76 mW at 80 MSPS
Differential input with 700 MHz bandwidth
On-chip voltage reference and sample-and-hold circuit
2 V p-p differential analog input
DNL = ±0.10 LSB
Serial port control options
Offset binary, gray code, or twos complement data format
Optional clock duty cycle stabilizer
Integer 1-to-8 input clock divider
Built-in selectable digital test pattern generation
Energy-saving power-down modes
Data clock out with programmable clock and data alignment
APPLICATIONS
Communications
Diversity radio systems
Multimode digital receivers
1. The AD9609 operates from a single 1.8 V analog power
supply and features a separate digital output driver supply
to accommodate 1.8 V to 3.3 V logic families.
2. The patented sample-and-hold circuit maintains excellent
performance for input frequencies up to 200 MHz and is
designed for low cost, low power, and ease of use.
3. A standard serial port interface supports various product
features and functions, such as data output formatting,
internal clock divider, power-down, DCO and data output
(D9 to D0) timing and offset adjustments, and voltage
reference modes.
4. The AD9609 is packaged in a 32-lead RoHS compliant
LFCSP that is pin compatible with the AD9629 12-bit ADC
and the AD9649 14-bit ADC, enabling a simple migration
path between 10-bit and 14-bit converters sampling from
20 MSPS to 80 MSPS.
AD9609
MODE
CONTROLS
DFS MODE
DRVDD
CMOS
OUTPUT BUFFER
OR
D9 (MSB)
D0 (LSB)
DCO
08541-001
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
The AD9609 is a monolithic, single channel 1.8 V supply,
10-bit, 20 MSPS/40 MSPS/65 MSPS/80 MSPS analog-to-digital
converter (ADC). It features a high performance sample-andhold circuit and on-chip voltage reference.
The product uses multistage differential pipeline architecture
with output error correction logic to provide 10-bit accuracy at
80 MSPS data rates and to guarantee no missing codes over the
full operating temperature range.
The ADC contains several features designed to maximize
flexibility and minimize system cost, such as programmable
clock and data alignment and programmable digital test pattern
generation. The available digital test patterns include built-in
deterministic and pseudorandom patterns, along with custom
user-defined test patterns entered via the serial port interface (SPI).
A differential clock input with selectable internal 1 to 8 divide ratio
controls all internal conversion cycles. An optional duty cycle
stabilizer (DCS) compensates for wide variations in the clock duty
cycle while maintaining excellent overall ADC performance.
The digital output data is presented in offset binary, gray code,
or twos complement format. A data output clock (DCO) is
provided to ensure proper latch timing with receiving logic. Both
1.8 V and 3.3 V CMOS levels are supported.
The AD9609 is available in a 32-lead RoHS-compliant LFCSP
and is specified over the industrial temperature range (−40°C
to +85°C).
Rev. 0 | Page 3 of 32
Page 4
AD9609
SPECIFICATIONS
DC SPECIFICATIONS
AVDD = 1.8 V; DRVDD = 1.8 V, maximum sample rate, 2 V p-p differential input, 1.0 V internal reference; AIN = −1.0 dBFS, 50% duty
cycle clock, DCS disabled, unless otherwise noted.
Table 1.
AD9609-20/AD9609-40 AD9609-65 AD9609-80
Parameter Temp
RESOLUTION Full 10 10 10 Bits
ACCURACY
No Missing Codes Full Guaranteed Guaranteed Guaranteed
Offset Error Full −0.45 +0.05 +0.55 −0.45 +0.05 +0.55 −0.45 +0.05 +0.55 % FSR
Gain Error1 Full −1.5 −1.5 −1.5 % FSR
Differential Nonlinearity (DNL)2 Full ±0.15/±0.25 ±0.25 ±0.25 LSB
25°C ±0.05/±0.08 ±0.15 ±0.07 LSB
Integral Nonlinearity (INL)2
25°C ±0.15 ±0.15 ±0.15 LSB
TEMPERATURE DRIFT
Offset Error Full ±2 ±2 ±2 ppm/°C
INTERNAL VOLTAGE REFERENCE
Output Voltage (1 V Mode) Full 0.984 0.996 1.008 0.984 0.996 1.008 0.984 0.996 1.008 V
Load Regulation Error at 1.0 mA Full 2 2 2 mV
INPUT-REFERRED NOISE
VREF = 1.0 V 25°C 0.06 0.08 0.08 LSB rms
ANALOG INPUT
Input Span, VREF = 1.0 V Full 2 2 2 V p-p
Input Capacitance3 Full 6 6 6 pF
Input Common-Mode Voltage Full 0.9 0.9 0.9 V
Input Common-Mode Range Full 0.5 1.3 0.5 1.3 0.5 1.3 V
REFERENCE INPUT RESISTANCE Full 7.5 7.5 7.5 kΩ
POWER SUPPLIES
Supply Voltage
AVDD Full 1.7 1.8 1.9 1.7 1.8 1.9 1.7 1.8 1.9 V
DRVDD Full 1.7 3.6 1.7 3.6 1.7 3.6 V
Supply Current
IAVDD2
IDRVDD2 (1.8 V)
IDRVDD2 (3.3 V)
POWER CONSUMPTION
DC Input Full 45.2/54.7 67.7 76.3 mW
Sine Wave Input2 (DRVDD = 1.8 V)
Sine Wave Input2 (DRVDD = 3.3 V)
Standby Power4 Full 34 34 34 mW
Power-Down Power Full 0.5 0.5 0.5 mW
1
Measured with 1.0 V external reference.
2
Measured with a 10 MHz input frequency at rated sample rate, full-scale sine wave, with approximately 5 pF loading on each output bit.
3
Input capacitance refers to the effective capacitance between one differential input pin and AGND.
4
Standby power is measured with a dc input and the CLK active.
Full ±0.35 ±0.45 ±0.45 LSB
Full 24.9/29.7 27.0/32.0 37.1 39.5 41.8 45 mA
Full 1.4/2.2 3.6 4.3 mA
Full 2.5/4.1 6.6 7.9 mA
Full 46.3/57.4 52.0/61.0 73.3 78.0 83.0 92 mW
Full 53.1/67.0 88.6 89.5 mW
Unit Min Typ Max Min Typ Max Min Typ Max
Rev. 0 | Page 4 of 32
Page 5
AD9609
AC SPECIFICATIONS
AVDD = 1.8 V; DRVDD = 1.8 V, maximum sample rate, 2 V p-p differential input, 1.0 V internal reference; AIN = −1.0 dBFS, 50% duty
cycle clock, DCS disabled, unless otherwise noted.
Table 2.
AD9609-20/AD9609-40 AD9609-65 AD9609-80
Parameter1 Temp
SIGNAL-TO-NOISE RATIO (SNR)
fIN = 9.7 MHz 25°C 61.7 61.5 61.5 dBFS
fIN = 30.5 MHz 25°C 61.7 61.5 61.5 dBFS
Full 61.2 61.0 dBFS
fIN = 70 MHz 25°C 61.6 61.5 61.5 dBFS
Full 61.0 dBFS
fIN = 200 MHz 25°C 61.0 61.0 dBFS
SIGNAL-TO-NOISE-AND-DISTORTION (SINAD)
fIN = 9.7 MHz 25°C 61.6 61.4 61.4 dBFS
fIN = 30.5 MHz 25°C 61.5 61.3 61.4 dBFS
Full 60.7/60.9 60.5 dBFS
fIN = 70 MHz 25°C 61.5 61.4 61.4 dBFS
Full 60.5 dBFS
fIN = 200 MHz 25°C 60 60 dBFS
EFFECTIVE NUMBER OF BITS (ENOB)
fIN = 9.7 MHz 25°C 9.9 9.9 9.9 Bits
fIN = 30.5 MHz 25°C 9.9 9.9 9.9 Bits
fIN = 70 MHz 25°C 9.9 9.9 9.9 Bits
fIN = 200 MHz 25°C 9.6 9.6 Bits
WORST SECOND OR THIRD HARMONIC
fIN = 9.7 MHz 25°C −81 −78 −78 dBc
fIN = 30.5 MHz 25°C −80 −80 −80 dBc
Full −67 −65.5 dBc
fIN = 70 MHz 25°C −82 −78 −78 dBc
Full −68 dBc
fIN = 200 MHz 25°C −73 −73 dBc
SPURIOUS-FREE DYNAMIC RANGE (SFDR)
fIN = 9.7 MHz 25°C 78 75 75 dBc
fIN = 30.5 MHz 25°C 80.5 75 75 dBc
Full 67 65.5 dBc
fIN = 70 MHz 25°C 78 75 75 dBc
Full 68 dBc
fIN = 200 MHz 25°C 73 73 dBc
WORST OTHER (HARMONIC OR SPUR)
fIN = 9.7 MHz 25°C −82 −80 −80 dBc
fIN = 30.5 MHz 25°C −82 −80 −80 dBc
Full −74 −72 dBc
fIN = 70 MHz 25°C −82 −80 −80 dBc
Full −73 dBc
fIN = 200 MHz 25°C −80 −80 dBc
See the AN-835 Application Note, Understanding High Speed ADC Testing and Evaluation, for a complete set of definitions.
Unit Min Typ Max Min Typ Max Min Typ Max
Rev. 0 | Page 5 of 32
Page 6
AD9609
DIGITAL SPECIFICATIONS
AVDD = 1.8 V; DRVDD = 1.8 V, maximum sample rate, 2 V p-p differential input, 1.0 V internal reference; AIN = −1.0 dBFS, 50% duty
cycle clock, DCS disabled, unless otherwise noted.
Table 3.
AD9609-20/AD9609-40/AD9609-65/AD9609-80
Parameter Temp
DIFFERENTIAL CLOCK INPUTS (CLK+, CLK−)
Logic Compliance CMOS/LVDS/LVPECL
Internal Common-Mode Bias Full 0.9 V
Differential Input Voltage Full 0.2 3.6 V p-p
Input Voltage Range Full GND − 0.3 AVDD + 0.2 V
High Level Input Current Full −10 +10 μA
Low Level Input Current Full −10 +10 μA
Input Resistance Full 8 10 12 kΩ
Input Capacitance Full 4 pF
LOGIC INPUTS (SCLK/DFS, MODE, SDIO/PDWN)1
High Level Input Voltage Full 1.2 DRVDD + 0.3 V
Low Level Input Voltage Full 0 0.8 V
High Level Input Current Full −50 −75 μA
Low Level Input Current Full −10 +10 μA
Input Resistance Full 30 kΩ
Input Capacitance Full 2 pF
LOGIC INPUTS (CSB)2
High Level Input Voltage Full 1.2 DRVDD + 0.3 V
Low Level Input Voltage Full 0 0.8 V
High Level Input Current Full −10 +10 μA
Low Level Input Current Full 40 135 μA
Input Resistance Full 26 kΩ
Input Capacitance Full 2 pF
DIGITAL OUTPUTS
DRVDD = 3.3 V
High Level Output Voltage, IOH = 50 μA Full 3.29 V
High Level Output Voltage, IOH = 0.5 mA Full 3.25 V
Low Level Output Voltage, IOL = 1.6 mA Full 0.2 V
Low Level Output Voltage, IOL = 50 μA Full 0.05 V
DRVDD = 1.8 V
High Level Output Voltage, IOH = 50 μA Full 1.79 V
High Level Output Voltage, IOH = 0.5 mA Full 1.75 V
Low Level Output Voltage, IOL = 1.6 mA Full 0.2 V
Low Level Output Voltage, IOL = 50 μA Full 0.05 V
1
Internal 30 kΩ pull-down.
2
Internal 30 kΩ pull-up.
Unit Min Typ Max
Rev. 0 | Page 6 of 32
Page 7
AD9609
SWITCHING SPECIFICATIONS
AVDD = 1.8 V; DRVDD = 1.8 V, maximum sample rate, 2 V p-p differential input, 1.0 V internal reference; AIN = −1.0 dBFS, 50% duty
cycle clock, DCS disabled, unless otherwise noted.
15.38 12.5 ns
CLK Pulse Width High (tCH) 25.0/12.5 7.69 6.25 ns
Aperture Delay (tA) Full 1.0 1.0 1.0 ns
Aperture Uncertainty (Jitter, tJ) Full 0.1 0.1 0.1 ps rms
DATA OUTPUT PARAMETERS
Data Propagation Delay (tPD) Full
DCO Propagation Delay (t
DCO to Data Skew (t
SKEW
) Full 3
DCO
) Full 0.1
3
3
3
0.1
3 ns
3 ns
0.1 ns
Pipeline Delay (Latency) Full 8 8 8 Cycles
Wake-Up Time2 Full 350 350 350 μs
Standby Full 600/400 300 260 ns
OUT-OF-RANGE RECOVERY TIME Full 2 2 2 Cycles
1
Conversion rate is the clock rate after the CLK divider.
2
Wake-up time is dependent on the value of the decoupling capacitors.
VIN
CLK+
CLK–
DCO
DATA
N – 1
t
A
N
N + 1
t
CH
t
CLK
t
DCO
t
SKEW
N – 8
t
PD
N + 2
N – 7N – 6N – 5N – 4
N + 3
Figure 2. CMOS Output Data Timing
N + 4
N + 5
08541-002
Unit Min Typ Max Min Typ Max Min Typ Max
Rev. 0 | Page 7 of 32
Page 8
AD9609
TIMING SPECIFICATIONS
Table 5.
Parameter Conditions Min Typ Max Unit
SPI TIMING REQUIREMENTS
tDS Setup time between the data and the rising edge of SCLK 2 ns
tDH Hold time between the data and the rising edge of SCLK 2 ns
t
Period of the SCLK 40 ns
CLK
tS Setup time between CSB and SCLK 2 ns
tH Hold time between CSB and SCLK 2 ns
t
SCLK pulse width high 10 ns
HIGH
t
SCLK pulse width low 10 ns
LOW
t
EN_SDIO
t
DIS_SDIO
Time required for the SDIO pin to switch from an input to an
output relative to the SCLK falling edge
Time required for the SDIO pin to switch from an output to an
input relative to the SCLK rising edge
10 ns
10 ns
Rev. 0 | Page 8 of 32
Page 9
AD9609
ABSOLUTE MAXIMUM RATINGS
Table 6.
Parameter Rating
AVDD to AGND −0.3 V to +2.0 V
DRVDD to AGND −0.3 V to +3.9 V
VIN+, VIN− to AGND −0.3 V to AVDD + 0.2 V
CLK+, CLK− to AGND −0.3 V to AVDD + 0.2 V
VREF to AGND −0.3 V to AVDD + 0.2 V
SENSE to AGND −0.3 V to AVDD + 0.2 V
VCM to AGND −0.3 V to AVDD + 0.2 V
RBIAS to AGND −0.3 V to AVDD + 0.2 V
CSB to AGND −0.3 V to DRVDD + 0.3 V
SCLK/DFS to AGND −0.3 V to DRVDD + 0.3 V
SDIO/PDWN to AGND −0.3 V to DRVDD + 0.3 V
MODE/OR to AGND −0.3 V to DRVDD + 0.3 V
D0 through D9 to AGND
DCO to AGND
−0.3 V to DRVDD + 0.3 V
−0.3 V to DRVDD + 0.3 V
Operating Temperature Range (Ambient) −40°C to +85°C
Maximum Junction Temperature Under Bias 150°C
Storage Temperature Range (Ambient) −65°C to +150°C
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
THERMAL CHARACTERISTICS
The exposed paddle is the only ground connection for the chip.
The exposed paddle must be soldered to the AGND plane of the
user’s circuit board. Soldering the exposed paddle to the user’s
board also increases the reliability of the solder joints and
maximizes the thermal capability of the package.
Table 7. Thermal Resistance
Package
Type
32-Lead LFCSP
5 mm × 5 mm
1
Per JEDEC 51-7, plus JEDEC 51-5 2S2P test board.
2
Per JEDEC JESD51-2 (still air) or JEDEC JESD51-6 (moving air).
3
Per MIL-Std 883, Method 1012.1.
4
Per JEDEC JESD51-8 (still air).
Airflow
Velocity
(m/sec)
1, 2
1, 3
θ
θ
JA
JC
1, 4
θ
JB
1,2
Ψ
Unit
JT
0 37.1 3.1 20.7 0.3 °C/W
1.0 32.4 0.5 °C/W
2.5 29.1 0.8 °C/W
Typical θJA is specified for a 4-layer PCB with a solid ground
plane. As shown in Ta b l e 7 , airflow improves heat dissipation,
which reduces θ
. In addition, metal in direct contact with the
JA
package leads from metal traces, through holes, ground, and
power planes, reduces the θ
Out-of-range (OR) digital output only in non-SPI mode.
25 VREF 1.0 V Voltage Reference Input/Output. See Table 10.
26 SENSE Reference Mode Selection. See Table 1 0.
27 VCM Analog Output Voltage at Mid AVDD Supply. Sets common mode of the analog inputs.
28 RBIAS Set Analog Current Bias. Connect to 10 kΩ (1% tolerance) resistor to ground.
30, 31 VIN−, VIN+ ADC Analog Inputs.
Rev. 0 | Page 10 of 32
Page 11
AD9609
TYPICAL PERFORMANCE CHARACTERISTICS
AD9609-80
AVDD = 1.8 V; DRVDD = 1.8 V, maximum sample rate, 2 V p-p differential input, 1.0 V internal reference; AIN = −1.0 dBFS, 50% duty
cycle clock, DCS disabled, unless otherwise noted.
Figure 22. AD9609-40 SNR/SFDR vs. Input Amplitude (AIN) with fIN = 9.7 MHz
–40
–60
AMPLI TUDE (dB)
–80
–100
–120
24680101214161820
FREQUENCY (MHz)
Figure 21. AD9609-40 Single-Tone FFT with fIN = 30.5 MHz
08541-029
Rev. 0 | Page 14 of 32
Page 15
AD9609
AD9609-20
AVDD = 1.8 V; DRVDD = 1.8 V, maximum sample rate, 2 V p-p differential input, 1.0 V internal reference; AIN = −1.0 dBFS, 50% duty
cycle clock, DCS disabled, unless otherwise noted.
0
20MSPS
9.7MHz @ –1dBFS
–20
SNR = 60.6dBFS (61.6dBF S)
SFDR = 81.3dBc
–40
–60
AMPLI TUDE (dB)
–80
–100
–120
204681
FREQUENCY (MHz)
Figure 23. AD9609-20 Single-Tone FFT with fIN = 9.7 MHz
0
20MSPS
30.5MHz @ –1dBF S
–20
SNR = 60.6dBFS (61.6dBF S)
SFDR = 84.0dBc
–40
0
08541-024
90
80
70
60
50
40
30
SNR/SFDR (d Bc/dBFS)
20
10
0
–60–50–40–30–20
SFDR (dBFS)
SNR (dBFS)
SFDR (dBc)
INPUT AMPL ITUDE (dBc)
SNR (dBc)
–10
0
08541-058
Figure 25. AD9609-20 SNR/SFDR vs. Input Amplitude (AIN) with fIN = 9.7 MHz
–60
AMPLI TUDE (dB)
–80
–100
–120
2046810
FREQUENCY (MHz)
08541-026
Figure 24. AD9609-20 Single-Tone FFT with fIN = 30.5 MHz
Rev. 0 | Page 15 of 32
Page 16
AD9609
A
VDDV
A
V
S
A
V
V
V
A
A
V
EQUIVALENT CIRCUITS
DRVDD
IN±
Figure 26. Equivalent Analog Input Circuit
DD
VREF
7.5kΩ
375Ω
Figure 27. Equivalent VREF Circuit
DD
ENSE
375Ω
Figure 28. Equivalent SENSE Circuit
CLK+
5Ω
08541-039
08541-042
Figure 30. Equivalent D0 to D9 and OR Digital Output Circuit
DR
DD
SCLK/DFS,
MODE,
SDIO/PDWN
08541-047
350Ω
30kΩ
08541-043
Figure 31. Equivalent SCLK/DFS, MODE, and SDIO/PDWN Input Circuit
DR
DD
AVDD
30kΩ
CSB
08541-046
350Ω
08541-045
Figure 32. Equivalent CSB Input Circuit
15kΩ
0.9V
DD
15kΩ
CLK–
Figure 29. Equivalent Clock Input Circuit
5Ω
RBIAS
ND VCM
08541-040
375Ω
08541-044
Figure 33. Equivalent RBIAS and VCM Circuit
Rev. 0 | Page 16 of 32
Page 17
AD9609
THEORY OF OPERATION
The AD9609 architecture consists of a multistage, pipelined ADC.
Each stage provides sufficient overlap to correct for flash errors in
the preceding stage. The quantized outputs from each stage are
combined into a final 10-bit result in the digital correction logic.
The pipelined architecture permits the first stage to operate with a
new input sample while the remaining stages operate with preceding samples. Sampling occurs on the rising edge of the clock.
Each stage of the pipeline, excluding the last, consists of a low
resolution flash ADC connected to a switched-capacitor DAC
and an interstage residue amplifier (for example, a multiplying
digital-to-analog converter (MDAC)). The residue amplifier
magnifies the difference between the reconstructed DAC output
and the flash input for the next stage in the pipeline. One bit of
redundancy is used in each stage to facilitate digital correction
of flash errors. The last stage simply consists of a flash ADC.
The output staging block aligns the data, corrects errors, and
passes the data to the CMOS output buffers. The output buffers
are powered from a separate (DRVDD) supply, allowing adjustment of the output voltage swing. During power-down, the
output buffers go into a high impedance state.
ANALOG INPUT CONSIDERATIONS
The analog input to the AD9609 is a differential switchedcapacitor circuit designed for processing differential input
signals. This circuit can support a wide common-mode range
while maintaining excellent performance. By using an input
common-mode voltage of midsupply, users can minimize
signal-dependent errors and achieve optimum performance.
H
C
PAR
VIN+
VIN–
C
PAR
Figure 34. Switched-Capacitor Input Circuit
C
SAMPLE
SS
SS
C
SAMPLE
H
The clock signal alternately switches the input circuit between
sample-and-hold mode (see Figure 34). When the input circuit
is switched to sample mode, the signal source must be capable
of charging the sample capacitors and settling within one-half
of a clock cycle. A small resistor in series with each input can
help reduce the peak transient current injected from the output
stage of the driving source. In addition, low Q inductors or ferrite
beads can be placed on each leg of the input to reduce high differential capacitance at the analog inputs and, therefore, achieve
the maximum bandwidth of the ADC. Such use of low Q inductors
or ferrite beads is required when driving the converter front end at
H
H
08541-006
high IF frequencies. Either a shunt capacitor or two single-ended
capacitors can be placed on the inputs to provide a matching
passive network. This ultimately creates a low-pass filter at the
input to limit unwanted broadband noise. See the AN-742
Application Note, the AN-827 Application Note, and the Analog Dialogue article “Transformer-Coupled Front-End for Wideband
A/D Converters” (Volume 39, April 2005) for more information. In
general, the precise values depend on the application.
Input Common Mode
The analog inputs of the AD9609 are not internally dc-biased.
Therefore, in ac-coupled applications, the user must provide a
dc bias externally. Setting the device so that VCM = AVDD/2 is
recommended for optimum performance, but the device can
function over a wider range with reasonable performance, as
shown in Figure 35 and Figure 36.
100
90
80
70
SNR/SFDR (dBFS/dBc)
60
50
0.50.60.70.80.91.01.11.21.3
Figure 35. SNR/SFDR vs. Input Common-Mode Voltage,
100
90
80
70
SNR/SFDR (dBFS/dBc)
60
50
0.50.60.70.80.91.01.11.21.3
Figure 36. SNR/SFDR vs. Input Common-Mode Voltage,
SFDR (dBc)
SNR (dBFS)
INPUT COMMON-MODE VOLTAGE (V)
= 32.1 MHz, fS = 80 MSPS
f
IN
SFDR (dBc)
SNR (dBFS)
INPUT COMMON-MODE VOLTAGE (V)
= 10.3 MHz, fS = 20 MSPS
f
IN
8541-139
8541-140
An on-board, common-mode voltage reference is included in
the design and is available from the VCM pin. The VCM pin
must be decoupled to ground by a 0.1 µF capacitor, as described
in the Applications Information section.
Rev. 0 | Page 17 of 32
Page 18
AD9609
A
V
F
2
p
V
Differential Input Configurations
Optimum performance is achieved while driving the AD9609 in a
differential input configuration. For baseband applications, the
AD8138, ADA4937-2, and ADA4938-2 differential drivers provide
excellent performance and a flexible interface to the ADC.
The output common-mode voltage of the ADA4938-2 is easily
set with the VCM pin of the AD9609 (see Figure 37), and the
driver can be configured in a Sallen-Key filter topology to
provide band limiting of the input signal.
200Ω
VIN
0.1µF
76.8Ω
90Ω
120Ω
ADA4938-2
200Ω
33Ω
10pF
33Ω
VIN–
VIN+
AVDD
ADC
VCM
Figure 37. Differential Input Configuration Using the ADA4938-2
For baseband applications below ~10 MHz where SNR is a key
parameter, differential transformer-coupling is the recommended
input configuration. An example is shown in Figure 38. To bias
the analog input, the VCM voltage can be connected to the
center tap of the secondary winding of the transformer.
The signal characteristics must be considered when selecting
a transformer. Most RF transformers saturate at frequencies
below a few megahertz (MHz). Excessive signal power can also
cause core saturation, which leads to distortion.
Figure 41. Differential Input Configuration Using the AD8352
S
P
0.1µF
CC
8, 13
AD8352
10
14
0.1µF
08541-007
08541-008
11
At input frequencies in the second Nyquist zone and above, the
noise performance of most amplifiers is not adequate to achieve
the true SNR performance of the AD9609. For applications above
~10 MHz where SNR is a key parameter, differential double balun
coupling is the recommended input configuration (see Figure 40).
An alternative to using a transformer-coupled input at frequencies
in the second Nyquist zone is to use the AD8352 differential driver.
An example is shown in Figure 41. See the AD8352 data sheet
for more information.
In any configuration, the value of Shunt Capacitor C is dependent
on the input frequency and source impedance and may need to
be reduced or removed. Tab l e 9 displays the suggested values to set
the RC network. However, these values are dependent on the
input signal and should be used only as a starting guide.
Table 9. Example RC Network
R Series
Frequency Range (MHz)
(Ω Each) C Differential (pF)
0 to 70 33 22
70 to 200 125 Open
Single-Ended Input Configuration
A single-ended input can provide adequate performance in
cost-sensitive applications. In this configuration, SFDR and
distortion performance degrade due to the large input commonmode swing. If the source impedances on each input are matched,
there should be little effect on SNR performance. Figure 39
shows a typical single-ended input configuration.
25Ω
25Ω
0.1µF
0.1µF
0.1µF
200Ω
200Ω
1V p-p
0.1µF
10µF
49.9Ω
10µF
0.1µF
0.1µF
Figure 39. Single-Ended Input Configuration
R0.1µ
C
R
R
C
R
0.1µF
VIN+
VIN–
AVDD
ADC
VIN+
VIN–
1kΩ
1kΩ
1kΩ
1kΩ
VCM
ADC
DD
R
R
VCM
VIN+
C
VIN–
08541-010
08541-011
ADC
08541-009
Rev. 0 | Page 18 of 32
Page 19
AD9609
VOLTAGE REFERENCE
A stable and accurate 1.0 V voltage reference is built into the
AD9609. The VREF can be configured using either the internal
1.0 V reference or an externally applied 1.0 V reference voltage.
The various reference modes are summarized in the sections that
follow. The Reference Decoupling section describes the best
practices for PCB layout of VREF.
Internal Reference Connection
A comparator within the AD9609 detects the potential at the
SENSE pin and configures the reference into two possible
modes, which are summarized in Tabl e 10. If SENSE is grounded,
the reference amplifier switch is connected to the internal resistor
divider (see Figure 42), setting VREF to 1.0 V.
VIN+
VIN–
ADC
CORE
VREF
0.1µF1.0µF
SENSE
Figure 42. Internal Reference Configuration
In either internal or external reference mode, the maximum
input range of the ADC can be varied by configuring SPI
Address 0x18 as shown in Tab le 1 1 , resulting in a selectable
differential span from 1 V p-p to 2 V p-p.
If the internal reference of the AD9609 is used to drive multiple
converters to improve gain matching, the loading of the reference
by the other converters must be considered. Figure 43 shows
how the internal reference voltage is affected by loading.
SELECT
LOGIC
0.5V
ADC
08541-012
0
–0.5
–1.0
INTERNAL V RE F = 0.996V
–1.5
–2.0
–2.5
REFERENCE VOLTAGE ERROR (%)
–3.0
02
0.2 0.4 0.6 0.8 1.01.4 1.6 1.81.2
LOAD CURRENT (mA)
.0
08541-014
Figure 43. VREF Accuracy vs. Load Current
External Reference Operation
The use of an external reference may be necessary to enhance
the gain accuracy of the ADC or improve thermal drift characteristics. Figure 44 shows the typical drift characteristics of the
internal reference in 1.0 V mode.
4
3
2
1
0
–1
–2
VREF ERROR (mV)
–3
–4
–5
–6
–40–20020406080
VREF ERROR (mV)
TEMPERATURE (°C)
8541-052
Figure 44. Typical VREF Drift
When the SENSE pin is tied to AVDD, the internal reference is
disabled, allowing the use of an external reference. An internal
reference buffer loads the external reference with an equivalent
7.5 kΩ load (see Figure 27). The internal buffer generates the positive and negative full-scale references for the ADC core. Therefore,
the external reference must be limited to a maximum of 1.0 V.
Table 10. Reference Configuration Summary
Selected Mode SENSE Voltage (V) Resulting VREF (V) Resulting Differential Span (V p-p)
Fixed Internal Reference AGND to 0.2 1.0 internal 2.0
Fixed External Reference AVDD 1.0 applied to external VREF pin 2.0
Fixed Internal or External Reference 1.0 (internal or external) 0xC0 1.0
Fixed Internal or External Reference 1.0 (internal or external) 0xC8 1.14
Fixed Internal or External Reference 1.0 (internal or external) 0xD0 1.33
Fixed Internal or External Reference 1.0 (internal or external) 0xD8 1.6
Fixed Internal or External Reference 1.0 (internal or external) 0xE0 2.0
Rev. 0 | Page 19 of 32
Page 20
AD9609
C
CLOCK INPUT CONSIDERATIONS
For optimum performance, clock the AD9609 sample clock
inputs, CLK+ and CLK−, with a differential signal. The signal
is typically ac-coupled into the CLK+ and CLK− pins via a
transformer or capacitors. These pins are biased internally
(see Figure 45) and require no external bias.
AVDD
0.9V
CLK–CLK+
2pF2pF
If a low jitter clock source is not available, another option is to
ac couple a differential PECL signal to the sample clock input
pins, as shown in Figure 48. The AD9510/AD9511/AD9512/
Figure 48. Differential PECL Sample Clock (Up to 625 MHz)
0.1µF
CLK+
100Ω
0.1µF
240Ω240Ω
ADC
CLK–
08541-019
08541-016
Figure 45. Equivalent Clock Input Circuit
Clock Input Options
The AD9609 has a very flexible clock input structure. The clock
input can be a CMOS, LVDS, LVPECL, or sine wave signal.
Regardless of the type of signal being used, clock source jitter is
of great concern, as described in the Jitter Considerations section.
Figure 46 and Figure 47 show two preferred methods for clocking the AD9609 (at clock rates up to 625 MHz). A low jitter clock
source is converted from a single-ended signal to a differential
signal using either an RF transformer or an RF balun.
The RF balun configuration is recommended for clock frequencies
between 125 MHz and 625 MHz, and the RF transformer is
recommended for clock frequencies from 10 MHz to 200 MHz.
The back-to-back Schottky diodes across the transformer/
balun secondary limit clock excursions into the AD9609 to
approximately 0.8 V p-p differential.
This limit helps prevent the large voltage swings of the clock
from feeding through to other portions of the AD9609 while
preserving the fast rise and fall times of the signal that are
critical to a low jitter performance.
XFMR
0.1µF
®
0.1µF0.1µF
0.1µF
0.1µF1nF
0.1µF
SCHOTTKY
DIODES:
HSMS2822
SCHOTTKY
DIODES:
HSMS2822
CLK+
CLK–
CLK+
CLK–
ADC
ADC
08541-018
Mini-Circuits
ADT1-1WT, 1:1 Z
CLOCK
INPUT
50Ω
100Ω
Figure 46. Transformer-Coupled Differential Clock (Up to 200 MHz)
CLOCK
INPUT
50Ω
1nF
Figure 47. Balun-Coupled Differential Clock (Up to 625 MHz)
A third option is to ac couple a differential LVDS signal to the
sample clock input pins, as shown in Figure 49. The AD9510/
AD9511/AD9512/AD9513/AD9514/AD9515/AD9516/AD9517
clock drivers offer excellent jitter performance.
CLOCK
INPUT
CLOCK
INPUT
50kΩ50kΩ
0.1µF
0.1µF
AD951x
LVDS DRIV ER
Figure 49. Differential LVDS Sample Clock (Up to 625 MHz)
0.1µF
100Ω
0.1µF
CLK+
CLK–
ADC
08541-020
In some applications, it may be acceptable to drive the sample
clock inputs with a single-ended 1.8 V CMOS signal. In such
applications, drive the CLK+ pin directly from a CMOS gate, and
bypass the CLK− pin to ground with a 0.1 F capacitor (see
Figure 50).
V
LOCK
INPUT
CC
0.1µF
1kΩ
AD951x
1
50Ω
1
50Ω RESISTOR I S OPTIONAL.
CMOS DRIVER
1kΩ
OPTIONAL
100Ω
0.1µF
0.1µF
CLK+
CLK–
ADC
08541-021
Figure 50. Single-Ended 1.8 V CMOS Input Clock (Up to 200 MHz)
Input Clock Divider
The AD9609 contains an input clock divider with the ability
08541-017
to divide the input clock by integer values between 1 and 8.
Optimum performance can be obtained by enabling the internal duty cycle stabilizer (DCS) when using divide ratios other
than 1, 2, or 4.
Rev. 0 | Page 20 of 32
Page 21
AD9609
Clock Duty Cycle
Typical high speed ADCs use both clock edges to generate
a variety of internal timing signals and, as a result, may be
sensitive to clock duty cycle. Commonly, a ±5% tolerance is
required on the clock duty cycle to maintain dynamic
performance characteristics.
The AD9609 contains a duty cycle stabilizer (DCS) that retimes
the nonsampling (falling) edge, providing an internal clock
signal with a nominal 50% duty cycle. This allows the user to
provide a wide range of clock input duty cycles without
affecting the performance of the AD9609. Noise and distortion
performance are nearly flat for a wide range of duty cycles with
the DCS on, as shown in Figure 51.
Jitter in the rising edge of the input is still of concern and is not
easily reduced by the internal stabilization circuit. The duty
cycle control loop does not function for clock rates less than
20 MHz nominally. The loop has a time constant associated
with it that must be considered in applications in which the
clock rate can change dynamically. A wait time of 1.5 µs to 5 µs
is required after a dynamic clock frequency increase or decrease
before the DCS loop is relocked to the input signal.
80
75
70
65
60
SNR (dBFS)
55
50
45
40
1020304050607080
DCS ON
DCS OFF
POSITIVE DUTY CYCLE (%)
Figure 51. SNR vs. DCS On/Off
08541-053
Jitter Considerations
High speed, high resolution ADCs are sensitive to the quality
of the clock input. The degradation in SNR from the low frequency SNR (SNR
jitter (t
) can be calculated by
JRMS
SNR
= −10 log[(2π × f
HF
) at a given input frequency (f
LF
× t
INPUT
)2 + 10]
JRMS
INPUT
) due to
)10/(LFSNR−
In the previous equation, the rms aperture jitter represents the
clock input jitter specification. IF undersampling applications
are particularly sensitive to jitter, as illustrated in Figure 52.
80
75
70
65
60
SNR (dBFS)
55
50
45
1101001k
FREQUENCY (MHz)
Figure 52. SNR vs. Input Frequency and Jitter
3.0ps
0.05ps
0.2ps
0.5ps
1.0ps
1.5ps
2.0ps
2.5ps
08541-022
The clock input should be treated as an analog signal when
aperture jitter may affect the dynamic range of the AD9609. To
avoid modulating the clock signal with digital noise, keep power
supplies for clock drivers separate from the ADC output driver
supplies. Low jitter, crystal-controlled oscillators make the best
clock sources. If the clock is generated from another type of source
(by gating, dividing, or another method), it should be retimed by
the original clock at the last step.
For more information, see the AN-501 Application Note and
the AN-756 Application Note available at www.analog.com.
Rev. 0 | Page 21 of 32
Page 22
AD9609
POWER DISSIPATION AND STANDBY MODE
As shown in Figure 53, the analog core power dissipated by the
AD9609 is proportional to its sample rate. The digital power
dissipation of the CMOS outputs are determined primarily by
the strength of the digital drivers and the load on each output bit.
The maximum DRVDD current (IDRVDD) can be calculated as
IDRVDD = V
where N is the number of output bits (22, in the case of the
AD9609).
This maximum current occurs when every output bit switches
on every clock cycle, that is, a full-scale square wave at the Nyquist
frequency of f
CLK
lished by the average number of output bits switching, which
is determined by the sample rate and the characteristics of the
analog input signal.
Reducing the capacitive load presented to the output drivers can
minimize digital power consumption. The data in Figure 53 was
taken using the same operating conditions as those used for the
Typical Performance Characteristics, with a 5 pF load on each
output driver.
85
80
75
70
65
60
55
50
ANALOG CORE P OWER (mW)
45
40
35
1020304050607080
Figure 53. AD9609 Analog Core Power vs. Clock Rate
In SPI mode, the AD9609 can be placed in power-down mode
directly via the SPI port, or by using the programmable external
MODE pin. In non-SPI mode, power-down is achieved by asserting the PDWN pin high. In this state, the ADC typically dissipates
500 µW. During power-down, the output drivers are placed in a
high impedance state. Asserting PDWN low (or the MODE pin
in SPI mode) returns the AD9609 to its normal operating mode.
Note that PDWN is referenced to the digital output driver
supply (DRVDD) and should not exceed that supply voltage.
DRVDD
× C
LOAD
× f
CLK
× N
/2. In practice, the DRVDD current is estab-
AD9609-80
AD9609-65
AD9609-40
AD9609-20
CLOCK RATE (MSPS)
08541-051
Low power dissipation in power-down mode is achieved by
shutting down the reference, reference buffer, biasing networks,
and clock. Internal capacitors are discharged when entering powerdown mode and then must be recharged when returning to normal
operation. As a result, wake-up time is related to the time spent
in power-down mode, and shorter power-down cycles result in
proportionally shorter wake-up times.
When using the SPI port interface, the user can place the ADC
in power-down mode or standby mode. Standby mode allows
the user to keep the internal reference circuitry powered when
faster wake-up times are required. See the Memory Map section
for more details.
DIGITAL OUTPUTS
The AD9609 output drivers can be configured to interface with
1.8 V to 3.3 V CMOS logic families. Output data can also be
multiplexed onto a single output bus to reduce the total number
of traces required.
The CMOS output drivers are sized to provide sufficient output
current to drive a wide variety of logic families. However, large
drive currents tend to cause current glitches on the supplies and
may affect converter performance.
Applications requiring the ADC to drive large capacitive loads
or large fanouts may require external buffers or latches.
The output data format can be selected to be either offset binary
or twos complement by setting the SCLK/DFS pin when operating
in the external pin mode (see Tab l e 12).
As detailed in the AN-877 Application Note, Interfacing to High Speed ADCs via SPI, the data format can be selected for offset
binary, twos complement, or gray code when using the SPI control.
Table 12. SCLK/DFS and SDIO/PDWN Mode Selection
(External Pin Mode)
Voltage at Pin SCLK/DFS SDIO/PDWN
AGND Offset binary (default)
DRVDD Twos complement Outputs disabled
Digital Output Enable Function (OEB)
When using the SPI interface, the data outputs and DCO can be
independently three-stated by using the programmable external
MODE pin. The MODE pin (OEB) function is enabled via
Bits[6:5] of Register 0x08.
If the MODE pin is configured to operate in traditional OEB
mode, and the MODE pin is low, the output data drivers and
DCOs are enabled. If the MODE pin is high, the output data
drivers and DCOs are placed in a high impedance state. This
OEB function is not intended for rapid access to the data bus.
Note the MODE pin is referenced to the digital output driver
supply (DRVDD) and should not exceed that supply voltage.
Normal operation
(default)
Rev. 0 | Page 22 of 32
Page 23
AD9609
TIMING
The AD9609 provides latched data with a pipeline delay of
eight clock cycles. Data outputs are available one propagation
delay (t
Minimize the length of the output data lines and loads placed
on them to reduce transients within the AD9609. These
transients can degrade converter dynamic performance.
The lowest typical conversion rate of the AD9609 is 3 MSPS. At
clock rates below 3 MSPS, dynamic performance can degrade.
Data Clock Output (DCO)
The AD9609 provides a data clock output (DCO) signal
intended for capturing the data in an external register. The CMOS
data outputs are valid on the rising edge of DCO, unless the DCO
clock polarity has been changed via the SPI. See Figure 2 for a
graphical timing description.
Rev. 0 | Page 23 of 32
Page 24
AD9609
BUILT-IN SELF-TEST (BIST) AND OUTPUT TEST
The AD9609 includes a built-in test feature designed to enable
verification of the integrity of each channel as well as to facilitate board level debugging. A built-in self-test (BIST) feature that
verifies the integrity of the digital datapath of the AD9609 is
included. Various output test options are also provided to place
predictable values on the outputs of the AD9609.
BUILT-IN SELF-TEST (BIST)
The BIST is a thorough test of the digital portion of the selected
AD9609 signal path. Perform the BIST test after a reset to ensure
that the part is in a known state. During BIST, data from an internal
pseudorandom noise (PN) source is driven through the digital
datapath of both channels, starting at the ADC block output.
At the datapath output, CRC logic calculates a signature from
the data. The BIST sequence runs for 512 cycles and then stops.
Once completed, the BIST compares the signature results with a
pre-determined value. If the signatures match, the BIST sets Bit 0
of Register 0x24, signifying the test passed. If the BIST test failed,
Bit 0 of Register 0x24 is cleared. The outputs are connected
during this test, so the PN sequence can be observed as it runs.
Writing 0x05 to Register 0x0E runs the BIST. This enables the Bit 0
(BIST enable) of Register 0x0E and resets the PN sequence
generator, Bit 2 (BIST INIT) of Register 0x0E. At the completion of
the BIST, Bit 0 of Register 0x24 is automatically cleared. The PN
sequence can be continued from its last value by writing a 0 in
Bit 2 of Register 0x0E. However, if the PN sequence is not reset,
the signature calculation does not equal the predetermined
value at the end of the test. At that point, the user needs to rely
on verifying the output data.
OUTPUT TEST MODES
The output test options are described in Tab l e 1 7 at Address
0x0D. When an output test mode is enabled, the analog section
of the ADC is disconnected from the digital back-end blocks
and the test pattern is run through the output formatting block.
Some of the test patterns are subject to output formatting, and
some are not. The PN generators from the PN sequence tests
can be reset by setting Bit 4 or Bit 5 of Register 0x0D. These
tests can be performed with or without an analog signal (if
present, the analog signal is ignored), but they do require an
encode clock. For more information, see the AN-877
Application Note, Interfacing to High Speed ADCs via SPI.
Rev. 0 | Page 24 of 32
Page 25
AD9609
SERIAL PORT INTERFACE (SPI)
The AD9609 serial port interface (SPI) allows the user to configure
the converter for specific functions or operations through a
structured register space provided inside the ADC. The SPI
gives the user added flexibility and customization, depending
on the application. Addresses are accessed via the serial port
and can be written to or read from via the port. Memory is
organized into bytes that can be further divided into fields,
which are documented in the Memory Map section. For
detailed operational information, see the AN-877 Application Note, Interfacing to High Speed ADCs via SPI.
CONFIGURATION USING THE SPI
Three pins define the SPI of this ADC: SCLK, SDIO, and CSB
(see Table 14). The SCLK (a serial clock) is used to synchronize
the read and write data presented from and to the ADC. SDIO
(serial data input/output) is a dual-purpose pin that allows data to
be sent and read from the internal ADC memory map registers.
The CSB (chip select bar) is an active-low control that enables
or disables the read and write cycles.
Table 14. Serial Port Interface Pins
Pin Function
SCLK
Serial clock. The serial shift clock input, which is used to
synchronize serial interface reads and writes.
SDIO
Serial data input/output. A dual-purpose pin that
typically serves as an input or an output, depending on
the instruction being sent and the relative position in the
timing frame.
CSB
Chip select bar. An active-low control that gates the read
and write cycles.
The falling edge of CSB, in conjunction with the rising edge of
SCLK, determines the start of the framing. An example of the
serial timing and its definitions can be found in Figure 54 and
Tabl e 5.
Other modes involving the CSB are available. The CSB can be
held low indefinitely, which permanently enables the device;
this is called streaming. The CSB can stall high between bytes to
allow for additional external timing. When CSB is tied high, SPI
functions are placed in high impedance mode. This mode turns
on any SPI pin secondary functions.
During an instruction phase, a 16-bit instruction is transmitted.
Data follows the instruction phase, and its length is determined
by the W0 and W1 bits, as shown in Figure 54.
All data is composed of 8-bit words. The first bit of the first byte in
a multibyte serial data transfer frame indicates whether a read
command or a write command is issued. This allows the serial
data input/output (SDIO) pin to change direction from an input
to an output at the appropriate point in the serial frame.
In addition to word length, the instruction phase determines
whether the serial frame is a read or write operation, allowing
the serial port to be used both to program the chip and to read
the contents of the on-chip memory. If the instruction is a readback
operation, performing a readback causes the serial data input/
output (SDIO) pin to change direction from an input to an output
at the appropriate point in the serial frame.
Data can be sent in MSB-first mode or in LSB-first mode. MSB
first is the default on power-up and can be changed via the SPI
port configuration register. For more information about this
and other features, see the AN-877 Application Note, Inter facing to High Speed ADCs via SPI.
CSB
SCLK
SDIO
DON’T CARE
t
t
DS
t
S
R/WW1W0A12A11A10A9A8A7
t
DH
HIGH
t
LOW
Figure 54. Serial Port Interface Timing Diagram
t
CLK
Rev. 0 | Page 25 of 32
D5D4D3D2D1D0
t
H
DON’T CARE
DON’T CAREDON’T CARE
08541-023
Page 26
AD9609
HARDWARE INTERFACE
The pins described in Ta b l e 14 constitute the physical interface
between the programming device of the user and the serial port
of the AD9609. The SCLK pin and the CSB pin function as inputs
when using the SPI interface. The SDIO pin is bidirectional,
functioning as an input during write phases and as an output
during readback.
The SPI interface is flexible enough to be controlled by
either FPGAs or microcontrollers. One method for SPI
configuration is described in detail in the AN-812 Application Note, Microcontroller-Based Serial Port Interface (SPI) Boot Circuit.
The SPI port should not be active during periods when the full
dynamic performance of the converter is required. Because the
SCLK signal, the CSB signal, and the SDIO signal are typically
asynchronous to the ADC clock, noise from these signals can
degrade converter performance. If the on-board SPI bus is used for
other devices, it may be necessary to provide buffers between
this bus and the AD9609 to prevent these signals from transitioning at the converter inputs during critical sampling periods.
SDIO/PDWN and SCLK/DFS serve a dual function when the
SPI interface is not being used. When the pins are strapped to
DRVDD or ground during device power-on, they are associated
with a specific function. The Digital Outputs section describes
the strappable functions supported on the AD9609.
CONFIGURATION WITHOUT THE SPI
In applications that do not interface to the SPI control registers,
the SDIO/PDWN pin and the SCLK/DFS pin serve as standalone
CMOS-compatible control pins. When the device is powered up, it
is assumed that the user intends to use the pins as static control
lines for the power-down and output data format feature control.
In this mode, connect the CSB chip select to DRVDD, which
disables the serial port interface.
Table 15. Mode Selection
External
Pin
SDIO/PDWN DRVDD Chip power-down mode
SCLK/DFS DRVDD Twos complement enabled
Voltage Configuration
AGND (default) Normal operation (default)
AGND (default) Offset binary enabled
SPI ACCESSIBLE FEATURES
Tabl e 16 provides a brief description of the general features that
are accessible via the SPI. These features are described in detail
in the AN-877 Application Note, Interfacing to High Speed ADCs via SPI. The AD9609 part-specific features are described in
detail in Tabl e 17.
Table 16. Features Accessible Using the SPI
Feature Description
Modes
Clock Allows the user to access the DCS via the SPI
Offset
Tes t I /O
Output Mode Allows the user to set up outputs
Output Phase Allows the user to set the output clock polarity
Output Delay Allows the user to vary the DCO delay
VREF Allows the user to set the reference voltage
Allows the user to set either power-down mode
or standby mode
Allows the user to digitally adjust the
converter offset
Allows the user to set test modes to have known
data on output bits
Rev. 0 | Page 26 of 32
Page 27
AD9609
MEMORY MAP
READING THE MEMORY MAP REGISTER TABLE
Each row in the memory map register table (see Table 1 7)
contains eight bit locations. The memory map is roughly
divided into four sections: the chip configuration registers
(Address 0x00 to Address 0x02); the device index and transfer
register (Address 0xFF); the program registers, including setup,
control, and test (Address 0x08 to Address 0x2A); and the
AD9609-specific customer SPI control register (Address 0x101).
Tabl e 17 documents the default hexadecimal value for each
hexadecimal address shown. The column with the heading Bit 7
(MSB) is the start of the default hexadecimal value given. For
example, Address 0x2A, the OR/MODE select register, has a hexadecimal default value of 0x01. This means that in Address 0x2A,
Bits[7:1] = 0, and Bit 0 = 1. This setting is the default OR/MODE
setting. The default value results in the programmable external
MODE/OR pin (Pin 23) functioning as an out-of-range digital
output. For more information on this function and others, see the
AN-877 Application Note, Interfacing to High Speed ADCs via SPI.
This application note details the functions controlled by Register
0x00 to Register 0xFF. The remaining register, Register 0x101, is
documented in the Memory Map Register Descriptions section
that follows Ta b le 1 7.
DEFAULT VALUES
After the AD9609 is reset, critical registers are loaded with
default values. The default values for the registers are given in
the memory map register table (see Tabl e 17 ).
Logic Levels
An explanation of logic level terminology follows:
•“Bit is set” is synonymous with “bit is set to Logic 1” or
“writing Logic 1 for the bit.”
•“Clear a bit” is synonymous with “bit is set to Logic 0” or
“writing Logic 0 for the bit.”
Transfer Register Map
Address 0x08 to Address 0x18 are shadowed. Writes to these
addresses do not affect part operation until a transfer command
is issued by writing 0x01 to Address 0xFF, setting the transfer bit.
This allows these registers to be updated internally and simultaneously when the transfer bit is set. The internal update takes
place when the transfer bit is set, and then the bit autoclears.
OPEN LOCATIONS
All address and bit locations that are not included in the SPI map
are not currently supported for this device. Unused bits of a valid
address location should be written with 0s. Writing to these locations is required only when part of an address location is open
(for example, Address 0x2A). If the entire address location is
open, it is omitted from the SPI map (for example, Address 0x13)
and should not be written.
Rev. 0 | Page 27 of 32
Page 28
AD9609
MEMORY MAP REGISTER TABLE
All address and bit locations that are not included in Tab l e 17 are not currently supported for this device.
Table 17.
Default
Addr
(Hex)
Chip Configuration Registers
0x00 SPI port
0x01 Chip ID 8-bit chip ID, Bits[7:0]
0x02 Chip grade Open Speed grade ID, Bits[6:4]
Device Index and Transfer Register
0xFF Transfer OpenOpen Open Open Open Open Open Transfer 0x00 Synchronously
Program Registers
0x08 Modes External
0x09 Clock OpenOpen Open Open Open Duty cycle
0x0B Clock divide Open Clock divider, Bits[2:0]
0x0D Test mode User test mode
Register Name
configuration
Bit 7
(MSB)
0 LSB
Pin 23
mode
input
enable
00 = single
01 = alternate
10 = single once
11 = alternate once
External Pin 23
function when
high
00 = full power
down
01 = standby
10 = normal
mode: output
disabled
11 = normal
mode: output
enabled
Soft
reset
Reset
PN
long
gen
Bit 0
(LSB)
1 1 Soft
AD9609 = 0x71
OpenOpen Open 00 = chip run
Reset
PN
short
gen
Rev. 0 | Page 28 of 32
reset
Clock divide ratio
000 = divide by 1
001 = divide by 2
010 = divide by 3
011 = divide by 4
100 = divide by 5
101 = divide by 6
110 = divide by 7
111 = divide by 8
Output test mode, Bits[3:0] (local)
0000 = off (default)
0001 = midscale short
0010 = positive FS
0011 = negative FS
0100 = alternating checkerboard
0101 = PN 23 sequence
0110 = PN 9 sequence
0111 = 1/0 word toggle
1000 = user input
1001 = 1/0 bit toggle
1010 = 1× sync
1011 = one bit high
1100 = mixed bit frequency
LSB
first
Open Read only Unique speed grade
01 = full power-down
10 = standby
11 = chip wide digital
reset
0 0x18 The nibbles are
stabilize
Value
(Hex)
Read only Unique chip ID used
0x00 Determines various
0x01 Enable internal duty
0x00 The divide ratio is
0x00 When set, the test
Comments
mirrored so that LSB
or MSB first mode
registers correctly,
regardless of shift
mode
to differentiate
devices; read only
ID used to
differentiate
devices; read only
transfers data from
the master shift
register to the slave
generic modes of
chip operation
cycle stabilizer (DCS)
the value plus 1
data is placed on
the output pins in
place of normal
data
utilize global clock
divide, determines
which phase of the
divider output is
used to supply the
output clock;
internal latching is
unaffected
0x00 Sets the fine output
delay of the output
clock but does not
change internal
timing
adjusts the VREF
full-scale span
pattern, 1 LSB
pattern, 1 MSB
pattern, 2 LSB
pattern, 2 MSB
byte of BIST
signature, read only
0x01 Selects I/O
functionality in
conjunction with
Address 0x08 for
MODE (input) or OR
(output) on external
Pin 23
0x88 Enables internal
oscillator for clock
rates <5 MHz
Page 30
AD9609
MEMORY MAP REGISTER DESCRIPTIONS
For additional information about functions controlled in
Register 0x00 to Register 0xFF, see the AN-877 Application
Note, Interfacing to High Speed ADCs via SPI.
USR2 (Register 0x101)
Bit 3—Enable GCLK Detect
Normally set high, this bit enables a circuit that detects encode
rates below about 5 MSPS. When a low encode rate is detected,
an internal oscillator, GCLK, is enabled ensuring the proper
operation of several circuits. If set low, the detector is disabled.
Bit 2—Run GCLK
This bit enables the GCLK oscillator. For some applications
with encode rates below 10 MSPS, it may be preferable to set
this bit high to supersede the GCLK detector.
Bit 0—Disable SDIO Pull-Down
This bit can be set high to disable the internal 30 k pull-down
on the SDIO pin, which can be used to limit the loading when
many devices are connected to the SPI bus.
Rev. 0 | Page 30 of 32
Page 31
AD9609
APPLICATIONS INFORMATION
DESIGN GUIDELINES
Before starting design and layout of the AD9609 as a system,
it is recommended that the designer become familiar with these
guidelines, which discuss the special circuit connections and
layout requirements needed for certain pins.
Power and Ground Recommendations
When connecting power to the AD9609, it is strongly recommended that two separate supplies be used. Use one 1.8 V supply
for analog (AVDD); use a separate 1.8 V to 3.3 V supply for the
digital output supply (DRVDD). If a common 1.8 V AVDD and
DRVDD supply must be used, the AVDD and DRVDD domains
must be isolated with a ferrite bead or filter choke and separate
decoupling capacitors. Several different decoupling capacitors
can be used to cover both high and low frequencies. Locate
these capacitors close to the point of entry at the PCB level
and close to the pins of the part, with minimal trace length.
A single PCB ground plane should be sufficient when using the
AD9609. With proper decoupling and smart partitioning of the
PCB analog, digital, and clock sections, optimum performance
is easily achieved.
Exposed Paddle Thermal Heat Sink Recommendations
The exposed paddle (Pin 0) is the only ground connection for
the AD9609; therefore, it must be connected to analog ground
(AGND) on the customer’s PCB. To achieve the best electrical
and thermal performance, mate an exposed (no solder mask)
continuous copper plane on the PCB to the AD9609 exposed
paddle, Pin 0.
The copper plane should have several vias to achieve the
lowest possible resistive thermal path for heat dissipation to
flow through the bottom of the PCB. Fill or plug these vias
with nonconductive epoxy.
To maximize the coverage and adhesion between the ADC and
the PCB, a silkscreen should be overlaid to partition the continuous
plane on the PCB into several uniform sections. This provides
several tie points between the ADC and the PCB during the reflow
process. Using one continuous plane with no partitions guarantees
only one tie point between the ADC and the PCB. For detailed
information about packaging and PCB layout of chip scale
packages, see the AN-772 Application Note, A Design and
Manufacturing Guide for the Lead Frame Chip Scale Package
(LFCSP) at www.analog.com.
Encode Clock
For optimum dynamic performance a low jitter encode clock
source with a 50% duty cycle ±5% should be used to clock the
AD9609.
VCM
The VCM pin should be decoupled to ground with a 0.1 F
capacitor, as shown in Figure 38.
RBIAS
The AD9609 requires that a 10 kΩ resistor be placed between
the RBIAS pin and ground. This resistor sets the master current
reference of the ADC core and should have at least a 1% tolerance.
Reference Decoupling
Externally decoupled the VREF pin to ground with a low ESR,
1.0 F capacitor in parallel with a low ESR, 0.1 F ceramic
capacitor.
SPI Port
The SPI port should not be active during periods when the full
dynamic performance of the converter is required. Because the
SCLK, CSB, and SDIO signals are typically asynchronous to the
ADC clock, noise from these signals can degrade converter
performance. If the on-board SPI bus is used for other devices,
it may be necessary to provide buffers between this bus and the
AD9609 to keep these signals from transitioning at the converter
inputs during critical sampling periods.
Rev. 0 | Page 31 of 32
Page 32
AD9609
OUTLINE DIMENSIONS
0.08
0.60 MAX
25
24
EXPOSED
PAD
(BOTTOM VIEW)
17
16
3.50 REF
32
1
8
9
FOR PROPE R CONNECTION O F
THE EXPOSED PAD, REFE R T O
THE PIN CONFIGURATIO N AND
FUNCTION DE SCRIPTIONS
SECTION OF THIS DATA SHEET.
PIN 1
INDICATOR
3.65
3.50 SQ
3.35
0.25 MIN
100608-A
5.00
PIN 1
INDICATOR
1.00
0.85
0.80
12° MAX
SEATING
PLANE
BSC SQ
TOP
VIEW
0.80 MAX
0.65 TYP
0.30
0.23
0.18
COMPLIANT T O JEDEC STANDARDS MO-220-VHHD-2
4.75
BSC SQ
0.20 REF
0.05 MAX
0.02 NOM
0.60 MAX
0.50
BSC
0.50
0.40
0.30
COPLANARITY
Figure 55. 32-Lead Lead Frame Chip Scale Package [LFCSP_VQ]
9 mm × 9 mm Body, Very Thin Quad (CP-32-4)
Dimensions shown in millimeters
ORDERING GUIDE
Model Temperature Range Package Description Package Option