Datasheet ADC0803MDC, ADC0803LCWMX, ADC0804MDC, ADC0802MWC, ADC0802MDC Datasheet (NSC)

ADC0801/ADC0802/ADC0803/ADC0804/ADC0805
8-Bit µP Compatible A/D Converters

General Description

The ADC0801, ADC0802, ADC0803, ADC0804 and
ADC0805 are CMOS 8-bit successive approximation A/D
converters that use a differential potentiometric
ladder—similar to the 256R products. These converters are
designed to allowoperation with the NSC800 and INS8080A
derivative control bus with TRI-STATE output latches directly
driving the data bus. These A/Ds appear like memory loca­tions or I/O ports to the microprocessor and no interfacing
logic is needed.

Differential analog voltage inputs allow increasing the
common-mode rejection and offsetting the analog zero input
voltage value. Inaddition, the voltage reference inputcan be
adjusted to allow encoding any smaller analog voltage span
to the full 8 bits of resolution.

Features

n Compatible with 8080 µP derivatives—no interfacing

logic needed - access time - 135 ns

n Easy interface to all microprocessors, or operates “stand

alone”

n Differential analog voltage inputs
n Logic inputs and outputs meet both MOS and TTL

voltage level specifications

n Works with 2.5V (LM336) voltage reference
n On-chip clock generator
n 0V to 5V analog input voltage range with single 5V

supply

n No zero adjust required
n 0.3" standard width 20-pin DIP package
n 20-pin molded chip carrier or small outline package
n Operates ratiometrically or with 5 V

DC

, 2.5 VDC,or

analog span adjusted voltage reference

Key Specifications

n Resolution 8 bits
n Total error

±

1

⁄4LSB,

±

1

⁄2LSB and±1 LSB

n Conversion time 100 µs

Connection Diagram

Ordering Information

TEMP RANGE 0˚C TO 70˚C 0˚C TO 70˚C −40˚C TO +85˚C

±

1

⁄4Bit Adjusted ADC0801LCN

ERROR

±

1

⁄2Bit Unadjusted ADC0802LCWM ADC0802LCN

±

1

⁄2Bit Adjusted ADC0803LCN

±

1Bit Unadjusted ADC0804LCWM ADC0804LCN ADC0805LCN/ADC0804LCJ

PACKAGE OUTLINE M20B—Small

Outline

N20A—Molded DIP

Z-80®is a registered trademark of Zilog Corp.

ADC080X

Dual-In-Line and Small Outline (SO) Packages

DS005671-30

See Ordering Information

November 1999

ADC0801/ADC0802/ADC0803/ADC0804/ADC0805 8-Bit µP Compatible A/D Converters

© 2001 National Semiconductor Corporation DS005671 www.national.com

Typical Applications

Error Specification (Includes Full-Scale,

Zero Error, and Non-Linearity)

Part Full- V

REF

/2=2.500 V

DC

V

REF

/2=No Connection

Number Scale (No Adjustments) (No Adjustments)

Adjusted

ADC0801

±

1

⁄4LSB

ADC0802

±

1

⁄2LSB

ADC0803

±

1

⁄2LSB

ADC0804

±

1 LSB

ADC0805

±

1 LSB

DS005671-1

8080 Interface

DS005671-31

ADC0801/ADC0802/ADC0803/ADC0804/ADC0805

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Absolute Maximum Ratings (Notes 1, 2)

If Military/Aerospace specified devices are required,
please contactthe National Semiconductor Sales Office/
Distributors for availability and specifications.

Supply Voltage (V

CC

) (Note 3) 6.5V

Voltage

Logic Control Inputs −0.3V to +18V
At Other Input and Outputs −0.3V to (V

CC

+0.3V)

Lead Temp. (Soldering, 10 seconds)

Dual-In-Line Package (plastic) 260˚C
Dual-In-Line Package (ceramic) 300˚C
Surface Mount Package

Vapor Phase (60 seconds) 215˚C

Infrared (15 seconds) 220˚C
Storage Temperature Range −65˚C to +150˚C
Package Dissipation at T

A

=25˚C 875 mW

ESD Susceptibility (Note 10) 800V

Operating Ratings (Notes 1, 2)

Temperature Range T

MIN≤TA≤TMAX

ADC0804LCJ −40˚C≤TA≤+85˚C
ADC0801/02/03/05LCN −40˚C≤T

A

≤+85˚C

ADC0804LCN 0˚C≤T

A

≤+70˚C

ADC0802/04LCWM 0˚C≤T

A

≤+70˚C

Range of V

CC

4.5 VDCto 6.3 V

DC

Electrical Characteristics

The following specifications apply for VCC=5 VDC,T

MIN≤TA≤TMAX

and f

CLK

=640 kHz unless otherwise specified.

Parameter Conditions Min Typ Max Units

ADC0801: Total Adjusted Error (Note 8) With Full-Scale Adj.

±

1

⁄

4

LSB

(See Section 2.5.2)

ADC0802: Total Unadjusted Error (Note 8) V

REF

/2=2.500 V

DC

±

1

⁄

2

LSB

ADC0803: Total Adjusted Error (Note 8) With Full-Scale Adj.

±

1

⁄

2

LSB

(See Section 2.5.2)

ADC0804: Total Unadjusted Error (Note 8) V

REF

/2=2.500 V

DC

±

1 LSB

ADC0805: Total Unadjusted Error (Note 8) V

REF

/2-No Connection

±

1 LSB

V

REF

/2 Input Resistance (Pin 9) ADC0801/02/03/05 2.5 8.0 kΩ

ADC0804 (Note 9) 0.75 1.1 kΩ

Analog Input Voltage Range (Note 4) V(+) or V(−) Gnd–0.05 V

CC

+0.05 V

DC

DC Common-Mode Error Over Analog Input Voltage

±

1/16

±

1

⁄

8

LSB

Range

Power Supply Sensitivity V

CC

=5 V

DC

±

10% Over

±

1/16

±

1

⁄

8

LSB

Allowed V

IN

(+) and VIN(−)

Voltage Range (Note 4)

AC Electrical Characteristics

The following specifications apply for VCC=5 VDCand T

MIN≤TA≤TMAX

unless otherwise specified.

Symbol Parameter Conditions Min Typ Max Units

T

C

Conversion Time f

CLK

=640 kHz (Note 6) 103 114 µs

T

C

Conversion Time (Notes 5, 6) 66 73 1/f

CLK

f

CLK

Clock Frequency VCC=5V, (Note 5) 100 640 1460 kHz
Clock Duty Cycle 40 60 %

CR Conversion Rate in Free-Running INTR tied to WR with

8770 9708 conv/s

Mode CS =0 V

DC,fCLK

=640 kHz

t

W(WR)L

Width of WR Input (Start Pulse Width) CS =0 VDC(Note 7) 100 ns

t

ACC

Access Time (Delay from Falling CL=100 pF 135 200 ns
Edge of RD to Output Data Valid)

t1H,t

0H

TRI-STATE Control (Delay CL=10 pF, RL=10k 125 200 ns
from Rising Edge of RD to

(See TRI-STATE Test

Hi-Z State) Circuits)

t

WI,tRI

Delay from Falling Edge 300 450 ns
of WR or RD to Reset of INTR

C

IN

Input Capacitance of Logic 5 7.5 pF
Control Inputs

ADC0801/ADC0802/ADC0803/ADC0804/ADC0805

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AC Electrical Characteristics (Continued)

The following specifications apply for VCC=5 VDCand T

MIN≤TA≤TMAX

unless otherwise specified.

Symbol Parameter Conditions Min Typ Max Units

C

OUT

TRI-STATE Output 5 7.5 pF

Capacitance (Data Buffers)
CONTROL INPUTS [Note: CLK IN (Pin 4) is the input of a Schmitt trigger circuit and is therefore specified separately]
V

IN

(1) Logical “1” Input Voltage VCC=5.25 V

DC

2.0 15 V

DC

(Except Pin 4 CLK IN)
V

IN

(0) Logical “0” Input Voltage VCC=4.75 V

DC

0.8 V

DC

(Except Pin 4 CLK IN)
I

IN

(1) Logical “1” Input Current VIN=5 V

DC

0.005 1 µA

DC

(All Inputs)
I

IN

(0) Logical “0” Input Current VIN=0 V

DC

−1 −0.005 µA

DC

(All Inputs)

CLOCK IN AND CLOCK R

V

T

+ CLK IN (Pin 4) Positive Going 2.7 3.1 3.5 V

DC

Threshold Voltage
V

T

− CLK IN (Pin 4) Negative 1.5 1.8 2.1 V

DC

Going Threshold Voltage
V

H

CLK IN (Pin 4) Hysteresis 0.6 1.3 2.0 V

DC

(VT+)−(VT−)
V

OUT

(0) Logical “0” CLK R Output IO=360 µA 0.4 V

DC

Voltage VCC=4.75 V

DC

V

OUT

(1) Logical “1” CLK R Output IO=−360 µA 2.4 V

DC

Voltage VCC=4.75 V

DC

DATA OUTPUTS AND INTR

V

OUT

(0) Logical “0” Output Voltage

Data Outputs I

OUT

=1.6 mA, VCC=4.75 V

DC

0.4 V

DC

INTR Output I

OUT

=1.0 mA, VCC=4.75 V

DC

0.4 V

DC

V

OUT

(1) Logical “1” Output Voltage IO=−360 µA, VCC=4.75 V

DC

2.4 V

DC

V

OUT

(1) Logical “1” Output Voltage IO=−10 µA, VCC=4.75 V

DC

4.5 V

DC

I

OUT

TRI-STATE Disabled Output V

OUT

=0 V

DC

−3 µA

DC

Leakage (All Data Buffers) V

OUT

=5 V

DC

3µA

DC

I

SOURCE

V

OUT

Short to Gnd, TA=25˚C 4.5 6 mA

DC

I

SINK

V

OUT

Short to VCC,TA=25˚C 9.0 16 mA

DC

POWER SUPPLY

I

CC

Supply Current (Includes f

CLK

=640 kHz,

Ladder Current) V

REF

/2=NC, TA=25˚C

and CS =5V
ADC0801/02/03/04LCJ/05 1.1 1.8 mA
ADC0804LCN/LCWM 1.9 2.5 mA

Note 1: Absolute MaximumRatings indicatelimits beyond which damage tothe devicemay occur. DCandAC electrical specifications do not apply whenoperating
the device beyond its specified operating conditions.

Note 2: All voltages are measured with respect to Gnd, unless otherwise specified. The separate A Gnd point should always be wired to the D Gnd.
Note 3: A zener diode exists, internally, from V

CC

to Gnd and has a typical breakdown voltage of 7 VDC.

Note 4: For V

IN

(−)≥ VIN(+) the digitaloutputcode will be0000 0000. Two on-chip diodesare tied toeachanalog input (seeblock diagram) whichwillforward conduct

for analog input voltages one diode drop below ground or one diode drop greater than the V

CC

supply. Be careful, during testing at low VCClevels (4.5V), as high
level analog inputs (5V) can cause this input diode to conduct–especially at elevated temperatures, and cause errors for analog inputs near full-scale. The spec
allows 50mV forward bias of either diode. This means that as long as the analog V

IN

does notexceed the supply voltage by more than 50 mV, the output code will

be correct. To achieve an absolute 0 V

DC

to5VDCinput voltage range will therefore require a minimum supply voltage of 4.950 VDCover temperature variations,

initial tolerance and loading.
Note 5: Accuracy is guaranteed at f

CLK

= 640 kHz. At higher clock frequencies accuracy can degrade. For lower clock frequencies, the duty cycle limits can be

extended so long as the minimum clock high time interval or minimum clock low time interval is no less than 275 ns.
Note 6: With an asynchronous start pulse, up to 8 clock periods may be required before the internal clock phases are proper to start the conversion process. The

start request is internally latched, see

Figure 4

and section 2.0.

ADC0801/ADC0802/ADC0803/ADC0804/ADC0805

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AC Electrical Characteristics (Continued)

Note 7: The CS input is assumed to bracket the WRstrobe input and therefore timing is dependent on the WR pulse width. An arbitrarily wide pulse width will hold

the converter in a reset mode and the start of conversion is initiated by the low to high transition of the WR pulse (see timing diagrams).
Note 8: None of these A/Ds requires a zero adjust (see section 2.5.1). To obtain zero code at other analog input voltages see section 2.5 and

Figure 7

.

Note 9: The V

REF

/2 pin is the center point of a two-resistor divider connected from VCCto ground. In all versions of the ADC0801, ADC0802, ADC0803, and

ADC0805, and in the ADC0804LCJ, each resistor is typically 16 kΩ. In all versions of the ADC0804 except the ADC0804LCJ, each resistor is typically 2.2 kΩ.

Note 10: Human body model, 100 pF discharged through a 1.5 kΩ resistor.

Typical Performance Characteristics

Logic Input Threshold Voltage
vs. Supply Voltage

DS005671-38

Delay From Falling Edge of
RD to Output Data Valid
vs. Load Capacitance

DS005671-39

CLK IN Schmitt Trip Levels
vs. Supply Voltage

DS005671-40

f

CLK

vs. Clock Capacitor

DS005671-41

Full-Scale Error vs
Conversion Time

DS005671-42

Effect of Unadjusted Offset Error
vs. V

REF

/2 Voltage

DS005671-43

Output Current vs
Temperature

DS005671-44

Power Supply Current
vs Temperature (Note 9)

DS005671-45

Linearity Error at Low
V

REF

/2 Voltages

DS005671-46

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TRI-STATE Test Circuits and Waveforms

Timing Diagrams

(All timing is measured from the 50% voltage points)

t

1H

DS005671-47

t1H,CL=10 pF

DS005671-48

tr=20 ns

t

0H

DS005671-49

t0H,CL=10 pF

DS005671-50

tr=20 ns

DS005671-51

ADC0801/ADC0802/ADC0803/ADC0804/ADC0805

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Timing Diagrams (All timing is measured from the 50% voltage points) (Continued)

Typical Applications

Output Enable and Reset with INTR

DS005671-52

Note: Read strobe must occur 8 clock periods (8/f

CLK

) after assertion of interrupt to guarantee reset of INTR .

6800 Interface

DS005671-53

Ratiometeric with Full-Scale Adjust

DS005671-54

Note: before using caps at VINor V

REF

/2,

see section 2.3.2 Input Bypass Capacitors.

ADC0801/ADC0802/ADC0803/ADC0804/ADC0805

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Typical Applications (Continued)

Absolute with a 2.500V Reference

DS005671-55

*For low power, see also LM385–2.5

Absolute with a 5V Reference

DS005671-56

Zero-Shift and Span Adjust: 2V ≤ VIN≤ 5V

DS005671-57

Span Adjust: 0V ≤ VIN≤ 3V

DS005671-58

ADC0801/ADC0802/ADC0803/ADC0804/ADC0805

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Typical Applications (Continued)

Directly Converting a Low-Level Signal

DS005671-59

V

REF

/2=256 mV

A µP Interfaced Comparator

DS005671-60

For:
V

IN

(+)>VIN(−)

Output=FF

HEX

For:
V

IN

(+)<VIN(−)

Output=00

HEX

1 mV Resolution with µP Controlled Range

DS005671-61

V

REF

/2=128 mV
1 LSB=1 mV
V

DAC≤VIN

≤(V

DAC

+256 mV)

0 ≤ V

DAC

<

2.5V

ADC0801/ADC0802/ADC0803/ADC0804/ADC0805

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Typical Applications (Continued)

Digitizing a Current Flow

DS005671-62

Self-Clocking Multiple A/Ds

DS005671-63

* Use a large R value
to reduce loading
at CLK R output.

External Clocking

DS005671-64

100 kHz≤f

CLK

≤1460 kHz

ADC0801/ADC0802/ADC0803/ADC0804/ADC0805

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Typical Applications (Continued)

Self-Clocking in Free-Running Mode

DS005671-65

*After power-up, a momentary grounding of the WR input is needed to
guarantee operation.

µP Interface for Free-Running A/D

DS005671-66

Operating with “Automotive” Ratiometric Transducers

DS005671-67

*VIN(−)=0.15 V

CC

15% of VCC≤V

XDR

≤85% of V

CC

Ratiometric with V

REF

/2 Forced

DS005671-68

µP Compatible Differential-Input Comparator with Pre-Set VOS(with or without Hysteresis)

DS005671-69

*See

Figure 5

to select R value

DB7=“1” for V

IN

(+)>VIN(−)+(V

REF

/2)
Omit circuitry within the dotted area if
hysteresis is not needed

ADC0801/ADC0802/ADC0803/ADC0804/ADC0805

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Typical Applications (Continued)

Handling

±

10V Analog Inputs

DS005671-70

*Beckman Instruments#694-3-R10K resistor array

Low-Cost, µP Interfaced, Temperature-to-Digital

Converter

DS005671-71

µP Interfaced Temperature-to-Digital Converter

DS005671-72

*Circuit values shown are for 0˚C≤TA≤+128˚C
**

*

Can calibrate each sensor to allow easy replacement, then A/D can be calibrated with a pre-set input voltage.

ADC0801/ADC0802/ADC0803/ADC0804/ADC0805

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Typical Applications (Continued)

Handling

±

5V Analog Inputs

DS005671-33

*Beckman Instruments#694-3-R10K resistor array

Read-Only Interface

DS005671-34

µP Interfaced Comparator with Hysteresis

DS005671-35

Protecting the Input

DS005671-9

Diodes are 1N914

ADC0801/ADC0802/ADC0803/ADC0804/ADC0805

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Typical Applications (Continued)

Analog Self-Test for a System

DS005671-36

A Low-Cost, 3-Decade Logarithmic Converter

DS005671-37

*LM389 transistors
A, B, C, D = LM324A quad op amp

ADC0801/ADC0802/ADC0803/ADC0804/ADC0805

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Typical Applications (Continued)

3-Decade Logarithmic A/D Converter

DS005671-73

Noise Filtering the Analog Input

DS005671-74

fC=20 Hz
Uses Chebyshev implementation for steeper roll-off unity-gain, 2nd order,

low-pass filter
Adding a separate filter for each channel increases system response time

if an analog multiplexer is used

Multiplexing Differential Inputs

DS005671-75

Output Buffers with A/D Data Enabled

DS005671-76

*A/D output data is updated 1 CLK period prior to assertion of INTR

Increasing Bus Drive and/or Reducing Time on Bus

DS005671-77

*Allows output data to set-up at falling edge of CS

ADC0801/ADC0802/ADC0803/ADC0804/ADC0805

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Typical Applications (Continued)

Functional Description

1.0 UNDERSTANDING A/D ERROR SPECS

A perfect A/D transfer characteristic (staircase waveform) is
shown in

Figure 1

. The horizontal scale is analog input
voltage and the particular points labeled are in steps of 1
LSB (19.53 mV with 2.5V tied to the V

REF

/2 pin). The digital

output codes that correspond to these inputs are shown as

D−1, D, and D+1. For the perfect A/D, not only will

center-value (A−1, A, A+1, ....)analog inputs produce

the correct output digital codes, but also each riser (the
transitions between adjacent output codes) will be located

±

1

⁄2LSB away from each center-value. As shown, the risers
are ideal and have nowidth. Correct digital output codes will
be provided for a range of analog input voltages that extend

Sampling an AC Input Signal

DS005671-78

Note 11: Oversample whenever possible [keep fs>2f(−60)] to eliminate input frequency folding (aliasing) and to allow for the skirt response of the filter.
Note 12: Consider the amplitude errors which are introduced within the passband of the filter.

70% Power Savings by Clock Gating

DS005671-79

(Complete shutdown takes ≈ 30 seconds.)

Power Savings by A/D and V

REF

Shutdown

DS005671-80

*Use ADC0801, 02, 03 or 05 for lowest power consumption.
Note: Logic inputs can be driven to V

CC

with A/D supply at zero volts.

Buffer prevents data bus from overdriving output of A/D when in shutdown mode.

ADC0801/ADC0802/ADC0803/ADC0804/ADC0805

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Functional Description (Continued)

±

1

⁄2LSB from the ideal center-values. Each tread (the range
of analog input voltage that provides the same digital output
code) is therefore 1 LSB wide.

Figure 2

shows a worst case error plot for the ADC0801. All
center-valued inputs are guaranteed to produce the correct
output codes and the adjacent risers are guaranteed to be
no closer to the center-value points than

±

1

⁄4LSB. In other

words, if we apply an analog input equal to the center-value

±

1

⁄4LSB,

we guarantee

that the A/D will produce the correct
digital code. The maximum range of the position of the code
transition is indicated by the horizontal arrow and it is guar­anteed to be no more than

1

⁄2LSB.

The error curve of

Figure 3

shows a worst case error plot for
the ADC0802. Here we guarantee that if we apply an analog
input equal to the LSB analog voltage center-value the A/D
will produce the correct digital code.

Next to each transfer function is shown the corresponding
error plot. Manypeople may be more familiar with error plots
than transfer functions. The analog input voltage to the A/D
is provided by either a linear ramp or by the discrete output
steps of a high resolution DAC. Notice that the error is
continuously displayed and includes the quantization uncer­tainty of theA/D. For example the error at point 1 of

Figure 1

is +1⁄2LSB because the digital code appeared1⁄2LSB in
advance of the center-value of the tread. The error plots
always have a constant negative slope and the abrupt up­side steps are always 1 LSB in magnitude.

Transfer Function

DS005671-81

Error Plot

DS005671-82

FIGURE 1. Clarifying the Error Specs of an A/D Converter

Accuracy=

±

0 LSB: A Perfect A/D

Transfer Function

DS005671-83

Error Plot

DS005671-84

FIGURE 2. Clarifying the Error Specs of an A/D Converter

Accuracy=

±

1

⁄4LSB

ADC0801/ADC0802/ADC0803/ADC0804/ADC0805

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Functional Description (Continued)

2.0 FUNCTIONAL DESCRIPTION

The ADC0801 series contains a circuit equivalent of the
256R network. Analog switches are sequenced by succes­sive approximationlogic to match theanalog difference input
voltage [V

IN

(+)−VIN(−)] to a corresponding tap on the R
network. The most significant bit is tested first and after 8
comparisons (64 clock cycles) a digital 8-bit binary code
(1111 1111 = full-scale) is transferred to an output latch and
then an interrupt is asserted (INTR makes a high-to-low
transition). A conversion in process can be interrupted by
issuing a second start command. The device may be oper­ated inthe free-running mode by connecting INTR tothe WR
input with CS =0. To ensure start-up under all possible
conditions, an external WR pulse is required during the first
power-up cycle.

On the high-to-low transition of the WR input the internal
SAR latches and the shift register stages are reset. As long
as theCS input andWR input remain low,the A/Dwill remain
in a reset state.

Conversion will start from 1 to 8 clock
periods afterat least oneof these inputsmakes a low-to-high
transition

.

A functional diagram of the A/D converter is shown in

Figure

4

. All of the package pinouts are shown and the major logic

control paths are drawn in heavier weight lines.
The converter is started by having CS and WR simulta-

neously low. This sets the start flip-flop (F/F) and the result­ing “1” level resetsthe 8-bit shift register, resets the Interrupt
(INTR) F/Fand inputs a “1” tothe D flop,F/F1, which is at the
input end of the 8-bit shiftregister. Internal clocksignals then
transfer this “1” to the Q output of F/F1. The AND gate, G1,
combines this“1” output witha clock signalto provide a reset
signal to the start F/F. If the set signal is no longer present
(either WR or CS is a “1”) the start F/F is reset and the 8-bit
shift register then can have the “1” clocked in, which starts
the conversion process. If the set signal were to still be
present, this reset pulse would have no effect (both outputs
of the start F/F would momentarily be at a “1” level) and the
8-bit shift register would continue to be held in the reset
mode. This logic therefore allows for wide CS and WR
signals and the converter willstart after at least one of these
signals returns high and the internal clocks again provide a
reset signal for the start F/F.

Transfer Function

DS005671-85

Error Plot

DS005671-86

FIGURE 3. Clarifying the Error Specs of an A/D Converter

Accuracy=

±

1

⁄2LSB

ADC0801/ADC0802/ADC0803/ADC0804/ADC0805

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Functional Description (Continued)

After the “1” is clocked through the 8-bit shift register (which
completes the SAR search) it appears as the input to the
D-type latch, LATCH 1. As soon as this “1” is outputfrom the
shift register,the AND gate, G2, causes the new digital word
to transfer to the TRI-STATE output latches. When LATCH 1
is subsequently enabled, the Q output makes a high-to-low
transition which causes the INTR F/F to set. An inverting
buffer then supplies the INTR input signal.

Note that this SET control of the INTR F/F remains low for 8
of the external clock periods (as the internal clocks run at1⁄

8

of the frequency of the external clock). If the data output is
continuously enabled (CS and RD both held low), the INTR
output will still signal the end of conversion (by a high-to-low
transition), because the SET input can control the Q output
of the INTR F/F even though the RESET input is constantly
at a “1” level in this operating mode. This INTR output will
therefore staylow for the durationof the SET signal, which is
8 periods of the external clock frequency (assuming the A/D
is not started during this interval).

When operatingin the free-runningor continuous conversion
mode (INTR pin tied to WR and CS wired low—see also
section 2.8), the START F/F is SET by the high-to-low tran­sition of the INTR signal. This resets the SHIFT REGISTER

which causes the input to the D-type latch, LATCH 1, to go
low.As thelatch enable input is still present, theQ output will
go high, which then allows the INTR F/F to be RESET. This
reduces the width of the resulting INTR output pulse to only
a few propagation delays (approximately 300 ns).

When data is to be read,the combination of bothCS and RD
being low will cause the INTR F/F to be reset and the
TRI-STATE outputlatches will be enabled toprovide the 8-bit
digital outputs.

2.1 Digital Control Inputs

The digital control inputs (CS, RD, and WR) meet standard
T2L logic voltage levels. These signals have been renamed
when comparedto the standard A/DStart and OutputEnable
labels. In addition, these inputs are active low to allow an
easy interface to microprocessor control busses. For
non-microprocessor based applications, the CS input (pin 1)
can be grounded and the standard A/D Start function is
obtained by an active low pulse applied at the WR input (pin

3) and the Output Enable function is caused by an active low
pulse at the RD input (pin 2).

DS005671-13

Note 13: CS shown twice for clarity.
Note 14: SAR = Successive Approximation Register.

FIGURE 4. Block Diagram

ADC0801/ADC0802/ADC0803/ADC0804/ADC0805

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Functional Description (Continued)

2.2 Analog Differential Voltage Inputs and
Common-Mode Rejection

This A/D has additional applications flexibility due to the
analog differential voltage input. The V

IN

(−) input (pin 7) can
be used to automatically subtract a fixed voltage value from
the input reading (tare correction). This is also useful in 4
mA–20 mA current loop conversion. In addition,
common-mode noise can be reduced by use of the differen­tial input.

The time intervalbetween sampling V

IN

(+) and VIN(−) is 4-1⁄

2

clock periods. The maximum error voltage due to this slight
time difference between the input voltage samples is given
by:

where:

∆V

e

is the error voltage due to sampling delay

V

P

is the peak value of the common-mode voltage

f

cm

is the common-mode frequency

As an example, to keep this error to

1

⁄4LSB (∼5 mV) when

operating with a 60 Hz common-mode frequency, f

cm

, and

using a 640kHz A/D clock, f

CLK

, would allowa peak value of

the common-mode voltage, V

P

, which is given by:

or

which gives

V

P

.1.9V.

The allowed range of analog input voltages usually places
more severe restrictions on input common-mode noise lev­els.

An analog input voltage with a reduced span and a relatively
large zero offset can be handled easily by making use of the
differential input (see section 2.4 Reference Voltage).

2.3 Analog Inputs

2.3 1 Input Current

Normal Mode

Due to the internal switching action, displacement currents
will flow at the analog inputs. This is due to on-chip stray
capacitance to ground as shown in

Figure 5

.

The voltage on this capacitanceis switched and will result in
currents entering the V

IN

(+) input pin and leaving the VIN(−)
input which will depend on the analog differential input volt­age levels. These current transients occur at the leading
edge of the internal clocks. They rapidly decay and

do not

cause errors

as the on-chip comparator is strobed atthe end

of the clock period.

Fault Mode

If the voltage source applied to the V

IN

(+) or VIN(−) pin

exceeds the allowed operating range of V

CC

+50 mV, large

input currents can flow through a parasitic diode to the V

CC

pin. If these currents can exceed the 1 mA max allowed
spec, an external diode (1N914) should be added to bypass
this current to the V

CC

pin (with the current bypassed with

this diode, the voltage at the V

IN

(+) pin can exceed the V

CC

voltage by the forward voltage of this diode).

2.3.2 Input Bypass Capacitors

Bypass capacitors at the inputs will average these charges
and cause a DC current to flow through the output resis­tances of the analog signal sources. This charge pumping
action is worse for continuous conversions with the V

IN

(+)
input voltage at full-scale. For continuous conversions with a
640 kHz clock frequency with the V

IN

(+) input at 5V, this DC

current is at a maximum of approximately 5 µA. Therefore,

bypass capacitorsshould not be usedat the analog inputsor
the V

REF

/2 pin

for high resistance sources (>1kΩ). If input
bypass capacitors are necessary for noise filtering and high
source resistanceis desirable to minimize capacitor size, the
detrimental effects of the voltage drop across this input
resistance, which is due to the average value of the input
current, can be eliminated with a full-scale adjustment while
the given source resistor and input bypass capacitor are
both in place. This is possible because the average value of
the input current is a precise linear function of the differential
input voltage.

2.3.3 Input Source Resistance

Large values of source resistance where an input bypass
capacitor is not used,

will not cause errors

as the input
currents settle out prior to the comparison time. Ifa low pass
filter is required in the system, use a low valued series
resistor (≤ 1kΩ) for a passive RC section or add an op amp
RC active low pass filter. For low source resistance applica­tions, (≤ 1kΩ), a 0.1 µF bypass capacitor at the inputs will
prevent noise pickup due to series lead inductance of a long

DS005671-14

rONof SW 1 and SW 2 . 5kΩ
r=r

ONCSTRAY

. 5kΩx12pF=60ns

FIGURE 5. Analog Input Impedance

ADC0801/ADC0802/ADC0803/ADC0804/ADC0805

www.national.com 20

Functional Description (Continued)

wire. A 100Ω series resistor can be used to isolate this
capacitor—both the R and C are placed outside the feed­back loop—from the output of an op amp, if used.

2.3.4 Noise

The leads to the analog inputs (pins 6 and 7) should be kept
as short as possible to minimize input noise coupling. Both
noise and undesired digital clock coupling to these inputs
can cause system errors. The source resistance for these
inputs should, in general, be kept below 5 kΩ. Larger values
of source resistance can cause undesired system noise
pickup. Input bypass capacitors, placed from the analog
inputs to ground, will eliminate system noise pickup but can
create analog scale errors as these capacitors will average
the transient input switching currents of theA/D (see section

2.3.1.). This scale error depends on both a large source
resistance and the use of an input bypass capacitor. This
error can be eliminated by doing a full-scale adjustment of
the A/D (adjust V

REF

/2 for a proper full-scale reading — see
section 2.5.2 on Full-Scale Adjustment) with the source re­sistance and input bypass capacitor in place.

2.4 Reference Voltage

2.4.1 Span Adjust

For maximum applications flexibility, these A/Ds have been
designed to accommodatea5V

DC

, 2.5 VDCor an adjusted
voltage reference. This has been achieved in the design of
the IC as shown in

Figure 6

.

Notice that the reference voltage for the IC is either

1

⁄2of the

voltage applied to the V

CC

supply pin, or is equal to the

voltage thatis externally forced at theV

REF

/2 pin.This allows

for a ratiometric voltage reference using the V

CC

supply, a 5

V

DC

reference voltage can be used for the VCCsupply or a

voltage less than 2.5 V

DC

can be applied to the V

REF

/2 input
for increased application flexibility. The internal gain to the
V

REF

/2 input is 2, making the full-scale differential input

voltage twice the voltage at pin 9.
An example of the useof an adjusted reference voltage is to

accommodate a reduced span—or dynamic voltage range
of the analog input voltage. If the analog input voltage were
to range from 0.5 V

DC

to 3.5 VDC, instead of 0V to 5 VDC, the

span would be 3V as shown in

Figure 7

. With 0.5 V

DC

applied to the VIN(−) pin to absorb the offset, the reference
voltage can be made equal to

1

⁄2of the 3V span or 1.5 VDC.

TheA/D now will encode the V

IN

(+) signal from0.5V to 3.5 V

with the 0.5V input corresponding to zero and the 3.5 V

DC

input corresponding to full-scale. The full 8 bits of resolution
are therefore applied over this reduced analog input voltage
range.

2.4.2 Reference Accuracy Requirements

The converter can be operated in a ratiometric mode or an
absolute mode. In ratiometric converter applications, the
magnitude of the reference voltage is a factor in both the
output of the source transducer and the output of the A/D
converter and therefore cancels out in the final digital output
code. The ADC0805 is specified particularly for use in ratio­metric applicationswith no adjustments required.In absolute
conversion applications, both the initial value and the tem­perature stability of the reference voltage are important fac­tors in the accuracy of the A/D converter. For V

REF

/2 volt-

ages of2.4 V

DC

nominal value,initial errors of±10 mVDCwill

cause conversionerrors of

±

1 LSBdue to the gain of2 of the

V

REF

/2 input. In reduced span applications, the initial value

and the stability of the V

REF

/2 input voltage become even
more important. For example, if the span is reduced to 2.5V,
the analog input LSB voltage value is correspondingly re­duced from 20 mV (5V span) to 10 mV and 1 LSB at the
V

REF

/2 input becomes 5 mV. As can be seen, this reduces
the allowed initial tolerance of the reference voltage and
requires correspondingly less absolute change with tem­perature variations. Note that spans smaller than 2.5V place
even tighter requirements on the initialaccuracy and stability
of the reference source.

In general, the magnitude of the reference voltage will re­quire an initial adjustment. Errors due to an improper value
of reference voltage appear as full-scale errors in the A/D
transfer function. IC voltage regulators may be used for
references if the ambient temperature changes are not ex­cessive. The LM336B 2.5V IC reference diode (from Na­tional Semiconductor) has a temperature stability of 1.8 mV
typ (6 mV max) over 0˚C≤T

A

≤+70˚C. Other temperature

range parts are also available.

DS005671-15

FIGURE 6. The V

REFERENCE

Design on the IC

ADC0801/ADC0802/ADC0803/ADC0804/ADC0805

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Functional Description (Continued)

2.5 Errors and Reference Voltage Adjustments

2.5.1 Zero Error

The zero of the A/D does not require adjustment. If the
minimum analog input voltage value, V

IN(MIN)

, is not ground,
a zero offset can be done. The converter can be made to
output 0000 0000 digital code for this minimum input voltage
by biasing the A/D V

IN

(−) input at this V

IN(MIN)

value (see
Applications section). This utilizes the differential mode op­eration of the A/D.

The zero error of the A/D converter relates to the location of
the firstriser of thetransfer function andcan be measured by
grounding the V

IN

(−) input and applying a small magnitude

positive voltage to the V

IN

(+) input. Zero error is the differ­ence between the actual DC input voltage that is necessary
to justcause an output digital codetransition from 00000000
to 0000 0001 and the ideal

1

⁄2LSB value (1⁄2LSB = 9.8 mV

for V

REF

/2=2.500 VDC).

2.5.2 Full-Scale

The full-scale adjustment can be made by applying a differ­ential input voltage that is 1

1

⁄2LSB less than the desired
analog full-scale voltage range and then adjusting the mag­nitude of the V

REF

/2 input (pin 9 or the VCCsupply if pin 9 is
not used) for a digital output code that is just changing from
1111 1110 to 1111 1111.

2.5.3 Adjusting for an Arbitrary Analog Input Voltage
Range

If the analog zero voltage of the A/D is shifted away from
ground (forexample, to accommodatean analog input signal
that does not go to ground) this new zero reference should
be properly adjusted first. A V

IN

(+) voltage that equals this

desired zero reference plus

1

⁄2LSB (where the LSB is cal-

culated for the desired analog span, 1 LSB=analog span/

256) is applied to pin 6 and the zero reference voltage at pin
7 should then be adjusted to just obtain the 00

HEX

to 01

HEX

code transition.
The full-scale adjustment should then be made (with the

proper V

IN

(−) voltage applied) by forcing a voltage to the

V

IN

(+) input which is given by:

where:

V

MAX

=The high end of the analog input range

and

V

MIN

=the low end (the offset zero) of the analog range.

(Both are ground referenced.)
The V

REF

/2 (or VCC) voltage is then adjusted to provide a

code change from FE

HEX

to FF

HEX

. This completes the

adjustment procedure.

2.6 Clocking Option

The clock for the A/D can be derived from the CPU clock or
an external RC can be added to provide self-clocking. The
CLK IN (pin 4) makes use of a Schmitt trigger as shown in

Figure 8

.

DS005671-87

a) Analog Input Signal Example

DS005671-88

*

Add if V

REF

/2 ≤ 1VDCwith LM358 to draw 3 mA to ground.

b) Accommodating an Analog Input from

0.5V (Digital Out = 00

HEX

) to 3.5V

(Digital Out=FF

HEX

)

FIGURE 7. Adapting the A/D Analog Input Voltages to Match an Arbitrary Input Signal Range

ADC0801/ADC0802/ADC0803/ADC0804/ADC0805

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Functional Description (Continued)

Heavy capacitive or DC loading of the clock R pin should be
avoided as this will disturb normal converter operation.
Loads less than 50 pF, such as driving up to 7A/D converter
clock inputs from a single clock R pin of 1 converter, are
allowed. For larger clock line loading, a CMOS or low power
TTL buffer or PNPinput logic should beused to minimize the
loading on the clock R pin (do not use a standard TTL
buffer).

2.7 Restart During a Conversion

If the A/D is restarted (CS and WR go low and return high)
during a conversion, the converter is reset and a new con­version is started. The output data latch is not updated if the
conversion in process is not allowed to be completed, there­fore thedata of theprevious conversion remainsin this latch.
The INTR output simply remains at the “1” level.

2.8 Continuous Conversions

For operation in the free-running mode an initializing pulse
should be used, following power-up, to ensure circuit opera­tion. Inthis application, theCS input isgrounded and the WR
input is tied to the INTR output. This WR and INTR node
should be momentarily forced to logic low following a
power-up cycle to guarantee operation.

2.9 Driving the Data Bus

This MOS A/D, like MOS microprocessors and memories,
will require a bus driver when the total capacitance of the
data bus gets large. Other circuitry, which is tied to the data
bus, will add to the total capacitive loading, even in
TRI-STATE (high impedance mode). Backplane bussing
also greatly adds to the stray capacitance of the data bus.

There are some alternatives available to the designer to
handle this problem. Basically, the capacitive loading of the
data bus slows down the response time, even though DC
specifications are still met. For systems operating with a
relatively slow CPU clock frequency, more time is available
in which to establish proper logic levels on the bus and
therefore higher capacitive loads can be driven (see typical
characteristics curves).

At higher CPU clock frequencies time can be extended for
I/O reads (and/or writes) by inserting wait states (8080) or
using clock extending circuits (6800).

Finally,if timeis short andcapacitive loading ishigh, external
bus drivers must be used. These can be TRI-STATE buffers

(low power Schottky such as the DM74LS240 series is rec­ommended) or special higher drive current products which
are designed asbus drivers. High current bipolar bus drivers
with PNP inputs are recommended.

2.10 Power Supplies

Noise spikes on the V

CC

supply line can cause conversion
errors as the comparator will respond to this noise. A low
inductance tantalum filter capacitor should be used close to
the converter V

CC

pin and values of 1 µF or greater are
recommended. If an unregulated voltage is available in the
system, a separate LM340LAZ-5.0, TO-92, 5V voltage regu­lator for the converter (andother analog circuitry) will greatly
reduce digital noise on the V

CC

supply.

2.11 Wiring and Hook-Up Precautions

Standard digital wire wrap sockets are not satisfactory for
breadboarding this A/D converter. Sockets on PC boards
can be used and all logic signal wires and leads should be
grouped and kept as far away as possible from the analog
signal leads. Exposed leads to the analog inputs can cause
undesired digital noise and hum pickup, therefore shielded
leads may be necessary in many applications.

A single point analog ground that is separate from the logic
ground points should be used. The power supply bypass
capacitor and the self-clocking capacitor (if used) should
both be returned to digital ground. Any V

REF

/2 bypass ca­pacitors, analog input filter capacitors, or input signal shield­ing should be returned to the analog ground point. A test for
proper grounding is to measure the zero error of the A/D
converter. Zero errors in excess of

1

⁄4LSB can usually be
traced toimproper board layoutand wiring (seesection 2.5.1
for measuring the zero error).

3.0 TESTING THE A/D CONVERTER

There are many degrees of complexity associated with test­ing an A/D converter. One of the simplest tests is to apply a
known analoginput voltage to the converterand use LEDsto
display theresulting digital output code asshown in

Figure 9

.

For ease of testing, the V

REF

/2 (pin 9) should be supplied

with 2.560 V

DC

andaVCCsupply voltage of5.12 VDCshould

be used. This provides an LSB value of 20 mV.
If a full-scale adjustment is to be made, an analog input

voltage of 5.090 V

DC

(5.120–11⁄2LSB) should be applied to

the V

IN

(+) pin with the VIN(−) pin grounded. The value of the

V

REF

/2 input voltage should then be adjusted until the digital
output code is just changing from 1111 1110 to 1111 1111.
This value of V

REF

/2 should then be used for all the tests.

The digital output LED display can be decoded by dividing
the 8 bits into 2 hex characters, the 4 most significant (MS)
and the 4 least significant (LS).

Table 1

shows the fractional
binary equivalent of these two 4-bit groups. By adding the
voltages obtained from the “VMS” and “VLS” columns in

Table 1

, the nominal value of the digital display (when

V

REF

/2 = 2.560V) can be determined. For example, for an
output LED display of 1011 0110 or B6 (in hex), the voltage
values from thetable are 3.520 + 0.120or 3.640 V

DC

. These
voltage values represent the center-values of a perfect A/D
converter. The effects of quantization error have to be ac­counted for in the interpretation of the test results.

DS005671-17

FIGURE 8. Self-Clocking the A/D

ADC0801/ADC0802/ADC0803/ADC0804/ADC0805

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Functional Description (Continued)

For a higher speed test system, or to obtain plotted data, a
digital-to-analog converter is needed for the test set-up. An
accurate 10-bit DAC can serve as the precision voltage
source for the A/D. Errors of the A/D under test can be
expressed as either analog voltages or differences in 2
digital words.

Abasic A/D testerthat uses a DACand provides the error as
an analog output voltage is shown in

Figure 8

.The2op
amps can be eliminated if a lab DVM with a numerical
subtraction feature is available to read the difference volt­age, “A–C”, directly. The analog input voltage can be sup­plied by a low frequency ramp generator and an X-Y plotter
can be used to provide analog error (Y axis) versus analog
input (X axis).

For operation with a microprocessor or a computer-based
test system, it is more convenient to present the errors
digitally.This can be done with thecircuit of

Figure 11

, where
the output code transitions can be detected as the 10-bit
DAC is incremented.This provides

1

⁄4LSB steps forthe 8-bit
A/D under test. If the results of this test are automatically
plotted with the analog input on the X axis and the error (in
LSB’s) as the Y axis, a useful transfer function of the A/D
under test results. For acceptance testing, the plot is not
necessary and the testing speed can be increased by estab­lishing internal limits on the allowed error for each code.

4.0 MICROPROCESSOR INTERFACING

To dicuss the interface with 8080A and 6800 microproces­sors, a common sample subroutine structure is used. The
microprocessor starts the A/D, reads and stores the results
of 16 successive conversions, then returns to the user’s
program. The 16 data bytes are stored in 16 successive
memory locations. All Data and Addresses will be given in
hexadecimal form. Software and hardware details are pro­vided separately for each type of microprocessor.

4.1 Interfacing 8080 Microprocessor Derivatives (8048,

8085)

This converter has been designed to directly interface with
derivatives of the 8080 microprocessor. The A/D can be
mapped into memory space (using standard memory ad­dress decoding for CS and the MEMR and MEMW strobes)
or it can be controlled as an I/O device by using the I/O R
and I/O W strobes and decoding the address bits A0→A7
(or addressbits A8→A15 asthey will contain thesame 8-bit
address information) to obtain the CS input. Using the I/O
space provides 256 additional addresses and may allow a
simpler 8-bit address decoder but the data can only be input
to the accumulator. To make use of the additional memory
reference instructions, the A/D should be mapped into
memory space. An example of an A/D in I/O space is shown
in

Figure 12

.

DS005671-18

FIGURE 9. Basic A/D Tester

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Functional Description (Continued)

TABLE 1. DECODING THE DIGITAL OUTPUT LEDs

OUTPUT VOLTAGE

FRACTIONAL BINARY VALUE FOR CENTER VALUES

HEX BINARY WITH

V

REF

/2=2.560 V

DC

MS GROUP LS GROUP VMS

GROUP

(Note 15)

VLS

GROUP

(Note 15)
F 1111 15/16 15/256 4.800 0.300
E 1110 7/8 7/128 4.480 0.280

D 1101 13/16 13/256 4.160 0.260
C 1100 3/4 3/64 3.840 0.240

B 1011 11/16 11/256 3.520 0.220
A 1010 5/8 5/128 3.200 0.200
9 1001 9/16 9/256 2.880 0.180
8 10001/2 1/32 2.560 0.160
7 0111 7/16 7/256 2.240 0.140
6 0110 3/8 3/128 1.920 0.120
5 0101 5/16 2/256 1.600 0.100
4 0100 1/4 1/64 1.280 0.080
3 0011 3/16 3/256 0.960 0.060
2 0010 1/8 1/128 0.640 0.040
1 0001 1/16 1/256 0.320 0.020
0 0000 00

Note 15: Display Output=VMS Group + VLS Group

DS005671-89

FIGURE 10. A/D Tester with Analog Error Output

DS005671-90

FIGURE 11. Basic “Digital” A/D Tester

ADC0801/ADC0802/ADC0803/ADC0804/ADC0805

www.national.com25

Functional Description (Continued)

DS005671-20

Note 16:*Pin numbers for the DP8228 system controller, others are INS8080A.
Note 17: Pin 23 of the INS8228 must be tied to +12V througha1kΩresistor to generate the RST 7

instruction when an interrupt is acknowledged as required by the accompanying sample program.

FIGURE 12. ADC0801_INS8080A CPU Interface

ADC0801/ADC0802/ADC0803/ADC0804/ADC0805

www.national.com 26

Functional Description (Continued)

Note 18: The stack pointer must be dimensioned because a RST 7 instruction pushes the PC onto the stack.
Note 19: All address used were arbitrarily chosen.

The standard control bus signals of the 8080 CS, RD and
WR) can be directly wired to the digital control inputs of the
A/D and the bus timing requirements are met to allow both
starting the converter and outputting the data onto the data
bus. A bus driver should be used for larger microprocessor
systems where the data bus leaves the PC board and/or
must drive capacitive loads larger than 100 pF.

4.1.1 Sample 8080A CPU Interfacing Circuitry and
Program

The following sample program and associated hardware
shown in

Figure 12

may be used to input data from the
converter to the INS8080A CPU chip set (comprised of the
INS8080A microprocessor, the INS8228 system controller
and the INS8224 clock generator). For simplicity, the A/D is
controlled as an I/O device, specifically an 8-bit bi-directional
port located at an arbitrarily chosen port address, E0. The
TRI-STATE output capability of the A/D eliminates the need
for a peripheral interface device, however address decoding
is still required to generate the appropriate CS for the con­verter.

It is important to note that in systems where the A/D con­verter is 1-of-8 or less I/O mapped devices, no address
decoding circuitry is necessary. Each of the 8 address bits
(A0 to A7) can be directly used as CS inputs—one for each
I/O device.

4.1.2 INS8048 Interface

The INS8048 interface technique with the ADC0801 series
(see

Figure 13

) is simpler than the 8080A CPU interface.
There are 24 I/O lines and three test input lines in the 8048.
With these extra I/O lines available, one of the I/O lines (bit
0 of port 1) is used as the chip select signal to the A/D, thus
eliminating the use of an external address decoder. Bus
control signals RD, WR and INT of the 8048 are tied directly
to the A/D. The 16 converted data words are stored at
on-chip RAM locations from 20 to 2F(Hex). The RD andWR
signals are generated by reading from and writing into a
dummy address, respectively. Asample interface program is
shown below.

SAMPLE PROGRAM FOR

Figure 12

ADC0801–INS8080A CPU INTERFACE

DS005671-99

ADC0801/ADC0802/ADC0803/ADC0804/ADC0805

www.national.com27

Functional Description (Continued)

4.2 Interfacing the Z-80

The Z-80 control bus is slightly different from that of the

8080. General RD and WR strobes are provided and sepa­rate memory request, MREQ, and I/O request, IORQ, sig­nals are used which have to be combined with the general­ized strobes to provide the equivalent 8080 signals. An
advantage of operating the A/D in I/O space with the Z-80 is
that the CPU will automatically insert one wait state (the RD
and WR strobes are extended one clock period) to allow
more time for the I/O devices to respond. Logic to map the
A/D in I/O space is shown in

Figure 14

.

Additional I/O advantages exist as software DMA routines
are available and use can be made of the output data
transfer which exists on the upper 8 address lines (A8 to

DS005671-21

FIGURE 13. INS8048 Interface

SAMPLE PROGRAM FOR

Figure 13

INS8048 INTERFACE

DS005671-A0

DS005671-23

FIGURE 14. Mapping the A/D as an I/O Device

for Use with the Z-80 CPU

ADC0801/ADC0802/ADC0803/ADC0804/ADC0805

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Functional Description (Continued)

A15) during I/O input instructions. For example, MUX chan­nel selection for the A/D can be accomplished with this
operating mode.

4.3 Interfacing 6800 Microprocessor Derivatives
(6502, etc.)

The control bus for the 6800 microprocessor derivatives
does not use the RD and WR strobe signals. Instead it
employs a single R/W line and additional timing, if needed,
can be derived fom the φ2 clock. All I/O devices are memory
mapped in the 6800 system, and a special signal, VMA,
indicates that the current address is valid.

Figure 15

shows
an interface schematic where the A/D is memory mapped in
the 6800 system. For simplicity, the CS decoding is shown
using1⁄2DM8092. Note that in many 6800 systems, an
already decoded 4/5 line is brought out to the common bus
at pin 21. This can be tied directly to the CS pin of the A/D,
provided that no other devices are addressed at HX ADDR:
4XXX or 5XXX.

The followingsubroutine performsessentially the samefunc­tion asin the case ofthe 8080Ainterface and it canbe called
from anywhere in the user’s program.

In

Figure 16

the ADC0801 series is interfaced to the M6800
microprocessor through (the arbitrarily chosen) Port B of the
MC6820 or MC6821 Peripheral Interface Adapter, (PIA).
Here the CS pin of the A/D is grounded since the PIA is

already memory mapped in the M6800 system and no CS
decoding is necessary. Also notice that the A/D output data
lines are connected to the microprocessor bus under pro­gram control through the PIA and therefore the A/D RD pin
can be grounded.

Asample interface program equivalent to the previousone is
shown below

Figure 16

. The PIA Data and ControlRegisters
of Port B are located at HEX addresses 8006 and 8007,
respectively.

5.0 GENERAL APPLICATIONS

The following applications show some interesting uses for
the A/D. The fact that one particular microprocessor is used
is not meant to be restrictive. Each of these application
circuits would have its counterpart using anymicroprocessor
that is desired.

5.1 Multiple ADC0801 Series to MC6800 CPU Interface

To transfer analog data from several channels to a single
microprocessor system, a multiple converter scheme pre­sents several advantages over the conventional multiplexer
single-converter approach. With the ADC0801 series, the
differential inputs allow individual span adjustment for each
channel. Furthermore, all analog input channels are sensed
simultaneously, which essentially divides the microproces­sor’s total system servicing time by the number of channels,
since all conversions occur simultaneously. This scheme is
shown in

Figure 17

.

DS005671-24

Note 20: Numbers in parentheses refer to MC6800 CPU pin out.
Note 21: Number or letters in brackets refer to standard M6800 system common bus code.

FIGURE 15. ADC0801-MC6800 CPU Interface

ADC0801/ADC0802/ADC0803/ADC0804/ADC0805

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Functional Description (Continued)

Note 22: In order for the microprocessor to service subroutines and interrupts, the stack pointer must be dimensioned in the user’s program.

SAMPLE PROGRAM FOR

Figure 15

ADC0801-MC6800 CPU INTERFACE

DS005671-A1

DS005671-25

FIGURE 16. ADC0801–MC6820 PIA Interface

ADC0801/ADC0802/ADC0803/ADC0804/ADC0805

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Functional Description (Continued)

The following schematic and sample subroutine (DATA IN)
may be used to interface (up to) 8 ADC0801’s directly to the
MC6800 CPU. This scheme can easily be extended to allow
the interface of more converters. In this configuration the
converters are (arbitrarily) located at HEX address 5000 in
the MC6800 memory space. To save components, the clock
signal is derived from just one RC pair on the first converter.
This output drives the other A/Ds.

All the converters are started simultaneously with a STORE
instruction at HEX address 5000. Note that any other HEX
address of the form 5XXX will be decoded by the circuit,
pulling all the CS inputs low. This can easily be avoided by
using a more definitive address decoding scheme. All the
interrupts are ORed together to insure that all A/Ds have
completed their conversion before the microprocessor is
interrupted.

The subroutine, DATA IN, may be called from anywhere in
the user’s program. Once called, this routine initializes the

CPU, starts all the converters simultaneously and waits for
the interrupt signal. Upon receiving the interrupt, it reads the
converters (from HEX addresses 5000 through 5007) and
stores the data successively at (arbitrarily chosen) HEX
addresses 0200 to 0207, before returning to the user’s pro­gram. All CPU registers then recover the original data they
had before servicing DATA IN.

5.2 Auto-Zeroed Differential Transducer Amplifier
and A/D Converter

The differential inputs of the ADC0801 series eliminate the
need to perform a differential to single ended conversion for
a differential transducer. Thus, one op amp can be elimi­nated since the differential to single ended conversion is
provided by the differential input of the ADC0801 series. In
general, a transducer preamp is required to take advantage
of the full A/D converter input dynamic range.

SAMPLE PROGRAM FOR

Figure 16

ADC0801–MC6820 PIA INTERFACE

DS005671-A2

ADC0801/ADC0802/ADC0803/ADC0804/ADC0805

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Functional Description (Continued)

DS005671-26

Note 23: Numbers in parentheses refer to MC6800 CPU pin out.
Note 24: Numbers of letters in brackets refer to standard M6800 system common bus code.

FIGURE 17. Interfacing Multiple A/Ds in an MC6800 System

ADC0801/ADC0802/ADC0803/ADC0804/ADC0805

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Functional Description (Continued)

Note 25: In order for the microprocessor to service subroutines and interrupts, the stack pointer must be dimensioned in the user’s program.

For amplification ofDC input signals, a major system error is
the inputoffset voltage ofthe amplifiers used forthe preamp.

Figure 18

is a gain of 100 differential preamp whose offset
voltage errors will be cancelled by a zeroing subroutine
which is performed by the INS8080A microprocessor sys­tem. The total allowable input offset voltage error for this
preamp is only 50 µV for

1

⁄4LSB error. This would obviously
require very precise amplifiers.The expression for the differ­ential output voltage of the preamp is:

where IXis the current through resistor RX. All of the offset
error terms can be cancelled by making

±

IXRX=V

OS1

+

V

OS3

−V

OS2

. This is the principle of this auto-zeroing

scheme.
The INS8080A uses the 3 I/O ports of an INS8255 Progra-

mable Peripheral Interface (PPI) to control the auto zeroing
and input data from the ADC0801 as shown in

Figure 19

.
The PPIis programmed for basic I/Ooperation (mode 0)with
Port A being an input port and Ports B and C being output
ports. Two bitsof Port Care usedto alternately openor close
the 2 switches at the input of the preamp. Switch SW1 is
closed to force the preamp’s differential input to be zero
during the zeroing subroutine and then opened and SW2 is
then closed for conversion of the actual differential input
signal. Using 2 switches in this manner eliminates concern
for the ON resistance of the switches as they must conduct
only the input bias current of the input amplifiers.

Output Port B is used as a successive approximation regis­ter by the 8080 and the binary scaled resistors in series with
each output bit create a D/A converter. During the zeroing
subroutine, the voltage at V

x

increases or decreases as
required tomake the differentialoutput voltageequal to zero.
This is accomplished by ensuring that the voltage at the
output ofA1 is approximately 2.5V so that a logic “1” (5V) on

SAMPLE PROGRAM FOR

Figure 17

INTERFACING MULTIPLE A/D’s IN AN MC6800 SYSTEM

DS005671-A3

SAMPLE PROGRAM FOR

Figure 17

INTERFACING MULTIPLE A/D’s IN AN MC6800 SYSTEM

DS005671-A4

ADC0801/ADC0802/ADC0803/ADC0804/ADC0805

www.national.com33

Functional Description (Continued)

any output of Port B will source current into node V

X

thus

raising the voltage at V

X

and making the output differential
more negative. Conversely, a logic “0” (0V) will pull current
out of node V

X

and decrease the voltage, causing the differ­ential output to become more positive. For the resistor val­ues shown, V

X

can move±12 mV with a resolution of 50 µV,
which will null the offset error term to

1

⁄4LSB of full-scale for

theADC0801. It is importantthat the voltage levelsthat drive
the auto-zero resistors be constant. Also, for symmetry, a
logic swing of 0V to 5V is convenient. To achieve this, a
CMOS buffer is used for the logic output signals of Port B
and this CMOS package is poweredwith a stable 5Vsource.
Buffer amplifier A1 is necessary so that it can source or sink
the D/A output current.

DS005671-91

Note 26: R2 = 49.5 R1
Note 27: Switches are LMC13334 CMOS analog switches.
Note 28: The 9 resistors used in the auto-zero section can be

±

5% tolerance.

FIGURE 18. Gain of 100 Differential Transducer Preamp

ADC0801/ADC0802/ADC0803/ADC0804/ADC0805

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Functional Description (Continued)

Aflow chart for the zeroingsubroutine is shown in

Figure 20

.
It must be noted that the ADC0801 series will output an all
zero code when it converts anegative input [V

IN

(−) ≥ VIN(+)].
Also, a logic inversion exists as all of the I/O ports are
buffered with inverting gates.

Basically, if the data read is zero, the differential output
voltage is negative, so a bit in Port B is cleared to pull V

X

more negative which will make the output more positive for
the next conversion. If the data read is not zero, the output
voltage is positive so a bit in Port B is set to make V

X

more
positive and the output more negative. This continues for 8
approximations and the differential output eventually con­verges to within 5 mV of zero.

The actual program is given in

Figure 21

.All addresses used
are compatible with the BLC 80/10 microcomputer system.
In particular:

Port A and the ADC0801 are at port address E4
Port B is at port address E5
Port C is at port address E6
PPI control word port is at port address E7
Program Counter automatically goes toADDR:3C3D upon
acknowledgement of an interrupt from the ADC0801

5.3 Multiple A/D Converters in a Z-80 Interrupt
Driven Mode

In data acquisition systems where more than one A/D con­verter (or other peripheral device) will be interrupting pro­gram execution of a microprocessor, there is obviously a

need for the CPU to determine which device requires servic­ing.

Figure 22

and the accompanying software is a method
of determining which of 7 ADC0801 converters has com­pleted a conversion (INTR asserted) and is requesting an
interrupt. This circuit allows starting the A/D converters in
any sequence, but will input and store valid data from the
converters with a priority sequence of A/D 1 being read first,
A/D 2 second, etc., through A/D 7 which would have the
lowest priority for data being read. Only the converters
whose INT is asserted will be read.

The keyto decoding circuitry is the DM74LS373, 8-bitD type
flip-flop. When the Z-80 acknowledges the interrupt, the
program is vectored to a data input Z-80 subroutine. This
subroutine will read a peripheral status word from the
DM74LS373 which contains the logic state of the INTR
outputs of all the converters. Each converter which initiates
an interruptwill place a logic “0” in a unique bit positionin the
status word and the subroutine will determine the identity of
the converter and execute a data read. An identifier word
(which indicates which A/D the data came from) is stored in
the next sequential memory location above the location of
the data so the program can keep track of the identity of the
data entered.

DS005671-92

FIGURE 19. Microprocessor Interface Circuitry for Differential Preamp

ADC0801/ADC0802/ADC0803/ADC0804/ADC0805

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Functional Description (Continued)

DS005671-28

FIGURE 20. Flow Chart for Auto-Zero Routine

ADC0801/ADC0802/ADC0803/ADC0804/ADC0805

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Functional Description (Continued)

5.3 Multiple A/D Converters in a Z-80 Interrupt Driven
Mode (Continued)

The following notes apply:

•

It is assumed that the CPU automatically performs a RST
7 instruction when a valid interrupt is acknowledged
(CPU is in interrupt mode 1). Hence, the subroutine
starting address of X0038.

•

The address bus from the Z-80 and the data bus to the
Z-80 are assumed to be inverted by bus drivers.

•

A/D data and identifying words will be stored in sequen­tial memory locations starting at the arbitrarily chosen
address X 3E00.

•

The stack pointer must be dimensioned in the main pro­gram as the RST 7 instruction automatically pushes the
PC onto the stack and the subroutine uses an additional
6 stack addresses.

•

The peripherals of concern are mapped into I/O space
with the following port assignments:

DS005671-A5

Note 29: All numerical values are hexadecimal representations.

FIGURE 21. Software for Auto-Zeroed Differential A/D

ADC0801/ADC0802/ADC0803/ADC0804/ADC0805

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Functional Description (Continued)

HEX PORT ADDRESS PERIPHERAL

00 MM74C374 8-bit flip-flop
01 A/D 1
02 A/D 2
03 A/D 3

HEX PORT ADDRESS PERIPHERAL

04 A/D 4
05 A/D 5
06 A/D 6
07 A/D 7

This port address also serves as the A/D identifying word in
the program.

DS005671-29

FIGURE 22. Multiple A/Ds with Z-80 Type Microprocessor

ADC0801/ADC0802/ADC0803/ADC0804/ADC0805

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Functional Description (Continued)

DS005671-A6

ADC0801/ADC0802/ADC0803/ADC0804/ADC0805

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Physical Dimensions inches (millimeters) unless otherwise noted

SO Package (M)

Order Number ADC0802LCWM or ADC0804LCWM

NS Package Number M20B

Molded Dual-In-Line Package (N)

Order Number ADC0801LCN, ADC0802LCN,

ADC0803LCN, ADC0804LCN or ADC0805LCN

NS Package Number N20A

ADC0801/ADC0802/ADC0803/ADC0804/ADC0805

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Notes

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ADC0801/ADC0802/ADC0803/ADC0804/ADC0805 8-Bit µP Compatible A/D Converters

National does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and National reserves the right at any time without notice to change said circuitry and specifications.