1.8 V to 3.3V CMOS output supply or 1.8 V LVDS supply
Integer 1 to 8 input clock divider
IF sampling frequencies to 450 MHz
Internal ADC voltage reference
Integrated ADC sample-and-hold inputs
Flexible analog input range: 1 V p-p to 2 V p-p
Differential analog inputs with 650 MHz bandwidth
ADC clock duty cycle stabilizer
95 dB channel isolation/crosstalk
Serial port control
User-configurable, built-in self-test (BIST) capability
Energy-saving power-down modes
Integrated receive features
Fast detect/threshold bits
Composite signal monitor
Dual Analog-to-Digital Converter
AD9640
FUNCTIONAL BLOCK DIAGRAM
SCLK/
AVD D
DVDD
FD BITS/THRESHOLD
DETECT
VIN+A
VIN–A
VREF
SENSE
CML
RBIAS
VIN–B
VIN+B
SHA
REF
SELECT
SHA
MULTICHIP
SYNC
AGND SYNCFD(0:3)B
FD(0:3)A
ADC
FD BITS/THRESHOLD
SDIO/
DCS
PROGRAMMING DATA
SIGNAL
MONITOR
DIVIDE
1TO 8
DUTY CYCL E
STABILIZER
ADC
DETECT
Figure 1.
DFS
CSB
SPI
DCO
GENERATION
SIGNAL M ONITOR
DATA
SIGNAL MONITOR
INTERFACE
SMI
SMI
SCLK/
SDFS
PDWN
DRVDD
CMOS
CMOS
SMI
SDO/
OEB
D13A
D0A
OUTPUT BUFFER
CLK+
CLK–
DCOA
DCOB
D13B
D0B
OUTPUT BUFFER
DRGND
06547-001
APPLICATIONS
Communications
Diversity radio systems
Multimode digital receivers
GSM, EDGE, WCDMA,
CDMA2000, WiMAX, TD-SCDMA
I/Q demodulation systems
Smart antenna systems
General-purpose software radios
Broadband data applications
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Anal og Devices for its use, nor for any infringements of patents or ot her
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
ast overrange detect and signal monitor with serial output.
gnal monitor block with dedicated serial output mode.
3. Si
4. P
roprietary differential input that maintains excellent SNR
performance for input frequencies up to 450 MHz.
peration from a single 1.8 V supply and a separate digital
5. O
output driver supply to accommodate 1.8 V to 3.3 V logic
families.
standard serial port interface that supports various
6. A
product features and functions, such as data formatting
(offset binary, twos complement, or gray coding), enabling
the clock DCS, power-down, and voltage reference mode.
7. P
in compatibility with the AD9627 for a simple migration
The AD9640 is a dual 14-bit, 80/105/125/150 MSPS analog-todigital converter (ADC). The AD9640 is designed to support
communications applications where low cost, small size, and
versatility are desired.
The dual ADC core features a multistage, differential pipelined
a
rchitecture with integrated output error correction logic. Each
ADC features wide bandwidth differential sample-and-hold
analog input amplifiers supporting a variety of user-selectable
input ranges. An integrated voltage reference eases design
considerations. A duty cycle stabilizer is provided to compensate for variations in the ADC clock duty cycle, allowing the
converters to maintain excellent performance.
The AD9640 has several functions that simplify the automatic
ga
in control (AGC) function in the system receiver. The fast detect
feature allows fast overrange detection by outputting four bits of
input level information with very short latency.
In addition, the programmable threshold detector allows moni-
oring of the incoming signal power using the four fast detect
t
bits of the ADC with very low latency. If the input signal level
exceeds the programmable threshold, the fine upper threshold
indicator goes high. Because this threshold is set from the four
MSBs, the user can quickly turn down the system gain to avoid an
overrange condition.
The second AGC-related function is the signal monitor. This block
lows the user to monitor the composite magnitude of the
al
incoming signal, which aids in setting the gain to optimize the
dynamic range of the overall system.
The ADC output data can be routed directly to the two external
14-b
it output ports. These outputs can be set from 1.8 V to 3.3 V
CMOS or 1.8 V LVDS.
Flexible power-down options allow significant power savings,
wh
en desired.
Rev. 0 | Page 3 of 48
Page 4
AD9640
www.BDTIC.com/ADI
SPECIFICATIONS
ADC DC SPECIFICATIONS—AD9640BCPZ-80 AND AD9640BCPZ-105
AVDD = 1.8 V, DVDD = 1.8 V, DRVDD = 3.3 V, maximum sample rate, VIN = −1.0 dBFS differential input, 1.0 V internal reference,
DCS enabled, fast detect outputs disabled, and signal monitor disabled, unless otherwise noted.
Table 1.
AD9640BCPZ-80 AD9640BCPZ-105
Parameter Temperature
Min Typ Max Min Typ Max
RESOLUTION Full 14 14 Bits
ACCURACY
No Missing Codes Full Guaranteed Guaranteed
Offset Error Full ±0.3 ±0.6 ±0.3 ±0.6 % FSR
Gain Error Full ±0.2 ±3.0 ±0.2 ±3.0 % FSR
Differential Nonlinearity (DNL)
1
Full ±0.9 ±0.9 LSB
25°C ±0.4 ±0.4 LSB
Integral Nonlinearity (INL)
1
Full ±5.0 ±5.0 LSB
25°C ±2.0 ±2.0 LSB
MATCHING CHARACTERISTIC
Offset Error Full ±0.3 ±0.6 ±0.4 ±0.7 % FSR
Gain Error Full ±0.1 ±0.5 ±0.1 ±0.5 % FSR
TEMPERATURE DRIFT
Offset Error Full ±15 ±15 ppm/°C
Gain Error Full ±95 ±95 ppm/°C
INTERNAL VOLTAGE REFERENCE
Output Voltage Error (1 V Mode) Full ±2 ±15 ±2 ±15 mV
Load Regulation @ 1.0 mA Full 7 7 mV
INPUT REFERRED NOISE
VREF = 1.0 V 25°C 1.3 1.3 LSB rms
ANALOG INPUT
Input Span, VREF = 1.0 V Full 2 2 V p-p
Input Capacitance
2
Full 8 8 pF
VREF INPUT RESISTANCE Full 6 6 kΩ
POWER SUPPLIES
3
Supply Voltage
AVDD, DVDD Full 1.7 1.8 1.9 1.7 1.8 1.9 V
DRVDD (CMOS Mode) Full 1.7 3.3 3.6 1.7 3.3 3.6 V
DRVDD (LVDS Mode) Full 1.7 1.8 1.9 1.7 1.8 1.9 V
Supply Current
1, 4
IAVDD
1, 4
IDVDD
IDRVDD1 (3.3 V CMOS)
IDRVDD1 (1.8 V CMOS)
IDRVDD1 (1.8 V LVDS)
Full 233 310 mA
Full 26
277
34
371
Full 27 35 mA
Full 12 18 mA
Full 54 55 mA
POWER CONSUMPTION
DC Input Full 452 492 603 657 mW
Sine Wave Input1 (DRVDD = 1.8 V)
Sine Wave Input1 (DRVDD = 3.3 V)
Standby Power
5
Full 487 645 mW
Full 550 730 mW
Full 52 68 mW
Power-Down Power Full 2.5 6 2.5 6 mW
1
Measured with a low input frequency, full-scale sine wave, with approximately 5 pF loading on each output bit.
2
Input capacitance refers to the effective capacitance between one differential input pin and AGND. See Figure 8 for the equivalent analog input structure.
3
To guarantee proper operation, the DRVDD supply should be applied prior to the AVDD/DVDD supplies. See the Power Supply Sequence section in the Applications
Information section for more information about this requirement.
4
The maximum limit applies to the combination of IAVDD and IDVDD currents.
5
Standby power is measured with a dc input and with the CLK pins inactive (set to AVDD or AGND).
Unit
mA
Rev. 0 | Page 4 of 48
Page 5
AD9640
www.BDTIC.com/ADI
ADC DC SPECIFICATIONS—AD9640BCPZ-125 AND AD9640BCPZ-150
AVDD = 1.8 V, DVDD = 1.8 V, DRVDD = 3.3 V, maximum sample rate, VIN = −1.0 dBFS differential input, 1.0 V internal reference,
DCS enabled, fast detect outputs disabled, and signal monitor disabled, unless otherwise noted.
Table 2.
AD9640BCPZ-125 AD9640BCPZ-150
Parameter Temperature
Min Typ Max Min Typ Max
RESOLUTION Full 14 14 Bits
ACCURACY
No Missing Codes Full Guaranteed Guaranteed
Offset Error Full ±0.3 ±0.6 ±0.3 ±0.6 % FSR
Gain Error Full ±0.2 ±3.0 ±0.2 ±3.0 % FSR
Differential Nonlinearity (DNL)
1
Full ±0.9 −0.95/+1.5 LSB
25°C ±0.4 −0.4/+0.6 LSB
Integral Nonlinearity (INL)
1
Full ±5.0 ±5.0 LSB
25°C ±2 ±2 LSB
MATCHING CHARACTERISTIC
Offset Error Full ±15 ±15 ppm/°C
Gain Error Full ±95 ±95 ppm/°C
INTERNAL VOLTAGE REFERENCE
Output Voltage Error (1 V Mode) Full ±2 ±15 ±3 ±15 mV
Load Regulation @ 1.0 mA Full 7 7 mV
INPUT REFERRED NOISE
VREF = 1.0 V 25°C 1.3 1.3 LSB rms
ANALOG INPUT
Input Span, VREF = 1.0 V Full 2 2 V p-p
Input Capacitance2
Full 8 8 pF
VREF INPUT RESISTANCE Full 6 6 kΩ
POWER SUPPLIES
3
Supply Voltage
AVDD, DVDD Full 1.7 1.8 1.9 1.7 1.8 1.9 V
DRVDD (CMOS Mode) Full 1.7 3.3 3.6 1.7 3.3 3.6 V
DRVDD (LVDS Mode) Full 1.7 1.8 1.9 1.7 1.8 1.9 V
Supply Current
1, 4
IAVDD
1, 4
IDVDD
IDRVDD1 (3.3 V CMOS)
IDRVDD1 (1.8 V CMOS)
IDRVDD1 (1.8 V LVDS)
Full 385 419 mA
Full 42
470
50
517
Full 44 53 mA
Full 22 27 mA
56 57
POWER CONSUMPTION
DC Input Full 750 846 820 938 mW
Sine Wave Input1 (DRVDD = 1.8 V)
Sine Wave Input1 (DRVDD = 3.3 V)
Standby Power
5
Full 810 895 mW
Full 910 1000 mW
Full 77 77 mW
Power-Down Power Full 2.5 6 2.5 6 mW
1
Measured with a low input frequency, full-scale sine wave, with approximately 5 pF loading on each output bit.
2
Input capacitance refers to the effective capacitance between one differential input pin and AGND. See Figure 8 for the equivalent analog input structure.
3
To guarantee proper operation, the DRVDD supply should be applied prior to the AVDD/DVDD supplies. See the Power Supply Sequence section in the Applications
Information section for more information about this requirement.
4
The maximum limit applies to the combination of IAVDD and IDVDD currents.
5
Standby power is measured with a dc input and with the CLK pins inactive (set to AVDD or AGND).
Unit
mA
Rev. 0 | Page 5 of 48
Page 6
AD9640
www.BDTIC.com/ADI
ADC AC SPECIFICATIONS—AD9640BCPZ-80 AND AD9640BCPZ-105
AVDD = 1.8 V, DVDD = 1.8 V, DRVDD = 3.3 V, maximum sample rate, VIN = −1.0 dBFS differential input, 1.0 V internal reference,
DCS enabled, fast detect outputs disabled, and signal monitor disabled, unless otherwise noted.
Table 3.
Parameter
SIGNAL-TO-NOISE RATIO (SNR)
fIN = 2.3 MHz 25°C 72.5 72.3 dB
fIN = 70 MHz 25°C 72.1 71.9 dB
Full 70.5 70.2 dB
fIN = 140 MHz 25°C 71.6 71.3 dB
fIN = 200 MHz 25°C 71.0 70.3 dB
SIGNAL-TO-NOISE AND DISTORTION (SINAD)
fIN = 2.3 MHz 25°C 72.2 72.0 dB
fIN = 70 MHz 25°C 71.6 71.6 dB
Full 69 69.5 dB
fIN = 140 MHz 25°C 71.1 70.9 dB
fIN = 200 MHz 25°C 70.4 70.0 dB
EFFECTIVE NUMBER OF BITS (ENOB)
fIN = 2.3 MHz 25°C 11.9 11.8 Bits
fIN = 70 MHz 25°C 11.8 11.8 Bits
fIN = 140 MHz 25°C 11.7 11.7 Bits
fIN = 200 MHz 25°C 11.6 11.5 Bits
WORST SECOND OR THIRD HARMONIC
fIN = 2.3 MHz 25°C −87 −87 dBc
fIN = 70 MHz 25°C −85 −85 dBc
Full −75 −74 dBc
fIN = 140 MHz 25°C −84 −84 dBc
fIN = 200 MHz 25°C −83 −83 dBc
SPURIOUS-FREE DYNAMIC RANGE (SFDR)
fIN = 2.3 MHz 25°C 87 87 dBc
fIN = 70 MHz 25°C 85 85 dBc
Full 75 74 dBc
fIN = 140 MHz 25°C 84 84 dBc
fIN = 200 MHz 25°C 83 83 dBc
WORST OTHER HARMONIC OR SPUR
fIN = 2.3 MHz 25°C −93 −93 dBc
fIN = 70 MHz 25°C −89 −89 dBc
Full −82 −81 dBc
fIN = 140 MHz 25°C −89 −89 dBc
fIN = 200 MHz 25°C −89 −89 dBc
See Application Note835 AN-, Understanding High Speed ADC Testing and Evaluation, for a complete set of definitions.
2
Crosstalk is measured at 100 MHz with −1 dBFS on one channel and no input on the alternate channel.
1
2
Temperature
Full −95 −95 dB
AD9640BCPZ-125 AD9640BCPZ-150
Min Typ Max Min Typ Max
Unit
Rev. 0 | Page 7 of 48
Page 8
AD9640
www.BDTIC.com/ADI
DIGITAL SPECIFICATIONS
AVDD = 1.8 V, DVDD = 1.8 V, DRVDD = 3.3 V, maximum sample rate, −1.0 dBFS differential input, 1.0 V internal reference, and
DCS enabled, unless otherwise noted.
Table 5.
AD9640BCPZ-80/-105/-125/-150
Parameter Temperature Min Typ Max Unit
DIFFERENTIAL CLOCK INPUTS (CLK+, CLK−)
Logic Compliance CMOS/LVDS/LVPECL
Internal Common-Mode Bias Full 1.2 V
Differential Input Voltage Full 0.2 6 V p-p
Input Voltage Range Full
Input Common-Mode Range Full 1.1 AVDD V
High Level Input Voltage Full 1.2 3.6 V
Low Level Input Voltage Full 0 0.8 V
High Level Input Current Full −10 +10 μA
Low Level Input Current Full −10 +10 μA
Input Capacitance Full 4 pF
Input Resistance Full 8 10 12 kΩ
SYNC INPUT
Logic Compliance CMOS
Internal Bias Full 1.2 V
Input Voltage Range Full AVDD − 0.3 AVDD + 1.6 V
High Level Input Voltage Full 1.2 3.6 V
Low Level Input Voltage Full 0 0.8 V
High Level Input Current Full −10 +10 μA
Low Level Input Current Full −10 +10 μA
Input Capacitance Full 4 pF
Input Resistance Full 8 10 12 kΩ
LOGIC INPUT (CSB)1
High Level Input Voltage Full 1.22 3.6 V
Low Level Input Voltage Full 0 0.6 V
High Level Input Current Full −10 +10 μA
Low Level Input Current Full 40 132 μA
Input Resistance Full 26 kΩ
Input Capacitance Full 2 pF
LOGIC INPUT (SCLK/DFS)2
High Level Input Voltage Full 1.22 3.6 V
Low Level Input Voltage Full 0 0.6 V
High Level Input Current (VIN = 3.3 V) Full −92 −135 μA
Low Level Input Current Full −10 +10 μA
Input Resistance Full 26 kΩ
Input Capacitance Full 2 pF
LOGIC INPUTS/OUTPUTS (SDIO/DCS, SMI SDFS)
High Level Input Voltage Full 1.22 3.6 V
Low Level Input Voltage Full 0 0.6 V
High Level Input Current Full −10 +10 μA
Low Level Input Current Full 38 128 μA
Input Resistance Full 26 kΩ
Input Capacitance Full 5 pF
LOGIC INPUTS/OUTPUTS (SMI SDO/OEB, SMI SCLK/PDWN)
High Level Input Voltage Full 1.22 3.6 V
Low Level Input Voltage Full 0 0.6 V
High Level Input Current (VIN = 3.3 V) Full −90 −134 μA
Low Level Input Current Full −10 +10 μA
1
2
AVDD − 0.3
AVDD + 1.6 V
Rev. 0 | Page 8 of 48
Page 9
AD9640
www.BDTIC.com/ADI
AD9640BCPZ-80/-105/-125/-150
Parameter Temperature Min Typ Max Unit
Input Resistance Full 26 kΩ
Input Capacitance Full 5 pF
DIGITAL OUTPUTS
CMOS Mode—DRVDD = 3.3 V
High Level Output Voltage (IOH = 50 μA) Full 3.29 V
High Level Output Voltage (IOH = 0.5 mA) Full 3.25 V
Low Level Output Voltage (IOL = 1.6 mA) Full 0.2 V
Low Level Output Voltage (IOL = 50 μA) Full 0.05 V
CMOS Mode—DRVDD = 1.8 V
High Level Output Voltage (IOH = 50 μA) Full 1.79 V
High Level Output Voltage (IOH = 0.5 mA) Full 1.75 V
Low Level Output Voltage (IOL = 1.6 mA) Full 0.2 V
Low Level Output Voltage (IOL = 50 μA) Full 0.05 V
LVDS Mode—DRVDD = 1.8 V
Differential Output Voltage (VOD), ANSI Mode Full 250 350 450 mV
Output Offset Voltage (VOS), ANSI Mode Full 1.15 1.25 1.35 V
Differential Output Voltage (VOD), Reduced Swing Mode Full 150 200 280 mV
Output Offset Voltage (VOS), Reduced Swing Mode Full 1.15 1.25 1.35 V
1
Pull up.
2
Pull down.
SWITCHING SPECIFICATIONS—AD9640BCPZ-80 AND AD9640BCPZ-105
Channel A/Channel B
Aperture Delay (tA) Full 1.0 1.0 ns
Aperture Uncertainty (Jitter, tJ) Full 0.1 0.1 ps rms
Wake-Up Time
3
Full 350 350 μs
OUT-OF-RANGE RECOVERY TIME Full 3 3 Cycles
1
Conversion rate is the clock rate after the divider.
2
Output propagation delay is measured from CLK 50% transition to DATA 50% transition, with 5 pF load.
3
Wake-up time is dependent on the value of the decoupling capacitors.
Min Typ Max Min Typ Max
Unit
Unit
Rev. 0 | Page 10 of 48
Page 11
AD9640
C
A
www.BDTIC.com/ADI
TIMING SPECIFICATIONS
Table 8.
AD9640BCPZ-80/-105/-125/-150
Parameter Conditions Min Typ Max Unit
SYNC TIMING REQUIREMENTS
t
SYNC to rising edge of CLK setup time 0.24 ns
SSYNC
t
SYNC to rising edge of CLK hold time 0.40 ns
HSYNC
SPI TIMING REQUIREMENTS
tDS Setup time between the data and the rising edge of SCLK 2 ns
tDH Hold time between the data and the rising edge of SCLK 2 ns
t
Period of the SCLK 40 ns
CLK
tS Setup time between CSB and SCLK 2 ns
tH Hold time between CSB and SCLK 2 ns
t
SCLK pulse width high 10 ns
HIGH
t
SCLK pulse width low 10 ns
LOW
t
Time required for the SDIO pin to switch from an input to an output
EN_SDIO
relative to the SCLK falling edge
t
Time required for the SDIO pin to switch from an output to an input
DIS_SDIO
relative to the SCLK rising edge
SPORT TIMING REQUIREMENTS
t
Delay from rising edge of CLK+ to rising edge of SMI SCLK 3.2 4.5 6.2 ns
CSSCLK
t
Delay from rising edge of SMI SCLK to SMI SDO −0.4 0 0.4 ns
SSCLKSDO
t
Delay from rising edge of SMI SCLK to SMI SDFS −0.4 0 0.4 ns
SSCLKSDFS
Timing Diagrams
N+2
CLK+
CLK–
H A/B DAT
N+ 1
N
t
A
t
CLK
t
PD
N – 12N – 11N – 9N – 8N – 7N – 6N – 5N – 4
N – 13
N+ 3
N – 10
N+ 4
N+ 5
N+ 6
10 ns
10 ns
N+ 8
N+ 7
CH A/B FAST
DETECT
DCO A/B
t
S
N – 1N + 2N + 3N + 4N + 5N + 6N – 3N – 2
t
H
N
Figure 2. CMOS Output Mode Data and Fast Detect Outp
Rev. 0 | Page 11 of 48
t
DCO
N + 1
t
CLK
ut Timing (Fast Detect Mode 0)
06547-021
Page 12
AD9640
C
www.BDTIC.com/ADI
N
t
A
CLK+
CLK–
H A/B DATA
CH A/B FAST
DETECT
DCO+
DCO–
t
PD
ABABABABABABABABAAB
N – 12N – 11N – 9N – 8N – 7N – 6N – 5N – 4
N – 13
ABABABABABABABABAAB
N – 6N – 5N – 3N – 2N – 1NN + 1N + 2N – 7
t
S
Figure 3. LVDS Mode Data and Fast Detect Output Timing (Fa
N+ 1
t
CLK
N+2
t
H
N+ 3
N – 10
N – 4
N+ 4
N+ 5
N+ 6
t
DCO
t
CLK
N+ 7
N+ 8
06547-089
st Detect Mode 1 Through Fast Detect Mode 5)
CLK+
CLK+
CLK–
SMI SCLK
SMI SDFS
t
CSSCLK
t
SSYNC
SYNC
Figure 4. SYNC Input Timing Requirements
t
SSCLKSDFS
Figure 5. Signal Monitor SPORT Out
t
HSYNC
t
SSCLKSDO
DATADATASMI SDO
put Timing (Divide by 2 Mode)
06547-072
06547-082
Rev. 0 | Page 12 of 48
Page 13
AD9640
www.BDTIC.com/ADI
ABSOLUTE MAXIMUM RATINGS
Table 9.
Parameter Rating
ELECTRICAL
AVDD, DVDD to AGND −0.3 V to +2.0 V
DRVDD to DRGND −0.3 V to +3.9 V
AGND to DRGND −0.3 V to +0.3 V
AVDD to DRVDD −3.9 V to +2.0 V
VIN+A/VIN+B, VIN−A/VIN−B to AGND −0.3 V to AVDD + 0.2 V
CLK+, CLK− to AGND −0.3 V to +3.9 V
SYNC to AGND −0.3 V to +3.9 V 0 18.8 0.6 6.0 °C/W
VREF to AGND −0.3 V to AVDD + 0.2 V
SENSE to AGND −0.3 V to AVDD + 0.2 V
CML to AGND −0.3 V to AVDD + 0.2 V
RBIAS to AGND −0.3 V to AVDD + 0.2 V
CSB to AGND −0.3 V to +3.9 V
SCLK/DFS to DRGND −0.3 V to + 3.9 V
SDIO/DCS to DRGND −0.3 V to DRVDD + 0.3 V
SMI SDO/OEB −0.3 V to DRVDD + 0.3 V
SMI SCLK/PDWN −0.3 V to DRVDD + 0.3 V
SMI SDFS −0.3 V to DRVDD + 0.3 V
D0A/D0B through D13A/D13B to
DRGND
FD0A/FD0B through FD3A/FD3B to
DRGND
DCOA/DCOB to DRGND
−0.3 V to DRVDD + 0.3 V
−0.3 V to DRVDD + 0.3 V
−0.3 V to DRVDD + 0.3 V
ENVIRONMENTAL
Operating Temperature Range
−40°C to +85°C
(Ambient)
Maximum Junction Temperature
150°C
Under Bias
Storage Temperature Range
Ambient)
(
−65°C to +150°C
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
THERMAL CHARACTERISTICS
The exposed paddle must be soldered to the ground plane for
the LFCSP package. Soldering the exposed paddle to the customer
board increases the reliability of the solder joints and maximizes
the thermal capability of the package.
Table 10. Thermal Resistance
Airflow
Package
Typ e
Ve
lo city
(m/s)
1, 2
JA
1, 3
θ
JC
1, 4
θ
Unit θ
JB
64-lead LFCSP
9 mm × 9 mm
(CP-64-3)
1
JEDEC 51-7, plus JEDEC 25-5 2S2P test board.
2
Per JEDEC JESD51-2 (still air) or JEDEC JESD51-6 (moving air).
3
Per MIL-Std 883, Method 1012.1.
4
Per JEDEC JESD51-8 (still air).
1.0 16.5
°C/W
2.0 15.8 °C/W
Typical θJA is specified for a 4-layer PCB with a solid ground
plane. As shown, airflow improves heat dissipation, which
reduces θ
. In addition, metal in direct contact with the
JA
package leads from metal traces, through holes, ground, and
power planes, reduces the θ
.
JA
ESD CAUTION
Rev. 0 | Page 13 of 48
Page 14
AD9640
www.BDTIC.com/ADI
PIN CONFIGURATIONS AND FUNCTION DESCRIPTIONS
DRGND
D5B
D4B
D3B
D2B
D1B
D0B (LSB)
DVDD
FD3B
FD2B
FD1B
FD0B
SYNC
CSB
CLK–
646362616059585756555453525150
CLK+
49
DRVDD
1
D6B
2
D7B
3
D8B
4
D9B
5
D10B
6
D11B
7
D12B
DCOB
DCOA
D1A
D2A
D3A
D4A
8
9
10
11
12
13
14
15
16
D13B (MSB)
D0A (LSB)
NC = NO CONNECT
Figure 6. Pin Configuration, LFCS
PIN 1
INDICATOR
EXPOSED PADDLE, PIN 0
(BOTTOM OF PACKAGE)
AD9640
PARALLEL CMOS
TOP VIEW
(Not to Scal e)
171819202122232425262728293031
D5A
D6A
D7A
D8A
D9A
D11A
D10A
D12A
FD0A
DRGND
DVDD
DRVDD
FD1A
D13A (MSB)
P Parallel CMOS (Top View)
48
SCLK/DFS
47
SDIO/DCS
46
AVD D
45
AVD D
44
VIN+B
43
VIN–B
42
RBIAS
41
CML
40
SENSE
39
VREF
38
VIN–A
37
VIN+A
36
AVD D
35
SMI SDFS
34
SMI SCLK/PDWN
33
SMI SDO/OEB
32
FD2A
FD3A
06547-002
Table 11. Pin Function Descriptions (Parallel CMOS Mode)
Pin No. Mnemonic Type Description
ADC Power Supplies
20, 64 DRGND Ground Digital Output Ground.
1, 21 DRVDD Supply Digital Output Driver Supply (1.8 V to 3.3 V).
24, 57 DVDD Supply
36, 45, 46 AVDD Supply
0 AGND Ground
Digital Power Supply (1.8 V Nominal).
Analog Power Supply (1.8 V Nominal).
Analog Ground. Pin 0 is the exposed thermal pad on the bottom of the package.
ADC Analog
37 VIN+A Input Differential Analog Input Pin (+) for Channel A.
38 VIN−A Input Differential Analog Input Pin (−) for Channel A.
44 VIN+B Input
43 VIN−B Input
39 VREF Input/Output
40 SENSE Input
42 RBIAS Input/Output
41 CML Output
49 CLK+ Input
50 CLK− Input
Differential Analog Input Pin (+) for Channel B.
Differential Analog Input Pin (−) for Channel B.
Voltage Reference Input/Output.
Voltage Reference Mode Select. See Table 1 4 for details.
External Reference Bias Resistor.
Common Mode Level Bias Output for Analog Inputs.
ADC Clock Input—True.
ADC Clock Input—Complement.
ADC Fast Detect Outputs
29 FD0A Output Channel A Fast Detect Indicator. See Table 17 for details.
30 FD1A Output Channel A Fast Detect Indicator. See Table 17 for details.
31 FD2A Output
32 FD3A Output
53 FD0B Output
54 FD1B Output
55 FD2B Output
56 FD3B Output
Channel A Fast Detect Indicator. See Table 1 7 for details.
Channel A Fast Detect Indicator. See Table 1 7 for details.
Channel B Fast Detect Indicator. See Table 17 for details.
Channel B Fast Detect Indicator. See Table 17 for details.
Channel B Fast Detect Indicator. See Table 17 for details.
Channel B Fast Detect Indicator. See Table 17 for details.
Digital Inputs
52 SYNC Input Digital Synchronization Pin. Slave mode only.
Rev. 0 | Page 14 of 48
Page 15
AD9640
www.BDTIC.com/ADI
Pin No. Mnemonic Type Description
Digital Outputs
12 D0A (LSB) Output Channel A CMOS Output Data.
13 D1A Output Channel A CMOS Output Data.
14 D2A Output Channel A CMOS Output Data.
15 D3A Output Channel A CMOS Output Data.
16 D4A Output Channel A CMOS Output Data.
17 D5A Output Channel A CMOS Output Data.
18 D6A Output Channel A CMOS Output Data.
19 D7A Output Channel A CMOS Output Data.
22 D8A Output Channel A CMOS Output Data.
23 D9A Output Channel A CMOS Output Data.
25 D10A Output Channel A CMOS Output Data.
26 D11A Output Channel A CMOS Output Data.
27 D12A Output Channel A CMOS Output Data.
28 D13A (MSB) Output Channel A CMOS Output Data.
58 D0B (LSB) Output Channel B CMOS Output Data.
59 D1B Output Channel B CMOS Output Data.
60 D2B Output Channel B CMOS Output Data.
61 D3B Output Channel B CMOS Output Data.
62 D4B Output Channel B CMOS Output Data.
63 D5B Output Channel B CMOS Output Data.
2 D6B Output Channel B CMOS Output Data.
3 D7B Output Channel B CMOS Output Data.
4 D8B Output Channel B CMOS Output Data.
5 D9B Output Channel B CMOS Output Data.
6 D10B Output Channel B CMOS Output Data.
7 D11B Output Channel B CMOS Output Data.
8 D12B Output Channel B CMOS Output Data.
9 D13B (MSB) Output Channel B CMOS Output Data.
11 DCOA Output Channel A Data Clock Output.
10 DCOB Output Channel B Data Clock Output.
SPI Control
48 SCLK/DFS Input SPI Serial Clock/Data Format Select Pin in External Pin Mode.
47 SDIO/DCS Input/Output SPI Serial Data I/O/Duty Cycle Stabilizer in External Pin Mode.
51 CSB Input SPI Chip Select (Active Low).
Serial Port
33 SMI SDO/OEB Input/Output Signal Monitor Serial Data Output/Output Enable Input (Active Low) in External Pin Mode.
35 SMI SDFS Output Signal Monitor Serial Data Frame Sync.
34 SMI SCLK/PDWN Input/Output Signal Monitor Serial Clock Output/Power-Down Input in External Pin Mode.
Table 12. Pin Function Descriptions (Interleaved Parallel LVDS Mode)
Pin No. Mnemonic Type Function
ADC Power Supplies
20, 64 DRGND Ground Digital Output Ground.
1, 21 DRVDD Supply Digital Output Driver Supply (1.8 V to 3.3 V).
24, 57 DVDD Supply Digital Power Supply (1.8 V Nominal).
36, 45, 46 AVDD Supply Analog Power Supply (1.8 V Nominal).
0 AGND Ground Analog Ground. Pin 0 is the exposed thermal pad on the bottom of the package.
ADC Analog
37 VIN+A Input Differential Analog I
nput Pin (+) for Channel A.
38 VIN−A Input Differential Analog Input Pin (−) for Channel A.
44 VIN+B Input
43 VIN−B Input
39 VREF Input/Output
40 SENSE Input
42 RBIAS Input/Output
41 CML Output
49 CLK+ Input
50 CLK− Input
Differential Analog Input Pin (+) for Channel B.
Differential Analog Input Pin (−) for Channel B.
Voltage Reference Input/Output.
Voltage Reference Mode Select. See Table 1 4 for details.
External Reference Bias Resistor.
Common-Mode Level Bias Output for Analog Inputs.
ADC Clock Input—True.
ADC Clock Input—Complement.
ADC Fast Detect Outputs
54 FD0+ Output Channel A/Channel B LVDS Fast Detect Indicator 0—True. See Table 17 for details.
53 FD0− Output Channel A/Channel B LVDS Fast Detect Indicator 0—Complement. See Table 17 for details.
56 FD1+ Output
55 FD1− Output
59 FD2+ Output
58 FD2− Output
61 FD3+ Output
60 FD3− Output
Channel A/Channel B LVDS Fast Detect Indicator 1—True. See Table 17 for details.
Channel A/Channel B LVDS Fast Detect Indicator 1—Complement. See Tab le 17 for details.
Channel A/Channel B LVDS Fast Detect Indicator 2—True. See Table 17 for details.
Channel A/Channel B LVDS Fast Detect Indicator 2—Complement. See Tab le 17 for details.
Channel A/Channel B LVDS Fast Detect Indicator 3—True. See Table 17 for details.
Channel A/Channel B LVDS Fast Detect Indicator 3—Complement. See Tab le 17 for details.
Digital Inputs
52 SYNC Input Digital Synchronization Pin. Slave mode only.
Rev. 0 | Page 16 of 48
Page 17
AD9640
www.BDTIC.com/ADI
Pin No. Mnemonic Type Function
Digital Outputs
63 D0+ Output Channel A/Channel B LVDS Output Data 0—True.
62 D0− Output Channel A/Channel B LVDS Output Data 0—Complement.
3 D1+ Output Channel A/Channel B LVDS Output Data 1—True.
2 D1− Output Channel A/Channel B LVDS Output Data 1—Complement.
5 D2+ Output Channel A/Channel B LVDS Output Data 2—True.
4 D2− Output Channel A/Channel B LVDS Output Data 2—Complement.
7 D3+ Output Channel A/Channel B LVDS Output Data 3—True.
6 D3− Output Channel A/Channel B LVDS Output Data 3—Complement.
9 D4+ Output Channel A/Channel B LVDS Output Data 4—True.
8 D4− Output Channel A/Channel B LVDS Output Data 4—Complement.
13 D5+ Output Channel A/Channel B LVDS Output Data 5—True.
12 D5− Output Channel A/Channel B LVDS Output Data 5—Complement.
15 D6+ Output Channel A/Channel B LVDS Output Data 6 —True.
14 D6− Output Channel A/Channel B LVDS Output Data 6—Complement.
17 D7+ Output Channel A/Channel B LVDS Output Data 7—True.
16 D7− Output Channel A/Channel B LVDS Output Data 7—Complement.
19 D8+ Output Channel A/Channel B LVDS Output Data 8—True.
18 D8− Output Channel A/Channel B LVDS Output Data 8—Complement.
23 D9+ Output Channel A/Channel B LVDS Output Data 9—True.
22 D9− Output Channel A/Channel B LVDS Output Data 9—Complement.
26 D10+ Output Channel A/Channel B LVDS Output Data 10—True.
25 D10− Output Channel A/Channel B LVDS Output Data 10—Complement.
28 D11+ Output Channel A/Channel B LVDS Output Data 11—True.
27 D11− Output Channel A/Channel B LVDS Output Data 11—Complement.
30 D12+ Output Channel A/Channel B LVDS Output Data 12—True.
29 D12− Output Channel A/Channel B LVDS Output Data 12—Complement.
32 D13+ Output Channel A/Channel B LVDS Output Data 13—True.
31 D13− Output Channel A/Channel B LVDS Output Data 13—Complement.
11 DCO+ Output Channel A/Channel B LVDS Data Clock Output—True.
10 DCO− Output Channel A/Channel B LVDS Data Clock Output—Complement.
SPI Control
48 SCLK/DFS Input SPI Serial Clock/Data Format Select Pin in External Pin Mode.
47 SDIO/DCS Input/Output SPI Serial Data I/O/Duty Cycle Stabilizer in External Pin Mode.
51 CSB Input SPI Chip Select (Active Low).
Signal Monitor Ports
33 SMI SDO/OEB Input/Output Signal Monitor Serial Data Output/Output Enable Input (Active Low) in External Pin Mode.
35 SMI SDFS Output Signal Monitor Serial Data Frame Sync.
34 SMI SCLK/PDWN Input/Output Signal Monitor Serial Clock Output/Power-Down Input in External Pin Mode.
Rev. 0 | Page 17 of 48
Page 18
AD9640
V
C
A
V
S
www.BDTIC.com/ADI
EQUIVALENT CIRCUITS
IN
06547-004
SCLK/DFS
26kΩ
1kΩ
06547-011
LK+
AVDD
1.2V
10kΩ10kΩ
Figure 9. Equivalent Clock Input Circuit
DRVDD
DRGND
6547-081
Figure 10. Digital Output
CLK–
Figure 12. Equivalent SCLK
SENSE
06547-005
1kΩ
/DFS Input Circuit Figure 8. Equivalent Analog Input Circuit
06547-009
Figure 13. Equivalent SENSE Circuit
VDD
26kΩ
CSB
1kΩ
06547-010
Figure 14. Equivalent CSB Input Circuit
DRVDD
DRVDD
26kΩ
DIO/DCS
1kΩ
06547-007
Figure 11. Equivalent SDIO/DCS or SMI SDFS Circuit
Rev. 0 | Page 18 of 48
AVDD
REF
6kΩ
06547-096
Figure 15. Equivalent VREF Circuit
Page 19
AD9640
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TYPICAL PERFORMANCE CHARACTERISTICS
AVDD = 1.8 V; DVDD = 1.8 V; DRVDD = 3.3 V; sample rate = 150 MSPS, DCS enabled, 1 V internal reference;
2 V p-p differential input; VIN = −1.0 dBFS; and 64k sample; T
Figure 28. AD9640-150 Single Tone SNR/SFDR vs. Input Amplitude (AIN)
= 2.3 MHz
with f
IN
120
100
80
60
40
SNR/SFDR (dBc AND dBFS)
20
0
–90 –80–70–60 – 50 –40 –30–20–10
SFDR (dBFS )
SNR (dBFS)
SFDR (dBc)
SNR (dBc)
85dB REFERENCE L INE
INPUT AMPLITUDE (dBF S)
Figure 29. AD9640-150 Single Tone SFDR vs. Input Amplitude with
= 98.12 MHz
f
IN
95
95
90
85
80
75
SNR/SF DR (dBc)
06547-061
0
70
65
60
SNR = –40°C
SNR = +25°C
0
SFDR = +25°C
SFDR = –40°C
SFDR = +85°C
SNR = +85°C
INPUT FREQ UENCY (MHz)
Figure 31. AD9640-150 Single Tone SNR/SFDR vs.
Input Frequ
0.8
0.6
0.4
0.2
0
–0.2
–0.4
–0.6
GAIN/OF FSET ERROR (%FSR)
–0.8
06547-062
0
–1.0
–40
) and Temperature with 1 V p-p Full Scale
ency (f
IN
OFFSET
GAIN
–20020406080
TEMPERATURE ( °C)
Figure 32. AD9640 Gain and Offset vs. Temperature
0
06547-088
45050100 150200250 3 00 350 400
06547-098
SNR/SFDR (dBc)
90
85
80
75
70
65
60
0
SNR = –40°C
SNR = +25°C
SFDR = +25°C
SFDR = +85°C
SNR = +85°C
INPUT FREQ UENCY (MHz)
SFDR = –40°C
06547-087
45050100 150200250 3 00 350 400
Figure 30. AD9640-150 Single Tone SNR/SFDR vs.
) and Temperature with 2 V p-p Full Scale
Input Frequ
ency (f
IN
Rev. 0 | Page 21 of 48
–20
–40
–60
–80
SNR/SFDR (dBc AND d BFS)
–1
00
–120
–90–78–66–54–42–30–18
SFDR (dBc)
IMD3 (dBc)
SFDR (dBFS)
IMD3 (dBFS )
–6
INPUT AMPLITUDE (dBF S)
Figure 33. AD9640-150 Two Tone SFDR/IMD3 vs. Input Amplitude (A
with f
= 29.1 MHz, f
IN1
= 32.1 MHz, fS = 150 MSPS
IN2
06547-063
)
IN
Page 22
AD9640
www.BDTIC.com/ADI
0
–20
–40
–60
IMD3 (dBFS)
–80
SNR/SFDR (dBc AND dBFS)
–100
–120
–90–78–66–54–42–30–18
SFDR (dBc)
IMD3 (dBc)
SFDR (dBFS)
INPUT AMPLITUDE (dBF S)
Figure 34. AD9640-150 Two Tone SFDR/IMD3 vs. Input Amplitude (A
–20
–40
–60
with f
0
= 169.1 MHz, f
IN1
= 172.1 MHz, fS = 150 MSPS
IN2
0
–20
–40
–60
–80
AMPLITUDE (dBFS)
–100
06547-064
–6
)
IN
–120
10203040507060
0
FREQUENCY (M Hz)
Figure 37. AD9640-150 Two Tone FFT with f
= 172.1 MHz
f
IN2
0
–20
–40
–60
150 MSPS
169.1MHz @–7dBF S
172.1MHz @–7dBF S
SFDR = 83.8d Bc (90.8dBF S)
= 169.1 MHz and
IN1
NPR = 64.7dBc
NOTCH @ 18.5MHz
NOTCH WIDT H = 3MHz
06547-066
–80
AMPLITUDE (dBFS)
–100
–120
061.44
15.3630. 7246. 08
FREQUENCY (M Hz)
Figure 35. AD9640-125, Two 64 k WCDMA Carriers
= 170 MHz, fS = 122.88 MSPS
with f
IN
0
–20
–40
–60
–80
AMPLITUDE (dBFS)
–100
–120
010203040507060
FREQUENCY (M Hz)
Figu re 36. AD9640-150 Two Tone FFT with f
150 MSPS
29.1MHz @–7dBFS
32.1MHz @–7dBFS
SFDR = 86.1d Bc (93dBFS)
= 29.1 MHz and f
IN1
IN2
–80
AMPLITUDE (dBFS)
–100
06547-102
20
–1
0
15.62531.2546.875
FREQUENCY (M Hz)
Figure 38. AD9640 Noise Power Ratio (NPR)
100
95
SFDR - SIDE A
SFDR - SIDE B
0150
255075100125
CLOCK FREQ UENCY (Msps)
= 2.3 MHz
with f
IN
06547-065
= 32.1 MHz
90
85
SNR/SFDR (dBc)
80
75
70
Figure 39. AD9640-125 Single Tone SNR/SFDR vs. Clock Frequency (f
06547-100
62.5
SNR - SIDE ASNR - SIDE B
06547-067
)
S
Rev. 0 | Page 22 of 48
Page 23
AD9640
www.BDTIC.com/ADI
10
1.3 LSB rms
8
100
95
90
SFDR DCS ON
6
4
NUMBER OF HITS (1M)
2
0
N – 4
N – 3 N – 2 N – 1NN + 1 N + 2 N + 3 N + 4
OUTPUT CODE
06547-079
85
80
75
SNR/SF DR (dBc)
70
65
60
SFDR DCS OFF
2080
4060
DUTY CYCLE (%)
Figure 40. AD9640 Grounded Input Histogram Figure 43. AD9640 SNR/SFDR vs. Duty Cycle with f
2.0
1.5
1.0
0.5
0
–0.5
INL ERROR (L SB)
–1.0
–1.5
–2.0
016,384
2048 4096 61 4410,240 12,288 14,336
Figure 41. AD9640 INL with f
0.5
0.4
0.3
0.2
0.1
0
–0.1
DNL ERROR (LSB)
–0.2
–0.3
–0.4.
–0.5
016,384
2048 4096 61 4410,240 12,288 14,336
Figure 42. AD9640 DNL with f
8192
OUTPUT CODE
8192
OUTPUT CODE
= 10.3 MHz
IN
= 10.3 MHz
IN
06547-068
06547-069
90
SFDR
85
80
SNR/SFDR (dBc)
75
SNR
70
0.51.3
0.60. 70.80.91.01.11. 2
INPUT COMMON-MODE VOLTAGE (V)
Figure 44. AD9640 SNR/SFDR vs. Input Common Mode (VCM) with f
SNR DCS ON
SNR DCS OFF
IN
= 10.3 MHz
= 30 MHz
IN
06547-090
06547-091
Rev. 0 | Page 23 of 48
Page 24
AD9640
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THEORY OF OPERATION
The AD9640 dual ADC design can be used for diversity reception
f signals, where the ADCs are operating identically on the same
o
carrier but from two separate antennae. The ADCs can also be
operated with independent analog inputs. The user can sample
any f
/2 frequency segment from dc to 200 MHz using appropriate
S
low-pass or band-pass filtering at the ADC inputs with little loss
in ADC performance. Operation to 450 MHz analog input is
permitted but occurs at the expense of increased ADC distortion.
In nondiversity applications, the AD9640 can be used as a baseb
and receiver, where one ADC is used for I input data and the
other is used for Q input data.
Synchronizaton capability is provided to allow synchronized
g between multiple channels or multiple devices.
timin
Programming and control of the AD9640 are accomplished
sing a 3-bit SPI-compatible serial interface.
u
A small resistor in series with each input can help reduce the
peak transient current required from the output stage of the
driving source. A shunt capacitor can be placed across the
inputs to provide dynamic charging currents. This passive
network creates a low-pass filter at the ADC input; therefore,
the precise values are dependent on the application.
In intermediate frequency (IF) undersampling applications,
a
ny shunt capacitors should be reduced. In combination with
the driving source impedance, they limit the input bandwidth.
See Application Note AN-742, Frequency Domain Response of
Switched-Capacitor ADCs; Application Note AN-827, A Resonant
Approach to Interfacing Amplifiers to Switched-Capacitor ADCs;
and the Analog Dialogue article, “
d for Wideband A/D Converters” for more information on this
En
sub
ject.
Transformer-Coupled Front-
S
ADC ARCHITECTURE
The AD9640 architecture consists of a dual front-end sampleand-hold amplifier (SHA), followed by a pipelined, switched
capacitor ADC. The quantized outputs from each stage are
combined into a final 14-bit result in the digital correction
logic. The pipelined architecture permits the first stage to
operate on a new input sample, and the remaining stages
operate on preceding samples. Sampling occurs on the rising
edge of the clock.
Each stage of the pipeline, excluding the last, consists of a low
resolution flash ADC connected to a switched capacitor digitalto-analog converter (DAC) and an interstage residue amplifier
(MDAC). The residue amplifier magnifies the difference between
the reconstructed DAC output and the flash input for the next
stage in the pipeline. One bit of redundancy is used in each stage
to facilitate digital correction of flash errors. The last stage
simply consists of a flash ADC.
The input stage of each channel contains a differential SHA that
can be ac- or dc-coupled in differential or single-ended modes.
The output staging block aligns the data, carries out error correction, and passes the data to the output buffers. The output buffers
are powered from a separate supply, allowing adjustment of the
output voltage swing. During power-down, the output buffers go
into a high impedance state.
ANALOG INPUT CONSIDERATIONS
The analog input to the AD9640 is a differential switched
capacitor SHA that has been designed for optimum performance
while processing a differential input signal.
The clock signal alternatively switches the SHA between sample
m
ode and hold mode (see
into sample mode, the signal source must be capable of charging
the sample capacitors and settling within 1/2 of a clock cycle.
Figure 45). When the SHA is switched
C
H
C
H
S
06547-024
VIN+
VIN–
S
C
PIN, PAR
C
PIN, PAR
S
Figure 45. Switched-Capacitor SHA Input
C
H
C
S
S
For best dynamic performance, the source impedances driving
VIN+ and VIN− should be matched.
An internal differential reference buffer creates positive and
ne
gative reference voltages that define the input span of the ADC
core. The span of the ADC core is set by the buffer to 2 × VREF.
Input Common Mode
The analog inputs of the AD9640 are not internally dc biased.
I
n ac-coupled applications, the user must provide this bias
externally. Setting the device so that V
= 0.55 × AVDD
CM
is recommended for optimum performance, but the device
functions over a wider range with reasonable performance
(see
Figure 44). An on-board common-mode voltage reference
cluded in the design and is available from the CML pin.
is in
Optimum performance is achieved when the common-mode
voltage of the analog input is set by the CML pin voltage
(typically 0.55 × AVDD). The CML pin must be decoupled to
ground by a 0.1 µF capacitor, as described in the
In
formation section.
Applications
Differential Input Configurations
Optimum performance is achieved while driving the AD9640
in a
differential input configuration. For baseband applications,
the AD8138 differential driver provides excellent performance
a
nd a flexible interface to the ADC.
Rev. 0 | Page 24 of 48
Page 25
AD9640
A
V
V
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The output common-mode voltage of the AD8138 is easily set
with the CML pin of the AD9640 (see
ca
n be configured in a Sallen-Key filter topology to provide
Figure 46), and the driver
band limiting of the input signal.
499Ω
1V p-p
0.1µF
49.9Ω
499Ω
AD8138
523Ω
499Ω
Figure 46. Differential Input Configuration Using the AD8138
R
C
R
VIN+
AD9640
VIN–
AVDD
CML
For baseband applications where SNR is a key parameter,
differential transformer coupling is the recommended input
configuration. An example is shown in
Figure 47. To bias the
analog input, the CML voltage can be connected to the center
tap of the transformer’s secondary winding.
The signal characteristics must be considered when selecting
a transformer. Most RF transformers saturate at frequencies
below a few MHz, and excessive signal power can also cause
core saturation, which leads to distortion.
At input frequencies in the second Nyquist zone and above, the
oise performance of most amplifiers is not adequate to achieve
n
the true SNR performance of the AD9640. For applications where
SNR is a key parameter, differential double balun coupling is the
recommended input configuration (see
Figure 49 for an example).
06547-025
06547-026
An alternative to using a transformer coupled input at frequencies
in t
he second Nyquist zone is to use the AD8352 differential
driver. An example is shown in
she
et for more information.
Figure 50. See the AD8352 data
In any configuration, the value of Shunt Capacitor C is dependent
on the input frequency and source impedance and may need to
be reduced or removed. Tab l e 1 3 displays recommended values to
s
et the RC network. However, these values are dependent on the
input signal and should be used only as a starting guide.
Table 13. Example RC Network
R Series
Frequency Range (MHz) C Differential (pF)
(Ω Each)
0 to 70 33 15
70 to 200 33 5
200 to 300 15
5
>300 15 Open
Single-Ended Input Configuration
A single-ended input can provide adequate performance in cost
sensitive applications. In this configuration, SFDR and distortion
performance degrade due to the large input common-mode swing.
If the source impedances on each input are matched, there should
be little effect on SNR performance.
Figure 50. Differential Input Configuration Using the AD8352
16
1
2
R
D
G
3
4
5
0Ω
8, 13
AD8352
14
0.1µF
Rev. 0 | Page 25 of 48
R
25Ω
0.1µF
25Ω
0.1µF
11
0.1µF
10
C
R
0.1µF
200Ω
200Ω
R
R
0.1µF
VIN+
AD9640
VIN–
C
CML
VIN+
AD9640
VIN–
CML
06547-028
06547-070
Page 26
AD9640
www.BDTIC.com/ADI
VOLTAGE REFERENCE
A stable and accurate voltage reference is built into the AD9640.
The input range can be adjusted by varying the reference voltage
applied to the AD9640, using either the internal reference or an
externally applied reference voltage. The input span of the ADC
tracks reference voltage changes linearly. The various reference
modes are summarized in the next few sections. The
Deco
upling section describes the best practices PCB layout of
t
he reference.
Internal Reference Connection
A comparator within the AD9640 detects the potential at the
SENSE pin and configures the reference into four possible
modes, which are summarized in Tabl e 14. If SENSE is grounded,
t
he reference amplifier switch is connected to the internal
resistor divider (see
Figure 51), setting VREF to 1 V. Connecting
the SENSE pin to VREF switches the reference amplifier output
to the SENSE pin, completing the loop and providing a 0.5 V
reference output. If a resistor divider is connected external to
the chip, as shown in
S
ENSE pin. This puts the reference amplifier in a noninverting
Figure 52, the switch again sets to the
mode with the VREF output defined as
R2
⎞
⎛
VREF15.0
+×=
⎟
⎜
R1
⎠
⎝
The input range of the ADC always equals twice the voltage at
t
he reference pin for either an internal or an external reference.
VIN+A/VI N+B
VIN–A/VIN–B
ADC
CORE
VREF
0.1µF1.0µF
SENSE
Figure 51. Internal Reference Configuration
SELECT
LOGIC
0.5V
AD9640
Reference
06547-030
Figure 52. Programmable Reference Configuration
If the internal reference of the AD9640 is used to drive multiple
onverters to improve gain matching, the loading of the reference
c
by the other converters must be considered.
ow the internal reference voltage is affected by loading.
h
0
–0.25
–0.50
–0.75
–1.00
REFERENCE VOL TAGE ERROR (%)
–1.25
02
External Reference Operation
The use of an external reference may be necessary to enhance
the gain accuracy of the ADC or improve thermal drift characteristics. Figure 54 shows the typical drift characteristics of the
i
nternal reference in 1 V mode.
VIN+A/VIN+B
VIN–A/VI N–B
VREF
0.1µF1.0µF
R2
SENSE
R1
0.51.01. 5
LOAD CURRENT (mA)
Figure 53. VREF Accuracy vs. Load
SELECT
VREF = 1V
LOGIC
ADC
CORE
0.5V
AD9640
Figure 53 shows
VREF = 0.5V
06547-031
.0
06547-080
Table 14. Reference Configuration Summary
Selected Mode SENSE Voltage Resulting VREF (V) Resulting Differential Span (V p-p)
External Reference AVDD N/A 2 × External Reference
Internal Fixed Reference VREF 0.5 1.0
Programmable Reference 0.2 V to VREF
R2
⎛
⎜
⎝
⎞
+×
15.0
⎟
R1
⎠
Internal Fixed Reference AGND to 0.2 V 1.0 2.0
Rev. 0 | Page 26 of 48
(see Figure 52)
2 × VREF
Page 27
AD9640
K
A
V
www.BDTIC.com/ADI
2.5
2.0
1.5
1.0
0
–0.5
–1.0
–1.5
REFERENCE VOLTAGE ERROR (mV)
–2.0
–2.5
–40
–20020406080
TEMPERATURE ( °C)
06547-099
Figure 54. Typical VREF Drift
When the SENSE pin is tied to AVDD, the internal reference is
disabled, allowing the use of an external reference. An internal
reference buffer loads the external reference with an equivalent
6 kΩ load (see
an
d negative full-scale references for the ADC core. Therefore,
Figure 15). The internal buffer generates the positive
the external reference must be limited to a maximum of 1 V.
CLOCK INPUT CONSIDERATIONS
For optimum performance, the AD9640 sample clock inputs
CLK+, and CL
The signal is typically ac-coupled into the CLK+ and CLK− pins
via a transformer or capacitors. These pins are biased internally
(see
Figure 55) and require no external bias.
Clock Input Options
The AD9640 has a very flexible clock input structure. Clock input
can be a CMOS, LVDS, LVPECL , or s i n e w ave sig n a l . R egard less of
the type of signal being used, the jitter of the clock source is of the
most concern, as described in the
Figure 56 and Figure 57 show two preferred methods for clocking
e AD9640 (at clock rates to 625 MHz). A low jitter clock source
th
is converted from a single-ended signal to a differential signal
using either an RF balun or an RF transformer. The RF balun
configuration is recommended for clock frequencies between
125 MHz and 625 MHz, and the RF transformer is recommended
for clock frequencies from 10 MHz to 200MHz. The back-to-back
Schottky diodes across the transformer/balun secondary limit
clock excursions into the AD9640 to approximately 0.8 V p-p
differential.
K− should be clocked with a differential signal.
DD
1.2V
CLK–CLK+
2pF2pF
6547-034
Figure 55. Equivalent Clock Input Circuit
Jitter Considerations section.
This helps prevent the large voltage swings of the clock from
feeding through to other portions of the AD9640, while preserving
the fast rise and fall times of the signal that are critical to a low
jitter performance.
MINI-CIRCUI TS
CLOC
INPUT
50Ω
ADT1–1WT, 1:1Z
100Ω
XFMR
0.1µF
0.1µF0.1µF
0.1µF
SCHOTTKY
DIODES:
HSMS2822
CLK+
ADC
AD9640
CLK–
Figure 56. Transformer Coupled Differential Clock (Up to 200 MHz)
CLOCK
INPUT
50Ω
1nF
0.1µF1nF
0.1µF
SCHOTTKY
DIODES:
HSMS2822
CLK+
ADC
AD9640
CLK–
6547-101
Figure 57. Balun Coupled Differential Clock (Up to 625 MHz)
If a low jitter clock source is not available, another option is to
ac couple a differential PECL signal to the sample clock input
pins, as shown in
AD9513/AD95
Figure 58. The AD9510/AD9511/AD9512/
14/AD9515/AD9516 clock drivers offer excellent
jitter performance.
CLOCK
INPUT
CLOCK
INPUT
50kΩ50kΩ
0.1µF
0.1µF
AD951x
PECL DRIVER
Figure 58. Differential PECL Sample Clock (Up to 625 MHz)
0.1µF
CLK+
100Ω
0.1µF
240Ω240Ω
ADC
AD9640
CLK–
A third option is to ac-couple a differential LVDS signal to the
sample clock input pins, as shown in
Figure 59. Differential LVDS Sample Clock (Up to 625 MHz)
0.1µF
100Ω
0.1µF
CLK+
ADC
AD9640
CLK–
In some applications, it may be acceptable to drive the sample
clock inputs with a single-ended CMOS signal. In such applications, CLK+ should be directly driven from a CMOS gate, and
the CLK− pin should be bypassed to ground with a 0.1 F
capacitor in parallel with a 39 k resistor (see
Figure 60).
06547-035
06547-036
06547-037
Rev. 0 | Page 27 of 48
Page 28
AD9640
www.BDTIC.com/ADI
CLK+ can be directly driven from a CMOS gate. Although the
CLK+ input circuit supply is AVDD (1.8 V), this input is designed
to withstand input voltages up to 3.6 V, making the selection of
the drive logic voltage very flexible.
V
CLOCK
INPUT
CC
0.1µF
1kΩ
AD951x
1
50Ω
1
50Ω RESISTOR IS OPTIONAL
CMOS DRIVER
1kΩ
0.1µF
OPTIONAL
100Ω
39kΩ
0.1µF
CLK+
ADC
AD9640
CLK–
Figure 60. Single-Ended 1.8 V CMOS Sample Clock (Up to 150 MSPS)
V
CLOCK
INPUT
CC
0.1µF
1kΩ
AD951x
1
50Ω
1
50Ω RESISTOR IS OPTIONAL
CMOS DRIVER
1kΩ
OPTIONAL
100Ω
0.1µF
0.1µF
CLK+
ADC
AD9640
CLK–
Figure 61. Single-Ended 3.3 V CMOS Sample Clock (Up to 150 MSPS)
Input Clock Divider
The AD9640 contains an input clock divider with the ability to
divide the input clock by integer values between 1 and 8. If a
divide ratio other than 1 is selected, the duty cycle stabilizer is
automatically enabled.
The AD9640 clock divider can be synchronized using the external
S
YNC input. Bit 1 and Bit 2 of Register 0x100 allow the clock
divider to be resynchronized on every SYNC signal or only on
the first SYNC signal after the register is written. A valid SYNC
causes the clock divider to reset to its initial state. This synchronization feature allows multiple parts to have their clock dividers
aligned to guarantee simultaneous input sampling.
Clock Duty Cycle
Typical high speed ADCs use both clock edges to generate
a variety of internal timing signals and, as a result, may be
sensitive to clock duty cycle. Commonly, a ±5% tolerance is
required on the clock duty cycle to maintain dynamic
performance characteristics.
The AD9640 contains a duty cycle stabilizer (DCS) that retimes
t
he nonsampling (falling) edge, providing an internal clock
signal with a nominal 50% duty cycle. This allows the user to
provide a wide range of clock input duty cycles without affecting
the performance of the AD9640. Noise and distortion performance
are nearly flat for a wide range of duty cycles with the DCS on,
as shown in
Figure 43.
06547-038
06547-039
Jitter in the rising edge of the input is still of paramount concern
a
nd is not easily reduced by the internal stabilization circuit.
The duty cycle control loop does not function for clock rates
less than 20 MHz nominally. The loop has a time constant
associated with it that needs to be considered where the clock
rate can change dynamically. This requires a wait time of 1.5 µs
to 5 µs after a dynamic clock frequency increase or decrease before
the DCS loop is relocked to the input signal. During the time
period the loop is not locked, the DCS loop is bypassed, and
internal device timing is dependent on the duty cycle of the input
clock signal. In such applications, it may be appropriate to disable
the duty cycle stabilizer. In all other applications, enabling the DCS
circuit is recommended to maximize ac performance.
Jitter Considerations
High speed, high resolution ADCs are sensitive to the quality
of the clock input. The degradation in SNR from the low
frequency SNR (SNR
to jitter (t
SNR
) can be calculated by
JRMS
= −10 log[(2π × f
HF
) at a given input frequency (f
LF
× t
INPUT
)2 + 10]
JRMS
INPUT
) due
)10/(LFSNR−
In the equation, the rms aperture jitter represents the clock input
jitter specification. IF undersampling applications are particularly
sensitive to jitter, as illustrated in
75
70
65
60
55
SNR (dBc)
50
45
40
MEASURED
PERFORMANCE
1101001000
Figure 62. SNR vs. Input Frequency and Jitter
Figure 62.
INPUT FREQ UENCY (MHz)
0.05ps
0.20ps
0.5ps
1.0ps
1.50ps
2.00ps
2.50ps
3.00ps
06547-041
The clock input should be treated as an analog signal in cases
where aperture jitter may affect the dynamic range of the AD9640.
Power supplies for clock drivers should be separated from the
ADC output driver supplies to avoid modulating the clock
signal with digital noise. Low jitter, crystal-controlled oscillators
make the best clock sources. If the clock is generated from
another type of source (by gating, dividing, or other methods),
it should be retimed by the original clock at the last step.
See Application Note AN-501 and Application Note AN-756fo
more information about jitter performance as it relates to ADCs.
r
Rev. 0 | Page 28 of 48
Page 29
AD9640
www.BDTIC.com/ADI
POWER DISSIPATION AND STANDBY MODE
As shown in Figure 63, the power dissipated by the AD9640
is proportional to its sample rate. In CMOS output mode,
the digital power dissipation is determined primarily by the
strength of the digital drivers and the load on each output bit.
The maximum DRVDD current (I
I
DRVDD
where N is
= V
the number of output bits (30 in the case of the AD9640
DRVDD
× C
LOAD
× f
CLK
with the FD bits disabled). This maximum current occurs when
every output bit switches on every clock cycle, that is, a fullscale square wave at the Nyquist frequency of f
the DRVDD current is established by the average number of
output bits switching, which is determined by the sample rate
and the characteristics of the analog input signal.
Reducing the capacitive load presented to the output drivers can
mini
mize digital power consumption. The data in
taken with the same operating conditions as the Typica l
P
erformance Characteristics, with a 5 pF load on each output
dr
iver.
1.25
1.0
0.75
0.5
TOTAL POWER (W)
0.25
IDVDD
0
255075100
0150125
IAVDD
TOTAL POWER
ENCODE FREQUENCY (MHz)
Figure 63. AD9640-150 Power and Current vs. Clock Frequency
1.25
1.0
0.75
0.5
TOTAL POWER (W)
0.25
IDVDD
0
0125
255075100
ENCODE FREQUENCY (MHz)
IAVDD
Figure 64. AD9640-125 Power and Current vs. Clock Frequency
) can be calculated as
DRVDD
× N
CLK
IDRVDD
TOTAL POWER
IDRVDD
/2. In practice,
Figure 63 was
0.5
0.4
0.3
0.2
SUPPLY CURRENT (A)
0.1
06547-076
0
0.5
0.4
0.3
0.2
SUPPLY CURRENT (A)
0.1
06547-075
0
1
0.75
0.5
TOTAL POWER (W)
0.25
IDVDD
0
0
255075100
TOTAL POWER
ENCODE FREQUENCY (MHz)
IAVDD
IDRVDD
0.4
0.3
0.2
0.1
0
SUPPLY CURRENT (A)
06547-074
Figure 65. AD9640-105 Power and Current vs. Clock Frequency
0.75
IAVDD
0.5
TOTAL POWER
0.25
TOTAL POWER (W)
IDVDD
0
08
204060
ENCODE FREQUENCY (MHz)
IDRVDD
Figure 66. AD9640-80 Power and Current vs. Clock Frequency
0.3
0.2
0.1
SUPPLY CURRENT (A)
06547-073
0
0
By asserting PDWN (either through the SPI port or by asserting
the PDWN pin high), the AD9640 is placed in power-down
mode. In this state, the ADC typically dissipates 2.5 mW.
During power-down, the output drivers are placed in a high
impedance state. Asserting the PDWN pin low returns the
AD9640 to its normal operational mode. Note that PDWN is
referenced to the digital supplies (DRVDD) and should not
exceed that supply voltage.
Low power dissipation in power-down mode is achieved by
shutting down the reference, reference buffer, biasing networks,
and clock. Internal capacitors are discharged when entering powerdown mode and then must be recharged when returning to normal
operation. As a result, wake-up time is related to the time spent
in power-down mode, and shorter power-down cycles result in
proportionally shorter wake-up times.
When using the SPI port interface, the user can place the ADC
ower-down mode or standby mode. Standby mode allows
in p
the user to keep the internal reference circuitry powered when
faster wake-up times are required. See the
scription
De
section for more details.
Memory Map Register
Rev. 0 | Page 29 of 48
Page 30
AD9640
www.BDTIC.com/ADI
DIGITAL OUTPUTS
The AD9640 output drivers can be configured to interface with
1.8 V to 3.3 V CMOS logic families by matching DRVDD to the
digital supply of the interfaced logic. The AD9640 can also be
configured for LVDS outputs using a DRVDD supply voltage
of 1.8 V.
In CMOS output mode, the output drivers are sized to provide
ufficient output current to drive a wide variety of logic families.
s
However, large drive currents tend to cause current glitches on
the supplies that may affect converter performance.
Applications requiring the ADC to drive large capacitive loads
o
r large fan-outs may require external buffers or latches.
The output data format can be selected for either offset binary
o
r twos complement by setting the SCLK/DFS pin when operating
in the external pin mode (see Tab l e 1 5 ).
As detailed in A
Speed ADCs via SPI, the data format can be selected for offset
binary, twos complement, or gray code when using the SPI control.
The AD9640 has a flexible three-state ability for the digital output
pins. The three-state mode is enabled using the SMI SDO/OEB
pin or through the SPI interface. If the SMI SDO/OEB pin is low,
the output data drivers are enabled. If the SMI SDO/OEB pin is
high, the output data drivers are placed in a high impedance state.
This OEB function is not intended for rapid access to the data
bus. Note that OEB is referenced to the digital supplies (DRVDD)
and should not exceed that supply voltage.
When using the SPI interface, the data and fast detect outputs
o
f each channel can be independently three-stated by using the
output enable bar bit in Register 0x14.
TIMING
The AD9640 provides latched data with a pipeline delay of
twelve clock cycles. Data outputs are available one propagation
delay (t
The length of the output data lines and loads placed on them
hould be minimized to reduce transients within the AD9640.
s
These transients can degrade converter dynamic performance.
The lowest typical conversion rate of the AD9640 is 10 MSPS.
A
Data Clock Output (DCO)
The AD9640 provides two data clock output (DCO) signals
intended for capturing the data in an external register. The data
outputs are valid on the rising edge of DCO, unless the DCO clock
polarity has been changed via the SPI. See
fo
) after the rising edge of the clock signal.
PD
t clock rates below 10 MSPS, dynamic performance can degrade.
In receiver applications, it is desirable to have a mechanism to
reliably determine when the converter is about to be clipped.
The standard overflow indicator provides after-the-fact information on the state of the analog input that is of limited usefulness.
Therefore, it is helpful to have a programmable threshold below
full scale that allows time to reduce the gain before the clip
actually occurs. In addition, because input signals can have
significant slew rates, latency of this function is of major concern.
Highly pipelined converters can have significant latency. A good
compromise is to use the output bits from the first stage of the
ADC for this function. Latency for these output bits is very low,
and overall resolution is not highly significant. Peak input signals
are typically between full scale and 6 dB to 10 dB below full
scale. A 3-bit or 4-bit output provides adequate range and
resolution for this function.
Via the SPI port, the user can provide a threshold above which
a
n overrange output would be active. As long as the signal is below
that threshold, the output should remain low. The fast detect
outputs can also be programmed via the SPI port so that one of
the pins functions as a traditional overrange pin for customers
who currently use this feature. In this mode, all 14 bits of the
converter are examined in the traditional manner and the output is
high for the condition normally defined as overflow. In either
mode, the magnitude of the data (the sign of the data is not
considered) is considered in the calculation of the condition.
The threshold detection responds identically to positive and
negative signals outside the desired range (magnitude).
FAST DETECT OVERVIEW
The AD9640 contains circuitry to facilitate fast overrange detection, allowing very flexible external gain control implementations.
Each ADC has four fast detect (FD) bits that are used to output
information about the current state of the ADC input level. The
FD bit function is programmable, allowing range information to be
output from several points in the internal data path. These bits
can also be set up to indicate the presence of overrange or underrange conditions, according to programmable threshold levels.
Tabl e 1 7 shows the six configurations available for the fast
dete
ct bits.
Table 17. Fast Detect Bit Configuration Settings
Fast Detect Mode
Select
Register 0x104[3:1] Information Presented on FD Bits[3:0]
000 ADC Fast Magnitude[3:0]
001 ADC Fast Magnitude[2:0], OVR
010 ADC Fast Magnitude[2:1], OVR, F_LT
011 ADC Fast Magnitude[2:1], NA, F_LT
100 OVR, NA, F_UT, F_LT
101 OVR, F_UT, NA, NA
ADC FAST MAGNITUDE
When the FD bits are configured to output the ADC fast magnitude (Fast Detect Mode 0b000), the information presented is
the ADC level from an early converter stage with only a two
clock-cycle latency. Using the FD bits in this configuration provides
the earliest possible level indication information. Because this
information is provided early in the data path, there is a significant
uncertainty in the level indicated. The nominal levels, along with
the uncertainty indicated by the ADC fast magnitude, are shown
in
Tabl e 18 .
Table 18. ADC Fast Magnitude Bits Nominal Levels
(Us
ing ADC_Fast_Mag[3:0])
Nominal Input
Magnitude in
ADC_Fast_Mag[3:0]
0000 <−24 Min to −18.07
0001 −24 to −14.5 −30.14 to −12.04
0010 −14.5 to −10 −18.07 to −8.52
0011 −10 to −7 −12.04 to −6.02
0100 −7 to −5 −8.52 to −4.08
0101 −5 to −3.25 −6.02 to −2.5
0110 −3.25 to −1.8 −4.08 to −1.16
0111 −1.8 to −0.56 −2.5 to FS
1000 −0.56 to 0 −1.16 to 0
When Fast Detect Mode 0b001, Fast Detect Mode 0b010, or
Fast Detect Mode 0b011 is selected, a subset of the FD bits is
available. In these modes, the FD bits have a latency of six clock
cycles.
Tabl e 1 9 shows the corresponding ADC input levels when
C Fast Magnitude[2:0] is selected using 001.
AD
Table 19. ADC Fast Magnitude Bits Nominal
(Using ADC_Fast_Mag[2:0])
ADC_Fast_Mag[2:0]
000 <−24 Min to −18.07
001 −24 to −14.5 −30.14 to −12.04
010 −14.5 to −10 −18.07 to −8.52
011 −10 to −7 −12.04 to −6.02
100 −7 to −5 −8.52 to −4.08
101 −5 to −3.25 −6.02 to −2.5
110 −3.25 to −1.8 −4.08 to −1.16
111 −1.8 to 0 −2.5 to 0
dB Below FS
Nominal Input
Magnitude in
Below FS
dB
Nominal Input
Magnitude
ertainty in dB
Unc
Levels
Nominal Input
Magnitude
Uncertainty in dB
Rev. 0 | Page 31 of 48
Page 32
AD9640
www.BDTIC.com/ADI
When ADC_Fast_Mag[2:1] is selected, the LSB is not provided.
The input ranges for this mode are shown in
Table 20. ADC Fast Magnitude Bits Nominal
Tabl e 2 0 .
Levels
(Using ADC_Fast_Mag[2:1])
Nominal Input
Magnitude in
dB Below FS
00 <−14.5 Min to −12.04
01 −14.5 to −7 −18.07 to −6.02
10 −7 to −3.25
11 −3.25 to 0 −4.08 to 0
Nominal Input
Magnitude
Uncertainty in dB ADC_Fast_Mag[2:1]
−8.52 to −2.5
ADC OVERRANGE (OVR)
The ADC overrange bit becomes active when an overrange is
detected on the input of the ADC. The overrange condition is
determined at the output of the ADC pipeline and, thus, is subject
to the 12-ADC clock cycle latency. An overrange at the input would
be indicated by this bit 12 clock cycles after it occurred.
GAIN SWITCHING
The AD9640 includes circuitry that is useful in applications
either where large dynamic ranges exist or where gain ranging
converters are employed. This circuitry allows digital thresholds
to be set such that an upper threshold and a lower threshold can
be programmed. Fast Detect Mode 2 through Fast Detect Mode 7
support various combinations of the gain switching options.
One such use is to detect when an ADC is about to reach full
scale
with a particular input condition. The result is to provide
a flag that can be used to quickly insert an attenuator that prevents
ADC overdrive.
Fine Upper Threshold (F_UT)
The fine upper threshold bit is asserted if the input magnitude
exceeds the value programmed in the fine upper threshold
register located at Address 0x106 and Address 0x107. The 13-bit
threshold register is compared with the signal magnitude at the
output of the ADC. This comparison is subject to the ADC clock
latency but provides a comparison result accurate to converter
resolution. The fine threshold magnitude is defined by the
following equation:
13
dBFS = 20 log(Th
reshold Magnitude/2
)
Fine Lower Threshold (F_LT)
The fine lower threshold bit is asserted if the input magnitude
is less than the value programmed in the fine lower threshold
register located at Address 0x108 and Address 0x109. The fine
lower threshold register is a 13-bit register that is compared
with the signal magnitude at the output of the ADC. This
comparison is subject to the ADC clock latency but provides
a comparison accurate to the converter resolution. The fine
threshold magnitude is defined by the following equation:
13
dBFS = 20 log(Th
reshold Magnitude/2
)
The operation of the fine upper threshold bits and fine lower
t
hreshold bits is shown in
Figure 67.
FINE UPPER THRESHOLD
FINE LO WER THRESHO LD
F_UT
F_LT
6547-097
Figure 67. Threshold Settings for F_UT and F_LT
Rev. 0 | Page 32 of 48
Page 33
AD9640
www.BDTIC.com/ADI
SIGNAL MONITOR
The signal monitoring block provides additional information
a
bout the signal being digitized by the ADC. The signal monitor
computes the rms input magnitude, peak magnitude, and/or
the number of samples that the magnitude exceeds a particular
threshold. Together, these functions can be used to gain insight
into the signal characteristics and to estimate the peak/average
ratio or even the shape of the complementary cumulative
distribution function (CCDF) curve of the input signal. This
information can be used to drive an AGC loop to optimize the
range of the ADC in the presence of real world signals.
The signal monitor result values can be obtained from the part by
eading back internal registers at Address 0x116 to Address 0x11B,
r
using the SPI port, or by using the signal monitor SPORT output.
The output contents of the SPI-accessible signal monitor registers
are set via the two power-monitor mode bits of the signal monitor
control register. Both ADC channels must be configured for the
same signal monitor mode. Separate SPI-accessible, 20-bit signal
monitor result (SMR) output registers are provided for each ADC
channel. Any combination of the signal monitor functions can
also be output to the user via the serial SPORT interface. These
outputs are enabled using the peak power output enable, rms
magnitude output enable, and the threshold crossing output
enable bits in the signal monitor SPORT control register.
For each of the signal monitor measurements, a programmable
signal monitor period register (SMPR) controls the duration of
the measurement. This time period is programmed as the number
of input clock cycles in a 24-bit ADC monitor period register
located at Address 0x113, Address 0x114, and Address 0x115.
This register can be programmed with a period from 128 samples
to 16.78 (2
24
) million samples.
Because the dc offset of the ADC can be significantly larger
han the signal of interest (affecting the results from the signal
t
monitor), a dc correction circuit is included as part of the signal
monitor block to null the dc offset before measuring the power.
PEAK DETECTOR MODE (MODE = BITS 01)
The magnitude of the input port signal is monitored over a
programmable time period (given by SMPR) to give the peak
value detected. This function is enabled by programming a Logic 1
in the power-monitor mode bits of the power-monitor control
register or by setting the peak power output enable bit in the
signal monitor SPORT control register. The 24-bit SMPR must
be programmed before activating this mode.
After enabling this mode, the value in the SMPR is loaded into
onitor period timer and the countdown is started. The magni-
a m
tude of the input signal is compared to the internal peak level
holding register, and the greater of the two is updated back into
the peak level holding register. The initial value of the peak level
holding register is set to the current ADC input signal magnitude.
This comparison continues until the monitor period timer
reaches a count of 1.
When the monitor period timer reaches a count of 1, the 13-bit
value in the peak level holding register is transferred to a holding
register that can be read through the SPI port or output through
the SPORT serial interface. The monitor period timer is reloaded
with the value in the SMPR, and the countdown is restarted. Also,
the magnitude of first input sample is updated in the peak level
holding register, and the comparison and update procedure, as
explained previously, continues.
Figure 68 is a block diagram of the peak detector logic. The SMR
c
ontains the absolute magnitude of the peak detected by the peak
detector logic.
FROM
MEMORY
MAP
FROM
INPUT
PORTS
SIGNAL MONITOR
PERIOD REGISTER
MAGNITUDE
STORAGE
REGISTER
LOADLOAD
COMPARE
A>B
Figure 68. ADC Input Peak Detector Block Diagram
LOAD
CLEAR
DOWN
COUNTER
IS COUNT = 1?
SIGNAL MONITOR
HOLDING
REGIS TER (SMR)
TO
MEMORY
MAP/SPORT
RMS/MS MAGNITUDE MODE (MODE = BITS 00)
In this mode, the root-mean-squared (rms) or mean-squared (ms)
ma
gnitude of the input port signal is integrated (by adding an
accumulator) over a programmable time period (given by SMPR)
to give the rms or ms magnitude of the input signal. This mode
is set by programming Logic 0 in the signal monitor mode bits
of the signal monitor control register or by setting the rms magnitude output enable bit in the signal monitor SPORT control
register. The 24-bit SMPR, representing the period over which
integration is performed, must be programmed before activating
this mode.
After enabling the rms/ms magnitude mode, the value in the
S
MPR is loaded into a monitor period timer, and the countdown
is started immediately. Each input sample is converted to floating
point format and squared. It is then converted to 11-bit fixed
point format and added to the contents of a 24-bit holding
register, thus performing an accumulation. The integration
continues until the monitor period timer reaches a count of 1.
When the monitor period timer reaches a count of 1, the square
r
oot of the value in the holding register is taken and transferred
to the power-monitor holding register (after some formatting),
which can be read through the SPI port or output through the
SPORT serial port. The monitor period timer is reloaded with
the value in the SMPR, and the countdown is restarted. Also,
the first input sample signal power is updated in the holding
register, and the accumulation continues with the subsequent
input samples.
06547-044
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Figure 69 illustrates the rms magnitude monitoring logic.
For rms magnitude mode, the value in the signal monitoring result
(SMR) is a 20-bit fixed point number. The following equation
can be used to determine the rms magnitude in dBFS from the
MAG value in the register. Note that if the signal monitor period
(SMP) is a power of 2, the second term in the equation becomes 0.
RMS Magnitude = 20 log
SMPMAG
⎞
⎛
⎜
⎝
−
⎟
2
⎠
⎡
log10
[]
⎢
2
⎣
⎤
)(logceil20
SMP
⎥
2
⎦
For ms magnitude mode, the value in the SMR is a 20-bit fixed
point number. The following equation can be used to determine
the ms magnitude in dBFS from the MAG value in the register.
Note that if the SMP is a power of 2, the second term in the
equation becomes 0.
MS Magnitude = 10 log
SMPMAG
⎞
⎛
⎜
⎝
−
⎟
2
⎠
⎡
log10
[]
⎢
2
⎣
⎤
)(logceil20
SMP
⎥
2
⎦
THRESHOLD CROSSING MODE (MODE = BITS 1X)
In this mode of operation, the magnitude of the input port signal
is monitored over a programmable time period (given by SMPR)
to count the number of times it crosses a certain programmable
threshold value. This mode is set by programming Logic 1x
(where x is a don’t care bit) in the power-monitor mode bits of
the signal monitor control register or by setting the threshold
crossing output enable bit in the signal monitor SPORT control
register. Before activating this mode, the user needs to program
the 24-bit SMPR and the 13-bit upper threshold register for
each individual input port. The same upper threshold register is
used for both signal monitoring and gain control (see the ADC
Overrange and Gain Control section).
After entering this mode, the value in the SMPR is loaded into
a monitor period timer, and the countdown is started. The magnitude of the input signal is compared to the upper threshold register
(programmed previously) on each input clock cycle. If the input
signal has magnitude greater than the upper threshold register,
the internal count register is incremented by 1.
The initial value of the internal count register is set to 0. This
comparison and increment of the internal count register continues
until the monitor period timer reaches a count of 1.
When the monitor period timer reaches a count of 1, the value
in the internal count register is transferred to the signal monitor
holding register, which can be read through the SPI port or
output through the SPORT serial port.
The monitor period timer is reloaded with the value in the SMPR,
and the countdown is restarted. The internal count register is
also cleared to a value of 0. Figure 70 illustrates the threshold
crossing logic. The value in the SMR is the number of samples
that have a magnitude greater than the threshold register.
For additional flexibility in the signal monitoring process, two
control bits are provided in the power-monitor control register.
They are the signal monitor enable bit and the complex power bit.
Signal Monitor Enable Bit
The signal monitor enable bit located in Bit 0 of Register 0x112
enables operation of the signal monitor block. If the signal monitor
function is not needed in a particular application, this bit should
be cleared (default) to conserve power.
Measure Complex Power Bit
When this bit is set, the part assumes that Channel A is digitizing
the I data and Channel B is digitizing the Q data for a complex
input signal (or vice versa). In this mode, the power reported is
equal to
22
QI +
This complex power measurement result is presented in the
Channel A signal monitor value register if the signal monitor mode
bits are set to 00. The Channel B signal monitor continues to
compute the Channel B value.
DC CORRECTION
Because the dc offset of the ADC may be significantly larger
than the signal being measured, a dc correction circuit is included
to null the dc offset before measuring the power. The dc correction
circuit can also be switched into the main signal path, but this
may not be appropriate if the ADC is digitizing a time-varying
signal with significant dc content, such as GSM.
DC Correction Bandwidth
The dc correction circuit is a high-pass filter with a programmable
bandwidth ranging between 0.15 Hz and 1.2 kHz. The bandwidth
is controlled by writing to the 4-bit dc correction register located
in Bit 5 to Bit 2 at Address 0x10C. Table 21 shows the bandwidth
values for each of the 16 possible programmed values.
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Table 21. DC Correction Bandwidth Settings
DC Correction Control Register 0x10C[5:2] Bandwidth (Hz)
The current dc correction value can be read back in Register 0x10D
and Register 0x10E for Channel A and Register 0x10F and
Register 0x110 for Channel B. The dc correction value is a 14-bit
value that can span the entire input range of the ADC.
DC Correction Freeze
Setting the dc correction freeze bits freezes the dc correction at
its current state and continues to use the last updated value as
the dc correction value. Clearing this bit restarts dc correction and
adds the currently calculated value to the data.
DC Correction Enable Bits
Setting Bit 0 of Register 0x10C enables the dc correction for use
in the signal monitor calculations. The calculated dc correction
value can be added to the output data signal path by setting Bit 1
of Register 0x10C.
SIGNAL MONITOR SPORT OUTPUT
The SPORT is a serial interface with three output pins: SMI
SCLK (SPORT clock), SMI SDFS (SPORT frame sync) and
SMI SDO (SPORT data). The SPORT is the master and drives
all three pins out of the chip.
SMI SCLK
The data and frame sync are driven on the positive edge of the SMI
SCLK. The SMI SCLK has three possible baud rates. They are ½, ¼,
or ⅛ the ADC clock rate, based on the SPORT controls. The SMI
SCLK can also be gated off when not sending any data, based on
the SMI SCLK sleep bit. Using this bit to disable the SMI SCLK
when it is not needed can reduce any coupling errors back into the
signal path, if these prove to be a problem in the system. Doing so
has the disadvantage of spreading the frequency content of the
clock; if desired, it can be left running to ease frequency planning.
SMI SDFS
The SMI SDFS is the serial data frame sync, and it defines the
start of a frame. One SPORT frame includes data from both
data paths. The data from Data Path A is sent just after the
frame sync, followed by data from Data Path B.
SMI SDO
The SMI SDO is the serial data output of the block. The data
is sent MSB first on the next positive edge after the SMI SDFS.
Each data output block includes one or more of rms magnitude,
peak level, and threshold crossing values from both data paths
in the stated order. If enabled, the data is sent, rms first, followed by
peak and threshold, as shown in Figure 71.
The AD9640 includes built-in test features to enable verification
of the integrity of each channel as well as to facilitate board level
debugging. A BIST (built-in self-test) feature is included that
verifies the integrity of the digital data path of the AD9640.
Various output test options are also provided to place predictable
values on the outputs of the AD9640.
BUILT-IN SELF-TEST (BIST)
The BIST is a thorough test of the digital portion of the selected
AD9640 signal path. When enabled, the test runs from an internal
PN source through the digital data path starting at the ADC
block output. The BIST sequence runs for 512 cycles and stops.
The BIST signature value for Channel A or Channel B is placed
in Register 0x024 and Register 0x025. If one channel is chosen,
its BIST signature is written to the two registers. If both channels
are chosen, the results from the A channel are placed in the
BIST signature register.
The outputs are not disconnected during this test, so the PN
s
equence can be observed as it runs. The PN sequence can be
continued from its last value or started from the beginning,
based on the value programmed in Register 0x00E, Bit 2. The
BIST signature result varies based on the channel configuration.
OUTPUT TEST MODES
The output test options are shown in Tabl e 2 5 . When an output
test mode is enabled, the analog section of the ADC is disconnected from the digital backend blocks and the test pattern is run
through the output formatting block. Some of the test patterns are
subject to output formatting and some are not. The seed value for
the PN sequence tests can be forced if the PN reset bits are used
to hold the generator in reset mode by setting Bit 4 or Bit 5 of
Register 0x0D. These tests can be performed with or without
an analog signal (if present, the analog signal is ignored), but
they do require an encode clock. For more information, see
Application Note AN-877, Interfacing to High Speed ADCs via SPI.
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CHANNEL/CHIP SYNCHRONIZATION
The AD9640 has a SYNC input that allows the user flexible
synchronization options for synchronizing the internal blocks.
The clock divider sync feature is useful to guarantee synchronized
sample clocks across multiple ADCs. The signal monitor block
can also be synchronized using the SYNC input allowing properties
of the input signal to be measured during a specific time period.
The input clock divider can be enabled to synchronize on a single
occurrence of the sync signal or on every occurrence. The signal
monitor block is synchronized on every SYNC input signal.
The SYNC input is internally synchronized to the sample clock;
h
owever, to ensure there is no timing uncertainty between multiple
parts, the SYNC input signal should be externally synchronized to
the input clock signal, meeting the setup and hold times shown
in Tab l e 8 . The SYNC input should be driven using a singleended CMOS-type signal.
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SERIAL PORT INTERFACE (SPI)
The AD9640 serial port interface (SPI) allows the user to configure
the converter for specific functions or operations through a
structured register space provided inside the ADC. This gives
the user added flexibility and customization depending on the
application. Addresses are accessed via the serial port and can
be written to or read from via the port. Memory is organized
into bytes that can be further divided into fields, which are documented in the Memor y Map section. For detailed operational
information, see Application Note AN-877, Interfacing to High Speed ADCs via SPI.
CONFIGURATION USING THE SPI
There are three pins that define the SPI of this ADC. They are
the SCLK/DFS pin, the SDIO/DCS pin, and the CSB pin (see
Tabl e 2 2 ). The SCLK/DFS (a serial clock) is used to synchronize
the read and write data presented from and to the ADC. The
SDIO/DCS (serial data input/output) is a dual-purpose pin that
allows data to be sent and read from the internal ADC memory
map registers. The CSB (chip select bar) is an active-low control
that enables or disables the read and write cycles.
Table 22. Serial Port Interface Pins
Pin Function
Serial Clock. The serial shift clock input. SCLK is u
SCLK
synchronize serial interface reads and writes.
Serial Data Input/Output. A dual-pur
SDIO
role for this pin is an input and output depending on the
instruction being sent and the relative position in the
timing frame.
Chip Select Bar. An active-low control that gates the read
CSB
and wr
ite cycles.
The falling edge of the CSB, in conjunction with the rising edge
of the SCLK, determines the start of the framing. An example of
the serial timing and its definitions can be found in Figure 73
and Tabl e 8.
Other modes involving the CSB are available. The CSB can be
he
ld low indefinitely, which permanently enables the device;
this is called streaming. The CSB may stall high between bytes
to allow for additional external timing. When CSB is tied high,
SPI functions are placed in high impedance mode. This mode
turns on any SPI pin secondary functions.
During an instruction phase, a 16-bit instruction is transmitted.
Data follows the instruction phase, and its length is determined
by the W0 and W1 bits. All data is composed of 8-bit words.
The first bit of each individual byte of serial data indicates whether
a read command or a write command is issued. This allows the
serial data input/output (SDIO) pin to change direction from
an input to an output.
pose pin. The typical
sed to
In addition to word length, the instruction phase determines if
t
he serial frame is a read or write operation, allowing the serial
port to be used to both program the chip as well as read the
contents of the on-chip memory. If the instruction is a readback
operation, performing a readback causes the serial data input/
output (SDIO) pin to change direction from an input to an output
at the appropriate point in the serial frame.
Data can be sent in MSB first
first is the default on power-up and can be changed via the
configuration register. For more information about this and
other features, see Application Note AN-877, Interfacing to High Speed ADCs via SPI.
mode or LSB first mode. MSB
HARDWARE INTERFACE
The pins described in Ta b l e 22 comprise the physical interface
between the user’s programming device and the serial port of
the AD9640. The SCLK pin and the CSB pin function as inputs
when using the SPI interface. The SDIO pin is bidirectional,
functioning as an input during write phases and as an output
during readback.
The SPI interface is flexible enough to be controlled by either
PGAs or microcontrollers. One method for SPI configuration
F
is described in detail in Application Note AN-812, Microcontroller-Based Serial Port Interface Boot Circuit.
The SPI port should not be active during periods when the full
d
ynamic performance of the converter is required. Because the
SCLK signal, the CSB signal, and the SDIO signal are typically
asynchronous to the ADC clock, noise from these signals can
degrade converter performance. If the on-board SPI bus is utilized
for other devices, it may be necessary to provide buffers between
this bus and the AD9640 to keep these signals from transitioning
at the converter inputs during critical sampling periods.
Some pins serve a dual function when the SPI interface is not
b
eing used. When the pins are strapped to AVDD or ground
during device power-on, they are associated with a specific
function. The Digital Outputs section describes the strappable
functions supported on the AD9640.
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CONFIGURATION WITHOUT THE SPI SPI ACCESSIBLE FEATURES
In applications that do not interface to the SPI control registers,
the SDIO/DCS pin, the SCLK/DFS pin, the SMI SDO/OEB pin,
and the SMI SCLK/PDWN pin serve as standalone, CMOScompatible control pins. When the device is powered up, it is
assumed that the user intends to use the pins as static control
lines for the duty cycle stabilizer, output data format, output
enable, and power-down feature control. In this mode, the CSB
chip select should be connected to AVDD, which disables the
serial port interface.
Offset binary enabled.
AVDD SMI SDO/OEB Outputs in high impedance.
AGND (default) Outputs enabled.
SMI SCLK/PDWN
AVDD
Chip in power-down or
by.
stand
AGND (default) Normal operation.
A brief description of general features accessible via the SPI
follows. These features are described in detail in Application
Note AN-877, Interfacing to High Speed ADCs via SPI. The
AD9640 part-specific features are described in detail following
Tabl e 2 5 , the external memory map register table.
Table 24. Features Accessible Using the SPI
Feature Name Description
Modes
Allows user to set either power-down mode or
y mode.
standb
Clock Allows user to access the DCS via the SPI.
Offset
Allows user to digitally adjust the converter
offset.
Tes t I /O
Allows user to set test modes to have known
ta on output bits.
da
Output Mode Allows user to set up outputs.
Output Phase Allows user to set the output clock polarity.
Output Delay Allows user to vary the DCO delay.
VREF Allows user to set the reference voltage.
CSB
SCLK
SDIO
DON’T CARE
t
t
DS
t
S
R/WW1W0A12A11A10A9A8A7
t
DH
HIGH
t
LOW
Figure 73. Serial Port Interface Timing Diagram
t
CLK
D5D4D3D2D1D0
t
H
DON’T CARE
DON’T CAREDON’T CARE
06547-049
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MEMORY MAP
READING THE MEMORY MAP TABLE
Each row in the memory map table has eight bit locations. The
memory map is roughly divided into four sections: chip configuration and ID register map (Address 0x00 to Address 0x02); ADC
setup, control, and test (Address 0x08 to Address 0x25); the
channel index and transfer register map (Address 0x05 to
Address 0xFF); and digital feature control (Address 0x100 to
Address 0x11B).
Starting from the right hand column, the memory map register
in Ta
ble 25 documents the default hex value for each hex address
shown. The column with the heading Bit 7 (MSB) is the start
of the default hex value given. For example, Address 0x18, VREF
select, has a hex default value of 0xC0. This means Bit 7 = 1,
Bit 6 = 1, and the remaining bits are 0s. This setting is the default
reference selection setting. The default value uses a 2.0 V peakto-peak reference. For more information on this function and
others, see Application Note AN-877, Interfacing to High Speed ADCs via SPI. This document details the functions controlled by
Register 0x00 to Register 0xFF. The remaining registers, from
Register 0x100 to Register 0x11B, are documented in the Memory
Map Register Description section.
Open Locations
All address and bit locations that are not included in Tab l e 2 5
are currently not supported for this device. Unused bits of a
valid address location should be written with 0s. Writing to these
locations is required only when part of an address location is
open (for example, Address 0x18). If the entire address location
is open (for example, Address 0x13), this address location should
not be written.
Default Values
Coming out of reset, critical registers are loaded with default
values. The default values for the registers are given in the
memory map register table, Tab l e 25 .
Logic Levels
An explanation of various registers follows:
•“
Bit is set” is synonymous with “Bit is set to Logic 1” or
“Writing Logic 1 for the bit.”
Clear a bit” is synonymous with “Bit is set to Logic 0” or
•“
“Writing Logic 0 for the bit.”
Transfer Register Map
Address 0x08 to Address 0x18 are shadowed. Writes to these
addresses do not affect part operation until a transfer command
is issued by writing 0x01 to Address 0xFF, setting the transfer bit.
This allows these registers to be updated internally and simultaneously when the transfer bit is set. The internal update takes
place when the transfer bit is set, and the bit autoclears.
Channel-Specific Registers
Some channel setup functions, such as the signal monitor
thresholds, can be programmed differently for each channel.
In these cases, channel address locations are internally duplicated
for each channel. These registers are designated in the parameter
name column of Tab le 2 5 as local registers. These local registers
can be accessed by setting the appropriate Channel A or Channel B
bits in Register 0x05. If both bits are set, the subsequent write
affects the registers of both channels. In a read cycle, only
Channel A or Channel B should be set to read one of the two
registers. If both bits are set during an SPI read cycle, the part
returns the value for Channel A. Registers designated as global
in the parameter name column of Tabl e 2 5 affect the entire part
or the channel features where independent settings are not
allowed between the channels. The settings in Register 0x05
do not affect the global registers.
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EXTERNAL MEMORY MAP
Table 25. Memory Map Registers
Default
Addr
(Hex)
Chip Configuration Registers
0x00
0x01 Chip ID
0x02 Chip Grade
Channel Index and Transfer Registers
0x05 Channel Index Open Open Open Open Open Open
0xFF Device Update Open Open Open Open Open Open Open Transfer 0x00
ADC Functions
0x08 Power Modes Open Open
0x09 Global Clock
0x0B Clock Divide
0x0D
Register
Name
SPI Port
Configuration
(Global)
(Global)
(Global)
(Global)
(Global)
Test Mode
(Local)
Bit 7
(MSB)
0 LSB first Soft reset 1 1 Soft reset LSB first 0 0x18
Allows
selection of
clock delays
into the input
clock divider
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Addr
(Hex)
0x10C
0x10D
0x10E
0x10F
0x110
0x111
0x112
0x113
0x114
0x115
0x116
0x117
0x118
0x119
Register
Name
Signal Monitor
DC Correction
Control
(Global)
Signal Monitor
DC Value
Channel A
Register 0
(Global)
Signal Monitor
DC Value
Channel A
Register 1
(Global)
Signal Monitor
DC Value
Channel B
Register 0
(Global)
Signal Monitor
DC Value
Channel B
Register 1
(Global)
Signal Monitor
SPORT Control
(Global)
Signal Monitor
Control
(Global)
Signal Monitor
Period
Register 0
(Global)
Signal Monitor
Period
Register 1
(Global)
Signal Monitor
Period
Register 2
(Global)
Signal Monitor
Result
Channel A
Register 0
(Global)
Signal Monitor
Result
Channel A
Register 1
(Global)
Signal Monitor
Result
Channel A
Register 2
(Global)
Signal Monitor
Result
Channel B
Register 0
(Global)
Default
Bit 7
(MSB)
Open
Open Open DC Value Channel A[13:8] Read only
Open Open DC Value Channel A[13:8] Read only
Open
Complex
power
calculation
mode
enable
Open Open Open Open Signal Monitor Value Channel A[19:16] Read only
Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1
DC
correction
freeze
RMS/MS
magnitude
output
enable
Open Open Open
Peak
power
output
enable
DC Correction Bandwidth[3:0]
DC Value Channel A[7:0] Read only
DC Value Channel B[7:0] Read only
Threshold
crossing
output
enable
Signal Monitor Period[7:0] 0x80
Signal Monitor Period[15:8] 0x00
Signal Monitor Period[23:16] 0x00
Signal Monitor Result Channel A[7:0] Read only
Signal Monitor Result Channel A[15:8] Read only
Signal Monitor Result Channel B[7:0] Read only
SPORT SMI
CLK divide
00 = undefined
01 = divide by 2
10 = divide by 4
11 = divide by 8
MS
mode
1 = ms
00 = RMS/MS Magnitude
0 =
01 = peak power
rms
1x = threshold count
Signal monitor mode
DC
correction
for signal
path
enable
SPORT
SMI SCLK
sleep
Bit 0
(LSB)
DC
correction
for SM
enable
Signal
monitor
SPORT
output
enable
Signal
monitor
enable
Value
(Hex)
0x00
0x04
0x00
Default
Notes/
Comments
In ADC clock
cycles
In ADC clock
cycles
In ADC clock
cycles
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Addr
(Hex)
0x11A
0x11B
Register
Name
Signal Monitor
Result
Channel B
Register 1
(Global)
Signal Monitor
Result
Channel B
Register 2
(Global)
Default
Bit 7
(MSB)
Open Open Open Open Signal Monitor Result Channel B[19:16] Read only
Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1
Signal Monitor Result Channel B[15:8] Read only
Bit 0
(LSB)
Value
(Hex)
Default
Notes/
Comments
MEMORY MAP REGISTER DESCRIPTION
For additional information about functions controlled in
Register 0x00 to Register 0xFF, see Application Note AN-877,
Interfacing to High Speed ADCs via SPI.
Sync Control (Register 0x100)
Bit 7—Signal Monitor Sync Enable
Bit 7 enables the sync pulse from the external SYNC input to
the signal monitor block. The sync signal is passed when Bit 7
is high and Bit 0 is high. This is continuous sync mode.
Bits[6:3]—Reserved
Bit 2—Clock Divider Next Sync Only
If the sync enable bit (Address 0x100[0]) is high and the clock
divider sync enable (Address 0x100[1]) is high, Bit 2 allows the
clock divider to sync to the first sync pulse it receives and ignore
the rest. Address 0x100[1] resets after it syncs.
Bit 1—Clock Divider Sync Enable
Bit 1 gates the sync pulse to the clock divider. The sync signal is
passed when Bit 1 is high and Bit 0 is high. This is continuous
sync mode.
Bit 0—Master Sync Enable
Bit 0 must be high to enable any of the sync functions.
Fast Detect Control (Register 0x104)
Bits[7:4]—Reserved
Bits[3:1]—Fast Detect Mode Select
These bits set the mode of the fast detect output bits according
to Tab l e 1 7 .
Bit 0—Fast Detect Enable
Bit 0 is used to enable the fast detect bits. When the fast detect
outputs are disabled, the outputs go into a high impedance state.
In LVDS mode, when the outputs are interleaved, the outputs go
high-Z only if both channels are turned off (power-down/standby/
output disabled). If only one channel is turned off (power-down/
standby/output disabled), the fast detect outputs repeat the data
of the active channel.
Fine Upper Threshold (Register 0x106 and Register 0x107)
These registers provide the fine upper limit threshold. This 13-bit
value is compared to the 13-bit magnitude from the ADC block
and, if the ADC magnitude exceeds this threshold value, the
F_UT flag is set.
Fine Lower Threshold (Register 0x108 and Register 0x109)
These registers provide a fine lower limit threshold. This 13-bit
value is compared to the 13-bit magnitude from the ADC block
and, if the ADC magnitude is less than this threshold value, the
F_LT flag is set.
Signal Monitor DC Correction Control (Register 0x10C)
Bit 7—Reserved
B
it 6—DC Correction Freeze
When Bit 6 is set high, the dc correction is no longer updated
to the signal monitoring block. It holds the last dc value it
calculated.
Bits[5:2]—DC Correction Bandwidth
These bits set the averaging time of the signal monitor dc correction function. It is a 4-bit word that sets the bandwidth of the
correction block (see Tabl e 26 ).
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Table 26. DC Correction Bandwidth
DC Correction Control Register 0x10C[5:2] Bandwidth (Hz)
Setting Bit 1 high causes the output of the dc measurement
block to be summed with the data in the signal path to remove
the dc offset from the signal path.
Bit 0—DC Correction for SM Enable
Bit 0 enables the dc correction function in the signal monitoring
block. The dc correction is an averaging function that can be
used by the signal monitor to remove dc offset in the signal.
Removing this dc from the measurement allows a more accurate
reading.
Signal Monitor DC Value Channel A (Register 0x10D and
Register 0x10E)
Register 0x10D, Bits[7:0]—Channel A DC Value[7:0]
Register 0x10E, Bits[7:0]—Channel A DC Value[13:8]
These read-only registers hold the latest dc offset value computed
by the signal monitor for Channel A.
Signal Monitor DC Value Channel B (Register 0x10F and
Register 0x110)
Register 0x10F Bits[7:0]—Channel B DC Value[7:0]
Register 0x110 Bits[7:0]—Channel B DC Value[13:8]
These read-only registers hold the latest dc offset value computed
by the signal monitor for Channel B.
Signal Monitor SPORT Control (Register 0x111)
Bit 7—Reserved
Bit 6—RMS/MS Magnitude Output Enable
These bits enable the 20-bit rms or ms magnitude measurement
as output on the SPORT.
Bit 5—Peak Power Output Enable
Bit 5 enables the 13-bit peak measurement as output on the
SPORT.
Bit 4—Threshold Crossing Output Enable
Bit 4 enables the 13-bit threshold measurement as output on
the SPORT.
The values of these bits set the SPORT SMI SCLK divide ratio
from the input clock. A value of 0x01 sets divide by 2 (default),
a value of 0x10 sets divide by 4, and a value of 0x11 sets divide by 8.
Bit 1— SPORT SMI SCLK Sleep
Setting Bit 1 high causes the SMI SCLK to remain low when the
signal monitor block has no data to transfer.
Bit 0—Signal Monitor SPORT Output Enable
When set, Bit 0 enables the SPORT output of the signal monitor
to begin shifting out the result data from the signal monitor block.
Signal Monitor Control (Register 0x112)
Bit 7—Complex Power Calculation Mode Enable
This mode assumes I data is present on one channel and Q data
is present on the opposite channel. The result reported is the
complex power, measured as
22
QI +
Bits[6:4]—Reserved
Bit 3—Signal Monitor RMS/MS Select
Setting Bit 3 low selects rms power measurement mode. Setting
Bit 3 high selects ms power measurement mode.
Bits[2:1]—Signal Monitor Mode
Bit 2 and Bit 1 set the mode of the signal monitor for data output
to Register 0x116 to Register 0x11B. Setting Bit 2 and Bit 1 to
0x00 selects rms/ms power output; setting these bits to 0x01
selects peak power output; and setting 0x10 or 0x11 selects
threshold crossing output.
Bit 0—Signal Monitor Enable
Setting Bit 0 high enables the signal monitor block.
Signal Monitor Period (Register 0x113 to Register 0x115)
This 24-bit value sets the number of clock cycles over which the
signal monitor performs its operation. The minimum value for
this register is 128 cycles (programmed values less than 128 revert
to 128).
Rev. 0 | Page 45 of 48
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AD9640
www.BDTIC.com/ADI
Signal Monitor Result Channel A (Register 0x116 to
Register 0x118)
Register 0x116, Bits[7:0]—Signal Monitor Result
hannel A[7:0]
C
Register 0x117, Bits[7:0]—Signal Monitor Result
C
hannel A[15:8]
Register 0x118, Bits[7:4]—Reserved
Register 0x118, Bits[3:0]—Signal Monitor Result
C
hannel A[19:16]
This 20-bit value contains the result calculated by the signal
monitoring block for Channel A. The content is dependent on the
settings in Register 0x112[2:1].
Signal Monitor Result Channel B (Register 0x119 to
Register 0x11B)
Register 0x119, Bits[7:0]— Signal Monitor Result
hannel B[7:0]
C
Register 0x11A, Bits[7:0]—Signal Monitor Result
C
hannel B[15:8]
Register 0x11B, Bits[7:4]—Reserved
Register 0x11B, Bits[3:0]—Signal Monitor Result
C
hannel B[19:16]
This 20-bit value contains the result calculated by the signal
monitoring block for Channel B. The content is dependent on
the settings in Register 0x112[2:1].
Rev. 0 | Page 46 of 48
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AD9640
www.BDTIC.com/ADI
APPLICATIONS INFORMATION
DESIGN GUIDELINES
Before starting design and layout of the AD9640 as a system,
it is recommended that the designer become familiar with these
guidelines, which discuss the special circuit connections and
layout requirements needed for certain pins.
Power and Ground Recommendations
When connecting power to the AD9640, it is recommended
that two separate 1.8 V supplies be used: one supply should be
used for analog (AVDD) and digital (DVDD), and a separate
supply should be used for the digital outputs (DRVDD). The
AVDD and DVDD supplies, while derived from the same
source, should be isolated with a ferrite bead or filter choke and
separate decoupling capacitors. The user can employ several
different decoupling capacitors to cover both high and low
frequencies. These should be located close to the point of entry
at the PC board level and close to the part’s pins with minimal
trace length.
A single PCB ground plane should be sufficient when using the
AD9640. W
PCB analog, digital, and clock sections, optimum performance
is easily achieved.
Power Supply Sequence
The AD9640 requires the following power-up sequence:
The DRVDD supply (1.8 V to 3.3 V) must reach the minimum
nominal voltage level (1.7 V) before the AVDD/DVDD supplies
attain the minimum level. If this sequence is not observed,
no part damage occurs but the part may consume current that
exceeds the specified values.
Exposed Paddle Thermal Heat Slug Recommendations
It is mandatory that the exposed paddle on the underside of the
ADC be connected to analog ground (AGND) to achieve the
best electrical and thermal performance. A continuous, exposed
(no solder mask), copper plane on the PCB should mate to the
AD9640 exposed paddle, Pin 0.
ith proper decoupling and smart partitioning of the
The copper plane should have several vias to achieve the lowest
p
ossible resistive thermal path for heat dissipation to flow
through the bottom of the PCB. These vias should be filled or
plugged with nonconductive epoxy.
To maximize the coverage and adhesion between the ADC and
P
CB, a silkscreen should be overlaid to partition the continuous
plane on the PCB into several uniform sections. This provides
several tie points between the two during the reflow process.
Using one continuous plane with no partitions guarantees only
one tie point between the ADC and PCB. See the evaluation
board for a PCB layout example. For detailed information about
packaging and PCB layout of chip scale packages, see Application
Note AN-772, A Design and Manufacturing Guide for the Lead Frame Chip Scale Package (LFCSP).
CML
The CML pin should be decoupled to ground with a 0.1 F
capacitor, as shown in Figure 47.
RBIAS
The AD9640 requires that a 10 kΩ resistor be placed between
the RBIAS pin and ground. This resister sets the master current
reference of the ADC core and should have at least a 1% tolerance.
Reference Decoupling
The VREF pin should be externally decoupled to ground with a
low ESR 1.0 F capacitor in parallel with a 0.1 F ceramic, low
ESR capacitor.
SPI Port
The SPI port should not be active during periods when the full
dynamic performance of the converter is required. Because the
SCLK, CSB, and SDIO signals are typically asynchronous to the
ADC clock, noise from these signals can degrade converter
performance. If the on-board SPI bus is used for other devices,
it may be necessary to provide buffers between this bus and the
AD9640 to keep these signals from transitioning at the converter
inputs during critical sampling periods.
Rev. 0 | Page 47 of 48
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AD9640
www.BDTIC.com/ADI
OUTLINE DIMENSIONS
7.50
REF
0.30
0.25
0.18
PIN 1
16
1
INDICATOR
7.25
7.10 SQ
6.95
0.25 MIN
64
17
1.00
0.85
0.80
SEATING
PLANE
12° MAX
9.00
BSC SQ
PIN 1
INDICATOR
VIEW
TOP
0.80 MAX
0.65 TYP
0.50 BSC
8.75
BSC SQ
0.20 REF
0.60 MAX
0.50
0.40
0.30
0.05 MAX
0.02 NOM
49
48
33
32
0.60 MAX
EXPOSED PAD
(BOTTOM VIEW)
COMPLIANT TO JEDEC STANDARDS MO -220-VMMD-4
063006-B
Figure 74. 64-Lead Lead Frame Chip Scale Package [LFCSP_VQ]
9
mm × 9 mm Body, Very Thin Quad
(CP-64-3)
Dimensions shown in millimeters
ORDERING GUIDE
Model Temperature Range Package Description Package Option
AD9640BCPZ-150−40°C to +85°C 64-Lead Lead Frame Chip Scale Package [LFCSP_VQ] CP-64-3
AD9640BCPZ-125
AD9640BCPZ-105
AD9640BCPZ-80
AD9640-150EBZ
AD9640-125EBZ
AD9640-105EBZ
AD9640-80EBZ
1
Z = RoHS Compliant Part.
1
1
−40°C to +85°C 64-Lead Lead Frame Chip Scale Package [LFCSP_VQ] CP-64-3
1
1
1
1
1
1
−40°C to +85°C 64-Lead Lead Frame Chip Scale Package [LFCSP_VQ] CP-64-3
−40°C to +85°C 64-Lead Lead Frame Chip Scale Package [LFCSP_VQ] CP-64-3
Evaluation Board
Evaluation Board
Evaluation Board
Evaluation Board