ADC12191
12-Bit, 10 MHz Self-Calibrating, Pipelined A/D Converter
with Internal Sample & Hold
ADC12191 12-Bit, 10 MHz Self-Calibrating, Pipelined A/D Converter with Internal Sample & Hold
General Description
The ADC12191 is a monolithic CMOS analog-to-digital converter capable of converting analog input signals into 12-bit
digital words at 10 megasamples per second (MSPS). The
ADC12191 utilizes an innovative pipeline architecture to
minimize die size and power consumption. The ADC12191
uses self-calibration and error correction to maintain accuracy and performance over temperature.
The ADC12191 converter operates on a 5V power supply
and can digitize analog input signals in the range of 0 to 2V.
A single convert clock controls the conversion operation. All
digital I/O is TTL compatible.
The ADC12191 is designed to minimize external components necessary for the analog input interface. An internal
sample-and-hold circuit samples the analog input and an internal amplifier buffers the reference voltage input.
The ADC12191 is available in the 32-lead TQFP package
and is designed to operate over the extended commercial
temperature range of -40˚C to +85˚C.
Features
n Single 5V power supply
n Simple analog input interface
n Internal Sample-and-hold
n Internal Reference buffer amplifier
n Low power consumption
Key Specifications
n Resolution12 Bits
n Conversion Rate10 Msps (min)
n DNL
n SNR63 dB (typ)
n ENOB10 Bits (typ)
n Analog Input Range2 Vpp (min)
n Supply Voltage+5V
n Power Consumption, 10 MHz235 mW (typ)
±
0.5 LSB (typ)
±
Applications
n Image processing front end
n PC-based data acquisition
n Scanners
n Fax machines
n Waveform digitizer
Analog signal input. With a 2.0V reference voltage,
2V
1V
32V
31V
IN
REF
RP
RM
input signal voltages in the range of 0 to 2.0 Volts
will be converted. See section 1.2.
Reference voltage input. This pin should be driven
from an accurate, stable reference source in the
range of 1.8 to 2.2V and bypassed to a low-noise
analog ground with a monolithic ceramic capacitor,
nominally 0.01µF. See section 1.1.
Positive reference bypass pin. Bypass with a 0.1µF
capacitor. Do not connect anything else to this pin.
See section 3.1
Reference midpoint bypass pin. Bypass with a
0.1µF capacitor. Do not connect anything else to
this pin. See section 3.1
ADC12191
30V
RN
10CLOCK
8CAL
7PD
11OE
28OR
29READY
Negative reverence bypass pin. Bypass with a
0.1µF capacitor. Do not connect anything else to
this pin. See section 3.1
Sample Clock input, TTL compatible. Maximum
amplitude should not exceed 3V.
Calibration request, active High. Calibration cycle
starts when CAL returns to logic low. CAL is ignored
during power-down mode. See section 2.2.
Power-down, active High, ignored during calibration
cycle. See paragraph 2.4
Output enable control, active low. When this pin is
high the data outputs are in Tri-state
(high-impedance) mode.
Over range indicator. This pin is at a logic High for
V
IN
<
0 or for V
>
V
REF
.
IN
Device ready indicator, active High. This pin is at a
logic Low during a calibration cycle and while the
device is in the power down mode.
14-19,
22-27
D0 - D11
Digital output word, CMOS compatible. D0 (pin 14)
is LSB, D11 (pin 27) is MSB. Load with no more
than 50pF.
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Page 4
Pin Descriptions and Equivalent Circuits #2 (Continued)
ADC12191
No.SymbolEquivalent CircuitDescription
3V
5V
4, 6AGND
13V
9, 12DGND
21V
20DGND I/O
IN com
A
D
I/O
D
Analog input common. Connect to a quiet point in
analog ground near the driving device. See section
1.2.
Positive analog supply pin. Connect to a clean,
quiet voltage source of +5V. V
and VDshould have
A
a common supply and be separately bypassed with
a 5µF to 10µF capacitor and a 0.1µF chip capacitor.
The ground return for the analog supply. AGND and
DGND should be connected together close to the
ADC12191 package. See section 5.0.
Positive analog supply pin. Connect to a clean,
quiet voltage source of +5V. V
and VDshould have
A
a common supply and be separately bypassed with
a 5µF to 10µF capacitor and a 0.1 µF chip
capacitor.
The ground return for the analog supply. AGND and
DGND should be connected together close to the
ADC12191 package. See section 5.0
The digital output driver supply pin. This pin can be
operated from a supply voltage of 3V to 5V, but the
voltage on this pin should never exceed the V
D
supply pin voltage.
The ground return for the output drivers. This pin
should be returned to a point in the digital ground
that is removed from the other ground pins of the
ADC12191.
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Page 5
ADC12191
Absolute Maximum Ratings (Notes 1, 2)
If Military/Aerospace specified devices are required,
Storage Temp.−65˚C to +150˚C
Maximum Junction Temp.150˚C
please contact the National SemiconductorSalesOffice/
Distributors for availability and specifications.
Supply Voltage6.5V
Voltage on Any Output−0.3V to V
Input Current at Any Pin (Note 3)
Package Input Current (Note 3)
The following specifications apply for AGND = DGND = DGND I/O = 0V, VA=VD=VDI/O = +5V, PD = +5V, V
f
= 10 MHz, CL= 50 pF/pin. After Auto-Cal at Temperature. Boldface limits apply for TA=T
CLK
T
= 25˚C (Note 7) (Note 8) and (Note 10)
A=TJ
SymbolParameterConditions
f
CLK
Clock Frequency
Typical
(Note
10)
to T
MIN
MAX
Limits
(Note
11)
1MHz(min)
10MHz(max)
Clock Duty Cycle50%
t
CONV
t
OD
t
DIS
t
EN
t
WCAL
t
RDYC
t
CAL
t
WPD
t
RDYPD
t
PD
Note 1: AbsoluteMaximumRatings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is functional, but do not guarantee specific performance limits. For guaranteed specifications and test conditions, see the Electrical Characteristics. The guaranteed specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test conditions.
Note 2: All voltages are measured with respect to GND = AGND = DGND = 0V, unless otherwise specified.
Conversion Latency10
Data output delay after rising clk
edge
40ns
Data outputs into Tristate mode21nA (max)
Data outputs active after Tristate21ns (max)
Calibration request pulse width3Tclk(min)
Ready Low after CAL request3Tclk
Calibration cycle4000Tclk
Power-down pulse width3Tclk(min)
Ready Low after PD request3Tclk
Power down mode exit cycle4000Tclk
= +2.0V,
REF
; all other limits
Units
(Limits)
Clock
Cycles
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Page 7
AC Electrical Characteristics (Continued)
Note 3: When the input voltage at any pin exceeds the power supplies (that is, V
to 25 mA. The 50 mA maximum package input current rating limits the number of pins that can safely exceed the power supplies with an input current of 25 mA to
<
IN
AGND, or V
two.
Note 4: The absolute maximum junction temperatures (T
junction-to-ambient thermal resistance (θ
TQFP, θ
this device under normal operation will typically be about 255 mW (typical power consumption + 20 mW TTL output loading). The values for maximum power con-
is 74˚C/W, so PDMAX = 1,689 mW at 25˚C and 1,013 mW at the maximum operating ambient temperature of 75˚C. Note that the power consumption of
JA
), and the ambient temperature, (TA), and can be calculated using the formula PDMAX=(TJmax - TA)/θJA. In the 32-pin
JA
max) for this device is 150˚C. The maximum allowable power consumption is dictated by TJmax, the
J
sumption listed above will be reached only when the ADC12191 is operated in a severe fault condition (e.g. when input or output pins are driven beyond the power
supply voltages, or the power supply polarity is reversed). Obviously, such conditions should always be avoided.
Note 5: Human body model is 100 pF capacitor discharged through a 1.5kΩ resistor. Machine model is 220 pf discharged through ZERO Ohms.
Note 6: See AN450, “Surface Mounting Methods and Their Effect on Product Reliability”, or the section entitled “Surface Mount” found in any post 1986 National
Semiconductor Linear Data Book, for other methods of soldering surface mount devices.
Note 7: The inputs are protected as shown below. Input voltage magnitudes up to 5V above V
is limited per Note 3. However, errors in the A/D conversion can occur if the input goes above V
the full-scale input voltage must be ≤4.85V to ensure accurate conversions.
>
VA,VDor VDI/O), the current at that pin should be limited
IN
or to 5V below GND will not damage this device, provided current
A
or below GND by more than 100 mV.Asan example, if VAis 4.75V,
A
ADC12191
DS101040-8
Note 8: To guarantee accuracy, it is required that |V
Note 9: With the test condition for V
Note 10: Typical figures are at T
= +2.0V, the 12-bit LSB is 488µV.
REF
= 25˚C, and represent most likely parametric norms.
A=TJ
|≤100mV and separate bypassed capacitors are used at each power supply pin.
A-VD
Note 11: Tested limits are guaranteed to National’s AOQL (Average Outgoing Quality Level).
Note 12: Integral Non Linearity is defined as the deviation of the analog value, expressed in LSBs, from the straight line that passes through positive full-scall and
zero.
Note 13: Timingspecifications are tested at the TTL logic levels, V
to 1.4V.
= 0.4V for a falling edge and VIH= 2.4V for a rising edge. TRI-STATEoutput voltage is forced
IL
Note 14: Optimum SNR performance will be obtained by keeping the reference input in the 1.8V to 2.2V range. The LM4041CIM3-ADJ (SOT-23 package) or the
LM4041CIZ-ADJ (TO-92 package) bandgap voltage reference is recommended for this application.
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Page 8
Transfer Characteristics
ADC12191
DS101040-9
FIGURE 1. Transfer Characteristic
FIGURE 2. Errors Minimized by the Auto-Cal Cycle
Typical Performance Characteristics
INL vs Temperature
DS101040-11
DS101040-10
DNL vs Temperature
DS101040-12
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Page 9
Typical Performance Characteristics (Continued)
ADC12191
SNR vs Temperature
THD vs Temperature
DS101040-13
SINAD vs Temperature
DS101040-14
DS101040-15
Specification Definitions
DIFFERENTIAL NON-LINEARITY (DNL) is the measure of
the maximum deviation from the ideal step size of 1 LSB.
EFFECTIVE NUMBER OF BITS (ENOB, or EFFECTIVE
BITS) is another method of specifying Signal-to-Noise and
Distortion Ratio, or SINAD. ENOB is defined as (SINAD -
1.76) / 6.02.
DS101040-16
DS101040-17
FULL POWER BANDWIDTH is a measure of the frequency
at which the reconstructed output fundamental drops 3 dB
below its low frequency value for a full scale input. The test
is performed with f
of f
. The input frequency at which the output is −3 dB
CLK
equal to 100 KHz plus integer multiples
IN
relative to the low frequency input signal is the full power
bandwidth.
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Page 10
Specification Definitions (Continued)
FULL SCALE ERROR is the difference between the input
voltage just causing a transition to positive full scale and
ADC12191
V
-1.5 LSB.
REF
INTEGRAL NON-LINEARITY (INL) is a measure of the deviation of each individual code from a line drawn from negative full scale (
positive full scale (1
1
⁄2LSB below the first code transition) through
1
⁄2LSB above the last code transition).
The deviation of any given code from this straight line is
measured from the center of that code value.
INTERMODULATION DISTORTION (IMD) is the creation of
additional spectral components as a result of two sinusoidal
frequencies being applied to the ADC input at the same time.
It is defined as the ratio of the power in the intermodulation
products to the total power in the original frequencies. IMD is
usually expressed in dB.
PIPELINE DELAY (LATENCY) is the number of clock cycles
between initiation of conversion and the availability of that
conversion result at the output. New data is available at every clock cycle, but the data lags the conversion by the pipeline delay.
Timing Diagrams
SIGNAL TO NOISE PLUS DISTORTION (S/(N+D) or SINAD) is the ratio expressed in dB, of the rms value of the in-
put signal to the rms value of all of the other spectral components below half the clock frequency, including harmonics
but excluding dc.
SIGNAL TO NOISE RATIO (SNR) is the ratio of the rms
value of the input signal to the rms value of the other spectral
components below one-half the sampling frequency, not including harmonics or dc.
SPURIOUS FREE DYNAMIC RANGE (SFDR) is the difference, expressed in dB, between the rms values of the input
signal and the peak spurious signal, where a spurious signal
is any signal present in the output spectrum that is not
present at the input.
TOTAL HARMONIC DISTORTION (THD) is the ratio of the
rms total of the first six harmonic components, to the rms
value of the input signal.
ZERO ERROR is the difference between the ideal input volt-
1
age (
⁄2LSB) and the actual input voltage that causes an out-
put code transition from zero to one.
FIGURE 3. Data Output Timing
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DS101040-21
Page 11
Timing Diagrams (Continued)
ADC12191
FIGURE 4. Reset and Calibration Timing
Functional Description
The ADC12191 is a monolithic CMOS analog-to-digital converter capable of converting analog input signals into 12-bit
digital words at 10 megasamples per second (MSPS). This
device utilizes a proprietary pipeline architecture and algorithm to minimize die size and power consumption. The
ADC12191 uses self-calibration and digital error correction
to maintain accuracy and performance over temperature.
The ADC12191 has an input sample-and-hold amplifier and
internal reference buffer.The analog input and the reference
voltage are converted to differential signals for internal use.
Using differential signals in the analog conversion core reduces crosstalk and noise pickup from the digital section and
power supply.
The pipeline conversion core has 15 sequential signal processing stages. Each stage receives an analog signal from
the previous stage (called “residue”) and produces a 1-bit
digital output that is sent to the digital correction module. At
each stage the analog signal received from the previous
stage is compared to an internally generated reference level.
It is then amplified by a factor of 2, and, depending on the
output of the comparator, the internal reference signal may
be subtracted from the amplifier output. This produces the
residue that is passed to the next stage.
The calibration module is activated at power-on or by user
request. During calibration the conversion core is put into a
special mode of operation in order to determine inherent errors in the analog conversion blocks and to determine correction coefficients for each digital output bit from the conversion core and stores these coefficients in RAM. The
digital correction module uses the coefficients in RAM to
convert the raw data bits from the conversion core into the
12-bit digital output code.
DS101040-22
Applications Information
1.0 Analog Inputs.
The ADC12191 has two single-ended analog inputs. V
the reference input and V
1.1 Reference Input The V
is the signal input.
IN
input must be driven from an
REF
accurate, stable reference voltage source. of 1.8V to 2.2V,
and bypassed to a clean, quiet point in analog ground.
1.2 Analog Signal Input The V
input must be driven with
IN
a low impedance signal source that does not add any distortion to the input signal. The ground reference for the V
put is the V
INCOM
pin. The V
pin must be connected to
INCOM
a clean, quiet point in analog ground.
2.0 Digital Inputs
The ADC12191 has four digital inputs. They are CLOCK,
CAL, OE and PD.
2.1 CLOCK The CLOCK signal drives an internal phase delay loop to create timing for the ADC. The clock input should
be driven with a stable, low phase jitter TTL level clock signal
in the range of 1 to 10 MHz. The trace carrying the clock signal should be as short as possible. This trace should not
cross any other signal line, analog or digital, not even at 90˚.
A 100 Ohm resistor should be placed in series with the
CLOCK pin, as close to the pin as possible.
2.2 CAL The level sensitive CAL input must be pulsed high
for at least three clock cycles to begin ADC calibration. For
best performance, calibration should be performed about ten
sceonds after power up, after resetting the ADC, and after
the temperature has changed by more than 50˚C since the
last calibration was performed.
Calibration should be performed at the same clock frequency that the ADC12191 will be used for conversions to
minimize offset errors. Calibration takes 4000 clock cycles.
Irrelevant data may appear during the calibration cycle.
REF
in-
IN
is
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Page 12
Applications Information (Continued)
2.3 OE Pin The OE pin is used to control the state of the out-
puts. When the OE pin is low, the output buffers go into the
ADC12191
active state. When the OE input is high, the output buffers
are in the high impedance state.
2.4 PD Pin The PD pin, when high, holds the ADC12191 in
a power-down mode where power consumption is typically
less than 15 mW to conserve power when the converter is
not being used. The ADC12191 will begin normal operation
within t
CLOCK input is present. The data in the pipeline is corrupted
while in the power down mode. The ADC12191 should be recalibrated after a power-down cycle to ensure optimum performance.
3.0 Outputs
The ADC12191 has three analog outputs: reference output
voltages V
12 Data Output pins, Ready and OR (Out of Range).
3.1 Reference Output Voltages The reference output voltages are made available only for the purpose of bypassing
with capacitors to a clean analog ground. The recommended
bypass capacitors are 0.1µF ceramic chip capacitors. Do not
load these pins.
3.2 Ready Output The Ready output goes high to indicate
that the converter is ready for operation. This signal will go
low when the converter is in Calibration or Power Down
mode.
3.3 OR (Out of Range) Output The OR output goes high
when the analog input is below GND or above V
output is low when the input signal is in the valid range of operation (0V ≤ V
3.4 Data Outputs The Data Outputs are TTL/CMOS compatible. The output data format is 12 bits straight binary.
after this pin is brought low, provided a valid
PD
RN,VRM
, and VRP. There are 14 digital outputs:
≤ V
REF
).
IN
REF
. This
Minimizing the digital output currents will help to minimize
noise due to output switching. This can be done by connecting buffers between the ADC outputs and any other circuitry.
Only one buffer input should be connected to each output.
Additionally,inserting series resistors of 47 to 56 Ohms right
at the digital outputs, close to the ADC pins, will isolate the
outputs from other circuitry and limit output currents.
4.0 Power Supply Considerations
Each power pin should be bypassed with a parallel combination of a 10µF capacitor and a 0.1µF ceramic chip capacitor.
The chip capacitors should be within 1/2 centimeter of the
power pins. Leadless chip capacitors are preferred because
they provide low lead inductance.
The converter’s digital logic supply (V
) should be well iso-
D
lated from the supply that is used for other digital circuitry on
the board. A common power supply should be used for both
V
(analog supply) and VD(digital supply), and each of these
A
supply pins should be separately bypassed with a 0.1µF ceramic capacitor and a low ESR 10µF capacitor.Aferrite bead
or inductor should be used between V
and VDto prevent
A
noise coupling from the digital supply into the analog circuit.
V
I/O is the power pin for the output driver.This pin may be
D
supplied with a potential between 3V and 5V. This makes it
easy to interface the ADC12191 with 3V or 5V logic families.
Powering the V
I/O from 3 Volts will also reduce power con-
D
sumption and noise generation due to output switching. DO
NOT operate the V
I/O at a voltage higher than VDor VA!
D
All power supplies connected to the device should be applied simultaneously.
As is the case with all high speed converters, the ADC12191
is sensitive to power supply noise. Accordingly, the noise on
the analog supply pin should be minimized, keeping it below
100mV P-P.
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Page 13
Applications Information (Continued)
ADC12191
FIGURE 5. Basic Connections Diagram
5.0 Layout and Grounding
Proper grounding and routing of all signals is essential to ensure accurate conversion. Separate analog and digital
ground planes that are connected beneath the ADC12191
are required to achieve specified performance. The analog
and digital grounds may be in the same layer, but should be
separated from each other and should never overlap each
other. Separation should be at least 1/8 inch, where possible.
The ground return for the digital output buffer supply (DGND
I/O) carries the ground current for the output drivers. This pin
should be connected to the system digital ground. The current on this pin can exhibit high transients that could add
noise to the conversion process. To prevent this from happening, the DGND I/O pin should NOT be connected in close
proximity to any of the ADC12191’s other ground pins.
Capacitive coupling between the typically noisy digital
ground plane and the sensitive analog circuitry can lead to
poor performance that may seem impossible to isolate and
remedy. The solution is to keep the analog circuitry separated from the digital circuitry and from the digital ground
plane.
Digital circuits create substantial supply and ground current
transients. The logic noise thus generated could have significant impact upon system noise performance. The best logic
family to use in systems with A/D converters is one which
employs non-saturating transistor designs, or has low noise
characteristics, such as the 74LS, 74HC(T) and 74 AC(T)Q
DS101040-23
families. The worst noise generators are logic families that
draw the largest supply current transients during clock or signal edges, like the 74F and the 74AC(T) families.
Since digital switching transients are composed largely of
high frequency components, total ground plane copper
weight will have little effect upon the logic-generated noise.
This is because of the skin effect. Total surface area is more
important than is total ground plane volume.
An effective way to control ground noise is by connecting the
analog and digital ground planes together beneath the ADC
with a copper trace that is very narrow compared with the
rest of the ground plane. This narrowing beneath the converter provides a fairly high impedance to the high frequency
components of the digital switching currents, directing them
away from the analog pins. The relatively lower frequency
analog ground currents do not create a significant voltage
drop across the impedance of this narrow ground connection.
To maximize accuracy in high speed, high resolution systems, avoid crossing analog and digital signal traces. It is important to keep any clock lines isolated from ALL other lines.
Even the generally accepted 90 degree crossing should be
avoided as even a little coupling can cause problems at high
frequencies. This is because other lines can introduce phase
noise (jitter) into the clock line, which can lead to degradation
of SNR.
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Page 14
Applications Information (Continued)
Best performance at high frequencies and at high resolution
is obtained with a straight signal path. That is, the signal path
ADC12191
through all components should form a straight line wherever
possible.
Be especially careful with the layout of inductors. Mutual inductance can change the characteristics of the circuit in
which they are used. Inductors should not be placed side by
side, even with just a small part of their bodies beside each
other.
The analog input should be isolated from noisy signal traces
to avoid coupling of spurious signals into the input. Any external component (e.g., a filter capacitor) connected between the converter’s input and ground should be connected
to a very clean point in the analog ground plane.
FIGURE 6. Layout example
Figure 6
gives an example of a suitable layout. All analog circuitry (input amplifiers, filters, reference components, etc.)
should be placed on or over the analog ground plane. All
digital circuitry and I/O lines should be placed over the digital
ground plane.
All ground connections should have a low inductance path to
ground.
6.0 Layout and Grounding
The ADC12191 can achieve impressive dynamic performance. To achieve the best dynamic performance with the
ADC12191, the clock source driving the CLK input must be
free of jitter. For best ac performance, isolating the ADC
clock from any digital circuitry should be done with adequate
buffers, as with a clock tree. See
Figure 7
.
DS101040-24
DS101040-25
FIGURE 7. Isolating the ADC clock from other circuitry
with a clock tree.
It is good practice to keep the ADC clock line as short as
possible and to keep it well away from any other signals.
Other signals can introduce phase noise (jitter) into the clock
signal, which can lead to increased distortion. Even lines
with 90˚ crossings have capacitive coupling, so try to avoid
even these 90˚ crossings of the clock line.
7.0 Common Application Pitfalls
Driving the inputs (analog or digital) beyond the power
supply rails. For proper operation, all inputs should not go
more than 300mV beyond the supply rails (more than
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Page 15
Applications Information (Continued)
300mV below the ground pins or 300mV above the supply
pins). Exceeding these limits on even a transient basis may
cause faulty or erratic operation. It is not uncommon for high
speed digital circuits (e.g., 74F and 74AC devices) to exhibit
undershoot that goes more than a volt below ground above
the power supply. A resistor of about 50 to 100Ω in series
with the offending digital input will eliminate the problem.
Care should be taken not to overdrive the inputs of the
ADC12191 with a device that is powered from supplies outside the range of the ADC12191 supply. Such practice may
lead to conversion inaccuracies and even to device damage.
Attempting to drive a high capacitance digital data bus.
Capacitive loading on the digital outputs causes instantaneous digital currents to flow from the V
DGND I/O ground plane. These large charging current
spikes can couple into the analog section, degrading dynamic performance. Adequate bypassing and maintaining
separate analog and digital ground planes will reduce this
problem. The digital data outputs should be buffered (with
I/O supply into the
D
74ACQ541, for example). Dynamic performance can also be
improved by adding series resistors at each digital output,
close to the ADC12191, reducing the energy coupled back
into the converter output pins by limiting the output slew rate.
A reasonable value for these resistors is 47Ω.
Using an inadequate amplifier to drive the analog input.
The analog input circuits of the ADC12191 place a switched
capacitor load on the input signal source. Therefore the amplifier used to drive the ADC12191 must have a low impedance output and adequate bandwidth to avoid distortion of
the input signal.
Operating with the reference pins outside of the specified range. As mentioned in section 1.1, V
the range of 1.8V ≤ V
≤ 2.2V. Operating outside of these
REF
should be in
REF
limits could lead to signal distortion.
Using a clock source with excessive jitter, using excessively long clock signal trace, or having other signals
coupled to the clock signal trace. This will cause the sam-
pling interval to vary, causing excessive output noise and a
reduction in SNR performance.
NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT AND GENERAL
COUNSEL OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or
systems which, (a) are intended for surgical implant
into the body, or (b) support or sustain life, and
whose failure to perform when properly used in
accordance with instructions for use provided in the
2. A critical component is any component of a life
support device or system whose failure to perform
can be reasonably expected to cause the failure of
the life support device or system, or to affect its
safety or effectiveness.
labeling, can be reasonably expected to result in a
significant injury to the user.
ADC12191 12-Bit, 10 MHz Self-Calibrating, Pipelined A/D Converter with Internal Sample & Hold
National does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and National reserves the right at any time without notice to change said circuitry and specifications.
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