Datasheet ADG729, ADG728 Datasheet (Analog Devices)

Page 1
S1
S8
SDADSCL
ADG728
S1A
DA
S4A
S1B
S4B
DB
ADG729
RESET
INPUT SHIFT
REGISTER
INPUT SHIFT
REGISTER
A0 A1 SDA SCL A0 A1
a
FEATURES 2-Wire Serial Interface
2.7 V to 5.5 V Single Supply
2.5 On Resistance
0.75 On-Resistance Flatness 100 pA Leakage Currents Single 8-to-1 Matrix Switch ADG728 Dual 4-to-1 Matrix Switch ADG729 Power-On Reset Small 16-Lead TSSOP Package
APPLICATIONS Data Acquisition Systems Communication Systems Relay Replacement Audio and Video Switching Automatic Test Equipment
GENERAL DESCRIPTION
The ADG728 and ADG729 are CMOS analog matrix switches with a serially controlled 2-wire interface. The ADG728 is an 8-channel matrix switch, while the ADG729 is a dual 4-channel matrix switch. On resistance is closely matched between switches and very flat over the full signal range. These parts can operate equally well as either multiplexers, demultiplexers or switch arrays and the input signal range extends to the supplies.
The ADG728 and ADG729 utilize a 2-wire serial interface that is compatible with the I external address pins (A0 and A1). This allows the 2 LSBs of the 7-bit slave address to be set by the user. Four of each of the devices can be connected to the one bus. The ADG728 also has a RESET pin that should be tied high if not in use.
Each channel is controlled by one bit of an 8-bit word. This means that these devices may be used in a number of different configurations; all, any, or none of the channels may be on at any one time.
On power-up of the device, all switches will be in the OFF con­dition and the internal shift register will contain all zeros.
All channels exhibit break-before-make switching action pre­venting momentary shorting when switching channels.
The ADG728 and ADG729 are available in 16-lead TSSOP packages.
2
C™ interface standard. Both have two
Serially-Controlled, Matrix Switches
ADG728/ADG729
FUNCTIONAL BLOCK DIAGRAMS
PRODUCT HIGHLIGHTS
1. 2-Wire Serial Interface.
2. Single Supply Operation. The ADG728 and ADG729 are fully specified and guaranteed with 3 V and 5 V supply rails.
3. Low On Resistance 2.5 typical.
4. Any configuration of switches may be on at any one time.
5. Guaranteed Break-Before-Make Switching Action.
6. Small 16-Lead TSSOP Package.
I2C is a trademark of Philips Corporation.
REV. 0
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781/329-4700 World Wide Web Site: http://www.analog.com Fax: 781/326-8703 © Analog Devices, Inc., 2000
Page 2
ADG728/ADG729–SPECIFICATIONS
1
(VDD = 5 V 10%, GND = 0 V, unless otherwise noted.)
B Version
–40ⴗC
Parameter 25C to +85C Unit Test Conditions/Comments
ANALOG SWITCH
Analog Signal Range 0 V to V On Resistance (R
) 2.5 typ VS = 0 V to VDD, IS = 10 mA;
ON
4.5 5 max Test Circuit 1 On-Resistance Match Between 0.4 typ V Channels (∆R On-Resistance Flatness (R
) 0.8 max
ON
) 0.75 typ VS = 0 V to VDD, IS = 10 mA
FLAT(ON)
1.2 max
LEAKAGE CURRENTS V
Source OFF Leakage I
Drain OFF Leakage I
Channel ON Leakage I
LOGIC INPUTS (A0, A1)
Input High Voltage, V Input Low Voltage, V Input Current
I
or I
INL
INH
(OFF) ± 0.01 nA typ VD = 4.5 V/1 V, VS = 1 V/4.5 V, Test Circuit 2
S
(OFF) ± 0.01 nA typ VD = 4.5 V/1 V, VD = 1 V/4.5 V, Test Circuit 3
D
, IS (ON) ± 0.01 nA typ VD = VS = 4.5 V/1 V, Test Circuit 4
D
2
INH
INL
± 0.1 ± 0.3 nA max
± 0.1 ± 1 nA max
± 0.1 ± 1 nA max
2.4 V min
0.8 V max
0.005 µA typ
± 0.1 µA max
DD
V
= 0 V to VDD, IS = 10 mA
S
= 5.5 V
DD
CIN, Input Capacitance 6 pF typ
INH
INL
2
0.7 V
DD
V
+ 0.3 V max
DD
–0.3 V min
0.3 V
DD
± 1.0 µA max
DD
2
0.6 V max I
2
V min
V max
V min
SINK
SINK
DD
= 3 mA = 6 mA
95 ns typ RL = 300 , CL = 35 pF, Test Circuit 5;
85 ns typ VS1 = 3 V, RL = 300 , CL = 35 pF;
140 ns max V
= 3 V
S1
130 ns max Test Circuit 5
D
8 ns typ RL = 300 , CL = 35 pF;
1ns minV
= VS2 = 3 V, Test Circuit 5
S1
= 2.5 V, RS = 0 , CL = 1 nF;
S
Test Circuit 6
LOGIC INPUTS (SCL, SDA)
Input High Voltage, V
Input Low Voltage, V
I
, Input Leakage Current 0.005 µA typ VIN = 0 V to V
IN
, Input Hysteresis 0.05 V
V
HYST
CIN, Input Capacitance 6 pF typ
LOGIC OUTPUT (SDA)
VOL, Output Low Voltage 0.4 V max I
DYNAMIC CHARACTERISTICS
t
ON
t
OFF
Break-Before-Make Time Delay, t
Charge Injection ±3 pC typ V
Off Isolation –55 dB typ RL = 50 , CL = 5 pF, f = 10 MHz;
–75 dB typ R
= 50 , CL = 5 pF, f = 1 MHz;
L
Test Circuit 8
Channel-to-Channel Crosstalk –55 dB typ RL = 50 , CL = 5 pF, f = 10 MHz;
–75 dB typ R
= 50 , CL = 5 pF, f = 1 MHz;
L
Test Circuit 7
–3 dB Bandwidth
ADG728 65 MHz typ R ADG729 100 MHz typ
= 50 , CL = 5 pF, Test Circuit 8
L
CS (OFF) 13 pF typ
(OFF)
C
D
ADG728 85 pF typ ADG729 42 pF typ , CS (ON)
C
D
ADG728 96 pF typ ADG729 48 pF typ
POWER REQUIREMENTS V
I
DD
N
OTES
1
Temperature range is as follows: B Version: –40°C to +85°C.
2
Guaranteed by design, not subject to production test.
Specifications subject to change without notice.
10 µA typ Digital Inputs = 0 V or 5.5 V
20 µA max
= 5.5 V
DD
–2 – REV. 0
Page 3
ADG728/ADG729
1
SPECIFICATIONS
Parameter 25C to +85C Unit Test Conditions/Comments
ANALOG SWITCH
Analog Signal Range 0 V to V On Resistance (R
On-Resistance Match Between 0.4 typ V Channels (∆R On-Resistance Flatness (R
LEAKAGE CURRENTS V
Source OFF Leakage I
Drain OFF Leakage I
Channel ON Leakage I
LOGIC INPUTS (A0, A1)
Input High Voltage, V Input Low Voltage, V Input Current
I
or I
INL
INH
CIN, Input Capacitance 3 pF typ
LOGIC INPUTS (SCL, SDA)
Input High Voltage, V
Input Low Voltage, V
I
, Input Leakage Current 0.005 µA typ VIN = 0 V to V
IN
V
, Input Hysteresis 0.05 V
HYST
CIN, Input Capacitance 3 pF typ
LOGIC OUTPUT (SDA)
VOL, Output Low Voltage 0.4 V max I
DYNAMIC CHARACTERISTICS
t
ON
t
OFF
Break-Before-Make Time Delay, t
Charge Injection ±3 pC typ V
Off Isolation –55 dB typ R
Crosstalk –55 dB typ R
–3 dB Bandwidth
ADG728 65 MHz typ R ADG729 100 MHz typ
C
(OFF) 13 pF typ
S
C
(OFF)
D
ADG728 85 pF typ ADG729 42 pF typ
C
, CS (ON)
D
ADG728 96 pF typ ADG729 48 pF typ
POWER REQUIREMENTS V
I
DD
NOTES
1
Temperature ranges are as follows: B Versions: –40°C to +85°C.
2
Guaranteed by design, not subject to production test.
Specifications subject to change without notice.
)6 typ VS = 0 V to VDD, IS = 10 mA;
ON
) 1.2 max
ON
FLAT(ON)
(OFF) ± 0.01 nA typ VS = 3 V/1 V, VD = 1 V/3 V, Test Circuit 2
S
(OFF) ± 0.01 nA typ VD = 3 V/1 V, VD = 1 V/3 V, Test Circuit 3
D
, IS (ON) ± 0.01 nA typ VD = VS = 3 V/1 V, Test Circuit 4
D
2
INH
INL
2
INH
INL
2
(VDD = 3 V 10%, GND = 0 V, unless otherwise noted.)
B Version
11 12 max Test Circuit 1
) 3.5 typ VS = 0 V to VDD, IS = 10 mA
± 0.1 ±0.3 nA max
± 0.1 ±1 nA max
± 0.1 ±1 nA max
0.005 µA typ
DD
2
130 ns typ RL = 300 , CL = 35 pF, Test Circuit 5;
115 ns typ RL = 300 , CL = 35 pF;
D
8 ns typ RL = 300 , CL = 35 pF;
–75 dB typ R
–75 dB typ R
10 µA typ Digital Inputs = 0 V or 3.3 V
–40ⴗC
DD
V
= 0 V to VDD, IS = 10 mA
S
= 3.3 V
DD
2.0 V min
0.4 V max
± 0.1 µA max
0.7 V
DD
V
+ 0.3 V max
DD
–0.3 V min
0.3 V
DD
± 1.0 µA max
V min
V max
DD
V min
= 3 mA
0.6 V max I
200 ns max V
180 ns max V
1ns minV
SINK
= 6 mA
SINK
= 2 V
S1
= 2 V, Test Circuit 5
S
= VS8 = 2 V, Test Circuit 5
S1
= 1.5 V, RS = 0 , CL = 1 nF;
S
Test Circuit 6
= 50 , CL = 5 pF, f = 10 MHz;
L
= 50 , CL = 5 pF, f = 1 MHz;
L
Test Circuit 8
= 50 , CL = 5 pF, f = 10 MHz;
L
= 50 , CL = 5 pF, f = 1 MHz;
L
Test Circuit 7
= 50 , CL = 5 pF, Test Circuit 8
L
= 3.3 V
DD
20 µA max
–3–REV. 0
Page 4
ADG728/ADG729
1
TIMING CHARACTERISTICS
(VDD = 2.7 V to 5.5 V. All specifications –40C to +85C, unless otherwise noted.)
Parameter Limit at T
f
SCL
t
1
t
2
t
3
t
4
t
5
t
6
2
400 kHz max SCL Clock Frequency
2.5 ms min SCL Cycle Time
0.6 ms min t
1.3 ms min t
0.6 ms min t
100 ns min t
0.9 ms max t
MIN
, T
MAX
Unit Conditions/Comments
, SCL High Time
HIGH
, SCL Low Time
LOW
, Start/Repeated Start Condition Hold Time
HD, STA
, Data Setup Time
SU, DAT
, Data Hold Time
HD, DAT
0ms min
t
7
t
8
t
9
0.6 ms min t
0.6 ms min t
1.3 ms min t
, Setup Time for Repeated Start
SU, STA
, Stop Condition Setup Time
SU, STO
, Bus Free Time Between a STOP Condition and
BUF
a Start Condition
t
10
t
11
C
b
4
t
SP
NOTES
1
See Figure 1.
2
A master device must provide a hold time of at least 300 ns for the SDA signal (referred to the VIH min of the SCL signal) in order to bridge the undefined region of the falling edge of SCL.
3
Cb is the total capacitance of one bus line in pF. tR and tF measured between 0.3 VDD and 0.7 VDD.
4
Input filtering on both the SCL and SDA inputs suppress noise spikes which are less than 50 ns.
Specifications subject to change without notice.
300 ns max tR, Rise Time of Both SCL and SDA when Receiving 20 + 0.1C
3
b
ns min
250 ns max tF, Fall Time of SDA when Receiving 300 ns max t 20 + 0.1C
3
b
ns min
, Fall Time of SDA when Transmitting
F
400 pF max Capacitive Load for Each Bus Line
50 ns max Pulsewidth of Spike Suppressed
SDA
SCL
t
9
t
4
START
CONDITION
t
3
t
10
t
6
t
START
CONDITION
t
11
2
t
5
Figure 1. 2-Wire Serial Interface Timing Diagram
–4 – REV. 0
t
7
REPEATED
START
CONDITION
t
4
t
1
t
8
STOP
CONDITION
Page 5
ADG728/ADG729
PIN FUNCTION DESCRIPTIONS
ADG728 ADG729 Mnemonic Function
1 1 SCL Serial Clock Line. This is used in conjunction with the SDA line to clock data into
the 8-bit input shift register. Clock rates of up to 400 kbit/s can be accommodated with this 2-wire serial interface.
2 RESET Active low control input that clears the input register and turns all switches to the
OFF condition.
3 3 SDA Serial Data Line. This is used in conjunction with the SCL line to clock data into
the 8-bit input shift register during the write cycle and used to read back 1 byte of data during the read cycle. It is a bidirectional open-drain data line which should be
pulled to the supply with an external pull-up resistor. 4, 5, 6, 7 4, 5, 6, 7 Sxx Source. May be an input or output. 8 8, 9 Dx Drain. May be an input or output. 9, 10, 11, 12 10, 11, 12, 13 13 14 V 14 15 GND Ground Reference. 15 2 A1 Address Input. Sets the second least significant bit of the 7-bit slave address. 16 16 A0 Address Input. Sets the least significant bit of the 7-bit slave address.
Sxx Source. May be an input or output.
DD
Power Supply Input. These parts can be operated from a supply of 2.7 V to 5.5 V.
PIN CONFIGURATIONS
ADG729
1
2
3
ADG729
4
TOP VIEW
5
(Not to Scale)
6
7
8
A0
16
15
14
V
DD
13
S1B
S2B
12
S3B
11
10
S4B
9
DB
SCL
RESET
SDA
S1
S2
S3
S4
D
ADG728
1
2
3
ADG728
4
TOP VIEW
5
(Not to Scale)
6
7
8
A0
16
A1
15
14
GND
V
13
DD
12
S5
S6
11
S7
10
S8
9
SCL
A1 GND
SDA
S1A
S2A
S3A
S4A
DA
ORDERING GUIDE
Model Temperature Range Package Description Package Option
ADG728BRU –40°C to +85°C Thin Shrink Small Outline Package (TSSOP) RU-16 ADG729BRU –40°C to +85°C Thin Shrink Small Outline Package (TSSOP) RU-16
–5–REV. 0
Page 6
ADG728/ADG729
WARNING!
ESD SENSITIVE DEVICE
ABSOLUTE MAXIMUM RATINGS
(TA = 25°C unless otherwise noted.)
VDD to GND . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V
Analog, Digital Inputs
2
. . . . . . . . . . –0.3 V to VDD + 0.3 V or
Peak Current, S or D . . . . . . . . . . . . . . . . . . . . . . . . . . 100 mA
(Pulsed at 1 ms, 10% Duty Cycle max)
Continuous Current, Each S . . . . . . . . . . . . . . . . . . . . . 30 mA
Continuous Current D, ADG729 . . . . . . . . . . . . . . . . . 80 mA
Continuous Current D, ADG728 . . . . . . . . . . . . . . . . 120 mA
Operating Temperature Range
Industrial (B Version) . . . . . . . . . . . . . . . . –40°C to +85°C
Storage Temperature Range . . . . . . . . . . . . –65°C to +150°C
Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . 150°C
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although the ADG728/ADG729 features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high-energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality.
1
30 mA, Whichever Occurs First
TSSOP Package
θ
Thermal Impedance . . . . . . . . . . . . . . . . . . . 150.4°C/W
JA
Thermal Impedance . . . . . . . . . . . . . . . . . . . . 27.6°C/W
θ
JC
Lead Temperature, Soldering (10 seconds) . . . . . . . . . . 300°C
IR Reflow, Peak Temperature . . . . . . . . . . . . . . . . . . . . 220°C
NOTES
1
Stresses above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those listed in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Only one absolute maximum rating may be applied at any one time.
2
Overvoltages at IN, S or D will be clamped by internal diodes. Current should be
limited to the maximum ratings given.
TERMINOLOGY
V
I
DD
DD
Most Positive Power Supply Potential.
Positive Supply Current.
GND Ground (0 V) Reference.
S Source Terminal. May be an input or output.
D Drain Terminal. May be an input or output.
V
(VS) Analog Voltage on Terminals D, S.
D
R
ON
R
ON
R
FLAT(ON)
Ohmic Resistance between D and S.
On Resistance Match Between any Two Chan­nels, i.e., R
max – RONmin.
ON
Flatness is defined as the difference between the maximum and minimum value of on resistance as measured over the specified analog signal range.
I
(OFF) Source Leakage Current with the Switch “OFF.”
S
I
(OFF) Drain Leakage Current with the Switch “OFF.”
D
I
, IS (ON) Channel Leakage Current with the Switch “ON.”
D
V
INL
V
INH
I
INL (IINH
C
(OFF) “OFF” Switch Source Capacitance. Measured
S
Maximum Input Voltage for Logic “0.”
Minimum Input Voltage for Logic “1.”
) Input Current of the Digital Input.
with reference to ground.
C
(OFF) “OFF” Switch Drain Capacitance. Measured
D
with reference to ground.
CD, CS (ON) “ON” Switch Capacitance. Measured with refer-
ence to ground.
C
IN
t
ON
Digital Input Capacitance.
Delay time between the 50% and 90% points of the STOP condition and the switch “ON” condition.
t
OFF
Delay time between the 50% and 90% points of the STOP condition and the switch “OFF” condition.
t
D
“OFF” time measured between the 80% points of both switches when switching from one switch to another.
Charge A measure of the glitch impulse transferred from Injection the digital input to the analog output during
switching.
Off Isolation A measure of unwanted signal coupling through
an “OFF” switch.
Crosstalk A measure of unwanted signal which is coupled
through from one channel to another as a result of parasitic capacitance.
Bandwidth The frequency at which the output is attenuated
by 3 dBs.
On Response The frequency response of the “ON” switch.
Insertion The loss due to the ON resistance of the switch. Loss
–6 – REV. 0
Page 7
Typical Performance Characteristics–ADG728/ADG729
8
7
6
5
4
3
ON RESISTANCE –
2
1
0
0
OR VS – DRAIN OR SOURCE VOLTAGE – V
V
D
VDD = 2.7V
VDD = 3.3V
12345
TA = 25ⴗC V
VDD = 4.5V
VDD = 5.5V
= 0V
SS
Figure 2. On Resistance as a Function
(VS) for Single Supply
of V
D
0.12
VDD = 5V
= 0V
ID (ON)
IS (OFF)
V
SS
= 25ⴗC
T
A
ID (OFF)
CURRENT – nA
0.04
0.08
0.12
0.08
0.04
0.00
0
1
2345
VD (VS) – Volts
Figure 5. Leakage Currents as a Func­tion of VD (VS)
8
+25ⴗC
VDD = 5V
= 0V
V
SS
7
6
5
4
3
ON RESISTANCE –
2
1
0
1
0
VD OR VS – DRAIN OR SOURCE VOLTAGE – V
+85ⴗC
–40ⴗC
2345
Figure 3. On Resistance as a Function of VD (VS) for Different Temperatures, Single Supply
0.12
VDD = 3V
= 0V
V
SS
T
A
ID (ON)
ID (OFF)
= 25ⴗC
2.52.01.51.00.5
3.0
CURRENT – nA
0.04
0.08
0.12
0.08
0.04
0.00
IS (OFF)
0
(VS) – Volts
V
D
Figure 6. Leakage Currents as a Func­tion of VD (VS)
8
+85
+25ⴗC
VDD = 3V
= 0V
V
SS
C
3.02.52.01.51.00.5
7
6
5
4
3
ON RESISTANCE –
2
1
0
0
VD OR VS – DRAIN OR SOURCE VOLTAGE – V
–40ⴗC
Figure 4. On Resistance as a Function of VD (VS) for Different Temperatures, Single Supply
CURRENT nA
0.05
0.35
0.30
0.25
0.20
0.15
0.10
0.05
0.00
ID (OFF)
15
25
35 45 55 65 75 85
TEMPERATURE – ⴗC
IS (OFF)
VDD = 5V V
= 0V
SS
ID (ON)
Figure 7. Leakage Currents as a Function of Temperature
0.35
VDD = 3V V
= 0V
SS
ID (ON)
CURRENT – nA
–0.05
0.30
0.25
0.20
0.15
0.10
0.05
0.00
ID (OFF)
IS (OFF)
15
25
35 45 55 65 75 85
TEMPERATURE – ⴗC
Figure 8. Leakage Currents as a Func­tion of Temperature
1m
TA = 25ⴗC
100
VDD = 5V
CURRENT – A
10
1
10k
FREQUENCY – Hz
VDD = 3V
100k 1M
Figure 9. Input Current vs. Switch­ing Frequency
–7–REV. 0
– pC
Q
20
10
0
VDD = 3V
10
20
30
40
VSS = 0V
0
1
2345
VOLTAGE – Volts
INJ
TA = 25ⴗC
VDD = 5V
VSS = 0V
Figure 10. Charge Injection vs. Source Voltage
Page 8
ADG728/ADG729
FREQUENCY – Hz
0
30k
ATTENUATION – dB
20
40
60
80
100
120
100k 1M 10M 100M
VDD = 5V T
A
= 25ⴗC
160
140
T
= 3V
OFF, VDD
120
100
80
TON, VDD = 5V
TIME – ns
60
40
20
0
40
20 0 20 40 8060
TEMPERATURE C
Figure 11. TON/T Temperature
0
VDD = 5V
= 25ⴗC
T
A
5
10
TON, VDD = 3V
T
OFF, VDD
Times vs.
OFF
ADG728
ADG729
= 5V
0
VDD = 5V
= 25ⴗC
T
A
20
40
60
80
ATTENUATION dB
100
120
100k 1M 10M 100M
30k
FREQUENCY – Hz
Figure 12. Off Isolation vs. Frequency
Figure 13. Crosstalk vs. Frequency
ATTENUATION dB
15
20
30k
100k 1M 10M 100M
FREQUENCY – Hz
Figure 14. On Response vs. Frequency
–8 – REV. 0
Page 9
ADG728/ADG729
GENERAL DESCRIPTION
The ADG728 and ADG729 are serially controlled, 8-channel and dual 4-channel matrix switches respectively. While provid­ing the normal multiplexing and demultiplexing functions, these devices also provide the user with more flexibility as to where their signal may be routed. Each bit of the serial word corre­sponds to one switch of the device. A Logic 1 in the particular bit position turns on the switch, while a Logic 0 turns the switch off. Because each switch is independently controlled by an indi­vidual bit, this provides the option of having any, all, or none of the switches ON. This feature may be particularly useful in the demultiplexing application where the user may wish to direct one signal from the drain to a number of outputs (sources). Care must be taken, however, in the multiplexing situation where a number of inputs may be shorted together (separated only by the small on resistance of the switch).
When changing the switch conditions, a new 8-bit word is writ­ten to the input shift register. Some of the bits may be the same as the previous write cycle, as the user may not wish to change the state of some switches. In order to minimize glitches on the output of these switches, the part cleverly compares the state of switches from the previous write cycle. If the switch is already in the ON condition, and is required to stay ON, there will be minimal glitches on the output of the switch.
POWER-ON RESET
On power-up of the device, all switches will be in the OFF con­dition and the internal shift register is filled with zeros and will remain so until a valid write takes place.
SERIAL INTERFACE 2-Wire Serial Bus
The ADG728/ADG729 are controlled via an I2C compatible serial bus. These parts are connected to this bus as a slave device (no clock is generated by the multiplexer).
The ADG728/ADG729 have different 7-bit slave addresses. The five MSBs of the ADG728 are 10011, while the MSBs of the ADG729 are 10001 and the two LSBs are determined by the state of the A0 and A1 pins.
The 2-wire serial bus protocol operates as follows:
1. The master initiates data transfer by establishing a START condition which is when a high-to-low transition on the SDA line occurs while SCL is high. The following byte is the address byte, which consists of the 7-bit slave address fol­lowed by a R/W bit (this bit determines whether data will be read from or written to the slave device).
The slave whose address corresponds to the transmitted address responds by pulling the SDA line low during the ninth clock pulse (this is termed the Acknowledge bit). At this stage, all other devices on the bus remain idle while the selected device waits for data to be written to or read from its serial register. If the R/W bit is high, the master will read from the slave device. However, if the R/W bit is low, the master will write to the slave device.
2. Data is transmitted over the serial bus in sequences of nine clock pulses (eight data bits followed by an acknowledge bit). The transitions on the SDA line must occur during the low period of SCL and remain stable during the high period of SCL.
3. When all data bits have been read or written, a STOP condition is established by the master. A STOP condition is defined as a low-to-high transition on the SDA line while SCL is high. In Write mode, the master will pull the SDA line high during the 10th clock pulse to establish a STOP condition. In Read mode, the master will issue a No Acknowledge for the ninth clock pulse (i.e., the SDA line remains high). The master will then bring the SDA line low before the tenth clock pulse and then high during the tenth clock pulse to establish a STOP condition.
See Figures 18 to 21 below for a graphical explanation of the serial interface.
A repeated write function gives the user flexibility to update the matrix switch a number of times after addressing the part only once. During the write cycle, each data byte will update the con­figuration of the switches. For example, after the matrix switch has acknowledged its address byte, and receives one data byte, the switches will update after the data byte, if another data byte is written to the matrix switch while it is still the addressed slave device, this data byte will also cause an switch configuration update. Repeat read of the matrix switch is also allowed.
INPUT SHIFT REGISTER
The input shift register is eight bits wide. Figure 15 illustrates the contents of the input shift register. Data is loaded into the device as an 8-bit word under the control of a serial clock input, SCL. The timing diagram for this operation is shown in Figure 1. The 8-bit word consists of eight data bits each controlling one switch. MSB (Bit 7) is loaded first.
DB7 (MSB)
S8 S7 S6 S5 S4 S3 S2 S1
DATA BITS
Figure 15. ADG728/ADG729 Input Shift Register Contents
DB0 (LSB)
–9–REV. 0
Page 10
ADG728/ADG729
WRITE OPERATION
When writing to the ADG728/ADG729, the user must begin with an address byte and R/W bit, after which the switch will acknowledge that it is prepared to receive data by pulling SDA low. This address byte is followed by the 8-bit word. The write operations for each matrix switch are shown in the figures below.
SCL
A1
ACK
BY
ADG728
START
COND
BY
MASTER
1
ADDRESS BYTE
SDA S8 S7 S6 S5 S4 S3 S2 S100 1 1 A0R/W
Figure 16. ADG728 Write Sequence
SCL
A1
ACK
BY
ADG729
START
COND
BY
MASTER
1
ADDRESS BYTE
SDA S8 S7 S6 S5 S4 S3 S2 S100 1 A0R/W
0
Figure 17. ADG729 Write Sequence
READ OPERATION
When reading data back from the ADG728/ADG729, the user must begin with an address byte and R/W bit, after which the matrix switch will acknowledge that it is prepared to transmit data by pulling SDA low. The readback operation is a single byte that consists of the eight data bits in the input register. The read operations for each part are shown in Figures 18 and 19.
SCL
A1
ACK
BY
ADG728
START
COND
BY
MASTER
1
ADDRESS BYTE
SDA S8 S7 S6 S5 S4 S3 S2 S100 1 A0R/W
1
Figure 18. ADG728 Readback Sequence
DATA BYTE
DATA BYTE
DATA BYTE
ACK
BY
ADG728
ACK
BY
ADG729
NO ACK
BY
MASTER
STOP
COND
BY
MASTER
STOP
COND
BY
MASTER
STOP
COND
BY
MASTER
SCL
A1
START
COND
BY
MASTER
1
ADDRESS BYTE
SDA S8 S7 S6 S5 S4 S3 S2 S100 1 A0R/W
0
Figure 19. ADG729 Readback Sequence
ACK
BY
ADG729
DATA BYTE
NO ACK
MASTER
BY
STOP
COND
BY
MASTER
–10– REV. 0
Page 11
MULTIPLE DEVICES ON ONE BUS
Figure 20 shows four ADG728s devices on the same serial bus. Each has a different slave address since the state of their A0 and A1 pins is different. This allows each Matrix Switch to be writ­ten to or read from independently. Because the ADG729 has a different address to the ADG728, it would be possible for four of each of these devices to be connected to the same bus.
ADG728/ADG729
TEST CIRCUITS
Test Circuit 1. On Resistance
MASTER
S
V
S
SDA SCL
A1
A0
ADG728
I
DS
V
1
RON = V1/I
R
P
R
P
V
DD
+5V
SDA SCL
A1
A0
ADG728
V
DD
SDA SCL
A1
A0
ADG728
Figure 20. Multiple ADG728s on the Same Bus
D
DS
V
DD
SDA SCL
A1
A0
V
DD
V
S1
S2
S8
V
S
DD
GND
Test Circuit 3. IS (OFF)
ADG728
D
SDA
SCL
ID (OFF)
A
V
D
IS (OFF)
A
V
S
V
D
Test Circuit 2. ID (OFF)
V
DD
V
DD
ADG728*
S2 THRU S7
GND
* SIMILAR CONNECTION FOR ADG729
V
S1
S8
S1
V
S8
D
R
L
300
V
DD
V
DD
S1
S2
S8
GND
D
S1
S8
V
S
Test Circuit 4. ID (ON)
C
L
35pF
SCL
V
S1
V
OUT
V
OUT
t
50%
90%
OFF
50%
90%
t
ON
Test Circuit 5. Switching Times and Break-Before-Make Times
V
DD
V
DD
GND
= V
V
S1
S8
V
OUT
80%
D
ID (ON)
A
V
D
t
OPEN
80%
–11–REV. 0
Page 12
ADG728/ADG729
V
DD
V
DD
ADG728*
R
S
S
V
S
INPUT LOGIC
SDA
* SIMILAR CONNECTION FOR ADG729
D
GND
SCL
Test Circuit 6. Charge Injection
C 1nF
SWITCH ON
OUT
SWITCH OFF
Q
INJ
= CL x ⌬V
OUT
V
L
V
OUT
V
DD
V
DD
ADG728*
50
S1
S2
V
S
* SIMILAR CONNECTION FOR ADG729
CHANNEL-TO-CHANNEL CROSSTALK = 20LOG
S8
GND
D
R
L
50
10(VOUT/VS
V
OUT
)
Test Circuit 7. Channel-to-Channel Crosstalk
OUTLINE DIMENSIONS
Dimensions shown in inches and (mm).
16-Lead TSSOP
(RU-16)
V
DD
V
DD
S1
S8
V
S
ADG728*
D
GND
*SIMILAR CONNECTION FOR ADG729
S1 IS SWITCHED OFF FOR OFF ISOLATION MEASURE­MENTS AND ON FOR BANDWIDTH MEASUREMENTS
OFF ISOLATION = 20LOG
INSERTION LOSS = 20LOG
10
10
R
L
50
(V
)
OUT/VS
V
OUT
WITHOUT SWITCH
V
OUT
V
OUT
WITH SWITCH
Test Circuit 8. Off Isolation and Bandwidth
C3833–2.5–4/00 (rev. 0) 01002
PIN 1
0.006 (0.15)
0.002 (0.05)
SEATING
PLANE
0.201 (5.10)
0.193 (4.90)
16 9
BSC
0.0118 (0.30)
0.0075 (0.19)
0.0256 (0.65)
0.177 (4.50)
0.169 (4.30)
81
0.0433 (1.10) MAX
–12–
0.256 (6.50)
0.246 (6.25)
0.0079 (0.20)
0.0035 (0.090)
PRINTED IN U.S.A.
8 0
0.028 (0.70)
0.020 (0.50)
REV. 0
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