timed from a voltage level of 1.6 V. The 3.3 V operating range spans

from 3.0 V to 3.6 V. The 5 V operating range spans from 4.75 V to 5.25 V.

2

See Figure 3 and Figure 4.

3

Mark/space ratio for the SCLK input is 40/60 to 60/40.

4

Measured with the load circuit in Figure 2 and defined as the time required for the output to cross 0.4 V or 2.0 V with V

2.4 V with V

5

t8 is derived from the measured time taken by the data outputs to change 0.5 V when loaded with the circuit in Figure 2. The measured number is then extrapolated

back to remove the effects of charging or discharging the 50 pF capacitor. This means that the time, t8, quoted in the timing characteristics is the true bus relinquish
time of the part and is independent of the bus loading.

6

Shut-down recovery time denotes the time it takes to start producing samples and does not account for the recovery time of the sensor, which is dependent on the

overall bandwidth.

= 5.0 V.

CC

0.4 × t

SCLK

0.4 × t

SCLK

ns min SCLK high pulse width

SCLK

ns min SCLK low pulse width

SCLK

/CS rising edge to DOUT high impedance

TCS

= 3.3 V and time for an output to cross 0.8 V or

CC

Rev. B | Page 4 of 16

Data Sheet ADIS16003

T

CIRCUIT AND TIMING DIAGRAMS

O OUTPUT

PIN

50pF

C

200µA I

L

200µA I

OL

1.6V

OH

05463-002

Figure 2. Load Circuit for Digital Output Timing Specifications

t

ACQ

CS

t

1

SCLK

THREE-STATE THREE-STATE

DOUT

DIN

t

2

1

t

4

DONTC

t

5

t

6

234

t

7

4 LEADING ZEROS

ZERO ZERO ZERO ADD0 ONE ZERO PM0

56 15

Figure 3. Accelerometer Serial Interface Timing Diagram

t

3

DB11

t

CONVERT

DB10

16

DB9 DB0

t

8

05463-003

TCS

t

1

SCLK

THREE­STATE THREE-STATE

DOUT

1

LEADING

ZERO

t

6

234

t

3

t

7

DB9 DB8

11 15

DB0

16

t

8

DIN

05463-004

Figure 4. Temperature Serial Interface Timing Diagram

Rev. B | Page 5 of 16

ADIS16003 Data Sheet

ABSOLUTE MAXIMUM RATINGS

Table 3.

Parameter Rating

Acceleration (Any Axis, Unpowered) 3500 g
Acceleration (Any Axis, Powered) 3500 g
VCC −0.3 V to +7.0 V
All Other Pins (COM − 0.3 V) to (VCC + 0.3 V)
Output Short-Circuit Duration

(Any Pin to Common)

Indefinite
Operating Temperature Range −40°C to +125°C
Storage Temperature Range −65°C to +150°C

Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.

Table 4. Package Characteristics

Package Type θJA θ

Device Weight

JC

12-Terminal LGA 200°C/W 25°C/W 0.3 grams

3.1865

1.797
8×

3.594

6.373
4×

2×

1.127
12×

7.2mm × 7.2mm S TACKED LGA. ALL DIMENSIONS IN mm.

Figure 5. Second-Level Assembly Pad Layout

8×

0.670
8×

0.500
12×

05463-023

ESD CAUTION

Rev. B | Page 6 of 16

Data Sheet ADIS16003

K

PIN CONFIGURATION AND FUNCTION DESCRIPTIONS

CC

CS

V

1012 11

9

XFILT

TCS

SCL

1

ADIS16003

DOUT

3

DIN

NC = NO CONNECT

TOP VIEW

(Not to S cale)

4

NC

COM

Figure 6. Pin Configuration

82

YFILT

7

NC

65

ST

05463-005

Table 5. Pin Function Descriptions

Pin No. Mnemonic Description

1

TCS

Temperature Chip Select. Active low logic input. This input frames the serial data transfer for the
temperature sensor output.

2 DOUT

Data Out, Logic Output. The conversion of the ADIS16003 is provided on this output as a serial data stream.
The bits are clocked out on the falling edge of the SCLK input.

3 DIN

Data In, Logic Input. Data to be written into the control register of the ADIS16003 is provided on this input and

is clocked into the register on the rising edge of SCLK.
4 COM Common. Reference point for all circuitry on the ADIS16003.
5, 7 NC No Connect.
6 ST Self-Test Input. Active high logic input. Simulates a nominal 0.75 g test input for diagnostic purposes.
8 YFILT

Y-Channel Filter Node. Used in conjunction with an optional external capacitor to band limit the ac signal

from the accelerometer.
9 XFILT

X-Channel Filter Node. Used in conjunction with an optional external capacitor to band limit the ac signal

from the accelerometer.
10

CS

Chip Select. Active low logic input. This input provides the dual function of initiating the accelerometer

conversions on the ADIS16003 and frames the serial data transfer for the accelerometer output.
11 VCC Power Supply Input. The VCC range for the ADIS16003 is from 3.0 V to 5.25 V.
12 SCLK

Serial Clock, Logic Input. SCLK provides the serial clock for accessing data from the part and writing serial data

to the control register. This clock input is also used as the clock source for the conversion process of the

ADIS16003.

Rev. B | Page 7 of 16

ADIS16003 Data Sheet

TYPICAL PERFORMANCE CHARACTERISTICS

890

40

870

850

830

810

SENSITIVITY (LSB/g)

790

770

–200 20406080100–40

TEMPERATURE (°C)

125

Figure 7. Sensitivity vs. Temperature (ADIS16003 Soldered to PCB)

2200

2150

2100

2050

2000

BIAS LEVEL (LSB)

1950

1900

–40

–20 0 20 40 60 80 100

TEMPERATURE (°C)

125

Figure 8. Zero g Bias vs. Temperature

2200

2150

2100

2050

2000

BIAS LEVEL (LSB)

1950

1900

2.8

3.0 3.2 3.4 3.6 3.8 4.0 4.2 4.4 4.6 4.8 5.0 5.2
VCC (V)

5.4

Figure 9. Zero g Bias vs. Supply

35

30

25

20

15

10

PERCENTAGE OF POPULATI ON

5

05463-006

0

1900

1929 1958 1987 2016 2045 2074 2103 2132 2161 2190

OUTPUT (LSB)

05463-009

Figure 10. X-Axis Zero g Bias at 25°C

40

35

30

25

20

15

10

PERCENTAGE OF POPULATI ON

5

05463-007

0

1990

1929 1958 1987 2016 2045 2074 2103 2132 2161 2190

OUTPUT (LSB)

05463-010

Figure 11. Y-Axis Zero g Bias at 25°C

45

40

35

30

25

20

15

10

PERCENTAGE OF POPULATI ON

5

05463-008

0

60 70 80 90 100 110 120 130 140 150

X-AXIS NOISE DENSITY (µg/ Hz)

05463-011

Figure 12. X-Axis Noise Density at 25°C

Rev. B | Page 8 of 16

Data Sheet ADIS16003

50

40

30

20

10

PERCENTAGE OF POPULATI ON

0

60 70 80 90 100 110 120 130 140 150

Y-AXIS NOISE DENSITY (mg/ Hz)

Figure 13. Y-Axis Noise Density at 25°C

35

30

25

20

15

10

PERCENTAGE OF POPULATI ON

5

0

–4.5 –3.5 –2.5 –1.5 –0.5 0.5 1.5 2.5 3.5 4.5 5.5

PERCENT SENSITIVITY (% )

Figure 14. Z vs. X Cross-Axis Sensitivity

40

05463-012

05463-013

60

50

40

30

20

PERCENTAGE OF POPULATI ON

10

0

400 450 500 550 600 650 700 750 800

350 850

OUTPUT (LSB)

Figure 16. Self-Test at 25°C, V

at 5.0 V

CC

45

40

35

30

25

20

15

10

PERCENTAGE OF POPULATI ON

5

0

180 195 210 225 240 255 270 285 300

OUTPUT (LSB)

Figure 17. Self-Test at 25°C, V

at 3.3 V

CC

750

315

05463-015

05463-016

35

30

25

20

15

10

PERCENTAGE OF POPULATI ON

5

0

–4.5 –3.5 –2.5 –1.5 –0.5 0.5 1.5 2.5 3.5 4.5 5.5

PERCENT SENSITIVITY (% )

Figure 15. Z vs. Y Cross-Axis Sensitivity

05463-014

Rev. B | Page 9 of 16

700

)

g

650

600

550

SELF-TEST LEVEL (LSB/

500

450

–200 20406080100

–40

TEMPERATURE (°C)

Figure 18. Self-Test vs. Temperature, V

05463-017

125

at 5.0 V

CC

ADIS16003 Data Sheet

800

700

600

500

400

300

SELF-TEST L E VEL (LSB)

200

100

VCC (V)

05463-018

5.42.8 3.0 3.2 3.4 3.6 3.8 4.0 4.2 4.4 4.6 4.8 5.0 5.2

Figure 19. Self-Test vs. Supply Voltage

1.8

1.7

1.6

1.5

1.4

1.3

SUPPLY CURRENT (mA)

1.2

1.1

1.0

TA = +125°C

TA = –40°C

VCC (V)

TA = +25°C

05463-019

5.42.8 3.0 3.2 3.4 3.6 3.8 4.0 4.2 4.4 4.6 4.8 5.0 5.2

Figure 20. Supply Current vs. Supply Voltage

90

80

70

60

50

40

30

20

PERCENTAGE OF POPULATI ON

10

0

1.15 1.20 1.25 1.30 1.35 1.40 1.45 1.50 1.55 1.60 1.65 1.70

3.3V

5V

CURRENT (µA)

Figure 21. Supply Current at 25°C

1.0

0.8

0.6

0.4

0.2

0

–0.2

–0.4

SAMPLING E RROR (dB)

–0.6

–0.8

–1.0

10

SAMPLE RATE (kSPS)

Figure 22. Sampling Error vs. Sample Rate

1.75

05463-020

05463-021

1001

Rev. B | Page 10 of 16

Data Sheet ADIS16003

THEORY OF OPERATION

The ADIS16003 is a low cost, low power, complete dual-axis
accelerometer with an integrated serial peripheral interface
(SPI) and an integrated temperature sensor whose output is
also available on the SPI interface. The ADIS16003 is capable
of measuring acceleration with a full-scale range of ±1.7 g
(minimum). It can also measure both dynamic acceleration
(vibration) and static acceleration (gravity).

ACCELEROMETER DATA FORMAT

The accelerometer data comes out in a 12-bit, offset-binary format.
See Tab le 6 for examples of this data format.

Table 6. Acceleration Data Format Examples

Acceleration (g) Decimal Hex Binary

+1.7 3442 0xD72 1101 0111 0010
+2/[phone]x802 1000 0000 0010
+1/[phone]x801 1000 0000 0001
0 2048 0x800 1000 0000 0000

−1/[phone]x7FF 0111 1111 1111

−2/[phone]x7FE 0111 1111 1110

−1.7 654 0x28E 0010 1000 1110

SELF-TEST

The ST pin controls the self-test feature. When this pin is set to VCC,
an electrostatic force is exerted on the beam of the accelerometer.
The resulting movement of the beam allows the user to test if
the accelerometer is functional. The typical change in output is
750 mg (corresponding to 614 LSB) for V

= 5.0 V. This pin can be

CC

left open-circuit or connected to common in normal use. The ST
pin should never be exposed to a voltage greater than V

+ 0.3 V.

CC

If the system design is such that this condition cannot be
guaranteed (for example, multiple supply voltages are present),
a low V

clamping diode between ST and VCC is recommended.

F

SERIAL INTERFACE

The serial interface on the ADIS16003 consists of five wire: CS,
TCS

, SCLK, DIN, and DOUT. Both accelerometer axes and the
temperature sensor data are available on the serial interface. The
CS

TCS

and

sensor outputs, respectively.

are used to select the accelerometer or temperature

CS

TCS

and

cannot be active at the

same time.
The SCLK input accesses data from the internal data registers.

ACCELEROMETER SERIAL INTERFACE

Figure 3 shows the detailed timing diagram for serial interfacing to
the accelerometer in the ADIS16003. The serial clock provides the
conversion clock.
process and also frames the serial data transfer for the
accelerometer output. The accelerometer output is sampled on the
second rising edge of the SCLK input after the falling edge of
The conversion requires 16 SCLK cycles to complete. The rising
edge of

CS

CS

initiates the data transfer and conversion

CS

.

puts the bus back into three-state. If CS remains low,

the next digital conversion is initiated. The details for the control
register bit functions are shown in . Tabl e 7

Accelerometer Control Register

MSB LSB

DONTC ZERO ZERO ZERO ADD0 ONE ZERO PM0

Table 7. Accelerometer Control Register Bit Functions

Bit Mnemonic Comments

7 DONTC Don’t care. Can be 1 or 0.
6 to 4 ZERO These bits should be held low.
3 ADD0

2 ONE This bit should be held high.
1 ZERO This bit should be held low.
0 PM0

This address bit selects the x-axis or
y-axis outputs. A 0 selects the x-axis;
a 1 selects the y-axis.

This bit selects the operation mode for
the accelerometer; set to 0 for normal
operation and 1 for power-down mode.

Power Down

By setting PM0 to 1 when updating the accelerometer
control register, the ADIS16003 goes into a shutdown mode.
The information stored in the control register is maintained
during shutdown. The ADIS16003 changes modes as soon as
the control register is updated. If the part is in shutdown mode
and PM0 is changed to 0, the part powers up on the 16th SCLK
rising edge.

ADD0

By setting ADD0 to 0 when updating the accelerometer control
register, the x-axis output is selected. By setting ADD0 to 1,
the y-axis output is selected.

ZERO

ZERO is defined as the Logic low level.

ONE

ONE is defined as the Logic high level.

DONTC

DONTC is defined as don’t care and can be a low or high
logic level.

Accelerometer Conversion Details

Every time the accelerometer is sampled, the sampling function
discharges the internal C

or CY filtering capacitors by up to 2%

X

of their initial values (assuming no additional external filtering
capacitors are added). The recovery time for the filter capacitor
to recharge is approximately 10 μs. Therefore, sampling the
accelerometer at a rate of 10 kSPS or less does not induce a
sampling error. However, as sampling frequencies increase
above 10 kSPS, one can expect sampling errors to attenuate
the actual acceleration levels.

Rev. B | Page 11 of 16

ADIS16003 Data Sheet

TEMPERATURE SENSOR SERIAL INTERFACE

Read Operation

Figure 4 shows the timing diagram for a serial read from the

TCS

temperature sensor. The
Ten bits of data and a leading zero are transferred during a read
operation. Read operations occur during streams of 16 clock
pulses. The serial data is accessed in a number of bytes if 10 bits
of data are being read. At the end of the read operation, the
DOUT line remains in the state of the last bit of data clocked
out until

TCS

goes high, at which time the DOUT line from

the temperature sensor goes three-state.

Write Operation

Figure 4 also shows the timing diagram for the serial write
to the temperature sensor. The write operation takes place at
the same time as the read operation. Data is clocked into the
control register on the rising edge of SCLK. DIN should remain
low for the entire cycle.

Temperature Sensor Control Register

MSB

ZERO ZERO ZERO ZERO ZERO ZERO ZERO ZERO

Table 8. Temperature Sensor Control Register Bit Functions

Bit Mnemonic Comments

7 to 0 ZERO All bits should be held low.

ZERO

ZERO is defined as the Logic low level.

Output Data Format

The output data format for the temperature sensor is twos
complement. Tabl e 9 shows the relationship between the
temperature and the digital output.

Table 9. Temperature Sensor Data Format

Temperature Digital Output (DB9 … DB0)

−40°C 11 0110 0000

−25°C 11 1001 1100

−0.25°C 11 1111 1111
0°C 00 0000 0000
+0.25°C 00 0000 0001
+10°C 00 0010 1000
+25°C 00 0110 0100
+50°C 00 1100 1000
+75°C 01 0010 1100
+100°C 01 1001 0000
+125°C 01 1111 0100

line enables the SCLK input.

LSB

Temperature Sensor Conversion Details

The ADIS16003 features a 10-bit digital temperature sensor
that allows an accurate measurement of the ambient device
temperature to be made.

The conversion clock for the temperature sensor is internally
generated so no external clock is required except when reading
from and writing to the serial port. In normal mode, an internal
clock oscillator runs the automatic conversion sequence. A
conversion is initiated approximately every 350 μs. At this time,
the temperature sensor wakes up and performs a temperature
conversion. This temperature conversion typically takes 25 μs,
at which time the temperature sensor automatically shuts down.
The result of the most recent temperature conversion is available
in the serial output register at any time. Once the conversion is
finished, an internal oscillator starts counting and is designed to
time out every 350 μs. The temperature sensor then powers up
and does a conversion. If the

TCS

is brought low every 350 μs
(±30%) or less, the same temperature value is output onto the
DOUT line every time without changing.

It is recommended that the

TCS

line not be brought low every
350 μs (±30%) or less. The ±30% covers process variation. The
TCS

should become active (high to low) outside this range.

The device is designed to autoconvert every 350 μs. If the
temperature sensor is accessed during the conversion process,
an internal signal is generated to prevent any update of the
temperature value register during the conversion. This prevents
the user from reading back spurious data. The design of this
feature results in this internal lockout signal being reset only at
the start of the next autoconversion. Therefore, if the

TCS

line
goes active before the internal lockout signal is reset to its inactive
mode, the internal lockout signal is not reset. To ensure that no
lockout signal is set, bring

TCS

low at a greater time than 350 μs
(±30%). As a result, the temperature sensor is not interrupted
during a conversion process.

In the automatic conversion mode, every time a read or write
operation takes place, the internal clock oscillator is restarted at
the end of the read or write operation. The result of the conver­sion is typically available 25 μs later. Reading from the device
before conversion is complete provides the same set of data.

POWER SUPPLY DECOUPLING

For most applications, a single 0.1 μF capacitor (CDC) adequately
decouples the accelerometer from noise on the power supply.
However, in some cases, particularly where noise is present at
the 140 kHz internal clock frequency (or any harmonic thereof),
noise on the supply can cause interference on the ADIS16003
output. If additional decoupling is needed, ferrite beads can be
inserted in the supply line of the ADIS16003. Additionally, a
larger bulk bypass capacitor (in the 1 μF to 22 μF range) can be
added in parallel to C

DC

.

Rev. B | Page 12 of 16

Data Sheet ADIS16003

SETTING THE BANDWIDTH

The ADIS16003 has provisions for band limiting the
accelerometer. Capacitors can be added at the XFILT pin
and the YFILT pin to implement further low-pass filtering for
antialiasing and noise reduction. The equation for the 3 dB
bandwidth is

f

= 1/(2π(32 kΩ) × (C

−3dB

(XFILT, YFILT)

or more simply,

f

= 5 μF/(C

−3dB

(XFILT, YFILT)

+ 2200 pF)

The tolerance of the internal resistor (R
as much as ±25% of its nominal value (32 kΩ); thus, the
bandwidth varies accordingly.

A minimum capacitance of 0 pF for C

Table 10. Filter Capacitor Selection, CXFILT and CYFILT

Bandwidth (Hz) Capacitor (μF)

1 4.7
10 0.47
50 0.10
100 0.047
200 0.022
400 0.01
2250 0

+ 2200 pF))

) can vary typically

FILT

and C

XFILT

YFILT

is allowable.

SELECTING FILTER CHARACTERISTICS: THE NOISE/BANDWIDTH TRADE-OFF

The accelerometer bandwidth selected ultimately determines
the measurement resolution (smallest detectable acceleration).
Filtering can be used to lower the noise floor, which improves
the resolution of the accelerometer. Resolution is dependent
on the analog filter bandwidth at XFILT and YFILT.

The ADIS16003 has a typical bandwidth of 2.25 kHz with no
external filtering. The analog bandwidth can be further
decreased to reduce noise and improve resolution.

The ADIS16003 noise has the characteristics of white Gaussian
noise, which contributes equally at all frequencies and is described
in terms of μg/√Hz (that is, the noise is proportional to the
square root of the bandwidth of the accelerometer). The user
should limit bandwidth to the lowest frequency needed by the
application to maximize the resolution and dynamic range of
the accelerometer.

With the single-pole, roll-off characteristic, the typical noise of
the ADIS16003 is determined by

rmsNoise = (110 μg/√Hz) × (√(BW × 1.6))

At 100 Hz, the noise is

rmsNoise = (110 μg/√Hz) × (√(100 × 1.6)) =1.4 mg

Often, the peak value of the noise is desired. Peak-to-peak noise
can only be estimated by statistical methods. Table 1 1 is useful
for estimating the probabilities of exceeding various peak
values, given the rms value.

Table 11. Estimation of Peak-to-Peak Noise

Percentage of Time Noise Exceeds

Peak-to-Peak Value

2 × rms 32
4 × rms 4.6
6 × rms 0.27
8 × rms 0.006

Nominal Peak-to-Peak Value (%)

Rev. B | Page 13 of 16

ADIS16003 Data Sheet

12

DIGITAL OUTPUT (IN LSBs)

X-AXIS: 1229
Y-AXIS: 2048

3 2 1

1011

8 97

89 7

1011

DIGITAL OUTPUT (IN LSBs)

X-AXIS: 2048
Y-AXIS: 2867

12

4

65

Top View

Not to Scale

4

321

6 5

DIGITAL OUTPUT (I N LSBs)

89 7

X-AXIS: 2 867
Y-AXIS: 2048

10 11

65

3 2 1

4

DIGITAL OUTPUT (IN LSBs)

X-AXIS: 2048
Y-AXIS: 1229

65

8 97

4

321

DIGITAL OUTPUT (I N LSBs)

X-AXIS: 2048
Y-AXIS: 2048

12

12

11

10

05463-024

Figure 23. Output Response vs. Orientation

Rev. B | Page 14 of 16

Data Sheet ADIS16003

APPLICATIONS INFORMATION

DUAL-AXIS TILT SENSOR

One of the most popular applications of the ADIS16003 is tilt
measurement. An accelerometer uses the force of gravity as an
input vector to determine the orientation of an object in space.
An accelerometer is most sensitive to tilt when its sensitive axis
is perpendicular to the force of gravity, that is, parallel to the
earth’s surface. At this orientation, its sensitivity to changes in tilt is
highest. When the accelerometer is oriented on axis to gravity,
near its +1 g or –1 g reading, the change in output acceleration per
degree of tilt is negligible. When the accelerometer is perpendicular
to gravity, its output changes nearly 17.5 mg per degree of tilt.
At 45°, its output changes at only 12.2 mg per degree and its
resolution declines.

Converting Acceleration to Tilt

When the accelerometer is oriented, so both its x-axis and
y-axis are parallel to the earth’s surface, it can be used as a
2-axis tilt sensor with a roll axis and a pitch axis. Once the
output signal from the accelerometer is converted to an
acceleration that varies between –1 g and +1 g, the output
tilt in degrees is calculated as follows:

PITCH = Asin(A
ROLL = Asin(A

/1 g)

X

/1 g)

Y

where:
A

is the acceleration along the x-axis.

X

A

is the acceleration along the y-axis.

Y

Be sure to account for overranges. It is possible for the
accelerometers to output a signal greater than ±1 g due
to vibration, shock, or other accelerations.

SECOND LEVEL ASSEMBLY

The ADIS16003 can be attached to the second level assembly
board using SN63 (or equivalent) or lead-free solder. IPC/
JEDEC J-STD-020 and J-STD-033 provide standard handling
procedures for these types of packages.

Rev. B | Page 15 of 16

ADIS16003 Data Sheet

OUTLINE DIMENSIONS

3.594
BSC

7.35

MAX

7.20
TYP

6 .373

BSC

(2×)

1.797
BSC

(8×)

9

(4×)

10 12

PIN 1
INDICATOR

1.00 BSC
(12×)

1

TOP VIEW

5.00
TYP

SIDE VIEW

3.70
MAX

0.200
MIN

(ALL SIDES)

7

BOTTOM VIEW

3

0.797 BSC

46

(8×)

0.373 BSC
(12×)

092407-C

Figure 24. 12-Terminal Land Grid Array [LGA]

(CC-12-1)

Dimensions shown in millimeters

ORDERING GUIDE

Model1 Temperature Range Package Description Package Option

ADIS16003CCCZ −40°C to +125°C 12-Terminal Land Grid Array (LGA) CC-12-1
ADIS16003/PCBZ Evaluation Board

1

Z = RoHS Compliant Part.

©2005-2012 Analog Devices, Inc. All rights reserved. Trademarks and
registered trademarks are the property of their respective owners.
D05463-0-3/12(B)

Rev. B | Page 16 of 16