Datasheet ADCLK914 Datasheet (ANALOG DEVICES)

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Ultrafast, SiGe, Open-Collector
V
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FEATURES FEATURES

7.5 GHz operating frequency 7.5 GHz operating frequency 160 ps propagation delay 160 ps propagation delay 100 ps output rise/fall 100 ps output rise/fall 110 fs random jitter 110 fs random jitter On-chip input terminations On-chip input terminations Extended industrial temperature range: −40°C to +125°C Extended industrial temperature range: −40°C to +125°C
3.3 V power supply (V

APPLICATIONS APPLICATIONS

Clock and data signal restoration Clock and data signal restoration High speed converter clocking High speed converter clocking Broadband communications Broadband communications Cellular infrastructure Cellular infrastructure High speed line receivers High speed line receivers ATE and high performance instrumentation ATE and high performance instrumentation Level shifting Level shifting Threshold detection Threshold detection

GENERAL DESCRIPTION

The ADCLK914 is an ultrafast clock/data buffer fabricated on the Analog Devices, Inc., proprietary, complementary bipolar (XFCB-3) silicon-germanium (SiGe) process. The ADCLK914 features high voltage differential signaling (HVDS) outputs suitable for driving the latest Analog Devices high speed digital­to-analog converters (DACs). The ADCLK914 has a single, differential open-collector output.
The ADCLK914 buffer operates up to 7.5 GHz with a 160 ps propagation delay and adds only 110 fs random jitter (RJ).
− VEE) 3.3 V power supply (VCC − VEE)
CC
HVDS Clock/Data Buffer
ADCLK914

FUNCTIONAL BLOCK DIAGRAM FUNCTIONAL BLOCK DIAGRAM

V
V
CC
REF
V
V
T
T
50 50
D
D
D
D
The input has a center tapped, 100 Ω, on-chip termination resistor and accepts LVPECL, CML, CMOS, LVTTL, or LVDS (ac-coupled only). A V inputs.
The HVDS output stage is designed to directly drive 1.9 V each side into 50 Ω terminated to V swing of 3.8 V.
The ADCLK914 is available in a 16-lead LFCSP. It is specified for operation over the extended industrial temperature range of
−40°C to +125°C.
CC
ADCLK914
5050
Q
Q
Q
Q
V
V
EE
EE
Figure 1.
pin is available for biasing ac-coupled
REF
for a total differential output
CC
06561-001
Rev. A
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 www.analog.com Fax: 781.461.3113 ©2008 Analog Devices, Inc. All rights reserved.
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TABLE OF CONTENTS

Features .............................................................................................. 1
Applications ....................................................................................... 1
Functional Block Diagram .............................................................. 1
General Description ......................................................................... 1
Revision History ............................................................................... 2
Specifications ..................................................................................... 3
Electrical Characteristics ............................................................. 3
Absolute Maximum Ratings ............................................................ 5
Thermal Resistance ...................................................................... 5
ESD Caution .................................................................................. 5
Pin Configuration and Function Descriptions ............................. 6

REVISION HISTORY

10/08—Rev. 0 to Rev. A
Changes to Input Low Voltage Parameter, Table 1 ....................... 3
Changes to Output High Voltage Parameter, Table 1 ................ 3
Changes to Output Low Voltage Parameter, Table 1 .................. 3
Output Differential Range Parameter, Table 1 ............................ 3
Changes to Absolute Maximum Ratings Section ........................ 5
7/08—Revision 0: Initial Version
Typical Performance Characteristics ..............................................7
Applications Information .................................................................9
Power/Ground Layout and Bypassing ........................................9
HVDS Output Stage ......................................................................9
Interfacing to High Speed DACs .................................................9
Optimizing High Speed Performance ........................................9
Random Jitter .................................................................................9
Typical Application Circuits ..................................................... 10
Outline Dimensions ....................................................................... 11
Ordering Guide .......................................................................... 11
Rev. A | Page 2 of 12
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SPECIFICATIONS

ELECTRICAL CHARACTERISTICS

VCC = 3.3 V, VEE = 0 V, TA = −40°C to +125°C. All outputs terminated through 50 Ω to VCC, unless otherwise noted.
Table 1.
Parameter Symbol Min Typ Max Unit Test Conditions/Comments
DC INPUT CHARACTERISTICS
Input High Voltage VIH V Input Low Voltage VIL V Input Differential Range VID 0.2 3.4 V p-p
0.2 2.8 V p-p
Input Capacitance CIN 0.4 pF Input Resistance 50 Ω
Differential Mode 100 Common Mode 50 kΩ Open termination
Input Bias Current 20 µA
DC OUTPUT CHARACTERISTICS
Output High Voltage VOH V Output Low Voltage VOL V Output Differential Range VOD 1.54 1.95 2.22 V Reference Voltage V
REF
Output Voltage (VCC + 1)/2 V −500 A to +500 A Output Resistance 250
AC PERFORMANCE
Operating Frequency 7.5 GHz
Propagation Delay tPD 127 158 202 ps
Propagation Delay Temperature
140 fs/°C
Coefficient
Propagation Delay Skew (Device
65 ps V
to Device) Output Rise Time tR 100 125 ps 20%/80% Output Fall Time tF 80 95 ps 80%/20% Wideband Random Jitter
1
RJ 110 fs rms VID = 1.6 V p-p, 6 V/ns, V
Additive Phase Noise
622.08 MHz −132 dBc/Hz @10 Hz offset
−143 dBc/Hz @100 Hz offset
−151 dBc/Hz @1 kHz offset
−156 dBc/Hz @10 kHz offset
−157 dBc/Hz @100 kHz offset
−156 dBc/Hz >1 MHz offset
245.76 MHz −133 dBc/Hz @10 Hz offset
−143 dBc/Hz @100 Hz offset
−153 dBc/Hz @1 kHz offset
−158 dBc/Hz @10 kHz offset
−159 dBc/Hz @100 kHz offset
−158 dBc/Hz >1 MHz offset
+ 1.65 VCC V
EE
V
EE
− 0.2 V
CC
= −40°C to +85°C
T
A
(±1.7 V between input pins)
= 85°C to 125°C
T
A
(±1.4 V between input pins)
− 0.55 VCC − 0.40 VCC − 0.25 V
CC
− 2.75 VCC − 2.35 VCC − 1.9 V
CC
>1.1 V differential output swing,
= 3.3 V ± 10%
V
CC
= 3.3 V ± 10%,V
V
CC
V
= 1.6 V p-p
ID
= 1.6 V p-p
ID
ICM
= V
ICM
,
REF
= 1.85 V
Rev. A | Page 3 of 12
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Parameter Symbol Min Typ Max Unit Test Conditions/Comments
122.88 MHz −150 dBc/Hz @10 Hz offset
−156 dBc/Hz @100 Hz offset
−160 dBc/Hz @1 kHz offset
−161 dBc/Hz @10 kHz offset
−161 dBc/Hz @100 kHz offset
−160 dBc/Hz >1 MHz offset POWER SUPPLY
Supply Voltage Requirement VCC 2.97 3.63 V Power Supply Current
Negative Supply Current I Positive Supply Current I
Power Supply Rejection
2
Output Swing Supply Rejection3 −15 dB VCC = 3.3 V ± 10%
1
Calculated from SNR of ADC method. See Figure 8 for rms jitter vs. input slew rate.
2
Change in tPD per change in VCC.
3
Change in output swing per change in VCC.
66 111 150 mA Includes output current
VEE
34 55 73 mA
VCC
PSR
13 ps/V VCC = 3.3 V ± 10%
VCC
Rev. A | Page 4 of 12
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ABSOLUTE MAXIMUM RATINGS

Table 2.
Parameter Rating
Supply Voltage (VCC to GND) 6.0 V Input Voltage −0.5 V to VCC + 0.5 V Maximum Output Voltage VCC + 0.5 V Minimum Output Voltage VEE − 0.5 V Input Termination ±2 V Voltage Reference VCC − VEE Operating Temperature Range, Ambient −40°C to +125°C Operating Temperature, Junction 150°C Storage Temperature Range −65°C to +150°C
Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.

THERMAL PERFORMANCE

The ADCLK914 is specified for a case temperature (T ensure that T
is not exceeded, use an airflow source.
CASE
To determine the junction temperature on the application PCB
T
= T
+ (ΨJT × PD)
J
CASE
where:
T
is the junction temperature (°C).
J
T
is the case temperature (°C) measured by the customer at
CASE
top center of package.
is determined by the values listed in Table 3 .
Ψ
JT
PD is the power dissipation.
CASE
). To
Val u es o f θ design considerations. θ approximation of T
where T
Values of θ
are provided for package comparison and PCB
JA
can be used for a first-order
JA
by the equation
J
T
= TA + (θJA × PD)
J
is the ambient temperature (°C).
A
are provided for package comparison and PCB
JB
design considerations.
Table 3. Thermal Parameters for ADCLK914 16-Lead LFCSP
Symbol Description1 Value Units
θJA
θ
JMA
θ
JMA
θJB
θJC
ΨJT
1
Descriptions based on using a 2s2p test board.
Junction-to-ambient thermal resistance, 0.0 meters per sec air flow per JEDEC JESD51-2 (still air)
Junction-to-ambient thermal resistance, 1.0 meter per sec air flow per JEDEC JESD51-6 (moving air)
Junction-to-ambient thermal resistance, 2.5 m/s air flow per JEDEC JESD51-6 (moving air)
Junction-to-board thermal resistance, 1.0 meter per sec air flow per JEDEC JESD51-8 (moving air)
Junction-to-case thermal resistance (die-to-heatsink) per MIL-Std 883, Method 1012.1
Junction-to-top-of-package characterization parameter, 0 meters per sec air flow per JEDEC JESD51-2 (still air)
78.4 °C/W
68.5 °C/W
61.4 °C/W
48.8 °C/W
1.5 °C/W
2.0 °C/W

ESD CAUTION

Rev. A | Page 5 of 12
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PIN CONFIGURATION AND FUNCTION DESCRIPTIONS

REF
T
EE
CC
V
V
V
V
14
13
15
16
PIN 1
1D
2D
ADCLK914
3NC
(Not to Scale)
4NC
INDICAT OR
TOP VIEW
Q
12
Q
11
NC
10
NC
9
NC = NO CONNECT
8
7
5
6
EE
CC
NC
NC
V
V
Figure 2. Pin Configuration
Table 4. Pin Function Descriptions
Pin No. Mnemonic Description
1 D Noninverting Input. 2
D
Inverting Input.
3, 4, 5, 6, 9, 10 NC No Connect. No physical connection to the die. 7, 14 VEE Negative Supply Voltage. 8, 13 VCC Positive Supply Voltage. 11
Q
Inverting Output.
12 Q Noninverting Output. 15 V
Reference Voltage. Reference voltage for biasing ac-coupled inputs.
REF
16 VT Center Tap. Center tap of 100 Ω input resistor. Heat Sink/
Exposed Pad
NC
No Connect. The metallic back surface of the package is not electrically connected to any part of the circuit. It can be left floating for optimal electrical isolation between the package handle and the substrate of the die. It can also be soldered to ground on the application board if improved thermal and/or mechanical stability is needed. Exposed metal at the corners of the package is connected to this back surface. Allow sufficient clearance for vias and other components.
06561-002
Rev. A | Page 6 of 12
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TYPICAL PERFORMANCE CHARACTERISTICS

VCC = 3.3 V, VEE = 0 V, TA = 25°C. All outputs terminated through 50  to VCC, unless otherwise noted.
Q
250mV/DI
Q
62.5ps/DI V
Figure 3. Output Waveform at 1 GHz, VCC = 3.3 V
120
–130
–140
–150
PHASE NOISE (dBc/Hz)
–160
Q
250mV/DI
Q
06561-003
100ps/DIV
06561-006
Figure 6. Output Waveform at 1 GHz, VCC = 3.3 V
120
–130
–140
–150
PHASE NOISE (dBc/Hz)
–160
–170
10 100 1k 10k 100k 1M 10M 100M
FREQUENCY (Hz)
Figure 4. Phase Noise at 122.88 MHz
120
–130
–140
–150
PHASE NOISE (dBc/Hz)
–160
–170
10 100 1k 10k 100k 1M 10M 100M
FREQUENCY (Hz)
Figure 5. Phase Noise at 245.76 MHz
–170
10 100 1k 10k 100k 1M 10M 100M
06561-004
FREQUENCY (Hz)
06561-007
Figure 7. Phase Noise at 622.08 MHz
350
300
250
200
150
RMS JITT ER (fs)
100
50
0
06561-005
012345678
INPUT SLEW RATE (V/ns)
TA = 25°C
06561-008
Figure 8. RMS Jitter vs. Input Slew Rate
Rev. A | Page 7 of 12
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3.80
162
3.75
3.70
3.65
3.60
3.55
DIFFERENTIAL OUTP UT SWING (V)
3.50
2.97 3.13 3.30 3. 46 3.63
POWER SUPPLY VOLTAGE (V)
Figure 9. Differential Output Swing vs. Power Supply Voltage
115
114
113
112
111
110
109
108
107
POWER SUPPL Y CURRENT (mA)
106
105
2.97 3.13 3.30 3.46 3.63
POWER SUPPLY VOLTAGE (V)
Figure 10. Power Supply Current vs. Power Supply Voltage
200
180
160
140
120
100
80
60
PROPAGATI ON DELAY (ps)
40
20
0
0.5 1.0 1.5 2.0 2.5
Figure 11. Propagation Delay vs. V
INPUT COMMON MODE (V)
; VID = 1.6 V p-p
ICM
160
158
156
154
152
150
PROPAGATI ON DELAY (p s)
148
146
0.4 0.8 1.2 1.6 2.0
06561-009
Figure 12. Propagation Delay vs. VID; V
INPUT DIFFERENTIAL (V p-p)
= 2.15 V
ICM
06561-012
4.0
3.5
3.0
2.5
2.0
1.5
1.0
DIFFERENTIAL OUTPUT SWING (V)
0.5
0
0.5 1.5 2.5 3.5 4.5 5. 5 6.5 7.5 8.5 9.5 10.5 11.5 12. 5
06561-010
FREQUENCY (G Hz)
06561-013
Figure 13. Toggle Rate, Differential Output Swing vs. Frequency
06561-011
Rev. A | Page 8 of 12
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APPLICATIONS INFORMATION

POWER/GROUND LAYOUT AND BYPASSING

The ADCLK914 buffer is designed for very high speed applica­tions. Consequently, high speed design techniques must be used to achieve the specified performance. It is critically important to use low impedance supply planes for both the negative supply (V
) and the positive supply (VCC) planes as part of a multilayer
EE
board. Providing the lowest inductance return path for switching currents ensures the best possible performance in the target application.
It is also important to adequately bypass the input and output supplies. Place a 1 µF electrolytic bypass capacitor within several inches of each power supply pin to ground. In addition, place multiple high quality 0.001 µF bypass capacitors as close as possible to each V
and VCC supply pin and connect these cap-
EE
acitors to the GND plane with redundant vias. Carefully select high frequency bypass capacitors for minimum inductance and ESR. To maximize the effectiveness of the bypass capacitors at high frequencies, strictly avoid parasitic layout inductance.
Slew currents may also appear at the V
and VSS pins of the
DD
device being driven by the ADCLK914.

HVDS OUTPUT STAGE

The ADCLK914 has been developed to provide a bipolar interface to any CMOS device that requires extremely low jitter, high amplitude clocks. It is intended to be placed as close as possible to the receiving device and allows the rest of the clock distribu­tion to run at standard CML or PECL levels.
Interconnects must be short and very carefully designed because the single terminated design provides much less margin for error than lower voltage, double terminated transmission techniques.
Q
Q
40mA
Figure 14. Simplified Schematic Diagram
of the ADCLK914 HVDS Output Stage
7mA
7mA
V
V
EE
V
EE
EE
06561-015

INTERFACING TO HIGH SPEED DACs

The ADCLK914 is designed to drive high amplitude, low jitter clock signals into high speed, multi-GSPS DACs. The ADCLK914 should be placed as close as possible to the clock input of the DAC so that the high slew rate and high amplitude clock signal that these devices require do not cause routing difficulties, generate EMI, or become degraded by dielectric and other
losses. The ADCLK914, in turn, may be driven directly by standard or low swing PECL, CML, CMOS, or LVTTL sources, or by LVDS with simple ac coupling, as illustrated in Figure 15 through Figure 19.

OPTIMIZING HIGH SPEED PERFORMANCE

As with any high speed circuit, proper design and layout tech­niques are essential to obtaining the specified performance. Stray capacitance, inductance, inductive power, and ground impedances, as well as other layout issues, can severely limit performance and can cause oscillation. Discontinuities along input and output transmission lines can also severely limit the specified jitter performance by reducing the effective input slew rate.
Input and output matching have a significant impact on performance. The ADCLK914 buffer provides internal 50 Ω termination resistors for both D and
D
inputs. The return side can be connected to the reference pin provided or to a current sink at V direct coupled CML. The V
− 2 V for use with differential PECL, or to VCC for
CC
pin should be left floating any
REF
time that it is not used to minimize power consumption.
Note that the ADCLK914 V damage from momentary shorts to V charging currents; for this reason, the V
source is current-limited to resist
REF
or VCC and from capacitor
EE
source cannot be
REF
used as a PECL termination supply.
Carefully bypass the termination potential using ceramic capa­citors to prevent undesired aberrations on the input signal due to parasitic inductance in the termination return path. If the inputs are directly coupled to a source, care must be taken to ensure that the pins remain within the rated input differential and common-mode ranges.
If the return is floated, the device exhibits 100 Ω cross-term­ination, but the source must then control the common-mode voltage and supply the input bias currents.
ESD/clamp diodes between the input pins prevent the appli­cation of excessive offsets to the input transistors. ESD diodes are not optimized for best ac performance. If a clamp is needed, it is recommended that appropriate external diodes be used.

RANDOM JITTER

The ADCLK914 buffer has been specifically designed to minimize random jitter over a wide input range. Provided that sufficient voltage swing is present, random jitter is affected most by the slew rate of the input signal. Whenever possible, clamp excessively large input signals with fast Schottky diodes because attenuators reduce the slew rate. Input signal runs of more than a few centimeters should be over low loss dielectrics or cables with good high frequency characteristics.
Rev. A | Page 9 of 12
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TYPICAL APPLICATION CIRCUITS

V
CC
V
REF
V
T
– 2V
D
D
CC
V
REF
V
T
D
D
CONNECT VT TO VCC.
06561-017
Figure 15. Interfacing to CML Inputs
V
REF
V
T
D
D
TO V
CONNECT V
NOTES
1. PLACI NG A BYPA SS CAPACI TOR FROM V THE NOISE PERFORMANCE.
TO GROUND CAN IMPROVE
T
.
T
REF
Figure 16. AC Coupling Differential Signals
CC
Q
Q
CONNECT VT TO VCC – 2V.
06561-018
Figure 18. Interfacing to ECL Inputs
V
REF
V
T
D
D
CONNECT VT, V CAPACITOR FRO M V ALTERNATIVELY, V
06561-019
CONNECTED, G IVING A CLEANER LAYOUT AND A 180º PHASE SHIFT.
, AND D. PLACE A BYPAS S
REF
TO GROUND.
T
, V
, AND D CAN BE
T
REF
06561-020
Figure 19. Interfacing to AC-Coupled, Single-Ended Inputs
40mA
7mA
7mA
V
V
EE
V
EE
EE
06561-021
Figure 17. Interfacing to High Speed DAC
Rev. A | Page 10 of 12
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OUTLINE DIMENSIONS

0.50
EXPOSED
PAD
0.40
0.30
16
1
4
5
P
N
I
N
I
D
*
1.65
1.50 SQ
1.35
0.25 MIN
1
A
R
O
T
C
I
071708-A
0.45
0.50
BSC
1.50 REF
0.60 MAX
BOTTOM VIE W
13
12
9
8
FOR PROPER CONNECTION OF THE EXPOSED PAD, REFER TO THE PIN CONF IGURATIO N AND FUNCTION DES CRIPTIONS SECTION O F THIS DAT A SHEET.
PIN 1
INDICATOR
0.90
0.85
0.80
SEATING
PLANE
12° MAX
3.00
BSC SQ
2.75
BSC SQ
0.80 MAX
0.65 TYP
0.05 MAX
0.02 NOM
0.20 REF
*
COMPLIANT
EXCEPT FO R EXPOSED PAD DI MENSION.
TO
JEDEC STANDARDS MO-220-VEED-2
0.30
0.23
0.18
TOP
VIEW
Figure 20. 16-Lead Lead Frame Chip Scale Package [LFCSP_VQ]
3 mm × 3 mm Body, Very Thin Quad
(CP-16-3)
Dimensions shown in millimeters

ORDERING GUIDE

Model Temperature Range Package Description Package Option
ADCLK914BCPZ-WP ADCLK914BCPZ-R71 −40°C to +125°C 16-Lead Lead Frame Chip Scale Package [LFCSP_VQ] CP-16-3 ADCLK914BCPZ-R21 −40°C to +125°C 16-Lead Lead Frame Chip Scale Package [LFCSP_VQ] CP-16-3 ADCLK914/PCBZ1 Evaluation Board
1
Z = RoHS Compliant Part.
1
−40°C to +125°C 16-Lead Lead Frame Chip Scale Package [LFCSP_VQ] CP-16-3
Rev. A | Page 11 of 12
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NOTES
©2008 Analog Devices, Inc. All rights reserved. Trademarks and registered trademarks are the property of their respective owners. D06561-0-10/08(A)
Rev. A | Page 12 of 12
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