Datasheet ADF4108 Datasheet (ANALOG DEVICES)

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PLL Frequency Synthesizer

FEATURES

8.0 GHz bandwidth
3.2 V to 3.6 V power supply Separate charge pump supply (V
voltage in 3.3 V systems
Programmable, dual-modulus prescaler
8/9, 16/17,
32/33, or 64/65 Programmable charge pump currents Programmable antibacklash pulse width 3-wire serial interface Analog and digital lock detect Hardware and software power-down mode Loop filter design possible with ADIsimPLL 4 mm × 4 mm, 20-lead chip scale package

APPLICATIONS

Broadband wireless access Satellite systems Instrumentation Wireless LANs Base stations for wireless radio
) allows extended tuning
P
DV
AV
DD
DD

GENERAL DESCRIPTION

The ADF4108 frequency synthesizer can be used to implement local oscillators in the upconversion and downconversion sections of wireless receivers and transmitters. It consists of a low noise digital PFD (phase frequency detector), a precision charge pump, a programmable reference divider, programmable A and B counters, and a dual-modulus prescaler (P/P + 1). The A (6-bit) and B (13-bit) counters, in conjunction with the dual-modulus prescaler (P/P + 1), implement an N divider (N = BP + A). In addition, the 14-bit reference counter (R counter), allows selectable REF phase-locked loop (PLL) can be implemented if the synthesizer is used with an external loop filter and voltage controlled oscillator (VCO). Its very high bandwidth means that frequency doublers can be eliminated in many high frequency systems, simplifying system architecture and reducing cost.

FUNCTIONAL BLOCK DIAGRAM

V
CPGND
P
ADF4108
frequencies at the PFD input. A complete
IN
R
SET
REFERENCE
REF
IN
CLK
DATA
LE
RFINA
B
RF
IN
Rev. A
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Anal og Devices for its use, nor for any infringements of patents or ot her rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners.
24-BIT INP UT
REGISTER
SD
OUT
FUNCTION
PRESCALER
FROM
LATCH
P/P + 1
CE
22
N = BP + A
AGND
14-BIT
R COUNTER
R COUNTER
LATCH
FUNCTION
LATCH
A, B COUNTER
LATCH
B COUNTER
LOAD
LOAD
A COUNTER
DGND
14
13
13-BIT
6-BIT
6
19
Figure 1.
PHASE
FREQUENCY
DETECTOR
LOCK
DETECT
SD
CURRENT
SETTING 1
CPI3 CPI2 CPI1
AV
DD
OUT
CHARGE
MUX
M3 M2 M1
PUMP
CURRENT
SETTING 2
CPI6 CPI5 CPI4
HIGH-Z
CP
MUXOUT
ADF4108
06015-001
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 www.analog.com Fax: 781.461.3113 ©2006–2007 Analog Devices, Inc. All rights reserved.
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TABLE OF CONTENTS

Features.............................................................................................. 1
Applications....................................................................................... 1
General Description ......................................................................... 1
Functional Block Diagram .............................................................. 1
Revision History ............................................................................... 2
Specifications..................................................................................... 3
Timing Characteristics ................................................................ 5
Absolute Maximum Ratings............................................................ 6
ESD Caution.................................................................................. 6
Pin Configuration and Function Descriptions............................. 7
Typical Performance Characteristics ............................................. 8
Theory of Operation ........................................................................ 9
Reference Input Stage................................................................... 9
RF Input Stage............................................................................... 9
Prescaler (P/P + 1)........................................................................ 9
A and B Counters ......................................................................... 9
R Counter ...................................................................................... 9
Phase Frequency Detector and Charge Pump....................... 10
MUXOUT and Lock Detect...................................................... 10
Input Shift Register .................................................................... 10
Latch Summary........................................................................... 11
Reference Counter Latch Map.................................................. 12
AB Counter Latch Map ............................................................. 13
Function Latch Map................................................................... 14
Initialization Latch Map ............................................................ 15
Function Latch............................................................................ 16
Initialization Latch..................................................................... 17
Power Supply Considerations................................................... 17
Interfacing ....................................................................................... 18
ADuC812 Interface.................................................................... 18
ADSP-21xx Interface ................................................................. 18
PCB Design Guidelines for Chip Scale Package......................... 19
Outline Dimensions....................................................................... 20
Ordering Guide .......................................................................... 20

REVISION HISTORY

12/07—Rev. 0 to Rev. A
Removed TSSOP Package..................................................Universal
Changes to Features.......................................................................... 1
Changes to Table 1 Endnote 10 and Endnote 11.......................... 4
Changes to Table 3............................................................................ 6
Deleted Figure 3................................................................................ 7
Changes to Table 4............................................................................ 7
Changes to Figure 10 and Figure 11............................................... 8
Updated Outline Dimensions....................................................... 20
Deleted Figure 24............................................................................ 20
Changes to Ordering Guide.......................................................... 20
4/06—Revision 0: Initial Version
Rev. A | Page 2 of 20
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SPECIFICATIONS

AVDD = DVDD = 3.3 V ± 2%, AVDD ≤ VP ≤ 5.5 V, AGND = DGND = CPGND = 0 V, R T
, unless otherwise noted.
MAX
Table 1.
B Chips2
Parameter B Version
1
(Typ) Unit Test Conditions/Comments
RF CHARACTERISTICS See Figure 11 for input circuit
RF Input Frequency (RFIN) 1.0/8.0 1.0/8.0 GHz min/max For lower frequencies, ensure slew rate (SR) > 320 V/μs RF Input Sensitivity −5/+5 −5/+5 dBm min/max Maximum Allowable Prescaler
Output Frequency
3
300 300 MHz max P = 8
325 325 MHz max P = 16
REFIN CHARACTERISTICS
REFIN Input Frequency 20/250 20/250 MHz min/max For f < 20 MHz, ensure SR > 50 V/μs REFIN Input Sensitivity
4
0.8/VDD 0.8/VDD V p-p min/max Biased at AVDD/2 REFIN Input Capacitance 10 10 pF max REFIN Input Current ±100 ±100 μA max
PHASE DETECTOR
Phase Detector Frequency
6
104 104 MHz max
CHARGE PUMP Programmable; see Figure 18
ICP Sink/Source
High Value 5 5 mA typ With R Low Value 625 625 μA typ Absolute Accuracy 2.5 2.5 % typ With R R
Range 3.0/11 3.0/11 kΩ typ See Figure 18
SET
ICP Three-State Leakage 1 1 nA typ 1 nA typical; TA = 25°C Sink and Source Current Matching 2 2 % typ 0.5 V ≤ VCP ≤ VP − 0.5 V ICP vs. VCP 1.5 1.5 % typ 0.5 V ≤ VCP ≤ VP − 0.5 V ICP vs. Temperature 2 2 % typ VCP = VP/2
LOGIC INPUTS
VIH, Input High Voltage 1.4 1.4 V min VIL, Input Low Voltage 0.6 0.6 V max I
, I
, Input Current ±1 ±1 μA max
INH
INL
CIN, Input Capacitance 10 10 pF max
LOGIC OUTPUTS
VOH, Output High Voltage 1.4 1.4 V min Open-drain output chosen; 1 kΩ pull-up resistor to 1.8 V VOH, Output High Voltage VDD − 0.4 VDD − 0.4 V min CMOS output chosen IOH, Output High Current 100 100 μA max VOL, Output Low Voltage 0.4 0.4 V max IOL = 500 μA
POWER SUPPLIES
AVDD 3.2/3.6 3.2/3.6 V min/max DVDD AVDD AVDD VP AVDD/5.5 AVDD/5.5 V min/max AVDD ≤ VP ≤ 5.5 V IDD (AIDD + DIDD)
7
17 17 mA max 15 mA typ IP 0.4 0.4 mA max TA = 25°C Power-Down Mode (AIDD + DIDD)810 10 μA typ
= 5.1 kΩ, dBm referred to 50 Ω, TA = T
SET
5
= 5.1 kΩ
SET
= 5.1 kΩ
SET
MIN
to
Rev. A | Page 3 of 20
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B Chips2
Parameter B Version
NOISE CHARACTERISTICS
Normalized Phase Noise Floor Phase Noise Performance
7900 MHz Output
11
9
10
−219 −219 dBc/Hz typ @ VCO output
−81 −81 dBc/Hz typ @ 1 kHz offset and 1 MHz PFD frequency
Spurious Signals
7900 MHz Output
1
Operating temperature range (B version) is −40°C to +85°C.
2
The B chip specifications are given as typical values.
3
This is the maximum operating frequency of the CMOS counters. The prescaler value should be chosen to ensure that the RF input is divided down to a frequency that
is less than this value.
4
AVDD = DVDD = 3.3 V.
5
AC coupling ensures AVDD/2 bias.
6
Guaranteed by design. Sample tested to ensure compliance.
7
TA = 25°C; AVDD = DVDD = 3.3 V; P = 32; RFIN = 8 GHz, f
8
TA = 25°C; AVDD = DVDD = 3.3 V; R = 16,383; A = 63; B = 891; P = 32; RFIN = 7.0 GHz.
9
This value can be used to calculate phase noise for any application. Use the formula −219 + 10 log(f
seen at the VCO output. The value given is the lowest noise mode.
10
The phase noise is measured with the EVAL-ADF4108EB1Z evaluation board, with the ZComm CRO8000Z VCO. The spectrum analyzer provides the REFIN for the synthesizer (f
11
f
REFIN
REFOUT
= 10 MHz; f
PFD
11
= 10 MHz @ 0 dBm).
= 1 MHz; fRF = 7900 MHz; N = 7900; loop B/W = 30 kHz, VCO = ZComm CRO8000Z.
−82 −82 dBc typ @ 1 MHz offset and 1 MHz PFD frequency
1
(Typ) Unit Test Conditions/Comments
= 200 kHz, REFIN = 10 MHz.
PFD
) + 20 logN to calculate in-band phase noise performance as
PFD
Rev. A | Page 4 of 20
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TIMING CHARACTERISTICS

AVDD = DVDD = 3.3 V ± 2%, AVDD ≤ VP ≤ 5.5 V, AGND = DGND = CPGND = 0 V, R T
, unless otherwise noted.
MAX
= 5.1 kΩ, dBm referred to 50 Ω, TA = T
SET
MIN
to
Table 2.
Parameter
1
Limit2 (B Version) Unit Test Conditions/Comments
t1 10 ns min DATA to CLOCK setup time t2 10 ns min DATA to CLOCK hold time t3 25 ns min CLOCK high duration t4 25 ns min CLOCK low duration t5 10 ns min CLOCK to LE setup time t6 20 ns min LE pulse width
1
Guaranteed by design but not production tested.
2
Operating temperature range (B Version) is −40°C to +85°C.
t
t
3
4
CLOCK
DATA
DB23 (MSB)
LE
LE
t
t
1
2
DB22
DB2
DB1
(CONTROL BIT C2)
DB0 (LSB)
(CONTROL BIT C1)
t
5
t
6
Figure 2. Timing Diagram
06015-002
Rev. A | Page 5 of 20
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ABSOLUTE MAXIMUM RATINGS

TA = 25°C, unless otherwise noted.
Table 3.
Parameter Rating
AVDD to GND1 −0.3 V to +3.9 V AVDD to DVDD −0.3 V to +0.3 V VP to GND −0.3 V to +5.8 V VP to AVDD −0.3 V to +5.8 V Digital I/O Voltage to GND −0.3 V to VDD + 0.3 V Analog I/O Voltage to GND −0.3 V to VP + 0.3 V REFIN, RFINA, RFINB to GND −0.3 V to VDD + 0.3 V Operating Temperature Range
Industrial (B Version) −40°C to +85°C Storage Temperature Range −65°C to +125°C Maximum Junction Temperature 150°C CSP θJA Thermal Impedance
(Paddle Soldered) Reflow Soldering
Peak Temperature (60 sec) 260°C
Time at Peak Temperature 40 sec Transistor Count
CMOS 6425
Bipolar 303
1
GND = AGND = DGND = 0 V.
30.4°C/W
Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
This device is a high performance RF integrated circuit with an
D rating of <2 kV, and it is ESD sensitive. Proper precautions
ES should be taken for handling and assembly.

ESD CAUTION

Rev. A | Page 6 of 20
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PIN CONFIGURATION AND FUNCTION DESCRIPTIONS

DD
DD
P
SET
V
DV
R
DV
20 CP
191817
16
CPGND 1
AGND 2 AGND 3 RFINB 4 RF
A 5
IN
PIN 1 INDICATOR
ADF4108
TOP VIEW
(Not to Scale)
6
7
DD
AV
AV
Figure 3. Pin Configuration
DD
8
IN
REF
DGND 9
DGND 10
15 MUXOUT 14 LE 13 DATA 12 CLK 11 CE
6015-003
Table 4. Pin Function Descriptions
Pin No. Mnemonic Description
1 CPGND Charge Pump Ground. This is the ground return path for the charge pump. 2, 3 AGND Analog Ground. This is the ground return path of the prescaler. 4 RFINB
Complementary Input to the RF Prescaler. This point must be d
ecoupled to the ground plane with a small bypass
capacitor, typically 100 pF. See Figure 11. 5 RFINA Input to the RF Prescaler. This small signal input is ac-coupled to the external VCO. 6, 7 AVDD
8 REFIN
Analog Power Supply. This voltage may range from 3.2 V to 3.6
plane should be placed as close as possible to this pin. AV
Reference Input. This is a CMOS input with a nominal thr
V. Decoupling capacitors to the analog ground
must be the same value as DVDD.
DD
eshold of V
/2 and a dc equivalent input resistance of
DD
100 kΩ. See Figure 10. This input can be driven from a TTL or CMOS crystal oscillator or it can be ac-coupled. 9, 10 DGND Digital Ground. 11 CE
12 CLK
Chip Enable. A logic low on this pin powers down the device and puts the charge pump output into three-state
. Taking the pin high powers up the device, depending on the status of the power-down bit, F2.
mode
Serial Clock Input. This serial clock is used to clock in the serial d
ata to the registers. The data is latched into the
24-bit shift register on the CLK rising edge. This input is a high impedance CMOS input. 13 DATA
Serial Data Input. The serial da
ta is loaded MSB first with the 2 LSBs being the control bits. This input is a high
impedance CMOS input. 14 LE
Load Enable, CMOS Input. When LE goes high, the data stored i
n the shift registers is loaded into one of the four
latches, the latch being selected using the control bits. 15 MUXOUT
This multiplexer output allows either the lock de
tect, the scaled RF, or the scaled reference frequency to be
accessed externally. 16, 17 DVDD
18 VP
Digital Power Supply. This may range from 3.2 V to 3.6 V. Dec
be placed as close as possible to this pin. DV
must be the same value as AVDD.
DD
Charge Pump Power Supply. This voltage should be greater than or equal to V
oupling capacitors to the digital ground plane should
. In systems where VDD is 3.3 V, it
DD
can be set to 5 V and used to drive a VCO with a tuning range of up to 5 V. 19 R
20 CP
SET
Connecting a resistor between this pin and CPGND sets the maximum charge pump output current. The nominal
oltage potential at the R
v
25.5
=
I
MAXCP
R
SET
with R
= 5.1 kΩ, I
SET
CP MAX
pin is 0.66 V. The relationship between ICP and R
SET
= 5 mA.
Charge Pump Output. When enabled, this pin provides ±I
to the external loop filter, which in turn drives the
CP
SET
is
external VCO.
Rev. A | Page 7 of 20
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TYPICAL PERFORMANCE CHARACTERISTICS

FREQ UNIT: GHz KEYWORD: R PARAM TYPE: s DATA FORMAT: MA
Freq MAGS11 ANGS11
0.89148
0.88133
0.87152
0.85855
0.84911
0.83512
0.82374
0.80871
0.79176
0.77205
0.75696
0.74234
0.72239
0.69419
0.67288
0.66227
0.64758
0.62454
0.59466
0.55932
0.52256
0.48754
0.46411
0.45776
0.44859
0.44588
0.43810
0.43269
0.42777
0.42859
0.43365
0.43849
0.44475
0.44800
0.45223
0.45555
0.45313
0.45622
–17.2820 –20.6919 –24.5386 –27.3228 –31.0698 –34.8623 –38.5574 –41.9093 –45.6990 –49.4185 –52.8898 –56.2923 –60.2584 –63.1446 –65.6464 –68.0742 –71.3530 –75.5658 –79.6404 –82.8246 –85.2795 –85.6298 –86.1854 –86.4997 –88.8080 –91.9737 –95.4087 –99.1282 –102.748 –107.167 –111.883 –117.548 –123.856 –130.399 –136.744 –142.766 –149.269 –154.884
0.50000
0.60000
0.70000
0.80000
0.90000
1.00000
1.10000
1.20000
1.30000
1.40000
1.50000
1.60000
1.70000
1.80000
1.90000
2.00000
2.10000
2.20000
2.30000
2.40000
2.50000
2.60000
2.70000
2.80000
2.90000
3.00000
3.10000
3.20000
3.30000
3.40000
3.50000
3.60000
3.70000
3.80000
3.90000
4.00000
4.10000
4.20000
Freq MAGS11 ANGS11
0.45555
4.30000
0.46108
4.40000
0.45325
4.50000
0.45054
4.60000
0.45200
4.70000
0.45043
4.80000
0.45282
4.90000
0.44287
5.00000
0.44909
5.10000
0.44294
5.20000
0.44558
5.30000
0.45417
5.40000
0.46038
5.50000
0.47128
5.60000
0.47439
5.70000
0.48604
5.80000
0.50637
5.90000
0.52172
6.00000
0.53342
6.10000
0.53716
6.20000
0.55804
6.30000
0.56362
6.40000
0.58268
6.50000
0.59248
6.60000
0.61066
6.70000
0.61830
6.80000
0.61633
6.90000
0.61673
7.00000
0.60597
7.10000
0.58376
7.20000
0.57673
7.30000
0.58157
7.40000
0.60040
7.50000
0.61332
7.60000
0.62927
7.70000
0.63938
7.80000
0.65320
7.90000
0.65804
8.00000
Figure 4. S Parameter Data for the RF Input
–159.680 –164.916 –168.452 –173.462 –176.697
178.824
174.947
170.237
166.617
162.786
158.766
153.195
147.721
139.760
132.657
125.782
121.110
115.400
107.705
101.572
97.5379
93.0936
89.2227
86.3300
83.0956
80.8843
78.0872
75.3727
73.9456
73.5883
74.1975
76.2136
77.1545
76.1122
74.8359
74.0546
72.0061
69.9926
06015-004
0
VDD = 3.3V, VP = 5V I
= 5mA
CP
PFD FREQUENCY = 1MHz LOOP BANDWI DTH = 30kHz
–20
RES BANDWIDTH = 3kHz VIDEO BANDWI DTH = 3kHz AVERAGES = 1 OUTPUT PO WER = –0. 3dBm
–40
VCO = ZCOM M CRO8000Z
–60
OUTPUT PO WER (dBm)
–80
–100
CENTER 7.9GHz RES BW 24kHz
Figure 7. Reference Spurs at 7.9 GHz
1R
VBW 24kHz
MARKER 1 1MHz
–82.091dBc
SPAN 2.5MHz
1
06015-011
0
VDD = 3.3V
–5
T
= +85°C
A
–10
–15
T
= +25°C
A
–20
–25
RF INPUT POWER (dBm)
–30
–35
198765432
RF INPUT FREQUENCY (GHz)
Figure 5. RF Input Sensitivity
50
–60
–70
–80
1
–90
–100
–110
CARRIER POWER –5. 23dBm
–120
PHASE NOISE (dBc/Hz)
V
= 3.3V, VP = 5V
DD
I
= 5mA
CP
–130
PFD FREQUENCY = 1MHz LOOP BANDWIDTH = 50kHz
–140
PHASE NOISE = –82dBc/Hz @ 1kHz VCO = ZCO MM CRO8000Z
–150
100Hz 10MHz
FREQUENCY OFFSET
MARKER 1 1kHz
Figure 6. Phase Noise at 7.9 GHz
T
= –40°C
A
–82.51dBc/Hz
6
5
4
3
VP = 5V I
SETTLING = 5mA
CP
2
1
0
(mA)
CP
I
–1
–2
–3
–4
–5
–6
V
(V)
06015-005
CP
5.00 0.5 1.0 1.5 2. 0 2.5 3.0 3.5 4.0 4.5
06015-015
Figure 8. Charge Pump Output Characteristics
120
–130
–140
–150
–160
PHASE NOISE (dBc/Hz)
–170
–180
06015-010
PHASE FREQUENCY DETECTOR ( Hz)
VDD = 3V
= 5V
V
P
100M10k 100k 1M 10M
06015-014
Figure 9. Phase Noise (Referred to CP Output) vs. PFD Frequency
Rev. A | Page 8 of 20
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ADF4108
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THEORY OF OPERATION

REFERENCE INPUT STAGE

The reference input stage is shown in Figure 10. SW1 and SW2 are normally closed switches. SW3 is normally open. When power-down is initiated, SW3 is closed and SW1 and SW2 are opened. This ensures that there is no loading of the REF
IN
pin
on power-down.
POWER-DOWN
CONTROL
NC
100k
SW1
NO
SW2
SW3
BUFFER
TO R COUNTER
6015-016
REF
IN
NC
Figure 10. Reference Input Stage

RF INPUT STAGE

The RF input stage is shown in Figure 11. It is followed by a two-stage limiting amplifier to generate the CML clock levels needed for the prescaler.
500
1.6V
500
AV
DD
BIAS
GENERATOR

A AND B COUNTERS

The A and B CMOS counters combine with the dual-modulus prescaler to allow a wide ranging division ratio in the PLL feedback counter. The counters are specified to work when the prescaler output is 300 MHz or less. Thus, with an RF input frequency of 4.0 GHz, a prescaler value of 16/17 is valid but a value of 8/9 is not valid.

Pulse Swallow Function

The A and B counters, in conjunction with the dual-modulus prescaler, make it possible to generate output frequencies that are spaced only by the reference frequency divided by R. The equation for the VCO frequency is as follows:
f
[]
()
VCO
where:
f
is the output frequency of external voltage controlled
VCO
oscillator (VCO). P is the preset modulus of dual-modulus prescaler (8/9, 16/17, and so on.).
B is the preset divide ratio of binary 13-bit counter (3 to 8191). A is the preset divide ratio of binary 6-bit swallow counter
(0 to 63).
f
is the external reference frequency oscillator.
REFIN
N = BP + A
REFIN
ABPf
×+×=
R
RFINA
B
RF
IN
AGND
Figure 11. RF Input Stage
6015-017

PRESCALER (P/P + 1)

The dual-modulus prescaler (P/P + 1), along with the A and B counters, enables the large division ratio, N, to be realized (N = BP + A). The dual-modulus prescaler, operating at CML levels, takes the clock from the RF input stage and divides it down to a manageable frequency for the CMOS A and B counters. The prescaler is programmable. It can be set in software to 8/9, 16/17, 32/33, or 64/65. It is based on a synchronous 4/5 core. A minimum divide ratio is possible for contiguous output frequencies. This minimum is determined by P, the prescaler value, and is given by (P
2
− P).
TO PFD
FROM RF
INPUT STAG
PRESCALER
P/P + 1
MODULUS CONTROL
N DIVIDER
Figure 12. A and B Counters
13-BIT B
COUNTER
LOAD
LOAD
6-BIT A
COUNTER

R COUNTER

The 14-bit R counter allows the input reference frequency to be divided down to produce the reference clock to the phase frequency detector (PFD). Division ratios from 1 to 16,383 are allowed.
06015-018
Rev. A | Page 9 of 20
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V
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PHASE FREQUENCY DETECTOR AND CHARGE PUMP

The phase frequency detector (PFD) takes inputs from the R counter and N counter (N = BP + A) and produces an output proportional to the phase and frequency difference between them. Figure 13 is a simplified schematic. The PFD includes a p
rogrammable delay element that controls the width of the antibacklash pulse. This pulse ensures that there is no dead zone in the PFD transfer function and minimizes phase noise and reference spurs. Two bits in the reference counter latch, ABP2 and ABP1, control the width of the pulse (see
he minimum antibacklash pulse width is not recommended.
t
UP
HI
R DIVIDER
HID1D2
N DIVIDER
Figure 13. PFD Simplified Schemat
Q1
U1
CLR1
PROGRAMMABLE
ABP2
CLR2
DOWN
Q2
U2
DELAY
U3
ABP1
ic and Timing (in Lock)
Figure 16). Use of
P
CHARGE
PUMP
CP
CPGND

MUXOUT AND LOCK DETECT

The output multiplexer on the ADF4108 allows the user to access various internal points on the chip. The state of MUXOUT is controlled by M3, M2, and M1 in the function latch.
Figure 18 shows the full truth table. Figure 14 shows the
OUT section in block diagram form.
MUX

Lock Detect

MUXOUT can be programmed for two types of lock detect: digital lock detect and analog lock detect.
Digital lock detect is active high. When the lock detect precision (
LDP) bit in the R counter latch is set to 0, digital lock detect is set high when the phase error on three consecutive phase detector (PD) cycles is less than 15 ns. With LDP set to 1, five
06015-019
consecutive cycles of less than 15 ns are required to set the lock detect. It stays set high until a phase error of greater than 25 ns is detected on any subsequent PD cycle.
The N-channel open-drain analog lock detect should be op
erated with an external pull-up resistor of 10 kΩ nominal. When lock has been detected, this output is high with narrow, low going pulses.
DV
DD
ANALOG LO CK DETECT
DIGITAL LOCK DET ECT
R COUNTER OUT PUT
N COUNTER OUT PUT
SDOUT
MUX
Figure 14. MUXOUT Circuit
CONTROL
MUXOUT
DGND

INPUT SHIFT REGISTER

The ADF4108 digital section includes a 24-bit input shift register, a 14-bit R counter, and a 19-bit N counter, comprising a 6-bit A counter and a 13-bit B counter. Data is clocked into the 24-bit shift register on each rising edge of CLK. The data is clocked in MSB first. Data is transferred from the shift register to one of four latches on the rising edge of LE. The destination latch is determined by the state of the two control bits (C2, C1) in the shift register. These are the 2 LSBs, DB1 and DB0, as shown in the timing diagram of
hese bits is shown in Tabl e 5.
t
Figure 15 shows a summary of how the latches are pro
grammed.
Table 5. C2 and C1 Truth Table
Control Bits
C2 C1
Data Latch
0 0 R counter 0 1 N counter (A and B) 1 0
Function latch (including prescaler)
1 1 Initialization latch
Figure 2. The truth table for
6015-020
Rev. A | Page 10 of 20
Page 11
ADF4108
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LATCH SUMMARY

REFERENCE COUNTER LATCH
RESERVED
00X
RESERVED
PRESCALER
VALUE
DB22DB23
TEST
MODE BITS
LOCK
DETECT
PRECISION
DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB13 DB12 DB11 DB10 DB9 DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0
DB21DB22DB23
CP GAIN
DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB13 DB12 DB11 DB10 DB9 DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0
DB21DB22DB23
G1XX
CURRENT
SETTING
POWER-
DB21
DOWN 2
2
DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB13 DB12 DB11 DB10 DB9 DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0
ANTI-
BACKLASH
WIDTH
CURRENT
SETTING
CPI3CPI4
13-BIT B COUNTE R
1
N COUNTER LATCH
FUNCTION L ATCH
TIMER COUNT ER
CONTROL
TC3 TC2 TC1
14-BIT REFE RENCE COUNTER
R6
R7R8R9R10R11R12R13R14ABP1ABP2T1T2LDP
MODE
ENABLE
FASTLOCK
FASTLOCK
F4F5
PD
STATE
POLARITY
CP THREE-
6-BIT A COUNT ER
MUXOUT
CONTROL
A1A2A3A4A5B1B2B3B4B5B6B7B8B9B10B11B12B13 A6
POWER-
DOWN 1
COUNTER
C2 (0) C1 (0)R1R2R3R4R5
C2 (0)
RESET
C2 (1) C1 (0)F1PD1M1M2M3F3P1P2 CPI1CPI2CPI5CPI6 TC4PD2 F2
CONTROL
BITS
CONTROL
BITS
C1 (1)
CONTROL
BITS
PRESCALER
VALUE
DB21
DB22DB23
P1P2 CPI1CPI2
CURRENT
SETTING
POWER-
DOWN 2
2
DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB13 DB12 DB11 DB10 DB9
CPI5
CPI6 T C4PD2
CPI3CPI4
CURRENT
SETTING
1
INITIALIZATION LATCH
TIMER COUNTER
CONTROL
TC3 TC2 TC1
Figure 15. Latch Summary
Rev. A | Page 11 of 20
DOWN 1
RESET
COUNTER
F1PD1M1M2M3
CONTROL
BITS
C2 (1) C1 (1)
06015-021
MODE
ENABLE
FASTLOCK
FASTLOCK
F4F5
PD
STATE
CP THREE-
D
DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0
B
8
F3
F2
MUXOUT
CONTROL
POLARITY
POWER-
Page 12
ADF4108
www.BDTIC.com/ADI

REFERENCE COUNTER LATCH MAP

RESERVED
X
X
= DON’T CARE
DB21DB22DB 23
00
TEST
MODE BITS
LOCK
DETECT
PRECISION
DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB13 DB12 DB11 DB10 DB9 DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0
ANTI-
BACKLASH
WIDTH
R14 R13 R12 .......... R3 R2 R1
0 0 0 .......... 0 0 1 1
0 0 0 .......... 0 1 0 2
0 0 0 .......... 0 1 1 3
0 0 0 .......... 1 0 0 4
. . . .......... . . . .
. . . .......... . . . .
. . . .......... . . . .
1 1 1 .......... 1 0 0 16380
1 1 1 .......... 1 0 1 16381
1 1 1 .......... 1 1 0 16382
1 1 1 .......... 1 1 1 16383
ABP2 ABP1
0 0 2.9n s 0 1 1.3n s TEST M ODE ONLY . DO NOT USE 1 0 6.0n s 1 1 2.9n s
ANTIBACKLASH PULSE WIDTH
14-BIT REFE RENCE COUNTER
CONTROL
BITS
C2 (0) C1 (0)R1R2R3R4R5R6R7R8R9R10R11R12R13R14ABP1ABP2T1T2LDP
DIVIDE RATI O
LDP
0
1
BOTH OF THESE BITS MUST BE SET TO 0 FOR NORMAL OPE RATION.
TEST MODE BITS SHOULD BE SET TO 00 FOR NORMAL OPERATIO N.
OPERATIO N
THREE CONSECUTIVE CYCLES OF PHASE DELAY LESS THAN 15ns MUST O CCUR BEFORE LOCK DETECT I S SET. FIVE CONSECUTIVE CYCL ES OF PHASE DELAY LESS T HAN 15ns MUST O CCUR BEFORE LOCK DETECT I S SET.
Figure 16. Reference Counter Latch Map
06015-022
Rev. A | Page 12 of 20
Page 13
ADF4108
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AB COUNTER LATCH MAP

RESERVED
DB22DB23
XX
13-BIT B COUNTER
CP GAIN
DB21
G1
DB19
DB20
X = DON’T CARE
B13 B12 B11 B3 B2 B1
0 0 0 .......... 0 0 0
0 0 0 .......... 0 0 1
0 0 0 .......... 0 1 0
0 0 0 .......... 0 1 1
. . . ..... ..... . . .
. . . ..... ..... . . .
. . . ..... ..... . . .
1 1 1 .......... 1 0 0
1 1 1 .......... 1 0 1
1 1 1 .......... 1 1 0
1 1 1 .......... 1 1 1
DB18 DB17
DB16 DB15 DB14
DB13 DB12 DB11
DB10 DB9
B COUNTER DIVIDE RAT IO
NOT ALL OWED
NOT ALLOW ED
NOT ALLOW ED 3 .
. . 8188 8189 8190
8191
DB8 DB7
A6 A5 .......... A2 A1
0 0 .......... 0 0 0
0 0 .......... 0 1 1
0 0 .......... 1 0 2
0 0 .......... 1 1 3
. . ..... ..... . . .
. . ..... ..... . . .
. . ..... ..... . . .
1 1 .......... 0 0 60
1 1 .......... 0 1 61
1 1 .......... 1 0 62
1 1 .......... 1 1 63
6-BIT A COUNTER
DB6 DB5
DB4 DB3
CONTROL
DB2 D B1
C2 (0) C1 (1)A1A2A3A4A5B1B2B3B4B5B6B7B8B9B10B11B12B13 A6
A COUNTER DIVIDE RATIO
BITS
DB0
F4 (FUNCTION L ATCH) FASTLOCK ENABLE
00
0
1
11
THESE BITS ARE NOT USED BY THE DEVICE AND ARE DON'T CARE BITS .
G1 CP GAIN
1
0
OPERATION
CHARGE PUMP CURRENT SETTING 1 IS PE RMANENTLY USED.
CHARGE PUMP CURRENT SETTING 2 IS PERMANENTLY USED.
CHARGE PUMP CURRENT SETTING 1 IS USED.
CHARGE PUMP CURRENT IS SWITCHED TO SETTING 2. THE TIME SPENT IN SETTING 2 IS DEPENDENT ON WHICH FASTL OCK MODE IS USED. SEE F UNCTION LATCH DESCRIPTIO N.
Figure 17. AB Counter Latch Map
Rev. A | Page 13 of 20
N = BP + A, P IS PRESCALER VALUE SET IN THE FUNCTION LATCH. B MUST BE GREATER THAN OR EQUAL TO A. FOR CONTINUOUSLY ADJACENT VALUES OF (N × F OUTPUT, N
IS (P2 – P).
MIN
REF
), AT THE
6015-023
Page 14
ADF4108
www.BDTIC.com/ADI

FUNCTION LATCH MAP

PRESCALER
VALUE
DB22DB23
CURRENT
SETTING
POWER-
DB21
DOWN 2
2
DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB13 D B12 DB1 1 DB10 DB9 DB8 DB7 DB6 DB5 DB4 DB 3 DB2 DB1 DB0
CPI6
CURRENT
SETTING
1
CPI3CPI 4
TC4TC3TC2TC1
00003 00017
001011 001115
010019 010123 011027 011131 100035 100139 101043 101147 110051 110155 111059 111163
TIMER COUNTER
CONTROL
TC3 TC2 TC1
TC4PD2 F2
MODE
FASTLOCK
F5
F4
0 1 1
TIMEOUT (PFD CYCLES)
STATE
ENABLE
CP THREE-
FASTLOCK
F4
CHARGE PUMP
F3
OUTPUT
0
NORMAL THREE-STATE
1
F5
FASTLOCK MODE
X
FASTLOCK DISABL ED
0
FASTLOCK MODE 1
1
FASTLOCK MODE 2
MUXOUT
PD
CONTROL
POLARITY
PHASE DETECTOR
F2
POLARITY
NEGATIVE
0
POSITIVE
1
M3 M2 M1
000 001
010 011 100 101
110 111
POWER-
DOWN 1
M1M2M3F3P1P2 CPI1CPI2CPI5
PD1
F1
0 1
COUNTER
F1
CONTRO L
BITS
RESET
C2 (1) C1 (0)
COUNTER OPERATION
NORMAL R, A, B CO UNTERS
HELD IN RE SET
OUTPUT
THREE-STATE OUTPUT DIGITAL LOCK DETECT (ACTIVE HIGH)
N DIVIDE R OUTPUT DV
DD
R DIVIDE R OUTPUT N-CHANNEL OPEN-DRAIN LOCK DETECT SERIAL DATA OUT PUT DGND
(mA)
CPI6 CPI5 CPI4
CPI3 CPI2 CPI1
0 0 0 1.06 0.625 0. 289 0 0 1 2.12 1.25 0.580 0 1 0 3.18 1.875 0. 870 0 1 1 4.24 2.5 1.160
1 0 0 5.30 3.125 1. 450 1 0 1 6.36 3.75 1.730 1 1 0 7.42 4.375 2. 020 1 1 1 8.50 5.0 2.320
CE PIN
0 1 101 111
P2 P1
00 8/9 0 1 16/17 1 0 32/33 1 1 64/65
PD2 PD1 MODE
X X0
PRESCALER VALUE
3k 5. 1k 11k
ASYNCHRONOUS POWER-DOW N
X
NORMAL O PERAT ION ASYNCHRONOUS POWER-DOW N SYNCHRONOUS POWER-DO WN
I
CP
Figure 18. Function Latch Map
Rev. A | Page 14 of 20
6015-024
Page 15
ADF4108
www.BDTIC.com/ADI

INITIALIZATION LATCH MAP

PRESCALER
VALUE
DB22DB23
CURRENT
SETTING
POWER-
DB21
DOWN 2
2
DB20 DB19 DB18 DB17 DB16 DB15 DB14 DB13 DB12 DB11 DB10 DB 9 DB8 DB7 DB6 DB5 DB4 DB3 DB2 DB1 DB0
CPI6
CURRENT
SETTING
1
CPI3CPI 4
TC4 TC3 TC2 TC1
00003 00017
001011 001115
010019 010123 011027 011131 100035 100139 101043 101147 110051 110155 111059 111163
TIMER COUNTER
CONTROL
TC3 TC2 TC1
TC4PD2 F2
MODE
FASTLOCK
F5
F4
0 1 1
TIMEOUT (PFD CYCLES)
STATE
ENABLE
CP THREE-
FASTLOCK
F4
CHARGE PUMP
F3
OUTPUT
NORMAL
0
THREE-STATE
1
F5
FASTLOCK MODE
X
FASTLOCK DISABLED
0
FASTLOCK MODE 1
1
FASTLOCK MODE 2
MUXOUT
PD
CONTROL
POLARITY
PHASE DETECTOR
F2
POLARITY
0
NEGATIVE POSITIVE
1
M3 M2 M1
000 001
010 011 100 101
110 111
POWER-
DOWN 1
M1M2M3F3P1P2 CPI1CPI2CPI5
PD1
F1
0 1
COUNTER
F1
CONTROL
BITS
RESET
C2 (1) C1 (1)
COUNTER OPERATION
NORMAL R, A, B COUNTERS
HELD IN RESET
OUTPUT
THREE-STATE OUTPUT DIGITAL LOCK DETECT (ACTIVE HIGH)
N DIVIDE R OUTPUT DV
DD
R DIVIDE R OUTPUT N-CHANNEL OPEN-DRAIN LOCK DETECT SERIAL DATA OUTPUT DGND
(mA)
CPI6 CPI5 CPI4
CPI3 CPI2 CPI1
0 0 0 1.06 0.625 0. 289 0 0 1 2.12 1.25 0.580 0 1 0 3.18 1.875 0. 870 0 1 1 4.24 2.5 1.160
1 0 0 5.30 3.125 1. 450 1 0 1 6.36 3.75 1.730 1 1 0 7.42 4.375 2. 020 1 1 1 8.50 5.0 2.320
CE PIN
0 1 101 111
P2 P1
00 8/9 01 16/17 10 32/33 11 64/65
PD2 PD1 MODE
X X0
PRESCALER VALUE
3k 5. 1k 11k
ASYNCHRONOUS POWER-DO WN
X
NORMAL OPERATI ON ASYNCHRONOUS POWER-DO WN SYNCHRONOUS POWER-DOWN
I
CP
Figure 19. Initialization Latch Map
Rev. A | Page 15 of 20
6015-025
Page 16
ADF4108
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FUNCTION LATCH

The on-chip function latch is programmed with C2 and C1 set to 1 and 0, respectively. Figure 18 shows the input data format
or programming the function latch.
f

Counter Reset

DB2 (F1) is the counter reset bit. When this bit is 1, the R counter and the AB counters are reset. For normal operation, this bit should be 0. Upon powering up, the F1 bit needs to be disabled (set to 0). Then, the N counter resumes counting in close alignment with the R counter. (The maximum error is one prescaler cycle.)

Power-Down

DB3 (PD1) and DB21 (PD2) provide programmable power­down modes. They are enabled by the CE pin.
When the CE pin is low, the device is immediately disabled re
gardless of the states of PD2 and PD1.
In the programmed asynchronous power-down, the device p
owers down immediately after latching a 1 into the PD1 bit,
with the condition that PD2 has been loaded with a 0.
In the programmed synchronous power-down, the device
ower-down is gated by the charge pump to prevent unwanted
p frequency jumps. Once the power-down is enabled by writing a 1 into PD1 (on condition that a 1 has also been loaded to PD2), the device goes into power-down on the occurrence of the next charge pump event.
When a power-down is activated (either synchronous or asy
nchronous mode, including CE pin activated power-down),
the following events occur:
ll active dc current paths are removed.
A
The R
The cha
The dig
The RFIN
T
The i

MUXOUT Control

The on-chip multiplexer is controlled by M3, M2, and M1 on the ADF4108. Figure 18 shows the truth table.

Fastlock Enable Bit

DB9 of the function latch is the fastlock enable bit. Fastlock is enabled only when this bit is 1.

Fastlock Mode Bit

DB10 of the function latch is the fastlock mode bit. When fastlock is enabled, this bit determines which fastlock mode is
, N, and timeout counters are forced to their load
state conditions.
rge pump is forced into three-state mode.
ital lock detect circuitry is reset.
input is debiased.
he reference input buffer circuitry is disabled.
nput register remains active and capable of loading
and latching data.
used. If the fastlock mode bit is 0, then Fastlock Mode 1 is selected; and if the fastlock mode bit is 1, then Fastlock Mode 2 is selected.
Fastlock Mode 1
The charge pump current is switched to the contents of Current Setting 2.
The device enters fastlock by having a 1 written to the CP gain b
it in the AB counter latch. The device exits fastlock by having a
0 written to the CP gain bit in the AB counter latch.
Fastlock Mode 2
The charge pump current is switched to the contents of Current Setting 2.
The device enters fastlock by having a 1 written to the CP gain b
it in the AB counter latch. The device exits fastlock under the control of the timer counter. After the timeout period determined by the value in TC4:TC1, the CP gain bit in the AB counter latch is automatically reset to 0 and the device reverts to normal mode instead of fastlock. See
riods.
pe
Figure 18 for the timeout

Timer Counter Control

The user has the option of programming two charge pump currents. The intent is that Current Setting 1 is used when the RF output is stable and the system is in a static state. Current Setting 2 is meant to be used when the system is dynamic and in a state of change (that is, when a new output frequency is programmed).
The normal sequence of events is as follows:
The user initially decides what the preferred charge pump c
urrents are going to be. For example, the choice may be 2.5 mA
as Current Setting 1 and 5 mA as Current Setting 2.
At the same time, it must be decided how long the secondary
urrent is to stay active before reverting to the primary current.
c This is controlled by the timer counter control bits, DB14:DB11 (TC4:TC1) in the function latch. The truth table is given in Figure 18.
Now, to program a new output frequency, the user simply p
rograms the AB counter latch with new values for A and B. At the same time, the CP gain bit can be set to 1, which sets the charge pump with the value in CPI6:CPI4 for a period of time determined by TC4:TC1. When this time is up, the charge pump current reverts to the value set by CPI3:CPI1. At the same time, the CP gain bit in the AB counter latch is reset to 0 and is now ready for the next time the user wishes to change the frequency.
Note that there is an enable feature on the timer counter. It is ena
bled when Fastlock Mode 2 is chosen by setting the fastlock
mode bit (DB10) in the function latch to 1.
Rev. A | Page 16 of 20
Page 17
ADF4108
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Charge Pump Currents

CPI3, CPI2, and CPI1 program Current Setting 1 for the charge pump. CPI6, CPI5, and CPI4 program Current Setting 2 for the charge pump. The truth table is given in
Figure 18.

Prescaler Value

P2 and P1 in the function latch set the prescaler values. The prescaler value should be chosen so that the prescaler output frequency is always less than or equal to 300 MHz. Thus, with an RF frequency of 4 GHz, a prescaler value of 16/17 is valid but a value of 8/9 is not valid.

PD Polarity

This bit sets the phase detector polarity bit. See Figure 18.

CP Three-State

This bit controls the CP output pin. With the bit set high, the CP output is put into three-state. With the bit set low, the CP output is enabled.

INITIALIZATION LATCH

The initialization latch is programmed when C2 and C1 are set to 1 and 1. This is essentially the same as the function latch (programmed when C2, C1 = 1, 0).
However, when the initialization latch is programmed, an
itional internal reset pulse is applied to the R and AB
add counters. This pulse ensures that the AB counter is at load point when the AB counter data is latched and the device will begin counting in close phase alignment.
If the latch is programmed for synchronous power-down (CE
in is high; PD1 bit is high; PD2 bit is low), the internal pulse
p also triggers this power-down. The prescaler reference and the oscillator input buffer are unaffected by the internal reset pulse and so close phase alignment is maintained when counting resumes.
When the first AB counter data is latched after initialization, the in
ternal reset pulse is again activated. However, successive AB
counter loads after this do not trigger the internal reset pulse.

Device Programming After Initial Power-Up

After initially powering up the device, there are three ways to program the device.
Initialization Latch Method
1. Apply V
2. Pr
ogram the initialization latch (11 in 2 LSBs of input
word). Make sure that the F1 bit is programmed to 0.
3. N
ext, do a function latch load (10 in 2 LSBs of the control
word), making sure that the F1 bit is programmed to a 0.
4. Then
5. Then
.
DD
do an R load (00 in 2 LSBs).
do an AB load (01 in 2 LSBs).
When the initialization latch is loaded, the following occurs:
1. The f
2. A
3. L
unction latch contents are loaded.
n internal pulse resets the R, AB, and timeout counters to load state conditions and also three-states the charge pump. Note that the prescaler band gap reference and the oscillator input buffer are unaffected by the internal reset pulse, allowing close phase alignment when counting resumes.
atching the first AB counter data after the initialization word activates the same internal reset pulse. Successive AB loads do not trigger the internal reset pulse unless there is another initialization.
CE Pin Method
1. Apply VDD.
ing CE low to put the device into power-down. This is an
2. Br
asynchronous power-down in that it happens immediately.
rogram the function latch (10).
3. P
4. P
rogram the R counter latch (00).
5. P
rogram the AB counter latch (01).
ring CE high to take the device out of power-down. The R
6. B
and AB counters will now resume counting in close alignment.
Note that after CE goes high, a duration of 1 s may be required
r the prescaler band gap voltage and oscillator input buffer
fo bias to reach steady state.
CE can be used to power the device up and down to check for
nnel activity. The input register does not need to be repro-
cha grammed each time the device is disabled and enabled as long as it has been programmed at least once after V applied.
was initially
DD
Counter Reset Method
1. Apply V
2. Do a f
load 1 to the F1 bit. This enables the counter reset.
3. Do a
4. Do a
5. Do a f
load 0 to the F1 bit. This disables the counter reset.
This sequence provides the same close alignment as the i
nitialization method. It offers direct control over the internal reset. Note that counter reset holds the counters at load point and three-states the charge pump, but does not trigger synchronous power-down.
.
DD
unction latch load (10 in 2 LSBs). As part of this,
n R counter load (00 in 2 LSBs).
n AB counter load (01 in 2 LSBs).
unction latch load (10 in 2 LSBs). As part of this,

POWER SUPPLY CONSIDERATIONS

The ADF4108 operates over a power supply range of 3.2 V to
3.6 V. The ADP3300ART-3.3 is a low dropout linear regulator
rom Analog Devices, Inc. It outputs 3.3 V with an accuracy of
f
1.4% and is recommended for use with the ADF4108.
Rev. A | Page 17 of 20
Page 18
ADF4108
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INTERFACING

The ADF4108 has a simple SPI-compatible serial interface for writing to the device. CLK, DATA, and LE control the data transfer. When LE (latch enable) goes high, the 24 bits that have been clocked into the input register on each rising edge of CLK are transferred to the appropriate latch. See t
iming diagram and Tabl e 5 for the latch truth table.
Figure 2 for the
The maximum allowable serial clock rate is 20 MHz. This m
eans that the maximum update rate possible for the device is 833 kHz or one update every 1.2 µs. This is certainly more than adequate for systems that have typical lock times in hundreds of microseconds.

ADuC812 INTERFACE

Figure 20 shows the interface between the ADF4108 and the
ADuC812 MicroConverter®. Because the ADuC812 is based on
n 8051 core, this interface can be used with any 8051-based
a microcontroller. The MicroConverter is set up for SPI master mode with CPHA = 0. To initiate the operation, the I/O port driving LE is brought low. Each latch of the ADF4108 needs a 24-bit word. This is accomplished by writing three 8-bit bytes from the MicroConverter to the device. When the third byte has been written, the LE input should be brought high to complete the transfer.
On first applying power to the ADF4108, it needs four writes (o
ne each to the initialization latch, function latch, R counter latch, and N counter latch) for the output to become active.
I/O port lines on the ADuC812 are also used to control power-
wn (CE input) and to detect lock (MUXOUT configured as
do lock detect and polled by the port input).
When operating in the mode described, the maximum
OCK rate of the ADuC812 is 4 MHz. This means that
SCL the maximum rate at which the output frequency can be changed is 166 kHz.
SCLOCK
MOSI
ADuC812
I/O PORTS
Figure 20. ADuC812 to ADF4108 Interface

ADSP-21xx INTERFACE

Figure 21 shows the interface between the ADF4108 and the ADSP-21xx digital signal processor. The ADF4108 needs a 24-bit serial word for each latch write. The easiest way to accomplish this using the ADSP-21xx family is to use the autobuffered transmit mode of operation with alternate framing. This provides a means for transmitting an entire block of serial data before an interrupt is generated. Set up the word length for 8 bits and use three memory locations for each 24-bit word. To program each 24-bit latch, store the three 8-bit bytes, enable the autobuffered mode, and then write to the transmit register of the DSP. This last operation initiates the autobuffer transfer.
SCLOCK
MOSI
ADSP-21x x
TFS
I/O FLAGS
Figure 21. ADSP-21xx to ADF4108 Interface
CLK
DATA
LE
ADF4108
CE
MUXOUT (LOCK DETECT )
CLK
DATA
LE
ADF4108
CE
MUXOUT (LOCK DETECT )
6015-026
6015-027
Rev. A | Page 18 of 20
Page 19
ADF4108
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PCB DESIGN GUIDELINES FOR CHIP SCALE PACKAGE

The lands on the chip scale package (CP-20-1) are rectangular. The printed circuit board pad for these should be 0.1 mm longer than the package land length and 0.05 mm wider than the package land width. The land should be centered on the pad. This ensures that the solder joint size is maximized. The bottom of the chip scale package has a central thermal pad.
The thermal pad on the printed circuit board should be at least as la
rge as this exposed pad. On the printed circuit board, there should be a clearance of at least 0.25 mm between the thermal pad and the inner edges of the pad pattern. This ensures that shorting is avoided.
Thermal vias can be used on the printed circuit board thermal
ad to improve thermal performance of the package. If vias are
p used, they should be incorporated in the thermal pad at 1.2 mm pitch grid. The via diameter should be between 0.3 mm and
0.33 mm and the via barrel should be plated with 1 oz. copper to plug the via.
The user should connect the printed circuit board thermal pad to
AGND.
Rev. A | Page 19 of 20
Page 20
ADF4108
C
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OUTLINE DIMENSIONS

0.08
0.50
BSC
0.75
0.60
0.50
0.60 MAX
15
11
16
EXPOSED
PAD
(BOTTOM VIEW)
10
1
P
N
I
R
C
A
O
T
N
I
D
2.25
2.10 SQ
1.95
0.25 MIN
I
082207-B
20
1
5
6
4.00
INDI
ATO R
1.00
0.85
0.80
SEATING
PLANE
PIN 1
12° MAX
BSC SQ
TOP VIEW
0.80 MAX
0.65 TYP
0.30
0.23
0.18
COMPLIANT
BCS SQ
TO
0.60 MAX
3.75
0.05 MAX
0.02 NOM COPLANARITY
0.20 REF
JEDEC STANDARDS MO-220-VGGD-1
Figure 22. 20-Lead Lead Frame Chip Scale Package [LFCSP_VQ]
4 mm x 4 mm Body, Very Thin Quad
(CP-20-1)
Dimensions shown in millimeters

ORDERING GUIDE

Model Temperature Range Package Description Package Option
ADF4108BCPZ ADF4108BCPZ-RL ADF4108BCPZ-RL7 EVAL-ADF4108EBZ1
1
Z = RoHS Compliant Part.
1
1
1
1
−40°C to +85°C 20-Lead Lead Frame Chip Scale Package [LFCSP_VQ] CP-20-1
−40°C to +85°C 20-Lead Lead Frame Chip Scale Package [LFCSP_VQ] CP-20-1
−40°C to +85°C 20-Lead Lead Frame Chip Scale Package [LFCSP_VQ] CP-20-1 Evaluation Board
©2006–2007 Analog Devices, Inc. All rights reserved. Trademarks and registered trademarks are the property of their respective owners. D06015-0-12/07(A)
Rev. A | Page 20 of 20
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