3.2 V to 3.6 V power supply
Separate charge pump supply (V
voltage in 3.3 V systems
Programmable, dual-modulus prescaler
8/9, 16/17,
32/33, or 64/65
Programmable charge pump currents
Programmable antibacklash pulse width
3-wire serial interface
Analog and digital lock detect
Hardware and software power-down mode
Loop filter design possible with ADIsimPLL
4 mm × 4 mm, 20-lead chip scale package
APPLICATIONS
Broadband wireless access
Satellite systems
Instrumentation
Wireless LANs
Base stations for wireless radio
) allows extended tuning
P
DV
AV
DD
DD
GENERAL DESCRIPTION
The ADF4108 frequency synthesizer can be used to implement
local oscillators in the upconversion and downconversion
sections of wireless receivers and transmitters. It consists of a
low noise digital PFD (phase frequency detector), a precision
charge pump, a programmable reference divider, programmable
A and B counters, and a dual-modulus prescaler (P/P + 1).
The A (6-bit) and B (13-bit) counters, in conjunction with the
dual-modulus prescaler (P/P + 1), implement an N divider
(N = BP + A). In addition, the 14-bit reference counter (R counter),
allows selectable REF
phase-locked loop (PLL) can be implemented if the synthesizer
is used with an external loop filter and voltage controlled oscillator
(VCO). Its very high bandwidth means that frequency doublers
can be eliminated in many high frequency systems, simplifying
system architecture and reducing cost.
FUNCTIONAL BLOCK DIAGRAM
V
CPGND
P
ADF4108
frequencies at the PFD input. A complete
IN
R
SET
REFERENCE
REF
IN
CLK
DATA
LE
RFINA
B
RF
IN
Rev. A
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Anal og Devices for its use, nor for any infringements of patents or ot her
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
Changes to Ordering Guide.......................................................... 20
4/06—Revision 0: Initial Version
Rev. A | Page 2 of 20
Page 3
ADF4108
www.BDTIC.com/ADI
SPECIFICATIONS
AVDD = DVDD = 3.3 V ± 2%, AVDD ≤ VP ≤ 5.5 V, AGND = DGND = CPGND = 0 V, R
T
, unless otherwise noted.
MAX
Table 1.
B Chips2
Parameter B Version
1
(Typ) Unit Test Conditions/Comments
RF CHARACTERISTICS See Figure 11 for input circuit
RF Input Frequency (RFIN) 1.0/8.0 1.0/8.0 GHz min/max For lower frequencies, ensure slew rate (SR) > 320 V/μs
RF Input Sensitivity −5/+5 −5/+5 dBm min/max
Maximum Allowable Prescaler
Output Frequency
3
300 300 MHz max P = 8
325 325 MHz max P = 16
REFIN CHARACTERISTICS
REFIN Input Frequency 20/250 20/250 MHz min/max For f < 20 MHz, ensure SR > 50 V/μs
REFIN Input Sensitivity
4
0.8/VDD 0.8/VDD V p-p min/max Biased at AVDD/2
REFIN Input Capacitance 10 10 pF max
REFIN Input Current ±100 ±100 μA max
PHASE DETECTOR
Phase Detector Frequency
6
104 104 MHz max
CHARGE PUMP Programmable; see Figure 18
ICP Sink/Source
High Value 5 5 mA typ With R
Low Value 625 625 μA typ
Absolute Accuracy 2.5 2.5 % typ With R
R
Range 3.0/11 3.0/11 kΩ typ See Figure 18
SET
ICP Three-State Leakage 1 1 nA typ 1 nA typical; TA = 25°C
Sink and Source Current Matching 2 2 % typ 0.5 V ≤ VCP ≤ VP − 0.5 V
ICP vs. VCP 1.5 1.5 % typ 0.5 V ≤ VCP ≤ VP − 0.5 V
ICP vs. Temperature 2 2 % typ VCP = VP/2
LOGIC INPUTS
VIH, Input High Voltage 1.4 1.4 V min
VIL, Input Low Voltage 0.6 0.6 V max
I
, I
, Input Current ±1 ±1 μA max
INH
INL
CIN, Input Capacitance 10 10 pF max
LOGIC OUTPUTS
VOH, Output High Voltage 1.4 1.4 V min Open-drain output chosen; 1 kΩ pull-up resistor to 1.8 V
VOH, Output High Voltage VDD − 0.4 VDD − 0.4 V min CMOS output chosen
IOH, Output High Current 100 100 μA max
VOL, Output Low Voltage 0.4 0.4 V max IOL = 500 μA
POWER SUPPLIES
AVDD 3.2/3.6 3.2/3.6 V min/max
DVDD AVDD AVDD
VP AVDD/5.5 AVDD/5.5 V min/max AVDD ≤ VP ≤ 5.5 V
IDD (AIDD + DIDD)
7
17 17 mA max 15 mA typ
IP 0.4 0.4 mA max TA = 25°C
Power-Down Mode (AIDD + DIDD)810 10 μA typ
−81 −81 dBc/Hz typ @ 1 kHz offset and 1 MHz PFD frequency
Spurious Signals
7900 MHz Output
1
Operating temperature range (B version) is −40°C to +85°C.
2
The B chip specifications are given as typical values.
3
This is the maximum operating frequency of the CMOS counters. The prescaler value should be chosen to ensure that the RF input is divided down to a frequency that
is less than this value.
4
AVDD = DVDD = 3.3 V.
5
AC coupling ensures AVDD/2 bias.
6
Guaranteed by design. Sample tested to ensure compliance.
7
TA = 25°C; AVDD = DVDD = 3.3 V; P = 32; RFIN = 8 GHz, f
8
TA = 25°C; AVDD = DVDD = 3.3 V; R = 16,383; A = 63; B = 891; P = 32; RFIN = 7.0 GHz.
9
This value can be used to calculate phase noise for any application. Use the formula −219 + 10 log(f
seen at the VCO output. The value given is the lowest noise mode.
10
The phase noise is measured with the EVAL-ADF4108EB1Z evaluation board, with the ZComm CRO8000Z VCO. The spectrum analyzer provides the REFIN for the
synthesizer (f
−82 −82 dBc typ @ 1 MHz offset and 1 MHz PFD frequency
1
(Typ) Unit Test Conditions/Comments
= 200 kHz, REFIN = 10 MHz.
PFD
) + 20 logN to calculate in-band phase noise performance as
PFD
Rev. A | Page 4 of 20
Page 5
ADF4108
www.BDTIC.com/ADI
TIMING CHARACTERISTICS
AVDD = DVDD = 3.3 V ± 2%, AVDD ≤ VP ≤ 5.5 V, AGND = DGND = CPGND = 0 V, R
T
, unless otherwise noted.
MAX
= 5.1 kΩ, dBm referred to 50 Ω, TA = T
SET
MIN
to
Table 2.
Parameter
1
Limit2 (B Version) Unit Test Conditions/Comments
t1 10 ns min DATA to CLOCK setup time
t2 10 ns min DATA to CLOCK hold time
t3 25 ns min CLOCK high duration
t4 25 ns min CLOCK low duration
t5 10 ns min CLOCK to LE setup time
t6 20 ns min LE pulse width
1
Guaranteed by design but not production tested.
2
Operating temperature range (B Version) is −40°C to +85°C.
t
t
3
4
CLOCK
DATA
DB23 (MSB)
LE
LE
t
t
1
2
DB22
DB2
DB1
(CONTROL BIT C2)
DB0 (LSB)
(CONTROL BIT C1)
t
5
t
6
Figure 2. Timing Diagram
06015-002
Rev. A | Page 5 of 20
Page 6
ADF4108
www.BDTIC.com/ADI
ABSOLUTE MAXIMUM RATINGS
TA = 25°C, unless otherwise noted.
Table 3.
Parameter Rating
AVDD to GND1 −0.3 V to +3.9 V
AVDD to DVDD −0.3 V to +0.3 V
VP to GND −0.3 V to +5.8 V
VP to AVDD −0.3 V to +5.8 V
Digital I/O Voltage to GND −0.3 V to VDD + 0.3 V
Analog I/O Voltage to GND −0.3 V to VP + 0.3 V
REFIN, RFINA, RFINB to GND −0.3 V to VDD + 0.3 V
Operating Temperature Range
Industrial (B Version) −40°C to +85°C
Storage Temperature Range −65°C to +125°C
Maximum Junction Temperature 150°C
CSP θJA Thermal Impedance
(Paddle Soldered)
Reflow Soldering
Peak Temperature (60 sec) 260°C
Time at Peak Temperature 40 sec
Transistor Count
CMOS 6425
Bipolar 303
1
GND = AGND = DGND = 0 V.
30.4°C/W
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
This device is a high performance RF integrated circuit with an
D rating of <2 kV, and it is ESD sensitive. Proper precautions
ES
should be taken for handling and assembly.
ESD CAUTION
Rev. A | Page 6 of 20
Page 7
ADF4108
www.BDTIC.com/ADI
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
DD
DD
P
SET
V
DV
R
DV
20 CP
191817
16
CPGND 1
AGND 2
AGND 3
RFINB 4
RF
A 5
IN
PIN 1
INDICATOR
ADF4108
TOP VIEW
(Not to Scale)
6
7
DD
AV
AV
Figure 3. Pin Configuration
DD
8
IN
REF
DGND 9
DGND 10
15 MUXOUT
14 LE
13 DATA
12 CLK
11 CE
6015-003
Table 4. Pin Function Descriptions
Pin No. Mnemonic Description
1 CPGND Charge Pump Ground. This is the ground return path for the charge pump.
2, 3 AGND Analog Ground. This is the ground return path of the prescaler.
4 RFINB
Complementary Input to the RF Prescaler. This point must be d
ecoupled to the ground plane with a small bypass
capacitor, typically 100 pF. See Figure 11.
5 RFINA Input to the RF Prescaler. This small signal input is ac-coupled to the external VCO.
6, 7 AVDD
8 REFIN
Analog Power Supply. This voltage may range from 3.2 V to 3.6
plane should be placed as close as possible to this pin. AV
Reference Input. This is a CMOS input with a nominal thr
V. Decoupling capacitors to the analog ground
must be the same value as DVDD.
DD
eshold of V
/2 and a dc equivalent input resistance of
DD
100 kΩ. See Figure 10. This input can be driven from a TTL or CMOS crystal oscillator or it can be ac-coupled.
9, 10 DGND Digital Ground.
11 CE
12 CLK
Chip Enable. A logic low on this pin powers down the device and puts the charge pump output into three-state
. Taking the pin high powers up the device, depending on the status of the power-down bit, F2.
mode
Serial Clock Input. This serial clock is used to clock in the serial d
ata to the registers. The data is latched into the
24-bit shift register on the CLK rising edge. This input is a high impedance CMOS input.
13 DATA
Serial Data Input. The serial da
ta is loaded MSB first with the 2 LSBs being the control bits. This input is a high
impedance CMOS input.
14 LE
Load Enable, CMOS Input. When LE goes high, the data stored i
n the shift registers is loaded into one of the four
latches, the latch being selected using the control bits.
15 MUXOUT
This multiplexer output allows either the lock de
tect, the scaled RF, or the scaled reference frequency to be
accessed externally.
16, 17 DVDD
18 VP
Digital Power Supply. This may range from 3.2 V to 3.6 V. Dec
be placed as close as possible to this pin. DV
must be the same value as AVDD.
DD
Charge Pump Power Supply. This voltage should be greater than or equal to V
oupling capacitors to the digital ground plane should
. In systems where VDD is 3.3 V, it
DD
can be set to 5 V and used to drive a VCO with a tuning range of up to 5 V.
19 R
20 CP
SET
Connecting a resistor between this pin and CPGND sets the maximum charge pump output current. The nominal
oltage potential at the R
v
25.5
=
I
MAXCP
R
SET
with R
= 5.1 kΩ, I
SET
CP MAX
pin is 0.66 V. The relationship between ICP and R
SET
= 5 mA.
Charge Pump Output. When enabled, this pin provides ±I
to the external loop filter, which in turn drives the
CP
SET
is
external VCO.
Rev. A | Page 7 of 20
Page 8
ADF4108
–
–
www.BDTIC.com/ADI
TYPICAL PERFORMANCE CHARACTERISTICS
FREQ UNIT:GHz KEYWORD: R
PARAM TYPE: s
DATA FORMAT: MA
Figure 9. Phase Noise (Referred to CP Output) vs. PFD Frequency
Rev. A | Page 8 of 20
Page 9
ADF4108
E
www.BDTIC.com/ADI
THEORY OF OPERATION
REFERENCE INPUT STAGE
The reference input stage is shown in Figure 10. SW1 and SW2
are normally closed switches. SW3 is normally open. When
power-down is initiated, SW3 is closed and SW1 and SW2 are
opened. This ensures that there is no loading of the REF
IN
pin
on power-down.
POWER-DOWN
CONTROL
NC
100kΩ
SW1
NO
SW2
SW3
BUFFER
TO R COUNTER
6015-016
REF
IN
NC
Figure 10. Reference Input Stage
RF INPUT STAGE
The RF input stage is shown in Figure 11. It is followed by a
two-stage limiting amplifier to generate the CML clock levels
needed for the prescaler.
500Ω
1.6V
500Ω
AV
DD
BIAS
GENERATOR
A AND B COUNTERS
The A and B CMOS counters combine with the dual-modulus
prescaler to allow a wide ranging division ratio in the PLL
feedback counter. The counters are specified to work when the
prescaler output is 300 MHz or less. Thus, with an RF input
frequency of 4.0 GHz, a prescaler value of 16/17 is valid but a
value of 8/9 is not valid.
Pulse Swallow Function
The A and B counters, in conjunction with the dual-modulus
prescaler, make it possible to generate output frequencies that
are spaced only by the reference frequency divided by R. The
equation for the VCO frequency is as follows:
f
[]
()
VCO
where:
f
is the output frequency of external voltage controlled
VCO
oscillator (VCO).
P is the preset modulus of dual-modulus prescaler (8/9, 16/17,
and so on.).
B is the preset divide ratio of binary 13-bit counter (3 to 8191).
A is the preset divide ratio of binary 6-bit swallow counter
(0 to 63).
f
is the external reference frequency oscillator.
REFIN
N = BP + A
REFIN
ABPf
×+×=
R
RFINA
B
RF
IN
AGND
Figure 11. RF Input Stage
6015-017
PRESCALER (P/P + 1)
The dual-modulus prescaler (P/P + 1), along with the A and B
counters, enables the large division ratio, N, to be realized (N =
BP + A). The dual-modulus prescaler, operating at CML levels,
takes the clock from the RF input stage and divides it down to a
manageable frequency for the CMOS A and B counters. The
prescaler is programmable. It can be set in software to 8/9,
16/17, 32/33, or 64/65. It is based on a synchronous 4/5 core.
A minimum divide ratio is possible for contiguous output
frequencies. This minimum is determined by P, the prescaler
value, and is given by (P
2
− P).
TO PFD
FROM RF
INPUT STAG
PRESCALER
P/P + 1
MODULUS
CONTROL
N DIVIDER
Figure 12. A and B Counters
13-BIT B
COUNTER
LOAD
LOAD
6-BIT A
COUNTER
R COUNTER
The 14-bit R counter allows the input reference frequency to be
divided down to produce the reference clock to the phase
frequency detector (PFD). Division ratios from 1 to 16,383 are
allowed.
06015-018
Rev. A | Page 9 of 20
Page 10
ADF4108
V
www.BDTIC.com/ADI
PHASE FREQUENCY DETECTOR AND
CHARGE PUMP
The phase frequency detector (PFD) takes inputs from the R
counter and N counter (N = BP + A) and produces an output
proportional to the phase and frequency difference between
them. Figure 13 is a simplified schematic. The PFD includes a
p
rogrammable delay element that controls the width of the
antibacklash pulse. This pulse ensures that there is no dead zone
in the PFD transfer function and minimizes phase noise and
reference spurs. Two bits in the reference counter latch, ABP2
and ABP1, control the width of the pulse (see
he minimum antibacklash pulse width is not recommended.
t
UP
HI
R DIVIDER
HID1D2
N DIVIDER
Figure 13. PFD Simplified Schemat
Q1
U1
CLR1
PROGRAMMABLE
ABP2
CLR2
DOWN
Q2
U2
DELAY
U3
ABP1
ic and Timing (in Lock)
Figure 16). Use of
P
CHARGE
PUMP
CP
CPGND
MUXOUT AND LOCK DETECT
The output multiplexer on the ADF4108 allows the user to
access various internal points on the chip. The state of
MUXOUT is controlled by M3, M2, and M1 in the function
latch.
Figure 18 shows the full truth table. Figure 14 shows the
OUT section in block diagram form.
MUX
Lock Detect
MUXOUT can be programmed for two types of lock detect:
digital lock detect and analog lock detect.
Digital lock detect is active high. When the lock detect precision
(
LDP) bit in the R counter latch is set to 0, digital lock detect is
set high when the phase error on three consecutive phase
detector (PD) cycles is less than 15 ns. With LDP set to 1, five
06015-019
consecutive cycles of less than 15 ns are required to set the lock
detect. It stays set high until a phase error of greater than 25 ns
is detected on any subsequent PD cycle.
The N-channel open-drain analog lock detect should be
op
erated with an external pull-up resistor of 10 kΩ nominal.
When lock has been detected, this output is high with narrow,
low going pulses.
DV
DD
ANALOG LO CK DETECT
DIGITAL LOCK DET ECT
R COUNTER OUT PUT
N COUNTER OUT PUT
SDOUT
MUX
Figure 14. MUXOUT Circuit
CONTROL
MUXOUT
DGND
INPUT SHIFT REGISTER
The ADF4108 digital section includes a 24-bit input shift
register, a 14-bit R counter, and a 19-bit N counter, comprising a
6-bit A counter and a 13-bit B counter. Data is clocked into the
24-bit shift register on each rising edge of CLK. The data is
clocked in MSB first. Data is transferred from the shift register
to one of four latches on the rising edge of LE. The destination
latch is determined by the state of the two control bits (C2, C1)
in the shift register. These are the 2 LSBs, DB1 and DB0, as
shown in the timing diagram of
hese bits is shown in Tabl e 5.
t
Figure 15 shows a summary of how the latches are
pro
BOTH OF THESE BITS
MUST BE SET TO 0 FOR
NORMAL OPE RATION.
TEST MODE BITS
SHOULD BE SET
TO 00 FOR NORMAL
OPERATIO N.
OPERATIO N
THREE CONSECUTIVE CYCLES OF PHASE DELAY LESS THAN
15ns MUST O CCUR BEFORE LOCK DETECT I S SET.
FIVE CONSECUTIVE CYCL ES OF PHASE DELAY LESS T HAN
15ns MUST O CCUR BEFORE LOCK DETECT I S SET.
THESE BITS ARE NOT USED
BY THE DEVICE AND ARE
DON'T CARE BITS .
G1
CP GAIN
1
0
OPERATION
CHARGE PUMP CURRENT
SETTING 1 IS PE RMANENTLY USED.
CHARGE PUMP CURRENT
SETTING 2 IS PERMANENTLY USED.
CHARGE PUMP CURRENT
SETTING 1 IS USED.
CHARGE PUMP CURRENT IS
SWITCHED TO SETTING 2. THE
TIME SPENT IN SETTING 2 IS
DEPENDENT ON WHICH FASTL OCK
MODE IS USED. SEE F UNCTION
LATCH DESCRIPTIO N.
Figure 17. AB Counter Latch Map
Rev. A | Page 13 of 20
N = BP + A, P IS PRESCALER VALUE SET IN THE FUNCTION
LATCH. B MUST BE GREATER THAN OR EQUAL TO A. FOR
CONTINUOUSLY ADJACENT VALUES OF (N × F
OUTPUT, N
NORMAL OPERATI ON
ASYNCHRONOUS POWER-DO WN
SYNCHRONOUS POWER-DOWN
I
CP
Figure 19. Initialization Latch Map
Rev. A | Page 15 of 20
6015-025
Page 16
ADF4108
www.BDTIC.com/ADI
FUNCTION LATCH
The on-chip function latch is programmed with C2 and C1 set
to 1 and 0, respectively. Figure 18 shows the input data format
or programming the function latch.
f
Counter Reset
DB2 (F1) is the counter reset bit. When this bit is 1, the R
counter and the AB counters are reset. For normal operation,
this bit should be 0. Upon powering up, the F1 bit needs to be
disabled (set to 0). Then, the N counter resumes counting in
close alignment with the R counter. (The maximum error is one
prescaler cycle.)
Power-Down
DB3 (PD1) and DB21 (PD2) provide programmable powerdown modes. They are enabled by the CE pin.
When the CE pin is low, the device is immediately disabled
re
gardless of the states of PD2 and PD1.
In the programmed asynchronous power-down, the device
p
owers down immediately after latching a 1 into the PD1 bit,
with the condition that PD2 has been loaded with a 0.
In the programmed synchronous power-down, the device
ower-down is gated by the charge pump to prevent unwanted
p
frequency jumps. Once the power-down is enabled by writing a
1 into PD1 (on condition that a 1 has also been loaded to PD2),
the device goes into power-down on the occurrence of the next
charge pump event.
When a power-down is activated (either synchronous or
asy
nchronous mode, including CE pin activated power-down),
the following events occur:
ll active dc current paths are removed.
• A
• The R
• The cha
• The dig
• The RFIN
• T
• The i
MUXOUT Control
The on-chip multiplexer is controlled by M3, M2, and M1 on
the ADF4108. Figure 18 shows the truth table.
Fastlock Enable Bit
DB9 of the function latch is the fastlock enable bit. Fastlock is
enabled only when this bit is 1.
Fastlock Mode Bit
DB10 of the function latch is the fastlock mode bit. When
fastlock is enabled, this bit determines which fastlock mode is
, N, and timeout counters are forced to their load
state conditions.
rge pump is forced into three-state mode.
ital lock detect circuitry is reset.
input is debiased.
he reference input buffer circuitry is disabled.
nput register remains active and capable of loading
and latching data.
used. If the fastlock mode bit is 0, then Fastlock Mode 1 is
selected; and if the fastlock mode bit is 1, then Fastlock Mode 2
is selected.
Fastlock Mode 1
The charge pump current is switched to the contents of Current
Setting 2.
The device enters fastlock by having a 1 written to the CP gain
b
it in the AB counter latch. The device exits fastlock by having a
0 written to the CP gain bit in the AB counter latch.
Fastlock Mode 2
The charge pump current is switched to the contents of Current
Setting 2.
The device enters fastlock by having a 1 written to the CP gain
b
it in the AB counter latch. The device exits fastlock under the
control of the timer counter. After the timeout period
determined by the value in TC4:TC1, the CP gain bit in the AB
counter latch is automatically reset to 0 and the device reverts to
normal mode instead of fastlock. See
riods.
pe
Figure 18 for the timeout
Timer Counter Control
The user has the option of programming two charge pump
currents. The intent is that Current Setting 1 is used when the
RF output is stable and the system is in a static state. Current
Setting 2 is meant to be used when the system is dynamic and in
a state of change (that is, when a new output frequency is
programmed).
The normal sequence of events is as follows:
The user initially decides what the preferred charge pump
c
urrents are going to be. For example, the choice may be 2.5 mA
as Current Setting 1 and 5 mA as Current Setting 2.
At the same time, it must be decided how long the secondary
urrent is to stay active before reverting to the primary current.
c
This is controlled by the timer counter control bits, DB14:DB11
(TC4:TC1) in the function latch. The truth table is given in
Figure 18.
Now, to program a new output frequency, the user simply
p
rograms the AB counter latch with new values for A and B. At
the same time, the CP gain bit can be set to 1, which sets the
charge pump with the value in CPI6:CPI4 for a period of time
determined by TC4:TC1. When this time is up, the charge
pump current reverts to the value set by CPI3:CPI1. At the
same time, the CP gain bit in the AB counter latch is reset to 0
and is now ready for the next time the user wishes to change the
frequency.
Note that there is an enable feature on the timer counter. It is
ena
bled when Fastlock Mode 2 is chosen by setting the fastlock
mode bit (DB10) in the function latch to 1.
Rev. A | Page 16 of 20
Page 17
ADF4108
www.BDTIC.com/ADI
Charge Pump Currents
CPI3, CPI2, and CPI1 program Current Setting 1 for the charge
pump. CPI6, CPI5, and CPI4 program Current Setting 2 for the
charge pump. The truth table is given in
Figure 18.
Prescaler Value
P2 and P1 in the function latch set the prescaler values. The
prescaler value should be chosen so that the prescaler output
frequency is always less than or equal to 300 MHz. Thus, with
an RF frequency of 4 GHz, a prescaler value of 16/17 is valid but
a value of 8/9 is not valid.
PD Polarity
This bit sets the phase detector polarity bit. See Figure 18.
CP Three-State
This bit controls the CP output pin. With the bit set high, the
CP output is put into three-state. With the bit set low, the CP
output is enabled.
INITIALIZATION LATCH
The initialization latch is programmed when C2 and C1 are set
to 1 and 1. This is essentially the same as the function latch
(programmed when C2, C1 = 1, 0).
However, when the initialization latch is programmed, an
itional internal reset pulse is applied to the R and AB
add
counters. This pulse ensures that the AB counter is at load point
when the AB counter data is latched and the device will begin
counting in close phase alignment.
If the latch is programmed for synchronous power-down (CE
in is high; PD1 bit is high; PD2 bit is low), the internal pulse
p
also triggers this power-down. The prescaler reference and the
oscillator input buffer are unaffected by the internal reset pulse
and so close phase alignment is maintained when counting
resumes.
When the first AB counter data is latched after initialization, the
in
ternal reset pulse is again activated. However, successive AB
counter loads after this do not trigger the internal reset pulse.
Device Programming After Initial Power-Up
After initially powering up the device, there are three ways to
program the device.
Initialization Latch Method
1. Apply V
2. Pr
ogram the initialization latch (11 in 2 LSBs of input
word). Make sure that the F1 bit is programmed to 0.
3. N
ext, do a function latch load (10 in 2 LSBs of the control
word), making sure that the F1 bit is programmed to a 0.
4. Then
5. Then
.
DD
do an R load (00 in 2 LSBs).
do an AB load (01 in 2 LSBs).
When the initialization latch is loaded, the following occurs:
1. The f
2. A
3. L
unction latch contents are loaded.
n internal pulse resets the R, AB, and timeout counters to
load state conditions and also three-states the charge pump.
Note that the prescaler band gap reference and the oscillator
input buffer are unaffected by the internal reset pulse,
allowing close phase alignment when counting resumes.
atching the first AB counter data after the initialization
word activates the same internal reset pulse. Successive AB
loads do not trigger the internal reset pulse unless there is
another initialization.
CE Pin Method
1. Apply VDD.
ing CE low to put the device into power-down. This is an
2. Br
asynchronous power-down in that it happens immediately.
rogram the function latch (10).
3. P
4. P
rogram the R counter latch (00).
5. P
rogram the AB counter latch (01).
ring CE high to take the device out of power-down. The R
6. B
and AB counters will now resume counting in close
alignment.
Note that after CE goes high, a duration of 1 s may be required
r the prescaler band gap voltage and oscillator input buffer
fo
bias to reach steady state.
CE can be used to power the device up and down to check for
nnel activity. The input register does not need to be repro-
cha
grammed each time the device is disabled and enabled as long
as it has been programmed at least once after V
applied.
was initially
DD
Counter Reset Method
1. Apply V
2. Do a f
load 1 to the F1 bit. This enables the counter reset.
3. Do a
4. Do a
5. Do a f
load 0 to the F1 bit. This disables the counter reset.
This sequence provides the same close alignment as the
i
nitialization method. It offers direct control over the internal
reset. Note that counter reset holds the counters at load point
and three-states the charge pump, but does not trigger
synchronous power-down.
.
DD
unction latch load (10 in 2 LSBs). As part of this,
n R counter load (00 in 2 LSBs).
n AB counter load (01 in 2 LSBs).
unction latch load (10 in 2 LSBs). As part of this,
POWER SUPPLY CONSIDERATIONS
The ADF4108 operates over a power supply range of 3.2 V to
3.6 V. The ADP3300ART-3.3 is a low dropout linear regulator
rom Analog Devices, Inc. It outputs 3.3 V with an accuracy of
f
1.4% and is recommended for use with the ADF4108.
Rev. A | Page 17 of 20
Page 18
ADF4108
www.BDTIC.com/ADI
INTERFACING
The ADF4108 has a simple SPI-compatible serial interface for
writing to the device. CLK, DATA, and LE control the data
transfer. When LE (latch enable) goes high, the 24 bits that have
been clocked into the input register on each rising edge of CLK
are transferred to the appropriate latch. See
t
iming diagram and Tabl e 5 for the latch truth table.
Figure 2 for the
The maximum allowable serial clock rate is 20 MHz. This
m
eans that the maximum update rate possible for the device is
833 kHz or one update every 1.2 µs. This is certainly more than
adequate for systems that have typical lock times in hundreds of
microseconds.
ADuC812 INTERFACE
Figure 20 shows the interface between the ADF4108 and the
ADuC812 MicroConverter®. Because the ADuC812 is based on
n 8051 core, this interface can be used with any 8051-based
a
microcontroller. The MicroConverter is set up for SPI master
mode with CPHA = 0. To initiate the operation, the I/O port
driving LE is brought low. Each latch of the ADF4108 needs a
24-bit word. This is accomplished by writing three 8-bit bytes
from the MicroConverter to the device. When the third byte
has been written, the LE input should be brought high to
complete the transfer.
On first applying power to the ADF4108, it needs four writes
(o
ne each to the initialization latch, function latch, R counter
latch, and N counter latch) for the output to become active.
I/O port lines on the ADuC812 are also used to control power-
wn (CE input) and to detect lock (MUXOUT configured as
do
lock detect and polled by the port input).
When operating in the mode described, the maximum
OCK rate of the ADuC812 is 4 MHz. This means that
SCL
the maximum rate at which the output frequency can be
changed is 166 kHz.
SCLOCK
MOSI
ADuC812
I/O PORTS
Figure 20. ADuC812 to ADF4108 Interface
ADSP-21xx INTERFACE
Figure 21 shows the interface between the ADF4108 and the
ADSP-21xx digital signal processor. The ADF4108 needs a
24-bit serial word for each latch write. The easiest way to
accomplish this using the ADSP-21xx family is to use the
autobuffered transmit mode of operation with alternate
framing. This provides a means for transmitting an entire block
of serial data before an interrupt is generated. Set up the word
length for 8 bits and use three memory locations for each 24-bit
word. To program each 24-bit latch, store the three 8-bit bytes,
enable the autobuffered mode, and then write to the transmit
register of the DSP. This last operation initiates the autobuffer
transfer.
SCLOCK
MOSI
ADSP-21x x
TFS
I/O FLAGS
Figure 21. ADSP-21xx to ADF4108 Interface
CLK
DATA
LE
ADF4108
CE
MUXOUT
(LOCK DETECT )
CLK
DATA
LE
ADF4108
CE
MUXOUT
(LOCK DETECT )
6015-026
6015-027
Rev. A | Page 18 of 20
Page 19
ADF4108
www.BDTIC.com/ADI
PCB DESIGN GUIDELINES FOR CHIP SCALE PACKAGE
The lands on the chip scale package (CP-20-1) are rectangular.
The printed circuit board pad for these should be 0.1 mm
longer than the package land length and 0.05 mm wider than
the package land width. The land should be centered on the
pad. This ensures that the solder joint size is maximized. The
bottom of the chip scale package has a central thermal pad.
The thermal pad on the printed circuit board should be at least
as la
rge as this exposed pad. On the printed circuit board, there
should be a clearance of at least 0.25 mm between the thermal
pad and the inner edges of the pad pattern. This ensures that
shorting is avoided.
Thermal vias can be used on the printed circuit board thermal
ad to improve thermal performance of the package. If vias are
p
used, they should be incorporated in the thermal pad at 1.2 mm
pitch grid. The via diameter should be between 0.3 mm and
0.33 mm and the via barrel should be plated with 1 oz. copper
to plug the via.
The user should connect the printed circuit board thermal pad
to
AGND.
Rev. A | Page 19 of 20
Page 20
ADF4108
C
www.BDTIC.com/ADI
OUTLINE DIMENSIONS
0.08
0.50
BSC
0.75
0.60
0.50
0.60 MAX
15
11
16
EXPOSED
PAD
(BOTTOM VIEW)
10
1
P
N
I
R
C
A
O
T
N
I
D
2.25
2.10 SQ
1.95
0.25 MIN
I
082207-B
20
1
5
6
4.00
INDI
ATO R
1.00
0.85
0.80
SEATING
PLANE
PIN 1
12° MAX
BSC SQ
TOP VIEW
0.80 MAX
0.65 TYP
0.30
0.23
0.18
COMPLIANT
BCS SQ
TO
0.60 MAX
3.75
0.05 MAX
0.02 NOM
COPLANARITY
0.20 REF
JEDEC STANDARDS MO-220-VGGD-1
Figure 22. 20-Lead Lead Frame Chip Scale Package [LFCSP_VQ]
4 mm x 4 mm Body, Very Thin Quad
(CP-20-1)
Dimensions shown in millimeters
ORDERING GUIDE
Model Temperature Range Package Description Package Option