2.7 V to 5.5 V power supply
Separate V
Selected charge pump currents
Dual modulus prescaler
ADF4116: 8/9
ADF4117/ADF4118: 32/33
3-wire serial interface
Digital lock detect
Power-down mode
Fast lock mode
APPLICATIONS
Base stations for wireless radio
(GSM, PCS, DCS, CDMA, WCDMA)
Wireless handsets
(GSM, PCS, DCS, CDMA, WCDMA)
Wireless LANs
Communications test equipment
CATV equipment
allows extended tuning voltage in 3 V systems
P
ADF4116/ADF4117/ADF4118
GENERAL DESCRIPTION
The ADF4116 family of frequency synthesizers can be used to
implement local oscillators in the up-conversion and downconversion sections of wireless receivers and transmitters. They
consist of a low-noise digital PFD (phase frequency detector), a
precision charge pump, a programmable reference divider,
programmable A and B counters, and a dual-modulus prescaler
(P/P + 1). The A (5-bit) and B (13-bit) counters, in conjunction
with the dual-modulus prescaler (P/P + 1), implement an
N divider (N = BP + A). In addition, the 14-bit reference
counter (R counter) allows selectable REFIN frequencies at the
PFD input. A complete PLL (phase-locked loop) can be
implemented if the synthesizer is used with an external loop
filter and VCO (voltage controlled oscillator).
Control of all the on-chip registers is via a simple 3-wire
interface. The devices operate with a power supply ranging
from 2.7 V to 5.5 V and can be powered down when not in use.
FUNCTIONAL BLOCK DIAGRAM
AV
DV
DD
DD
V
CPGND
P
ADF4116/ADF4117/ADF4118
REF
IN
CLK
DATA
LE
RF
A
IN
B
RF
IN
Rev. B
Information furnished by Analog Devices is believed to be accurate and reliable.
However, no responsibility is assumed by Analog Devices for its use, nor for any
infringements of patents or other rights of third parties that may result from its use.
Specifications subject to change without notice. No license is granted by implication
or otherwise under any patent or patent rights of Analog Devices. Trademarks and
registered trademarks are the property of their respective owners.
21-BIT
INPUT REGISTER
SD
FROM
FUNCTION LATCH
PRESCALER
P/P +1
19
OUT
N = BP + A
14-BIT
R COUNTER
R COUNTER
LATCH
FUNCTION
LATCH
A, B COUNTER
LATCH
13-BIT
B COUNTER
LOAD
LOAD
5-BIT
A COUNTER
14
13
5
18
DGNDAGNDCE
Figure 1.
REFERENCE
PHASE
FREQUENCY
DETECTOR
LOCK
DETECT
AV
DD
SD
OUT
CHARGE
PUMP
MUX
M3 M2 M1
FL
SWITCH
CP
HIGH Z
MUXOUT
O
FL
O
00392-B-001
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781.329.4700
Reference Input Frequency 5/100 5/100 MHz min/max For f < 5 MHz, ensure SR > 100 V/µs
Reference Input Sensitivity 0.4/AVDD 0.4/AVDD V p-p min/max AVDD = 3.3 V, biased at AVDD/2 4
3.0/AV
DD
3.0/AV
V p-p min/max AVDD = 5 V, biased at AVDD/2
DD
REFIN Input Capacitance 10 10 pF max
REFIN Input Current ±100 ±100 µA max
PHASE DETECTOR FREQUENCY5 55 55 MHz max
CHARGE PUMP
I
Sink/Source
CP
High Value 1 1 mA typ
Low Value 250 250 µA typ
Absolute Accuracy 2.5 2.5 % typ
ICP Three-State Leakage Current 1 1 nA max
Sink and Source Current Matching 3 3 % typ 0.5 V ≤ VCP ≤ VP– 0.5
ICP vs. VCP 2 2 % typ 0.5 V ≤ VCP ≤ VP– 0.5
ICP vs. Temperature 2 2 % typ VCP = VP/2
LOGIC INPUTS
V
, Input High Voltage 0.8 × DVDD 0.8 × DVDD V min
INH
V
, Input Low Voltage 0.2 × DVDD 0.2 × DVDD V max
INL
I
, Input Current ±1 ± 1 µA max
INH/IINL
CIN, Input Capacitance 10 10 pF max
Reference Input Current ±100 ± 100 µA max
LOGIC OUTPUTS
VOH, Output High Voltage DVDD – 0.4 DVDD – 0.4 V min IOH = 500 µA
VOL, Output Low Voltage 0.4 0.4 V max IOL = 500 µA
Rev. B | Page 3 of 28
ADF4116/ADF4117/ADF4118
Parameter B Version1 B Chips2 Unit Test Conditions/Comments
POWER SUPPLIES
AVDD 2.7/5.5 2.7/5.5 V min/V max
DVDD AVDD AVDD
VP AVDD/6.0 AVDD/6.0 V min/V max AVDD ≤ VP ≤ 6.0 V
IDD (AIDD + DIDD)
ADF4116 5.5 4.5 mA max 4.5 mA typical
ADF4117 5.5 4.5 mA max 4.5 mA typical
ADF4118 7.5 6.5 mA max 6.5 mA typical
IP 0.4 0.4 mA max TA = 25°C
Low-Power Sleep Mode 1 1 µA typ
NOISE CHARACTERISTICS
ADF4118 Normalized Phase Noise
7
Floor
Phase Noise Performance8 @ VCO output
ADF4116 540 MHz Output
ADF4117 900 MHz Output
ADF4118 900 MHz Output10 −90 −90 dBc/Hz typ @ 1 kHz offset and 200 kHz PFD frequency
ADF4117 836 MHz Output11 −78 −78 dBc/Hz typ @ 300 Hz offset and 30 kHz PFD frequency
ADF4118 1750 MHz Output12 −85 −85 dBc/Hz typ @ 1 kHz offset and 200 kHz PFD frequency
ADF4118 1750 MHz Output13 −65 −65 dBc/Hz typ @ 200 Hz offset and 10 kHz PFD frequency
ADF4118 1960 MHz Output14 −84 −84 dBc/Hz typ @ 1 kHz offset and 200 kHz PFD frequency
Spurious Signals
ADF4116 540 MHz Output10 −88/−99 −88/−99 dBc typ @ 200 kHz/400 kHz and 200 kHz PFD frequency
ADF4117 900 MHz Output10 −90/−104 −90/−104 dBc typ @ 200 kHz/400 kHz and 200 kHz PFD frequency
ADF4118 900 MHz Output
ADF4117 836 MHz Output11 −80/−84 −80/−84 dBc typ @ 30 kHz/60 kHz and 30 kHz PFD frequency
ADF4118 1750 MHz Output12 −88/−90 −88/−90 dBc typ @ 200 kHz/400 kHz and 200 kHz PFD frequency
ADF4118 1750 MHz Output13 −65/−73 −65/−73 dBc typ @ 10 kHz/20 kHz and 10 kHz PFD frequency
ADF4118 1960 MHz Output14 −80/−86 −80/−86 dBc typ @ 200 kHz/400 kHz and 200 kHz PFD frequency
1
Operating temperature range for the B version is −40°C to +85°C.
2
The B Chip specifications are given as typical values.
3
This is the maximum operating frequency of the CMOS counters.
4
AC coupling ensures that AVDD/2 bias. See Figure 35 for typical circuit.
5
Guaranteed by design. Sample tested to ensure compliance.
6
AVDD = DVDD = 3 V; RFIN for ADF4116 = 540 MHz; RFIN for ADF4117, ADF4118 = 900 MHz.
7
The synthesizer phase noise floor is estimated by measuring the in-band phase noise at the output of the VCO, PN
value) and 10logF
8
The phase noise is measured with the EVAL-ADF411xEB Evaluation Board and the HP8562E Spectrum Analyzer. The Spectrum Analyzer provides the REFIN for the
synthesizer (f
9
f
= 10 MHz; f
REFIN
10
f
= 10 MHz; f
REFIN
11
f
= 10 MHz; f
REFIN
12
f
= 10 MHz; f
REFIN
13
f
= 10 MHz; f
REFIN
14
f
= 10 MHz; f
REFIN
6
−213 −213 dBc/Hz typ
9
10
10
: PN
= PN
PFD
SYNTH
= 10 MHz @ 0 dBm).
REFOUT
= 200 kHz; Offset frequency = 1 kHz; fRF = 540 MHz; N = 2700; Loop Bandwidth = 20 kHz.
PFD
= 200 kHz; Offset frequency = 1 kHz; fRF = 900 MHz; N = 4500; Loop Bandwidth = 20 kHz.
PFD
= 30 kHz; Offset frequency = 300 Hz; fRF = 836 MHz; N = 27867; Loop Bandwidth = 3 kHz.
PFD
= 200 kHz; Offset frequency = 1 kHz; fRF = 1750 MHz; N = 8750; Loop Bandwidth = 20 kHz.
PFD
= 10 kHz; Offset frequency = 200 Hz; fRF = 1750 MHz; N = 175000; Loop Bandwidth = 1 kHz.
PFD
= 200 kHz; Offset frequency = 1 kHz; fRF = 1960 MHz; N = 9800; Loop Bandwidth = 20 kHz.
PFD
– 10logF
TOT
−89 −89 dBc/Hz typ @ 1 kHz offset and 200 kHz PFD frequency
−87 −87 dBc/Hz typ @ 1 kHz offset and 200 kHz PFD frequency
−91/−100 −91/−100 dBc typ @ 200 kHz/400 kHz and 200 kHz PFD frequency
– 20logN.
PFD
, and subtracting 20 logN (where N is the N divider
TOT
Rev. B | Page 4 of 28
ADF4116/ADF4117/ADF4118
TIMING CHARACTERISTICS
AVDD = DVDD = 3 V ± 10%, 5 V ± 10%; AVDD ≤ VP < 6.0 V; AGND = DGND = CPGND = 0 V; TA = T
Guaranteed by design, but not production tested.
Table 2.
Parameter Limit at T
MIN
to T
(B Version) Unit Test Conditions/Comments
MAX
t1 10 ns min DATA to CLOCK set-up time
t2 10 ns min DATA to CLOCK hold time
t3 25 ns min CLOCK high duration
t4 25 ns min CLOCK low duration
t5 10 ns min CLOCK to LE set-up time
t6 20 ns min LE pulse width
MIN
to T
, unless otherwise noted.
MAX
t
4
DB1
(CONTROL BIT C2)
DB0 (LSB)
(CONTROL BIT C1)
t
5
t
6
00392-B-002
CLOCK
DATA
t
1
DB20 (MSB)DB19DB2
LE
LE
t
t
3
2
Figure 2. Timing Diagram
Rev. B | Page 5 of 28
ADF4116/ADF4117/ADF4118
ABSOLUTE MAXIMUM RATINGS
TA = 25°C, unless otherwise noted.
Table 3.
Parameter Rating
AVDD to GND
AVDD to DVDD −0.3 V to +0.3 V
VP to GND −0.3 V to +7 V
VP to AVDD −0.3 V to +5.5 V
Digital I/O Voltage to GND −0.3 V to VDD + 0.3 V
Analog I/O Voltage to GND −0.3 V to VP + 0.3 V
REFIN, RFINA, RFINB to GND −0.3 V to VDD + 0.3 V
RFINA to RFINB ±320 mV
Operating Temperature Range
Industrial (B Version) −40°C to +85°C
Storage Temperature Range −65°C to +150°C
Maximum Junction Temperature 150°C
TSSOP θJA Thermal Impedance 150.4°C/W
Lead Temperature, Soldering
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those listed in the operational sections
of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
This device is a high performance RF integrated circuit with an
ESD rating of < 2 kV, and it is ESD sensitive. Proper precautions
should be taken for handling and assembly.
TRANSISTOR COUNT
6425 (CMOS) and 303 (bipolar).
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
Rev. B | Page 6 of 28
ADF4116/ADF4117/ADF4118
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
FL
CP
CPGND
AGND
RF
IN
RFINA
AV
REF
O
B
DD
IN
1
2
ADF4116/
3
ADF4117/
4
ADF4118
5
TOP VIEW
(Not to Scale)
6
7
8
16
15
14
13
12
11
10
9
V
P
DV
DD
MUXOUT
LE
DATA
CLK
CE
DGND
00392-B-003
Figure 3. Pin Configuration
Table 4. Pin Function Descriptions
Pin No. Mnemonic Description
1 FLO
Fast Lock Switch Output. This can be used to switch an external resistor to change the loop filter bandwidth. This
speeds up locking the PLL.
2 CP
Charge Pump Output. When enabled, this provides the ± I
to the external loop filter, which in turn drives the
CP
external VCO.
3 CPGND Charge Pump Ground. This is the ground return path for the charge pump.
4 AGND Analog Ground. This is the ground return path for the prescaler.
5 RFINB
Complementary Input to the RF Prescaler. This point should be decoupled to the ground plane with a small
bypass capacitor, typically 100 pF. See Figure 26.
6 RFINA Input to the RF Prescaler. This small signal input is ac-coupled from the VCO.
7 AVDD
8 REFIN
Analog Power Supply. This can range from 2.7 V to 5.5 V. Decoupling capacitors to the analog ground plane
should be placed as close as possible to this pin. AV
Reference Input. This is a CMOS input with a nominal threshold of V
must be the same value as DVDD.
DD
/2 and an equivalent input resistance
DD
of 100 kΩ. See Figure 25. The oscillator input can be driven from a TTL or CMOS crystal oscillator, or it can be
ac-coupled.
9 DGND Digital Ground.
10 CE
Chip Enable. A logic low on this pin powers down the device and puts the charge pump output into three-state
mode. Taking the pin high powers up the device depending on the status of the power-down bit F2.
11 CLK
Serial Clock Input. This serial clock is used to clock in the serial data to the registers. The data is latched into the
21-bit shift register on the CLK rising edge. This input is a high impedance CMOS input.
12 DATA
Serial Data Input. The serial data is loaded MSB first with the two LSBs as the control bits. This input is a high
impedance CMOS input.
13 LE
Load Enable, CMOS Input. When LE goes high, the data stored in the shift registers is loaded into one of the four
latches, the latch being selected using the control bits.
14 MUXOUT
This multiplexer output allows either the lock detect, the scaled RF, or the scaled reference frequency to be
accessed externally.
15 DVDD
16 VP
Digital Power Supply. This may range from 2.7 V to 5.5 V. Decoupling capacitors to the digital ground plane
should be placed as close as possible to this pin. DV
Charge Pump Power Supply. This should be greater than or equal to V
must have the same value as AVDD.
DD
. In systems where VDD is 3 V, this supply
DD
can be set to 5 V and used to drive a VCO with a tuning range of up to 6 V.
Rev. B | Page 7 of 28
ADF4116/ADF4117/ADF4118
TYPICAL PERFORMANCE CHARACTERISTICS
PARAM-TYPE DATA-FORMAT KEYWORD IMPEDANCE-
FREQUNIT
GHzSMAR50
FREQ MagS11AngS11
0.050.89207–2.0571
0.100.8886–4.4427
0.150.89022–6.3212
0.200.96323–2.1393
0.250.90566–12.13
0.300.90307–13.52
0.350.89318–15.746
0.400.89806–18.056
0.450.89565–19.693
0.500.88538–22.246
0.550.89699–24.336
0.600.89927–25.948
0.650.87797–28.457
0.700.90765–29.735
0.750.88526–31.879
0.800.81267–32.681
0.850.90357–31.522
0.900.92954–34.222
FREQ MagS11 AngS11
0.950.92087 –36.961
1.000.93788 –39.343
1.050.9512–40.134
1.100.93458 –43.747
1.150.94782 –44.393
1.200.96875 –46.937
1.250.92216 –49.6
1.300.93755 –51.884
1.350.96178 –51.21
1.400.94354 –53.55
1.450.95189 –56.786
1.500.97647 –58.781
1.550.98619 –60.545
1.600.95459 –61.43
1.650.97945 –61.241
1.700.98864 –64.051
1.750.97399 –66.19
1.800.97216 –63.775
Figure 4. S-Parameter Data for the ADF4118 RF Input (Up to 1.8 GHz)
Figure 19. ADF4118 Reference Spurs vs. Temperature
900 MHz, 200 kHz, 20 kHz
5
–5
–15
–25
–35
–45
–55
–65
–75
FIRST REFERENCE SPUR (dBc)
–85
–95
00392-B-017
–105
0
1
234
TURNING VOLTAGE
Figure 20. ADF4118 Reference Spurs (200 kHz) vs. V
VDD = 3V
V
= 5V
P
TUNE
00392-B-020
5
900 MHz, 200 kHz, 20 kHz
–60
–70
VDD = 3V
= 5V
V
P
–80
PHASE NOISE (dBc/Hz)
–90
–100
–20020406080100
–40
TEMPERATURE (°C)
Figure 18. ADF4118 Phase Noise vs. Temperature
900 MHz, 200 kHz, 20 kHz
00392-B-018
Rev. B | Page 10 of 28
–80
PHASE NOISE (dBc/Hz)
–90
020406080100
TEMPERATURE (°C)
Figure 21. ADF4118 Phase Noise vs. Temperature
836 MHz, 30 kHz, 3 kHz
00392-B-021
ADF4116/ADF4117/ADF4118
–60
–70
VDD = 3V
= 5V
V
P
3.0
2.5
2.0
–80
–90
FIRST REFERENCE SPUR (dBc)
–100
0
20406080100
TEMPERATURE (°C)
Figure 22. ADF4118 Reference Spurs vs. Temperature
836 MHz, 30 kHz, 3 kHz
1.2
1.0
0.8
0.6
0.4
0.2
0
(mA)
CP
I
–0.2
–0.4
–0.6
–0.8
–1.0
–1.2
01.0
0.51.52.0 2.53.0 3.54.55.0
VCP (Volts)
Figure 24. Charge Pump Output Characteristics
ADF4116, ADF4117, ADF4118
VP = 5V
SETTING: 1mA
I
CP
4.0
(mA)
1.5
DD
DI
1.0
0.5
00392-B-022
0.0
0
Figure 23. DI
50100150200
PRESCALER OUTPUT FREQUENCY (MHz)
vs. Prescaler Output Frequency
DD
00392-B-023
ADF4116, ADF4117, ADF4118
00392-B-024
Rev. B | Page 11 of 28
ADF4116/ADF4117/ADF4118
(
[
×+×
=
CIRCUIT DESCRIPTION
REFERENCE INPUT SECTION
The reference input stage is shown in Figure 25. SW1 and SW2
are normally closed switches; SW3 is normally open. When
power-down is initiated, SW3 is closed and SW1 and SW2 are
opened. This ensures that there is no loading of the REF
on power-down.
POWER-DOWN
CONTROL
100kΩ
NC
NO
SW2
SW3
REF
IN
NC
SW1
Figure 25. Reference Input Stage
BUFFER
TO R COUNTER
RF INPUT STAGE
The RF input stage is shown in Figure 26. It is followed by a
2-stage limiting amplifier to generate the CML clock levels
needed for the prescaler.
1.6V
AV
DD
500Ω500Ω
RFINA
RF
IN
BIAS
GENERATOR
B
IN
pin
00392-B-025
A AND B COUNTERS
The A and B CMOS counters combine with the dual-modulus
prescaler to allow a wide ranging division ratio in the PLL
feedback counter. The counters are specified to work when the
prescaler output is 200 MHz or less.
Pulse Swallow Function
The A and B counters, in conjunction with the dual-modulus
prescaler, make it possible to generate output frequencies that
are spaced only by the reference frequency divided by R. The
equation for the VCO frequency is as follows:
]
VCO
)
where:
f
is the output frequency of external voltage controlled
VCO
oscillator (VCO).
P is the preset modulus of dual-modulus prescaler.
B is the preset divide ratio of binary 13-bit counter (3 to 8191).
A is the preset divide ratio of binary 5-bit swallow counter
(0 to 31).
f
is the output frequency of the external reference frequency
REFIN
oscillator.
R is the preset divide ratio of binary 14-bit programmable
reference counter (1 to 16383).
REFIN
RfABPf
/
AGND
Figure 26. RF Input Stage
00392-B-026
PRESCALER (P/P + 1)
The dual-modulus prescaler (P/P + 1), along with the A and B
counters, enables the large division ratio, N, to be realized (N =
PB + A). The dual-modulus prescaler takes the CML clock from
the RF input stage and divides it down to a manageable frequency
for the CMOS A and B counters. The prescaler is programmable.
It can be set in software to 8/9 for the ADF4116 and to 32/33 for
the ADF4117 and ADF4118. It is based on a synchronous 4/5
core.
R COUNTER
The 14-bit R counter allows the input reference frequency to be
divided down to produce the input clock to the phase frequency
detector (PFD). Division ratios from 1 to 16,383 are allowed.
FROM RF
INPUT STAGE
N = BP + A
PRESCALER
P/P + 1
MODULUS
CONTROL
Figure 27. A and B Counters
13-BIT
B COUNTER
LOAD
LOAD
5-BIT
A COUNTER
TO PFD
00392-B-027
Rev. B | Page 12 of 28
ADF4116/ADF4117/ADF4118
PHASE FREQUENCY DETECTOR (PFD)
AND CHARGE PUMP
The PFD takes inputs from the R counter and N counter and
produces an output proportional to the phase and frequency
difference between them. Figure 28 is a simplified schematic.
The PFD includes a fixed delay element that sets the width of
the antibacklash pulse. This is typically 3 ns. This pulse ensures
that there is no dead zone in the PFD transfer function and
gives a consistent reference spur level.
V
P
CHARGE
PUMP
U1
CLR1
CLR2
U2
UP
Q1D1
CP
DELAY
DOWN
Q2D2
U3
CPGND
HI
R DIVIDER
HI
N DIVIDER
R DIVIDER
N DIVIDER
CP OUTPUT
Figure 28. PFD Simplified Schematic and Timing (In Lock)
00392-B-028
MUXOUT AND LOCK DETECT
The output multiplexer on the ADF4116 family allows the user
to access various internal points on the chip. The state of
MUXOUT is controlled by M3, M2, and M1 in the function
latch. Figure 33 shows the full truth table. Figure 29 shows the
MUXOUT section in block diagram form.
DV
DD
ANALOG LOCK DETECT
DIGITAL LOCK DETECT
R COUNTER OUTPUT
N COUNTER OUTPUT
SDOUT
CONTROLMUX
MUXOUT
DGND
Figure 29. MUXOUT Circuit
Lock Detect
MUXOUT can be programmed for both digital lock detect and
analog lock detect.
Digital lock detect is active high. It is set high when the phase
error on three consecutive phase detector cycles is less than
15 ns. It stays set high until a phase error of greater than 25 ns is
detected on any subsequent PD cycle.
The N channel open-drain analog lock detect should be
operated with an external pull-up resistor of 10 kΩ nominal.
When lock is detected, it is high with narrow low-going pulses.
INPUT SHIFT REGISTER
The ADF4116 family digital section includes a 21-bit input shift
register, a 14-bit R counter, and an 18-bit N counter, comprising
a 5-bit A counter and a 13-bit B counter. Data is clocked into
the 21-bit shift register on each rising edge of CLK. The data is
clocked in MSB first. Data is transferred from the shift register
to one of four latches on the rising edge of LE. The destination
latch is determined by the state of the two control bits (C2, C1)
in the shift register. These are the two LSBs, DB1 and DB0, as
shown in the timing diagram in Figure 2. The truth table for
these bits is shown in Figure 34. Table 5 summarized how the
latches are programmed.
Table 5. C2, C1 Truth Table
Control Bits
C2 C1 Data Latch
0 0 R Counter
0 1 N Counter (A and B)
1 0 Function Latch
1 1 Initialization Latch
With C2, C1 set to 1, 0, the on-chip function latch is
programmed. Figure 33 shows the input data format for
programming the function latch.
COUNTER RESET
DB2 (F1) is the counter reset bit. When this is 1, the R counter
and the A, B counters are reset. For normal operation, this bit
should be 0. On power-up, the F1 bit needs to be disabled, and
the N counter resumes counting in “close” alignment with the
R counter. (The maximum error is one prescaler cycle.)
POWER-DOWN
DB3 (PD1) and DB19 (PD2) on the ADF4116 family provide
programmable power-down modes. They are enabled by the
CE pin.
When the CE pin is low, the device is immediately disabled
regardless of the states of PD2 and PD1.
In the programmed asynchronous power-down, the device
powers down immediately after latching a 1 into the PD1 bit,
with the condition that PD2 is loaded with a 0.
In the programmed synchronous power-down, the device
power-down is gated by the charge pump to prevent unwanted
frequency jumps. Once the power-down is enabled by writing a
1 into the PD1 bit (on condition that a 1 is also loaded to PD2),
the device goes into power-down after the first successive
charge pump event.
When a power-down is activated (either synchronous or
asynchronous mode including CE pin-activated power-down),
the following events occur:
• All active dc current paths are removed.
• The R, N, and timeout counters are forced to their load
state conditions.
• The charge pump is forced into three-state mode.
• The digital clock detect circuitry is reset.
• The RF
• The oscillator input buffer circuitry is disabled.
• The input register remains active and capable of loading
and latching data.
input is debiased.
IN
MUXOUT CONTROL
The on-chip multiplexer is controlled by M3, M2, M1 on the
ADF4116 family. Figure 33 shows the truth table.
PHASE DETECTOR POLARITY
DB7 (F2) of the function latch sets the phase detector polarity.
When the VCO characteristics are positive, DB7 should be set
to 1. When they are negative, it should be set to 0.
CHARGE PUMP THREE-STATE
The DB8 bit puts the charge pump into three-state mode when
programmed to 1. It should be set to 0 for normal operation.
FASTLOCK ENABLE BIT
DB9 of the function latch is the Fastlock enable bit. Fastlock is
enabled only when DB9 is set to1.
FASTLOCK MODE BIT
DB11 of the function latch is the Fastlock mode bit. When
Fastlock is enabled, this bit determines which Fastlock mode is
used. If the Fastlock mode bit is 0, Fastlock Mode 1 is selected;
if the Fastlock mode bit is 1, Fastlock Mode 2 is selected.
If Fastlock is not enabled (DB9 = 0), DB11 (ADF4116)
determines the state of the FL
that programmed to DB11.
output. FLO state is the same as
O
Fastlock Mode 1
In the ADF4116 family, the output level of FLO is programmed
to a low state, and the charge pump current is switched to the
high value (1 mA). FL
filter and to ensure stability while in Fastlock by altering the
loop bandwidth.
The device enters Fastlock by having a 1 written to the CP Gain
bit in the N register. The device exits Fastlock by having a 0
written to the CP Gain bit in the N register.
is used to switch a resistor in the loop
O
Fastlock Mode 2
In the ADF4116 family, the output level of FLO is programmed
to a low state, and the charge pump current is switched to the
high value (1 mA). FL
filter and to ensure stability while in Fastlock by altering the
loop bandwidth.
The device enters Fastlock by having a 1 written to the CP gain
bit in the N register. The device exits Fastlock under the control
of the timer counter. After the timeout period determined by
the value in TC4–TC1, the CP gain bit in the N register is
automatically reset to 0, and the device reverts to normal mode
instead of Fastlock.
is used to switch a resistor in the loop
O
TIMER COUNTER CONTROL
In the ADF4116 family, the user has the option of switching
between two charge pump current values to speed up locking to
a new frequency.
When using the Fastlock feature with the ADF4116 family, the
normal sequence of events is as follows:
The user must make sure that Fastlock is enabled. Set DB9 of
the ADF4116 family to 1. The user must also choose which
Fastlock mode to use. As discussed in the previous section,
Rev. B | Page 19 of 28
ADF4116/ADF4117/ADF4118
Fastlock Mode 2 uses the values in the timer counter to
determine the timeout period before reverting to normal mode
operation after Fastlock. Fastlock Mode 2 is chosen by setting
DB11 of the ADF4116 family to 1.
The user must also decide how long to keep the high current
(1 mA) active before reverting to low current (250 µA). This is
controlled by the Timer Counter Control Bits DB14 to DB11
(TC4–TC1) in the function latch. The truth table is given in
Figure 33.
To program a new output frequency, simply program the A, B
counter latch with new values for A and B. At the same time, set
the CP gain bit to a 1, which sets the charge pump 1 mA for a
period of time determined by TC4–TC1. When this time is up,
the charge pump current reverts to 250 µA. At the same time,
the CP gain bit in the A, B counter latch is reset to 0 and is
ready for the next time that the user wants to change the
frequency.
INITIALIZATION LATCH
When C2, C1 = 1, 1, the initialization latch is programmed.
This is essentially the same as the function latch , that is,
programmed when C2, C1 = 1, 0.
However, when the initialization latch is programmed, an
additional internal reset pulse is applied to the R and N counters.
This pulse ensures that the N counter is at a load point when the
N counter data is latched, and that the device begins counting in
close phase alignment.
When the initialization latch is loaded, the following occurs:
The function latch contents are loaded.
An internal pulse resets the R, N, and timeout counters to load
state conditions and also three-states the charge pump. Note
that the prescaler band gap reference and the oscillator input
buffer are unaffected by the internal reset pulse, allowing close
phase alignment when counting resumes.
Latching the first N counter data after the initialization word
activates the same internal reset pulse. Successive N loads do
not trigger the internal reset pulse unless there is another
initialization.
CE Pin Method
1. Apply V
2.
Bring CE low to put the device into power-down. This is an
DD
.
asynchronous power-down in that it happens immediately.
3.
Program the function latch (10).
4.
Program the R counter latch (00).
5.
Program the N counter latch (01). Bring CE high to take the device out of power-down.
6.
The R and N counters resume counting in close alignment.
Note that after CE goes high, a duration of 1 µs may be required
for the prescaler band gap voltage and oscillator input buffer
bias to reach steady state.
If the latch is programmed for synchronous power-down (CE
pin is high; PD1 bit is high; PD2 bit is low), the internal pulse
also triggers this power-down. The prescaler reference and the
oscillator input buffer are unaffected by the internal reset pulse,
so close phase alignment is maintained when counting resumes.
When the first N counter data is latched after initialization, the
internal reset pulse is again activated. However, successive N
counter loads after this do not trigger the internal reset pulse.
DEVICE PROGRAMMING AFTER
INITIAL POWER-UP
After initial power-up, the device can be programmed by the
initialization latch method, the CE pin method, or the counter
reset method.
Initialization Latch Method
1. Apply V
2.
Program the initialization latch (11 in 2 LSBs of input
word). Make sure that F1 bit is programmed to 0.
3. Do an R load (00 in 2 LSBs).
4.
Do an N load (01 in 2 LSBs).
DD
.
CE can be used to power up and power down the device to check
for channel activity. The input register does not need to be reprogrammed each time the device is disabled and enabled as long
as it is programmed at least once after V
is initially applied.
CC
Counter Reset Method
1. Apply V
2.
Do a function latch load (10 in 2 LSBs). As part of this,
DD
.
load 1 to the F1 bit. This enables the counter reset.
Do an R counter load (00 in 2 LSBs).
3.
4.
Do an N counter load (01 in 2 LSBs). Do a function latch
load (10 in 2 LSBs). As part of this, load 0 to the F1 bit.
This disables the counter reset.
This sequence provides the same close alignment as the initialization method. It offers direct control over the internal reset.
Note that counter reset holds the counters at load point and
three-states the charge pump, but does not trigger synchronous
power-down. The counter reset method requires an extra
function latch load compared to the initialization latch method.
Rev. B | Page 20 of 28
ADF4116/ADF4117/ADF4118
APPLICATIONS
LOCAL OSCILLATOR FOR THE
GSM BASE STATION TRANSMITTER
Figure 35 shows the ADF4117/ADF4118 being used with a
VCO to produce the LO for a GSM base station transmitter.
The reference input signal is applied to the circuit at F
in this case, is terminated in 50 Ω. A typical GSM system has a
13 MHz TCXO driving the reference input without a 50 Ω
termination. To have a channel spacing of 200 kHz (the GSM
standard), the reference input must be divided by 65, using the
on-chip reference divider of the ADF4117/ADF1118.
REFIN
and,
SHUTDOWN CIRCUIT
The attached circuit in Figure 36 shows how to shut down both
the ADF4116 family and the accompanying VCO. The ADG702
switch goes open-circuit when a Logic 1 is applied to the IN
input. The low-cost switch is available in both SOT-23 and
MSOP packages.
DIRECT CONVERSION MODULATOR
In some applications, a direct conversion architecture can be
used in base station transmitters. Figure 37 shows the
combination available from ADI to implement this solution.
The charge pump output of the ADF4117/ADF1118 (Pin 2)
drives the loop filter. In calculating the loop filter component
values, a number of items need to be considered. In this
example, the loop filter was designed so that the overall phase
margin for the system is 45 degrees. Other PLL system
specifications are given below.
K
= 1 mA
D
K
= 12 MHz/V
V
Loop Bandwidth = 20 kHz
= 200 kHz
F
REF
N = 4500
Extra Reference Spur Attenuation = 10 dB
All of these specifications are needed and are used to produce
the loop filter components values shown in Figure 36.
The loop filter output drives the VCO, which, in turn, is fed back
to the RF input of the PLL synthesizer; it also drives the RF
output terminal. A T-circuit configuration provides 50 Ω
matching between the VCO output, the RF output, and the
RF
terminal of the synthesizer.
IN
In a PLL system, it is important to know when the system is in
locked mode. In Figure 35, this is accomplished by using the
MUXOUT signal from the synthesizer. The MUXOUT pin can
be programmed to monitor various internal signals in the
synthesizer. One of these is the LD or lock-detect signal.
The circuit diagram shows the AD9761 being used with the
AD8346. The use of dual integrated DACs, such as the AD9761
with specified ±0.02 dB and ±0.004 dB gain and offset matching
characteristics, ensures minimum error contribution (over
temperature) from this portion of the signal chain.
The local oscillator (LO) is implemented by using the
ADF4117/ADF4118. In this case, the OSC 3B1-13M0 provides
the stable 13 MHz reference frequency. The system is designed
for 200 kHz channel spacing and an output center frequency of
1960 MHz. The target application is a WCDMA base station
transmitter. Typical phase noise performance from this LO is
−85 dBc/Hz at a 1 kHz offset. The LO port of the AD8346 is
driven in single-ended fashion. LOIN is ac-coupled to ground
with the 100 pF capacitor, and LOIP is driven through the accoupling capacitor from a 50 Ω source. An LO drive level
between −6 dBm and −12 dBm is required. The circuit in Figure
37 gives a typical level of −8 dBm.
The RF output is designed to drive a 50 Ω load but must be
ac-coupled as shown in Figure 37. If the I and Q inputs are
driven in quadrature by 2 V p-p signals, the resulting output
power is approximately −10 dBm.
Rev. B | Page 21 of 28
ADF4116/ADF4117/ADF4118
RF
OUT
18Ω
18Ω
FREQUENCY
00392-B-035
F
REFIN
1000pF
51Ω*
SPI-COMPATIBLE SERIAL BUS
1000pF
V
DD
71516
AVDDDV
REF
IN
8
ADF4117/
ADF4118
CE
MUXOUT
CLK
DATA
LE
CPGND
AGND
349
DD
FL
RFINA
RF
IN
DGND
V
P
100pF
V
P
2
CP
0.15nF
1
O
10kΩ
14
LOCK
DETECT
100pF
6
5
B
100pF
DECOUPLING CAPACITORS (10F/10p) ON AVDD,DVDD,andVPOF THE
ADF4117/ADF4118 AND ON V
OMITTED FROM THE DIAGRAM FOR CLARITY.
3.3kΩ
27kΩ
1.5nF
51Ω**
*TO BE USED WHEN GENERATOR SOURCE IMPEDANCE IS 50Ω
**OPTIONAL MATCHING RESISTOR DEPENDING ON RF
V
CC
VCO190-902T
620pF
OF THE VCO190-920T HAVE BEEN
CC
100pF
18Ω
OUT
Figure 35. Local Oscillator for GSM Base Station
V
P
F
REFIN
V
DD
71516
AVDDDV
8
REF
IN
ADF4116/
ADF4117/
ADF4118
CPGND
AGND
349
POWER-DOWN CONTROL
V
CE
DD
P
FL
RFINA
RF
DGND
2
CP
1
O
10kΩ
100pF
6
5
B
IN
100pF
LOOP
FILTER
51Ω
DECOUPLING CAPACITORS AND INTERFACE SIGNALS HAVE
BEEN OMITTED FROM THE DIAGRAM FOR CLARITY.
Figure 36. Local Oscillator Shutdown Circuit
IN
V
GND
D
CC
V
S
ADG702
GND
VCO
DD
100pF
100pF
18Ω
18Ω
18Ω
RF
OUT
00392-B-036
Rev. B | Page 22 of 28
ADF4116/ADF4117/ADF4118
O
0.1µF
MODULATED
DIGITAL
DATA
SC 3B1-13M0
TCXO
SERIAL
DIGITAL
NTERFACE
REFIO
AD9761
TxDAC
FS ADJ
2kΩ
REF
IN
ADF4118
IOUTA
IOUTB
QOUTA
QOUTB
CP
RFINARFINB
680pF
LOW-PASS
FILTER
LOW-PASS
FILTER
10kΩ
1kΩ
6.8nF
18pF
VCO190-1960T
IBBP
IBBP
AD8346
QBBP
QBBP
LOINLOIP
100pF
18Ω
100pF
18Ω
100pF
18Ω
VOUT
100pF
RF
OUT
100pF
100pF
51Ω
POWER SUPPLY CONNECTIONS AND DECOUPLING CAPACITORS
ARE OMITTED FROM DIAGRAM FOR CLARITY.
00392-B-037
Figure 37. Direct Conversion Transmitter Solution
Rev. B | Page 23 of 28
ADF4116/ADF4117/ADF4118
INTERFACING
The ADF4116 family has a simple SPI-compatible serial interface for writing to the device. SCLK, SDATA, and LE control the
data transfer. When LE (latch enable) goes high, the 24 bits that
are clocked into the input register on each rising edge of SCLK
are transferred to the appropriate latch. See Figure 2 for the
timing diagram and Table 5 for the latch truth table.
The maximum allowable serial clock rate is 20 MHz. This means
that the maximum update rate possible for the device is 833 kHz
or one update every 1.2 microseconds. This is more than
adequate for systems that have typical lock times in hundreds of
microseconds.
ADuC812 Interface
Figure 38 shows the interface between the ADF4116 family and
the ADuC812 MicroConverter®. Since the ADuC812 is based
on an 8051 core, this interface can be used with any 8051-based
microcontroller. The MicroConverter is set up for SPI master
mode with CPHA = 0. To initiate the operation, the I/O port
driving LE is brought low. Each latch of the ADF4116 family
needs a 24-bit word. This is accomplished by writing three 8-bit
bytes from the MicroConverter to the device. When the third
byte has been written, the LE input should be brought high to
complete the transfer.
SCLOCK
ADuC812
Figure 38. ADuC812 to ADF4116 Family Interface
MOSI
I/O PORTS
SCLK
SDATA
ADF4116/
LE
ADF4117/
ADF4118
CE
MUXOUT
(LOCK DETECT)
00392-B-038
On first applying power to the ADF4116 family, it requires three
writes (one each to the R counter latch, the N counter latch, and
the initialization latch) for the output to become active.
I/O port lines on the ADuC812 are also used to control powerdown (CE input) and to detect lock (MUXOUT configured as
lock detect and polled by the port input).
When operating in the mode described, the maximum SCLOCK
rate of the ADuC812 is 4 MHz. This means that the maximum
rate at which the output frequency can be changed is 166 kHz.
ADSP-21xx Interface
Figure 39 shows the interface between the ADF4116 family and
the ADSP-21xx digital signal processor. The ADF4116 family
needs a 21-bit serial word for each latch write. The easiest way
to accomplish this using the ADSP-21xx family is to use the
autobuffered transmit mode of operation with alternate framing.
This provides a means for transmitting an entire block of serial
data before an interrupt is generated.
SCLK
ADSP-21xx
Figure 39. ADSP-21xx to ADF4116 Family Interface
DT
TFS
I/O FLAGS
SCLK
SDATA
ADF4116/
LE
ADF4117/
ADF4118
CE
MUXOUT
(LOCK DETECT)
00392-B-039
Set up the word length for 8 bits and use three memory
locations for each 24-bit word. To program each 21-bit latch,
store the three 8-bit bytes, enable the autobuffered mode, and
write to the transmit register of the DSP. This last operation
initiates the autobuffer transfer.
Rev. B | Page 24 of 28
ADF4116/ADF4117/ADF4118
OUTLINE DIMENSIONS
5.10
5.00
4.90
0.15
0.05
4.50
4.40
4.30
PIN 1
16
0.65
BSC
COPLANARITY
COMPLIANT TO JEDEC STANDARDS MO-153AB
0.10
0.30
0.19
9
81
1.20
MAX
SEATING
PLANE
6.40
BSC
0.20
0.09
8°
0°
0.75
0.60
0.45
Figure 40. 16-Lead Thin Shrink Small Outline Package [TSSOP]
(RU-16)
Dimensions shown in millimeters
ORDERING GUIDE
Model Temperature Range Package Description Package Option
ADF4116BRU
ADF4116BRU-REEL
ADF4116BRU-REEL7
ADF4116BRUZ
1
ADF4116BRUZ-REEL
ADF4116BRUZ-REEL7
ADF4117BRU
ADF4117BRU-REEL
ADF4117BRU-REEL7
ADF4117BRUZ
1
ADF4117BRUZ-REEL
ADF4117BRUZ-REEL7
ADF4118BRU
ADF4118BRU-REEL
ADF4118BRU-REEL7
ADF4118BRUZ
1
ADF4118BRUZ-REEL
ADF4118BRUZ-REEL7
EVAL-ADF4118EB1
EVAL-ADF411XEB1
−40°C to +85°C
−40°C to +85°C
−40°C to +85°C
−40°C to +85°C
1
1
−40°C to +85°C
−40°C to +85°C
−40°C to +85°C
−40°C to +85°C
−40°C to +85°C
−40°C to +85°C
1
1
−40°C to +85°C
−40°C to +85°C
−40°C to +85°C
−40°C to +85°C
−40°C to +85°C
−40°C to +85°C
1
1
−40°C to +85°C
−40°C to +85°C
Thin Shrink Small Outline Package (TSSOP) RU-16
Thin Shrink Small Outline Package (TSSOP) RU-16
Thin Shrink Small Outline Package (TSSOP RU-16
Thin Shrink Small Outline Package (TSSOP) RU-16
Thin Shrink Small Outline Package (TSSOP) RU-16
Thin Shrink Small Outline Package (TSSOP) RU-16
Thin Shrink Small Outline Package (TSSOP) RU-16
Thin Shrink Small Outline Package (TSSOP) RU-16
Thin Shrink Small Outline Package (TSSOP) RU-16
Thin Shrink Small Outline Package (TSSOP) RU-16
Thin Shrink Small Outline Package (TSSOP) RU-16
Thin Shrink Small Outline Package (TSSOP) RU-16
Thin Shrink Small Outline Package (TSSOP) RU-16
Thin Shrink Small Outline Package (TSSOP) RU-16
Thin Shrink Small Outline Package (TSSOP) RU-16
Thin Shrink Small Outline Package (TSSOP) RU-16
Thin Shrink Small Outline Package (TSSOP) RU-16
Thin Shrink Small Outline Package (TSSOP) RU-16
Evaluation Board
Evaluation Board
1
Z = Pb-free part.
Rev. B | Page 25 of 28
ADF4116/ADF4117/ADF4118
NOTES
Rev. B | Page 26 of 28
ADF4116/ADF4117/ADF4118
NOTES
Rev. B | Page 27 of 28
ADF4116/ADF4117/ADF4118
NOTES
Purchase of licensed I2C components of Analog Devices or one of its sublicensed Associated Companies conveys a license for the purchaser under the Philips I2C Patent
Rights to use these components in an I
2
C system, provided that the system conforms to the I2C Standard Specification as defined by Philips.