Datasheet ADG821 Datasheet (Analog Devices)

Page 1
<1 Ω CMOS 1.8 V to 5.5 V,
a

FEATURES

0.8 Max On Resistance @125C
0.28 Max On Resistance Flatness @125C
1.8 V to 5.5 V Single Supply 200 mA Current Carrying Capability Automotive Temperature Range: –40C to +125C Rail-to-Rail Operation 8-Lead MSOP Package 33 ns Switching Times Typical Power Consumption (<0.01 W) TTL/CMOS Compatible Inputs Pin Compatible with ADG721/722/723
APPLICATIONS Power Routing Battery-Powered Systems Communication Systems Data Acquisition Systems Audio and Video Signal Routing Cellular Phones Modems PCMCIA Cards Hard Drives Relay Replacement
Dual SPST Switches
ADG821/ADG822/ADG823

FUNCTIONAL BLOCK DIAGRAM

ADG822
IN1
D2
S2
IN2
ADG821
S1
D1
S1
D1
IN2
SWITCHES SHOWN FOR A LOGIC “0”
IN1
D2
S2
ADG823
INPUT
S1
D1
IN2
IN1
D2
S2

GENERAL DESCRIPTION

The ADG821, ADG822, and ADG823 are monolithic CMOS SPST (single pole, single throw) switches. These switches are designed on an advanced submicron process that provides low power dissipation, yet gives high switching speed, low on resistance, and low leakage currents.
The ADG821, ADG822, and ADG823 are designed to operate from a single 1.8 V to 5.5 V supply, making them ideal for use in battery-powered instruments.
Each switch of the ADG821/ADG822/ADG823 conducts equally well in both directions when on. The ADG821, ADG822, and ADG823 contain two independent SPST switches.
The ADG821 and ADG822 differ only in that both switches are normally open and normally closed, respectively. In the ADG823, Switch 1 is normally open and Switch 2 is normally closed. The ADG823 exhibits break-before-make switching action.
The ADG821, ADG822, and ADG823 are available in an 8-lead MSOP package.
REV. 0
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices.

PRODUCT HIGHLIGHTS

1. Very Low On Resistance (0.5 Ω typ)
2. On Resistance Flatness (R
FLAT(ON)
) (0.15 Ω typ)
3. Automotive Temperature Range –40°C to +125°C
4. 200 mA Current Carrying Capability
5. Low Power Dissipation. CMOS construction ensures low power dissipation.
6. 8-Lead MSOP Package
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781/329-4700 www.analog.com Fax: 781/326-8703 © Analog Devices, Inc., 2002
Page 2
ADG821/ADG822/ADG823–SPECIFICATIONS
(VDD = 5 V ± 10%, GND = 0 V. All specifications
1
–40C to +125C, unless otherwise noted.)
–40C to –40C to
Parameter 25C +85C +125C
2
Unit Test Conditions/Comments
ANALOG SWITCH
Analog Signal Range 0 V to V On Resistance (R
) 0.5 typ VS = 0 V to VDD, IS = 100 mA;
ON
DD
V
0.6 0.7 0.8 Ω max Test Circuit 1
On Resistance Match Between
Channels (∆R
)0.16 Ω typ VS = 0 V to VDD, IS = 100 mA
ON
0.2 0.25 0.28 Ω max
On Resistance Flatness (R
FLAT(ON)
)0.15 Ω typ VS = 0 V to VDD, IS = 100 mA
0.23 0.26 0.3 Ω max
LEAKAGE CURRENTS V
Source OFF Leakage I
(OFF) ± 0.01 nA typ VS = 4.5 V/1 V, VD = 1 V/4.5 V;
S
DD
± 0.25 ± 3 ± 25 nA max Test Circuit 2
Drain OFF Leakage I
(OFF) ± 0.01 nA typ VS = 4.5 V/1 V, VD = 1 V/4.5 V;
D
± 0.25 ± 3 ± 25 nA max Test Circuit 2
Channel ON Leakage I
, IS (ON) ±0.01 nA typ VS = VD = 1 V, or VS = VD = 4.5 V;
D
± 0.25 ± 3 ± 25 nA max Test Circuit 3
DIGITAL INPUTS
Input High Voltage, V Input Low Voltage, V
INL
INH
2.0 V min
0.8 V max
Input Current
I
INL
or I
INH
0.005 µA typ VIN = V ± 0.1 µA max
CIN, Digital Input Capacitance 4 pF typ
DYNAMIC CHARACTERISTICS
t
ON
t
OFF
Break-Before-Make Time Delay, t
(ADG823 Only) 1 ns min V
Charge Injection 15 pC typ V
3
33 ns typ RL = 50 , CL = 35 pF, 45 48 52 ns max V
= 3 V; Test Circuit 4
S
11 ns typ RL = 50 , CL = 35 pF, 16 19 21 ns max V 32 ns typ RL = 50 , CL = 35 pF,
BBM
= 3 V; Test Circuit 4
S
= VS2 = 3 V; Test Circuit 5
S1
= 2.5 V; RS = 0 , CL = 1 nF;
S
Test Circuit 6
Off Isolation –52 dB typ R
= 50 , CL = 5 pF,
L
f =1 MHz; Test Circuit 7
Channel-to-Channel Crosstalk –82 dB typ R
= 50 , CL = 5 pF
L
f = 1 MHz; Test Circuit 9
Bandwidth –3 dB 24 MHz typ R
= 50 , CL = 5 pF;
L
Test Circuit 8
(OFF) 85 pF typ f =1 MHz
C
S
C
(OFF) 98 pF typ f =1 MHz
D
CD, CS (ON) 230 pF typ f =1 MHz
POWER REQUIREMENTS V
DD
Digital Inputs = 0 V or 5.5 V
I
DD
0.001 µA typ
1.0 2.0 µA max
NOTES
1
Temperature range: Automotive range: –40°C to +125°C.
2
On resistance parameters tested with IS = 10 mA.
3
Guaranteed by design, not subject to production test.
Specifications subject to change without notice.
= 5.5 V
or V
INL
= 5.5 V
INH
REV. 0–2–
Page 3
(VDD = 2.7 V to 3.6 V, GND = 0 V. All specifications –40C to +125C, unless otherwise noted.)
1
ADG821/ADG822/ADG823
–40C to – 40C to
Parameter 25C +85C +125C
2
Unit Test Conditions/Comments
ANALOG SWITCH
Analog Signal Range 0 V to V On Resistance (R
) 0.7 typ VS = 0 V to VDD, IS = 100 mA;
ON
DD
V
1.4 1.5 1.6 Ω max Test Circuit 1
On Resistance Match Between 0.16 Ω typ
Channels (∆R
On Resistance Flatness (R
LEAKAGE CURRENTS V
Source OFF Leakage I
) 0.2 0.25 0.28 max VS = 0 V to VDD, IS = 100 mA
ON
FLAT(ON)
(OFF) ± 0.01 nA typ VS = 3.3 V/1 V, VD = 1 V/3.3 V;
S
) 0.3 0.33 typ VS = 0 V to VDD, IS = 100 mA
DD
± 0.25 ± 3 ± 15 nA max Test Circuit 2
Drain OFF Leakage I
(OFF) ± 0.01 nA typ VS = 3.3 V/1 V, VD = 1 V/3.3 V;
D
± 0.25 ± 3 ± 25 nA max Test Circuit 2
Channel ON Leakage I
, IS (ON) ± 0.01 nA typ VS = VD = 1 V, or 3.3 V;
D
± 0.25 ± 3 ± 25 nA max Test Circuit 3
DIGITAL INPUTS
Input High Voltage, V Input Low Voltage, V
INL
INH
2.0 V min
0.8 V max
Input Current
I
INL
or I
INH
0.005 µA typ VIN = V ± 0.1 µA max
CIN, Digital Input Capacitance 4 pF typ
DYNAMIC CHARACTERISTICS
t
ON
t
OFF
Break-Before-Make Time Delay, t
(ADG823 Only) 1 ns min V
Charge Injection ± 2pC typ V
3
48 ns typ RL = 50 , CL = 35 pF, 67 74 78 ns max V
= 1.5 V; Test Circuit 4
S
12 ns typ RL = 50 , CL = 35 pF, 18 20 23 ns max V 40 ns typ RL = 50 , CL = 35 pF,
BBM
= 1.5 V; Test Circuit 4
S
= VS2 = 1.5V; Test Circuit 5
S1
=1.5 V; RS = 0 , CL = 1 nF;
S
Test Circuit 6
Off Isolation –52 dB typ R
= 50 , CL = 5 pF,
L
f = 1 MHz; Test Circuit 7
Channel-to-Channel Crosstalk –82 dB typ R
= 50 , CL = 5 pF,
L
f = 1 MHz; Test Circuit 9
Bandwidth –3 dB 24 MHz typ R
= 50 , CL = 5 pF;
L
Test Circuit 8
(OFF) 85 pF typ f =1 MHz
C
S
(OFF) 98 pF typ f =1 MHz
C
D
CD, CS (ON) 230 pF typ f =1 MHz
POWER REQUIREMENTS V
DD
Digital Inputs = 0 V or 3.6 V
I
DD
0.001 µA typ
1.0 2.0 µA max
NOTES
1
Temperature range: Automotive range: –40°C to +125°C.
2
On resistance parameters tested with IS = 10 mA.
3
Guaranteed by design, not subject to production test.
Specifications subject to change without notice.
= 3.6 V
INL
= 3.6 V
or V
INH
REV. 0
–3–
Spec RIGHT
Page 4
ADG821/ADG822/ADG823

ABSOLUTE MAXIMUM RATINGS

1
(TA = 25°C, unless otherwise noted.) V
to GND . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V
DD
Analog Inputs
Digital Inputs
2
. . . . . . . . . . . . . . . . . . . . . . . . . . .
2
. . . . . . . . . . . . . . . . . . –0.3 V to VDD + 0.3 V or
–0.3 V to VDD + 0.3 V or
30 mA, Whichever Occurs First
30 mA, Whichever Occurs First
Peak Current, S or D . . . . . . . . . . . . . . . . . . . . . . . . . . 400 mA
(Pulsed at 1 ms, 10% Duty Cycle max)
Continuous Current, S or D . . . . . . . . . . . . . . . . . . . . 200 mA
Operating Temperature Range
Automotive . . . . . . . . . . . . . . . . . . . . . . . –40°C to +125°C
Storage Temperature Range . . . . . . . . . . . . –65°C to +150°C
Junction Temperature (T
Package Power Dissipation . . . . . . . . . . . . . . (T
max) . . . . . . . . . . . . . . . . . . . 150°C
j
max – TA)/θ
j
8-Lead MSOP Package
θJAThermal Impedance . . . . . . . . . . . . . . . . . . . . . 206°C/W
Table I. Truth Table for the ADG821/ADG822
ADG821 INx ADG822 INx Switch x Condition
01OFF 10ON
θ
Thermal Impedance . . . . . . . . . . . . . . . . . . . . . . 44°C/W
JC
Lead Temperature, Soldering (10 sec) . . . . . . . . . . . . . 300°C
IR Reflow, Peak Temperature (<20 sec) . . . . . . . . . . . . 235°C
NOTES
1
Stresses above those listed under Absolute Maximum Ratings may cause perma­nent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those listed in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Only one absolute maximum rating may be applied at any one time.
2
Overvoltages at IN, S, or D will be clamped by internal diodes. Current should be limited to the maximum ratings given.
JA
Table II. Truth Table for the ADG823
IN1 IN2 Switch S1 Switch S2
0 0 OFF ON 0 1 OFF OFF 1 0 ON ON 1 1 ON OFF

ORDERING GUIDE

Model Option Temperature Range Brand
*
Package Description Package
ADG821BRM –40°C to +125°C SQB MSOP (microSmall Outline IC) RM-8 ADG822BRM –40°C to +125°C SRB MSOP (microSmall Outline IC) RM-8 ADG823BRM –40°C to +125°C SSB MSOP (microSmall Outline IC) RM-8
*
Branding on MSOP packages is limited to three characters due to space constraints.
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although the
WARNING!
ADG821/ADG822/ADG823 features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality.
ESD SENSITIVE DEVICE
REV. 0–4–
Page 5
ADG821/ADG822/ADG823

PIN CONFIGURATION

8-Lead MSOP
(RM-8)
1
S1
TOP VIEW
(Not to Scale)
2
D1
ADG821/
IN2
3
ADG822/
ADG823
4

TERMINOLOGY

V
DD
Most Positive Power Supply Potential
GND Ground (0 V) Reference
I
DD
Positive Supply Current
S Source Terminal. May be an input or output.
DDrain Terminal. May be an input or output.
IN Logic Control Input
R
ON
R
ON
R
FLAT(ON)
Ohmic Resistance between D and S
On Resistance Match between any Two Channels (i.e., R
Flatness is defined as the difference between the maximum and minimum value of on resistance as measured over the specified analog signal range.
I
(OFF) Source Leakage Current with the Switch OFF
S
I
(OFF) Drain Leakage Current with the Switch OFF
D
I
, IS (ON) Channel Leakage Current with the Switch ON
D
V
)Analog Voltage on Terminals D and S
D (VS
V
INL
V
INH
I
(I
INL
C
C
C
t
ON
t
OFF
t
BBM
) Input Current of the Digital Input
INH
(OFF) OFF Switch Source Capacitance
S
(OFF) OFF Switch Drain Capacitance
D
, CS (ON) ON Switch Capacitance
D
Maximum Input Voltage for Logic “0”
Minimum Input Voltage for Logic “1”
Delay between Applying the Digital Control Input and the Output Switching ON
Delay between Applying the Digital Control Input and the Output Switching OFF
OFF time or ON time measured between the 90% points of both switches, when switching from one address state to another.
Charge Injection It is a measure of the glitch impulse transferred from the digital input to the analog output during switching.
Crosstalk It is a measure of unwanted signal that is coupled through from one channel to another as a result
of parasitic capacitance.
Off Isolation A Measure of Unwanted Signal Coupling through an OFF Switch
Bandwidth The Frequency at which the Output Is Attenuated by –3 dBs
On Response The Frequency Response of the ON Switch
Insertion Loss The Loss due to the On Resistance of the Switch
V
8
DD
IN1
7
D2
6
S2GND
5
max – R
ON
ON
min)
REV. 0
–5–
Page 6
ADG821/ADG822/ADG823
–Typical Performance Characteristics
ON RESISTANCE –
0.8
0.7
0.6
0.5
0.4
0.3
0.2
0.1
0
0
VDD = 3.0V
VDD = 3.3V
VDD = 2.7V
VDD = 5.5V
12345
VD (VS) – V
TA = 25C
VDD = 4.5V
VDD = 5.0V
TPC 1. On Resistance vs. VD (VS)
0.8
0.7
0.6
0.5
0.4
0.3
ON RESISTANCE –
0.2
0.1
0
0
+125C
+85C
+25C
0.5 1.0 1.5 2.0 2.5 3.0
–40C
VDD = 3V
VD (VS) – V
TPC 4. On Resistance vs. VD (VS) for Different Temperatures
5.0
4.5
4.0
3.5
3.0
2.5
2.0
1.5
ON RESISTANCE –
1.0
0.5
0
0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8
5
0
VD (VS) – V
TA = 25C
VDD = 1.8V
TPC 2. On Resistance vs. VD (VS)
0.8 VDD = 5V
0.7
0.6
0.5
0.4
0.3
ON RESISTANCE –
0.2
–40C
0.1
0
0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0
0
+125C
+85C
+25C
VD (VS) – V
TPC 3. On Resistance vs. V
(VS)
D
for Different Temperatures
8
VDD = 5V, 3V
7
6
5
4
3
CURRENT – nA
2
1
0
–1
020 120
40 60 80 100
TEMPERATURE – C
IS, ID (ON)
ID (OFF)
TPC 5. Leakage Currents vs. Temperature
IS (OFF)
125
200
TA = 25C
150
100
50
V
= 3V
DD
0
–50
–100
CHARGE INJECTION – pC
–150
–200
0 0.5 3.0
1.0 1.5 2.0 2.5
VDD = 5V
Vs – V
TPC 6. Charge Injection vs. Source Voltage
3.5 4.0 4.5 5.0
60
TA = 25C
ON
VDD = 3V
VDD = 5V
VDD = 3V, 5V
TEMPERATURE – C
vs. Temperature
OFF
50
40
t
30
TIME – ns
20
t
OFF
10
0 –40 –20 0 20 40 60 80 100 1200
TPC 7. tON/t
0
VDD = 3V, 5V
TA = 25C
–10
–20
–30
–40
ATTENUATION – dB
–50
–60
–70
0.2
110
FREQUENCY – MHz
100
TPC 8. Off Isolation vs. Frequency
0
–1
–2
–3
–4
–5
–6
ATTENUATION – dB
–7
VDD = 3V, 5V
–8
TA = 25C
–9
0.1 1 10 FREQUENCY – MHz
100
TPC 9. On Response vs. Frequency
REV. 0–6–
Page 7
ADG821/ADG822/ADG823
FREQUENCY – Hz
0.045
100
THD – %
20
0.040
0.035
0.030
0.025
0.020
0.015
0.010
0.005
0.050
1K 10K
VS = 5V
RL = 600
V
P-P
= 2V
–10
–20
–30
–40
–50
–60
–70
–80
ATTENUATION – dB
–90
–100
–110
0.1 1 10 FREQUENCY – MHz
TPC 10. Crosstalk vs. Frequency
100
1.8
1.6
1.4
1.2
1.0
0.8
0.6
0.4
LOGIC THRESHOLD VOLTAGE – V
0.4
0
0
VIN RISING
VIN FALLING
1 234 5
VDD – V
TPC 11. Logic Threshold Voltage vs. Suppply Voltage
6
TPC 12. THD
REV. 0
–7–
Page 8
ADG821/ADG822/ADG823

Test Circuits

I
DS
V1
SD
V
S
RON = V1/I
DS
IS (OFF) ID (OFF)
SD
A
V
S
(ON)
I
A
V
D
NC
SD
NC = NO CONNECT
D
A
V
D
Test Circuit 1. On Resistance
V
S
V
V
S1 D1
S1
S2
S2
IN1, IN2
V
IN
0.1F
V
DD
V
GND
IN
DD
Test Circuit 2. Off Leakage
V
DD
0.1F
V
DD
SD
GND
Test Circuit 4. Switching Times
D2
R 50
V
OUT2
C
L2
L2
35pF
R
50
Test Circuit 3. On Leakage
t
IN
0V
0V
90%
0V
50% 50%
50% 50%
90% 90%
ON
50% 50%
90%
t
BBM
t
OFF
t
90%
90%
BBM
ADG821
V
IN
V
OUT
C
L
L
35pF
R
C
L1
50
L1
35pF
V
OUT1
V
V
IN
OUT
V
V
OUT1
OUT2
ADG822
V
Test Circuit 5. Break-Before-Make Time Delay, t
V
DD
V
DD
R
S
V
S
SD
IN
GND
C 1nF
V
OUT
L
SW ON
V
IN
V
OUT
Test Circuit 6. Charge Injection
(ADG823 only)
BBM
SW OFF
Q
= CL ∆V
INJ
OUT
V
OUT
REV. 0–8–
Page 9
ADG821/ADG822/ADG823
V
DD
0.1F
V
DD
IN
V
IN
S
GND
OFF ISOLATION = 20 LOG
Test Circuit 7. Off Isolation
NETWORK
ANALYZER
V
OUT
R
L
50
50
V
S
V
DD
0.1F
NETWORK
ANALYZER
50
D
V
OUT
V
S
50
V
S
V
OUT
R
L
50
IN
V
IN
V
DD
S
D
GND
INSERTION LOSS = 20 LOG
V
OUT
V
WITHOUT SWITCH
OUT
NETWORK ANALYZER
50
R
L
50
WITH SWITCH
V
S
V
OUT
Test Circuit 8. Bandwidth
V
DD
0.1F
V
DD
S1
S2
IN
GND
D
R 50
V
CHANNEL-TO-CHANNEL
CROSSTALK = 20
LOG
OUT
V
S
Test Circuit 9. Channel-to-Channel Crosstalk
REV. 0
–9–
Page 10
ADG821/ADG822/ADG823

OUTLINE DIMENSIONS

8-Lead MSOP Package [MSOP]
(RM-8)
Dimensions shown in millimeters
3.00
BSC
85
3.00 BSC
1
PIN 1
0.65 BSC
0.15
0.00
0.38
0.22
COMPLIANT TO JEDEC STANDARDS MO-187AA
BSC
4
SEATING
PLANE
4.90
1.10 MAX
0.23
0.08
8 0
0.80
0.40
REV. 0–10–
Page 11
–11–
Page 12
C02851–0–8/02(0)
–12–
PRINTED IN U.S.A.
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