1.8 V supply operation
Low power: 164 mW per channel at 125 MSPS
SNR = 76.5 dBFS at 70 MHz (2.0 V p-p input span)
SNR = 77.5 dBFS at 70 MHz (2.6 V p-p input span)
SFDR = 90 dBc (to Nyquist, 2.0 V p-p input span)
DNL = ±0.7 LSB; INL = ±3.5 LSB (2.0 V p-p input span)
Serial LVDS (ANSI-644, default) and low power, reduced
range option (similar to IEEE 1596.3)
650 MHz full power analog bandwidth
2 V p-p input voltage range (supports up to 2.6 V p-p)
Serial port control
Full chip and individual channel power-down modes
Flexible bit orientation
Built-in and custom digital test pattern generation
Multichip sync and clock divider
Programmable output clock and data alignment
Standby mode
APPLICATIONS
Medical ultrasound and MRI
High speed imaging
Quadrature radio receivers
Diversity radio receivers
Test equipment
GENERAL DESCRIPTION
The AD9653 is a quad, 16-bit, 125 MSPS analog-to-digital converter (ADC) with an on-chip sample-and-hold circuit
designed for low cost, low power, small size, and ease of use.
The product operates at a conversion rate of up to 125 MSPS
and is optimized for outstanding dynamic performance and low
power in applications where a small package size is critical.
The ADC requires a single 1.8 V power supply and LVPECL-/
CMOS-/LVDS-compatible sample rate clock for full performance
operation. No external reference or driver components are
required for many applications.
The ADC automatically multiplies the sample rate clock for the
appropriate LVDS serial data rate. A data clock output (DCO) for
capturing data on the output and a frame clock output (FCO)
for signaling a new output byte are provided. Individual-channel
power-down is supported and typically consumes less than 2 mW
when all channels are disabled. The ADC contains several features
designed to maximize flexibility and minimize system cost, such
FUNCTIONAL BLOCK DIAGRAM
VIN+A
VIN–A
VIN+B
VIN–B
RBIAS
VREF
AGND
VIN+C
VIN–C
VIN+D
VIN–D
VCM
PIPELINE
ADC
PIPELINE
ADC
REF
SELECT
PIPELINE
ADC
PIPELINE
ADC
SERIAL PORT
INTERFACE
CSB
SDIO/OLM
16
DIGITAL
SERIALIZER
16
DIGITAL
SERIALIZER
1V
AD9653
16
DIGITAL
SERIALIZER
16
DIGITAL
SERIALIZER
CLOCK
MANAGEMENT
CLK+
SYNC
SCLK/DTP
SERIAL
LVDS
SERIAL
LVDS
SERIAL
LVDS
SERIAL
LVDS
SERIAL
LVDS
SERIAL
LVDS
SERIAL
LVDS
SERIAL
LVDS
CLK–
Figure 1.
as programmable output clock and data alignment and digital
test pattern generation. The available digital test patterns
include built-in deterministic and pseudorandom patterns, along
with custom user-defined test patterns entered via the serial port
interface (SPI).
The AD9653 is available in a RoHS-compliant, 48-lead LFCSP.
It is specified over the industrial temperature range of −40°C to
+85°C. This product is protected by a U.S. patent.
D0+A
D0–A
D1+A
D1–A
D0+B
D0–B
D1+B
D1–B
FCO+
FCO–
D0+C
D0–C
D1+C
D1–C
D0+D
D0–D
D1+D
D1–D
DCO+
DCO–
10538-001
PRODUCT HIGHLIGHTS
1. Small Footprint.
Four ADCs are contained in a small, space-saving package.
2. Low power of 164 mW/channel at 125 MSPS with scalable
power options.
3. Pin compatible to the AD9253 14-bit quad and the AD9633
12-bit quad ADC.
4. Ease of Use.
A data clock output (DCO) operates at frequencies of up to
500 MHz and supports double data rate (DDR) operation.
5. User Flexibility.
The SPI control offers a wide range of flexible features to
meet specific system requirements.
responsi bility is as sumed by Anal og Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781.329.4700
www.analog.com
Page 2
AD9653 Data Sheet
TABLE OF CONTENTS
Features .............................................................................................. 1
AVDD = 1.8 V, DRVDD = 1.8 V, 2.0 V p-p full-scale differential input at −1.0 dBFS; V
Table 1.
Parameter1 Temperature Min Typ Max Unit
RESOLUTION 16 Bits
ACCURACY
No Missing Codes Full Guaranteed
Offset Error Full −0.49 −0.3 0.17 % FSR
Offset Matching Full −0.14 +0.2 0.39 % FSR
Gain Error Full −12.3 −5 2.37 % FSR
Gain Matching Full 1.0 1.1 5.8 % FSR
Differential Nonlinearity (DNL) Full
25°C ±0.7 LSB
Integral Nonlinearity (INL) Full
25°C ±3.5
TEMPERATURE DRIFT
Offset Error Full 3.5 ppm/°C
INTERNAL VOLTAGE REFERENCE
Output Voltage (1.0 V Mode) Full 0.98 1.0 1.01 V
Load Regulation at 1.0 mA (V
= 1.0 V) Full 2 mV
Input Resistance 25°C 7.5 kΩ
INPUT-REFERRED NOISE
V
= 1.0 V 25°C 2.7 LSB rms
ANALOG INPUTS
Differential Input Voltage (V
= 1.0 V) Full 2 V p-p
Common-Mode Voltage Full 0.9 V
Common-Mode Range 25°C 0.5 1.3 V
Differential Input Resistance 25°C 2.6 kΩ
Differential Input Capacitance 25°C 7 pF
POWER SUPPLY
AVDD Full 1.7 1.8 1.9 V
DRVDD Full 1.7 1.8 1.9 V
2
I
Full 305 330 mA
I
(ANSI-644 Mode)2 Full 60 64 mA
I
(Reduced Range Mode)2 25°C 45
TOTAL POWER CONSUMPTION
DC Input Full 607 649 mW
Sine Wave Input (Four Channels Including Output Drivers, ANSI-644 Mode) Full 657 708 mW
Sine Wave Input (Four Channels Including Output Drivers, Reduced Range Mode) 25°C 630 mW
Power-Down 25°C 2 mW
Standby3 Full 356 392 mW
1
See the AN-835 Application Note, Understanding High Speed ADC Testing and Evaluation, for definitions and for details on how these tests were completed.
2
Measured with a low input frequency, full-scale sine wave on all four channels.
3
Can be controlled via the SPI.
= 1.0 V, DCS off, unless otherwise noted.
REF
0.77
0.95 LSB
7.26
8.18 LSB
LSB
mA
Rev. 0 | Page 3 of 40
Page 4
AD9653 Data Sheet
INTERNAL VOLTAGE REFERENCE
REF
REF
REF
AVDD
25°C 1.8 V
DRVDD
25°C 1.8 V
AVDD
2
DRVDD
DRVDD
AVDD = 1.8 V, DRVDD = 1.8 V, 2.6 V p-p full-scale differential input at −1.0 dBFS; V
Table 2.
Parameter1 Temperature Min Ty p Max Unit
RESOLUTION 16 Bits
ACCURACY
No Missing Codes 25°C Guaranteed
Offset Error 25°C −0.3 % FSR
Offset Matching 25°C +0.2 % FSR
Gain Error 25°C −5 % FSR
Gain Matching 25°C 1.1 % FSR
Differential Nonlinearity (DNL) 25°C
Integral Nonlinearity (INL) 25°C
TEMPERATURE DRIFT
Offset Error 25°C 3.5 ppm/°C
Output Voltage (1.3 V Programmable Mode) 25°C 1.3 V
Load Regulation at 1.0 mA (V
= 1.3 V) 25°C 6.5 mV
Input Resistance 25°C 7.5 kΩ
INPUT-REFERRED NOISE
V
= 1.3 V 25°C 2.1 LSB rms
ANALOG INPUTS
Differential Input Voltage (V
= 1.3 V) 25°C 2.6 V p-p
Common-Mode Voltage 25°C 0.9 V
Common-Mode Range 25°C 0.6 1.3 V
Differential Input Resistance 25°C 2.6 kΩ
Differential Input Capacitance 25°C 7 pF
DC Input 25°C 614 mW
Sine Wave Input (Four Channels Including Output Drivers, ANSI-644 Mode) 25°C 673 mW
Sine Wave Input (Four Channels Including Output Drivers, Reduced Range Mode) 25°C 646 mW
Power-Down 25°C 2 mW
Standby3 25°C 371 mW
1
See the AN-835 Application Note, Understanding High Speed ADC Testing and Evaluation, for definitions and for details on how these tests were completed.
2
Measured with a low input frequency, full-scale sine wave on all four channels.
3
Can be controlled via the SPI.
Rev. 0 | Page 4 of 40
Page 5
Data Sheet AD9653
fIN = 128 MHz
25°C 73.9 dBFS
fIN = 200 MHz
25°C 71.5 dBFS
fIN = 70 MHz
Full
12.1
12.4 Bits
fIN = 128 MHz
25°C 11.9 Bits
fIN = 70 MHz
Full
−78
−89 dBc
IN1
IN2
87
AVDD
25°C 31 dB
ANALOG INPUT BANDWIDTH, FULL POWER
25°C 650 MHz
AC SPECIFICATIONS
AVDD = 1.8 V, DRVDD = 1.8 V, 2.0 V p-p full-scale differential input at −1.0 dBFS; V
Table 3.
Parameter1 Temperature Min Typ Max Unit
SIGNAL-TO-NOISE RATIO (SNR)
fIN = 9.7 MHz 25°C 78 dBFS
fIN = 15 MHz 25°C 77.8 dBFS
fIN = 70 MHz Full 75.5 76.5 dBFS
SIGNAL-TO-NOISE-AND-DISTORTION RATIO (SINAD)
fIN = 9.7 MHz 25°C 78 dBFS
fIN = 15 MHz 25°C 77.7 dBFS
fIN = 70 MHz Full 74.6 76.1 dBFS
fIN = 128 MHz 25°C 73.6 dBFS
fIN = 200 MHz 25°C 70.3 dBFS
EFFECTIVE NUMBER OF BITS (ENOB)
fIN = 9.7 MHz 25°C 12.7 Bits
fIN = 15 MHz 25°C 12.6 Bits
= 1.0 V, DCS off, unless otherwise noted.
REF
fIN = 200 MHz 25°C 11.4 Bits
SPURIOUS-FREE DYNAMIC RANGE (SFDR)
fIN = 9.7 MHz 25°C 96 dBc
fIN = 15 MHz 25°C 93 dBc
fIN = 70 MHz Full 78 89 dBc
fIN = 128 MHz 25°C 87 dBc
fIN = 200 MHz 25°C 77 dBc
WORST HARMONIC (SECOND OR THIRD)
fIN = 9.7 MHz 25°C −98 dBc
fIN = 15 MHz 25°C −93 dBc
fIN = 128 MHz 25°C −87 dBc
fIN = 200 MHz 25°C −77 dBc
WORST OTHER HARMONIC OR SPUR
fIN = 9.7 MHz 25°C −96 dBc
fIN = 15 MHz 25°C −98
fIN = 70 MHz Full −85 −94 dBc
fIN = 128 MHz 25°C −89 dBc
fIN = 200 MHz 25°C −83 dBc
TWO-TONE INTERMODULATION DISTORTION (IMD)—AIN1 AND AIN2 = −7.0 dBFS
f
= 70.5 MHz, f
CROSSTALK2 25°C
CROSSTALK (OVERRANGE CONDITION)3 25°C
= 72.5 MHz 25°C −90 dBc
91
dB
dB
POWER SUPPLY REJECTION RATIO (PSRR)4
dBc
DRVDD 25°C 79 dB
1
See the AN-835 Application Note, Understanding High Speed ADC Testing and Evaluation, for definitions and for details on how these tests were completed.
2
Crosstalk is measured at 70 MHz with −1.0 dBFS analog input on one channel and no input on the adjacent channel.
3
Overrange condition is defined as the input being 3 dB above full scale.
4
PSRR is measured by injecting a sinusoidal signal at 10 MHz to the power supply pin and measuring the output spur on the FFT. PSRR is calculated as the ratio of the
amplitudes of the spur voltage over the pin voltage, expressed in decibels.
Rev. 0 | Page 5 of 40
Page 6
AD9653 Data Sheet
IN1
IN2
AVDD = 1.8 V, DRVDD = 1.8 V, 2.6 V p-p full-scale differential input at −1.0 dBFS; V
noted.
Table 4.
Parameter1 Temperature Min Ty p Max Unit
SIGNAL-TO-NOISE RATIO (SNR)
fIN = 9.7 MHz 25°C 80 dBFS
fIN = 15 MHz 25°C 79.4 dBFS
fIN = 70 MHz 25°C 77.5 dBFS
fIN = 128 MHz 25°C 74.4 dBFS
fIN = 200 MHz 25°C 71.7 dBFS
SIGNAL-TO-NOISE-AND-DISTORTION RATIO (SINAD)
fIN = 9.7 MHz 25°C 79.8 dBFS
fIN = 15 MHz 25°C 79.2 dBFS
fIN = 70 MHz 25°C 76.1 dBFS
fIN = 128 MHz 25°C 74 dBFS
fIN = 200 MHz 25°C 69.9 dBFS
EFFECTIVE NUMBER OF BITS (ENOB)
fIN = 9.7 MHz 25°C 13 Bits
fIN = 15 MHz 25°C 12.9 Bits
fIN = 70 MHz 25°C 12.3 Bits
fIN = 128 MHz 25°C 12 Bits
fIN = 200 MHz 25°C 11.3 Bits
SPURIOUS-FREE DYNAMIC RANGE (SFDR)
fIN = 9.7 MHz 25°C 94 dBc
fIN = 15 MHz 25°C 94 dBc
fIN = 70 MHz 25°C 82 dBc
fIN = 128 MHz 25°C 86 dBc
fIN = 200 MHz 25°C 75 dBc
WORST HARMONIC (SECOND OR THIRD)
fIN = 9.7 MHz 25°C −94 dBc
fIN = 15 MHz 25°C −94 dBc
fIN = 70 MHz 25°C −82 dBc
fIN = 128 MHz 25°C −87 dBc
fIN = 200 MHz 25°C −75 dBc
WORST OTHER HARMONIC OR SPUR
fIN = 9.7 MHz 25°C −100 dBc
fIN = 15 MHz 25°C −99 dBc
fIN = 70 MHz 25°C −96 dBc
fIN = 128 MHz 25°C −86 dBc
fIN = 200 MHz 25°C −84 dBc
TWO-TONE INTERMODULATION DISTORTION (IMD)—AIN1 AND AIN2 = −7.0 dBFS
f
= 70.5 MHz, f
= 72.5 MHz 25°C −90 dBc
CROSSTALK2 25°C 91 dB
CROSSTALK (OVERRANGE CONDITION)3 25°C 87 dB
POWER SUPPLY REJECTION RATIO (PSRR)4
AVDD 25°C 31 dB
DRVDD 25°C 79 dB
ANALOG INPUT BANDWIDTH, FULL POWER 25°C 650 MHz
1
See the AN-835 Application Note, Understanding High Speed ADC Testing and Evaluation, for definitions and for details on how these tests were completed.
2
Crosstalk is measured at 70 MHz with −1.0 dBFS analog input on one channel and no input on the adjacent channel.
3
Overrange condition is defined as the input being 3 dB above full scale.
4
PSRR is measured by injecting a sinusoidal signal at 10 MHz to the power supply pin and measuring the output spur on the FFT. PSRR is calculated as the ratio of the
amplitudes of the spur voltage over the pin voltage, expressed in decibels.
Logic Compliance CMOS/LVDS/LVPECL
Differential Input Voltage2 Full 0.2 3.6 V p-p
Input Voltage Range Full AGND − 0.2 AVDD + 0.2 V
Input Common-Mode Voltage Full 0.9 V
Input Resistance (Differential) 25°C 15 kΩ
Input Capacitance 25°C 4 pF
LOGIC INPUTS (PDWN, SYNC, SCLK)
Logic 0 Voltage Full 0 0.8 V
Input Resistance 25°C 30 kΩ
Input Capacitance 25°C 2 pF
LOGIC INPUT (CSB)
Logic 1 Voltage Full 1.2 AVDD + 0.2 V
Logic 0 Voltage Full 0 0.8 V
Input Resistance 25°C 26 kΩ
Input Capacitance 25°C 2 pF
Logic 1 Voltage (IOH = 800 μA) Full 1.79 V
Logic 0 Voltage (IOL = 50 μA) Full 0.05 V
DIGITAL OUTPUTS (D0±x, D1±x), ANSI-644
Logic Compliance LVDS
Differential Output Voltage (VOD) Full 290 345 400 mV
Output Offset Voltage (VOS) Full 1.15 1.25 1.35 V
Output Coding (Default) Twos complement
DIGITAL OUTPUTS (D0±x, D1±x), LOW POWER,
REDUCED SIGNAL OPTION
Logic Compliance LVDS
Differential Output Voltage (VOD) Full 160 200 230 mV
Output Offset Voltage (VOS) Full 1.15 1.25 1.35 V
Output Coding (Default) Twos complement
1
See the AN-835 Application Note, Understanding High Speed ADC Testing and Evaluation, for definitions and for details on how these tests were completed.
2
This is specified for LVDS and LVPECL only.
3
This is specified for 13 SDIO/OLM pins sharing the same connection.
See the AN-835 Application Note, Understanding High Speed ADC Testing and Evaluation, for definitions and for details on how these tests were completed.
2
Measured on standard FR-4 material.
3
Can be adjusted via the SPI. The conversion rate is the clock rate after the divider.
4
t
/16 is based on the number of bits in two LVDS data lanes. t
SAMPLE
5
Wake-up time is defined as the time required to return to normal operation from power-down mode.
SAMPLE
= 1/fS.
Clock cycles
Clock cycles
Rev. 0 | Page 8 of 40
Page 9
Data Sheet AD9653
SSYNC
HSYNC
CLK
HIGH
LOW
D0–A
D0+A
D1–A
D1+A
FCO–
BYTEWISE
MODE
FCO+
D0–A
D0+A
D1–A
D1+A
FCO–
DCO
DCO+
CLK+
VIN±x
CLK–
DCO–
FCO+
BITWISE
MODE
SDR
DDR
10538-002
MSB
N – 17
D14
N – 17
D13
N – 17
D12
N – 17
D11
N – 17
D10
N – 17
D09
N – 17
D08
N – 17
MSB
N – 16
D14
N – 16
D13
N – 16
D12
N – 16
D11
N – 16
D10
N – 16
D09
N – 16
D08
N – 16
D07
N – 17
D06
N – 17
D05
N – 17
D04
N – 17
D03
N – 17
D02
N – 17
D01
N – 17
LSB
N – 17
D07
N – 16
D06
N – 16
D05
N – 16
D04
N – 16
D03
N – 16
D02
N – 16
D01
N – 16
LSB
N – 16
MSB
N – 17
D13
N – 17
D11
N – 17
D09
N – 17
D07
N – 17
D05
N – 17
D03
N – 17
D01
N – 17
MSB
N – 16
D13
N – 16
D11
N – 16
D09
N – 16
D07
N – 16
D05
N – 16
D03
N – 16
D01
N – 16
D14
N – 17
D12
N – 17
D10
N – 17
D08
N – 17
D06
N – 17
D04
N – 17
D02
N – 17
LSB
N – 17
D14
N – 16
D12
N – 16
D10
N – 16
D08
N – 16
D06
N – 16
D04
N – 16
D02
N – 16
LSB
N – 16
t
A
t
DATA
t
LD
t
EH
t
FCO
t
FRAME
t
PD
t
CPD
t
EL
N – 1
N
N + 1
TIMING SPECIFICATIONS
Table 7.
Parameter Description Limit
SYNC TIMING REQUIREMENTS
t
SYNC to rising edge of CLK+ setup time 0.24 ns typ
t
SYNC to rising edge of CLK+ hold time 0.40 ns typ
SPI TIMING REQUIREMENTS See Figure 75
tDS Setup time between the data and the rising edge of SCLK 2 ns min
tDH Hold time between the data and the rising edge of SCLK 2 ns min
t
Period of the SCLK 40 ns min
tS Setup time between CSB and SCLK 2 ns min
tH Hold time between CSB and SCLK 2 ns min
t
SCLK pulse width high 10 ns min
t
SCLK pulse width low 10 ns min
t
Time required for the SDIO pin to switch from an input to an output relative to the
EN_SDIO
10 ns min
SCLK falling edge (not shown in Figure 75)
t
Time required for the SDIO pin to switch from an output to an input relative to the
DIS_SDIO
10 ns min
SCLK rising edge (not shown in Figure 75)
Timing Diagrams
Refer to the Memory Map Register Descriptions section and Table 23 for SPI register settings.
−0.3 V to +2.0 V
(D0±x, D1±x, DCO+, DCO−, FCO+,
FCO−) to AGND
VIN+x, VIN−x to AGND −0.3 V to +2.0 V
SCLK/DTP, SDIO/OLM, CSB to AGND −0.3 V to +2.0 V
SYNC, PDWN to AGND −0.3 V to +2.0 V
RBIAS to AGND −0.3 V to +2.0 V
VREF, SENSE to AGND −0.3 V to +2.0 V
Environmental
Operating Temperature
Range (Ambient, V
Operating Temperature
Range (Ambient, V
Maximum Junction
= 1.0 V)
= 1.3 V)
−40°C to +85°C
0°C to 85°C
150°C
Temperature
Lead Temperature
300°C
(Soldering, 10 sec)
Storage Temperature
−65°C to +150°C
Range (Ambient)
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
THERMAL RESISTANCE
Table 9. Thermal Resistance
Air Flow
Package Type
Velocity
(m/sec)
θ
1
θ
Unit
48-Lead LFCSP 0.0 23.7 7.8 7.1 °C/W
7 mm × 7 mm 1.0 20.0 N/A N/A °C/W
(CP-48-13) 2.5 18.7 N/A N/A °C/W
1
θJA for a 4-layer PCB with solid ground plane (simulated). Exposed pad
soldered to PCB.
ESD CAUTION
Rev. 0 | Page 11 of 40
Page 12
AD9653 Data Sheet
21, 22
D1−B, D1+B
Channel B Digital Outputs.
35
VIN−A
ADC A Analog Input Complement.
36 VIN+A
ADC A Analog Input True.
SENSE
D
NOTES
1. THE EXPOSED THERMAL PAD ON THE BOTTOM OF THE
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
VIN+C
48
1
VIN+D
2
VIN–D
3
AVDD
4
AVDD
5
CLK–
6
CLK+
7
AVDD
8
RVDD
9
D1–D
10
D1+D
11
D0–D
12
D0+D
13
D1–C
PACKAGE PROV IDES THE ANALOG GROUND FOR THE PART.
THIS EXP OSED PAD MUST BE CONNECTED TO GROUND FOR
PROPER OP E RATION.
VIN–C
AVDD
AVDD
SYNC
47
46
45
44
AD9653
TOP VIEW
(Not to S cale)
17
16
14
15
D0–C
D0+C
D1+C
DCO–
VCM
43
18
DCO+
Figure 6. 48-Lead LFCSP Pin Configuration, Top View
Table 10. Pin Function Descriptions
Pin No. Mnemonic Description
0 AGND,
Exposed Pad
1
2
VIN+D ADC D Analog Input True.
VIN−D ADC D Analog Input Complement.
Analog Ground, Exposed Pad. The exposed thermal pad on the bottom of the package provides the
analog ground for the part. This exposed pad must be connected to ground for proper operation.
3, 4, 7, 34, 39, 45, 46 AVDD 1.8 V Analog Supply Pins.
5, 6
8, 29
9, 10
CLK−, CLK+ Differential Encode Clock. PECL, LVDS, or 1.8 V CMOS inputs.
DRVDD Digital Output Driver Supply.
D1−D, D1+D Channel D Digital Outputs.
11, 12 D0−D, D0+D Channel D Digital Outputs.
13, 14
15, 16
17, 18
19, 20
D1−C, D1+C Channel C Digital Outputs.
D0−C, D0+C Channel C Digital Outputs.
DCO−, DCO+ Data Clock Outputs.
FCO−, FCO+ Frame Clock Outputs.
VREF
42
19
FCO–
41
20
FCO+
AVDD
RBIAS
39
40
22
21
D1–B
D1+B
VIN+B
VIN–B
37
38
24
23
D0–B
D0+B
36
VIN+A
VIN–A
35
AVDD
34
PDWN
33
32
CSB
SDIO/OLM
31
SCLK/DTP
30
DRVDD
29
28
D0+A
D0–A
27
D1+A
26
25
D1–A
10538-006
23, 24
D0−B, D0+B Channel B Digital Outputs.
25, 26 D1−A, D1+A Channel A Digital Outputs.
27, 28 D0−A, D0+A Channel A Digital Outputs.
30
31
32
33
37
38 VIN−B ADC B Analog Input Complement.
40
41
42
43
SCLK/DTP SPI Clock Input/Digital Test Pattern.
SDIO/OLM SPI Data Input and Output Bidirectional SPI Data/Output Lane Mode.
CSB SPI Chip Select Bar. Active low enable; 30 kΩ internal pull-up.
PDWN Digital Input, 30 kΩ Internal Pull-Down.
VIN+B ADC B Analog Input True.
RBIAS Sets Analog Current Bias. Connect to 10 kΩ (1% tolerance) resistor to ground.
SENSE Reference Mode Selection.
VREF Voltage Reference Input and Output.
VCM Analog Input Common-Mode Voltage.
PDWN high = power-down device.
PDWN low = run device, normal operation.
Rev. 0 | Page 12 of 40
Page 13
Data Sheet AD9653
Pin No. Mnemonic Description
44
47
48
SYNC Digital Input. SYNC input to clock divider.
VIN−C ADC C Analog Input Complement.
VIN+C ADC C Analog Input True.
Rev. 0 | Page 13 of 40
Page 14
AD9653 Data Sheet
0
–30
–60
–15
–45
–75
–90
–105
–120
–135
012
+
2
3
4
5
6
18624303642486054
AMPLITUDE (dBFS)
FREQUENCY (MHz)
125MSPS
9.7MHz AT –1d BFS
SNR = 77.1dB (78.1dBFS)
SFDR = 96.8d Bc
10538-007
+
2
3
4
0
–30
–60
–15
–45
–75
–90
–105
–120
–135
01218624303642486054
AMPLITUDE (dBFS)
FREQUENCY (MHz)
125MSPS
15MHZ AT –1dBFS
SNR = 76.8dB (77.8dBFS)
SFDR = 95.2d Bc
5
6
10538-008
0
AMPLITUDE (dBFS)
10538-009
0
–30
–60
–15
–45
–75
–90
–105
–120
–135
012
+
2
3
4
5
6
18624303642486054
AMPLITUDE (dBFS)
FREQUENCY (MHz)
125MSPS
70MHz AT –1dBF S
SNR = 75.6dB (76.6dBFS)
SFDR = 85.5d Bc
10538-010
0
–30
–60
–15
–45
–75
–90
–105
–120
–135
012
+
2
3
4
5
6
18624303642486054
AMPLITUDE (dBFS)
FREQUENCY (MHz)
125MSPS
128MHz AT –1dBF S
SNR = 73.2dB (74.2dBFS)
SFDR = 86.6d Bc
10538-011
0
–30
–60
–15
–45
–75
–90
–105
–120
–135
012
+
2
3
4
5
6
18624303642486054
AMPLITUDE (dBFS)
FREQUENCY (MHz)
125MSPS
200.5MHz AT –1d BFS
SNR = 70.7dB (71.7dBFS)
SFDR = 76.6d Bc
10538-012
TYPICAL PERFORMANCE CHARACTERISTICS
V
= 1.0 V
REF
Figure 7. Single-Tone 16k FFT with fIN = 9.7 MHz,
f
= 125 MSPS, V
SAMPLE
Figure 8. Single-Tone 16k FFT with fIN = 15 MHZ,
f
= 125 MSPS, V
SAMPLE
–15
–30
–45
–60
–75
2
–90
–105
–120
–135
Figure 9. Single-Tone 16k FFT with fIN = 64 MHz, f
4
6
01218624303642486054
= 1.0 V
REF
= 1.0 V
REF
125MSPS
64MHz AT –1dBF S
SNR = 75.7dB (76.7dBFS)
SFDR = 87.2d Bc
FREQUENCY (MHz)
V
= 1.0 V
REF
Figure 10. Single-Tone 16k FFT with fIN = 70 MHz,
f
= 125 MSPS, V
SAMPLE
= 1.0 V
REF
Figure 11. Single-Tone 16k FFT with fIN = 128 MHz,
f
= 125 MSPS, V
SAMPLE
3
5
+
= 125 MSPS,
SAMPLE
Figure 12. Single-Tone 16k FFT with fIN = 200.5 MHz at f
V
REF
= 1.0 V
= 1.0 V
REF
= 125 MSPS,
SAMPLE
Rev. 0 | Page 14 of 40
Page 15
Data Sheet AD9653
–20
0
20
40
60
80
100
120
–100 –90 –80 –70 –60 –50 –40 –30 –20 –100
SNR/SFDR (dBFS/dBc)
INPUT AMPLITUDE (dBFS)
10538-013
SFDRFS
SNRFS
SFDR
SNR
0
–30
–60
–15
–45
–75
–90
–105
–120
–135
012
F2 – F1
F1 + F2
+
2F2 + F1
2F1 + F2
F2 – F1
2F1 – F2
18624303642486054
AMPLITUDE (dBFS)
FREQUENCY (MHz)
10538-014
IMD3 (dBc)
–120
–100
–80
–60
–40
–20
0
–90–70–50–30–10
SFDR/IMD3(dBc/dBFS)
INPUT AMPLITUDE (dBFS)
IMD3 (dBFS)
SFDR (dBFS)
SFDR (dBc)
10538-015
0
20
40
60
80
100
120
020406080100 120 140 160 180 200
SNR/SFDR (dBFS/dBc)
INPUT FRE QUENCY (MHz)
SNR (dBFS)
SFDR (dBc)
10538-016
70
75
80
85
90
95
100
–40–20020406080
SNR/SFDR(dBFS/dBc)
TEMPERATURE (C)
SFDR (dBc)
SNR (dBFS)
10538-017
INL (LSB)
OUTPUT CODE
Figure 13. SNR/SFDR vs. Input Amplitude (AIN), fIN = 9.7 MHz,
f
= 125 MSPS, V
SAMPLE
Figure 14. Two-Tone 16k FFT with f
f
= 125 MSPS, V
SAMPLE
= 1.0 V
REF
= 70.5 MHz and f
IN1
= 1.0 V
REF
IN2
= 72.5 MHz,
Figure 16. SNR/SFDR vs. fIN, f
Figure 17. SNR/SFDR vs. Temperature, fIN = 9.7 MHz,
f
SAMPLE
4.5
3.0
= 125 MSPS, Clock Divider = 8, V
SAMPLE
= 125 MSPS, V
= 1.0 V
REF
= 1.0 V
REF
Figure 15. Two-Tone SFDR/IMD3 vs. Input Amplitude (AIN) with
f
= 70.5 MHz and f
IN1
= 72.5 MHz, f
IN2
= 125 MSPS, V
SAMPLE
1.5
0
–1.5
–3.0
–4.5
0
6000
12000
18000
24000
30000
36000
42000
48000
54000
= 1.0 V
REF
Figure 18. INL, fIN = 9.7 MHz, f
= 125 MSPS, V
SAMPLE
= 1.0 V
REF
60000
10538-018
Rev. 0 | Page 15 of 40
Page 16
AD9653 Data Sheet
0
DNL (LSB)
OUTPUT CODE
–0.8
–0.6
–0.4
–0.2
0
0.2
0.4
0.8
0.6
6000
12000
18000
24000
30000
36000
42000
48000
54000
60000
10538-019
0
20000
40000
60000
80000
100000
120000
140000
160000
N – 12
N – 11
N – 10
N – 9
N – 8
N – 7
N – 6
N – 5
N – 4
N – 3
N – 2
N – 1
N
N + 1
N + 2
N + 3
N + 4
N + 5
N + 6
N + 7
N + 8
N + 9
N + 10
N + 11
N + 12
N + 13
NUMBER OF HI TS
CODE
10538-020
2.7 LSB RMS
0
10
20
30
40
50
60
70
80
90
100
11070
PSRR (dB)
FREQUENCY (MHz)
DRVDD
AVDD
10538-021
0
20
40
60
80
100
20406080100120
SNR/SFDR (dBFS/dBc)
SAMPLE RATE (MSPS)
10538-022
SFDR (dBc)
SNR (dBFS)
0
20
40
60
80
100
20406080100120
SNR/SFDR (dBFS/dBc)
SAMPLE RATE (MSPS)
10538-023
SNR (dBFS)
SFDR (dBc)
Figure 19. DNL, fIN = 9.7 MHz, f
SAMPLE
Figure 20. Input-Referred Noise Histogram, f
= 125 MSPS, V
= 125 MSPS, V
SAMPLE
= 1.0 V
REF
= 1.0 V
REF
Figure 22. SNR/SFDR vs. Sample Rate, fIN = 9.7 MHz, V
= 1.0 V
REF
Figure 23. SNR/SFDR vs. Sample Rate, fIN = 64 MHz, Clock Divider = 4, V
1.0 V
=
REF
Figure 21. PSRR vs. Frequency, f
SAMPLE
= 125 MSPS, V
REF
= 1.0 V
Rev. 0 | Page 16 of 40
Page 17
Data Sheet AD9653
0
–30
–60
–15
–45
–75
–90
–105
–120
–135
012
+
2
3
4
5
6
18624303642486054
AMPLITUDE (dBFS)
FREQUENCY (MHz)
125MSPS
9.7MHz AT –1d BFS
SNR = 79.1dB (80.1dBFS)
SFDR = 93.5d Bc
10538-024
0
–30
–60
–15
–45
–75
–90
–105
–120
–135
012
+
2
3
4
5
6
18624303642486054
AMPLITUDE (dBFS)
FREQUENCY (MHz)
125MSPS
15MHz AT –1dBF S
SNR = 78.3dB (79.3dBFS)
SFDR = 94.5d Bc
10538-025
0
AMPLITUDE (dBFS)
0
AMPLITUDE (dBFS)
0
AMPLITUDE (dBFS)
0
AMPLITUDE (dBFS)
FREQUENCY (MHz)
V
= 1.3 V
REF
125MSPS
–15
70MHz AT –1dBF S
SNR = 76.7dB (77.7dBFS)
–30
SFDR = 82.1d Bc
–45
–60
Figure 24. Single-Tone 16k FFT with fIN = 9.7 MHz,
f
= 125 MSPS, V
SAMPLE
= 1.3 V
REF
–75
–90
–105
–120
–135
012
2
+
5
18624303642486054
FREQUENCY (MHz)
Figure 27. Single-Tone 16k FFT with fIN = 70 MHz,
f
= 125 MSPS, V
SAMPLE
3
4
REF
6
10538-027
= 1.3 V
Figure 25. Single-Tone 16k FFT with fIN = 15 MHZ,
f
SAMPLE
125MSPS
–15
64MHz AT –1dBF S
SNR = 76.9dB (77.9dBFS)
–30
SFDR = 82.6d Bc
–45
–60
–75
2
–90
–105
–120
–135
4
6
012
Figure 26. Single-Tone 16k FFT with fIN = 64 MHz,
f
SAMPLE
= 125 MSPS, V
18624303642486054
FREQUENCY (MHz)
= 125 MSPS, V
= 1.3 V
REF
= 1.3 V
REF
–15
–30
–45
–60
–75
–90
–105
–120
–135
125MSPS
128MHz AT –1dBF S
SNR = 73.5dB (74.5dBFS)
SFDR = 86.7d Bc
2
3
012
5
6
4
18624303642486054
FREQUENCY (MHz)
+
10538-028
Figure 28. Single-Tone 16k FFT with fIN = 128 MHz,
f
= 125 MSPS, V
SAMPLE
–15
–30
–45
–60
3
+
5
10538-026
–75
–90
–105
–120
–135
125MSPS
200.5MHz AT –1d BFS
SNR = 71.1dB (72.1dBFS)
SFDR = 73.7d Bc
5
012
3
2
18624303642486054
= 1.3 V
REF
+
6
4
10538-029
Figure 29. Single-Tone 16k FFT with fIN = 200.5 MHz,
f
= 125 MSPS, V
SAMPLE
= 1.3 V
REF
Rev. 0 | Page 17 of 40
Page 18
AD9653 Data Sheet
0
–30
–60
–15
–45
–75
–90
–105
–120
–135
8
+
2
3
124016202428323640
AMPLITUDE (dBFS)
FREQUENCY (MHz)
80MSPS
15MHz AT –1dBF S
SNR = 79.0dB (80.0dBFS)
SFDR = 90.5d Bc
10538-030
6
4
5
0
–30
–60
–15
–45
–75
–90
–105
–120
–135
8
+
2
3
124016202428323640
AMPLITUDE (dBFS)
FREQUENCY (MHz)
80MSPS
15MHz AT –1dBF S
SNR = 76.7dB (77.7dBFS)
SFDR = 82.1d Bc
10538-031
6
4
5
120
SNR/SFDR (dBFS/dBc)
10538-032
0
–30
–60
–15
–45
–75
–90
–105
–120
–135
012
F2 – F1
F1 + F2
+
2F2 + F1
2F1 + F2
2F2 – F1
2F1 – F2
18624303642486054
AMPLITUDE (dBFS)
FREQUENCY (MHz)
10538-033
IMD3 (dBc)
–120
–100
–80
–60
–40
–20
0
–90–70–50–30–10
SFDR/IM D3 ( dBc/dBFS)
INPUT AMPLITUDE (dBFS)
IMD3 (dBFS)
SFDR (dBFS)
SFDR (dBc)
10538-034
0
10
20
30
40
50
60
70
80
90
100
020406080100 120 140 160 180 200
SNR/SFDR (dBFS/dBc)
INPUT FRE QUENCY (MHz)
SFDR (dBc)
SNR (dBFS)
10538-035
Figure 30. Single-Tone 16k FFT with fIN = 15 MHz,
f
= 80 MSPS, V
SAMPLE
= 1.3 V
REF
Figure 31. Single-Tone 16k FFT with fIN = 64.5 MHz,
f
100
= 80 MSPS, V
SAMPLE
SFDRFS
80
60
40
SNRFS
SFDR
= 1.3 V
REF
Figure 33. Two-Tone 16k FFT with f
f
= 125 MSPS, V
SAMPLE
= 70.5 MHz and f
IN1
= 1.3 V
REF
= 72.5 MHz,
IN2
Figure 34. Two-Tone SFDR/IMD3 vs. Input Amplitude (AIN) with
f
= 70.5 MHz and f
IN1
= 72.5 MHz, f
IN2
= 125 MSPS, V
SAMPLE
REF
= 1.3 V
20
0
–20
–100 –90 –80 –70 –60 –50 –40 –30 –20 –100
Figure 32. SNR/SFDR vs. Input Amplitude (AIN), fIN = 9.7 MHz,
SNR
INPUT AMPLITUDE (dBFS)
f
= 125 MSPS, V
SAMPLE
= 1.3 V
REF
Figure 35. SNR/SFDR vs. fIN, f
= 125 MSPS, Clock Divider = 8, V
SAMPLE
= 1.3 V
REF
Rev. 0 | Page 18 of 40
Page 19
Data Sheet AD9653
SNR (dBFS)
SFDR (dBc)
78
80
82
84
86
88
90
92
94
020406080
SNR/SFDR (dBFS/dBc)
TEMPERATURE (°C)
10538-036
0
INL (LSB)
OUTPUT CODE
–4.5
–3.0
–1.5
0
1.5
3.0
4.5
6000
12000
18000
24000
30000
36000
42000
48000
54000
60000
10538-037
DNL (LSB)
0
20000
40000
60000
80000
100000
120000
140000
160000
180000
200000
N – 9
N – 8
N – 7
N – 6
N – 5
N – 4
N – 3
N – 2
N – 1
N
N + 1
N + 2
N + 3
N + 4
N + 5
N + 6
N + 7
N + 8
N + 9
N + 10
NUMBER OF HI TS
CODE
10538-039
2.1 LSB RMS
0
10
20
30
40
50
60
70
80
90
100
11070
PSRR (dB)
FREQUENCY (MHz)
DRVDD
AVDD
10538-040
0
20
40
60
80
100
20406080100120
SNR/SFDR (dBFS/dBc)
SAMPLE RATE (MSPS)
SFDR (dBc)
SNR (dBFS)
10538-041
Figure 36. SNR/SFDR vs. Temperature, fIN = 9.7 MHz,
f
= 125 MSPS, V
SAMPLE
Figure 37. INL, fIN = 9.7 MHz, f
0.8
0.6
0.4
0.2
0
–0.2
–0.4
–0.6
–0.8
0
6000
Figure 38. DNL, fIN = 9.7 MHz, f
12000
18000
24000
OUTPUT CODE
REF
= 125 MSPS, V
SAMPLE
30000
36000
= 125 MSPS, V
SAMPLE
= 1.3 V
42000
48000
REF
REF
= 1.3 V
54000
= 1.3 V
60000
10538-038
Rev. 0 | Page 19 of 40
Figure 39. Input-Referred Noise Histogram, f
Figure 40. PSRR vs. Frequency, f
SAMPLE
= 125 MSPS, V
SAMPLE
Figure 41. SNR/SFDR vs. Sample Rate, fIN = 9.7 MHz, V
= 125 MSPS, V
= 1.3 V
REF
= 1.3 V
REF
= 1.3 V
REF
Page 20
AD9653 Data Sheet
0
20
40
60
80
100
20406080100120
SNR/SFDR (dBFS/dBc)
SAMPLE RATE (MSPS)
SNR (dBFS)
SFDR (dBc)
10538-042
Figure 42. SNR/SFDR vs . Sample Rate, fIN = 64 MHz, Clock Divider = 4, V
= 1.3 V
REF
Rev. 0 | Page 20 of 40
Page 21
Data Sheet AD9653
AVDD
VIN±x
10538-043
CLK+
CLK–
10538-044
31kΩ
SDIO/OLM
400Ω
AVDD
10538-045
DRVDD
D0–x, D1–xD0+x, D1+ x
V
V
V
V
10538-046
350Ω
AVDD
30kΩ
SCLK/DTP, SYNC,
AND PDWN
10538-047
RBIAS
AND VCM
375Ω
AVDD
10538-048
CSB
350Ω
AVDD
30kΩ
10538-049
VREF
AVDD
7.5kΩ
375Ω
10538-050
EQUIVALENT CIRCUITS
Figure 43. Equivalent Analog Input Circuit
AVDD
10Ω
15kΩ
0.9V
AVDD
15kΩ
10Ω
Figure 44. Equivalent Clock Input Circuit
Figure 47. Equivalent SCLK/DTP, SY NC, and PDWN Input Circuit
Figure 48. Equivalent RBIAS and VCM Circuit
Figure 45. Equivalent SDIO/OLM Input Circuit
Figure 46. Equivalent Digital Output Circuit
Figure 49. Equivalent CS Input Circuit
Figure 50. Equivalent VREF Circuit
Rev. 0 | Page 21 of 40
Page 22
AD9653 Data Sheet
SS
H
C
PAR
C
SAMPLE
C
SAMPLE
C
PAR
VIN–x
H
SS
H
VIN+x
H
10538-051
20
30
40
50
60
70
80
90
100
110
0.50.60.70.80.91.01.11.21.3
SNR/SFDR (dBFS/dBc)
COMMON-MODE VOLTAGE (V)
SFDR (dBc)
SNRFS (dBFS)
10538-052
THEORY OF OPERATION
The AD9653 is a multistage, pipelined ADC. Each stage
provides sufficient overlap to correct for flash errors in the
preceding stage. The quantized outputs from each stage are
combined into a final 16-bit result in the digital correction
logic. The serializer transmits this converted data in a 16-bit
output. The pipelined architecture permits the first stage to
operate with a new input sample while the remaining stages
operate with preceding samples. Sampling occurs on the rising
edge of the clock.
Each stage of the pipeline, excluding the last, consists of a low
resolution flash ADC connected to a switched-capacitor DAC
and an interstage residue amplifier (for example, a multiplying
digital-to-analog converter (MDAC)). The residue amplifier
magnifies the difference between the reconstructed DAC output
and the flash input for the next stage in the pipeline. One bit of
redundancy is used in each stage to facilitate digital correction
of flash errors. The last stage simply consists of a flash ADC.
The output staging block aligns the data, corrects errors, and
passes the data to the output buffers. The data is then serialized
and aligned to the frame and data clocks.
ANALOG INPUT CONSIDERATIONS
The analog input to the AD9653 is a differential switchedcapacitor circuit designed for processing differential input
signals. This circuit can support a wide common-mode range
while maintaining excellent performance. By using an input
common-mode voltage of midsupply, users can minimize
signal-dependent errors and achieve optimum performance.
the output stage of the driving source. In addition, low Q inductors
or ferrite beads can be placed on each leg of the input to reduce
high differential capacitance at the analog inputs and therefore
achieve the maximum bandwidth of the ADC. Such use of low
Q inductors or ferrite beads is required when driving the converter
front end at high IF frequencies. Either a differential capacitor or
two single-ended capacitors can be placed on the inputs to
provide a matching passive network. This ultimately creates a
low-pass filter at the input to limit unwanted broadband noise.
See the AN-742 Application Note, the AN-827 Application Note,
and the Analog Dialogue article “Transformer-Coupled Front-
End for Wideband A/D Converters” (Volume 39, April 2005) for
more information. In general, the precise values depend on the
application.
Input Common Mode
The analog inputs of the AD9653 are not internally dc-biased.
Therefore, in ac-coupled applications, the user must provide
this bias externally. Setting the device so that V
= AVDD /2 is
CM
recommended for optimum performance, but the device can
function over a wider range with reasonable performance, as
shown in Figure 52 and Figure 53.
An on-chip, common-mode voltage reference is included in the
design and is available from the VCM pin. The VCM pin must
be bypassed to ground by a 0.1 µF capacitor, as described in the
Applications Information section.
Maximum SNR performance is achieved by setting the ADC to
the largest span in a differential configuration. In the case of the
AD9653, the input span is dependent on the reference voltage
(see Table 11).
Figure 51. Switched-Capacitor Input Circuit
The clock signal alternately switches the input circuit between
sample mode and hold mode (see Figure 51). When the input
circuit is switched to sample mode, the signal source must be
capable of charging the sample capacitors and settling within
one-half of a clock cycle. A small resistor in series with each
input can help reduce the peak transient current injected from
Figure 52. SNR/SFDR vs. Common-Mode Voltage,
f
= 9.7 MHz, f
IN
= 125 MSPS, V
SAMPLE
= 1.0 V
REF
Rev. 0 | Page 22 of 40
Page 23
Data Sheet AD9653
+×=
R1
R2
V
REF
15.0
REF
REF
20
30
40
50
60
70
80
90
100
110
0.60.70.80.91.01.11.21.3
SNR/SFDR (dBFS/dBc)
COMMON-MODE VOLTAGE (V)
SFDR (dBc)
SNRFS (dBFS)
10538-053
VREF
SENSE
0.5V
AD9653
SELECT
LOGIC
0.1µF1.0µF
VIN–A
VIN+A
ADC
CORE
10538-054
VREF
SENSE
R1
R2
0.5V
AD9653
SELECT
LOGIC
0.1µF1.0µF
VIN–A
VIN+A
ADC
CORE
10538-055
+
Internal Reference Connection
A comparator within the AD9653 detects the potential at the
SENSE pin and configures the reference into one of three
possible modes, which are summarized in Table 11. If SENSE is
grounded, the reference amplifier switch is connected to the
internal resistor divider (see Figure 54), setting the voltage at the
Figure 53. SNR/SFDR vs. Common-Mode Voltage,
f
= 9.7 MHz, f
IN
= 125 MSPS, V
SAMPLE
= 1.3 V
REF
Differential Input Configurations
There are several ways to drive the AD9653 either actively or
passively. However, optimum performance is achieved by driving
the analog inputs differentially. Using a differential double balun
configuration to drive the AD9653 provides excellent performance
and a flexible interface to the ADC (see Figure 56) for baseband
applications.
For applications where SNR is a key parameter, differential transformer coupling is the recommended input configuration (see
Figure 57), because the noise performance of most amplifiers is
not adequate to achieve the true performance of the AD9653.
Regardless of the configuration, the value of the shunt capacitor,
C, is dependent on the input frequency and may need to be
reduced or removed.
It is not recommended to drive the AD9653 inputs single-ended.
VREF pin, V
resistor divider (see Figure 55), V
where:
7 kΩ ≤ (R1 + R2) ≤ 10 kΩ
, to 1.0 V. If SENSE is connected to an external
REF
is defined as
REF
Figure 54. 1.0 V Internal Reference Configuration
VOLTAGE REFERENCE
A stable and accurate voltage reference is built into the AD9653.
VREF can be configured using either the internal 1.0 V reference, an externally applied 1.0 V to 1.3 V reference voltage, or
using an external resistor divider applied to the internal reference to produce a reference voltage of the user’s choice. The
various reference modes are summarized in the Internal Reference
Connection section and the External Reference Operation
section. The VREF pin should be externally bypassed to ground
with a low ESR, 1.0 μF capacitor in parallel with a low ESR,
0.1 μF ceramic capacitor.
Table 11. Reference Configuration Summary
Selected Mode SENSE Voltage (V) Resulting V
Fixed Internal Reference AGND to 0.2 1.0 internal 2.0
Programmable Internal Reference Tie to external R-divider
Fixed External Reference AVDD 1.0 to 1.3 applied to external VREF pin1 2.0 to 2.6
1
Normal operation for V
= 1.3 V is supported over the 0°C to 85°C temperature range.
If the internal reference of the AD9653 is used to drive multiple
converters to improve gain matching, the loading of the reference
by the other converters must be considered. Figure 58 and
Figure 59 show how the internal reference voltage is affected by
loading.
Figure 58. V
= 1.0 V Error vs. Load Current
REF
Figure 59. V
=1.3 V Error vs. Load Current
REF
External Reference Operation
The use of an external reference may be necessary to enhance
the gain accuracy of the ADC or improve thermal drift characteristics. Figure 60 and Figure 61 show the typical drift characteristics of the internal reference in 1.0 V mode and programmable
1.3 V mode, respectively.
Rev. 0 | Page 24 of 40
Page 25
Data Sheet AD9653
4
–8
–4085
V
REF
ERROR (mV)
TEMPERATURE (°C)
–6
–4
–2
0
2
–15103560
10538-060
–15
–10
–5
0
5
10
–40–20020406080
V
REF
ERROR (mV)
TEMPERATURE (°C)
10538-061
0.1µF
0.1µF
0.1µF0.1µF
SCHOTTKY
DIODES:
HSMS2822
CLOCK
INPUT
50Ω
100Ω
CLK–
CLK+
ADC
Mini-Circuits
®
ADT1-1WT, 1:1 Z
XFMR
10538-062
0.1µF
0.1µF0.1µF
CLOCK
INPUT
0.1µF
50Ω
CLK–
CLK+
SCHOTTKY
DIODES:
HSMS2822
ADC
10538-063
100Ω
0.1µF
0.1µF
0.1µF
0.1µF
240Ω240Ω
50kΩ50kΩ
CLK–
CLK+
CLOCK
INPUT
CLOCK
INPUT
ADC
AD951x
PECL DRIVER
10538-064
The RF balun configuration is recommended for clock frequencies
between 125 MHz and 1 GHz, and the RF transformer is recommended for clock frequencies from 20 MHz to 200 MHz. The
back-to-back Schottky diodes across the transformer/balun
secondary winding limit clock excursions into the AD9653 to
approximately 0.8 V p-p differential.
This limit helps prevent the large voltage swings of the clock
from feeding through to other portions of the AD9653 while
preserving the fast rise and fall times of the signal that are critical
to achieving low jitter performance. However, the diode capacitance comes into play at frequencies above 500 MHz. Care must be
taken in choosing the appropriate signal limiting diode.
Figure 60. Typical V
Figure 61. Typical V
When the SENSE pin is tied to AVDD, the internal reference is
disabled, allowing the use of an external reference. An internal
reference buffer loads the external reference with an equivalent
7.5 kΩ load (see Figure 50). The internal buffer generates the
positive and negative full-scale references for the ADC core.
It is not recommended to leave the SENSE pin floating.
CLOCK INPUT CONSIDERATIONS
For optimum performance, clock the AD9653 sample clock
inputs, CLK+ and CLK−, with a differential signal. The signal
is typically ac-coupled into the CLK+ and CLK− pins via a
transformer or capacitors. These pins are biased internally
(see Figure 44) and require no external bias.
Clock Input Options
The AD9653 has a flexible clock input structure. The clock input
can be a CMOS, LVDS, LVPECL, or sine wave signal. Regardless of the type of signal being used, clock source jitter is of the
most concern, as described in the Jitter Considerations section.
Figure 62 and Figure 63 show two preferred methods for clocking the AD9653 (at clock rates up to 1 GHz prior to internal clock
divider). A low jitter clock source is converted from a singleended signal to a differential signal using either an RF transformer
or an RF balun.
= 1.0 V Drift
REF
= 1.3 V Drift
REF
Figure 62. Transformer-Coupled Differential Clock (Up to 200 MHz)
Figure 63. Balun-Coupled Differential Clock (Up to 1 GHz)
If a low jitter clock source is not available, another option is to
ac couple a differential PECL signal to the sample clock input
pins, as shown in Figure 64. The AD9510/AD9511/AD9512/
A third option is to ac couple a differential LVDS signal to the
sample clock input pins, as shown in Figure 65. The AD9510/
AD9511/AD9512/AD9513/AD9514/AD9515/AD9516/AD9517
clock drivers offer excellent jitter performance.
In some applications, it may be acceptable to drive the sample
clock inputs with a single-ended 1.8 V CMOS signal. In such
applications, drive the CLK+ pin directly from a CMOS gate, and
bypass the CLK− pin to ground with a 0.1 μF capacitor (see
Figure 66).
Figure 66. Single-Ended 1.8 V CMOS Input Clock (Up to 200 MHz)
Input Clock Divider
The AD9653 contains an input clock divider with the ability
to divide the input clock by integer values between 1 and 8.
The AD9653 clock divider can be synchronized using the
external SYNC input. Bit 0 and Bit 1 of Register 0x109 allow the
clock divider to be resynchronized on every SYNC signal or
only on the first SYNC signal after the register is written. A
valid SYNC causes the clock divider to reset to its initial state.
This synchronization feature allows multiple parts to have their
clock dividers aligned to guarantee simultaneous input sampling.
Clock Duty Cycle
Typical high speed ADCs use both clock edges to generate a variety of internal timing signals and, as a result, may be sensitive to
clock duty cycle. Commonly, a ±5% tolerance is required on the
clock duty cycle to maintain dynamic performance characteristics.
The AD9653 contains a duty cycle stabilizer (DCS) that retimes
the nonsampling (falling) edge, providing an internal clock
signal with a nominal 50% duty cycle. This feature minimizes
performance degradation in cases where the clock input duty
cycle deviates from 50% greater than the specified ±5%. Noise and
distortion performance are nearly flat for a wider range of duty
cycles with the DCS on, as shown in Figure 67 and Figure 68.
Figure 67. SNR vs. DCS On/Off, V
= 1.0 V
REF
Figure 68. SNR vs. DCS On/Off, V
= 1.3 V
REF
Jitter in the rising edge of the input is still of concern and is not
easily reduced by the internal stabilization circuit. The duty
cycle control loop does not function for clock rates less than
20 MHz, nominally. The loop has a time constant associated
with it that must be considered in applications in which the
clock rate can change dynamically. A wait time of 1.5 µs to 5 µs
is required after a dynamic clock frequency increase or decrease
before the DCS loop is relocked to the input signal.
Jitter Considerations
High speed, high resolution ADCs are sensitive to the quality of the
clock input. The degradation in SNR at a given input frequency
(f
) due only to aperture jitter (tJ) can be calculated by
A
SNR Degradation = 20 log
10
In this equation, the rms aperture jitter represents the root mean
square of all jitter sources, including the clock input, analog input
signal, and ADC aperture jitter specifications. IF undersampling
applications are particularly sensitive to jitter (see Figure 69).
The clock input should be treated as an analog signal in cases
where aperture jitter may affect the dynamic range of the AD9653.
Power supplies for clock drivers should be separated from the
Rev. 0 | Page 26 of 40
Page 27
Data Sheet AD9653
ADC output driver supplies to avoid modulating the clock signal
with digital noise. Low jitter, crystal-controlled oscillators make
the best clock sources. If the clock is generated from another
type of source (by gating, dividing, or other methods), it should
be retimed by the original clock at the last step.
Refer to the AN-501 Application Note and the AN-756
Application Note for more in-depth information about jitter
performance as it relates to ADCs.
130
RMS CLOCK JITTER RE Q U I REMENT
120
110
100
90
80
SNR (dB)
70
10 BITS
60
8 BITS
50
40
30
1101001000
ANALOG INPUT FREQUENC Y (MHz)
0.125ps
0.25ps
0.5ps
1.0ps
2.0ps
16 BITS
14 BITS
12 BITS
10538-067
Figure 69. Ideal SNR vs. Input Frequency and Jitter
POWER DISSIPATION AND POWER-DOWN MODE
As shown in Figure 70, the power dissipated by the AD9653 is
proportional to its sample rate. The digital power dissipation
does not vary significantly because it is determined primarily by
the DRVDD supply and bias current of the LVDS output drivers.
0.60
0.55
0.50
0.45
0.40
0.35
V
=1.3V
REF
=1.0V
V
REF
Low power dissipation in power-down mode is achieved by
shutting down the reference, reference buffer, biasing networks,
and clock. Internal capacitors are discharged when entering
power-down mode and then must be recharged when returning
to normal operation. As a result, wake-up time is related to the
time spent in power-down mode, and shorter power-down
cycles result in proportionally shorter wake-up times. When
using the SPI port interface, the user can place the ADC in
power-down mode or standby mode. Standby mode allows the
user to keep the internal reference circuitry powered when
faster wake-up times are required. See the Memory Map section
for more details on using these features.
DIGITAL OUTPUTS AND TIMING
The AD9653 differential outputs conform to the ANSI-644 LVDS
standard on default power-up. This can be changed to a low power,
reduced signal option (similar to the IEEE 1596.3 standard) via the
SPI. The LVDS driver current is derived on chip and sets the
output current at each output equal to a nominal 3.5 mA. A 100 Ω
differential termination resistor placed at the LVDS receiver
inputs results in a nominal 350 mV swing (or 700 mV p-p
differential) at the receiver.
When operating in reduced range mode, the output current is
reduced to 2 mA. This results in a 200 mV swing (or 400 mV p-p
differential) across a 100 Ω termination at the receiver.
The AD9653 LVDS outputs facilitate interfacing with LVDS
receivers in custom ASICs and FPGAs for superior switching
performance in noisy environments. Single point-to-point net
topologies are recommended with a 100 Ω termination resistor
placed as close to the receiver as possible. If there is no far-end
receiver termination or there is poor differential trace routing,
timing errors may result. To avoid such timing errors, it is
recommended that the trace length be less than 24 inches and
that the differential output traces be close together and at equal
lengths. An example of the FCO and data stream with proper
trace length and position is shown in Figure 71. Figure 72 shows
the LVDS output timing example in reduced range mode.
0.30
ANALOG C ORE POWER (W)
0.25
0.20
20406080100120
Figure 70. Analog Core Power vs. f
SAMPLE RATE (MSPS)
for fIN = 9.7 MHz, Four Channels
SAMPLE
10538-068
The AD9653 is placed in power-down mode either by the SPI
port or by asserting the PDWN pin high. In this state, the ADC
typically dissipates 2 mW. During power-down, the output
drivers are placed in a high impedance state. Asserting the
PDWN pin low returns the AD9653 to its normal operating
mode. Note that PDWN is referenced to the digital output
driver supply (DRVDD) and should not exceed that supply
voltage.
Figure 72. LVDS Output Timing Example in Reduced Range Mode
An example of the LVDS output using the ANSI-644 standard
(default) data eye and a time interval error (TIE) jitter histogram with trace lengths less than 24 inches on standard FR-4
material is shown in Figure 73.
500
EYE: ALL BITS
400
300
200
100
0
–100
–200
–300
EYE DIAGRAM VOLTAGE (mV)
–400
–500
–0.8ns–0.4ns0ns0.4ns0.8ns
7k
6k
5k
4k
3k
2k
TIE JITTER HISTOGRAM (Hits)
1k
0
200ps250ps300ps350ps400ps450ps500ps
Figure 73. Data Eye for LVDS Outputs in ANSI-644 Mode with Trace Lengths
Less than 24 Inches on Standard FR-4 Material, External 100 Ω Far-End
Termination Only
ULS: 7000/400354
Figure 74. Data Eye for LVDS Outputs in ANSI-644 Mode with Trace Lengths
Greater than 24 Inches on Standard FR-4 Material, External 100 Ω Far-End
Figure 74 shows an example of trace lengths exceeding 24 inches
on standard FR-4 material. Notice that the TIE jitter histogram
reflects the decrease of the data eye opening as the edge deviates
from the ideal position.
It is the user’s responsibility to determine if the waveforms
meet the timing budget of the design when the trace lengths
exceed 24 inches. Additional SPI options allow the user to further
increase the internal termination (increasing the current) of all
four outputs to drive longer trace lengths. This can be achieved
by programming Register 0x15. Even though this produces
sharper rise and fall times on the data edges and is less prone to
bit errors, the power dissipation of the DRVDD supply increases
when this option is used.
The format of the output data is twos complement by default.
An example of the output coding format can be found in Table 12.
To change the output data format to offset binary, see the
10538-071
Memory Map section.
Data from each ADC is serialized and provided on a separate
channel in two lanes in DDR mode. The data rate for each serial
stream is equal to 16 bits times the sample clock rate, with a
maximum of 500 Mbps/lane [(16 bits × 125 MSPS)/(2 × 2) =
500 Mbps/lane]. The lowest typical conversion rate is 20 MSPS.
See the Memory Map section for details on enabling this feature.
–0.8ns–0.4ns0ns0.4ns–0.8ns
12k
10k
8k
6k
4k
TIE JITTER HISTOGRAM (Hits)
2k
0k
–800ps –600ps –400ps –200ps0ps200ps400 ps 600ps
Termination Only
10538-072
Rev. 0 | Page 28 of 40
Page 29
Data Sheet AD9653
0001
Midscale short
1000 0000 0000 0000 (16-bit)
N/A
Yes
Offset binary
1010
1× sync
0000 0001 1111 1100 (16-bit)
N/A
No
Two output clocks are provided to assist in capturing data from
the AD9653. The DCO is used to clock the output data and is
equal to four times the sample clock (CLK) rate for the default
mode of operation. Data is clocked out of the AD9653 and must
be captured on the rising and falling edges of the DCO that
supports double data rate (DDR) capturing. The FCO is used to
signal the start of a new output byte and is equal to the sample
clock rate in 1× frame mode. See the Timing Diagrams section
for more information.
When the SPI is used, the DCO phase can be adjusted in 60°
increments relative to the data edge. This enables the user to
refine system timing margins if required. The default DCO+
and DCO− timing, as shown in Figure 2, is 90° relative to the
output data edge.
In default mode, as shown in Figure 2, the MSB is first in the
data output serial stream. This can be inverted so that the LSB
is first in the data output serial stream by using the SPI.
There are 12 digital output test pattern options available that
can be initiated through the SPI. This is a useful feature when
validating receiver capture and timing. Refer to Tab l e 13 for the
output bit sequencing options available. Some test patterns have
two serial sequential words and can be alternated in various
ways, depending on the test pattern chosen. Note that some
patterns do not adhere to the data format select option. In
addition, custom user-defined test patterns can be assigned in
the 0x19, 0x1A, 0x1B, and 0x1C register addresses.
Table 13. Flexible Output Test Modes
Output Test
Mode Bit
Sequence Pattern Name Digital Output Word 1 Digital Output Word 2
The PN sequence short pattern produces a pseudorandom bit
sequence that repeats itself every 2
9
− 1 or 511 bits. A description of the PN sequence and how it is generated can be found in
Section 5.1 of the ITU-T 0.150 (05/96) standard. The seed value
is all 1s (see Table 14 for the initial values). The output is a
parallel representation of the serial PN9 sequence in MSB-first
format. The first output word is the first 14 bits of the PN9
sequence in MSB aligned form.
The PN sequence long pattern produces a pseudorandom bit
sequence that repeats itself every 2
23
− 1 or 8,388,607 bits. A
description of the PN sequence and how it is generated can be
found in Section 5.6 of the ITU-T 0.150 (05/96) standard. The
seed value is all 1s (see Table 14 for the initial values) and the
AD9653 inverts the bit stream with relation to the ITU standard.
The output is a parallel representation of the serial PN23 sequence
in MSB-first format. The first output word is the first 14 bits of the
PN23 sequence in MSB aligned form
Table 14. PN Sequence
Sequence
PN Sequence Short 0x1FE0 0x1DF1, 0x3CC8, 0x294E
PN Sequence Long 0x1FFF 0x1FE0, 0x2001, 0x1C00
Initial
Value
First Three Output Samples
(MSB First) Twos Complement
Consult the Memory Map section for information on how to
change these additional digital output timing features through
the SPI.
SDIO/OLM Pin
For applications that do not require SPI mode operation, the
CSB pin is tied to AVDD, and the SDIO/OLM pin controls the
output lane mode according to Table 15.
Note that, when the CSB pin is tied to AVDD, the AD9653 DCS
is on by default and remains on unless the part is placed in SPI
mode and controlled via the SPI. Refer to the Clock Duty Cycle
section for more information on the DCS.
For applications where the SDIO/OLM pin is not used, CSB
should be tied to AVDD. When using the one-lane mode, the
conversion rate should be ≤62.5 MSPS to meet the maximum
output rate of 1 Gbps.
Table 15. Output Lane Mode Pin Settings
OLM Pin
Voltage Output Mode
AVDD (Default) Two-lane. 1× frame, 16-bit serial output
GND One-lane. 1× frame, 16-bit serial output
SCLK/DTP Pin
The SCLK/DTP pin is used to select the digital test pattern
(DTP) for applications that do not require SPI mode operation.
This pin can enable a single digital test pattern if it and the CSB
pin are held high during device power-up. When SCLK/DTP is
tied to AVDD, the ADC channel outputs shift out the following
pattern: 1000 0000 0000 0000. The FCO and DCO function
normally while all channels shift out the repeatable test pattern.
This pattern allows the user to perform timing alignment
adjustments among the FCO, DCO, and output data. This pin has
an internal 10 kΩ resistor to GND. It can be left unconnected.
Table 16. Digital Test Pattern Pin Settings
Selected DTP DTP Voltage
Normal Operation 10 kΩ to AGND Normal operation
DTP AVDD 1000 0000 0000 0000
Resulting
D0±x and D1±x
Additional and custom test patterns can also be observed when
commanded from the SPI port. Consult the Memory Map
section for information about the options available.
CSB Pin
The CSB pin should be tied to AVDD for applications that do
not require SPI mode operation. By tying CSB high, all SCLK
and SDIO information is ignored.
Note that, when the CSB pin is tied to AVDD, the AD9653 DCS
is on by default and remains on unless the part is placed in SPI
mode and controlled via the SPI. Refer to the Clock Duty Cycle
section for more information on the DCS.
RBIAS Pin
To set the internal core bias current of the ADC, place a
10.0 kΩ, 1% tolerance resistor to ground at the RBIAS pin.
OUTPUT TEST MODES
The output test options are described in Tab l e 13 and controlled by
the output test mode bits at Address 0x0D. When an output test
mode is enabled, the analog section of the ADC is disconnected
from the digital back-end blocks and the test pattern is run
through the output formatting block. Some of the test patterns
are subject to output formatting, and some are not. The PN
generators from the PN sequence tests can be reset by setting
Bit 4 or Bit 5 of Register 0x0D. These tests can be performed
with or without an analog signal (if present, the analog signal is
ignored), but they do require an encode clock. For more
information, see the AN-877 Application Note, Interfacing to High Speed ADCs via SPI.
Rev. 0 | Page 30 of 40
Page 31
Data Sheet AD9653
SERIAL PORT INTERFACE (SPI)
The AD9653 serial port interface (SPI) allows the user to configure
the converter for specific functions or operations through a
structured register space provided inside the ADC. The SPI
offers the user added flexibility and customization, depending on
the application. Addresses are accessed via the serial port and
can be written to or read from via the port. Memory is organized
into bytes that can be further divided into fields, which are documented in the Memory Map section. For detailed operational
information, see the AN-877 Application Note, Interfacing to High Speed ADCs via SPI.
CONFIGURATION USING THE SPI
Three pins define the SPI of this ADC: the SCLK pin, the SDIO
pin, and the CSB pin (see Table 17). The SCLK (a serial clock) is
used to synchronize the read and write data presented from and
to the ADC. The SDIO (serial data input/output) is a dualpurpose pin that allows data to be sent to and read from the
internal ADC memory map registers. The CSB (chip select bar)
is an active low control that enables or disables the read and
write cycles.
Table 17. Serial Port Interface Pins
Pin Function
SCLK
Serial clock. The serial shift clock input, which is used to
synchronize serial interface reads and writes.
SDIO
Serial data input/output. A dual-purpose pin that
typically serves as an input or an output, depending on
the instruction being sent and the relative position in the
timing frame.
CSB
Chip select bar. An active low control that gates the read
and write cycles.
The falling edge of the CSB, in conjunction with the rising edge
of the SCLK, determines the start of the framing. An example of
the serial timing and its definitions can be found in Figure 75
and Table 7.
Other modes involving the CSB are available. The CSB can be
held low indefinitely, which permanently enables the device;
this is called streaming. The CSB can stall high between bytes to
allow for additional external timing. When CSB is tied high, SPI
functions are placed in high impedance mode. This mode turns
on any SPI pin secondary functions.
During an instruction phase, a 16-bit instruction is transmitted.
Data follows the instruction phase, and its length is determined
by the W0 and W1 bits.
In addition to word length, the instruction phase determines
whether the serial frame is a read or write operation, allowing
the serial port to be used both to program the chip and to read
the contents of the on-chip memory. The first bit of the first byte in
a multibyte serial data transfer frame indicates whether a read
command or a write command is issued. If the instruction is a
readback operation, performing a readback causes the serial
data input/output (SDIO) pin to change direction from an input to
an output at the appropriate point in the serial frame.
All data is composed of 8-bit words. Data can be sent in MSBfirst mode or in LSB-first mode. MSB-first mode is the default
on power-up and can be changed via the SPI port configuration
register. For more information about this and other features,
see the AN-877 Application Note, Interfacing to High Speed ADCs via SPI.
CSB
SCLK
SDIO
DON’T CARE
t
t
DS
t
S
R/WW1W0A12A11A10A9A8A7
t
DH
HIGH
t
LOW
Figure 75. Serial Port Interface Timing Diagram
t
CLK
Rev. 0 | Page 31 of 40
D5D4D3D2D1D0
t
H
DON’T CARE
DON’T CAREDON’T CARE
10538-073
Page 32
AD9653 Data Sheet
Power Mode
Allows the user to set either power-down mode
HARDWARE INTERFACE
The pins described in Ta ble 17 comprise the physical interface
between the user programming device and the serial port of the
AD9653. The SCLK pin and the CSB pin function as inputs
when using the SPI interface. The SDIO pin is bidirectional,
functioning as an input during write phases and as an output
during readback.
The SPI interface is flexible enough to be controlled by either
FPGAs or microcontrollers. One method for SPI configuration
is described in detail in the AN-812 Application Note, Micro-controller-Based Serial Port Interface (SPI) Boot Circuit.
The SPI port should not be active during periods when the full
dynamic performance of the converter is required. Because the
SCLK signal, the CSB signal, and the SDIO signal are typically
asynchronous to the ADC clock, noise from these signals can
degrade converter performance. If the on-board SPI bus is used for
other devices, it may be necessary to provide buffers between
this bus and the AD9653 to prevent these signals from transitioning at the converter inputs during critical sampling periods.
Some pins serve a dual function when the SPI interface is not
being used. When the pins are strapped to DRVDD or ground
during device power-on, they are associated with a specific
function. Table 15 and Table 16 describe the strappable
functions supported on the AD9653.
CONFIGURATION WITHOUT THE SPI
In applications that do not interface to the SPI control registers,
the SDIO/OLM pin, the SCLK/DTP pin, and the PDWN pin
serve as standalone CMOS-compatible control pins. When the
device is powered up, it is assumed that the user intends to use the
pins as static control lines for the output lane mode, digital test
pattern, and power-down feature control. In this mode, CSB
should be connected to AVDD, which disables the serial port
interface.
Note that, when the CSB pin is tied to AVDD, the AD9653 DCS
is on by default and remains on unless the part is placed in SPI
mode and controlled via the SPI. Refer to the Clock Duty Cycle
section for more information on the DCS.
When the device is in SPI mode, the PDWN pin (if enabled)
remains active. For SPI control of power-down, the PDWN pin
should be set to its default state.
SPI ACCESSIBLE FEATURES
Table 18 provides a brief description of the general features that
are accessible via the SPI. These features are described in detail
in the AN-877 Application Note, Interfacing to High Speed ADCs via SPI. The AD9653 part-specific features are described in detail
following Tabl e 19, the external memory map register table.
Table 18. Features Accessible Using the SPI
Feature Name Description
or standby mode
Clock Allows the user to set the clock divider, set the
clock divider phase, and enable the sync
Offset Allows the user to digitally adjust the
converter offset
Test I/O Allows the user to set test modes to have
known data on output bits
Output Mode Allows the user to set the output mode
Output Phase Allows the user to set the output clock polarity
Rev. 0 | Page 32 of 40
Page 33
Data Sheet AD9653
MEMORY MAP
READING THE MEMORY MAP REGISTER TABLE
Each row in the memory map register table has eight bit locations.
The memory map is roughly divided into three sections: the chip
configuration registers (Address 0x00 to Address 0x02); the device
index and transfer registers (Address 0x05 and Address 0xFF);
and the global ADC functions registers, including setup, control,
and test (Address 0x08 to Address 0x109).
The memory map register table (see Tab l e 19) lists the default
hexadecimal value for each hexadecimal address shown. The
column with the heading Bit 7 (MSB) is the start of the default
hexadecimal value given. For example, Address 0x05, the device
index register, has a hexadecimal default value of 0x3F. This
means that in Address 0x05, Bits[7:6] = 0, and the remaining
Bits[5:0] = 1. This setting is the default channel index setting.
The default value results in both ADC channels receiving the
next write command. For more information on this function
and others, see the AN-877 Application Note, Interfacing to High Speed ADCs via SPI. This application note details the functions
controlled by Register 0x00 to Register 0xFF. The remaining
registers are documented in the Memory Map Register
Descriptions section.
Open Locations
All address and bit locations that are not included in Table 19
are not currently supported for this device. Unused bits of a
valid address location should be written with 0s. Writing to these
locations is required only when part of an address location is
open (for example, Address 0x05). If the entire address location
is open or not listed in Table 19 (for example, Address 0x13), this
address location should not be written.
Default Values
After the AD9653 is reset, critical registers are loaded with
default values. The default values for the registers are given in
the memory map register table, Tabl e 19.
Logic Levels
An explanation of logic level terminology follows:
•“Bit is set” is synonymous with “bit is set to Logic 1” or
“writing Logic 1 for the bit.”
•“Clear a bit” is synonymous with “bit is set to Logic 0” or
“writing Logic 0 for the bit.”
Channel-Specific Registers
Some channel setup functions, such as the signal monitor
thresholds, can be programmed differently for each channel. In
these cases, channel address locations are internally duplicated
for each channel. These registers and bits are designated in
Table 19 as local. These local registers and bits can be accessed
by setting the appropriate data channel bits (A, B, C, or D) and
the clock channel DCO bit (Bit 5) and FCO bit (Bit 4) in
Register 0x05. If all the bits are set, the subsequent write affects
the registers of all channels and the DCO/FCO clock channels.
In a read cycle, only one of the channels (A, B, C, or D) should
be set to read one of the four registers. If all the bits are set
during a SPI read cycle, the part returns the value for Channel A.
Registers and bits designated as global in Table 19 affect the
entire part or the channel features for which independent
settings are not allowed between channels. The settings in
Register 0x05 do not affect the global registers and bits.
Rev. 0 | Page 33 of 40
Page 34
AD9653 Data Sheet
MEMORY MAP REGISTER TABLE
The AD9653 uses a 3-wire interface and 16-bit addressing and,
therefore, Bit 0 and Bit 7 in Register 0x00 are set to 0, and Bit 3
and Bit 4 are set to 1. When Bit 5 in Register 0x00 is set high,
Table 19.
ADDR
(Hex) Parameter Name
Chip Configuration Registers
0x00
0x01 Chip ID (global) 8-bit chip ID, Bits[7:0]
0x02
Device Index and Transfer Registers
0x05 Device index Open Open
0xFF Transfer Open Open Open Open Open Open Open
Global ADC Function Registers
0x08
0x09 Clock (global) Open Open Open Open Open Open Open
SPI port
configuration
Chip grade
(global)
Power modes
(global)
Bit 7
(MSB) Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1
0 =
SDO
active
Open Speed grade ID[6:4]
Open Open
LSB first
Soft
reset
AD96530xB5 = quad, 16-bit, 125 MSPS serial LVDS
110 = 125 MSPS
Clock
Channel
DCO
External
powerdown
pin
function
0 = full
powerdown
1 =
standby
1 =
16-bit
address
Clock
Channel
FCO
Open Open Open Power mode
the SPI enters a soft reset, where all of the user registers revert
to their default values and Bit 2 is automatically cleared.
Default
Bit 0
(LSB)
1 =
16-bit
address
Open Open Open Open
Data
Channel
D
Soft
reset
Data
Channel
C
LSB first
Data
Channel
B
01 = full power-
0 = SDO
active
Data
Channel
A
Initiate
override
00 = chip run
down
10 = standby
11 = reset
Duty
cycle
stabilize
0 = on
1 = off
Value
(Hex) Comments
0x18
0xB5
0x3F
0x00
0x00
0x01
The nibbles
are mirrored
so that LSBfirst or MSBfirst mode
registers
correctly. The
default for
ADCs is 16-bit
mode.
Unique chip
ID used to
differentiate
devices; read
only.
Unique
speed grade
ID used to
differentiate
graded
devices; read
only.
Bits are set to
determine
which device
on chip
receives the
next write
command.
The default is
all devices on
chip.
Set sample
rate override.
Determines
various
generic
modes of chip
operation.
Turns duty
cycle stabilizer
on or off.
Rev. 0 | Page 34 of 40
Page 35
Data Sheet AD9653
Test mode (local
Reset
Reset PN
Output test mode[3:0] (local)
When set, the
0x15
Output adjust
Open
Open
Output driver
Open
Open
Open
Output
0x00
Determines
Default
ADDR
(Hex)
0x0B Clock divide
0x0C
0x0D
0x10
0x14 Output mode Open
Parameter Name
(global)
Enhancement
control
except for PN
sequence resets)
Offset adjust
(local)
Bit 7
(MSB)
Open Open Open Open Open
Open Open Open Open Open
User input test mode
10 = single once
11 = alternate once
(affects user input test
Bits[3:0] = 1000)
Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1
Chop
mode
0 = off
1 = on
00 = single
01 = alternate
mode only,
Offset adjust in LSBs from +127 to −128 (twos complement format)
LVDS-ANSI/
LVDS-IEEE
option
0 = LVDSANSI
1 = LVDSIEEE
reduced
range link
(global)
see
Table 20
PN long
gen
8-bit device offset adjustment [7:0] (local)
Open Open Open
short
gen
0000 = off (default)
0001 = midscale short
0010 = positive FS
0011 = negative FS
0100 = alternating checkerboard
0101 = PN 23 sequence
0110 = PN 9 sequence
0111 = one/zero word toggle
1000 = user input
1001 = 1-/0-bit toggle
1011 = one bit high
1100 = mixed bit frequency
Output
invert
(local)
Clock divide ratio[2:0]
000 = divide by 1
001 = divide by 2
010 = divide by 3
011 = divide by 4
100 = divide by 5
101 = divide by 6
110 = divide by 7
111 = divide by 8
test data is
placed on the
output pins in
place of
normal data.
Device offset
trim.
Configures
the outputs
and the
format of the
data.
0x16 Output phase Open Input clock phase adjust[6:4]
termination[1:0]
00 = none
01 = 200 Ω
10 = 100 Ω
11 = 100 Ω
(value is number of input clock
cycles of phase delay)
see Table 21
Rev. 0 | Page 35 of 40
Output clock phase adjust[3:0]
(0000 through 1011)
see Table 22
drive
0 = 1×
drive
1 = 2×
drive
0x03
LVDS or other
output
properties.
On devices
that use
global clock
divide,
determines
which phase
of the divider
output is used
to supply the
output clock.
Internal
latching is
unaffected.
Page 36
AD9653 Data Sheet
USER_PATT2_MSB
User Defined
SDIO
Disables SDIO
Default
ADDR
(Hex)
0x18 V
Parameter Name
Open Open Open Open Open V
REF
Bit 7
(MSB)
Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1
adjustment
REF
digital scheme[2:0]
000 = 1.0 V p-p (1.3 V p-p)
001 = 1.14 V p-p (1.48 V p-p)
010 = 1.33 V p-p (1.73 V p-p)
0x101 User I/O Control 2 Open Open Open Open Open Open Open
0x102 User I/O Control 3 Open Open Open Open
VCM
Open Open Open 0x00 VCM control.
powerdown
0x109 Sync Open Open Open Open Open Open
Sync
next
only
Bit 0
(LSB)
Serial output
00 = 16 bits
Channel
powerdown
pulldown
Enable
sync
Value
(Hex)
0x04
0x30
0x00
0x00
0x00
0x00
Comments
Selects
internal V
Values shown
are for V
1.0 V (1.3 V).
.
REF
=
REF
User Defined
Pattern 1 LSB.
User Defined
Pattern 1 MSB.
User Defined
Pattern 2 LSB.
Pattern 2 MSB.
Serial stream
control.
Default causes
MSB first and
the native bit
stream.
Used to
power down
individual
sections of a
converter.
Sample rate
override
(requires
transfer
register, 0xFF).
pull-down.
Rev. 0 | Page 36 of 40
Page 37
Data Sheet AD9653
MEMORY MAP REGISTER DESCRIPTIONS
For additional information about functions controlled in
Register 0x00 to Register 0xFF, see the AN-877 Application Note, Interfacing to High Speed ADCs via SPI.
Device Index (Register 0x05)
There are certain features in the map that can be set independently for each channel, whereas other features apply
globally to all channels (depending on context) regardless of
which are selected. The first four bits in Register 0x05 can be
used to select which individual data channels are affected. The
output clock channels can be selected in Register 0x05 as well.
A smaller subset of the independent feature list can be applied
to those devices.
Transfer (Register 0xFF)
All registers except Register 0x100 are updated the moment
they are written. Setting Bit 0 of this transfer register high
initializes the settings in the sample rate override register
(Address 0x100).
Power Modes (Register 0x08)
Bits[7:6]—Open
Bit 5—External Power-Down Pin Function
If set, the external PDWN pin initiates standby mode. If cleared,
the external PDWN pin initiates power-down mode.
Bits[4:2]—Open
Bits[1:0]—Power Mode
In normal operation (Bits[1:0] = 00), all ADC channels are
active.
In power-down mode (Bits[1:0] = 01), the digital datapath clocks
are disabled while the digital datapath is reset. Outputs are
disabled.
In standby mode (Bits[1:0] = 10), the digital datapath clocks
and the outputs are disabled.
During a digital reset (Bits[1:0] = 11), all the digital datapath
clocks and the outputs (where applicable) on the chip are reset,
except the SPI port. Note that the SPI is always left under
control of the user; that is, it is never automatically disabled or
in reset (except by power-on reset).
Clock (Register 0x09)
Bits[7:1]—Open
Bit 0—Duty Cycle Stabilize.
The default state is Bit 0 = 1, duty cycle stabilizer off.
Note that, when the part is not in SPI mode, the duty cycle
stabilizer is on. Refer to the Configuration Without the SPI
section for more information.
Enhancement Control (Register 0x0C)
Bits[7:3]—Open
Bit 2—Chop Mode
For applications that are sensitive to offset voltages and other
low frequency noise, such as homodyne or direct conversion
receivers, chopping in the first stage of the AD9653 is a feature
that can be enabled by setting Bit 2. In the frequency domain,
chopping translates offsets and other low frequency noise to
f
/2 where it can be filtered.
CLK
Bits[1:0]—Open
Output Mode (Register 0x14)
Bit 7—Open
Bit 6—LVDS-ANSI/LVDS-IEEE Option
Setting this bit chooses LVDS-IEEE (reduced range) option.
The default setting is LVDS-ANSI. As described in Table 20,
when LVDS-ANSI or LVDS-IEEE reduced range link is selected,
the user can select the driver termination. The driver current
is automatically selected to give the proper output swing.
Table 20. LVDS-ANSI/LVDS-IEEE Options
Output
Mode,
Bit 6
0 LVDS-ANSI User
1 LVDS-IEEE
Output
Mode
reduced
range link
Output
Driver
Termination
selectable
User
selectable
Output Driver
Current
Automatically
selected to give
proper swing
Automatically
selected to give
proper swing
Bits[5:3]—Open
Bit 2—Output Invert
Setting this bit inverts the output bit stream.
Bit 1—Open
Bit 0—Output Format
By default, this bit is set to send the data output in twos
complement format. Resetting this bit changes the output mode
to offset binary.
Output Adjust (Register 0x15)
Bits[7:6]—Open
Bits[5:4]—Output Driver Termination
These bits allow the user to select the internal termination
resistor.
Bits[3:1]—Open
Bit 0—Output Drive
Bit 0 of the output adjust register controls the drive strength on
the LVDS driver of the FCO and DCO outputs only. The default
values set the drive to 1× while the drive can be increased to 2×
by setting the appropriate channel bit in Register 0x05 and then
setting Bit 0. These features cannot be used with the output
driver termination select. The termination selection takes
precedence over the 2× driver strength on FCO and DCO when
both the output driver termination and output drive are selected.
The serial output data control register is used to program the
AD9653 in various output data modes depending upon the data
capture solution. Tabl e 23 describes the various serialization
options available in the AD9653.
Sample Rate Override (Register 0x100)
This register is designed to allow the user to downgrade the sample
rate. Settings in this register are not initialized until Bit 0 of the
transfer register (Register 0xFF) is written high.
User I/O Control 2 (Register 0x101)
Bits[7:1]—Open
Bit 0—SDIO Pull-Down
Bit 0 can be set to disable the internal 30 kΩ pull-down on the
SDIO pin, which can be used to limit the loading when many
devices are connected to the SPI bus.
User I/O Control 3 (Register 0x102)
Bits[7:4]—Open
Bit 3—VCM Power-Down
Bit 3 can be set high to power down the internal VCM
generator. This feature is used when applying an external
reference.
Serial Output Number
of Bits (SONB) Frame Mode Serial Data Mode DCO Multiplier Timing Diagram
Rev. 0 | Page 38 of 40
Page 39
Data Sheet AD9653
SILKSCREEN PARTITION
PIN 1 INDICATOR
10538-074
GROUNDED
FILLED VIAS
FOR ADDED
CROSSTALK
ISOLATION
VIN
CHANNEL B
VIN
CHANNEL C
VIN
CHANNEL A
VIN
CHANNEL D
PIN 1
10538-075
APPLICATIONS INFORMATION
DESIGN GUIDELINES
Before starting design and layout of the AD9653 as a system,
it is recommended that the designer become familiar with these
guidelines, which describes the special circuit connections and
layout requirements that are needed for certain pins.
POWER AND GROUND RECOMMENDATIONS
When connecting power to the AD9653, it is recommended
that two separate 1.8 V supplies be used. Use one supply for
analog (AVDD); use a separate supply for the digital outputs
(DRVDD). For both AVDD and DRVDD, several different
decoupling capacitors should be used to cover both high and
low frequencies. Place these capacitors close to the point of
entry at the PCB level and close to the pins of the part, with
minimal trace length.
A single PCB ground plane should be sufficient when using the
AD9653. With proper decoupling and smart partitioning of the
PCB analog, digital, and clock sections, optimum performance
is easily achieved.
EXPOSED PAD THERMAL HEAT SLUG
RECOMMENDATIONS
It is required that the exposed pad on the underside of the ADC
be connected to analog ground (AGND) to achieve the best
electrical and thermal performance of the AD9653. An exposed
continuous copper plane on the PCB should mate to the
AD9653 exposed pad, Pin 0. The copper plane should have
several vias to achieve the lowest possible resistive thermal path
for heat dissipation to flow through the bottom of the PCB.
These vias should be solder-filled or plugged.
To maximize the coverage and adhesion between the ADC and
PCB, partition the continuous copper plane by overlaying a
silkscreen on the PCB into several uniform sections. This provides
several tie points between the ADC and PCB during the reflow
process, whereas using one continuous plane with no partitions
only guarantees one tie point. See Figure 76 for a PCB layout
example. For detailed information on packaging and the PCB
layout of chip scale packages, see the AN-772 Application Note,
A Design and Manufacturing Guide for the Lead Frame Chip
Scale Package (LFCSP), at www.analog.com.
VCM
The VCM pin should be bypassed to ground with a 0.1 μF
capacitor.
REFERENCE DECOUPLING
The VREF pin should be externally bypassed to ground with a
low ESR, 1.0 μF capacitor in parallel with a low ESR, 0.1 μF
ceramic capacitor.
SPI PORT
The SPI port should not be active during periods when the full
dynamic performance of the converter is required. Because the
SCLK, CSB, and SDIO signals are typically asynchronous to the
ADC clock, noise from these signals can degrade converter
performance. If the on-board SPI bus is used for other devices,
it may be necessary to provide buffers between this bus and the
AD9653 to keep these signals from transitioning at the con-
verter inputs during critical sampling periods.
CROSSTALK PERFORMANCE
The AD9653 is available in a 48-lead LFCSP package with the
input pairs on either corner of the chip. See Figure 6 for the pin
configuration. To maximize the crosstalk performance on the
board, add grounded filled vias in between the adjacent
channels as shown in Figure 77.
Figure 77. Layout Technique to Maximize Crosstalk Performance
Figure 76. Typical PCB Layout
Rev. 0 | Page 39 of 40
Page 40
AD9653 Data Sheet
COMPLI ANT TO JEDEC STANDARDS MO-220-WKKD.
1
0.50
BSC
BOTTOM VIEW
TOP VIEW
PIN 1
INDICATOR
48
13
24
36
37
EXPOSED
PAD
PIN 1
INDICATOR
5.65
5.60 SQ
5.55
0.45
0.40
0.35
SEATING
PLANE
0.80
0.75
0.70
0.05 MAX
0.02 NOM
0.20 REF
COPLANARITY
0.08
0.30
0.23
0.18
02-14-2011-B
7.10
7.00 SQ
6.90
FOR PROP E R CONNECTION OF
THE EXPOSED PAD, REFER TO
THE PIN CO NFIGURATI ON AND
FUNCTIO N DE S CRIPTIONS
SECTION OF THIS DATA SHEET.