Differential ECL-compatible outputs
700 ps propagation delay input to output
75 ps propagation delay dispersion
Input common-mode range: –2.0 V to +3.0 V
Robust input protection
Differential latch control
Internal latch pull-up resistors
Power supply rejection greater than 85 dB
700 ps minimum pulse width
1.5 GHz equivalent input rise time bandwidth
Typical output rise/fall time of 500 ps
ESD protection > 4kV HBM, >200V MM
Programmable hysteresis
APPLICATIONS
Automatic test equipment
High speed instrumentation
Scope and logic analyzer front ends
Window comparators
High speed line receivers
Threshold detection
Peak detection
High speed triggers
Patient diagnostics
Hand-held test instruments
Zero crossing detectors
Line receivers and signal restoration
Clock drivers
GENERAL DESCRIPTION
The ADCMP563/ADCMP564 are high speed comparators
fabricated on Analog Devices’ proprietary XFCB process. The
devices feature a 700 ps propagation delay with less than 75 ps
overdrive dispersion. Dispersion, a measure of the difference in
propagation delay under differing overdrive conditions, is a
particularly important characteristic of high speed comparators.
A separate programmable hysteresis pin is available on the
ADCMP564.
A differential input stage permits consistent propagation delay
wi
th a wide variety of signals in the common-mode range from
−2.0 V to +3.0 V. Outputs are complementary digital signals
that are fully compatible with ECL 10 K and 10 KH logic
families. The outputs provide sufficient drive current to directly
drive transmission lines terminated in 50 Ω to −2 V. A latch
input, which is included, permits tracking, track-and-hold, or
sample-and-hold modes of operation. The latch input pins
contain internal pull-ups that set the latch in tracking mode
when left open.
The ADCMP563/ADCMP564 are specified over the industrial
emperature range (−40°C to +85°C).
t
1
2
3
ADCMP564
4
BRQ
5
TOP VIEW
(Not to Scale)
6
7
8
9
10
GND
12
LEB
11
LEB
10
9
V
CC
Q OUTPUT
Q OUTPUT
111151-0-026
04650-0-001
GND
20
QB
19
QB
18
GND
17
LEB
16
LEB
15
V
14
–INB
13
+INB
12
HYSB
11
CC
04650-0-012
Rev. B
Information furnished by Analog Devices is believed to be accurate and reliable.
However, no responsibility is assumed by Analog Devices for its use, nor for any
infringements of patents or other rights of third parties that may result from its use.
Specifications subject to change without notice. No license is granted by implication
or otherwise under any patent or patent rights of Analog Devices. Trademarks and
registered trademarks are the property of their respective owners.
hanges to Specification Table ....................................................... 4
C
Changes to Figure 14........................................................................ 9
Changes to Figure 21...................................................................... 12
Changes to Figure 23...................................................................... 13
4/04—Revision 0: Initial Version
Rev. B | Page 2 of 16
Page 3
ADCMP563/ADCMP564
www.BDTIC.com/ADI
SPECIFICATIONS
VCC = +5.0 V, VEE = −5.2 V, TA = −40°C to +85°C. Typical values are at TA = +25°C, unless otherwise noted.
Table 1. Electrical Characteristics
Parameter Symbol Conditions Min Typ Max Unit
DC INPUT CHARACTERISTICS
Input Voltage Range −2.0 3.0 V
Input Differential Voltage −5 +5 V
Input Offset Voltage V
OS
Input Offset Voltage Channel Matching ±2.0 mV
Offset Voltage Temperature Coefficient ∆VOS/d
Input Bias Current I
BC
Input Bias Current Temperature Coefficient 0.5 nA/°C
Input Offset Current ±1.0 μA
Input Capacitance C
IN
Input Resistance, Differential Mode 750 kΩ
Input Resistance, Common Mode 1800 kΩ
Active Gain A
V
Common-Mode Rejection Ratio CMRR VCM = −2.0 V to +3.0 V 80 dB
Hysteresis R
LATCH ENABLE CHARACTERISTICS
Latch Enable Voltage Range −2.0 0 V
Latch Enable Differential Input Voltage 0.4 2.0 V
Latch Enable Input High Current @ 0.0 V −300 +300 μA
Latch Enable Input Low Current @ −2.0 V −300 +300 μA
LE Voltage, Open Latch inputs not connected −0.2 0 +0.1 V
LE Voltage, Open
Latch Setup Time t
Latch Hold Time t
Latch to Output Delay
Latch Minimum Pulse Width t
Latch inputs not connected −2.8 −2.6 −2.4 V
S
H
t
PLOH
t
PLOL
PL
DC OUTPUT CHARACTERISTICS
Output Voltage—High Level V
Output Voltage—Low Level V
Rise Time t
Fall Time t
OH
OL
R
F
AC PERFORMANCE
Propagation Delay t
PD
V
Propagation Delay Temperature Coefficient ∆tPD /d
Prop Delay Skew—Rising Transition to Falling
V
Transition
Within Device Propagation Delay Skew—
V
Channel-to-Channel
Overdrive Dispersion 20 mV ≤ VOD ≤ 100 mV 75 ps
100 mV ≤ VOD ≤ 1.5 V 75 ps
Slew Rate Dispersion 0.4 V/ns ≤ SR ≤ 1.33 V/ns 50 ps
Pulse Width Dispersion 750ps ≤ PW ≤ 10ns 25 ps
Duty Cycle Dispersion 33 MHz, 1 V/ns, 0.5 V 10 ps
Common-Mode Voltage Dispersion 1 V swing, −1.5 V ≤ VCM ≤ +2.5 V 10 ps
ECL 50 Ω to −2.0 V −1.15 −0.81 V
ECL 50 Ω to −2.0 V −1.95 −1.54 V
10% to 90% 530 ps
10% to 90% 450 ps
VOD = 1 V 700 ps
= 20 mV 830 ps
OD
VOD = 1 V 0.25 ps/°C
T
= 1 V 50 ps
OD
= 1 V 50 ps
OD
Rev. B | Page 3 of 16
Page 4
ADCMP563/ADCMP564
www.BDTIC.com/ADI
Parameter Symbol Conditions Min Typ Max Unit
AC PERFORMANCE (Continued)
Equivalent Input Rise Time Bandwidth
Maximum Toggle Rate >50% output swing, 50% duty cycle 800 MHz
Minimum Pulse Width PW
RMS Random Jitter
Unit to Unit Propagation Delay Skew 100 ps
POWER SUPPLY
Positive Supply Current I
Negative Supply Current I
Positive Supply Voltage V
Negative Supply Voltage V
Power Dissipation P
Dual, with load 150 180 230 mW
DC Power Supply Rejection Ratio—V
DC Power Supply Rejection Ratio—V
HYSTERESIS (ADCMP564 Only)
Hysteresis R
R
Hysteresis Pin Bias Voltage Referred to AGND −1 V
Hysteresis Pin Series Resistance 3 kΩ
1
Equivalent input rise time bandwidth assumes a first-order input response and is calculated by the following formula: BWEQ = 0.22/√(tr
20/80 input transition time applied to the comparator and tr is the effective transition time, as digitized by the comparator input.
1
BW
EQ
MIN
0 V to 1 V swing, 2 V/ns 1500 MHz
ΔtPD < 25 ps 700 ps
= 400 mV, 1.3 V/ns, 312 MHz,
V
OD
1.0 ps
50% duty cycle
VCC
VEE
CC
EE
D
CC
EE
PSRR
PSRR
COMP
@ +5.0 V 2 3.2 5 mA
@ −5.2 V 10 19 25 mA
Dual 4.75 5.0 5.25 V
Dual −4.96 −5.2 −5.45 V
Dual, without load 90 120 150 mW
85 dB
VCC
85 dB
VEE
= 23.5 kΩ 20 mV
HYS
= 9.0 kΩ 70 mV
HYS
2
2
P
– tr
COMP
), where tr is the
IN
IN
Rev. B | Page 4 of 16
Page 5
ADCMP563/ADCMP564
www.BDTIC.com/ADI
ABSOLUTE MAXIMUM RATINGS
Table 2.
Parameter Rating
Supply Voltages
Positive Supply Voltage (VCC to GND) −0.5 V to +6.0 V
Negative Supply Voltage (VEE to GND) −6.0 V to +0.5 V
Ground Voltage Differential −0.5 V to +0.5 V
Input Voltages
Input Common-Mode Voltage −3.0 V to +4.0 V
Differential Input Voltage −7.0 V to +7.0 V
Input Voltage, Latch Controls VEE to +0.5 V
Output
Output Current 30 mA
Temperature
Operating Temperature, Ambient −40°C to +85°C
Operating Temperature, Junction 125°C
Storage Temperature Range −65°C to +150°C
S
tresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to
absolute maximum rating conditions for extended periods may
affect device reliability.
THERMAL CONSIDERATIONS
The ADCMP563 QSOP 16-lead package option has a θJA
(junction-to-ambient thermal resistance) of 104°C/W in
still air.
The ADCMP563 LFCSP 16-lead package option has a θ
(junction-to-ambient thermal resistance) of 70°C/W in
still air.
The ADCMP564 QSOP 20-lead package option has a θ
(junction-to-ambient thermal resistance) of 80°C/W in
still air.
JA
JA
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
Rev. B | Page 5 of 16
Page 6
ADCMP563/ADCMP564
A
www.BDTIC.com/ADI
PIN CONFIGURATIONS AND FUNCTION DESCRIPTIONS
GND
QA
QA
GND
LEA
LEA
V
–INA
+INA
1
2
3
4
5
6
EE
7
8
ADCMP563
BRQ
TOP VIEW
(Not to Scale)
16
QB
15
QB
14
GND
13
LEB
LEB
12
11
V
CC
10
–INB
+INB
9
Figure 5. ADCMP563 16-Lead QSOP
in Configuration
P
04650-0-002
1
QA
2
QA
3
ADCMP564
GND
4
5
TOP VIEW
(Not to Scale)
6
7
8
9
10
BRQ
LEA
LEA
–INA
+INA
HYS
V
EE
Figure 6. ADCMP564 20-Lead QSOP
P
in Configuration
Table 3. Pin Function Descriptions
Pin No.
ADCMP563
16-Lead
QSOP
ADCMP563
16-Lead
LFCSP
ADCMP564
20-Lead
QSOP
Mnemonic
Function
1 GND Analog Ground.
1 15 2 QA
One of Two Complementary Outputs for Channel A. QA is logic high if the
analog voltage at the noninverting input is greater than the analog voltage
at the inverting input (provided the comparator is in compare mode). See
the description of the LEA pin for more information.
2 16 3
QA
One of Two Complementary Outputs for Channel A. QA is logic low if the
analog voltage at the noninverting input is greater than the analog voltage
at the inverting input (provided the comparator is in compare mode). See
the description of the LEA pin for more information.
3 1 4 GND Analog Ground.
4 2 5 LEA
One of Two Complementary Inputs for Channel A Latch Enable. In compare
mode (logic high), the output tracks change at the input of the comparator.
In latch mode (logic low), the output reflects the input state just prior to the
comparator being placed in the latch mode. LEA
conjunction with LEA. If left unconnected, the comparator defaults to
compare mode.
5 3 6
LEAOne of Two Complementary Inputs for Channel A Latch Enable. In compare
mode (logic low), the output tracks change at the input of the comparator.
In latch mode (logic high), the output reflects the input state just prior to the
comparator being placed in the latch mode. LEA must be driven in
conjunction with
compare mode.
6 4 7 V
EE
7 5 8 −INA
Negative Supply Terminal.
Inverting Analog Input of the Differential Input Stage for Channel A. The
Inverting A input must be driven in conjunction with the Noninverting A input.
8 6 9 +INA
Noninverting Analog Input of the Differential Input Stage for Channel A. The
Noninverting A input must be driven in conjunction with the Inverting A input.
10 HYSA
11 HYSB
9 7 12 +INB
Programmable Hysteresis Input.
Programmable Hysteresis Input.
Noninverting Analog Input of the Differential Input Stage for Channel B. The
Noninverting B input must be driven in conjunction with the Inverting B input.
10 8 13 −INB
Inverting Analog Input of the Differential Input Stage for Channel B. The
Inverting B input must be driven in conjunction with the Noninverting B input.
11 9 14 V
CC
Positive Supply Terminal.
GND
20
QB
19
QB
18
GND
17
LEB
16
LEB
15
V
14
CC
–INB
13
+INB
12
HYSB
11
04650-0-012
. If left unconnected, the comparator defaults to
LEA
QA QA QB QB
16 151413
GND
LEA
LEA
V
EE
PIN1
1
ADCMP563
2
3
4
BCP
TOP VIEW
(Not to Scale)
–INA +INA +INB –INB
12
11
10
9
8765
Figure 7. ADCMP563 16-Lead LFCSP
Pin Configuration
must be driven in
GND
LEB
LEB
V
CC
111151-0-026
Rev. B | Page 6 of 16
Page 7
ADCMP563/ADCMP564
www.BDTIC.com/ADI
Pin No.
ADCMP563
16-Lead
QSOP
12 10 15
13 11 16 LEB
14 12 17 GND Analog Ground.
15 13 18
16 14 19 QB
20 GND Analog Ground.
ADCMP563
16-Lead
LFCSP
ADCMP564
20-Lead
QSOP
Mnemonic
LEB
QB
Function
One of Two Complementary Inputs for Channel B Latch Enable. In compare
mode (logic low), the output tracks change at the input of the comparator.
In latch mode (logic high), the output reflects the input state just prior to the
comparator being placed in the latch mode. LEB must be driven in conjunction
with
One of Two Complementary Inputs for Channe
mode (logic high), the output tracks change at the input of the comparator.
In latch mode (logic low), the output reflects the input state just prior to the
comparator being placed in the latch mode. LEB
with LEB. If left unconnected, the comparator defaults to compare mode.
One of Two Complementary Outputs for Channel B. QB is logic low if the
analog voltage at the noninverting input is greater than the analog voltage
at the inverting input (provided the comparator is in compare mode). See
the description of the LEB pin for more information.
One of Two Complementary Outputs for Channel B. QB i
analog voltage at the noninverting input is greater than the analog voltage
at the inverting input (provided the comparator is in compare mode). See the
description of the LEB pin for more information.
. If left unconnected, the comparator defaults to compare mode.
LEB
l B Latch Enable. In compare
must be driven in conjunction
s logic high if the
Rev. B | Page 7 of 16
Page 8
ADCMP563/ADCMP564
www.BDTIC.com/ADI
TYPICAL PERFORMANCE CHARACTERISTICS
VCC = 3.3 V, TA = 25°C, unless otherwise noted.
3.0
2.5
2.0
1.5
1.0
0.5
0
INPUT BIAS CURRENT (μA)
–0.5
–1.0
–2.5–1.5–0.50.51.52.53.5
NONINVERTING INPUT VOLTAGE (INVERTING VOLTAGE = 0V)
Figure 8. Input Bias Current vs. Input Voltage
2.00
1.95
1.90
1.85
1.80
1.75
1.70
1.65
OFFSET VOLTAGE (mV)
1.60
1.55
1.50
–40–200 20406080
TEMPERATURE (°C)
Figure 9. Input Offset Voltage vs. Temperature
550
545
540
535
530
525
TIME (ps)
520
515
510
505
500
–40–30–20–100 102030405060708090
TEMPERATURE (°C)
Figure 10. Rise Time vs. Temperature
04650-0-013
04650-0-014
04650-0-015
2.80
2.78
2.76
2.74
2.72
2.70
2.68
(+IN = 3V, –IN = 0V)
2.66
2.64
+IN INPUT BIAS CURRENT (μA)
2.62
2.60
–40–200 20406080
TEMPERATURE (°C)
Figure 11. Input Bias Current vs. Temperature
–0.8
–1.0
–1.2
–1.4
–1.6
OUTPUT RISE AND FALL (V)
–1.8
–2.0
00.25 0.500.751.001.25 1.501.752.00
TIME (ns)
Figure 12. Rise and Fall of Outputs vs. Time
475
470
465
460
455
450
TIME (ps)
445
440
435
430
425
–40–30–20–100 102030405060708090
TEMPERATURE (°C)
Figure 13. Fall Time vs. Temperature
04650-0-016
04650-0-017
04650-0-018
Rev. B | Page 8 of 16
Page 9
ADCMP563/ADCMP564
www.BDTIC.com/ADI
720
705
715
710
705
700
695
690
PROPAGATION DELAY (ps)
685
680
–40–30–20–100 102030405060708090
TEMPERATURE (°C)
Figure 14. Propagation Delay vs. Temperature
140
120
100
80
60
40
04650-0-019
704
703
702
701
700
699
PROPAGATION DELAY (ps)
698
697
–2–10123
INPUT COMMON-MODE VOLTAGE (V)
Figure 17. Propagation Delay vs. Common-Mode Voltage
25
20
15
10
5
04650-0-022
PROPAGATION DELAY ERROR (ps)
20
0
01.61.41.21.00.80.60.40.2
OVERDRIVE VOLTAGE (V)
Figure 15. Propagation Delay Error vs. Overdrive Voltage
160
140
120
100
80
60
40
PROGRAMMED HYSTERESIS (mV)
20
0
50010203040
R
(kΩ)
HYS
Figure 16. Comparator Hysteresis vs. R
0
PROPAGATION DELAY ERROR (ps)
04650-0-020
–5
0.71.72.73.7 4.75.76.77.78.79.7
PULSE WIDTH (ns)
04650-0-023
Figure 18. Propagation Delay Error vs. Pulse Width
160
140
120
100
80
60
40
PROGRAMMED HYSTERESIS (mV)
20
04650-0-021
HYS
0
050100150
Figure 19. Comparator Hysteresis vs. I
I
HYS
(μA)
HYS
04650-0-024
Rev. B | Page 9 of 16
Page 10
ADCMP563/ADCMP564
www.BDTIC.com/ADI
TIMING INFORMATION
LATCH ENABLE
LATCH ENABLE
DIFFERENTIAL
INPUT VOLTAGE
50%
t
S
t
H
V
IN
V
OD
t
PL
V
± V
REF
OS
Q OUTPUT
Q OUTPUT
t
PDL
t
t
PDH
F
t
R
t
PLOH
t
PLOL
50%
50%
Figure 20. System Timing Diagram
Figure 20 shows the compare and latch features of the ADCMP563. Table 4 describes the terms in the diagram.
Table 4. Timing Descriptions
Symbol Timing Description
t
PDH
Input-to-Output High Delay
Propagation delay measured from the time the i
nput signal crosses the reference (± the
input offset voltage) to the 50% point of an output low-to-high transition.
t
PDL
Input-to-Output Low Delay
Propagation delay measured from the time the i
nput signal crosses the reference (± the
input offset voltage) to the 50% point of an output high-to-low transition.
t
PLOH
Latch Enable to Output High Delay
Propagation delay measured from the 50% point of the latch enable sig
transition to the 50% point of an output low-to-high transition.
t
PLOL
Latch Enable to Output Low Delay
Propagation delay measured from the 50% point of the latch enable sig
transition to the 50% point of an output high-to-low transition.
t
H
Minimum Hold Time
Minimum time after the negative transition of the latch enable
must remain unchanged to be acquired and held at the outputs.
t
PL
t
S
t
R
t
F
Minimum Latch Enable Pulse Width Minimum time the latch enable signal must be high to acquire an input signal change.
Minimum Setup Time
Output Rise Time
Output Fall Time
Minimum time before the negative transition of the latch enable signal that an input
hange must be present to be acquired and held at the outputs.
signal c
Amount of time required to transition from a low to a high output as measured at the
20% and 80% p
Amount of time required to transition from a hig
oints.
h to a low output as measured at the
20% and 80% points.
V
OD
Voltage Overdrive Difference between the differential input and reference input voltages.
04650-0-003
nal low-to-high
nal low-to-high
signal that the input signal
Rev. B | Page 10 of 16
Page 11
ADCMP563/ADCMP564
www.BDTIC.com/ADI
APPLICATION INFORMATION
The ADCMP563/ADCMP564 comparators are very high speed
devices. Consequently, high speed design techniques must be
employed to achieve the best performance. The most critical
aspect of any ADCMP563/ADCMP564 design is the use of a
low impedance ground plane. A ground plane, as part of a
multilayer board, is recommended for proper high speed
performance. Using a continuous conductive plane over the
surface of the circuit board can create this, allowing breaks in
the plane only for necessary signal paths. The ground plane
provides a low inductance ground, eliminating any potential
differences at different ground points throughout the circuit
board caused by ground bounce. A proper ground plane also
minimizes the effects of stray capacitance on the circuit board.
It is also important to provide bypass capacitors for the power
su
pply in a high speed application. A 1 μF electrolytic bypass
capacitor should be placed within 0.5 inches of each power
supply pin to ground. These capacitors reduce any potential
voltage ripples from the power supply. In addition, a 10 nF
ceramic capacitor should be placed as close as possible from the
power supply pins on the ADCMP563/ADCMP564 to ground.
These capacitors act as a charge reservoir for the device during
high frequency switching.
The LATCH ENABLE input is active low (latched). If the
atching function is not used, the LATCH ENABLE input can be
l
left open or grounded (ground is an ECL logic high). The
complementary input,
tied to −2.0 V. Leaving the latch inputs unconnected or
providing the proper voltages disables the latching function.
Occasionally, one of the two comparator stages within the
AD
CMP563/ADCMP564 is not used. The inputs of the unused
comparator should not be allowed to float. The high internal
gain can cause the output to oscillate (possibly affecting the
comparator that is being used), unless the output is forced into
a fixed state. This is easily accomplished by ensuring that the
two inputs are at least one diode drop apart, while also
appropriately connecting the LATCH ENABLE and
LATCH ENABLE
The best performance is achieved with the use of proper ECL
erminations. The open emitter outputs of the ADCMP563/
t
ADCMP564 are designed to be terminated through 50 Ω
resistors to −2.0 V, or any other equivalent ECL termination. If a
−2.0 V supply is not available, an 82 Ω resistor to ground and a
130 Ω resistor to −5.2 V provide a suitable equivalent. If high
speed ECL signals must be routed more than a centimeter,
microstrip or stripline techniques may be required to ensure
proper transition times and prevent output ringing.
LATCH ENABLE
inputs as described previously.
, can be left open or
CLOCK TIMING RECOVERY
Comparators are often used in digital systems to recover clock
timing signals. High speed square waves transmitted over a
distance, even tens of centimeters, can become distorted due to
stray capacitance and inductance. Poor layout or improper
termination can also cause reflections on the transmission line,
further distorting the signal waveform. A high speed
comparator can be used to recover the distorted waveform
while maintaining a minimum of delay.
OPTIMIZING HIGH SPEED PERFORMANCE
As with any high speed comparator amplifier, proper design
and layout techniques should be used to ensure optimal
performance from the ADCMP563/ADCMP564. The performance limits of high speed circuitry all too often are the result
of stray capacitance, improper ground impedance, or other
layout issues.
Minimizing resistance from source to the input is an important
co
nsideration in maximizing the high speed operation of the
ADCMP563/ADCMP564. Source resistance, in combination
with equivalent input capacitance, could cause a lagged
response at the input, thus delaying the output. The input
capacitance of the ADCMP563/ADCMP564, in combination
with stray capacitance from an input pin to ground, could result
in several picofarads of equivalent capacitance. A combination
of 3 kΩ source resistance and 5 pF input capacitance yields a
time constant of 15 ns, which is significantly slower than the
750 ps capability of the ADCMP563/ADCMP564. Source
impedances should be significantly less than 100 Ω for best
performance.
Sockets should be avoided due to stray capacitance and induc-
ance. If proper high speed techniques are used, the devices
t
should be free from oscillation when the comparator input
signal passes through the switching threshold.
COMPARATOR PROPAGATION DELAY DISPERSION
The ADCMP563/ADCMP564 have been specifically designed
to reduce propagation delay dispersion over an input overdrive
range of 100 mV to 1.5 V. Propagation delay overdrive
dispersion is the change in propagation delay that results from a
change in the degree of overdrive (how far the switching point
is exceeded by the input). The overall result is a higher degree of
timing accuracy because the ADCMP563/ADCMP564 are far
less sensitive to input variations than most comparator designs.
Rev. B | Page 11 of 16
Page 12
ADCMP563/ADCMP564
www.BDTIC.com/ADI
Propagation delay dispersion is important in critical timing
applications such as ATE, bench instruments, and nuclear
instrumentation. Overdrive dispersion is defined as the variation in propagation delay as the input overdrive conditions are
changed (
dr
from 100 mV to 1.5 V. This specification applies for both
positive and negative overdrive because the ADCMP563 and
the ADCMP564 have equal delays for positive and negative
going inputs.
COMPARATOR HYSTERESIS
The addition of hysteresis to a comparator is often useful in a
noisy environment, or where it is not desirable for the comparator to toggle between states when the input signal is at the
switching threshold. The transfer function for a comparator
with hysteresis is shown in
a
pproaches the threshold from the negative direction, the
comparator switches from 0 to 1 when the input crosses +V
The new switching threshold becomes −V
remains in a 1 state until the threshold −V
coming from the positive direction. In this manner, noise
centered on 0 V input does not cause the comparator to switch
states unless it exceeds the region bounded by ±V
The customary technique for introducing hysteresis into a
omparator uses positive feedback from the output back to the
c
input. A limitation of this approach is that the amount of
hysteresis varies with the output logic levels, resulting in
hysteresis that can be load dependent and is not symmetrical
about the threshold. The external feedback network can also
introduce significant parasitics, which reduce high speed
performance and can induce oscillation in some cases.
In the ADCMP564, hysteresis is generated through the
p
rogrammable hysteresis pin. A resistor from the HYS pin to
GND creates a current into the part that is used to generate
hysteresis. Hysteresis generated in this manner is independent
of output swing and is symmetrical around the trip point. The
hysteresis vs. resistance curve is shown in
Figure 21). For the ADCMP563/ADCMP564, over-
ive dispersion is typically 75 ps as the overdrive is changed
1.5V OVERDRIVE
INPUT VOLTAGE
20mV OVERDRIVE
± V
V
REF
OS
DISPERSION
Q OUTPUT
Figure 21. Propagation Delay Dispersion
03633-0-004
Figure 22. If the input voltage
/2. The comparator
H
/2 is crossed while
H
/2.
H
Figure 23.
/2.
H
A current may be sourced into the HYS pin. The pin is biased
pproximately 1 V below AGND and has a 3 kΩ series
a
resistance. The relationship between the current applied to the
HYS pin and the resulting hysteresis is shown in Figure 19.
–V
H
2
0
Figure 22. Comparator Hysteresis Transfer Function
160
140
120
100
80
60
40
PROGRAMMED HYSTERESIS (mV)
20
0
50010203040
Figure 23. Comparator Hysteresis vs. R
0V
OUTPUT
R
HYS
+V
H
2
INPUT
1
04650-0-005
04650-0-021
(kΩ)
HYS
MINIMUM INPUT SLEW RATE REQUIREMENT
As for all high speed comparators, a minimum slew rate must
be met to ensure that the device does not oscillate as the input
crosses the threshold. This oscillation is due in part to the high
input bandwidth of the comparator and the parasitics of the
package. ADI recommends a slew rate of 1 V/μs or faster to
ensure a clean output transition. If slew rates less than 1 V/μs
are used, hysteresis can be added to prevent the oscillation.
Rev. B | Page 12 of 16
Page 13
ADCMP563/ADCMP564
A
V
V
www.BDTIC.com/ADI
TYPICAL APPLICATION CIRCUITS
V
IN
V
REF
ADCMP563/
ADCMP564
LATCH
ENABLE
INPUTS
ALL RESISTORS 50Ω
–2.0V
Figure 24. High Speed Sampling Circuits
+V
REF
V
IN
–V
REF
LL RESISTORS 50Ω UNLESS OTHERWISE NOTED
ADCMP563/
ADCMP564
ADCMP563/
ADCMP564
LATCH
ENABLE
INPUTS
–2V
–2V
Figure 25. High Speed Window Comparator
OUTPUTS
OUTPUTS
OUTPUTS
046500-007
04650-0-008
V
IN
REF
ALL RESISTORS 50Ω, UNLESS OTHERWISE NOTED
ADCMP564
HYS
0Ω TO 80kΩ
OUTPUTS
–2.0V
Figure 26. Adding Hysteresis Using the HYS Control Pin
30Ω50Ω
IN
ADCMP563/
ADCMP564
–5.2V
30Ω
127Ω127Ω
50Ω
Figure 27. One Method to Interface an ECL Output to an
nt with a 50 Ω to Ground Input
Instrume
04650-0-009
04650-0-011
Rev. B | Page 13 of 16
Page 14
ADCMP563/ADCMP564
R
R
www.BDTIC.com/ADI
OUTLINE DIMENSIONS
0.193
BSC
0.341
BSC
0.065
0.049
0.010
0.004
COPLANARITY
0.004
Figure 28. 16-Lead Shrink Small Outline Package [QSOP]
0.012
0.008
9
8
0.154
BSC
0.069
0.053
SEATING
PLANE
(R
Q-16)
0.236
BSC
0.010
0.006
16
1
PIN 1
0.025
BSC
COMPLIANT TO JEDEC STANDARDS MO-137-AB
Dimensions shown in inches
3.00
BSC SQ
PIN 1
INDICATO
TOP
VIEW
12° MAX
0.90
0.85
0.80
SEATING
PLANE
0.30
0.23
0.18
Figure 30. 16-Lead Lead Frame Chip Scale Package [LFCSP_VQ]
8°
0°
0.050
0.016
0.010
0.004
COPLANARITY
0.60 MAX
0.45
2.75
BSC SQ
0.50
BSC
0.80 MAX
1.50 REF
0.65 TYP
0.05 MAX
0.02 NOM
0.20 REF
*
COMPLIANT
TO
JEDEC STANDARDS MO-220-VEED-2
EXCEPT FOR EXPOSED PAD DIMENSION.
mm × 3 mm Body, Very Thin Quad
3
(CP-16-3)
Dimensions shown in millimeters
2011
1
PIN 1
0.065
0.049
0.025
BSC
0.004
COMPLIANT TO JEDEC STANDARDS MO-137-AD
0.012
0.008
0.069
0.053
10
SEATING
PLANE
0.154
BSC
0.236
BSC
0.010
0.006
Figure 29. 20-Lead Shrink Small Outline Package [QSOP]
(R
Q-20)
Dimensions shown in inches
0.50
0.40
13
12
EXPOSED
PAD
(BOT TOM VIEW)
9
8
0.30
16
1
4
5
P
N
I
N
I
D
*
1.65
1.50 SQ
1.35
1
O
T
C
I
A
0.25 MIN
8°
0°
0.050
0.016
ORDERING GUIDE
Model Temperature Range Package Description Package Option
ADCMP563BRQ −40°C to +85°C 16-Lead QSOP RQ-16
ADCMP563BRQZ
ADCMP563BCP-R2 −40°C to +85°C 16-Lead LFCSP_VQ, 250 Unit Reel CP-16-3
ADCMP563BCP-RL7 −40°C to +85°C 16-Lead LFCSP_VQ, 1,500 Unit Reel CP-16-3
ADCMP563BCP-WP −40°C to +85°C 16-Lead LFCSP_VQ, 50 Unit Waffle Pack CP-16-3
EVAL-ADCMP563BRQ Evaluation Board
ADCMP564BRQ −40°C to +85°C 20-Lead QSOP RQ-20
ADCMP564BRQZ
EVAL-ADCMP564BRQ Evaluation Board