SNR = 64.8 dBFS @ fIN up to 70 MHz @ 250 MSPS
ENOB of 10.5 @ f
SFDR = 80 dBc @ f
Excellent linearity
DNL =
±0.3 LSB typical
INL = ±0.7 LSB typical
CMOS outputs
Single data port at up to 250 MHz
Interleaved dual port @ ½ sample rate up to 125 MHz
700 MHz full power analog bandwidth
On-chip reference, no external decoupling required
Integrated input buffer and track-and-hold
Low power dissipation
272 mW
364 mW @ 250 MSPS
Programmable input voltage range
V to 1.5 V, 1.25 V nominal
1.0
1.8 V analog and digital supply operation
Selectable output data format (offset binary, twos
omplement, Gray code)
c
Clock duty cycle stabilizer
Integrated data capture clock
up to 70 MHz @ 250 MSPS (−1.0 dBFS)
IN
up to 70 MHz @ 250 MSPS (−1.0 dBFS)
IN
@ 170 MSPS
1.8 V Analog-to-Digital Converter
AD9626
APPLICATIONS
Wireless and wired broadband communications
Cable reverse path
Communications test equipment
Radar and satellite subsystems
Power amplifier linearization
FUNCTIONAL BLOCK DIAGRAM
AGNDPWDNRBIASAVDD (1.8V)
CML
VIN+
VIN–
CLK+
CLK–
REFERENCE
TRACK-AND-HOLD
CLOCK
MANAGEMENT
ADC
12-BIT
CORE
SERIAL PORT
SCLK SDIO CSB
RESET
1212
Figure 1.
AD9626
OUTPUT
STAGING
LVDS
DRVDD
DRGND
Dx11 TO Dx0
OVRA
OVRB
DCO+
DCO–
07099-001
GENERAL DESCRIPTION
The AD9626 is a 12-bit monolithic sampling analog-to-digital
converter optimized for high performance, low power, and ease
of use. The product operates at up to a 250 MSPS conversion
rate and is optimized for outstanding dynamic performance in
wideband carrier and broadband systems. All necessary functions, including a track-and-hold (T/H) and voltage reference,
are included on the chip to provide a complete signal
conversion solution.
The ADC requires a 1.8 V analog voltage supply and a differen-
ial clock for full performance operation. The digital outputs are
t
CMOS compatible and support either twos complement, offset
binary format, or Gray code. A data clock output is available for
proper output data timing.
Fabricated on an advanced CMOS process, the AD9626 is
vailable in a 56-lead LFCSP, specified over the industrial
a
temperature range (−40°C to +85°C).
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Anal og Devices for its use, nor for any infringements of patents or ot her
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
PRODUCT HIGHLIGHTS
1. High Performance—Maintains 64.9 dBFS SNR @ 250 MSPS
with a 70 MHz input.
2. L
ow Power—Consumes only 364 mW @ 250 MSPS.
3. E
ase of Use—CMOS output data and output clock signal
allow interface to current FPGA technology. The on-chip
reference and sample-and-hold provide flexibility in
system design. Use of a single 1.8 V supply simplifies
system power supply design.
erial Port Control—Standard serial port interface supports
4. S
various product functions, such as data formatting, clock
duty cycle stabilizer, power-down, gain adjust, and output
test pattern generation.
No Missing Codes Full Guaranteed Guaranteed Guaranteed
Offset Error 25°C 4.0 4.0 4.0 mV
Full −12 +12 −12 +12 −12 +12 mV
Gain Error 25°C 1.4 1.4 1.4 % FS
Full −2.1 +4.5 −2.1 +4.5 −2.1 +4.5 % FS
Differential Nonlinearity (DNL) 25°C 0.3 0.3 0.3 LSB
Full −0.6 +0.6 −0.6 +0.6 −0.6 +0.6 LSB
Integral Nonlinearity (INL) 25°C 0.7 0.6 0.7 LSB
Full −1.4 +1.4 −1.1 +1.1 −1.7 +1.7 LSB
TEMPERATURE DRIFT
Offset Error Full ±8 ±8 ±8 µV/°C
Gain Error Full 0.021 0.021 0.021 %/°C
ANALOG INPUTS (VIN+, VIN−)
Differential Input Voltage Range2Full 0.98 1.25 1.5 0.98 1.25 1.5 0.98 1.25 1.5 V p-p
Input Common-Mode Voltage Full 1.4 1.4 1.4 V
Input Resistance (Differential) Full 4.3 4.3 4.3 kΩ
Input Capacitance 25°C 2 2 2 pF
POWER SUPPLY
AVDD Full 1.7 1.8 1.9 1.7 1.8 1.9 1.7 1.8 1.9 V
DRVDD Full 1.58 1.8 1.9 1.7 1.8 1.9 1.7 1.8 1.9 V
Supply Currents
3
I
AVDD
3
I
/Single Port Mode
DRVDD
3
I
/Interleaved Mode
DRVDD
Power Dissipation
Single Port Mode
Interleaved Mode
3
4
5
4
5
Power-Down Mode Supply
Currents
I
AVDD
I
DRVDD
Standby Mode Supply Currents
I
AVDD
I
DRVDD
1
See the AN-835 Application Note, Understanding High Speed ADC Testing and Evaluation, for a complete set of definitions and how these tests were completed.
2
The input range is programmable through the SPI, and the range specified reflects the nominal values of each setting. See the Memory Map section.
3
I
and I
AVDD
4
Single data rate mode; this is the default mode of the AD9626.
5
Interleaved mode; user-programmable feature. See the Memory Map section.
are measured with a −1 dBFS, 10.3 MHz sine input at rated sample rate.
DRVDD
= −40°C, T
MIN
= +85°C, fIN = −1.0 dBFS, full scale = 1.25 V, single port output mode, DCS enabled,
MAX
AD9626-170 AD9626-210 AD9626-250
Temp Min Typ Max Min Typ Max Min Typ Max Unit
Full 134 143 151 161 178 191 mA
Full 17 18.5 21 22 24 25.5 mA
Full 15 18 20 mA
Full mW
Full 272 291 310 330 364 390 mW
Full 268 304 357 mW
Parameter2 Temp Min Typ Max Min Typ Max Min Typ Max Unit
SNR
fIN = 10 MHz 25°C 64.5 64.4 64.0 dB
Full 63.6 63.0 dB
fIN = 70 MHz 25°C 64.4 64.2 63.8 dB
Full 63.0 62.3 dB
SINAD
fIN = 10 MHz 25°C 64.5 64.4 64.0 dB
Full 63.5 62.8 dB
fIN = 70 MHz 25°C 64.2 64.0 63.4 dB
Full 62.6 62.0 dB
EFFECTIVE NUMBER OF BITS (ENOB)
fIN = 10 MHz 25°C 10.6 10.6 10.5 Bits
fIN = 70 MHz 25°C 10.5 10.5 10.5 Bits
WORST HARMONIC (SECOND OR THIRD)
fIN = 10 MHz 25°C 84 86 83 dBc
Full 75 77 73 dBc
fIN = 70 MHz 25°C 79 79 80 dBc
Full 71 73 71 dBc
WORST OTHER (SFDR EXCLUDING
SECOND AND THIRD)
fIN = 10 MHz 25°C 92 90 84 dBc
Full 85 79 76 dBc
fIN = 70 MHz 25°C 92 87 84 dBc
Full 81 77 73 dBc
TWO-TONE IMD
140.2 MHz/141.3 MHz @ −7 dBFS 25°C 80 dBFS
170.2 MHz/171.3 MHz @ −7 dBFS 25°C 83 83 dBc
ANALOG INPUT BANDWIDTH 25°C 700 700 700 MHz
1
All ac specifications tested by driving CLK+ and CLK− differentially.
2
See the AN-835 Application Note, Understanding High Speed ADC Testing and Evaluation, for a complete set of definitions and how these tests were completed.
= −40°C, T
MIN
1
= +85°C, fIN = −1.0 dBFS, full scale = 1.25 V, , Single Port Output mode, DCS
MAX
AD9626-170AD9626-210AD9626-250
Rev. 0 | Page 4 of 36
AD9626
www.BDTIC.com/ADI
DIGITAL SPECIFICATIONS
AVDD = 1.8 V, DRVDD = 1.8 V, T
Table 3.
AD9626-170 AD9626-210 AD9626-250
Parameter1 Temp Min Typ Max Min Typ Max Min Typ Max Unit
CLOCK INPUTS
Logic Compliance Full CMOS/LVDS/LVPECL CMOS/LVDS/LVPECL CMOS/LVDS/LVPECL
Internal Common-Mode Bias Full 1.2 1.2 1.2 V
Differential Input Voltage Full 0.2 6 0.2 6 0.2 6 V p-p
Input Voltage Range Full
Input Common-Mode Range Full 1.1 AVDD 1.1 AVDD 1.1 AVDD V
High Level Input Voltage (VIH) Full 1.2 3.6 1.2 3.6 1.2 3.6 V
Low Level Input Voltage (VIL) Full 0 0.8 0 0.8 0 0.8 V
Input Resistance (Differential) Full 16 20 24 16 20 24 16 20 24 kΩ
Input Capacitance Full 4 4 4 pF
LOGIC INPUTS
Logic 1 Voltage Full
Logic 0 Voltage Full
Logic 1 Input Current (SDIO) Full 0 0 0 µA
Logic 0 Input Current (SDIO) Full −60 −60 −60 µA
Logic 1 Input Current
(SCLK, PDWN, CSB, RESET)
Logic 0 Input Current
(SCLK, PDWN, CSB, RESET)
Input Capacitance 25°C 4 4 4 pF
LOGIC OUTPUTS2
High Level Output Voltage Full DRVDD − 0.05 DRVDD − 0.05 DRVDD − 0.05 V
Low Level Output Voltage Full GND + 0.05 GND + 0.05 GND + 0.05 V
Output Coding Twos complement, Gray code, or offset binary (default)
1
See the AN-835 Application Note, Understanding High Speed ADC Testing and Evaluation, for a complete set of definitions and how these tests were completed.
2
LVDS R
TERMINATION
= 100 Ω.
= −40°C, T
MIN
AVDD −
0.3
0.8 ×
A
Full 55 55 50 µA
Full 0 0 0 µA
= +85°C, fIN = −1.0 dBFS, full scale = 1.25 V, DCS enabled, unless otherwise noted.
MAX
VDD
AVDD +
1.6
0.2 ×
VDD
A
AVDD −
0.3
0.8 ×
A
VDD
AVDD +
1.6
0.2 ×
AVDD
AVDD −
0.3
0.8 ×
A
VDD
V
AVDD +
1.6
0.2 ×
AVDD
V
V
Rev. 0 | Page 5 of 36
AD9626
www.BDTIC.com/ADI
SWITCHING SPECIFICATIONS
AVDD = 1.8 V, DRVDD = 1.8 V, T
Table 4.
AD9626-170 AD9626-210 AD9626-250
Parameter (Conditions) Temp Min Typ Max Min Typ Max Min Typ Max Unit
Maximum Conversion Rate Full 170
Minimum Conversion RateFull
CLK+ Pulse Width High (tCH)Full 2.65 2.9 2.15 2.4 1.8 2.0 ns
CLK+ Pulse Width Low (tCL) Full 2.65 2.9 2.15 2.4 1.8 2.0 ns
Output, Single Data Port Mode
Data Propagation Delay (tPD) 25°C 3.7 3.7 3.7 ns
DCO Propagation Delay (t
Data to DCO Skew (t
CPD
) Full 0 0.3 0.55 0 0.3 0.55 0 0.3 0.55 ns
SKEW
Latency Full 6 6 6 Cycles
SKEWA
2
PDA
CPDA
, t
SKEWB
Output, Interleaved Mode
Data Propagation Delay (t
DCO Propagation Delay (t
Data to DCO Skew (t
= +85°C, fIN = −1.0 dBFS, full scale = 1.25 V, DCS enabled, unless otherwise noted.
MAX
40
210
250
40
40 MSPS
MSPS
) 25°C 3.4 3.4 3.4 ns
, t
) 25°C 3.5 3.5 3.5 ns
PDB
, t
) 25°C 3.0 3.0 3.0 ns
CPDB
) Full 0 0.5 1.1 0 0.5 1.1 0 0.5 1.1 ns
50 50 50 µs
Rev. 0 | Page 6 of 36
AD9626
www.BDTIC.com/ADI
TIMING DIAGRAMS
N + 2
N + 1
N
t
A
t
= 1/
f
CLK+
CLK–
DCO–
DCO+
t
DAXN – 6N – 5N – 4N – 3N – 2N – 1NN + 1N + 2N – 7
CLK
t
CPD
t
SKEW
PD
N + 2
CLK+
CLK–
DCO+
DCO–
DAX
N + 1
N
t
A
t
= 1/
f
CLK
t
CPDA
t
t
PDA
SKEWA
N + 3
CLK
N – 6
N + 3
CLK
Figure 2. Single Port Mode
N + 4
N + 5
t
CPDB
N – 4
N + 4
N + 6
N + 5
N – 2
N + 7
N + 6
N + 8
N + 7
N + 8
07099-051
N
N + 2
t
SKEWB
t
PDB
DBX
N – 7
N – 5
N – 3
N – 1
N + 1
07099-050
Figure 3. Interleaved Mode
Rev. 0 | Page 7 of 36
AD9626
www.BDTIC.com/ADI
ABSOLUTE MAXIMUM RATINGS
Table 5.
Parameter Rating
ELECTRICAL
AVDD to AGND −0.3 V to +2.0 V
DRVDD to DRGND −0.3 V to +2.0 V
AGND to DRGND −0.3 V to +0.3 V
AVDD to DRVDD −2.0 V to +2.0 V
Dx0 Through Dx11 to DRGND −0.3 V to DRVDD + 0.3 V
DCO+/DCO− to DRGND −0.3 V to DRVDD + 0.3 V
OVRA/OVRB to DGND −0.3 V to DRVDD + 0.3 V
CLK+ to AGND −0.3 V to +3.6 V
CLK− to AGND −0.3 V to +3.6 V
VIN+ to AGND −0.3 V to AVDD + 0.2 V
VIN− to AGND −0.3 V to AVDD + 0.2 V
SDIO/DCS to DGND −0.3 V to DRVDD + 0.3 V
PDWN to AGND −0.3 V to +3.6 V
CSB to AGND −0.3 V to +3.6 V
SCLK/DFS to AGND −0.3 V to +3.6 V
ENVIRONMENTAL
Storage Temperature Range −65°C to +125°C
Operating Temperature Range −40°C to +85°C
Lead Temperature
(Soldering, 10 sec)
Junction Temperature 150°C
300°C
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
THERMAL RESISTANCE
The exposed paddle must be soldered to the ground plane for
the LFCSP package. Soldering the exposed paddle to the
customer board increases the reliability of the solder joints,
maximizing the thermal capability of the package.
Table 6.
Package Type θ
56-Lead LFCSP (CP-56-2) 30.4 2.9 °C/W
Typical θJA and θJC are specified for a 4-layer board in still air.
Airflow increases heat dissipation, effectively reducing θ
addition, metal in direct contact with the package leads from
metal traces, and through holes, ground, and power planes
reduces the θ
Table 7. Single Data Rate Mode Pin Function Descriptions
Pin No. Mnemonic Description
30, 32, 33, 34, 37, 38,
AVDD 1.8 V Analog Supply.
39, 41, 42, 43, 46
7, 24, 47 DRVDD 1.8 V Digital Output Supply.
0 AGND
8, 23, 48 DRGND
1
1
Analog Ground.
Digital Output Ground.
35 VIN+ Analog Input—True.
36 VIN− Analog Input—Complement.
40 CML
Common-Mode Output Pin. Enabled through the SPI, this pin provides a reference for the
ed internal bias voltage for VIN+/VIN−.
optimiz
44 CLK+ Clock Input—True.
45 CLK− Clock Input—Complement.
31 RBIAS Set Pin for Chip Bias Current. (Place 1% 10 kΩ resistor terminated to ground.) Nominally 0.5 V.
28 RESET CMOS-Compatible Chip Reset (Active Low).
25 SDIO/DCS
Serial Port Interface (SPI) Data Input/Output (Serial P
ort Mode); Duty Cycle Stabilizer Select
(External Pin Mode).
26 SCLK/DFS Serial Port Interface Clock (Serial Port Mode); Data Format Select Pin (External Pin Mode).
27 CSB Serial Port Chip Select (Active Low).
29 PWDN Chip Power-Down.
49 DCO− Data Clock Output—Complement.
50 DCO+ Data Clock Output—True.
51 DA0 (LSB) Output Port A Output Bit 0 (LSB).
52 DA1 Output Port A Output Bit 1.
53 DA2 Output Port A Output Bit 2.
54 DA3 Output Port A Output Bit 3.
55 DA4 Output Port A Output Bit 4.
56 DA5 Output Port A Output Bit 5.
1 DA6 Output Port A Output Bit 6.
2 DA7 Output Port A Output Bit 7.
Rev. 0 | Page 9 of 36
AD9626
www.BDTIC.com/ADI
Pin No. Mnemonic Description
3 DA8 Output Port A Output Bit 8.
4 DA9 Output Port A Output Bit 9.
5 DA10 Output Port A Output Bit 10.
6 DA11 (MSB) Output Port A Output Bit 11 (MSB).
9 OVRA Output Port A Overrange Output Bit.
10 DB0 (LSB) Output Port B Output Bit 0 (LSB).
11 DB1 Output Port B Output Bit 1.
12 DB2 Output Port B Output Bit 2.
13 DB3 Output Port B Output Bit 3.
14 DB4 Output Port B Output Bit 4.
15 DB5 Output Port B Output Bit 5.
16 DB6 Output Port B Output Bit 6.
17 DB7 Output Port B Output Bit 7.
18 DB8 Output Port B Output Bit 8.
19 DB9 Output Port B Output Bit 9.
20 DB10 Output Port B Output Bit 10.
21 DB11 (MSB) Output Port B Output Bit 11 (MSB).
22 OVRB Output Port B Overrange Output Bit.
1
AGND and DRGND should be tied to a common quiet ground plane.
Figure 37. AD9626 Power Supply Current vs. Sample Rate
90
80
70
60
50
40
SNR/SFDR (dB)
30
20
10
0
75275
95 115 135 155 175 195 215 235 255
07099-044
SFDR
SNR
SAMPLE RATE (MSPS)
07099-047
Figure 39. SNR/SFDR vs. Sample Rate;
0 MSPS, 170.3 MHz @ −1 dBFS
25
2.5
2.0
1.5
AD9626-210
1.0
GAIN (%FS)
0.5
0
–0.5
–60120100806040200–20–40
07099-045
TEMPERATURE ( °C)
AD9626-250
AD9626-170
07099-048
Figure 40. Gain vs. Temperature
Rev. 0 | Page 16 of 36
AD9626
www.BDTIC.com/ADI
6.0
5.5
5.0
4.5
AD9626-210
4.0
OFFSET (mV)
3.5
3.0
2.5
2.0
–40 –30 –20 –10 0908070605040302010
Figure 41. Offset vs. Temperature
TEMPERATURE ( °C)
AD9626-250
AD9626-170
07099-049
Rev. 0 | Page 17 of 36
AD9626
V
A
A
www.BDTIC.com/ADI
THEORY OF OPERATION
The AD9626 architecture consists of a front-end sample-andhold amplifier (SHA) followed by a pipelined switched capacitor
ADC. The quantized outputs from each stage are combined into
a final 12-bit result in the digital correction logic. The pipelined
architecture permits the first stage to operate on a new input
sample, while the remaining stages operate on preceding
samples. Sampling occurs on the rising edge of the clock.
Each stage of the pipeline, excluding the last, consists of a low
solution flash ADC connected to a switched capacitor DAC
re
and interstage residue amplifier (MDAC). The residue amplifier
magnifies the difference between the reconstructed DAC output
and the flash input for the next stage in the pipeline. One bit of
redundancy is used in each stage to facilitate digital correction
of flash errors. The last stage simply consists of a flash ADC.
The input stage contains a differential SHA that can be ac- or
upled. The output-staging block aligns the data, carries
dc-co
out the error correction, and passes the data to the output
buffers. The output buffers are powered from a separate supply,
allowing adjustment of the output voltage swing. During powerdown, the output buffers go into a high impedance state.
ANALOG INPUT AND VOLTAGE REFERENCE
The analog input to the AD9626 is a differential buffer. For best
dynamic performance, the source impedances driving VIN+
and VIN− should be matched such that common-mode settling
errors are symmetrical. The analog input is optimized to
provide superior wideband performance and requires that the
analog inputs be driven differentially.
A wideband transformer, such as Mini-Circuits® ADT1-1WT,
ca
n provide the differential analog inputs for applications that
require a single-ended-to-differential conversion. Both analog
inputs are self-biased by an on-chip resistor divider to a
nominal 1.4 V.
An internal differential voltage reference creates positive and
egative reference voltages that define the 1.25 V p-p fixed span
n
of the ADC core. This internal voltage reference can be adjusted
by means of SPI control. See the
e SPI section for more details.
th
Differential Input Configurations
Optimum performance is achieved while driving the AD9626
in a differential input configuration. For baseband applications,
the AD8138 differential driver provides excellent performance
a
nd a flexible interface to the ADC. The output common-mode
voltage of the AD8138 is easily set to AVDD/2 + 0.5 V, and the
dr
iver can be configured in a Sallen-Key filter topology to
provide band limiting of the input signal.
AD9626 Configuration Using
At input frequencies in the second Nyquist zone and above, the
performance of most amplifiers may not be adequate to achieve
the true performance of the AD9626. This is especially true in
IF undersampling applications where frequencies in the 70 MHz
to 100 MHz range are being sampled. For these applications,
differential transformer coupling is the recommended input
configuration. The signal characteristics must be considered
when selecting a transformer. Most RF transformers saturate at
frequencies below a few millihertz, and excessive signal power
can also cause core saturation, which leads to distortion.
In any configuration, the value of the shunt capacitor, C, is
dep
endent on the input frequency and may need to be reduced
or removed.
As an alternative to using a transformer-coupled input at
frequencies in the second Nyquist zone, the AD8352 differential
dr
iver can be used (see Figure 44).
NALOG INPUT
NALOG INPUT
49.9Ω1V p-p
0.1µF
499Ω
523Ω
499Ω
AD8138
499Ω
33Ω
33Ω
20pF
AVDD
VIN+
AD9626
VIN–
CML
Figure 42. Differential Input Configuration Using the AD8138
Figure 44. Differential Input Configuration Using the AD8352
CML
7099-008
07099-010
Rev. 0 | Page 18 of 36
AD9626
A
www.BDTIC.com/ADI
CLOCK INPUT CONSIDERATIONS
For optimum performance, the AD9626 sample clock inputs
(CLK+ and CLK−) should be clocked with a differential signal.
This signal is typically ac-coupled into the CLK+ pin and the
CLK− pin via a transformer or capacitors. These pins are biased
internally and require no additional bias.
Figure 45 shows one preferred method for clocking the AD9626.
w jitter clock source is converted from single-ended to
The lo
differential using an RF transformer. The back-to-back Schottky
diodes across the secondary transformer limit clock excursions
into the AD9626 to approximately 0.8 V p-p differential. This
helps prevent the large voltage swings of the clock from feeding
through to other portions of the AD9626 and preserves the fast
rise and fall times of the signal, which are critical to low jitter
performance.
In some applications, it is acceptable to drive the sample clock
inputs with a single-ended CMOS signal. In such applications,
CLK+ should be directly driven from a CMOS gate, and the
CLK− pin should be bypassed to ground with a 0.1 μF capacitor
in parallel with a 39 kΩ resistor (see
CLK+ i
nput circuit supply is AVDD (1.8 V), this input is
Figure 48). Although the
designed to withstand input voltages up to 3.3 V, making the
selection of the drive logic voltage very flexible.
D9510/AD9511/
AD9512/AD9513/
CLOCK
INPUT
0.1µF
50Ω*
0.1µF
AD9514/AD9515
CLK
CMOS DRIVER
CLK
0.1µF
OPTIONAL
100Ω
39kΩ
0.1µF
CLK+
ADC
AD9626
CLK–
MINI-CIRCUITS
CLOCK
INPUT
50Ω
ADT1–1WT, 1:1Z
100Ω
XFMR
0.1µF
0.1µF0.1µF
0.1µF
SCHOTT KY
DIODES:
HSM2812
CLK+
ADC
AD9626
CLK–
Figure 45. Transformer-Coupled Differential Clock
If a low jitter clock is available, another option is to ac couple a
differential PECL signal to the sample clock input pins, as
shown in Figure 46. The AD9510/AD9511/AD9512/AD9513/
AD9514/AD9515 family of clock drivers offers excellent jitter
pe
rformance.
AD9510/AD9511/
AD9512/AD9513/
AD9514/AD9515
CLOCK
INPUT
CLOCK
INPUT
50Ω*50Ω*
*50Ω RESISTORS ARE OPTIONAL.
0.1µF
0.1µF
CLK
PECL DRIVER
CLK
0.1µF
CLK+
100Ω
0.1µF
240Ω240Ω
ADC
AD9626
CLK–
Figure 46. Differential PECL Sample Clock
AD9510/AD9511/
CLOCK
INPUT
CLOCK
INPUT
50Ω*50Ω*
*50Ω RESIS TORS ARE OPT IONAL .
0.1µF
0.1µF
Figure 47. Differential LVDS Sample Clock
AD9512/AD9513/
AD9514/AD9515
CLK
LVDS DRIVER
CLK
0.1µF
100Ω
0.1µF
CLK+
ADC
AD9626
CLK–
*50Ω RESISTOR IS OPTIONAL.
07099-014
Figure 48. Single-Ended 1.8 V CMOS Sample Clock
AD9510/AD9511/
AD9512/AD9513/
CLOCK
07099-011
INPUT
*50Ω RESISTOR IS OPTIONAL.
0.1µF
50Ω*
0.1µF
AD9514/AD9515
CLK
CMOS DRIVER
CLK
OPTIONAL
100Ω
0.1µF
0.1µF
CLK+
ADC
AD9626
CLK–
07099-015
Figure 49. Single-Ended 3.3 V CMOS Sample Clock
Clock Duty Cycle Considerations
Typical high speed ADCs use both clock edges to generate a
variety of internal timing signals. As a result, these ADCs may
be sensitive to the clock duty cycle. Commonly, a 5% tolerance
is required on the clock duty cycle to maintain dynamic performance characteristics. The AD9626 contains a duty cycle
07099-012
stabilizer (DCS) that retimes the nonsampling edge, providing
an internal clock signal with a nominal 50% duty cycle. This
allows a wide range of clock input duty cycles without affecting
the performance of the AD9626. When the DCS is on, noise
and distortion performance are nearly flat for a wide range of
duty cycles. However, some applications may require the DCS
function to be off. If so, keep in mind that the dynamic range
performance can be affected when operated in this mode. See the
AD9626 Configuration Using the SPI section for more details
o
n using this feature.
The duty cycle stabilizer uses a delay-locked loop (DLL) to
07099-013
cr
eate the nonsampling edge. As a result, any changes to the
sampling frequency require approximately eight clock cycles
to allow the DLL to acquire and lock to the new rate.
Rev. 0 | Page 19 of 36
AD9626
O
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Clock Jitter Considerations
High speed, high resolution ADCs are sensitive to the quality of the
clock input. The degradation in SNR for a full-scale input signal
at a given input frequency (f
) due only to aperture jitter (tJ) can
A
be calculated by
SNR Degradation = 20 × log
[1/2 × π × fA × tJ]
10
In this equation, the rms aperture jitter represents the root mean
sq
uare of all jitter sources, including the clock input, analog input
signal, and ADC aperture jitter specifications. IF undersampling
applications are particularly sensitive to jitter (see
Figure 50).
The clock input should be treated as an analog signal in cases
w
here aperture jitter may affect the dynamic range of the AD9626.
Power supplies for clock drivers should be separated from the
ADC output driver supplies to avoid modulating the clock signal
with digital noise. Low jitter, crystal controlled oscillators make
the best clock sources. If the clock is generated from another
type of source (by gating, dividing, or other methods), it should
be retimed by the original clock at the last step.
Refer to the AN-501 Application Note and the AN-756
A
pplication Note for more in-depth information about jitter
performance as it relates to ADCs (visit www.analog.com).
130
RMS CLOCK JIT TER REQUIREMENT
120
110
100
90
80
SNR (dB)
70
10 BITS
60
8 BITS
50
40
30
1101001000
Figure 50. Ideal SNR vs. Input Frequency a
ANALOG INPUT FREQUENCY (MHz)
0.125ps
0.25ps
0.5ps
1.0ps
2.0ps
nd Jitter for 0 dBFS input Signal
16 BITS
14 BITS
12 BITS
07099-016
POWER DISSIPATION AND POWER-DOWN MODE
As shown in Figure 37, the power dissipated by the AD9626 is
proportional to its sample rate. The digital power dissipation
does not vary much because it is determined primarily by the
DRVDD supply and bias current of the LVDS output drivers.
By asserting PDWN (Pin 29) high, the AD9626 is placed in
andby mode or full power-down mode, as determined by the
st
contents of Serial Port Register 08. Reasserting the PDWN pin
low returns the AD9626 into its normal operational mode.
An additional standby mode is supported by means of varying
t
he clock input. When the clock rate falls below 50 MHz, the
AD9626 assumes a standby state. In this case, the biasing network
and internal reference remain on, but digital circuitry is powered
down. Upon reactivating the clock, the AD9626 resumes normal
operation after allowing for the pipeline latency.
DIGITAL OUTPUTS
Digital Outputs and Timing
The off-chip drivers on the AD9626 are CMOS-compatible
output levels. The outputs are biased from a separate supply
(DRVDD), allowing isolation from the analog supply and easy
interface to external logic. The outputs are CMOS devices that
swing from ground to DRVDD (with no dc load). It is recommended to minimize the capacitive load the ADC drives by
keeping the output traces short (<1 inch, for a total C
When operating in CMOS mode, it is also recommended to
place low value (20 Ω) series damping resistors on the data lines
to reduce switching transient effects on performance.
The format of the output data is offset binary by default. An
mple of the output coding format can be found in Tabl e 11 .
exa
f it is desired to change the output data format to twos comple-
I
ment, see the
AD9626 Configuration Using the SPI section.
An output clock signal is provided to assist in capturing data
rom the AD9626. The DCO+/DCO− signal is used to clock the
f
output data and is equal to the sampling clock (CLK) rate in
single port mode, and one-half the clock rate in interleaved
output mode. See the timing diagrams shown in
Figure 3 for more information.
Out-of-Range
An out-of-range condition exists when the analog input voltage
is beyond the input range of the ADC. OVRA/OVRB is a digital
output that is updated along with the data output corresponding
to the particular sampled input voltage. Thus, OVRA/OVRB
has the same pipeline latency as the digital data. OVRA/OVRB
is low when the analog input voltage is within the analog input
range and high when the analog input voltage exceeds the input
range, as shown in
t
he analog input returns to within the input range and another
Figure 51. OVRA/OVRB remains high until
conversion is completed. By logically AND-ing OVRA/OVRB
with the MSB and its complement, overrange high or underrange low conditions can be detected.
VRA/OVRB
DATA OUTPUTS
1
1111
1111
0
1111
1111
1111
0
1111
0
0000
0000
0
0000
0000
1
0000
0000
Figure 51. OVRA/OVRB Relation to Input Voltage and Output Data
1111
1111
1110
0001
0000
0000
OVRA/
OVRB
–FS + 1/2 L SB
–FS – 1/2 LSB
+FS – 1 LSB
+FS – 1/2 L SB
< 5 pF).
LOAD
Figure 2 and
+FS–FS
07099-017
Rev. 0 | Page 20 of 36
AD9626
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TIMING—SINGLE PORT MODE
In single port mode, the CMOS output data is available from
Data Port A (DA0 to DA11). The outputs for Port B (DB0 to
DB11) are unused, and are high impedance in this mode.
The Port A outputs and the differential output data clock
(DCO+/DCO−) switch nearly simultaneously during the rising
edge of DCO+. In this mode, it is recommended to use the
rising edge of DCO− to capture the data from Port A. The setup
and hold time depends on the input sample clock period, and is
approximately 1/f
CLK
± t
SKEW
.
TIMING—INTERLEAVED MODE
In interleaved mode, the output data of the AD9626 is
demultiplexed onto two data port buses, Port A (DA0 to DA11)
and Port B (DB0− to DB11). The output data and differential
data capture clock switch at one-half the rate of the sample
clock input (CLK+/CLK−), increasing the setup and hold time
for the external data capture circuit relative to single port mode
(see
Figure 3, interleaved mode timing diagram). The two ports
witch on alternating sample clock cycles, with the data for
s
Port A being valid during the rising edge of DCO+, and the
data for Port B being valid during the rising edge of DCO−. The
pipeline latency for both ports is six sample clock cycles. Due to
the random nature of the ÷2 circuit that generates the timing
for the output stage in interleaved mode, the first data sample
during power up can be assigned to either Data Port A or Port
B. The user cannot control the polarity of the output data clock
relative to the input sample clock. In this mode, it is recom-
mended to use the rising edge of DCO+ to capture the data
from Port A, and the rising edge of DCO− to capture the data
from Port B. In both cases, the setup and hold time depends on
the input sample clock period, and both are approximately
2/f
± t
.
S
SKEW
fS/2 Spurious
Because the AD9626 output data rate is at one-half the sampling
frequency in interleaved output mode, there is significant f
/2
S
energy in the outputs of the part, and there will be significant
energy in the ADC output spectrum at f
to be certain that this f
/2 energy does not couple into either the
S
clock circuit or the analog inputs of the AD9626. When f
/2. Care must be taken
S
/2
S
energy is coupled in this fashion, it appears as a spurious tone
reflected around f
/4, 3fS/4, 5fS/4, and so on. For example, in a
S
125 MSPS sampling application with a 90 MHz single-tone
analog input, this energy generates a tone at 97.5 MHz.
[(3 × 125 MSPS/4 − 90 MHz) + 3 × 125 MSPS/4]
Depending on the relationship of the IF frequency to the center
o
f the Nyquist zone, this spurious tone may or may not be in the
user’s band of interest. Some residual f
/2 energy is present in
S
the AD9601, and the level of this spur is typically below the
level of the harmonics at clock rates.
e f
th
/2 spur level vs. the analog input frequency for the
S
AD9626-250. For the specifications provided in Tab l e 2 , the f
Figure 20 shows a plot of
/2
S
spur effect is not a factor, as the device is specified in single port
output mode.
Rev. 0 | Page 21 of 36
AD9626
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LAYOUT CONSIDERATIONS
POWER AND GROUND RECOMMENDATIONS
When connecting power to the AD9626, it is recommended
that two separate supplies be used: one for analog (AVDD, 1.8 V
nominal) and one for digital (DRVDD, 1.8 V nominal). If only a
single 1.8 V supply is available, it is routed to AVDD first, then
tapped off and isolated with a ferrite bead or filter choke with
decoupling capacitors proceeding connection to DRVDD. The
user can employ several different decoupling capacitors to cover
both high and low frequencies. These should be located close to
the point of entry at the PC board level and close to the parts
with minimal trace length.
A single PCB ground plane is sufficient when using the
AD9626. W
analog, digital, and clock sections of the PCB, optimum
performance is easily achieved.
ith proper decoupling and smart partitioning of
Exposed Paddle Thermal Heat Slug Recommendations
It is required that the exposed paddle on the underside of the
ADC be connected to analog ground (AGND) to achieve the
best electrical and thermal performance of the AD9626. An
exposed, continuous copper plane on the PCB should mate to
the AD9626 exposed paddle, Pin 0. The copper plane should
have several vias to achieve the lowest possible resistive thermal
path for heat dissipation to flow through the bottom of the PCB.
These vias should be solder-filled or plugged.
To maximize the coverage and adhesion between the ADC and
PCB
, partition the continuous plane by overlaying a silkscreen
on the PCB into several uniform sections. This provides several
tie points between the two during the reflow process. Using one
continuous plane with no partitions guarantees only one tie
point between the ADC and PCB. See
ample. For detailed information on packaging and the PCB
ex
layout of chip scale packages, seeApplication Note AN-772,
A Design and Manufacturing Guide for the Lead Frame Chip
Scale Package.
SILKSCREEN PARTITION
PIN 1 INDICATOR
Figure 52. Typical PCB Layout
Figure 52 for a PCB layout
07099-018
CML
The CML pin should be decoupled to ground with a 0.1 μF
capacitor, as shown in Figure 54.
RBIAS
The AD9626 requires the user to place a 10 kΩ resistor between
the RBIAS pin and ground. This resistor sets the master current
reference of the ADC core and should have at least a 1% tolerance.
AD9626 CONFIGURATION USING THE SPI
The AD9626 SPI allows the user to configure the converter for
specific functions or operations through a structured register
space inside the ADC. This gives the user added flexibility to
customize device operation depending on the application.
Addresses are accessed (programmed or read back) serially in
one-byte words. Each byte can be further divided down into
fields, which are documented in the
There are three pins that define the serial port interface or SPI
t
o this particular ADC. They are the SPI SCLK/DFS, SPI
SDIO/DCS, and CSB pins. The SCLK/DFS (serial clock) is used
to synchronize the read and write data presented the ADC. The
SDIO/DCS (serial data input/output) is a dual-purpose pin that
allows data to be sent and read from the internal ADC memory
map registers. The CSB is an active low control that enables or
disables the read and write cycles (see
Table 8. Serial Port Pins
Mnemonic Function
SCLK
SDIO
CSB
RESET
The falling edge of the CSB, in conjunction with the rising edge
of the SCLK, determines the start of the framing. An example of
the serial timing and its definitions can be found in
nd Tabl e 10 .
a
During an instruction phase, a 16-bit instruction is transmitted.
D
ata then follows the instruction phase and is determined by
the W0 and W1 bits, which is 1 or more bytes of data. All data is
composed of 8-bit words. The first bit of each individual byte of
serial data indicates whether this is a read or write command.
This allows the serial data input/output (SDIO) pin to change
direction from an input to an output.
Data can be sent in MSB or in LSB first mode. MSB first is
ult on power-up and can be changed by changing the
defa
configuration register. For more information about this feature
and others, see Interfacing to High Speed ADCs via SPI at
www.analog.com.
SCLK (Serial Clock) is the serial shift clock in.
SCLK is used t
reads and writes.
SDIO (Serial Data Input/O
pin. The typical role for this pin is an input and
output depending on the instruction being sent
and the relative position in the timing frame.
CSB (Chip Select Bar) is an active low control that
tes the read and write cycles.
ga
Master Device Reset. When asserted, device
assumes d
efault settings. Active low.
Memory Map section.
Tabl e 8).
o synchronize serial interface
utput) is a dual-purpose
Figure 53
Rev. 0 | Page 22 of 36
AD9626
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HARDWARE INTERFACE CONFIGURATION WITHOUT THE SPI
The pins described in Ta b l e 8 comprise the physical interface
between the user’s programming device and the serial port of
the AD9626. All serial pins are inputs, which is an open-drain
output and should be tied to an external pull-up or pull-down
resistor (suggested value of 10 kΩ).
This interface is flexible enough to be controlled by either
PROMS or PIC mirocontrollers as well. This provides the user
with an alternate method to program the ADC other than a SPI
controller.
If the user chooses not to use the SPI interface, some pins serve
a dual function and are associated with a specific function when
strapped externally to AVDD or ground during device poweron. The
s
Configuration Without the SPI section describes the
trappable functions supported on the AD9626.
t
HI
t
CLK
t
LO
CSB
t
DS
t
S
t
DH
In applications that do not interface to the SPI control registers,
the SPI SDIO/DCS and SPI SCLK/DFS pins can alternately
serve as standalone CMOS-compatible control pins. When the
device is powered up, it is assumed that the user intends to use
the pins as static control lines for the duty cycle stabilizer. In
this mode, the SPI CSB chip select should be connected to
ground, which disables the serial port interface.
5 Setup time between the data and the rising edge of SCLK
2 Hold time between the data and the rising edge of SCLK
40 Period of the clock
5 Setup time between CSB and SCLK
2 Hold time between CSB and SCLK
16 Minimum period that SCLK should be in a logic high state
16 Minimum period that SCLK should be in a logic low state
1
5
Offset Binary Output Mode
D11 t
Minimum time for the SDIO pin to switch from an input t
falling edge (not shown in Figure 53)
Minimum time for the SDIO pin to switch from an output t
rising edge (not shown in Figure 53)
Twos Complement Mode
o D0
D11 to D0
Gray Code Mode
(SPI Accessible)
D11 to D0
o an output relative to the SCLK
o an input relative to the SCLK
OR
Rev. 0 | Page 24 of 36
AD9626
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MEMORY MAP
READING THE MEMORY MAP TABLE
Each row in the memory map table has eight address locations.
The memory map is roughly divided into three sections: chip
configuration register map (Address 0x00 to Address 0x02),
transfer register map (Address 0xFF), and program register map
(Address 0x08 to Address 0x2A).
The Addr (Hex) column of the memory map indicates the
egister address in hexadecimal, and the Default Value (Hex)
r
column shows the default hexadecimal value that is already
written into the register, The Bit 7 (MSB) column is the start of
the default hexadecimal value given. For example, Hexadecimal
Address 0x09, clock, has a hexadecimal default value of 0x01.
This means Bit 7 = 0, Bit 6 = 0, Bit 5 = 0, Bit 4 = 0, Bit 3 = 0,
Bit 2 = 0, Bit 1 = 0, and Bit 0 = 1, or 0000 0001 in binary. The
default value enables the duty cycle stabilizer. Overwriting this
default so that Bit 0 = 0 disables the duty cycle stabilizer. For more
information on this and other functions, consult the Inter facing to High Speed ADCs via SPI user manual at
Table 12. Memory Map Register
Addr
(Hex)
Chip Configuration Registers
00 chip_port_config 0 LSB
01 chip_id 8-bit chip ID, Bits[7:0]
02 chip_grade 0 0 0 Speed grade:
Transfer Register
FF device_update 0 0 0 0 0 0 0 SW
ADC Functions
08 modes 0 0 PDWN:
Parameter Name
Bit 7
(MSB)
www.analog.com.
Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1
Soft reset 1 1 Soft reset LSB
first
AD9626 = 0x3c
00 = 170 MSPS
01 = 210 MSPS
10 = 250 MSPS
0 0 Internal power-down mode:
0 = full
(default)
1 =
standby
RESERVED LOCATIONS
Undefined memory locations should not be written to other
than their default values suggested in this data sheet. Addresses
that have values marked as 0 should be considered reserved and
have a 0 written into their registers during power-up.
DEFAULT VALUES
Coming out of reset, critical registers are preloaded with default
values. These values are indicated in Tab le 1 2. Other registers
not have default values and retain the previous value when
do
exiting reset.
LOGIC LEVELS
An explanation of various registers follows: “Bit is set” is
synonymous with “bit is set to Logic 1” or “writing Logic 1 for
the bit.” Similarly, “clear a bit” is synonymous with “bit is set to
Logic 0” or “writing Logic 0 for the bit.”
Default
Bit 0
(LSB)
first
X X X Read-
000 = normal (power-up, default)
Note: external PDWN pin overrides
= full power-down
001
010 = standby
011 = normal (power-up)
this setting
0 0x18 The nibbles should
transfer
Value
(Hex)
Read-
only
only
0x00 Synchronously
0x00 Determines various
Default Notes/
Com
ments
be mirrored by the
user so that LSB or
MSB first mode
registers correctly,
regardless of shift
mode.
Default is unique
chip ID, different
for each device.
This is a read-only
register.
Child ID used to
differentiate
ded devices.
gra
transfers data from
the master shift
register to the
slave.
1 P8 Power jack, male, 2.1 mm power jack dc CUI Inc CP-102A-ND
1 R1 201 Resistor, 100 Ω, 0201, 1/20 W, 1% NIC Components NRC02F1000TRF
1 R2 603 Resistor, 499 Ω, 0603, 1/10 W, 1% NIC Components NRC06F4990TRF