1.8 V CMOS or 1.8 V LVDS output
SNR = 61.7 dBFS at 70 MHz
SFDR = 85 dBc at 70 MHz
Low power: 71 mW/channel ADC core at 125 MSPS
Differential analog input with 650 MHz bandwidth
IF sampling frequencies to 200 MHz
On-chip voltage reference and sample-and-hold circuit
2 V p-p differential analog input
DNL = ±0.13 LSB
Serial port control options
Offset binary, Gray code, or twos complement data format
Optional clock duty cycle stabilizer
Integer 1-to-8 input clock divider
Data output multiplex option
Built-in selectable digital test pattern generation
Energy-saving power-down modes
Data clock out with programmable clock and data
alignment
APPLICATIONS
Communications
Diversity radio systems
I/Q demodulation systems
Broadband data applications
Battery-powered instruments
Handheld scope meters
Portable medical imaging
Ultrasound
Analog-to-Digital Converter (ADC)
AD9608
FUNCTIONAL BLOCK DIAGRAM
DCS
SPI
CSB
MUX OPTION
CONTROLS
PDWN DFSCLK+ CLK–
MODE
CMOS/LVDS
CMOS/LVDS
OEB
ORA
D9A
D0A
OUTPUT BUFFER
DCOA
DRVDD
ORB
D9B
D0B
OUTPUT BUFFER
DCOB
1
GND
DDSCLK
VIN+A
VIN–A
VREF
SENSE
VCM
RBIAS
VIN–B
VIN+B
NOTES
1. PIN NAMES ARE FOR THE CMOS PIN CONFIGURATION ONLY;
SEE FIGURE 7 FOR LVDS PIN NAMES.
REF
SELECT
ADC
ADC
DIVIDE
1TO 8
SYNC
SDIO
PROGRAMMING DATA
AD9608
DUTY CYCLE
STABILIZER
Figure 1.
PRODUCT HIGHLIGHTS
1. Operates from a single 1.8 V analog power supply and
features a separate digital output driver supply to accommodate 1.8 V CMOS or 1.8 V LVDS logic families.
2. Provides a patented sample-and-hold circuit that maintains
excellent performance for input frequencies up to 200 MHz
and is designed for low cost, low power, and ease of use.
3. Includes a standard serial port interface that supports various
product features and functions, such as data output formatting, internal clock divider, power-down, DCO/data timing,
and offset adjustments.
4. Packaged in a 64-lead, RoHS-compliant LFCSP that is pin
compatible with the AD9650, AD9269, and AD9268 16-bit
ADCs, the AD9258 and AD9648 14-bit ADCs, the AD9628
and AD9231 12-bit ADCs, and the AD9204 10-bit ADC,
enabling a simple migration path between 10-bit and 16-bit
converters sampling from 20 MSPS to 125 MSPS.
09977-001
1
This product is protected by a U.S. patent.
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Anal og Devices for its use, nor for any infringements of patents or ot her
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
The AD9608 is a monolithic, dual-channel, 1.8 V supply, 10-bit,
105 MSPS/125 MSPS analog-to-digital converter (ADC) that
features a high performance sample-and-hold circuit and an
on-chip voltage reference.
The product uses multistage differential pipeline architecture
with output error correction logic to provide 10-bit accuracy at
125 MSPS data rates and to guarantee no missing codes over the
full operating temperature range.
The ADC contains several features designed to maximize
flexibility and minimize system cost, such as programmable
clock and data alignment and programmable digital test pattern
generation. The available digital test patterns include built-in
deterministic and pseudorandom patterns, along with custom
user-defined test patterns entered via the serial port interface (SPI).
A differential clock input controls all internal conversion cycles.
An optional duty cycle stabilizer (DCS) compensates for wide
variations in the clock duty cycle while maintaining excellent
overall ADC performance.
The digital output data is presented in offset binary, Gray code, or
twos complement format. A data output clock (DCO) is provided
for each ADC channel to ensure proper latch timing with receiving
logic. Logic levels of 1.8 V CMOS and 1.8 V LVDS are supported.
Output data can also be multiplexed onto a single output bus.
AD9608 is available in a 64-lead RoHS-compliant LFCSP and
The
is specified over the industrial temperature range (−40°C to
+85°C). This product is protected by a U.S. patent.
AD9608-105 AD9608-125
Parameter1 Temp Min Typ Max Min Typ Max Unit
SIGNAL-TO-NOISE-RATIO (SNR)
fIN = 9.7 MHz 25°C 61.7 61.7 dBFS
fIN = 30.5 MHz 25°C 61.7 61.7 dBFS
fIN = 70 MHz 25°C 61.7 61.7 dBFS
Full 61.3 61.3 dBFS
fIN = 100 MHz
fIN = 200 MHz 25°C 61.4 61.4 dBFS
SIGNAL-TO-NOISE AND DISTORTION (SINAD)
fIN = 9.7 MHz 25°C 61.6 61.6 dBFS
fIN = 30.5 MHz 25°C 61.6 61.6 dBFS
fIN = 70 MHz 25°C 61.6 61.6 dBFS
Full 61.1 61.1 dBFS
fIN = 100 MHz 25°C 61.5 61.5 dBFS
fIN = 200 MHz 25°C
EFFECTIVE NUMBER OF BITS (ENOB)
fIN = 9.7 MHz
fIN = 30.5 MHz
fIN = 70 MHz
fIN = 100 MHz
fIN = 200 MHz
WORST SECOND OR THIRD HARMONIC
fIN = 9.7 MHz
fIN = 30.5 MHz
fIN = 70 MHz
fIN = 100 MHz
fIN = 200 MHz
SPURIOUS-FREE DYNAMIC RANGE (SFDR)
fIN = 9.7 MHz
fIN = 30.5 MHz
fIN = 70 MHz
fIN = 100 MHz
fIN = 200 MHz
WORST OTHER (HARMONIC OR SPUR)
fIN = 9.7 MHz
fIN = 30.5 MHz
fIN = 70 MHz
fIN = 100 MHz
fIN = 200 MHz
TWO-TONE SFDR
fIN = 29 MHz (−7 dBFS ), 32 MHz (−7 dBFS )
CROSSTALK2
ANALOG INPUT BANDWIDTH
1
See the AN-835 Application Note, Understanding High Speed ADC Testing and Evaluation, for a complete set of definitions.
2
Crosstalk is measured at 100 MHz with −1.0 dBFS on one channel and no input on the alternate channel.
25°C 61.6 61.6 dBFS
25°C
25°C
25°C
25°C
25°C
25°C
25°C
25°C
Full
25°C
25°C
25°C
25°C
25°C
Full
25°C
25°C
25°C
25°C
25°C
Full
25°C
25°C
25°C
Full
25°C
61.3
−90 −90
−89 −89
−89 −89
−75 −75
−89 −89
−84 −84
85 85
85 85
85 85
75 75
85 85
84 84
−85 −85
−85 −85
−85 −85
−75 −75
−85 −85
−85 −85
82 82
−95 −95
650 650
9.9
9.9
9.9
9.9
9.9
61.3
9.9
9.9
9.9
9.9
9.9
dBFS
Bits
Bits
Bits
Bits
Bits
dBc
dBc
dBc
dBc
dBc
dBc
dBc
dBc
dBc
dBc
dBc
dBc
dBc
dBc
dBc
dBc
dBc
dBc
dBc
dB
MHz
Rev. 0 | Page 5 of 40
Page 6
AD9608
DIGITAL SPECIFICATIONS
AVDD = 1.8 V, DRVDD = 1.8 V, maximum sample rate, VIN = −1.0 dBFS differential input, 1.0 V internal reference, and DCS enabled, unless
otherwise noted.
Table 3.
Parameter Temp Min Typ Max Unit
DIFFERENTIAL CLOCK INPUTS (CLK+, CLK−)
Logic Compliance CMOS/LVDS/LVPECL
Internal Common-Mode Bias Full 0.9 V
Differential Input Voltage Full 0.3 3.6 V p-p
Input Voltage Range Full AGND − 0.3 AVDD + 0.2 V
Input Common-Mode Range Full 0.9 1.4 V
High Level Input Current Full −10 +10 μA
Low Level Input Current Full −10 +10 μA
Input Capacitance Full 4 pF
Input Resistance Full 8 10 12 kΩ
LOGIC INPUT (CSB)1
High Level Input Voltage Full 1.22 DRVDD + 0.2 V
Low Level Input Voltage Full 0 0.6 V
High Level Input Current Full −10 +10 μA
Low Level Input Current Full 40 132 μA
Input Resistance Full 26 kΩ
Input Capacitance Full 2 pF
LOGIC INPUT (SCLK/DFS/SYNC)2
High Level Input Voltage Full 1.22 DRVDD + 0.2 V
Low Level Input Voltage Full 0 0.6 V
High Level Input Current (VIN = 1.8 V) Full −92 −135 μA
Low Level Input Current Full −10 +10 μA
Input Resistance Full 26 kΩ
Input Capacitance Full 2 pF
LOGIC INPUT/OUTPUT (SDIO/DCS)1
High Level Input Voltage Full 1.22 DRVDD + 0.2 V
Low Level Input Voltage Full 0 0.6 V
High Level Input Current Full −10 +10 μA
Low Level Input Current Full 38 128 μA
Input Resistance Full 26 kΩ
Input Capacitance Full 5 pF
LOGIC INPUTS (OEB, PDWN)2
High Level Input Voltage Full 1.22 DRVDD + 0.2 V
Low Level Input Voltage Full 0 0.6 V
High Level Input Current (VIN = 1.8 V) Full −90 −134 μA
Low Level Input Current Full −10 +10 μA
Input Resistance Full 26 kΩ
Input Capacitance Full 5 pF
DIGITAL OUTPUTS
CMOS Mode—DRVDD = 1.8 V
High Level Output Voltage
IOH = 50 μA Full 1.79 V
IOH = 0.5 mA Full 1.75 V
Low Level Output Voltage
IOL = 1.6 mA Full 0.2 V
IOL = 50 μA Full 0.05 V
Rev. 0 | Page 6 of 40
Page 7
AD9608
Parameter Temp Min Typ Max Unit
LVDS Mode—DRVDD = 1.8 V
Differential Output Voltage (VOD), ANSI Mode Full 290 345 400 mV
Output Offset Voltage (VOS), ANSI Mode Full 1.15 1.25 1.35 V
Differential Output Voltage (VOD), Reduced Swing Mode Full 160 200 230 mV
Output Offset Voltage (VOS), Reduced Swing Mode Full 1.15 1.25 1.35 V
1
Pull up.
2
Pull down.
SWITCHING SPECIFICATIONS
AVDD = 1.8 V, DRVDD = 1.8 V, maximum sample rate, VIN = −1.0 dBFS differential input, 1.0 V internal reference, and DCS enabled, unless
otherwise noted.
Table 4.
AD9608-105 AD9608-125
Parameter Temp Min Typ Max Min Typ Max Unit
CLOCK INPUT PARAMETERS
Input Clock Rate Full 1000 1000 MHz
Conversion Rate1
DCS Enabled Full 20 105 20 125 MSPS
DCS Disabled Full 10 105 10 125 MSPS
CLK Period—Divide-by-1 Mode (t
CLK Pulse Width High (tCH) Full 4.76 4 ns
Aperture Delay (tA) Full 1.0 1.0 ns
Aperture Uncertainty (Jitter, tJ) Full 0.07 0.07 ps rms
DATA OUTPUT PARAMETERS
CMOS Mode
CMOS Mode (DRVDD = 1.8 V)
Data Propagation Delay (tPD) Full 1.8 2.9 4.4 1.8 2.9 4.4 ns
DCO Propagation Delay (t
DCO to Data Skew (t
SKEW
LVDS Mode (DRVDD = 1.8 V)
Data Propagation Delay (tPD) Full 2.4
DCO Propagation Delay (t
DCO to Data Skew (t
Channel A/Channel B
Wake-Up Time (Power-Down)3 Full 350 350 μs
Wake-Up Time (Standby) Full 250 250 ns
Out-of-Range Recovery Time Full 2 2 Cycles
1
Conversion rate is the clock rate after the divider.
2
Additional DCO delay can be added by writing to Bits[2:0] in SPI Register 0x17 (see Ta). ble 18
3
Wake-up time is defined as the time required to return to normal operation from power-down mode.
) Full 9.52 8 ns
CLK
)2 Full 2.0 3.1 4.4 2.0 3.1 4.4 ns
DCO
) Full −1.2
)2 Full
DCO
4.4 4.4
−0.1
+1.0−1.2
−0.1
+1.0ns
2.4 ns
ns
) Full −0.1 +0.2 +0.5 −0.1+0.2 +0.5 ns
Full 16/16.5 16/16.5 Cycles
Rev. 0 | Page 7 of 40
Page 8
AD9608
TIMING SPECIFICATIONS
Table 5.
Parameter Descriptions Limit
SYNC TIMING REQUIREMENTS
t
SYNC to rising edge of CLK+ setup time 0.24 ns typ
SSYNC
t
SYNC to rising edge of CLK+ hold time 0.40 ns typ
HSYNC
SPI TIMING REQUIREMENTS
tDS Setup time between the data and the rising edge of SCLK 2 ns min
tDH Hold time between the data and the rising edge of SCLK 40 ns min
t
Period of the SCLK 2 ns min
CLK
tS Setup time between CSB and SCLK 2 ns min
tH Hold time between CSB and SCLK 10 ns min
t
SCLK pulse width high 10 ns min
HIGH
t
SCLK pulse width low 10 ns min
LOW
t
EN_SDIO
t
DIS_SDIO
Timing Diagrams
CH A/CH B DATA
CLK+
CLK–
DCOA/DCOB
VIN
CLK+
CLK–
DCOA/DCOB
CH A DATA
CH B DATA
Time required for the SDIO pin to switch from an input to an output relative to the
SCLK falling edge
Time required for the SDIO pin to switch from an output to an input relative to the
SCLK rising edge
VIN
N – 1
t
CH
Figure 2. CMOS Default Output Mode Data Output Timing
N – 1
t
CH
Figure 3. CMOS Interleaved Output Mode Data Output Timing
t
A
N
t
CLK
t
DCO
t
N – 16N – 17
t
PD
t
A
N
t
CLK
t
DCO
t
SKEW
CH A
N – 16
t
PD
CH B
N – 16
Rev. 0 | Page 8 of 40
SKEW
N + 1
N + 1
CH B
N – 15
CH A
N – 15
N + 3
N + 2
N – 15N – 14N – 13N – 12
N + 3
N + 2
CH A
CH B
CH A
CH B
N – 14
CH B
N – 14
N – 13
CH A
N – 13
N – 12
CH B
N – 12
N – 11
CH A
N – 11
CH A
N – 10
CH B
N – 10
N + 4
N + 4
CH B
N – 9
CH A
N – 9
CH A
N – 8
CH B
N – 8
N + 5
N + 5
10 ns min
2 ns min
09977-002
09977-003
Page 9
AD9608
VIN
CLK+
N – 1
t
A
N
N + 1
t
CH
t
CLK
N + 2
N + 3
N + 4
N + 5
CLK–
t
DCO
t
t
PD
CH A
N – 16
CH A
N – 16
CH A0
N – 16
CH A8
N – 16
CH B0
N – 16
CH B8
N – 16
SKEW
CH B
N – 16
CH B
N – 16
CH A1
N – 16
CH A9
N – 16
CH B1
N – 16
CH B9
N – 16
CH A
N – 15
CH A
N – 15
CH A0
N – 15
CH A8
N – 15
CH B0
N – 15
CH B8
N – 15
CH B
N – 15
CH B
N – 15
CH A1
N – 15
CH A9
N – 15
CH B1
N – 15
CH B9
N – 15
CH A
N – 14
CH A
N – 14
CH A0
N – 14
CH A8
N – 14
CH B0
N – 14
CH B8
N – 14
CH B
N – 14
CH B
N – 14
CH A1
N – 14
CH A9
N – 14
CH B1
N – 14
CH B9
N – 14
CH A
N – 13
CH A
N – 13
CH A0
N – 13
CH A8
N – 13
CH B0
N – 13
CH B8
N – 13
CH B
N – 13
CH B
N – 13
CH A1
N – 13
CH A9
N – 13
CH B1
N – 13
CH B9
N – 13
CH A
N – 12
CH A
N – 12
CH A0
N – 12
CH A8
N – 12
CH B0
N – 12
CH B8
N – 12
09977-004
PARALLEL
INTERLEAVED
MODE
CHANNEL
MULTIPLEXED
MODE
CHANNEL A
CHANNEL
MULTIPLEXED
MODE
CHANNEL B
DCO–
DCO+
D0+ (LSB)
D0– (LSB)
D9+ (MSB)
D9– (MSB)
D1+/D0+ (LSB)
D1–/D0– (LSB)
D9+/D8+ (MSB)
D9–/D8– (MSB)
D1+/D0+ (LSB)
D1–/D0– (LSB)
D9+/D8+ (MSB)
D9–/D8– (MSB)
Figure 4. LVDS Modes for Data Output Timing
CLK+
t
SSYNC
t
HSYNC
SYNC
09977-005
Figure 5. SYNC Input Timing Requirements
Rev. 0 | Page 9 of 40
Page 10
AD9608
ABSOLUTE MAXIMUM RATINGS
Table 6.
Parameter Rating
Electrical
1
AVDD to AGND −0.3 V to +2.0 V
DRVDD to AGND −0.3 V to +2.0 V
VIN+A/VIN+B, VIN−A/VIN−B to AGND −0.3 V to AVDD + 0.2 V
CLK+, CLK− to AGND −0.3 V to AVDD + 0.2 V
THERMAL CHARACTERISTICS
The exposed paddle must be soldered to the ground plane for
the LFCSP package. Soldering the exposed paddle to the PCB
increases the reliability of the solder joints and maximizes the
thermal capability of the package.
Table 7. Thermal Resistance
SYNC to AGND −0.3 V to AVDD + 0.2 V
VCM to AGND −0.3 V to AVDD + 0.2 V
RBIAS to AGND −0.3 V to AVDD + 0.2 V
CSB to AGND −0.3 V to DRVDD + 0.2 V
SCLK/DFS to AGND −0.3 V to DRVDD + 0.2 V
SDIO/DCS to AGND −0.3 V to DRVDD + 0.2 V
OEB −0.3 V to DRVDD + 0.2 V
PDWN −0.3 V to DRVDD + 0.2 V
D0A, D0B through D9A, D9B to AGND −0.3 V to DRVDD + 0.2 V
DCOA, DCOB to AGND−0.3 V to DRVDD + 0.2 V
Environmental
Operating Temperature Range
−40°C to +85°C
(Ambient)
Maximum Junction Temperature
150°C
Under Bias
Storage Temperature Range
−65°C to +150°C
(Ambient)
1
The inputs and outputs are rated to the supply voltage (AVDD or DRVDD) +
0.2 V but should not exceed 2.1 V.
Package
Typ e
64-Lead
LFCSP
9 mm × 9 mm
(CP-64-4)
1
Per JEDEC 51-7, plus JEDEC 25-5 2S2P test board.
2
Per JEDEC JESD51-2 (still air) or JEDEC JESD51-6 (moving air).
3
Per MIL-Std 883, Method 1012.1.
4
Per JEDEC JESD51-8 (still air).
Typical θJA is specified for a 4-layer PCB with a solid ground
plane. As shown Tabl e 7, airflow improves heat dissipation,
which reduces θ
package leads from metal traces, through holes, ground, and
power planes reduces θ
ESD CAUTION
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
Airflow
Veloc ity
(m/sec) θ
1, 2
1, 3
θ
JA
JC
1, 4
θ
JB
1, 2
Ψ
JT
Unit
0 22.3 1.4 N/A 0.1 °C/W
1.0 19.5 N/A 11.8 0.2 °C/W
2.5 17.5 N/A N/A 0.2 °C/W
. In addition, metal in direct contact with the
JA
.
JA
Rev. 0 | Page 10 of 40
Page 11
AD9608
PIN CONFIGURATIONS AND FUNCTION DESCRIPTIONS
AVD D
AVD D
VIN+B
VIN–B
AVD D
AVD D
RBIAS
VCM
SENSE
VREF
AVD D
AVD D
VIN–A
VIN+A
AVD D
AVD D
49
PDWN
48
OEB
47
CSB
46
SCLK/DFS
45
SDIO/DCS
44
ORA
43
D9A (MSB)
42
D8A
41
D7A
40
D6A
39
D5A
38
DRVDD
37
D4A
36
D3A
35
D2A
34
D1A
33
CLK+
CLK–
SYNC
NC
NC
NC
NC
NC
NC
DRVDD
D0B (LSB)
D1B
D2B
D3B
D4B
D5B
646362616059585756555453525150
PIN 1
1
INDICATOR
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
AD9608
PARALLEL CMO S
TOP VIEW
(Not to Scal e)
171819202122232425262728293031
D8B
D6B
D7B
DRVDD
NOTES
1. NC = NO CONNECT. DO NOT CONNECT TO THI S PIN.
2. THE EXP OSED THERMAL PAD ON THE BOTTO M OF THE PACKAGE PROVIDES
THE ANALOG GRO UND FOR THE PART. THIS EXPOSED PAD MUST BE
CONNECTED T O GROUND F OR PROPER OPERATIO N.
Table 8. Pin Function Descriptions (Parallel CMOS Mode)
Pin No. Mnemonic Type Description
ADC Power Supplies
10, 19, 28, 37 DRVDD Supply Digital Output Driver Supply (1.8 V Nominal).
49, 50, 53, 54,
AVDD Supply Analog Power Supply (1.8 V Nominal).
59, 60, 63, 64
4, 5, 6, 7, 8, 9,
NC No Connect. Do not connect to this pin.
25, 26, 27, 29,
30, 31
0
AGND,
Exposed Pad
Ground
The exposed thermal pad on the bottom of the package provides the analog ground
for the part. This exposed pad must be connected to ground for proper operation.
ADC Analog
51 VIN+A Input Differential Analog Input Pin (+) for Channel A.
52 VIN−A Input Differential Analog Input Pin (−) for Channel A.
62 VIN+B Input Differential Analog Input Pin (+) for Channel B.
61 VIN−B Input Differential Analog Input Pin (−) for Channel B.
55 VREF Input/Output Voltage Reference Input/Output.
56 SENSE Input Reference Mode Selection.
58 RBIAS Input/Output External Reference Bias Resistor.
57 VCM Output Common-Mode Level Bias Output for Analog Inputs.
1 CLK+ Input ADC Clock Input—True.
2 CLK− Input ADC Clock Input—Complement.
Rev. 0 | Page 11 of 40
Page 12
AD9608
Pin No. Mnemonic Type Description
Digital Input
3 SYNC Input Digital Synchronization Pin. Slave mode only.
Digital Outputs
32 D0A (LSB) Output Channel A CMOS Output Data.
33 D1A Output Channel A CMOS Output Data.
34 D2A Output Channel A CMOS Output Data.
35 D3A Output Channel A CMOS Output Data.
36 D4A Output Channel A CMOS Output Data.
38 D5A Output Channel A CMOS Output Data.
39 D6A Output Channel A CMOS Output Data.
40 D7A Output Channel A CMOS Output Data.
41 D8A Output Channel A CMOS Output Data.
42 D9A (MSB) Output Channel A CMOS Output Data.
43 ORA Output Channel A Overrange Output.
11 D0B (LSB) Output Channel B CMOS Output Data.
12 D1B Output Channel B CMOS Output Data.
13 D2B Output Channel B CMOS Output Data.
14 D3B Output Channel B CMOS Output Data.
15 D4B Output Channel B CMOS Output Data.
16 D5B Output Channel B CMOS Output Data.
17 D6B Output Channel B CMOS Output Data.
18 D7B Output Channel B CMOS Output Data.
20 D8B Output Channel B CMOS Output Data.
21 D9B (MSB) Output Channel B CMOS Output Data.
22 ORB Output Channel B Overrange Output
24 DCOA Output Channel A Data Clock Output.
23 DCOB Output Channel B Data Clock Output.
SPI Control
45 SCLK/DFS Input SPI Serial Clock/Data Format Select Pin in External Pin Mode.
44 SDIO/DCS Input/Output SPI Serial Data I/O/Duty Cycle Stabilizer Pin in External Pin Mode.
46 CSB Input SPI Chip Select (Active Low).
ADC Configuration
47 OEB Input Output Enable Input (Active Low). Pin must be enabled via SPI.
48 PDWN Input
Power-Down Input in External Pin Mode. In SPI mode, this input can be configured
as power-down or standby.
Rev. 0 | Page 12 of 40
Page 13
AD9608
2
E
AVD D
AVD D
VIN+B
VIN–B
AVD D
AVD D
RBIAS
VCM
SENSE
VREF
AVD D
AVD D
VIN–A
VIN+A
AVD D
646362616059585756555453525150
AVD D
49
CLK+
CLK–
SYNC
NC
NC
NC
NC
NC
NC
DRVDD
10
NC
11
NC
12
13
NC
14
NC
15
NC
16
NC
NOTES
1. NC = NO CONNECT. DO NOT CO NNECT TO THIS PIN.
. THE EXPO SED THERMAL PAD ON THE BOTTOM OF THE PACKAGE PRO VIDES
THE ANALOG G ROUND FOR THE PART. THI S EXPOSED PAD MUST B
CONNECTED TO GROUND FOR PRO PER OPERAT ION.
Table 9. Pin Function Descriptions (Interleaved Parallel LVDS Mode)
Pin No. Mnemonic Type Description
ADC Power Supplies
10, 19, 28, 37 DRVDD Supply Digital Output Driver Supply (1.8 V Nominal).
49, 50, 53, 54,
AVDD Supply Analog Power Supply (1.8 V Nominal).
59, 60, 63, 64
4, 5, 6, 7, 8, 9,
NC No Connect. Do not connect to this pin.
11, 12, 13, 14,
15, 16
0
AGND,
Exposed Pad
Ground
The exposed thermal pad on the bottom of the package provides the analog ground for
the part. This exposed pad must be connected to ground for proper operation.
ADC Analog
51 VIN+A Input Differential Analog Input Pin (+) for Channel A.
52 VIN−A Input Differential Analog Input Pin (−) for Channel A.
62 VIN+B Input Differential Analog Input Pin (+) for Channel B.
61 VIN−B Input Differential Analog Input Pin (−) for Channel B.
55 VREF Input/Output Voltage Reference Input/Output.
56 SENSE Input Reference Mode Selection.
58 RBIAS Input/Output External Reference Bias Resistor.
57 VCM Output Common-Mode Level Bias Output for Analog Inputs.
1 CLK+ Input ADC Clock Input—True.
2 CLK− Input ADC Clock Input—Complement.
Digital Input
3 SYNC Input Digital Synchronization Pin. Slave mode only.
09977-007
Rev. 0 | Page 13 of 40
Page 14
AD9608
Pin No. Mnemonic Type Description
Digital Outputs
18 D0+ (LSB) Output Channel A/Channel B LVDS Output Data 0—True.
17 D0− (LSB) Output Channel A/Channel B LVDS Output Data 0—Complement.
21 D1+ Output Channel A/Channel B LVDS Output Data 1—True.
20 D1− Output Channel A/Channel B LVDS Output Data 1—Complement.
23 D2+ Output Channel A/Channel B LVDS Output Data 2 —True.
22 D2− Output Channel A/Channel B LVDS Output Data 2—Complement.
27 D3+ Output Channel A/Channel B LVDS Output Data 3—True.
26 D3− Output Channel A/Channel B LVDS Output Data 3—Complement.
30 D4+ Output Channel A/Channel B LVDS Output Data 4—True.
29 D4− Output Channel A/Channel B LVDS Output Data 4—Complement.
32 D5+ Output Channel A/Channel B LVDS Output Data 5—True.
31 D5− Output Channel A/Channel B LVDS Output Data 5—Complement.
34 D6+ Output Channel A/Channel B LVDS Output Data 6—True.
33 D6− Output Channel A/Channel B LVDS Output Data 6—Complement.
36 D7+ Output Channel A/Channel B LVDS Output Data 7—True.
35 D7− Output Channel A/Channel B LVDS Output Data 7—Complement.
39 D8+ Output Channel A/Channel B LVDS Output Data 8—True.
38 D8− Output Channel A/Channel B LVDS Output Data 8—Complement.
41 D9+ (MSB) Output Channel A/Channel B LVDS Output Data 9—True.
40 D9− (MSB) Output Channel A/Channel B LVDS Output Data 9—Complement.
43 OR+ Output Channel A/Channel B LVDS Overrange Output—True.
42 OR− Output Channel A/Channel B LVDS Overrange Output—Complement.
25 DCO+ Output Channel A/Channel B LVDS Data Clock Output—True.
24 DCO− Output Channel A/Channel B LVDS Data Clock Output—Complement.
SPI Control
45 SCLK/DFS Input SPI Serial Clock/Data Format Select Pin in External Pin Mode.
44 SDIO/DCS Input/Output SPI Serial Data I/O/Duty Cycle Stabilizer Pin in External Pin Mode.
46 CSB Input SPI Chip Select (Active Low).
ADC Configuration
47 OEB Input Output Enable Input (Active Low). Pin must be enabled via SPI.
48 PDWN Input
Power-Down Input in External Pin Mode. In SPI mode, this input can be configured as
power-down or standby.
Rev. 0 | Page 14 of 40
Page 15
AD9608
AVD D
AVD D
VIN+B
VIN–B
AVD D
AVD D
RBIAS
VCM
SENSE
VREF
AVD D
AVD D
VIN–A
VIN+A
AVD D
646362616059585756555453525150
AVD D
49
1
CLK+
2
CLK–
3
SYNC
4
NC
5
NC
6
NC
7
NC
8
NC
9
NC
10
DRVDD
11
NC
12
B D1–/D0– (LSB)
B D1+/D0+ (LSB )
NC
13
B D3–/D2–
B D3+/D2+
NOTES
1. NC = NO CONNECT. DO NOT CONNECT T O THIS PIN.
2. THE EXPOSED THERMAL PAD ON THE BOTTOM OF THE PACKAGE PROVIDES
THE ANALOG GROUND FO R THE PART. THIS EXPOSED PAD MUST BE
CONNECTED TO GROUND FOR PROPER O PERATIO N.
Table 10 Pin Function Descriptions (Channel Multiplexed Parallel LVDS Mode)
Pin No. Mnemonic Type Description
ADC Power Supplies
10, 19, 28, 37 DRVDD Supply Digital Output Driver Supply (1.8 V Nominal).
49, 50, 53, 54,
AVDD Supply Analog Power Supply (1.8 V Nominal).
59, 60, 63, 64
4, 5, 6, 7, 8, 9,
NC No Connect. Do not connect to this pin.
11, 12, 26, 27,
29, 30
0 AGND, Exposed Pad Ground
The exposed thermal pad on the bottom of the package provides the
analog ground for the part. This exposed pad must be connected to ground
for proper operation.
ADC Analog
51 VIN+A Input Differential Analog Input Pin (+) for Channel A.
52 VIN−A Input Differential Analog Input Pin (−) for Channel A.
62 VIN+B Input Differential Analog Input Pin (+) for Channel B.
61 VIN−B Input Differential Analog Input Pin (−) for Channel B.
55 VREF Input/Output Voltage Reference Input/Output.
56 SENSE Input Reference Mode Selection.
58 RBIAS Input/Output External Reference Bias Resistor.
57 VCM Output Common-Mode Level Bias Output for Analog Inputs.
1 CLK+ Input ADC Clock Input—True.
2 CLK− Input ADC Clock Input—Complement.
Digital Input
3 SYNC Input Digital Synchronization Pin. Slave mode only.
Rev. 0 | Page 15 of 40
Page 16
AD9608
Pin No. Mnemonic Type Description
Digital Outputs
14 B D1+/D0+ (LSB) Output Channel B LVDS Output Data 1/ Data 0—True.
13 B D1−/D0− (LSB) Output Channel B LVDS Output Data 1/ Data 0—Complement.
16 B D3+/D2+ Output Channel B LVDS Output Data 3/ Data 2—True.
15 B D3−/D2− Output Channel B LVDS Output Data 3/ Data 2—Complement.
18 B D5+/D4+ Output Channel B LVDS Output Data 5/ Data 4—True.
17 B D5−/D4− Output Channel B LVDS Output Data 5/ Data 4—Complement.
21 B D7+/D6+ Output Channel B LVDS Output Data 7/ Data 6—True.
20 B D7−/D6− Output Channel B LVDS Output Data 7/ Data 6—Complement.
23 B D9+/D8+ (MSB) Output Channel B LVDS Output Data 9/ Data 8—True.
22 B D9−/D8− (MSB) Output Channel B LVDS Output Data 9/ Data 8—Complement.
32 A D1+/D0+ (LSB) Output Channel A LVDS Output Data 1/ Data 0—True.
31 A D1−/D0− (LSB)
34 A D3+/D2+ Output Channel A LVDS Output Data 3/ Data 2—True.
33 A D3−/D2− Output Channel A LVDS Output Data 3/ Data 2—Complement.
36 A D5+/D4+ Output Channel A LVDS Output Data 5/ Data 4—True.
35 A D5−/D4− Output Channel A LVDS Output Data 5/ Data 4—Complement.
39 A D7+/D6+ Output Channel A LVDS Output Data 7/ Data 6—True.
38 A D7−/D6− Output Channel A LVDS Output Data 7/ Data 6—Complement.
41 A D9+/D8+ (MSB) Output Channel A LVDS Output Data 9/ Data 8—True.
40 A D9−/D8− (MSB) Output Channel A LVDS Output Data 9/ Data 8—Complement.
43 OR+ Output Channel A/Channel B LVDS Overrange Output—True.
42 OR− Output Channel A/Channel B LVDS Overrange Output—Complement.
25 DCO+ Output Channel A/Channel B LVDS Data Clock Output—True.
24 DCO− Output Channel A/Channel B LVDS Data Clock Output—Complement.
SPI Control
45 SCLK/DFS Input SPI Serial Clock/Data Format Select Pin in External Pin Mode.
44 SDIO/DCS Input/Output SPI Serial Data I/O/Duty Cycle Stabilizer Pin in External Pin Mode.
46 CSB Input SPI Chip Select (Active Low).
ADC Configuration
47 OEB Input Output Enable Input (Active Low). Pin must be enabled via SPI.
48 PDWN Input
Power-Down Input in External Pin Mode. In SPI mode, this input can be
configured as power-down or standby.
Rev. 0 | Page 16 of 40
Page 17
AD9608
TYPICAL PERFORMANCE CHARACTERISTICS
AD9608-125
AVDD = 1.8 V, DRVDD = 1.8 V, maximum sample rate, VIN = −1.0 dBFS differential input, 1.0 V internal reference, and DCS enabled, unless
otherwise noted.
200.5MHz AT –1dBFS
SNR = 60.3dB (61.3dBF S)
SFDR = 85.9d Bc
= 100.5 MHz
IN
0
09977-017
–120
0510203040
FREQUENCY (MHz)
Figure 24. Single-Tone FFT with f
0
105MSPS
70.1MHz AT –1d BFS
SNR = 60.7dB (61.7dBFS)
–20
SFDR = 86.8d Bc
–40
–60
–80
AMPLIT UDE (dBF S)
–100
–120
0510203040
FREQUENCY (MHz)
Figure 25. Single-Tone FFT with f
= 30.5 MHz
IN
= 70.1 MHz
IN
0
09977-015
–120
0510203040
Figure 27. Single-Tone FFT with f
0
09977-016
Rev. 0 | Page 20 of 40
FREQUENC Y (MHz)
= 200.5 MHz
IN
0
09977-018
Page 21
AD9608
AVDD = 1.8 V, DRVDD = 1.8 V, maximum sample rate, VIN = −1.0 dBFS dierential input, 1.0 V internal reference, and DCS enabled, unless
otherwise noted.
100
95
90
85
80
75
70
65
SNR/SFDR (dBFS / d Bc)
60
55
50
050
ANALOG INP UT F RE QUENCY (MHz)
SFDR
SNRFS
100150200250
Figure 28. SNR/SFDR vs. Input Frequency (AIN) with 2 V p-p Full Scale
09977-029
90
SNRFS
SFDR
80
SNR
SFDRFS
70
60
50
40
30
SNR/SFD R ( d B c AND dBFS)
20
10
0
–60–50–40–30–20–100
INPUT AMPLI TUDE (dBFS)
Figure 31. SNR/SFDR vs. Input Amplitude (AIN) with fIN = 9.7 MHz
09977-028
120
100
SFDR (dBc)
80
60
40
SNR/SFDR (dBFS/dBc)
20
0
5 152535455565758595105
SNR (dBFS)
SAMPLE RATE (MSPS)
Figure 29. SNR/SFDR vs. Sample Rate with AIN = 9.7 MHz
1.0
0.5
0
120
100
SFDR (dBc)
80
60
40
SNR/SFDR (d BF S /dBc)
20
0
5 152535455565758595105
09977-026
SNR (dBFS)
SAMPLE RATE (MSPS)
09977-027
Figure 32. SNR/SFDR vs. Sample Rate with AIN = 70 MHz
1.0
0.5
0
DNLERROR (L S B)
–0.5
–1.0
0
Figure 30. DNL Error with f
OUTPUT CO DE
= 9.7 MHz
IN
1000500
09977-019
INL ERROR ( LSB)
–0.5
–1.0
02004006008001000
OUTPUT CODE
Figure 33. INL Error with f
= 9.7 MHz
IN
09977-025
Rev. 0 | Page 21 of 40
Page 22
AD9608
A
V
S
A
V
V
S
A
V
V
V
A
V
EQUIVALENT CIRCUITS
DD
DD
DR
VIN±x
Figure 34. Equivalent Analog Input Circuit
CLK+
CLK–
5Ω
15kΩ
0.9V
15kΩ
5Ω
Figure 35. Equivalent Clock Input Circuit
DRVDD
PAD
SCLK/DFS, SYNC,
OEB, AND PDWN
09977-039
350Ω
30kΩ
09977-045
Figure 38. Equivalent SCLK/DFS, SYNC, OEB, and PDWN Input Circuit
DD
ENSE
09977-040
375Ω
09977-043
Figure 39. Equivalent SENSE Circuit
DR
DD
AVD D
30kΩ
CSB
350Ω
09977-047
Figure 36. Equivalent Digital Output Circuit
DD
DRVDD
30kΩ
DIO/DCS
350Ω
30kΩ
Figure 37. Equivalent SDIO/DCS Input Circuit
Figure 40. Equivalent CSB Input Circuit
DD
REF
7.5kΩ
09977-042
375Ω
Figure 41. Equivalent VREF Circuit
09977-044
09977-048
Rev. 0 | Page 22 of 40
Page 23
AD9608
THEORY OF OPERATION
The AD9608 dual ADC design can be used for diversity reception
of signals, where the ADCs are operating identically on the same
carrier but from two separate antennae. The ADCs can also be
operated with independent analog inputs. The user can sample
any f
/2 frequency segment from dc to 200 MHz, using appropriate
S
low-pass or band-pass filtering at the ADC inputs with little loss
in ADC performance. Operation to 300 MHz analog input is
permitted but occurs at the expense of increased ADC noise
and distortion.
In nondiversity applications, the AD9608 can be used as a baseband or direct downconversion receiver, where one ADC is
used for I input data and the other is used for Q input data.
Synchronization capability is provided to allow synchronized
timing between multiple channels or multiple devices.
Programming and control of the AD9608 is accomplished using
a 3-bit SPI-compatible serial interface.
ADC ARCHITECTURE
The AD9608 architecture consists of a multistage, pipelined ADC.
Each stage provides sufficient overlap to correct for flash errors in
the preceding stage. The quantized outputs from each stage are
combined into a final 10-bit result in the digital correction logic.
The pipelined architecture permits the first stage to operate with
a new input sample while the remaining stages operate with
preceding samples. Sampling occurs on the rising edge of
the clock.
Each stage of the pipeline, excluding the last, consists of a low
resolution flash ADC connected to a switched-capacitor DAC
and an interstage residue amplifier (for example, a multiplying
digital-to-analog converter (MDAC)). The residue amplifier
magnifies the difference between the reconstructed DAC output
and the flash input for the next stage in the pipeline. One bit of
redundancy is used in each stage to facilitate digital correction
of flash errors. The last stage consists of a flash ADC.
The output staging block aligns the data, corrects errors, and
passes the data to the CMOS/LVDS output buffers. The output
buffers are powered from a separate (DRVDD) supply, allowing
digital output noise to be separated from the analog core. During
power-down, the output buffers go into a high impedance state.
ANALOG INPUT CONSIDERATIONS
The analog input to the AD9608 is a differential switchedcapacitor circuit designed for processing differential input
signals. This circuit can support a wide common-mode range
while maintaining excellent performance. By using an input
common-mode voltage of midsupply, users can minimize
signal-dependent errors and achieve optimum performance.
H
C
PAR
VIN+x
VIN–x
C
PAR
Figure 42. Switched-Capacitor Input Circuit
C
SAMPLE
SS
SS
C
SAMPLE
H
The clock signal alternately switches the input circuit between
sample-and-hold mode (see Figure 42). When the input circuit
is switched to sample mode, the signal source must be capable
of charging the sample capacitors and settling within one-half
of a clock cycle. A small resistor in series with each input can help
reduce the peak transient current injected from the output stage
of the driving source. In addition, low Q inductors or ferrite beads
can be placed on each leg of the input to reduce high differential
capacitance at the analog inputs and, therefore, achieve the
maximum bandwidth of the ADC. Such use of low Q inductors
or ferrite beads is required when driving the converter front end
at high IF frequencies. Either a shunt capacitor or two single-ended
capacitors can be placed on the inputs to provide a matching
passive network. This ultimately creates a low-pass filter at the
input to limit unwanted broadband noise. See the AN-742
Application Note, the AN-827 Application Note, and the Analog Dialogue article “Transformer-Coupled Front-End for Wideband
A/D Converters” (Volume 39, April 2005) for more information.
In general, the precise values depend on the application.
H
H
09977-049
Rev. 0 | Page 23 of 40
Page 24
AD9608
V
Input Common Mode
The analog inputs of the AD9608 are not internally dc-biased.
Therefore, in ac-coupled applications, the user must provide
a dc bias externally. Setting the device so that VCM = AVDD/2
is recommended for optimum performance, but the device can
function over a wider range with reasonable performance, as
shown in Figure 43.
An on-board, common-mode voltage reference is included in
the design and is available from the VCM pin. The VCM pin
must be decoupled to ground by a 0.1 µF capacitor, as described
in the Applications Information section.
100
90
80
70
60
50
40
30
SNR/SFDR (dBFS/dBc)
20
10
0
0.50.60.70.80.91.01. 11.21.3
INPUT COMMON-MODE VOLTAGE (V)
SFDR (d Bc)
SNR (dBFS)
09977-056
Figure 43. SNR/SFDR vs. Input Common-Mode Voltage,
= 70 MHz, fS = 125 MSPS
f
IN
Differential Input Configurations
Optimum performance is achieved while driving the AD9608 in
a differential input configuration. For baseband applications,
the AD8138, ADA4937-2, and ADA4938-2 differential drivers
provide excellent performance and a flexible interface to the ADC.
The output common-mode voltage of the ADA4938-2 is easily
set with the VCM pin of the AD9608 (see Figure 44), and the
driver can be configured in a Sallen-Key filter topology to
provide band limiting of the input signal.
200Ω
VIN
0.1µF
76.8Ω
90Ω
120Ω
ADA4938
200Ω
33Ω
10pF
33Ω
VIN–x
VIN+x
AVDD
ADC
VCM
Figure 44. Differential Input Configuration Using the ADA4938-2
For baseband applications below ~10 MHz where SNR is a key
parameter, differential transformer coupling is the recommended
input configuration (see Figure 45). To bias the analog input,
the VCM voltage can be connected to the center tap of the
secondary winding of the transformer.
The signal characteristics must be considered when selecting
a transformer. Most RF transformers saturate at frequencies that
are below a few megahertz (MHz). Excessive signal power can
also cause core saturation, which leads to distortion.
At input frequencies in the second Nyquist zone and above, the
noise performance of most amplifiers is not adequate to achieve
the true SNR performance of the AD9608. For applications above
~10 MHz where SNR is a key parameter, differential double balun
coupling is the recommended input configuration (see Figure 46).
09977-050
09977-051
An alternative to using a transformer-coupled input at frequencies
in the second Nyquist zone is to use the AD8352 differential driver
(see Figure 47). See the AD8352 data sheet for more information.
Figure 47. Differential Input Configuration Using the AD8352
0.1µF
P
0.1µF
CC
8, 13
11
AD8352
10
14
0.1µF
Rev. 0 | Page 24 of 40
25Ω
25Ω
0.1µF
0.1µF
0.1µF
200Ω
200Ω
0.1µF
R
R
0.1µF
VIN+x
C
R
C
R
VIN–x
ADC
VIN+x
VIN–x
VCM
ADC
VCM
09977-053
09977-054
Page 25
AD9608
In any configuration, the value of Shunt Capacitor C is dependent
on the input frequency and source impedance and may need to
be reduced or removed. Tab l e 1 1 displays the suggested values to
set the RC network. However, these values are dependent on the
input signal and should be used only as a starting guide.
Table 11. Example RC Network
R Series
Frequency Range (MHz)
(Ω Each) C Differential (pF)
0 to 70 33 22
70 to 200 125 Open
Single-Ended Input Configuration
A single-ended input can provide adequate performance in
cost-sensitive applications. In this configuration, SFDR and
distortion performance degrade due to the large input commonmode swing. If the source impedances on each input are
matched, there should be little effect on SNR performance.
Figure 48 shows a typical single-ended input configuration.
1V p-p
10µF
49.9Ω
10µF
0.1µF
0.1µF
Figure 48. Single-Ended Input Configuration
AVD D
1kΩ
1kΩ
1kΩ
1kΩ
AVDD
R
C
R
VIN+x
ADC
VIN–x
09977-052
Internal Reference Connection
A comparator within the AD9608 detects the potential at the
SENSE pin and configures the reference into two possible modes,
which are summarized in Tabl e 12 . If SENSE is grounded, the
reference amplifier switch is connected to the internal resistor
divider (see Figure 49), setting VREF to 1.0 V.
VIN+A/VIN+B
VIN–A/V IN–B
ADC
CORE
VREF
0.1µF1.0µF
SENSE
SELECT
LOGIC
0.5V
ADC
09977-055
Figure 49. Internal Reference Configuration
If the internal reference of the AD9608 is used to drive multiple
converters to improve gain matching, the loading of the reference
by the other converters must be considered. Figure 50 shows
how the internal reference voltage is affected by loading.
0
VOLTAGE REFERENCE
–0.5
A stable and accurate 1.0 V voltage reference is built into the
AD9608. The VREF pin can be configured using either the internal
1.0 V reference or an externally applied 1.0 V reference voltage.
The various reference modes are summarized in the sections
–1.0
–1.5
INTERNAL V
REF
= 1.00V
that follow. The Reference Decoupling section describes the
best practices PCB layout of the reference.
–2.0
–2.5
REFERENCE VOL TAGE ERROR (%)
–3.0
02
0.20.4 0.6 0.8 1.01.4 1.6 1.81.2
LOAD CURRENT (mA)
Figure 50. V
Accuracy vs. Load Current
REF
Table 12. Reference Configuration Summary
Selected Mode SENSE Voltage (V) Resulting VREF (V) Resulting Differential Span (V p-p)
Fixed Internal Reference AGND to 0.2 1.0 internal 2.0
Fixed External Reference AVDD 1.0 applied to external VREF pin 2.0
.0
09977-057
Rev. 0 | Page 25 of 40
Page 26
AD9608
V
C
External Reference Operation
The use of an external reference may be necessary to enhance
the gain accuracy of the ADC or improve thermal drift characteristics. Figure 51 shows the typical drift characteristics of the
internal reference in 1.0 V mode.
4
3
2
1
0
–1
ERROR (mV)
–2
REF
V
–3
–4
–5
–6
–40–20020406080
V
ERROR (mV)
REF
TEMPERATURE (°C)
Figure 51. Typical V
REF
Drift
09977-066
When the SENSE pin is tied to AVDD, the internal reference is
disabled, allowing the use of an external reference. An internal
reference buffer loads the external reference with an equivalent
7.5 kΩ load (see Figure 41). The internal buffer generates the
positive and negative full-scale references for the ADC core.
Therefore, the external reference must be limited to a maximum
of 1.0 V.
CLOCK INPUT CONSIDERATIONS
For optimum performance, clock the AD9608 sample clock
inputs, CLK+ and CLK−, with a differential signal. The signal
is typically ac-coupled into the CLK+ and CLK− pins via a
transformer or capacitors. These pins are biased internally
(see Figure 52) and require no external bias.
A
DD
0.9V
CLK–CLK+
2pF2pF
Clock Input Options
The AD9608 has a very flexible clock input structure. The clock
input can be a CMOS, LVDS, LVPECL, or sine wave signal.
Regardless of the type of signal being used, clock source jitter is
of the most concern, as described in the Jitter Considerations
section.
Figure 53 and Figure 54 show two preferred methods for clocking the AD9608 (at clock rates up to 1 GHz prior to internal CLK
divider). A low jitter clock source is converted from a singleended signal to a differential signal using either an RF
transformer or an RF balun.
The RF balun configuration is recommended for clock frequencies
between 125 MHz and 1 GHz, and the RF transformer is recommended for clock frequencies from 10 MHz to 200 MHz. The
back-to-back Schottky diodes across the transformer/balun
secondary limit clock excursions into the AD9608 to approximately 0.8 V p-p differential.
This limit helps prevent the large voltage swings of the clock
from feeding through to other portions of the AD9608 while
preserving the fast rise and fall times of the signal that are critical
to a low jitter performance.
XFMR
0.1µF
®
0.1µF0.1µF
0.1µF
SCHOTTKY
DIODES:
HSMS2822
CLK+
ADC
CLK–
Mini-Circuits
ADT1-1WT, 1:1 Z
CLOCK
INPUT
50Ω
100Ω
Figure 53. Transformer-Coupled Differential Clock (Up to 200 MHz)
LOCK
INPUT
50Ω
1nF
Figure 54. Balun-Coupled Differential Clock (Up to 1 GHz)
0.1µF1nF
0.1µF
SCHOTTKY
DIODES:
HSMS2822
CLK+
ADC
CLK–
09977-059
09977-060
09977-058
Figure 52. Equivalent Clock Input Circuit
Rev. 0 | Page 26 of 40
Page 27
AD9608
C
If a low jitter clock source is not available, another option is to
ac couple a differential PECL signal to the sample clock input
pins, as shown in Figure 55. The AD9510/AD9511/AD9512/
Figure 55. Differential PECL Sample Clock (Up to 1 GHz)
0.1µF
CLK+
100Ω
0.1µF
240Ω240Ω
ADC
CLK–
A third option is to ac couple a differential LVDS signal to the
sample clock input pins, as shown in Figure 56. The AD9510/
AD9511/AD9512/AD9513/AD9514/AD9515/AD9516/AD9517
clock drivers offer excellent jitter performance.
LOCK
INPUT
CLOCK
INPUT
0.1µF
AD951x
LVDS DRIVER
0.1µF
50kΩ50kΩ
Figure 56. Differential LVDS Sample Clock (Up to 1 GHz)
0.1µF
100Ω
0.1µF
CLK+
ADC
CLK–
In some applications, it may be acceptable to drive the sample
clock inputs with a single-ended 1.8 V CMOS signal. In such
applications, drive the CLK+ pin directly from a CMOS gate, and
bypass the CLK− pin to ground with a 0.1 F capacitor (see
Figure 57).
V
CC
0.1µF
1kΩ
1kΩ
AD951x
CMOS DRIVER
CLOCK
INPUT
1
50Ω
1
50Ω RESISTOR IS OPTIONAL.
Figure 57. Single-Ended 1.8 V CMOS Input Clock (Up to 200 MHz)
OPTIONAL
100Ω
0.1µF
0.1µF
CLK+
ADC
CLK–
09977-061
09977-062
09977-063
Input Clock Divider
The AD9608 contains an input clock divider with the ability
to divide the input clock by integer values between 1 and 8.
The AD9608 clock divider can be synchronized using the
external SYNC input. Bit 1 and Bit 2 of Register 0x3A allow
the clock divider to be resynchronized on every SYNC signal
or only on the first SYNC signal after the register is written.
A valid SYNC causes the clock divider to reset to its initial state.
This synchronization feature allows multiple parts to have their
clock dividers aligned to guarantee simultaneous input sampling.
Clock Duty Cycle
Typical high speed ADCs use both clock edges to generate
a variety of internal timing signals and, as a result, may be
sensitive to clock duty cycle. A ±5% tolerance is commonly
required on the clock duty cycle to maintain dynamic
performance characteristics.
The AD9608 contains a duty cycle stabilizer (DCS) that retimes
the nonsampling (falling) edge, providing an internal clock
signal with a nominal 50% duty cycle. This allows the user to
provide a wide range of clock input duty cycles without affecting
the performance of the AD9608. Noise and distortion performance are nearly flat for a wide range of duty cycles with the DCS
on, as shown in Figure 58.
Jitter in the rising edge of the input is still of concern and is not
easily reduced by the internal stabilization circuit. The duty
cycle control loop does not function for clock rates less than
20 MHz, nominally. The loop has a time constant associated
with it that must be considered in applications in which the
clock rate can change dynamically. A wait time of 1.5 µs to 5 µs
is required after a dynamic clock frequency increase or decrease
before the DCS loop is relocked to the input signal.
70
65
DCS ON
60
55
SNR (dBFs)
50
DCS OFF
45
40
35404550556065
POSITIVE DUTY CYCLE (%)
09977-036
Figure 58. SNR vs. DCS On/Off
Rev. 0 | Page 27 of 40
Page 28
AD9608
Jitter Considerations
High speed, high resolution ADCs are sensitive to the quality
of the clock input. The degradation in SNR from the low frequency SNR (SNR
jitter (t
) can be calculated by
JRMS
SNR
= −10 log[(2π × f
HF
) at a given input frequency (f
LF
× t
INPUT
)2 + 10]
JRMS
INPUT
) due to
)10/(LFSNR−
In the previous equation, the rms aperture jitter represents the
clock input jitter specification. IF undersampling applications
are particularly sensitive to jitter, as illustrated in Figure 59.
80
75
70
65
60
SNR (dBFS)
55
50
45
1101001k
FREQUENCY (MHz)
3.0ps
0.05ps
0.2ps
0.5ps
1.0ps
1.5ps
2.0ps
2.5ps
09977-065
Figure 59. SNR vs. Input Frequency and Jitter
The clock input should be treated as an analog signal in cases
where aperture jitter may affect the dynamic range of the AD9608.
To avoid modulating the clock signal with digital noise, keep
power supplies for clock drivers separate from the ADC output
driver supplies. Low jitter, crystal-controlled oscillators make the
best clock sources. If the clock is generated from another type of
source (by gating, dividing, or another method), it should be
retimed by the original clock at the last step.
For more information, see the AN-501 Application Note and the
AN-756 Application Note, available on www.analog.com.
CHANNEL/CHIP SYNCHRONIZATION
The AD9608 has a SYNC input that offers the user flexible
synchronization options for synchronizing sample clocks
across multiple ADCs. The input clock divider can be enabled
to synchronize on a single occurrence of the SYNC signal or on
every occurrence. The SYNC input is internally synchronized
to the sample clock; however, to ensure that there is no timing
uncertainty between multiple parts, the SYNC input signal should
be externally synchronized to the input clock signal, meeting the
setup and hold times shown in Tabl e 5 . Drive the SYNC input
using a single-ended CMOS-type signal.
POWER DISSIPATION AND STANDBY MODE
As shown in Figure 60, the analog core power dissipated by
the AD9608 is proportional to its sample rate. The digital
power dissipation of the CMOS outputs are determined
primarily by the strength of the digital drivers and the load
on each output bit.
Rev. 0 | Page 28 of 40
The maximum DRVDD current (I
I
DRVDD
= V
DRVDD
× C
LOAD
× f
where N is the number of output bits (22, in the case of the
AD9608).
This maximum current occurs when every output bit switches
on every clock cycle, that is, a full-scale square wave at the Nyquist
frequency of f
/2. In practice, the DRVDD current is estab-
CLK
lished by the average number of output bits switching, which
is determined by the sample rate and the characteristics of the
analog input signal.
Reducing the capacitive load presented to the output drivers can
minimize digital power consumption. The data in Figure 60 was
taken in CMOS mode using the same operating conditions as those
used for the power supplies and power consumption parameters
in Tab l e 1 , with a 5 pF load on each output driver.
0.10
I
AVDD
I
DRVDD
0.09
TOTAL POWER
0.08
0.07
0.06
0.05
0.04
0.03
SUPPLY CURRENT (mA)
0.02
0.01
0
5 25456585105125
ENCODE RATE (Msps)
Figure 60. AD9608-125 Power and Current vs. Clock Rate
(1.8 V CMOS Output Mode)
0.09
I
AVDD
I
DRVDD
0.08
TOTAL POWER
0.07
0.06
0.05
0.04
0.03
SUPPLY CURRENT (mA)
0.02
0.01
0
5 152535455565758595105
ENCODE RATE (Msps)
Figure 61. AD9608-105 Power and Current vs. Clock Rate
(1.8 V CMOS Output Mode)
) can be calculated as
DRVDD
× N
CLK
240
190
140
POWER (mW)
90
40
240
190
140
POWER (mW)
90
40
09977-030
09977-023
Page 29
AD9608
The AD9608 is placed in power-down mode either by the SPI
port or by asserting the PDWN pin high. In this state, the ADC
typically dissipates <2 mW. During power-down, the output
drivers are placed in a high impedance state. Asserting the
PDWN pin low returns the AD9608 to its normal operating
mode. Note that PDWN is referenced to the digital output driver
supply (DRVDD) and should not exceed that supply voltage.
Low power dissipation in power-down mode is achieved by
shutting down the reference, reference buffer, biasing networks,
and clock. Internal capacitors are discharged when entering powerdown mode and then must be recharged when returning to normal
operation. As a result, wake-up time is related to the time spent
in power-down mode, and shorter power-down cycles result in
proportionally shorter wake-up times.
When using the SPI port interface, the user can place the ADC
in power-down mode or standby mode. Standby mode allows
the user to keep the internal reference circuitry powered when
faster wake-up times are required. See the Memory Map section
for more details.
DIGITAL OUTPUTS
The AD9608 output drivers can be configured to interface with
either 1.8 V CMOS or 1.8 V LVDS logic families. The default
output mode is CMOS, with each channel output on separate
busses as shown in Figure 2.
In CMOS output mode, the CMOS output drivers are sized to
provide sufficient output current to drive a wide variety of logic
families. However, large drive currents tend to cause current
glitches on the supplies and may affect converter performance.
Applications requiring the ADC to drive large capacitive loads
or large fanouts may require external buffers or latches.
The CMOS output can also be configured for interleaved CMOS
output mode via the SPI port. In interleaved CMOS mode, the
data for both channels is output onto a single output bus to reduce
the total number of traces required. The timing diagram for
interleaved CMOS output mode is shown in Figure 3.
The interleaved CMOS output mode is enabled globally onto both
output channels via Bit 5 in Register 0x14. The unused channel
output can be disabled by selecting the appropriate bit (Bit 1 or
Bit 0) in Register 0x05 and then writing a 1 to the local (channelspecific) output port disable bit (Bit 4) in Register 0x14.
The output data format can be selected to be either offset binary
or twos complement by setting the SCLK/DFS pin when operating
in the external pin mode (see Tab l e 1 3 ).
As detailed in the AN-877 Application Note, Interfacing to High Speed ADCs via SPI, the data format can be selected for offset
binary, twos complement, or Gray code when using the SPI control.
The AD9608 has a flexible three-state ability for the digital output
pins. The three-state mode is enabled through the SPI interface
and can subsequently be controlled using the OEB pin or through
the SPI. Once enabled via the SPI (Bit 7) in Register 0x101 and
the OEB pin is low, the output data drivers and DCOs are enabled.
If the OEB pin is high, the output data drivers and DCOs are
placed in a high impedance state. This OEB function is not
intended for rapid access to the data bus. Note that OEB is
referenced to the digital output driver supply (DRVDD) and
should not exceed that supply voltage.
When using the SPI interface, the data outputs and DCO of
each channel can be independently three-stated by using the
output port disable bit (Bit 4) in Register 0x14.
TIMING
The AD9608 provides latched data with a pipeline delay of
16 clock cycles. Data outputs are available one propagation
delay (t
Minimize the length of the output data lines and loads placed
on them to reduce transients within the AD9608. These
transients can degrade converter dynamic performance.
The lowest typical conversion rate of the AD9608 is 10 MSPS.
At clock rates below 10 MSPS, dynamic performance can degrade.
Data Clock Output (DCO)
The AD9608 provides two data clock output (DCO) signals
intended for capturing the data in an external register. In CMOS
output mode, the data outputs are valid on the rising edge of DCO,
unless the DCO clock polarity has been changed via the SPI. In
LVDS output mode, the DCO and data output switching edges
are closely aligned. Additional delay can be added to the DCO
output using SPI Register 0x17 to increase the data setup time.
In this case, the Channel A output data is valid on the rising
edge of DCO, and the Channel B output data is valid on the
falling edge of DCO. See Figure 2, Figure 3, and Figure 4 for
a graphical timing description of the output modes.
The AD9608 includes a built-in test feature designed to enable
verification of the integrity of each channel, as well as to
facilitate board level debugging. A built-in self-test (BIST) feature
that verifies the integrity of the digital datapath of the AD9608
is included. Various output test options are also provided to place
predictable values on the outputs of the AD9608.
BUILT-IN SELF-TEST (BIST)
The BIST is a thorough test of the digital portion of the selected
AD9608 signal path. Perform the BIST test after a reset to ensure
that the part is in a known state. During BIST, data from an internal
pseudorandom noise (PN) source is driven through the digital
datapath of both channels, starting at the ADC block output.
At the datapath output, CRC logic calculates a signature from
the data. The BIST sequence runs for 512 cycles and then stops.
Once completed, the BIST compares the signature results with a
predetermined value. If the signatures match, the BIST sets Bit 0
of Register 0x24, signifying that the test passed. If the BIST test
fails, Bit 0 of Register 0x24 is cleared. The outputs are connected
during this test, so the PN sequence can be observed as it runs.
Writing the value 0x05 to Register 0x0E runs the BIST. This enables
Bit 0 (BIST enable) of Register 0x0E and resets the PN sequence
generator, Bit 2 (initialize BIST sequence) of Register 0x0E. At the
completion of the BIST, Bit 0 of Register 0x24 is automatically
cleared. The PN sequence can be continued from its last value
by writing a 0 in Bit 2 of Register 0x0E. However, if the PN
sequence is not reset, the signature calculation does not equal
the predetermined value at the end of the test. At that point, the
user needs to rely on verifying the output data.
OUTPUT TEST MODES
The output test options are described in Ta bl e 18 at Address 0x0D.
When an output test mode is enabled, the analog section of the
ADC is disconnected from the digital back-end blocks and the
test pattern is run through the output formatting block. Some of
the test patterns are subject to output formatting, and some are
not. The PN generators from the PN sequence tests can be reset
by setting Bit 4 or Bit 5 of Register 0x0D. These tests can be
performed with or without an analog signal (if present, the
analog signal is ignored), but they do require an encode clock.
For more information, see the AN-877 Application Note,
Interfacing to High Speed ADCs via SPI.
Rev. 0 | Page 30 of 40
Page 31
AD9608
SERIAL PORT INTERFACE (SPI)
The AD9608 serial port interface (SPI) allows the user to configure
the converter for specific functions or operations through a
structured register space provided inside the ADC. The SPI
gives the user added flexibility and customization, depending on
the application. Addresses are accessed via the serial port and
can be written to or read from via the port. Memory is organized
into bytes that can be further divided into fields, which are documented in the Memor y Map section. For detailed operational
information, see the AN-877 Application Note, Interfacing to High Speed ADCs via SPI.
CONFIGURATION USING THE SPI
Three pins define the SPI of this ADC: the SCLK/DFS pin, the
SDIO/DCS pin, and the CSB pin (see Tab l e 1 5 ). The SCLK/DFS
(a serial clock) is used to synchronize the read and write data
presented from and to the ADC. The SDIO/DCS (serial data
input/output) is a dual-purpose pin that allows data to be sent
to and read from the internal ADC memory map registers. The
CSB (chip select bar) is an active low control that enables or
disables the read and write cycles.
Table 15. Serial Port Interface Pins
Pin Function
Serial clock. The serial shift clock input, which is used to
SCLK
synchronize serial interface reads and writes.
Serial data input/output. A dual-purpose pin that typically
SDIO
serves as an input or an output, depending on the
instruction being sent and the relative position in the
timing frame.
Chip select bar. An active low control that gates the read
CSB
and write cycles.
The falling edge of the CSB, in conjunction with the rising edge
of the SCLK, determines the start of the framing. An example of
the serial timing and its definitions can be found in Figure 62
and Tabl e 5.
Other modes involving the CSB are available. The CSB can be
held low indefinitely, which permanently enables the device;
this is called streaming. The CSB can stall high between bytes to
allow for additional external timing. When CSB is tied high, SPI
functions are placed in high impedance mode. This mode turns
on any SPI pin secondary functions.
During an instruction phase, a 16-bit instruction is transmitted.
Data follows the instruction phase, and its length is determined
by the W0 and W1 bits.
In addition to word length, the instruction phase determines
whether the serial frame is a read or write operation, allowing
the serial port to be used both to program the chip and to read
the contents of the on-chip memory. The first bit of the first byte
in a multibyte serial data transfer frame indicates whether a read
command or a write command is issued. If the instruction is a
readback operation, performing a readback causes the serial
data input/output (SDIO) pin to change direction from an input
to an output at the appropriate point in the serial frame.
All data is composed of 8-bit words. Data can be sent in MSBfirst mode or in LSB-first mode. MSB first is the default on
power-up and can be changed via the SPI port configuration
register. For more information about this and other features,
see the AN-877 Application Note, Interfacing to High Speed ADCs via SPI.
CSB
SCLK
SDIO
DON’T CARE
t
t
DS
t
S
R/WW1W0A12A11A10A9A8A7
t
DH
HIGH
t
LOW
Figure 62. Serial Port Interface Timing Diagram
t
CLK
Rev. 0 | Page 31 of 40
D5D4D3D2D1D0
t
H
DON’T CARE
DON’T CAREDON’T CARE
09977-046
Page 32
AD9608
HARDWARE INTERFACE
The pins described in Table 15 comprise the physical interface
between the user programming device and the serial port of the
AD9608. The SCLK pin and the CSB pin function as inputs
when using the SPI interface. The SDIO pin is bidirectional,
functioning as an input during write phases and as an output
during readback.
The SPI interface is flexible enough to be controlled by either
FPGAs or microcontrollers. One method for SPI configuration
is described in detail in the AN-812 Application Note, Micro-controller-Based Serial Port Interface (SPI) Boot Circuit.
The SPI port should not be active during periods when the full
dynamic performance of the converter is required. Because the
SCLK signal, the CSB signal, and the SDIO signal are typically
asynchronous to the ADC clock, noise from these signals can
degrade converter performance. If the on-board SPI bus is used for
other devices, it may be necessary to provide buffers between
this bus and the AD9608 to prevent these signals from transitioning at the converter inputs during critical sampling periods.
Some pins serve a dual function when the SPI interface is not
being used. When the pins are strapped to DRVDD or ground
during device power-on, they are associated with a specific
function. Table 16 describes the strappable functions supported
on the AD9608.
CONFIGURATION WITHOUT THE SPI
In applications that do not interface to the SPI control registers,
the SDIO/DCS pin, the SCLK/DFS pin, and the PDWN pin
serve as standalone CMOS-compatible control pins. When the
device is powered up, it is assumed that the user intends to use the
pins as static control lines for the duty cycle stabilizer, output
data format, and power-down feature control. In this mode, the
CSB chip select bar should be connected to AVDD, which
disables the serial port interface.
When the device is in SPI mode, the PDWN and OEB pins (if
enabled) remain active. For SPI control of output enable and
power-down, the OEB and PDWN pins should be set to their
default states.
Table 17 provides a brief description of the general features that
are accessible via the SPI. These features are described in detail
in the AN-877 Application Note, Interfacing to High Speed ADCs via SPI. The AD9608 part-specific features are described in detail
following Table 18, the external memory map register table (see the
Memory Map Register Descriptions section).
Table 17. Features Accessible Using the SPI
Feature
Name
Mode
Clock
Offset Allows user to digitally adjust the converter offset
Tes t I /O
Output Mode Allows user to set the output mode, including LVDS
Output Phase Allows user to set the output clock polarity
Output Delay Allows user to vary the DCO delay
Description
Allows user to set either power-down mode or
standby mode
Allows user to access the DCS, set the clock
divider, set the clock divider phase, and enable
the sync
Allows user to set test modes to have known
data on output bits
Rev. 0 | Page 32 of 40
Page 33
AD9608
MEMORY MAP
READING THE MEMORY MAP REGISTER TABLE
Each row in the memory map register table has eight bit locations.
The memory map is roughly divided into three sections: the chip
configuration registers (Address 0x00 to Address 0x02); the
channel index and transfer registers (Address 0x05 and
Address 0xFF) and the ADC functions registers, including setup,
control, and test (Address 0x08 to Address 0x102).
The memory map register table (see Tab l e 1 8 ) lists the default
hexadecimal value for each hexadecimal address shown. The
column with the heading Bit 7 (MSB) is the start of the default
hexadecimal value given. For example, Address 0x05, the device
index register, has a hexadecimal default value of 0x03. This
means that in Address 0x05, Bits[7:2] = 0, and Bits[1:0] = 1.
This setting is the default channel index setting. The default
value results in both ADC channels receiving the next write
command. For more information about this function and others,
see the AN-877 Application Note, Interfacing to High Speed ADCs via SPI. This application note details the functions controlled by
Register 0x00 to Register 0xFF. The remaining registers are
documented in the Memory Map Register Descriptions section.
Open Locations
All address and bit locations that are not included in Tab l e 1 8
are not currently supported for this device. Unused bits of a
valid address location should be written with 0s. Writing to these
locations is required only when part of an address location is
open (for example, Address 0x05). If the entire address location
is open (for example, Address 0x13), this address location should
not be written to.
Default Values
After the AD9608 is reset, critical registers are loaded with
default values. The default values for the registers are given in
the memory map register table, Tab l e 1 8 .
Logic Levels
An explanation of logic level terminology follows:
•“Bit is set” is synonymous with “bit is set to Logic 1” or
“writing Logic 1 for the bit.”
•“Clear a bit” is synonymous with “bit is set to Logic 0” or
“writing Logic 0 for the bit.”
Channel-Specific Registers
Some channel setup functions, such as the signal monitor
thresholds, can be programmed differently for each channel. In
these cases, channel address locations are internally duplicated for
each channel. These registers and bits are designated in Tab l e 1 8
as local. These local registers and bits can be accessed by setting
the appropriate Channel A or Channel B bits in Register 0x05.
If both bits are set, the subsequent write affects the registers of
both channels. In a read cycle, only Channel A or Channel B
should be set to read one of the two registers. If both bits are set
during an SPI read cycle, the part returns the value for Channel A.
Registers and bits designated as global in Ta b le 18 affect the entire
part or the channel features for which independent settings are not
allowed between channels.
Rev. 0 | Page 33 of 40
Page 34
AD9608
MEMORY MAP REGISTER TABLE
All address and bit locations that are not included in Tab l e 1 8 are not currently supported for this device.
Table 18. Memory Map Registers
Addr
(Hex)
Chip Configuration Registers
0x00
0x01 Chip ID
0x02
Channel Index and Transfer Registers
0x05
0xFF
ADC Functions
0x08
0x09
Register
Name
SPI port
config
(global)
(global)
Chip
grade
(global)
Device
index
(global)
Transfer
(global)
Power
modes
(local)
Global
clock
(global)
Bit 7
(MSB)
Open LSB first Soft reset 1 1 Soft reset LSB first Open 0x18
Open Speed grade ID
Open Open Open Open Open Open Channel B Channel A 0x03
Open Open Open Open Open Open Open Transfer 0x00
Open Open
Open Open Open Open Open Open Open
Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1
8-bit chip ID, Bits[7:0]
AD9608 = 0x9C
100 = 105 MSPS
101 = 125 MSPS
External
powerdown pin
function
0 = PDWN
1 = standby
Open Open Open Internal power-down mode
Open Open Open Open
00 = normal operation
01 = full power-down
10 = standby
11 = digital reset
Bit 0
(LSB)
Duty cycle
stabilizer
0 = disabled
1 = enabled
Default
Value
(Hex)
Read
only
Read
only
0x00
0x01
Comments
Nibbles are
mirrored so
LSB-first
mode or
MSB-first
mode
registers
correctly,
regardless
of shift
mode
Unique
chip ID
used to
differentiate
devices;
read only
Unique
speed
grade ID
used to
differentiate
devices;
read only
Bits are
set to
determine
which
device on
the chip
receives the
next write
command;
applies to
local
registers
only
Synchronous
transfer of
data from
the master
shift
register to
the slave
Determines
various
generic
modes of
chip
operation
Rev. 0 | Page 34 of 40
Page 35
AD9608
Default
Addr
(Hex)
0x0B
0x0C
0x0D
0x0E
0x10
0x14
0x15
0x16
0x17
Register
Name
Clock
divide
(global)
Enhancement
control
(global)
Test
mode
(local)
BIST
enable
(global)
Customer
offset
adjust
(local)
Output
mode
Output
adjust
Clock
phase
control
(global)
Output
delay
(global)
Bit 7
(MSB)
Open Open Open Open Open Clock divide ratio
Open Open Open Open Open Chop mode
User test mode control
00 = single pattern
mode
01 = alternate
continuous/repe at
pattern mode
10 = single once
pattern mode
11 = alternate once
pattern mode
Open Open Open Open Open
Output port logic
type (global)
00 = CMOS, 1.8 V
10 = LVDS, ANSI
11 = LVDS, reduced
Open Open
Invert
DCO
clock
0 = not
inverted
1 =
inverted
DCO
clock
delay
0 =
disabled
1 =
enabled
Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1
000 = divide by 1
001 = divide by 2
010 = divide by 3
011 = divide by 4
100 = divide by 5
101 = divide by 6
110 = divide by 7
111 = divide by 8
0 = disabled
1 = enabled
Reset PN
long ge n
Output
interleave
enable
(global)
range
CMOS 1.8 V DCO drive
Open Open Open Open
Open Data delay
0 = disabled
1 = enabled
Reset PN
short gen
Offset adjust in LSBs from +127 to −128
(twos complement format)
Output
port disable
(local)
strength
00 = 1×
01 = 2×
10 = 3×
11 = 4×
Open Open Delay selection
Open
(global)
Open Open
Output test mode
0000 = off (default)
0001 = midscale short
0010 = positive FS
0011 = negative FS
0100 = alternating checkerboard
0101 = PN long sequence
0110 = PN short sequence
0111 = one/zero word toggle
1000 = user test mode
1111 = ramp output
When this
register is
set, the test
data is
placed on
the output
pins in
place of
normal data
Configures
the outputs
and the
format of
the data
Determines
CMOS
output
drive
strength
properties
Allows
selection of
clock delays
into the
input clock
divider
This sets
the fine
output
delay of the
output
clock but
does not
change
internal
timing
Rev. 0 | Page 35 of 40
Page 36
AD9608
Default
Addr
(Hex)
0x18
0x19
0x1A
0x1B
0x1C
0x24 MISR LSB MISR LSB, Bits[7:0] 0xFF Read only
0x25 MISR MSB MISR MSB, Bits[15:8] 0xFF Read only
0x2A
0x2E
0x3A
0x100
0x101
0x102
Register
Name
VREF
select
(global)
User
Pattern 1,
LSB
(global)
User
Pattern 1,
MSB
(global)
User
Pattern 2,
LSB
(global)
User
Pattern 2,
MSB
Overrange
control
(global)
Output
assign
(local)
Sync
control
(global)
Sample
rate
override
User I/O
Control
Register 2
User I/O
Control
Register 3
Bit 7
(MSB)
Open Open Open Open Open Internal V
B7 B6 B5 B4 B3 B2 B1 B0 0x00
B15 B14 B13 B12 B11 B10 B9 B8 0x00
B7 B6 B5 B4 B3 B2 B1 B0 0x00
B15 B14 B13 B12 B11 B10 B9 B8 0x00
Open Open Open Open Open Open Open
Open Open Open Open Open Open Open
Open Open Open Open Open
Open
Output
enable
bar
(OEB)
pin
enable
Open Open Open Open
Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1
digital adjustment
REF
000 = 1.0 V p-p
001 = 1.14 V p-p
010 = 1.33 V p-p
011 = 1.6 V p-p
100 = 2.0 V p-p
Clock
divider
next sync
only
Sample
rate
override
enable
Open Open Open Open Open Open
Open Open Open Sample rate
VCM
power-down
Clock
divider
sync
enable
011 = 80 MSPS
100 = 105 MSPS
101 = 125 MSPS
Open 0x00
Bit 0
(LSB)
Overrange
output
0 = disabled
1 = enabled
0 = ADC A
1 = ADC B
(local)
Open 0x00
Disable SDIO
pull-down
Value
(Hex) Comments
0x04
0x01
0x00 =
ADC A
0x01 =
ADC B
0x00
0x00
Select
and/or
adjust V
REF
UserDefined
Pattern 1,
LSB
UserDefined
Pattern 1,
MSB
UserDefined
Pattern 2,
LSB
UserDefined
Pattern 2,
MSBs
Overrange
control
settings
Assign an
ADC to an
output
channel
Sets the
global sync
options
OEB and
SDIO pin
controls
Rev. 0 | Page 36 of 40
Page 37
AD9608
MEMORY MAP REGISTER DESCRIPTIONS
For additional information about functions controlled in
Register 0x00 to Register 0xFF, see the AN-877 Application Note,
Interfacing to High Speed ADCs via SPI.
Power Modes (Register 0x08)
Bits[7:6]—Open
Bit 5—External Power-Down Pin Function
If set, the external PDWN pin initiates power-down mode.
If clear, the external PDWN pin initiates standby mode.
Bits[4:2]—Open
Bits[1:0]—Internal Power-Down Mode
In normal operation (Bits[1:0] = 00), both ADC channels are
active.
In power-down mode (Bits[1:0] = 01), the digital data path clocks
are disabled while the digital data path is reset. Outputs are
disabled.
In standby mode (Bits[1:0] = 10), the digital data path clocks
and the outputs are disabled.
During a digital reset (Bits[1:0] = 11), the digital data path clocks
are disabled while the digital data path is held in reset. The outputs
are enabled in this state. For optimum performance, it is recommended that both ADC channels be reset simultaneously. This
is accomplished by ensuring that both channels are selected via
Register 0x05 prior to issuing the digital reset instruction.
Enhancement Control (Register 0x0C)
Bits[7:3]—Open
Bit 2—Chop Mode
For applications that are sensitive to offset voltages and other
low frequency noise, such as homodyne or direct-conversion
receivers, chopping in the first stage of the AD9628 is a feature
that can be enabled by setting Bit 2. In the frequency domain,
chopping translates offsets and other low frequency noise to
f
/2 where it can be filtered.
CLK
Bits[1:0]—Open
Output Mode (Register 0x14)
Bits[7:6]—Output Port Logic Type
00 = CMOS, 1.8 V
10 = LVDS, ANSI
11 = LVDS, reduced range
Bit 5—Output Interleave Enable
For LVDS outputs, setting Bit 5 enables interleaving. Channel A
is sent coincident with a high DCO clock, and Channel B is
coincident with a low DCO clock. Clearing Bit 5 disables the
interleaving feature. Channel A is sent on least significant bits
(LSBs), and Channel B is sent on most significant bits (MSBs).
The even bits are sent coincident with a high DCO clock, and
the odd bits are sent coincident with a low DCO clock.
For CMOS outputs, setting Bit 5 enables interleaving in CMOS
DDR mode. On ADC Output Port A, Channel A is sent coincident
with a low DCO clock, and Channel B is coincident with a high
DCO clock. On ADC Output Port B, Channel B is sent coincident
with a low DCO clock, and Channel A is coincident with a high
DCO clock. Clearing Bit 5 disables the interleaving feature, and
data is output in CMOS SDR mode. Channel A is sent to Port A,
and Channel B is sent to Port B.
Bit 4—Output Port Disable
Setting Bit 4 high disables the output port for the channels
selected in Bits[1:0] of the device index register (Register 0x05).
Bit 3—Open
Bit 2—Output Invert
Setting Bit 2 high inverts the output port data for the channels
selected in Bits[1:0] of the device index register (Register 0x05).
If the clock divider sync enable bit (Address 0x3A, Bit 1) is high,
Bit 2 allows the clock divider to sync to the first sync pulse it
receives and to ignore the rest. The clock divider sync enable bit
resets after it syncs.
Bit 1—Clock Divider Sync Enable
Bit 1 gates the sync pulse to the clock divider. The sync signal is
enabled when Bit 1 is high. This is continuous sync mode.
Bit 0—Open
Transfer (Register 0xFF)
All registers except Register 0x100 are updated the moment they
are written. Setting Bit 0 of this transfer register high initializes the
settings in the ADC sample rate override register (Address 0x100).
Sample Rate Override (Register 0x100)
This register is designed to allow the user to downgrade the device.
Any attempt to upgrade the default speed grade results in a chip
power-down. Settings in this register are not initialized until Bit 0
of the transfer register (Register 0xFF) is written high.
Rev. 0 | Page 37 of 40
Page 38
AD9608
User I/O Control 2 (Register 0x101)
Bit 7—OEB Pin Enable
If the OEB pin enable bit (Bit 7) is set, the OEB pin is enabled.
If Bit 7 is clear, the OEB pin is disabled (default).
Bits[6:1]—Open
Bit 0—SDIO Pull-Down
Bit 0 can be set to disable the internal 30 k pull-down on the
SDIO pin, which can be used to limit the loading when many
devices are connected to the SPI bus.
User I/O Control 3 (Register 0x102)
Bits[7:4]—Open
Bit 3—VCM Power-Down
Bit 3 can be set high to power down the internal VCM
generator. This feature is used when applying an external
reference.
Bits[2:0]—Open
Rev. 0 | Page 38 of 40
Page 39
AD9608
APPLICATIONS INFORMATION
DESIGN GUIDELINES
Before starting design and layout of the AD9608 as a system,
it is recommended that the designer become familiar with these
guidelines, which discuss the special circuit connections and
layout requirements that are needed for certain pins.
Power and Ground Recommendations
When connecting power to the AD9608, it is recommended that
two separate 1.8 V supplies be used. Use one supply for analog
(AVDD); use a separate supply for the digital outputs (DRVDD).
For both AVDD and DRVDD, several different decoupling capacitors should be used to cover both high and low frequencies.
Place these capacitors close to the point of entry at the PCB level
and close to the pins of the part, with minimal trace length.
A single PCB ground plane should be sufficient when using the
AD9608. With proper decoupling and smart partitioning of the
PCB analog, digital, and clock sections, optimum performance
is easily achieved.
LVDS Operation
The AD9608 defaults to CMOS output mode on power-up.
If LVDS operation is desired, this mode must be programmed,
using the SPI configuration registers after power-up. When the
AD9608 powers up in CMOS mode with LVDS termination
resistors (100 Ω) on the outputs, the DRVDD current can be
higher than the typical value until the part is placed in LVDS
mode. This additional DRVDD current does not cause damage
to the AD9608, but it should be taken into account when considering the maximum DRVDD current for the part.
To avoid this additional DRVDD current, the AD9608 outputs
can be disabled at power-up by taking the PDWN pin high.
After the part is placed into LVDS mode via the SPI port, the
PDWN pin can be taken low to enable the outputs.
Exposed Paddle Thermal Heat Slug Recommendations
It is mandatory that the exposed paddle on the underside of the
ADC be connected to analog ground (AGND) to achieve the
best electrical and thermal performance. A continuous, exposed
(no solder mask) copper plane on the PCB should mate to the
AD9608 exposed paddle, Pin 0.
The copper plane should have several vias to achieve the lowest
possible resistive thermal path for heat dissipation to flow through
the bottom of the PCB. These vias should be filled or plugged to
prevent solder wicking through the vias, which can compromise
the connection.
To maximize the coverage and adhesion between the ADC and
the PCB, a silkscreen should be overlaid to partition the continuous
plane on the PCB into several uniform sections. This provides
several tie points between the ADC and the PCB during the reflow
process. Using one continuous plane with no partitions guarantees
only one tie point between the ADC and the PCB. For detailed
information about packaging and PCB layout of chip scale
packages, see the AN-772 Application Note, A Design and
Manufacturing Guide for the Lead Frame Chip Scale Package
(LFCSP), at www.analog.com.
VCM
The VCM pin should be decoupled to ground with a 0.1 F
capacitor.
Reference Decoupling
The VREF pin should be externally decoupled to ground with
a low ESR, 1.0 F capacitor in parallel with a low ESR, 0.1 F
ceramic capacitor.
SPI Port
The SPI port should not be active during periods when the full
dynamic performance of the converter is required. Because the
SCLK, CSB, and SDIO signals are typically asynchronous to the
ADC clock, noise from these signals can degrade converter
performance. If the on-board SPI bus is used for other devices,
it may be necessary to provide buffers between this bus and the
AD9608 to keep these signals from transitioning at the converter
inputs during critical sampling periods.
Rev. 0 | Page 39 of 40
Page 40
AD9608
OUTLINE DIMENSIONS
49
48
0.60 MAX
EXPOSED PAD
(BOTTOM VIEW)
PIN 1
64
INDICATOR
1
6.35
6.20 SQ
6.05
PIN 1
INDICATOR
9.00
BSC SQ
TOP VIE W
8.75
BSC SQ
0.60
MAX
0.50
BSC
1.00
0.85
0.80
SEATING
PLANE
12° MAX
0.50
0.40
0.30
0.80 MAX
0.65 TYP
0.30
0.23
0.18
COMPLIANT TO JEDEC STANDARDS MO-220-VMMD-4
0.05 MAX
0.02 NOM
0.20 REF
33
32
7.50
REF
16
17
FOR PROPER CO NNECTION O F
THE EXPOSED PAD, REFER TO
THE PIN CONF IGURATIO N AND
FUNCTION DESCRI PTIONS
SECTION OF THIS DATA SHEET.
0.25 MIN
091707-C
Figure 63. 64-Lead Lead Frame Chip Scale Package [LFCSP_VQ]
9 mm × 9 mm Body, Very Thin Quad
(CP-64-4)
Dimensions shown in millimeters
ORDERING GUIDE
Model1 Temperature Range Package Description Package Option
AD9608BCPZ-105 −40°C to +85°C 64-Lead Lead Frame Chip Scale Package [LFCSP_VQ] CP-64-4
AD9608BCPZ-125 −40°C to +85°C 64-Lead Lead Frame Chip Scale Package [LFCSP_VQ] CP-64-4
AD9608BCPZRL7-105 −40°C to +85°C 64-Lead Lead Frame Chip Scale Package [LFCSP_VQ] CP-64-4
AD9608BCPZRL7-125 −40°C to +85°C 64-Lead Lead Frame Chip Scale Package [LFCSP_VQ] CP-64-4
AD9608-125EBZ Evaluation Board